USD699607S1 - Contact probe - Google Patents

Contact probe Download PDF

Info

Publication number
USD699607S1
USD699607S1 US29/431,034 US201229431034F USD699607S US D699607 S1 USD699607 S1 US D699607S1 US 201229431034 F US201229431034 F US 201229431034F US D699607 S USD699607 S US D699607S
Authority
US
United States
Prior art keywords
view
contact probe
section
tip side
enlarged view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/431,034
Inventor
Yuji Nakamura
Katsumi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Co Ltd
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Assigned to YAMAICHI ELECTRONICS CO., LTD. reassignment YAMAICHI ELECTRONICS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NAKAMURA, YUJI, SUZUKI, KATSUMI
Application granted granted Critical
Publication of USD699607S1 publication Critical patent/USD699607S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Description

FIG. 1 is a perspective view of the front, top and left side of a contact probe of a first embodiment showing our new design;
FIG. 2 is a perspective view of the rear, top and right side thereof;
FIG. 3 is a front view thereof;
FIG. 4 is a rear view thereof;
FIG. 5 is a left side view thereof;
FIG. 6 is a right side view thereof;
FIG. 7 is a top view thereof;
FIG. 8 is a bottom view thereof;
FIG. 9 is an enlarged view of tip side from 9-9 section in FIG. 1 thereof;
FIG. 10 is an enlarged view of tip side from 10-10 section in FIG. 2 thereof;
FIG. 11 is an enlarged view of tip side from 11-11 section in FIG. 3 thereof; and
FIG. 12 is an enlarged view of tip side from 12-12 section in FIG. 6 thereof,
FIG. 13 is a perspective view of the front, top and left side of a contact probe of a second embodiment showing our new design;
FIG. 14 is a perspective view of the rear, top and right side thereof;
FIG. 15 is a front view thereof;
FIG. 16 is a rear view thereof;
FIG. 17 is a left side view thereof;
FIG. 18 is a right side view thereof;
FIG. 19 is a top view thereof;
FIG. 20 is a bottom view thereof;
FIG. 21 is an enlarged view of tip side from 21-21 section in FIG. 13 thereof;
FIG. 22 is an enlarged view of tip side from 22-22 section in FIG. 14 thereof;
FIG. 23 is an enlarged view of tip side from 23-23 section in FIG. 15 thereof; and
FIG. 24 is an enlarged view of tip side from 24-24 section in FIG. 18 thereof,
FIG. 25 is a perspective view of the front, top and left side of a contact probe of a third embodiment showing our new design;
FIG. 26 is a perspective view of the rear, top and right side thereof;
FIG. 27 is a front view thereof;
FIG. 28 is a rear view thereof;
FIG. 29 is a left side view thereof;
FIG. 30 is a right side view thereof;
FIG. 31 is a top view thereof;
FIG. 32 is a bottom view thereof;
FIG. 33 is an enlarged view of tip side from 33-33 section in FIG. 25 thereof;
FIG. 34 is an enlarged view of tip side from 34-34 section in FIG. 26 thereof;
FIG. 35 is an enlarged view of tip side from 35-35 section in FIG. 27 thereof; and
FIG. 36 is an enlarged view of tip side from 36-36 section in FIG. 30 thereof,
FIG. 37 is a perspective view of the front, top and left side of a contact probe of a fourth embodiment showing our new design;
FIG. 38 is a perspective view of the rear, top and right side thereof;
FIG. 39 is a front view thereof;
FIG. 40 is a rear view thereof;
FIG. 41 is a left side view thereof;
FIG. 42 is a right side view thereof;
FIG. 43 is a top view thereof;
FIG. 44 is a bottom view thereof;
FIG. 45 is an enlarged view of tip side from 45-45 section in FIG. 37 thereof;
FIG. 46 is an enlarged view of tip side from 46-46 section in FIG. 38 thereof;
FIG. 47 is an enlarged view of tip side from 47-47 section in FIG. 39 thereof; and,
FIG. 48 is an enlarged view of tip side from 48-48 section in FIG. 42 thereof.
The portions of the article in broken lines are shown for illustrative purposes only and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design(s) for a contact probe, as shown and described.
US29/431,034 2012-03-01 2012-08-31 Contact probe Active USD699607S1 (en)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP2012-004632 2012-01-13
JP2012004633 2012-03-01
JP2012-004631 2012-03-01
JP2012004634 2012-03-01
JP2012004631 2012-03-01
JP2012-004633 2012-03-01
JP2012-004634 2012-03-01
JP2012004632 2012-03-01

Publications (1)

Publication Number Publication Date
USD699607S1 true USD699607S1 (en) 2014-02-18

Family

ID=50072488

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/431,034 Active USD699607S1 (en) 2012-03-01 2012-08-31 Contact probe

Country Status (1)

Country Link
US (1) USD699607S1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140247065A1 (en) * 2011-08-02 2014-09-04 Nhk Spring Co., Ltd. Probe unit
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD983056S1 (en) * 2019-12-13 2023-04-11 Gened Co., Ltd. Probe pin
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly
USD1115703S1 (en) * 2023-11-29 2026-03-03 Kabushiki Kaisha Nihon Micronics Electric contact

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4050762A (en) * 1976-11-10 1977-09-27 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
US4417206A (en) * 1981-03-09 1983-11-22 Virginia Panel Corporation Electrical contact probe and method of manufacturing
US4438397A (en) * 1979-12-26 1984-03-20 Teradyne, Inc. Test pin
US4885533A (en) * 1988-09-09 1989-12-05 Q A Technology Company, Inc. Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
USD400811S (en) 1997-11-21 1998-11-10 Delaware Capital Formation, Inc. Test probe plunger tip
US6053777A (en) * 1998-01-05 2000-04-25 Rika Electronics International, Inc. Coaxial contact assembly apparatus
US6159056A (en) * 1998-11-25 2000-12-12 Rika Electronics International, Inc. Electrical contact assembly for interconnecting test apparatus and the like
JP2002357622A (en) 2001-05-31 2002-12-13 Yamaichi Electronics Co Ltd Contact probe and IC socket
US7253647B2 (en) * 2004-05-17 2007-08-07 Chae Yoon Lee Probe for high electric current
JP2010038612A (en) 2008-08-01 2010-02-18 Hioki Ee Corp Contact probe
US20120122355A1 (en) 2010-06-23 2012-05-17 Yamaichi Electronics Co., Ltd. Contact head, probe pin including the same, and electrical connector using the probe pin

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4050762A (en) * 1976-11-10 1977-09-27 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
US4438397A (en) * 1979-12-26 1984-03-20 Teradyne, Inc. Test pin
US4417206A (en) * 1981-03-09 1983-11-22 Virginia Panel Corporation Electrical contact probe and method of manufacturing
US4885533A (en) * 1988-09-09 1989-12-05 Q A Technology Company, Inc. Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
US4885533B1 (en) * 1988-09-09 1998-11-03 Qa Technology Co Inc Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
USD400811S (en) 1997-11-21 1998-11-10 Delaware Capital Formation, Inc. Test probe plunger tip
US6053777A (en) * 1998-01-05 2000-04-25 Rika Electronics International, Inc. Coaxial contact assembly apparatus
US6159056A (en) * 1998-11-25 2000-12-12 Rika Electronics International, Inc. Electrical contact assembly for interconnecting test apparatus and the like
JP2002357622A (en) 2001-05-31 2002-12-13 Yamaichi Electronics Co Ltd Contact probe and IC socket
US7253647B2 (en) * 2004-05-17 2007-08-07 Chae Yoon Lee Probe for high electric current
JP2010038612A (en) 2008-08-01 2010-02-18 Hioki Ee Corp Contact probe
US20120122355A1 (en) 2010-06-23 2012-05-17 Yamaichi Electronics Co., Ltd. Contact head, probe pin including the same, and electrical connector using the probe pin

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140247065A1 (en) * 2011-08-02 2014-09-04 Nhk Spring Co., Ltd. Probe unit
US9702905B2 (en) * 2011-08-02 2017-07-11 Nhk Spring Co., Ltd. Probe unit
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD983056S1 (en) * 2019-12-13 2023-04-11 Gened Co., Ltd. Probe pin
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly
USD1117092S1 (en) 2023-01-12 2026-03-10 Johnstech International Corporation Spring probe contact
USD1117094S1 (en) 2023-01-12 2026-03-10 Johnstech International Corporation Spring probe contact
USD1117077S1 (en) 2023-01-12 2026-03-10 Johnstech International Corporation Spring probe contact
USD1117091S1 (en) 2023-01-12 2026-03-10 Johnstech International Corporation Spring probe
USD1117093S1 (en) 2023-01-12 2026-03-10 Johnstech International Corporation Spring probe contact
USD1115703S1 (en) * 2023-11-29 2026-03-03 Kabushiki Kaisha Nihon Micronics Electric contact

Similar Documents

Publication Publication Date Title
USD900330S1 (en) Instrument
USD838370S1 (en) Electrocardiography monitor
USD704581S1 (en) Breath alcohol tester
USD718455S1 (en) Finger tip oximeter
USD750077S1 (en) Monitor
USD671858S1 (en) Wristband
USD732029S1 (en) Monitor for computer
USD689494S1 (en) Mouse
USD696886S1 (en) Chair
USD722697S1 (en) Blood glucose meter
USD711530S1 (en) Nozzle
USD647117S1 (en) Hole cutter tip
USD729939S1 (en) Blood glucose meter
USD690342S1 (en) Microscope
USD688072S1 (en) Instrument stand
USD695792S1 (en) Joystick
USD624893S1 (en) Display
USD723029S1 (en) Computer integrated with a monitor
USD714287S1 (en) Personal computer
USD719148S1 (en) Notebook computer
USD672770S1 (en) Display
USD707291S1 (en) Writing instrument
USD623156S1 (en) Display
USD688243S1 (en) Mouse
USD735998S1 (en) Toothbrush