USD699607S1 - Contact probe - Google Patents
Contact probe Download PDFInfo
- Publication number
- USD699607S1 USD699607S1 US29/431,034 US201229431034F USD699607S US D699607 S1 USD699607 S1 US D699607S1 US 201229431034 F US201229431034 F US 201229431034F US D699607 S USD699607 S US D699607S
- Authority
- US
- United States
- Prior art keywords
- view
- contact probe
- section
- tip side
- enlarged view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
The portions of the article in broken lines are shown for illustrative purposes only and form no part of the claimed design.
Claims (1)
- The ornamental design(s) for a contact probe, as shown and described.
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012-004632 | 2012-01-13 | ||
| JP2012004633 | 2012-03-01 | ||
| JP2012-004631 | 2012-03-01 | ||
| JP2012004634 | 2012-03-01 | ||
| JP2012004631 | 2012-03-01 | ||
| JP2012-004633 | 2012-03-01 | ||
| JP2012-004634 | 2012-03-01 | ||
| JP2012004632 | 2012-03-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD699607S1 true USD699607S1 (en) | 2014-02-18 |
Family
ID=50072488
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/431,034 Active USD699607S1 (en) | 2012-03-01 | 2012-08-31 | Contact probe |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD699607S1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140247065A1 (en) * | 2011-08-02 | 2014-09-04 | Nhk Spring Co., Ltd. | Probe unit |
| USD769753S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
| USD983056S1 (en) * | 2019-12-13 | 2023-04-11 | Gened Co., Ltd. | Probe pin |
| USD1090440S1 (en) * | 2023-01-12 | 2025-08-26 | Johnstech International Corporation | Spring probe contact assembly |
| USD1115703S1 (en) * | 2023-11-29 | 2026-03-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4050762A (en) * | 1976-11-10 | 1977-09-27 | Everett/Charles, Inc. | Telescoping spring probe having separate wiper contact member |
| US4417206A (en) * | 1981-03-09 | 1983-11-22 | Virginia Panel Corporation | Electrical contact probe and method of manufacturing |
| US4438397A (en) * | 1979-12-26 | 1984-03-20 | Teradyne, Inc. | Test pin |
| US4885533A (en) * | 1988-09-09 | 1989-12-05 | Q A Technology Company, Inc. | Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region |
| US5032787A (en) * | 1989-11-03 | 1991-07-16 | Everett/Charles Contact Products, Inc. | Electrical test probe having rotational control of the probe shaft |
| USD400811S (en) | 1997-11-21 | 1998-11-10 | Delaware Capital Formation, Inc. | Test probe plunger tip |
| US6053777A (en) * | 1998-01-05 | 2000-04-25 | Rika Electronics International, Inc. | Coaxial contact assembly apparatus |
| US6159056A (en) * | 1998-11-25 | 2000-12-12 | Rika Electronics International, Inc. | Electrical contact assembly for interconnecting test apparatus and the like |
| JP2002357622A (en) | 2001-05-31 | 2002-12-13 | Yamaichi Electronics Co Ltd | Contact probe and IC socket |
| US7253647B2 (en) * | 2004-05-17 | 2007-08-07 | Chae Yoon Lee | Probe for high electric current |
| JP2010038612A (en) | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | Contact probe |
| US20120122355A1 (en) | 2010-06-23 | 2012-05-17 | Yamaichi Electronics Co., Ltd. | Contact head, probe pin including the same, and electrical connector using the probe pin |
-
2012
- 2012-08-31 US US29/431,034 patent/USD699607S1/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4050762A (en) * | 1976-11-10 | 1977-09-27 | Everett/Charles, Inc. | Telescoping spring probe having separate wiper contact member |
| US4438397A (en) * | 1979-12-26 | 1984-03-20 | Teradyne, Inc. | Test pin |
| US4417206A (en) * | 1981-03-09 | 1983-11-22 | Virginia Panel Corporation | Electrical contact probe and method of manufacturing |
| US4885533A (en) * | 1988-09-09 | 1989-12-05 | Q A Technology Company, Inc. | Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region |
| US4885533B1 (en) * | 1988-09-09 | 1998-11-03 | Qa Technology Co Inc | Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region |
| US5032787A (en) * | 1989-11-03 | 1991-07-16 | Everett/Charles Contact Products, Inc. | Electrical test probe having rotational control of the probe shaft |
| USD400811S (en) | 1997-11-21 | 1998-11-10 | Delaware Capital Formation, Inc. | Test probe plunger tip |
| US6053777A (en) * | 1998-01-05 | 2000-04-25 | Rika Electronics International, Inc. | Coaxial contact assembly apparatus |
| US6159056A (en) * | 1998-11-25 | 2000-12-12 | Rika Electronics International, Inc. | Electrical contact assembly for interconnecting test apparatus and the like |
| JP2002357622A (en) | 2001-05-31 | 2002-12-13 | Yamaichi Electronics Co Ltd | Contact probe and IC socket |
| US7253647B2 (en) * | 2004-05-17 | 2007-08-07 | Chae Yoon Lee | Probe for high electric current |
| JP2010038612A (en) | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | Contact probe |
| US20120122355A1 (en) | 2010-06-23 | 2012-05-17 | Yamaichi Electronics Co., Ltd. | Contact head, probe pin including the same, and electrical connector using the probe pin |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140247065A1 (en) * | 2011-08-02 | 2014-09-04 | Nhk Spring Co., Ltd. | Probe unit |
| US9702905B2 (en) * | 2011-08-02 | 2017-07-11 | Nhk Spring Co., Ltd. | Probe unit |
| USD769753S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
| USD983056S1 (en) * | 2019-12-13 | 2023-04-11 | Gened Co., Ltd. | Probe pin |
| USD1090440S1 (en) * | 2023-01-12 | 2025-08-26 | Johnstech International Corporation | Spring probe contact assembly |
| USD1117092S1 (en) | 2023-01-12 | 2026-03-10 | Johnstech International Corporation | Spring probe contact |
| USD1117094S1 (en) | 2023-01-12 | 2026-03-10 | Johnstech International Corporation | Spring probe contact |
| USD1117077S1 (en) | 2023-01-12 | 2026-03-10 | Johnstech International Corporation | Spring probe contact |
| USD1117091S1 (en) | 2023-01-12 | 2026-03-10 | Johnstech International Corporation | Spring probe |
| USD1117093S1 (en) | 2023-01-12 | 2026-03-10 | Johnstech International Corporation | Spring probe contact |
| USD1115703S1 (en) * | 2023-11-29 | 2026-03-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| USD900330S1 (en) | Instrument | |
| USD838370S1 (en) | Electrocardiography monitor | |
| USD704581S1 (en) | Breath alcohol tester | |
| USD718455S1 (en) | Finger tip oximeter | |
| USD750077S1 (en) | Monitor | |
| USD671858S1 (en) | Wristband | |
| USD732029S1 (en) | Monitor for computer | |
| USD689494S1 (en) | Mouse | |
| USD696886S1 (en) | Chair | |
| USD722697S1 (en) | Blood glucose meter | |
| USD711530S1 (en) | Nozzle | |
| USD647117S1 (en) | Hole cutter tip | |
| USD729939S1 (en) | Blood glucose meter | |
| USD690342S1 (en) | Microscope | |
| USD688072S1 (en) | Instrument stand | |
| USD695792S1 (en) | Joystick | |
| USD624893S1 (en) | Display | |
| USD723029S1 (en) | Computer integrated with a monitor | |
| USD714287S1 (en) | Personal computer | |
| USD719148S1 (en) | Notebook computer | |
| USD672770S1 (en) | Display | |
| USD707291S1 (en) | Writing instrument | |
| USD623156S1 (en) | Display | |
| USD688243S1 (en) | Mouse | |
| USD735998S1 (en) | Toothbrush |