USD427088S - Wafer level burn-in tester - Google Patents
Wafer level burn-in tester Download PDFInfo
- Publication number
- USD427088S USD427088S US29/114,644 US11464499F USD427088S US D427088 S USD427088 S US D427088S US 11464499 F US11464499 F US 11464499F US D427088 S USD427088 S US D427088S
- Authority
- US
- United States
- Prior art keywords
- tester
- wafer level
- level burn
- burn
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a perspective view of the top, front and right side of a wafer level burn-in tester showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a right side view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a rear view thereof.
Claims (1)
- The ornamental design for a wafer level burn-in tester, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11-18322 | 1999-07-09 | ||
JP1832299 | 1999-07-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD427088S true USD427088S (en) | 2000-06-27 |
Family
ID=71780506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/114,644 Expired - Lifetime USD427088S (en) | 1999-07-09 | 1999-11-29 | Wafer level burn-in tester |
Country Status (1)
Country | Link |
---|---|
US (1) | USD427088S (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
-
1999
- 1999-11-29 US US29/114,644 patent/USD427088S/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
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