US5734158A - LCD panel test apparatus - Google Patents
LCD panel test apparatus Download PDFInfo
- Publication number
- US5734158A US5734158A US08/638,943 US63894396A US5734158A US 5734158 A US5734158 A US 5734158A US 63894396 A US63894396 A US 63894396A US 5734158 A US5734158 A US 5734158A
- Authority
- US
- United States
- Prior art keywords
- lcd panel
- polarizing plate
- polarizing
- test apparatus
- lcd
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 69
- 230000007547 defect Effects 0.000 claims abstract description 31
- 238000012545 processing Methods 0.000 claims abstract description 12
- 238000000034 method Methods 0.000 claims abstract description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims description 5
- 238000010998 test method Methods 0.000 description 10
- 239000013078 crystal Substances 0.000 description 7
- 230000010287 polarization Effects 0.000 description 6
- 238000011179 visual inspection Methods 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Definitions
- This invention relates to an apparatus for testing an LCD (liquid crystal display) panel, and more particularly, to an apparatus for automatically testing an LCD panel to find out defects of the LCD panel by providing a mechanism for changing or rotating polarizing plates.
- an apparatus as shown in FIG. 2 has been used for the various test methods described below.
- the conventional apparatus of FIG. 2 includes a polarizing plate 11 provided above the LCD panel 10 to be tested, a polarizing plate 12 provided below the LCD panel 10, a back light 13 provided under the polarizing plate 12 and a camera 16 to monitor light signals passing through the polarizing plate 11.
- the LCD test apparatus further includes an analog-digital converter 17 to convert an analog signal from the camera 16 into digital data, an image processing CPU 20 which performs a signal processing for the digital data from the analog-digital converter 17, an LCD pattern generator 18 to generate a display pattern for the LCD panel 10 to be tested, an LCD panel driver 15 which provides a drive signal based on the display pattern to drive the LCD panel 10 to be tested through contact units 14.
- the directions of polarization in the polarizing plates 11 and 12 are arranged to be perpendicular with each other so that the light from the back light 13 will not reach the camera 16 when the LCD panel 10 is not inserted between the polarizing plates 11 and 12.
- the light beams from the polarizing plate 12 may be changed their directions by the crystals aligned in the LCD panel.
- the light beams from the polarizing plate 12 may be uniformly polarized by the LCD panel 10.
- the image obtained by the camera 16 for the LCD panel should be uniform.
- the LCD panel 10 has defects such as unevenness of orientations of the liquid crystals in the LCD panel, the light beams are nonuniformly affected by the LCD panel.
- the light beams reaching the camera 16 incorporate such effects caused by the defects of the LCD panel 10.
- the camera 16 obtains an intensity image of the LCD panel 10 propagated through the polarizing plate 11.
- the analog-voltage converter 17 converts the analog data obtained by the camera 16 into digital data so that the CPU 20 can perform a signal processing for the image data.
- signal processing includes an averaging process for determining an average intensity of the light beams received by the camera 16 and a process of determining the intensity difference from the average intensity in each display area.
- the LCD panel is driven by the LCD panel driver 15 through the contact unit 14.
- the LCD panel 10 is set to all white or all black state by the drive signals applied to the contact unit 14. In this situation, all of the crystals in the LCD panel 10 are aligned in the same direction, i.e., a vertical direction in which the light beams are not polarized. Thus, the back light will not reach the camera 16 because of the 90 degrees polarization angle between the plates 11 and 12.
- the LCD panel 10 has a display nonuniformity, i.e., the orientations of some crystals are not the same as the other, the light beams in the area suffer the polarization and reach the camera 16 through the plate 11.
- the display defects of the LCD panel may be located.
- the LCD panel 10 is not excited by the external voltage and is placed between the polarizing plates 11 and 12 as in the first method. It is known that when rotating the polarizing plate 11, there is a point of the rotation angle where the defects of the LCD panel are more easily observable.
- the above mentioned first and second tests are automatically performed first, and then the manual and visual inspection is performed without driving the LCD panel while applying a certain angle of rotation in the polarizing plate 11.
- the above noted visual inspection is performed manually but not automatically.
- an object of the present invention to provide an LCD panel test apparatus which is capable of automatically testing an LCD panel to find out display defects of the display panel.
- the LCD panel test apparatus is automatically identify the defects of the LCD panel by including a mechanism for replacing one polarizing plate with another and providing rotations for the polarizing plate.
- the LCD panel test apparatus of the present invention includes: a first polarizing plate provided above a LCD panel under test and having a predetermined polarizing direction; a second polarizing plate provided below the LCD panel under test and having a polarizing direction perpendicular to that of the first polarizing plate; a back light provided under the second polarizing plate to illuminate the LCD panel under test; a camera to monitor light signals passing through the first polarizing plate; a third polarizing plate mounted on the same horizontal plane of the first polarizing plate and having a predetermined polarizing direction suitable for finding a specific defect of the LCD panel under test; a polarizing plate driver for driving the first and third polarizing plates to place either one of the first or third polarizing plate right above the LCD panel under test; an analog-digital converter to convert an analog signal from the camera into digital data; an image processing CPU which performs a signal processes for the digital data received from the analog-digital converter; and an LCD panel driver which provides a drive signal to the LCD panel under test.
- the LCD panel test apparatus is capable of automatically testing an LCD panel to find out display defects of the LCD panel.
- the LCD panel test apparatus of the present invention is capable of automatically testing an LCD panel while replacing one polarizing plate with other polarizing plate to detect the display defects of the LCD panel which are relatively difficult to be located.
- the LCD panel test apparatus is capable of automatically testing an LCD panel while rotating one or more polarizing plates with respect to the LCD panel to find out display defects of the panel which are not easily identifiable in the conventional automatic test method.
- the LCD panel test apparatus can test the LCD panel with high efficiency and reliability without subjecting to reading errors of a user.
- FIG. 1 is a block diagram showing a structure of the LCD panel test apparatus of the present invention.
- FIG. 2 is a block diagram showing a structure of the LCD panel test apparatus of the conventional example.
- FIG. 3 is a schematic plan view showing two polarizing plates slidably arranged to replace with one another according to the present invention.
- FIG. 4 is a schematic plan view showing an example of rotating a polarizing plate above the LCD panel to be tested.
- FIG. 5 is a schematic plan view showing three polarizing plates slidably arranged to replace with one another according to the present invention.
- FIG. 6 is a schematic plan view showing an example of rotating a plurality of polarizing plates above the LCD panel to be tested.
- FIG. 1 shows an embodiment of LCD panel test apparatus of the present invention.
- the LCD panel test apparatus includes a polarizing plate 11 provided above the LCD panel 10 to be tested, a polarizing plate 12 provided below the LCD panel 10, a back light 13 provided under the polarizing plate 12, a camera 16 to monitor light signals passing through the polarizing plate 11, a polarizing plate 19 mounted on the same plane of the plate 11, and a polarizing plate driver 21.
- the LCD test apparatus further includes an analog-digital converter 17 to convert an analog signal from the camera 16 into digital data, an image processing CPU 20 which data processes the digital data from the analog-digital converter 17, an LCD pattern generator 18 to generate a display pattern for the LCD panel 10 to be tested, and an LCD panel driver 15 which provides a drive signal to drive the LCD panel 10 to be tested through contact units 14.
- the directions of polarization in the polarizing plates 11 and 12 are arranged to be perpendicular with each other so the light from the back light 13 will not reach the camera 16 when the LCD panel 10 is not inserted between the polarizing plates 11 and 12.
- the light beams from the polarizing plate 12 may be changed their directions by the crystals aligned in the LCD panel.
- the light beams from the polarizing plate 12 may be uniformly polarized by the LCD panel
- the image obtained by the camera 16 for the LCD panel should be uniform.
- the LCD panel 10 has defects such as unevenness of orientations of the liquid crystals in the LCD panel, the light beams are nonuniformly affected by the LCD panel.
- the light beams reaching the camera 16 incorporate such effect caused by the defects of the LCD panel 10.
- the camera 16 obtains an intensity image of the LCD panel 10 propagated through the polarizing plate 11.
- the analog-voltage converter 17 converts the analog data obtained by the camera 16 into digital data so that the CPU 20 can perform a signal processing for the image data.
- signal processing includes an averaging process for determining an average intensity of the light beams received by the camera 16 and a process of determining the intensity difference from the average intensity in each display area.
- the LCD panel is driven by the LCD panel driver 15 through the contact unit 14.
- the LCD panel 10 is set to all white or all black state by the drive signals applied to the contact unit 14.
- all of the crystals in the LCD panel 10 are aligned in the same direction, i.e., a vertical direction in which the light beams are not polarized.
- the back light will not reach the camera 16 because of the 90 degrees polarization angle between the plates 11 and 12.
- the LCD panel 10 has a display nonuniformity, i.e., the orientations of some crystals are not the same as the other, the light beams in the area suffer the polarization and reach the camera 16 through the plate 11.
- the display defects of the LCD panel may be located.
- the next test is performed by replace the polarizing plate 11 with the polarizing plate 19 by the polarizing plate driver 21.
- the polarizing plate driver 21 provides a slide movement to the polarizing plates 11 and 19 in the horizontal direction so that the plates 11 and 19 change the position with each other.
- the polarizing plate 19 is arranged its polarizing direction to easily identify display defects, such as tray nonuniformity, of the specific type of LCD panel under test.
- the polarizing direction of the plate 19 may be determined through an experiment for the type of LCD panel to be tested.
- FIG. 3 illustrates a situation where the two polarizing plates slide in the horizontal direction to change position with each other.
- the polarizing plate 19 is also arranged on a rotation mechanism so that the plate 19 horizontally rotates above the LCD panel 10 under test.
- the polarizing plate 19 is mounted on a turn table 23 which is driven by a motor 27 through a belt 25.
- the polarizing plate 19 and the rotation mechanism may be slidably placed on a horizonal plane as in FIG. 3, the polarizing plate 11 can be automatically replaces with the polarizing plate 19 which further rotates above the LCD panel 10.
- FIG. 5 hows another embodiment wherein three polarizing plates 11, 19 and 20 are slidably provided on the horizontal plane.
- the polarizing plate 20 may be arranged to have other polarizing direction to be suitable for specific defects of the LCD panel or specific type of LCD panel to be tested.
- FIG. 6 shows a further embodiment which has a plurality of polarizing plates 19 1 -19 5 on the turn table 23. This arrangement further improves the test efficiency and flexibility.
- the LCD panel test apparatus is capable of automatically testing an LCD panel to find out display defects of the LCD panel.
- the LCD panel test apparatus of the present invention is capable of automatically testing an LCD panel while replacing one polarizing plate with other polarizing plate to detect the display defects of the LCD panel which are relatively difficult to be located.
- the LCD panel test apparatus is capable of automatically testing an LCD panel while rotating one or more polarizing plates with respect to the LCD panel to find out display defects of the panel which are not easily identifiable in the conventional automatic test method.
- the LCD panel test apparatus can test the LCD panel with high efficiency and reliability without subjecting to reading errors of an operator.
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7-123174 | 1995-04-24 | ||
JP7123174A JPH08292406A (en) | 1995-04-24 | 1995-04-24 | Lcd panel inspecting device |
Publications (1)
Publication Number | Publication Date |
---|---|
US5734158A true US5734158A (en) | 1998-03-31 |
Family
ID=14854024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08/638,943 Expired - Fee Related US5734158A (en) | 1995-04-24 | 1996-04-24 | LCD panel test apparatus |
Country Status (3)
Country | Link |
---|---|
US (1) | US5734158A (en) |
JP (1) | JPH08292406A (en) |
KR (1) | KR100189177B1 (en) |
Cited By (33)
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WO1999018472A1 (en) * | 1997-10-06 | 1999-04-15 | Orbotech Ltd. | Optical inspection method and system |
US6246253B1 (en) * | 1998-06-18 | 2001-06-12 | Hyundai Electronics Industries Co., Ltd. | System for testing liquid crystal and end seal of LCD cell |
US6285207B1 (en) * | 1996-08-15 | 2001-09-04 | Andrew Listwan | Method and apparatus for testing an electrically conductive substrate |
US20030055591A1 (en) * | 2001-09-14 | 2003-03-20 | American Panel Corporation | Visual display testing, optimization, and harmonization method and system |
US20030174214A1 (en) * | 2002-03-15 | 2003-09-18 | Lg. Philips Lcd Co., Ltd. | Apparatus and method for testing liquid crystal display panel |
US20040032280A1 (en) * | 2002-08-19 | 2004-02-19 | Clark Bernard T. | Integrated visual imaging and electronic sensing inspection systems |
US6714670B1 (en) * | 1998-05-20 | 2004-03-30 | Cognex Corporation | Methods and apparatuses to determine the state of elements |
US20040114198A1 (en) * | 2002-12-16 | 2004-06-17 | Samsung Electronics Co., Ltd. | Image processing system and method |
US20040232939A1 (en) * | 2003-05-20 | 2004-11-25 | Panelvision Technology, A California Corporation | Testing flat panel display plates using high frequency AC signals |
US20040239364A1 (en) * | 2003-06-02 | 2004-12-02 | Lg.Philips Lcd Co., Ltd. | Method and apparatus for inspecting and repairing liquid crystal display device |
US20050018897A1 (en) * | 2003-07-23 | 2005-01-27 | Samsung Electronics, Co., Ltd. | Panel inspection apparatus |
US20050222690A1 (en) * | 2004-04-01 | 2005-10-06 | Chih-Cheng Wang | Test system and method for portable electronic apparatus |
SG119174A1 (en) * | 2002-11-18 | 2006-02-28 | Nihon Micronics Kk | Method and apparatus for inspecting display base plate |
WO2006075164A1 (en) * | 2005-01-12 | 2006-07-20 | Enfis Limited | Sensing in meat products and the like |
US20070153226A1 (en) * | 2005-12-29 | 2007-07-05 | Lg.Philips Lcd Co., Ltd. | Apparatus for testing liquid crystal display panel |
US20070281734A1 (en) * | 2006-05-25 | 2007-12-06 | Yoram Mizrachi | Method, system and apparatus for handset screen analysis |
US20080063254A1 (en) * | 2006-09-07 | 2008-03-13 | Kabushiki Kaisha Toshiba | Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatus |
US20080111805A1 (en) * | 2006-11-10 | 2008-05-15 | Innolux Display Corp. | Liquid crystal display having common voltage initialization circuit and method for manufacturing same |
US20080116928A1 (en) * | 2006-11-21 | 2008-05-22 | Lg Electronics Inc. | Electro-Optic Modulator Assembly For Contactless Test Of Flat Panel Display, Method For Contactless Test Of Flat Panel Display Using The Same, Method For Manufacturing Flat Panel Display Using The Method For Contactless Test Of Flat Panel Display, And Related Technologies |
US20090009864A1 (en) * | 2006-01-11 | 2009-01-08 | Nitto Denko Corporation | Layered Film Fabrication Method, Layered Film Defect Detection Method, Layered Film Defect Detection Device, Layered Film, and Image Display Device |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4983911A (en) * | 1990-02-15 | 1991-01-08 | Photon Dynamics, Inc. | Voltage imaging system using electro-optics |
US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5444385A (en) * | 1991-09-10 | 1995-08-22 | Photon Dynamics, Inc. | Testing apparatus for liquid crystal display substrates |
US5614839A (en) * | 1994-10-24 | 1997-03-25 | Lucent Technologies Inc. | Method for optically testing flat panel display base plates |
-
1995
- 1995-04-24 JP JP7123174A patent/JPH08292406A/en active Pending
- 1995-09-14 KR KR1019950029957A patent/KR100189177B1/en not_active IP Right Cessation
-
1996
- 1996-04-24 US US08/638,943 patent/US5734158A/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4983911A (en) * | 1990-02-15 | 1991-01-08 | Photon Dynamics, Inc. | Voltage imaging system using electro-optics |
US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5459410A (en) * | 1991-06-17 | 1995-10-17 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5444385A (en) * | 1991-09-10 | 1995-08-22 | Photon Dynamics, Inc. | Testing apparatus for liquid crystal display substrates |
US5614839A (en) * | 1994-10-24 | 1997-03-25 | Lucent Technologies Inc. | Method for optically testing flat panel display base plates |
Cited By (68)
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---|---|---|---|---|
US6285207B1 (en) * | 1996-08-15 | 2001-09-04 | Andrew Listwan | Method and apparatus for testing an electrically conductive substrate |
WO1999018472A1 (en) * | 1997-10-06 | 1999-04-15 | Orbotech Ltd. | Optical inspection method and system |
US6714670B1 (en) * | 1998-05-20 | 2004-03-30 | Cognex Corporation | Methods and apparatuses to determine the state of elements |
US6246253B1 (en) * | 1998-06-18 | 2001-06-12 | Hyundai Electronics Industries Co., Ltd. | System for testing liquid crystal and end seal of LCD cell |
US20050062704A1 (en) * | 2001-09-14 | 2005-03-24 | American Panel Corporation | Visual display testing, optimization and harmonization method and system |
US6809746B2 (en) | 2001-09-14 | 2004-10-26 | American Panel Corporation | Visual display testing, optimization, and harmonization method and system |
US7180530B2 (en) | 2001-09-14 | 2007-02-20 | Amy Whittington | Visual display testing, optimization and harmonization method and system |
US20030055591A1 (en) * | 2001-09-14 | 2003-03-20 | American Panel Corporation | Visual display testing, optimization, and harmonization method and system |
US20030174214A1 (en) * | 2002-03-15 | 2003-09-18 | Lg. Philips Lcd Co., Ltd. | Apparatus and method for testing liquid crystal display panel |
CN100343658C (en) * | 2002-03-15 | 2007-10-17 | Lg.菲利浦Lcd株式会社 | Device and method for investigating liquid crystal display panel |
US7271903B2 (en) * | 2002-03-15 | 2007-09-18 | Lg.Philips Lcd Co., Ltd. | Apparatus and method for testing liquid crystal display panel |
US20040032280A1 (en) * | 2002-08-19 | 2004-02-19 | Clark Bernard T. | Integrated visual imaging and electronic sensing inspection systems |
US7330583B2 (en) | 2002-08-19 | 2008-02-12 | Photon Dynamics, Inc. | Integrated visual imaging and electronic sensing inspection systems |
SG119174A1 (en) * | 2002-11-18 | 2006-02-28 | Nihon Micronics Kk | Method and apparatus for inspecting display base plate |
US20040114198A1 (en) * | 2002-12-16 | 2004-06-17 | Samsung Electronics Co., Ltd. | Image processing system and method |
US20040232939A1 (en) * | 2003-05-20 | 2004-11-25 | Panelvision Technology, A California Corporation | Testing flat panel display plates using high frequency AC signals |
US20060061380A1 (en) * | 2003-05-20 | 2006-03-23 | Panelvision Technology, A California Corporation | Testing flat panel display plates using high frequency AC signals |
US6987400B2 (en) | 2003-05-20 | 2006-01-17 | Panelvision Technologies | Testing flat panel display plates using high frequency AC signals |
CN102253550A (en) * | 2003-06-02 | 2011-11-23 | 乐金显示有限公司 | Method and apparatus for inspecting and repairing liquid crystal display device |
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US20050018897A1 (en) * | 2003-07-23 | 2005-01-27 | Samsung Electronics, Co., Ltd. | Panel inspection apparatus |
US7200497B2 (en) * | 2004-04-01 | 2007-04-03 | Quanta Computer Inc. | Test system and method for portable electronic apparatus |
US20050222690A1 (en) * | 2004-04-01 | 2005-10-06 | Chih-Cheng Wang | Test system and method for portable electronic apparatus |
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WO2006075164A1 (en) * | 2005-01-12 | 2006-07-20 | Enfis Limited | Sensing in meat products and the like |
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TWI391647B (en) * | 2006-01-11 | 2013-04-01 | Nitto Denko Corp | Production method of deposition films, defect detection method of deposition films, defect detection device of deposition films, deposition films and image display device |
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US20070281734A1 (en) * | 2006-05-25 | 2007-12-06 | Yoram Mizrachi | Method, system and apparatus for handset screen analysis |
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US20080111805A1 (en) * | 2006-11-10 | 2008-05-15 | Innolux Display Corp. | Liquid crystal display having common voltage initialization circuit and method for manufacturing same |
US20080116928A1 (en) * | 2006-11-21 | 2008-05-22 | Lg Electronics Inc. | Electro-Optic Modulator Assembly For Contactless Test Of Flat Panel Display, Method For Contactless Test Of Flat Panel Display Using The Same, Method For Manufacturing Flat Panel Display Using The Method For Contactless Test Of Flat Panel Display, And Related Technologies |
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US7966861B2 (en) * | 2007-12-27 | 2011-06-28 | Samsung Mobile Display Co., Ltd. | Jig frame for drop test of flat panel display device |
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US20090219531A1 (en) * | 2008-03-03 | 2009-09-03 | Kum-Mi Oh | Detecting device and method for detecting unevenness of a glass substrate |
US8436632B2 (en) * | 2008-06-27 | 2013-05-07 | American Panel Corporation | System and method for optimizing LCD displays |
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US20120188537A1 (en) * | 2011-01-25 | 2012-07-26 | Hon Hai Precision Industry Co., Ltd. | Test apparatus for liquid crystal display |
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Publication number | Publication date |
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JPH08292406A (en) | 1996-11-05 |
KR100189177B1 (en) | 1999-06-01 |
KR960039440A (en) | 1996-11-25 |
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