US7243282B2 - Method and apparatus for implementing multiple remote diagnose register chains - Google Patents
Method and apparatus for implementing multiple remote diagnose register chains Download PDFInfo
- Publication number
- US7243282B2 US7243282B2 US10/207,512 US20751202A US7243282B2 US 7243282 B2 US7243282 B2 US 7243282B2 US 20751202 A US20751202 A US 20751202A US 7243282 B2 US7243282 B2 US 7243282B2
- Authority
- US
- United States
- Prior art keywords
- rdr
- identified
- chain
- register
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related, expires
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (25)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/207,512 US7243282B2 (en) | 2002-07-29 | 2002-07-29 | Method and apparatus for implementing multiple remote diagnose register chains |
JP2003273149A JP2004062906A (en) | 2002-07-29 | 2003-07-11 | Method and device for executing two or more remote diagnostic register chains |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/207,512 US7243282B2 (en) | 2002-07-29 | 2002-07-29 | Method and apparatus for implementing multiple remote diagnose register chains |
Publications (2)
Publication Number | Publication Date |
---|---|
US20040019829A1 US20040019829A1 (en) | 2004-01-29 |
US7243282B2 true US7243282B2 (en) | 2007-07-10 |
Family
ID=30770453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/207,512 Expired - Fee Related US7243282B2 (en) | 2002-07-29 | 2002-07-29 | Method and apparatus for implementing multiple remote diagnose register chains |
Country Status (2)
Country | Link |
---|---|
US (1) | US7243282B2 (en) |
JP (1) | JP2004062906A (en) |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5333139A (en) | 1992-12-30 | 1994-07-26 | Intel Corporation | Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain |
US5377199A (en) | 1993-06-30 | 1994-12-27 | Intel Corporation | Boundary test scheme for an intelligent device |
US5434804A (en) | 1993-12-29 | 1995-07-18 | Intel Corporation | Method and apparatus for synchronizing a JTAG test control signal to an on-chip clock signal |
US5448525A (en) | 1994-03-10 | 1995-09-05 | Intel Corporation | Apparatus for configuring a subset of an integrated circuit having boundary scan circuitry connected in series and a method thereof |
US5644609A (en) * | 1996-07-31 | 1997-07-01 | Hewlett-Packard Company | Apparatus and method for reading and writing remote registers on an integrated circuit chip using a minimum of interconnects |
US5768289A (en) | 1997-05-22 | 1998-06-16 | Intel Corporation | Dynamically controlling the number of boundary-scan cells in a boundary-scan path |
US5867644A (en) * | 1996-09-10 | 1999-02-02 | Hewlett Packard Company | System and method for on-chip debug support and performance monitoring in a microprocessor |
US5956476A (en) * | 1996-10-31 | 1999-09-21 | Hewlett Packard Company | Circuitry and method for detecting signal patterns on a bus using dynamically changing expected patterns |
US6009539A (en) * | 1996-11-27 | 1999-12-28 | Hewlett-Packard Company | Cross-triggering CPUs for enhanced test operations in a multi-CPU computer system |
US6038651A (en) * | 1998-03-23 | 2000-03-14 | International Business Machines Corporation | SMP clusters with remote resource managers for distributing work to other clusters while reducing bus traffic to a minimum |
US6175518B1 (en) * | 1999-03-30 | 2001-01-16 | Hewlett-Packard Company | Remote register hierarchy accessible using a serial data line |
US6266793B1 (en) | 1999-02-26 | 2001-07-24 | Intel Corporation | JTAG boundary scan cell with enhanced testability feature |
US6321320B1 (en) * | 1998-10-30 | 2001-11-20 | Hewlett-Packard Company | Flexible and programmable BIST engine for on-chip memory array testing and characterization |
US6374370B1 (en) * | 1998-10-30 | 2002-04-16 | Hewlett-Packard Company | Method and system for flexible control of BIST registers based upon on-chip events |
US6691270B2 (en) * | 2000-12-22 | 2004-02-10 | Arm Limited | Integrated circuit and method of operation of such a circuit employing serial test scan chains |
-
2002
- 2002-07-29 US US10/207,512 patent/US7243282B2/en not_active Expired - Fee Related
-
2003
- 2003-07-11 JP JP2003273149A patent/JP2004062906A/en not_active Withdrawn
Patent Citations (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5333139A (en) | 1992-12-30 | 1994-07-26 | Intel Corporation | Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain |
US5377199A (en) | 1993-06-30 | 1994-12-27 | Intel Corporation | Boundary test scheme for an intelligent device |
US5434804A (en) | 1993-12-29 | 1995-07-18 | Intel Corporation | Method and apparatus for synchronizing a JTAG test control signal to an on-chip clock signal |
US5448525A (en) | 1994-03-10 | 1995-09-05 | Intel Corporation | Apparatus for configuring a subset of an integrated circuit having boundary scan circuitry connected in series and a method thereof |
US5491666A (en) | 1994-03-10 | 1996-02-13 | Intel Corporation | Apparatus for configuring a subset of an integrated circuit having boundary scan circuitry connected in series and a method thereof |
US5644609A (en) * | 1996-07-31 | 1997-07-01 | Hewlett-Packard Company | Apparatus and method for reading and writing remote registers on an integrated circuit chip using a minimum of interconnects |
US5867644A (en) * | 1996-09-10 | 1999-02-02 | Hewlett Packard Company | System and method for on-chip debug support and performance monitoring in a microprocessor |
US5956476A (en) * | 1996-10-31 | 1999-09-21 | Hewlett Packard Company | Circuitry and method for detecting signal patterns on a bus using dynamically changing expected patterns |
US6009539A (en) * | 1996-11-27 | 1999-12-28 | Hewlett-Packard Company | Cross-triggering CPUs for enhanced test operations in a multi-CPU computer system |
US5768289A (en) | 1997-05-22 | 1998-06-16 | Intel Corporation | Dynamically controlling the number of boundary-scan cells in a boundary-scan path |
US6038651A (en) * | 1998-03-23 | 2000-03-14 | International Business Machines Corporation | SMP clusters with remote resource managers for distributing work to other clusters while reducing bus traffic to a minimum |
US6321320B1 (en) * | 1998-10-30 | 2001-11-20 | Hewlett-Packard Company | Flexible and programmable BIST engine for on-chip memory array testing and characterization |
US6374370B1 (en) * | 1998-10-30 | 2002-04-16 | Hewlett-Packard Company | Method and system for flexible control of BIST registers based upon on-chip events |
US6266793B1 (en) | 1999-02-26 | 2001-07-24 | Intel Corporation | JTAG boundary scan cell with enhanced testability feature |
US6175518B1 (en) * | 1999-03-30 | 2001-01-16 | Hewlett-Packard Company | Remote register hierarchy accessible using a serial data line |
US6691270B2 (en) * | 2000-12-22 | 2004-02-10 | Arm Limited | Integrated circuit and method of operation of such a circuit employing serial test scan chains |
Also Published As
Publication number | Publication date |
---|---|
JP2004062906A (en) | 2004-02-26 |
US20040019829A1 (en) | 2004-01-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: HEWLETT-PACKARD COMPANY, COLORADO Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SEDMAK, MICHAEL C.;REEL/FRAME:013561/0799 Effective date: 20020725 |
|
AS | Assignment |
Owner name: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P., COLORAD Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HEWLETT-PACKARD COMPANY;REEL/FRAME:013776/0928 Effective date: 20030131 Owner name: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.,COLORADO Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HEWLETT-PACKARD COMPANY;REEL/FRAME:013776/0928 Effective date: 20030131 |
|
AS | Assignment |
Owner name: HEWLETT-PACKARD DEVELOPMENT COMPANY L.P., TEXAS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HEWLETT-PACKARD COMPANY;REEL/FRAME:014061/0492 Effective date: 20030926 Owner name: HEWLETT-PACKARD DEVELOPMENT COMPANY L.P.,TEXAS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HEWLETT-PACKARD COMPANY;REEL/FRAME:014061/0492 Effective date: 20030926 |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
REMI | Maintenance fee reminder mailed | ||
LAPS | Lapse for failure to pay maintenance fees | ||
STCH | Information on status: patent discontinuation |
Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
|
FP | Lapsed due to failure to pay maintenance fee |
Effective date: 20150710 |