USD426522S - Contactor for semiconductor IC testers - Google Patents

Description

FIG. 1 is a perspective view of another embodiment of FIG. 1;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1, the rear elevational view being a mirror image of the front elevational view;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view being a mirror image of the left side view; and,

FIG. 6 is a center horizontal cross-sectional view in an enlarged scale of FIG. 2.

Claims (1)

1. The ornamental design for a contactor for semiconductor IC testers, as shown and described.

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