USD427088S - Wafer level burn-in tester - Google Patents
Wafer level burn-in tester Download PDFInfo
- Publication number
- USD427088S USD427088S US29/114,644 US11464499F USD427088S US D427088 S USD427088 S US D427088S US 11464499 F US11464499 F US 11464499F US D427088 S USD427088 S US D427088S
- Authority
- US
- United States
- Prior art keywords
- tester
- wafer level
- level burn
- burn
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a perspective view of the top, front and right side of a wafer level burn-in tester showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a right side view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a rear view thereof.
Claims (1)
- The ornamental design for a wafer level burn-in tester, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11-18322 | 1999-07-09 | ||
| JP1832299 | 1999-07-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD427088S true USD427088S (en) | 2000-06-27 |
Family
ID=71780506
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/114,644 Expired - Lifetime USD427088S (en) | 1999-07-09 | 1999-11-29 | Wafer level burn-in tester |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD427088S (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
| USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
| USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
| US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
| US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
-
1999
- 1999-11-29 US US29/114,644 patent/USD427088S/en not_active Expired - Lifetime
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
| USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
| USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
| US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
| US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| USD438311S1 (en) | Strip for blood test | |
| USD425608S (en) | Sanitary slide bar | |
| USD412448S (en) | Measuring cup | |
| USD433600S (en) | Bowl | |
| USD494279S1 (en) | Urine test device | |
| USD431867S (en) | Immunoassay test device | |
| USD404663S (en) | Measuring cup | |
| USD445909S1 (en) | Cuvette | |
| USD431724S (en) | Air-cushioned loveseat | |
| USD420141S (en) | Drug test card | |
| USD413537S (en) | Test instrument | |
| USD430285S (en) | Tablet | |
| USD450928S1 (en) | Toothbrush | |
| USD426785S (en) | Wafer level burn-in tester | |
| USD430499S (en) | Watthour meter | |
| USD476088S1 (en) | Test tube receptacle | |
| USD410203S (en) | Voltage tester | |
| USD435256S (en) | Case for semiconductor element | |
| USD433854S (en) | Ergonomic stool | |
| USD433691S (en) | Ice tray | |
| USD427088S (en) | Wafer level burn-in tester | |
| USD418171S (en) | Display chip | |
| USD434907S (en) | Toothbrush | |
| USD434788S (en) | Eyewear | |
| USD423377S (en) | Radiation detecting probe |