USD400811S - Test probe plunger tip - Google Patents
Test probe plunger tip Download PDFInfo
- Publication number
- USD400811S USD400811S US29/079,957 US7995797F USD400811S US D400811 S USD400811 S US D400811S US 7995797 F US7995797 F US 7995797F US D400811 S USD400811 S US D400811S
- Authority
- US
- United States
- Prior art keywords
- test probe
- plunger tip
- probe plunger
- tip
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a perspective view of the test probe plunger tip showing the new design;
FIG. 2 is a left side elevational view of the embodiment of FIG. 1;
FIG. 3 is a front elevational view of the embodiment of FIG. 1;
FIG. 4 is a right side elevational view of the embodiment of FIG. 1;
FIG. 5 is a back elevational view of the embodiment of FIG. 1;
FIG. 6 is a bottom elevational view of the embodiment of FIG. 1; and,
FIG. 7 is a top elevational view of the embodiment of FIG. 1.
Claims (1)
- The ornamental design for a test probe plunger tip, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/079,957 USD400811S (en) | 1997-11-21 | 1997-11-21 | Test probe plunger tip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/079,957 USD400811S (en) | 1997-11-21 | 1997-11-21 | Test probe plunger tip |
Publications (1)
Publication Number | Publication Date |
---|---|
USD400811S true USD400811S (en) | 1998-11-10 |
Family
ID=71573602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/079,957 Expired - Lifetime USD400811S (en) | 1997-11-21 | 1997-11-21 | Test probe plunger tip |
Country Status (1)
Country | Link |
---|---|
US (1) | USD400811S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002010784A1 (en) * | 2000-07-31 | 2002-02-07 | Lecroy Corporation | Notched electrical test probe tip |
USD769753S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
-
1997
- 1997-11-21 US US29/079,957 patent/USD400811S/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002010784A1 (en) * | 2000-07-31 | 2002-02-07 | Lecroy Corporation | Notched electrical test probe tip |
US6538424B1 (en) | 2000-07-31 | 2003-03-25 | Le Croy Corporation | Notched electrical test probe tip |
US20030189437A1 (en) * | 2000-07-31 | 2003-10-09 | Lecroy Corporation | Notched electrical test probe tip |
US6809535B2 (en) | 2000-07-31 | 2004-10-26 | Lecroy Corporation | Notched electrical test probe tip |
US20050052193A1 (en) * | 2000-07-31 | 2005-03-10 | Lecroy Corporation | Notched electrical test probe tip |
US7140105B2 (en) | 2000-07-31 | 2006-11-28 | Lecroy Corporation | Method of fabricating a notched electrical test probe tip |
USD769753S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
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