BACKGROUND OF THE INVENTION
The present invention relates to a semiconductor integrated circuit device, and more particularly to a monolithic semiconductor integrated circuit device including an audio signal processing circuit.
When circuit elements of a circuit dealing with an audio signal, for example a filter circuit, are incorporated in a semiconductor integrated circuit, a time constant of the filter circuit has manufacturing variations. For example, the resistance value of a resistor element has a variation of about ±25% and the capacitance value of a capacitor has a variation of about ±30%. As a result, the time constant of a time constant circuit including such resistor element and capacitor has a large variation of about ±60%. Especially, in the case where two or more filter circuits having such large variations are involved in a semiconductor integrated circuit, the possession of the above-mentioned variation by each filter circuit does not give assurance that no reliability for the electric characteristic of the overall system is lost.
A basic circuit for a filter has been disclosed in, for example, "PRACTICAL ELECTRONIC CIRCUIT HANDBOOK (2)" published by CQ Publishing Co., Ltd. on Oct. 20, 1975, pp. 281-289. In the active filter circuit, time constant circuit elements including a capacitor C and a resistor R are constructed by external parts in order to suppress the variation of a cut-off frequency of the filter circuit.
On the other hand, in order to improve the high-frequency performance of a transistor included in an integrating circuit, JP-A-63-193710 (laid open on Aug. 11, 1988) has proposed to make an emitter current of the transistor as large as possible for the purpose of increasing a transition frequency of the transistor. The proposed integrated circuit includes a differential amplifier and is provided with a terminal for supplying a signal which controls the emitter current of a transistor forming the differential amplifier.
SUMMARY OF THE INVENTION
An object of the present invention is to provide a monolithic semiconductor integrated circuit device including an audio signal processing circuit, in which variations of electric characteristics from one chip to another can be compensated for with a simple construction.
Another object of the present invention is to provide a monolithic semiconductor integrated circuit device in which compensation for variations of filter characteristics can be made with a simple construction.
According to one aspect of the present invention, a monolithic semiconductor integrated circuit device includes a differentially operative circuit section, an amplifying element connected to define a current flowing in the differentially operative circuit section and a circuit for adjusting a current flowing in the amplifying element to thereby compensate for variations of electric characteristics from one semiconductor device to another. The current adjusting circuit includes at least one amplifying element and a load resistance for the amplifying element in the current adjusting circuit. The load resistance has a structure suitable for a trimming operation to adjustably determine the resistance value of the load resistance. The amplifying elements are in a current mirror circuit connection with their control electrodes being connected with each other so that the electric current flowing in the current path between the current receiving and delivering electrodes of the amplifying element connected to define the current flowing in the differentially operative circuit section is controlled by the adjustably determined resistance of the load resistance.
According to another aspect of the present invention, a monolithic semiconductor integrated circuit device includes a plurality of filter circuits. Each filter circuit includes a pair of differentially operative transistors and a cut-off frequency of the filter circuit is changed by controlling an emitter current of the transistor pair. Amplifying elements dealing with the emitter current are in a current mirror circuit connection which receives an adjustable control current through a resistor-trimming operation. The emitter currents of the differentially operative transistor pairs are adjusted en bloc through the resistor-trimming operation so that the cut-off frequencies of the respective filter circuits are corrected en bloc.
With the above construction, the time constants of the respective filter circuits can be readily made identical with each other by the resistor-trimming operation at one location since the characteristics of circuit elements formed in one chip have substantially the same deviation.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic circuit diagram of a monolithic semiconductor integrated circuit device according to an embodiment of the present invention.
FIGS. 2A to 2D are diagrams showing examples of the structure of load resistor means for amplifying means in a current adjusting circuit shown in FIG. 1.
FIGS. 3A and 3B are a circuit diagram and a block diagram of a monolithic semiconductor integrated circuit device including a filter circuit according to an embodiment of the present invention.
FIGS. 4A and 4B are a circuit diagram and a block diagram of a monolithic semiconductor integrated circuit device including another filter circuit according to another embodiment of the present invention.
FIG. 4C shows a gain versus frequency characteristic useful for explaining the operation of the device shown in FIGS. 4A and 4B.
FIGS. 5A and 5B are a circuit diagram and a block diagram of a monolithic semiconductor integrated circuit device including a further filter circuit according to a further embodiment of the present invention.
FIGS. 6A and 6B are a circuit diagram and a block diagram of a monolithic semiconductor integrated circuit device including a still further filter circuit according to a still further embodiment of the present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
FIG. 1 shows a circuit diagram of a main part of a monolithic semiconductor integrated circuit according to an embodiment of the present invention. Circuit blocks and circuit elements shown in the figure are formed by means of known semiconductor circuit fabrication techniques on a single semiconductor substrate which may be a monocrystalline silicon substrate.
In the present embodiment, the electric characteristics of filter circuits indicated by blocks (that is, a low-pass filter F1, a high-pass filter F2 and a notch filter F3), for example, the cut-off frequencies (or time constants) thereof can be respectively adjusted by currents I1, I2 and I3 which are set by a current adjusting circuit CA. Detailed explanation of such filter circuits will be made later.
The current adjusting circuit CA includes at least one amplifying element (first amplifying element) or NPN transistors Q20 and Q21 in the shown example, a collector load resistor R90 for the transistor Q20 and emitter load resistors R5 to R8 for the transistor Q20. The collector and base of the transistor Q20 are connected with the base and emitter of the transistor Q21, respectively. The collector of the transistor Q21 is connected with a terminal of a reference voltage Vref. The collector resistor R90 is connected between the collector of the transistor Q20 and the terminal of the reference voltage Vref, and the emitter resistors R5 and R8 are connected in parallel between the emitter of the transistor Q20 and a common potential (for example, grounded) line.
The currents I1 to I3 flowing in the above-mentioned filter circuits are formed by transistors Q22 to Q24, respectively. The emitters of the transistors Q22 to Q24 are connected with emitter resistors R10 to R12, respectively. The bases of the transistors Q22 to Q24 are commonly connected and those transistors Q22 to Q24 are in a current mirror circuit connection together with the transistor Q20. Thereby, the currents I1 to I3 flowing in the respective filter circuits are set by the current adjusting circuit CA. A field-effect transistor may be used in place of the bipolar transistor Q20. In that case, the transistor Q21 is not required.
In the above construction, the emitter of the transistor Q20 is provided with the emitter resistors or trimming resistors R5 to R8 connected, for example, in parallel with each other for adjustably changing an emitter current flowing in the transistor Q20, or in other words, for adjustably changing the currents I1 to I3 flowing in the above-mentioned filter circuits. The resistors R5 to R8 are not limited to the shown parallel connection form but may be provided with another connection form.
The parallel connection line of the trimming resistors R5 to R8 is selectively cut off by, for example, irradiation thereof with a laser beam. For example, a state in which all of the resistors R5 to R8 are connected in parallel with each other exhibits the smallest combined resistance, and the combined resistance value is made large by properly cutting off the connection line of the resistors R5 to R7. When the resistance value of the emitter resistance of the transistor Q20 is thus made large, the voltage dividing ratio of the emitter resistance to the collector resistor R90 is changed to increase a base potential Vc of the transistor Q20, thereby increasing the currents I1 to I3 in a constant ratio.
Resistors R91 to R93 may be connected with the collector resistor R90 of the transistor Q20 in a parallel form or another form. In this case, when the combined resistance value is made large by selectively cutting off a connection line of the resistors R90 to R93, the resistance ratio of the combined resistance on the collector side of the transistor Q20 to the combined resistance on the emitter side thereof is changed to lower the base potential Vc of the transistor Q20, thereby decreasing the currents I1 to I3 in a constant ratio. Namely, it is possible not only to increase the potential Vc but also to lower the same.
FIGS. 2A and 2B show one example of that structure of the collector load resistor means and/or emitter load resistor means of the transistor Q20 shown in FIG. 1 which is suitable for a trimming operation. In FIG. 2A, the load resistor means includes a plurality of resistor elements r11 to r1n (the resistance values of which may be the same or different) and two conductors l1 and l2 for making respective common connections of opposite ends of the resistor elements. For a trimming operation on the load resistor means, the conductor l2 is cut off at one of a plurality of locations indicated by one-dotted chain lines by use of, for example, a laser beam. As a result, the resistance value of the load resistor means is adjusted. FIG. 2B is an electrical connection diagram of the resistor elements shown in FIG. 2A.
FIGS. 2C and 2D show an example of another structure of the load resistor means of the transistor Q20. In FIG. 2C, the load resistor means includes a plurality of resistor elements r21 to r2n (the resistance values of which may be the same or different), a conductor l3 for commonly connecting one-side ends of the resistor elements r21 to r2n, conductors l4, l5 and l6 for connecting the other-side ends of two adjacent resistor elements. A trimming operation on the load resistor means is achieved by cutting off the conductor l3 at one or more of a plurality of locations indicated by one-dotted chain lines by use of, for example, a laser beam. FIG. 2D is an electrical connection diagram of the resistor elements shown in FIG. 2C.
The structure shown in FIG. 2A and the structure shown in FIG. 2C may be used in combination with each other.
As is apparent from the foregoing, various configurations using a plurality of resistor elements and a plurality of conductors can be considered as the structure of the load resistor means of the transistor Q20 which is suitable for the resistor-trimming operation.
FIG. 3A shows a circuit diagram of a monolithic semiconductor integrated circuit device including a low-pass filter and high-pass filter circuit, and FIG. 3B shows a block diagram of the device shown in FIG. 3A.
Constant current sources I0 are provided between the emitters of PNP type input transistors Q1 and Q2 and a power source voltage Ccc, respectively. The bases of the transistors Q1 and Q2 are connected with first and second input terminals, respectively. A resistance R1 for obtaining an input signal current is provided between the emitters of the input transistors Q1 and Q2. The collectors of the transistors Q1 and Q2 are connected with diode-connected NPN transistors Q3 and Q4 which form active load circuits. The common emitter (or cathode) of the transistors Q3 and Q4 is coupled with a grounded potential point through a diode-connected NPN transistor Q5. The above-mentioned circuit elements form a differential input stage A1 or a first differentially operative circuit.
Output voltages formed by the diode-connected transistors Q3 and Q4 in which collector currents of the transistors Q1 and Q2 flow are supplied to the bases of differentially operative NPN transistors Q6 and Q7 which form a controllable voltage-current conversion circuit VVIC or a second differentially operative circuit.
The controllable voltage-current conversion circuit VVIC includes the differentially operative transistors Q6 and Q7, PNP transistors Q8 and Q9 which are provided in a current mirror circuit connection on the collector sides of the differentially operative transistors Q6 and Q7 and form active load circuits, and an adjustable current source circuit, as mentioned above, which includes a transistor Q22 forming a second amplifying element causing the above-mentioned current I1 to flow in the common emitter of the differentially operative transistors Q6 and Q7 and an emitter resistor R10 of the transistor Q22. The base of the transistor Q22 is connected with the base of the transistor Q20 of the current adjusting circuit CA so that a current mirror circuit connection is provided as a whole. A signal current formed by the differentially operative transistors Q6 and Q7 of the controllable voltage-current conversion circuit VVIC serves as a charging/ discharging current for a capacitor C1 which will be explained later, and the current signal is fed back to the base of the transistor Q2 which is a feedback terminal (or the second input terminal) of the above-mentioned differential input stage A1. The capacitor C1 forming a filter circuit is provided between the feedback terminal and an earth potential. The capacitor C1 is incorporated in the semiconductor integrated circuit. For example, the capacitor C1 is constructed by an inter-layer insulating film which has no voltage dependency and two electrodes which have the interlayer insulating film sandwiched therebetween. The other various methods of forming a capacitor in a semiconductor integrated circuit are known and any one thereof suitable for the filter circuit in the present embodiment can be used.
The differential input stage A1 operates such that an input signal Vin supplied to the base of the transistor Q1 which is a non-inverted input (+) or first input terminal of the differential input stage and a DC potential of the base of the transistor Q2 which is an inverted input (-) or second input terminal of the differential input stage become equal to each other. Since the capacitor C1 is provided at the noninverted input (-) of the input stage A1, the input signal Vin is AC-wise attenuated in its high frequency region. Accordingly, a low-pass filter circuit can be constructed by providing a proper buffer circuit (or a high impedance element) at a junction point of the capacitor C1 and the collectors of the transistors Q8 and Q6 so that the inverted input (-) signal is outputted through the buffer circuit.
In the present embodiment, the output of the low-pass filter circuit is inputted to a buffer circuit A3. An output of the buffer circuit A3 and the input signal Vin are subtracted from each other by a subtracter circuit constructed by an operational amplifier circuit A2 and resistors R21a, R21b, R22a and R22b, thereby forming a high-pass filter output signal Vout.
Provided that the ON-resistance value of each of the transistors Q3 and Q4 is rd1 and the resistance value of each of the emitter resistances of the transistors Q6 and Q7 is re1, there are satisfied a relation of rd1 =(kT/q)÷I0 and a relation of re1 =(kT/q)÷I1 /2. Here, kT/q is about 26 mV. Since the current I1 can be changed by a resistor-trimming operation as mentioned above, it is possible to correspondingly change the resistance re1.
In the circuit shown in FIG. 3A, when the input signal Vin is inputted, a current of (Vin -Vx)/R1 is outputted from the collector of the transistor Q1 and a phase-inverted current thereof is outputted from the collector of the transistor Q2. Vx is a voltage on a junction point of the capacitor C1 and the base of the transistor Q2. The diode-connected transistors Q3 and Q4 serve as loads so that signal voltages outputted from the collectors of the transistors Q3 and Q4 result in rd1 ·(Vin -Vx)/R1. These signal input voltages supplied to the bases of the differentially operative transistors Q6 and Q7 which form the controllable voltage-current conversion circuit VVIC.
Since the emitter resistance of each of the differentially operative transistors Q6 and Q7 is re1, as mentioned above, the following current is obtained from the collectors of the transistors Q6 and Q7. Namely, in the controllable voltage-current conversion circuit VVIC, a signal current is formed in such a manner that the above-mentioned signal voltages rd1 ·(Vin -Vx)/R1 are applied to the emitter resistances re1 of the differentially operative transistors Q6 and Q7. Accordingly, the signal current formed is [rd1 ·(Vin -Vx)/R1 ]÷re1. This current is supplied to the capacitor C1. The capacitor C1 serves to attenuate a high frequency component of the supplied current signal. Therefore, there is obtained the following signal voltage Vx :
V.sub.x =[(V.sub.in -V.sub.x)/R.sub.1 ]×(r.sub.d1 jωC.sub.1)(1)
On the other hand, in the subtracter circuit A2, a relation of
V.sub.in -V.sub.x /2+V.sub.out -V.sub.x /2=0 (2)
is satisfied (on the assumption that R21a =R21b and R22a =R22b)
The equations (1) and (2) provide the following input/output transfer function: ##EQU1##
The equation (3) shows a high-pass filter and a cut-off frequency fH of the filter is represented by ##EQU2##
By setting re1 and rd1 so as to satisfy a relation of (re1 /rd1)>1 for the time constant defined by C1 ·R1 (re1 /rd1), the capacitance value of the capacitor C1 is equivalently made large. Thereby, it is possible to obtain a filter circuit having a relatively large time constant or a relatively low cut-off frequency even if a capacitor incorporated in a semiconductor integrated circuit has a relatively small capacitance. Also, the resistance value of the resistor re1 can be corrected by adjusting the current I1 through the resistor-trimming operation in the current adjusting circuit CA. Thereby, it is possible to compensate for variations of cut-off frequencies fH from one semiconductor integrated circuit chip to another which may be caused by the deviations of electric characteristics of circuit elements in a semiconductor integrated circuit.
FIG. 4A shows a circuit diagram of a monolithic semiconductor integrated circuit device including another filter circuit, and FIG. 4B shows a block diagram of the device shown in FIG. 4A.
An input signal Vin and a feedback signal Vx are supplied to a differential input stage A1 (or a first differentially operative circuit) similar to that in the device shown in FIG. 3A.
Output voltages of the differential input stage A1 formed by diode-connected transistors Q3 and Q4 in which collector currents of the differentially operative transistors Q1 and Q2 flow are applied to the bases of differentially operative NPN transistors Q6 and Q7 which form a controllable voltage-current conversion circuit VVIC (or a second differentially operative circuit) and the bases of differentially operative NPN transistors Q10 and Q11 which form a voltage-current conversion circuit VIC (or a third differentially operative circuit).
Like the embodiment shown in FIGS. 3A and 3B, the controllable voltage-current conversion circuit VVIC (or the second differentially operative circuit) includes the differentially operative transistors Q6 and Q7, PNP transistors Q8 and Q9 which are provided in a current mirror circuit connection on the collector sides of the differentially operative transistors Q6 and Q7 and form active load circuits, and a transistor Q22 and an emitter resistor R10 thereof which are provided on the common emitter side of the differentially operative transistors Q6 and Q7 and form an adjustable current source circuit I12. The transistor Q22 and a current adjusting circuit CA are in a current mirror circuit connection, like the embodiment shown in FIG. 3A. A signal current (or a first current signal) formed by the differentially operative transistors Q6 and Q7 of the controllable voltage-current conversion circuit VVIC serves as a charging/discharging current for a capacitor C1 and the current signal is fed back to the base of the transistor Q2 which is a feedback terminal of the differential input stage A1.
The voltage-current conversion circuit VIC (or the third differentially operative circuit) receiving the output signal of the differential input stage A1 to convert it into a second current signal includes the differentially operative transistors Q10 and Q11, PNP transistors Q12 and Q13 which are provided in a current mirror circuit connection on the collector sides of the differentially operative transistors Q10 and Q11 and form active load circuits, and a constant current source I0 which is provided to the common emitter of the differentially operative transistors Q10 and Q11.
An output signal of the controllable voltage-current conversion circuit VVIC and an output signal of the voltage-current conversion circuit VIC are supplied to a non-inverted input (+) and an inverted input (-) of an operational amplifier circuit A2 which forms an adder circuit. The operational amplifier circuit A2 includes a differentially operative circuit and an output circuit. The differentially operative circuit is composed of differentially operative NPN transistors Q14 and Q15 which receive the output signals of the voltage-current conversion circuits VVIC and VIC, PNP transistors Q16 and Q17 which are provided in a current mirror circuit connection on the collector sides of the differentially operative transistors Q14 and Q15 and serve as active loads, a capacitor C2 for phase compensation which is provided between the base and collector of the transistor Q17 on the output side, and a constant current source I0 which is provided to the common emitter of the differentially operative transistors Q14 and Q15. The output circuit of the operational amplifier circuit A2 is composed of an emitter-follower output transistor Q18 and a constant current source I0 provided to the emitter of the transistor Q18.
The base of the transistor Q14 which is the non-inverted input (+) of the operational amplifier circuit A2 is connected with the commonly connected collectors of the transistors Q6 and Q8 which are an output terminal of the controllable voltage-current conversion circuit VVIC. The base of the transistor Q15 which is the inverted input (-) of the operational amplifier circuit A2 is connected with the commonly connected collectors of the transistors Q10 and Q13 which are an output terminal of the voltage-current conversion circuit VIC.
In order to allow the operational amplifier circuit A2 to operate as an adder circuit, a feedback resistor R2 is provided between an output terminal and the inverted input (-) of the operational amplifier circuit A2. Namely, the resistor R2 is inserted between the emitter of the output transistor Q18 and the base of the differential transistor Q15.
Explanation will now be made of the operation of the filter circuit of the present embodiment.
The differential input stage A1 operates such that an input signal Vin supplied to the base of the transistor Q1 which is a non-inverted input (+) or first input terminal of the differential input stage A1 and a DC potential of the base of the transistor Q2 which is an inverted input (-) or second input terminal of the differential input stage A1 become equal to each other. Since the capacitor C1 is provided at the inverted input (-) of the input stage A1, the input signal Vin is AC-wise attenuated in its high frequency region. Accordingly, like the embodiment shown in FIG. 3A, a low-pass filter output is obtained from the inverted input (-) or the base of the transistor Q2 with which the capacitor C1 is connected.
When the input signal Vin is inputted, a current of (Vin -Vx)/R1 is outputted from the collector of the transistor Q1 and a phase-inverted current thereof is outputted from the collector of the transistor Q2 . The diode-connected transistors Q3 and Q4 serve as loads so that signal voltages outputted from the collectors of the transistors Q3 and Q4 result in rd1 ·(Vin -Vx)/R1, provided that the ON-resistance of each of the transistors Q3 and Q4 both in a diode connection is rd1. These signal voltages (or first and second output voltages) serve for input voltages of the differentially operative transistors which form the controllable voltage-current conversion circuit VVIC and the voltage-current conversion circuit VIC.
Provided that the resistance value of the emitter resistance of each of the differentially operative transistors Q6 and Q7 is re1, the following current is obtained from the collectors of the transistors Q6 and Q7.
In the controllable voltage-current conversion circuit VVIC, since a signal current is formed in such a manner that the above-mentioned signal voltages rd1 ·(Vin -Vx)/R1 are applied to the emitter resistances re1 of the differentially operative transistors Q6 and Q7, the signal current formed is [rd1 ·(Vin -Vx)R1 ]÷re1. This current is supplied to the capacitor C1. Since the capacitor C1 serves to attenuate a high frequency component of the supplied current signal, the signal Vx has a low-pass filter output characteristic. Thus, the signal fed back to the differential input stage A1 has a low-pass filter characteristic. Accordingly, an output signal of the differential input stage A1 has a high-pass filter characteristic in accordance with the decrease of feedback amount of the high frequency component.
In the present embodiment, the output signal of the differential input stage A1 is converted into a current signal of [rd1 ·(Vin -Vx)/R1 ]÷re2 by the differentially operative transistors Q10 and Q11 of the voltage-current conversion circuit VIC and the current signal flows through the feedback resistor R2 of the adder circuit A2. Here, re2 is the resistance value of the emitter resistance of each of the transistors Q10 and Q11. From the above explanation of the operation, there are satisfied the following equations (4) and (5):
V.sub.x =(V.sub.in - V.sub.x)/R.sub.1 ]×r.sub.d1 /(r.sub.e1 ×jωC.sub.1) (4)
V.sub.out =(V.sub.in - V.sub.x)/R.sub.1 ]×(r.sub.d1 /r.sub.e2)×R.sub.2 +V.sub.x. (5)
The equations (4) and (5) provide the following input/output transfer function: ##EQU3##
From the equation (6), it is apparent that there serves for not only a low-pass filter but also a high-pass filter, depending on the resistance values of the resistors R1 and R2.
In the case of R1 re1 <R2 re2, there is provided a high-pass filter the lower cut-off frequency fL of which is C1 ·R2 (re1 /re2) and the higher cut-off frequency fH of which is C1 ·R1 (re1 /re2), as shown by solid line in FIG. 4C. On the contrary, in the case of R1 re1 >R2 re2, there is provided a low-pass filter the lower cut-off frequency fL of which is C1 ·R1 (re1 /re2) and the higher cut-off frequency fH of which is C1 ·R2 (re1 /re2), as shown by dotted line in FIG. 4C. As a matter of design, re1 and re2 are made approximately equal to each other and hence the filter characteristic is determined in accordance with a relation in magnitude between R1 and R2.
Compensation for a variation of a time constant defined by CR(re1 /re2) can be made through such a resistor-trimming operation as explained in conjunction with FIG. 2A or 2B since the resistance re1 is changed by a constant current source I12. Also, by setting re1 and re2 so as to satisfy a relation of (re1 /re2)>1, the time constant can be regarded as being equivalent to one in which the capacitance value of the capacitor C1 is made large. Thereby, it is possible to obtain a relatively large time constant even if a capacitor incorporated in a semiconductor integrated circuit has a relatively small capacitance.
FIG. 5A shows a circuit diagram of a monolithic semiconductor integrated circuit device including a notch filter circuit, and FIG. 5B shows a block diagram of the device shown in FIG. 5A.
A differential input stage A1, a first controllable voltage-current conversion circuit VVIC1 and an operational amplifier A2 shown in FIG. 5A have constructions similar to those of the circuits shown in FIG. 4A. A second controllable voltage-current conversion circuit VVIC2 may have a construction similar to that of the first controllable voltage-current conversion circuit VVIC1.
In the embodiment shown in FIGS. 5A and 5B, output signals of the differential input stage A1 are supplied to the first and second controllable voltage-current conversion circuits VVIC1 and VVIC2 in order to obtain a notch filter characteristic. Second amplifying elements or transistors Q23 and Q24 in the first and second controllable voltage-current conversion circuits VVIC1 and VVIC2 are in a current mirror circuit connection together with a current adjusting circuit CA, like the embodiment shown in FIG. 3A. Accordingly, the transistors Q23 and Q24 form adjustable current sources I3 and I3 '. A load resistor R2 is provided between an output terminal of the second controllable voltage-current conversion circuit VVIC2 and a predetermined bias terminal VB. A capacitor C2 is provided between the outputs of the first and second controllable voltage-current conversion circuits VVIC1 and VVIC2. An output signal Vy of the second controllable voltage-current conversion circuit VVIC2 and an input signal Vin are summed by an adder circuit which is constructed by the operational amplifier circuit A2. Namely, the input signal Vin is supplied to a non-inverted input terminal (+) of the operational amplifier circuit A2 while the signal Vy is supplied to an inverted input terminal (-) thereof through a resistor R3a, and a resistor R3b is provided between the inverted input (-) and an output of the operational amplifier circuit A2.
Provided that the ON-resistance of each of the transistors Q3 and Q4 of the differential input stage A1, the emitter resistance of each of differentially operative transistors Q6 and Q7 of the first controllable voltage-current conversion circuit VVIC1 is re1 and the emitter resistance of each of differentially operative transistors Q6 ' and Q7 ' of the second controllable voltage-current conversion circuit VVIC2 is re3, the following equations (7) and (9) are satisfied similarly to the above explained:
[(V.sub.in -V.sub.x)/R.sub.1 ]×2r.sub.d1 /r.sub.e1 -jωC.sub.1 C.sub.x +jωC.sub.2 (V.sub.y -V.sub.x)=0 (7)
[(V.sub.in -V.sub.x)/R.sub.1 ]×2r.sub.d1 /r.sub.e3 +(V.sub.y /R.sub.2)+jωC.sub.2 (V.sub.y -V.sub.x)=0 (8)
V.sub.out =V.sub.in +V.sub.y (under assumption of R.sub.3a =R.sub.3b).(9)
The notch frequency as represented by the corresponding angular frequency ω0 and the gain Gvω.sbsb.o of the notch filter circuit at the notch angular frequencies will be determined from equations (7) to (9) as follows. ##EQU4##
From the above two equations, it can be seen that the notch frequency can be controlled by the control current I3, i.e., by the resistance re1 in the first controllable voltage-current conversion circuit VVIC1, while the gain at the notch frequency can be adjusted by the control current I3 ', i.e., by the resistance re3 in the second controllable voltage-current conversion circuit VVIC2 with the control current I3 being first fixed, though the gain could be varied by the control current I3 (the resistance re1).
FIG. 6A shows a circuit diagram of a monolithic semiconductor integrated circuit device including a high-pass filter circuit, and FIG. 6B shows a block diagram of the device shown in FIG. 6A.
A differential input stage A1, a controllable voltage-current conversion circuit VVIC, an operational amplifier circuit A3 and an adder circuit A2 shown in FIG. 6A may have constructions similar to those of the circuits shown in FIG. 3A. A second amplifying element or transistor Q23 in the controllable voltage-current conversion circuit VVIC is in a current mirror circuit connection together with a current adjusting circuit CA, like the embodiment shown in FIG. 3A. Accordingly, the transistor Q23 forms an adjustable current source I2.
However, in the embodiment shown in FIG. 6A, a feedback is applied to the operational amplifier circuit A3 in order to reduce the DC offset and the signal distortion of an output Vout. Namely, a signal Vx in the controllable voltage-current conversion circuit VVIC having a low-pass filter characteristic is divided by resistors R5a and R5b through the operational amplifier A3 in a voltage-follower configuration and is thereafter supplied to a non-inverted input (+) of the operational amplifier circuit A2. An inverted input (-) of the operational amplifier circuit A2 is applied with an input signal Vin through a resistor R5a and a resistor R5b is provided between the inverted input (-) and an output of the operational amplifier circuit A2.
Briefly explaining the operation of the filter circuit of the embodiment shown in FIG. 6A, a high-pass filter characteristic is obtained subtracting the signal Vx having the low-pass filter characteristic from the input signal Vin. This can be quantitatively explained by equations (10) to (12) which will be shown just in below. Namely, since a relation of Vx =[(Vin -Vx)/R1 ]×(rd1 /re1)×1/jωC1 is satisfied similarly to the above explained, there are satisfied the following equations (10) to (12): ##EQU5##
V.sub.y =V.sub.x /2 (11)
V.sub.in -V.sub.y +V.sub.out -V.sub.y =0. (12)
From the equations (10) to (12), a transfer function as shown by the equation (3) is obtained similarly to the case of the circuit shown in FIG. 3A (on the assumption that R5a =R5b and R6a =R6b).
In the embodiment shown in FIGS. 6A and 6B, since the feedback is applied also to the amplifier circuit A3 to obtain the output signal Vout, it is possible to greatly reduce the DC offset voltage and the signal distortion. Also, a gain can be adjusted by setting the ratio of the resistance value of the resistor R5a to that of the resistor R5b and the ratio of the resistance value of the resistor T6a to that of the resistor R6b to desired values.
Functional effects obtained by the above-mentioned embodiments are as follows:
(1) Since the electric characteristics of circuit elements formed in a semiconductor integrated circuit have approximately uniform deviations in only one direction, it is possible to match the time constants of filter circuits with each other through a resistor-trimming operation at one location.
(2) By transmitting an output signal of a differential input stage to a controllable voltage-current conversion circuit and providing a capacitor charged/discharged by an output signal of the controllable voltage-current conversion circuit so that the output signal is fed back to a feedback terminal of the differential input stage, a signal having a low-pass filter characteristic and a signal having a high-pass filter characteristic can be obtained from the feedback terminal and an output terminal, respectively. A variety of filter circuits can be constructed by a signal processing of those signals including summation, subtraction and/or so on. A frequency response can be corrected by flowing a control current in the controllable voltage-current conversion circuit.
(3) The capacitance value of the capacitor provided to the feedback terminal of the differential input stage can be made equivalently large in accordance with the ratio of a load resistor of the differential input stage to the emitter resistance of transistors forming the voltage-current conversion circuit. Thereby, even in a semiconductor integrated circuit in which only a capacitor having a relatively small capacitance can be formed, a filter circuit having a relatively low cut-off frequency can be obtained.
In the foregoing, the invention made by the present inventors has been specifically explained on the basis of the embodiments thereof. However, of course, the present invention is not limited to the disclosed embodiments but various changes or modifications can be made without departing from the subject matter of the present invention. For example, a structure for changing a control current by a resistor-trimming operation can employ a variety of configurations inclusive of the trimming of patterns of resistor elements themselves instead of the disclosed selective cutting-off of the connection lines by which resistor elements are connected. Also, differentially operative amplifying elements forming a filter circuit may include MOSFETs (insulated-gate field-effect transistors), junction type FETs instead of bipolar transistors disclosed. Further, a specific construction for an adder or subtracter circuit for receiving the signal having the low-pass filter characteristic and the signal having the high-pass filter characteristic can employ a variety of configurations.
The present invention is widely applicable to a semiconductor integrated circuit device having a filter circuit incorporated therein.