US8040747B2 - Circuit and method for controlling precharge in semiconductor memory apparatus - Google Patents
Circuit and method for controlling precharge in semiconductor memory apparatus Download PDFInfo
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- US8040747B2 US8040747B2 US12/650,536 US65053609A US8040747B2 US 8040747 B2 US8040747 B2 US 8040747B2 US 65053609 A US65053609 A US 65053609A US 8040747 B2 US8040747 B2 US 8040747B2
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- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims abstract description 12
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
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- Various aspects of the present disclosure generally relate to a semiconductor memory apparatus, and more particularly, to a circuit and a method for controlling precharge in a semiconductor memory apparatus.
- a semiconductor memory apparatus typically receives an external command and performs active and precharge operations.
- the semiconductor memory apparatus performs a read operation or a write operation in the active operation.
- data is outputted from memory cells, and in the write operation, data is inputted to memory cells.
- the semiconductor memory apparatus has a precharge control circuit which precharges the respective signal lines between active intervals.
- one precharge control circuit may be provided for each memory bank and is configured to generate auto precharge signals in precharge operations for read operations (hereafter referred to as “read precharge operation”) and in precharge operations for write operations (hereafter referred to as “write precharge operation”).
- the precharge control circuit may have a read precharge control unit and a write precharge control unit.
- the precharge control circuit generates a burst clock signal using an internal clock signal and generates a read auto precharge signal through the read precharge control unit by using the burst clock signal and burst length information in a read operation.
- the precharge control circuit generates a write auto precharge signal through the write precharge control unit by using the burst clock signal, the burst length information, and write latency information in a write operation.
- the precharge control circuit may combine the read auto precharge signal, the write auto precharge signal, and bank information to generate an auto precharge signal, and transmits the generated auto precharge signal to a corresponding memory bank.
- FIG. 1 shows waveforms of a read write mode signal rdwt which distinguishes a read operation and a write operation, a data input off signal dioff which indicates an interval during which data is not inputted, and a burst clock signal bclk.
- the read write mode signal rdwt indicates a read operation mode at a low level and a write operation mode at a high level.
- the data input off signal dioff is enabled to a high level during an interval in which data is not inputted to the memory bank, that is, in an all bank idle mode or a refresh mode.
- the burst clock signal bclk is a clock signal that is inputted to the read precharge control unit and the write precharge control unit.
- the write precharge control unit need not be activated. Also, the write precharge control unit need not be activated during an interval in which the data input off signal dioff is enabled since a data input operation is not actually performed during that time. As shown in the drawing, however, the burst clock signal bclk is implemented to constantly toggle and such constant toggling configuration makes the activated burst clock signal bclk resulting from such constant toggling implementation makes the write precharge control unit be activated as well.
- the precharge control circuit of a related art semiconductor memory apparatus is configured such that the write precharge control unit is activated even under situations where a write operation mode is not performed, thereby increasing power consumption.
- precharge control circuits are provided in a number corresponding to the number of memory banks, the increased power consumption lowers power utilization efficiency of the entire semiconductor memory apparatus.
- various aspects of the present invention may provide a circuit and a method for controlling precharge in a semiconductor memory apparatus which can reduce power consumption.
- one exemplary aspect of the invention may provide a circuit for controlling precharge in a semiconductor memory apparatus comprising: a read clock driver configured to drive an internal clock signal and generate a read burst clock signal; a read precharge control unit configured to generate a read auto precharge signal in response to the read burst clock signal, a burst end signal, and a read write mode signal wherein the read write mode signal has different potential levels in a read operation mode and a write operation mode; a write clock driver configured to drive the internal clock signal and generate a write burst clock signal in response to the read write mode signal and a data input off signal; a write precharge control unit configured to generate a write auto precharge signal in response to the write burst clock signal, the burst end signal, a write latency signal, and a write address combination signal; and a precharge signal generation unit configured to combine the read auto precharge signal and the write auto precharge signal in response to
- a circuit for controlling precharge in a semiconductor memory apparatus may comprise a read clock driver configured to drive an internal clock signal and generate a read burst clock signal; a write clock driver configured to drive the internal clock signal and generate a write burst clock signal in response to a read write mode signal and a data input off signal; and a precharge control unit configured to generate an auto precharge signal by using the read burst clock signal in a read operation and the write burst clock signal in a write operation, wherein the write clock driver is configured to toggle the write burst clock signal when the read write mode signal indicates a write operation mode and the data input off signal is disabled.
- a method for controlling precharge in a semiconductor memory apparatus may comprise: a) generating a read burst clock signal by driving an internal clock signal; b) generating an auto precharge signal in a read operation by using the read burst clock signal, a bank active signal, and a burst end signal that is enabled in the form of a pulse when a time corresponding to a preset burst length passes during data input and output operations of the semiconductor memory apparatus; c) generating a write burst clock signal by driving the internal clock signal in a write operation; and d) generating the auto precharge signal using the write burst clock signal, the burst end signal, and the bank active signal, wherein the step c) is a step of toggling the write burst clock signal when a data input off signal is disabled in a write operation.
- a circuit for controlling precharge in a semiconductor memory apparatus may comprise a read clock driver configured to drive an internal clock signal and generate a read burst clock signal; a write clock driver configured to provide the internal clock signal as a write burst clock signal in response to a read write mode signal and a data input off signal and inactivate the write burst clock signal when the data input off signal is enabled; a read precharge control unit configured to provide a read auto precharge signal in response to the read write mode signal and the read burst clock signal; and a write precharge control unit configured to provide a write auto precharge signal in response to the read write mode signal and the write burst clock signal, wherein the write precharge control unit is inactivated in response to the inactivated write burst clock signal.
- a circuit for controlling precharge in a semiconductor memory apparatus may comprise a read clock driver configured to drive an internal clock signal and generate a read burst clock signal; a write clock driver configured to drive the internal clock signal and generate a write burst clock signal in response to a read write mode signal and a data input off signal, and inactivate the write burst clock signal when the data input off signal is enabled; and a precharge control unit configured to generate an auto precharge signal by using the read burst clock signal in a read operation and the write burst clock signal in a write operation.
- a method for controlling precharge in a semiconductor memory apparatus may comprise: a) generating a read burst clock signal by driving an internal clock signal; b) generating an auto precharge signal in a read operation by using the read burst clock signal, a bank active signal, and a burst end signal that is enabled in the form of a pulse when a time corresponding to a preset burst length passes during data input and output operations of the semiconductor memory apparatus; c) determining whether to provide the internal clock signal as a write burst clock signal that toggles in response to a data input off signal in a write operation; and d) generating the auto precharge signal using the write burst clock signal, the burst end signal, and the bank active signal.
- FIG. 1 is a timing diagram explaining an operation of a conventional circuit for controlling precharge in a semiconductor memory apparatus.
- FIG. 2 is a block diagram illustrating a configuration of a circuit for controlling precharge in a semiconductor memory apparatus in accordance with an embodiment of the present invention.
- FIG. 3 is a circuit diagram illustrating a detailed configuration of a write clock driver shown in FIG. 2 .
- FIG. 4 is a timing diagram explaining an operation of a circuit for controlling precharge in a semiconductor memory apparatus in accordance with the embodiment of the present invention.
- FIG. 2 is a block diagram illustrating a configuration of a circuit for controlling precharge in a semiconductor memory apparatus in accordance with an embodiment of the present invention.
- a precharge control circuit in accordance with an embodiment of the present invention includes a read clock driver 10 configured to drive an internal clock signal clk_int to generate a read burst clock signal rd_bclk; a read precharge control unit 20 configured to generate a read auto precharge signal rdpcg in response to the read burst clock signal rd_bclk, a burst end signal bstend, a read write mode signal rdwt, and a reset signal rst; a write clock driver 30 configured to drive the internal clock signal clk_int to generate a write burst clock signal wt_bclk in response to the read write mode signal rdwt and a data input off signal dioff; a write precharge control unit 40 configured to generate a write auto precharge signal wtpcg in response to the write burst clock signal wt_bclk, the burst end signal bstend
- the internal clock signal clk_int is inputted through a buffer from the outside of a semiconductor memory apparatus and is used in various parts of the semiconductor memory apparatus.
- the internal clock signal clk_int is driven by the read clock driver 10 and the write clock driver 30 to respectively generate the read burst clock signal rd_bclk and the write burst clock signal wt_bclk.
- the read clock driver 10 has a configuration that can be easily implemented in the form of a typical clock driver.
- the burst end signal bstend is used to apply a preset burst length to the precharge control circuit in data input and output operations of the semiconductor memory apparatus.
- the burst end signal bstend is enabled in the form of a pulse.
- the reset signal rst is enabled in the form of a pulse, the read precharge control unit 20 initializes the state of the read auto precharge signal rdpcg.
- the burst end signal bstend is delayed by a preset time in response to the read burst clock signal rd_bclk and is outputted as the read auto precharge signal rdpcg.
- the write clock driver 30 performs an operation of driving the internal clock signal clk_int to generate a write burst clock signal wt_bclk.
- the write clock driver 30 is not activated when the read write mode signal rdwt indicates a read operation mode or the data input off signal dioff is enabled.
- the data input off signal dioff is enabled to a high level during an interval when data is not inputted to a memory bank, that is, in an all bank idle mode or a refresh mode.
- the write clock driver 30 is activated only when a data input operation is actually performed in a write operation mode, and allows the write burst clock signal wt_bclk to periodically toggle.
- the write latency signal wltc allows the write precharge control unit 40 to operate according to a preset write latency.
- the write latency signal wltc is a combination of a plurality of signals and can be implemented in a manner such that only one signal is enabled depending on the length of the write latency.
- the write address combination signal wac is generated by combing an address indicating an all bank precharge operation or an auto precharge operation with the read write mode signal rdwt, and is enabled in an all bank precharge mode or an auto precharge mode before a write operation.
- the bank address signal badd indicates whether a corresponding memory bank is to be activated or not.
- the write precharge control unit 40 can be activated only when the bank address signal badd is enabled.
- the write precharge control unit 40 delays the burst end signal bstend in response to the write burst clock signal wt_bclk after the reset signal rst is enabled and the state of the write auto precharge signal wtpcg is initialized.
- the write precharge control unit 40 can be implemented in the form of a shift register.
- the write latency signal wltc determines the number of periods the write burst clock signal wt_bclk is shifted before the burst end signal bstend is outputted as the write auto precharge signal wtpcg.
- the write precharge control unit 40 performs an operation of shifting the burst end signal bstend using the write burst clock signal wt_bclk. In a read operation mode, although a write auto precharge signal wtpcg is not enabled, the shifting operation can be continuously performed in the write precharge control unit 40 . Thus, when the write precharge control unit 40 performs the shifting operation in a read operation mode or during an interval when data input operations are not actually performed, unnecessary power consumption is caused.
- the write clock driver 30 since the write clock driver 30 is inactivated during the interval when data input operations are not actually performed and controls the write burst clock signal wt_bclk to not toggle, the write precharge control unit 40 is not activated and unnecessary power consumption of the precharge control circuit can be reduced.
- the precharge signal generation unit 50 performs a logical OR operation of the read auto precharge signal rdpcg and the write auto precharge signal wtpcg.
- the precharge signal generation unit 50 outputs a signal generated through the logical OR operation as the auto precharge signal pcg under the control of the bank active signal ba, a command pulse signal cmp, and a precharge delay signal pcgdly.
- the bank active signal ba is enabled when the corresponding memory bank is in an active mode or a refresh mode.
- the command pulse signal cmp indicates a read operation and a write operation of the corresponding memory bank.
- the precharge delay signal pcgd delays the generation of the auto precharge signal pcg until a precharge operation is actually performed after a precharge command is inputted and thereby improves the stability of the precharge operation.
- the read precharge control unit 20 , the write precharge control unit 40 , and the precharge signal generation unit 50 can be collectively referred to as a precharge control unit 60 .
- the precharge control unit 60 generates an auto precharge signal pcg by using the read burst clock signal rd_bclk in a read operation and the write burst clock signal wt_bclk in a write operation.
- FIG. 3 is a circuit diagram illustrating a detailed configuration of the write clock driver shown in FIG. 2 .
- the write clock driver 30 includes a clock enable unit 310 configured to combine the read write mode signal rdwt with the data input off signal dioff to generate a clock enable signal clken; and a clock driving unit 320 configured to drive the internal clock signal clk_int in response to the clock enable signal clken to generate the write burst clock signal wt_bclk.
- the clock enable unit 310 includes an inverter IV configured to receive the data input off signal dioff, and a NAND gate ND configured to receive the read write mode signal rdwt and an output signal of the inverter IV and output the clock enable signal clken.
- the clock driving unit 320 includes a NOR gate NR configured to receive the internal clock signal clk_int and the clock enable signal clken to output the write burst clock signal wt_bclk.
- the clock enable signal clken is implemented as a low enable signal.
- the clock enable unit 310 disables the clock enable signal clken to a high level. Also, when the data input off signal dioff is enabled to a high level, the clock enable unit 310 disables the clock enable signal clken. In these cases, the clock driving unit 320 disables the write burst clock signal wt_bclk irrespective of the input of the internal clock signal clk_int.
- the clock enable unit 310 enables the clock enable signal clken.
- the write burst clock signal wt_bclk outputted from the clock driving unit 320 has a form in which the internal clock signal clk_int is inverted and delayed.
- FIG. 4 is a timing diagram explaining an operation of the circuit for controlling precharge in a semiconductor memory apparatus in accordance with the embodiment of the present invention.
- FIG. 4 shows waveforms of the read write mode signal rdwt, the data input off signal dioff, and the write burst clock signal wt_bclk.
- the write burst clock signal wt_bclk toggles. However, when the data input off signal dioff is enabled, the write burst clock signal wt_bclk is disabled to a low level.
- the write burst clock signal wt_bclk is disabled irrespective of the state of the data input off signal dioff.
- the write burst clock signal wt_bclk is activated only when data input operation is actually performed.
- the waveform of the write burst clock signal wt_bclk with that shown in FIG. 1 illustrating the related art, the effect of power consumption reduction according to the present invention can be readily appreciated.
- a write burst clock signal is disabled during an interval when a data input operation is not actually performed, and thus a write precharge control unit is inactivated and unnecessary power consumption is reduced.
- a write clock driver and the write precharge control unit are each provided correspondingly to the number of memory banks, the power consumption of the semiconductor memory apparatus can be significantly reduced because the write burst clock signal is disabled at certain intervals.
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Cited By (2)
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US20100329041A1 (en) * | 2009-06-30 | 2010-12-30 | Young-Soo Sohn | Semiconductor memory device having power-saving effect |
US20110126039A1 (en) * | 2009-11-20 | 2011-05-26 | Si-Hong Kim | Memory controller with reduced power consumption, memory device, and memory system |
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US10163474B2 (en) * | 2016-09-22 | 2018-12-25 | Qualcomm Incorporated | Apparatus and method of clock shaping for memory |
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KR20180049502A (en) | 2016-11-03 | 2018-05-11 | 삼성전자주식회사 | Semiconductor memory devices and methods of operating semiconductor memory devices |
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