US4669872A - Temperature measuring device - Google Patents

Temperature measuring device Download PDF

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Publication number
US4669872A
US4669872A US06/787,592 US78759285A US4669872A US 4669872 A US4669872 A US 4669872A US 78759285 A US78759285 A US 78759285A US 4669872 A US4669872 A US 4669872A
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United States
Prior art keywords
light
temperature
temperature sensor
spectroscope
sensor
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Expired - Fee Related
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US06/787,592
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English (en)
Inventor
Yoshiaki Ida
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Publication date
Priority claimed from JP59219122A external-priority patent/JPS6196427A/ja
Priority claimed from JP1984157607U external-priority patent/JPS6172653U/ja
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Assigned to MITSUBISHI DENKI KABUSHIKI KAISHA reassignment MITSUBISHI DENKI KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: IDA, YOSHIAKI
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance

Definitions

  • the present invention relates to a temperature measuring device, and particularly to such a device utilizing a temperature sensor made of a material wherein, in an edge portion thereof, the light absorbing spectrum varies with temperature.
  • a temperature measuring device utilizing a temperature sensor made of a material wherein, in an edge portion thereof, the light absorbing spectrum varies with temperature.
  • Such measuring devices are known, for example, from Japanese Laid Open Patent Applications Nos. 8878/1980 and 6731/1982.
  • FIG. 1 depicts a drive circuit for a light-emitting element used as a light source 6, 2 and 4 optical fibers, 6 a light-emitting element used as a light source, and 9 a temperature sensor made of a crystalline semiconductor material or amorphous semiconductor material such as GaAs for which the higher end of its light absorbing wavelength range, and hence its light transmittance, varies with temperature.
  • the temperature sensor 9 is disposed between the optical fibers 2 and 4 and bonded thereto by a suitable adhesive.
  • FIG. 2 An example of the temperature dependency of the light transmittance of the temperature sensor 9 is shown in FIG. 2 with the wavelength plotted on the abscissa, from which it is clear that the higher end of the light absorbing wavelength range of the temperature sensor 9 is shifted to the side of longer wavelengths with an increase of temperature.
  • FIG. 3 is a graph showing the spectrum of light produced by the light-emitting element 6 and the spectrum of light which passes through the temperature sensor 9.
  • the temperature measuring device further includes a diffraction grating 15 used as a spectroscope, a photodiode array 16, comparators 17, each connected to a different photodiode of the array, and a processing circuit 18.
  • the light-emitting element 6 is driven by the drive circuit 1 and emits light.
  • the spectral distribution of the emitted light follows a normal distribution, as shown in FIG. 3.
  • the temperature sensor 9 is selected such that the higher end of its light absorbing wavelength range is positioned within the normal distribution of the spectrum of light emitted from the LED 6. Since the higher end shifts with temperature variation as shown in FIG. 2, the spectrum of light passed through the temperature sensor 9 at a certain temperature is as shown by a hatched portion in FIG. 3. This spectrum is transmitted through the optical fiber 4 to the diffraction grating 15 where it is decomposed to wavelength components which are received by respective ones of the photodiodes of the array 16.
  • Electric signals from the photodiodes are compared by the comparators 17 associated therewith with respective comparison levels, and outputs of the comparators 17 are processed by the processing circuit 18 to obtain the position of a photodiode of the array 16 corresponding to the shortest wavelength of the light passed through the temperature sensor 9.
  • the output wavelength of a temperature sensor after being spectroscopicaly processed, is detected at a plurality of different detection levels, and a fixed end point of the light absorption wavelength range of the sensor is caluculated on the basis of lower wavelength values of the detected wavelength ranges.
  • FIG. 1 shows schematically an example of a conventional temperature sensor
  • FIG. 2 is a graph showing a relation of temperature dependency of transmittance of the temperature sensor
  • FIG. 3 is a graph showing a relation of a spectrum of light from a light-emitting element to a light transmittance of the temperature sensor
  • FIG. 4 shows schematically an embodiment of the present invention
  • FIG. 5A and 5B are illustrations each showing a relation of the spectrum of light passing through the temperature sensor and the transmittance of the temperature sensor when the intensity of light emitted from the light-emitting element varies;
  • FIG. 6 shows schematically another embodiment of the present invention.
  • FIG. 4 which schematically shows a preferred embodiment of a temperature measuring device of the present invention
  • reference numerals seen commonly in FIG. 1 designate the same or corresponding components.
  • a light-emitting element 6 is driven by a light-emitting element drive circuit 1, and light emitted from the element 6 is guided through an optical fiber 2 to a temperature sensor 9.
  • the output of the latter is guided through an optical fiber 4 and a diffraction grating 15 to an array of CCDs (charge-coupled devices) 19.
  • Outputs of the CCDs 19 are connected through respective comparators 17-1 and 17-2, operating with different comparison levels, to a processing circuit 20.
  • FIG. 5A shows the spectrum of light emitted from the light-emitting element 6 in which the hatched portion indicates light passing through the temperature sensor 9 at a certain temperature.
  • FIG. 5B similar to FIG. 5A, illustrates the case where the intensity of light emitted from the light-emitting element 6 is at a lower level.
  • a light component passed through the temperature sensor 9 is spectroscopically separated by the diffraction grating 15 into a plurality of components (in this case, two components), and these components are converted into a time series of electric signals by the CCDs 19, which signals are then compared by the comparators 17-1 and 17-2 with different comparison levels.
  • a rising point ⁇ of a curve drawn by plotting higher ends ⁇ 1 and ⁇ 2 of the absorption spectral range of the light passing through the temperature sensor 9 at different levels is constant regardless of variations of the light intensity due to temperature variations or time dependent degradation of the light-emitting element 6, as shown by the hatched portion in FIGS. 5A and 5B.
  • wavelengths ⁇ 1 and ⁇ 2 which are the shortest wavelengths of the light passing ranges of the temperature sensor 9 at levels L 1 and L 2 , respectively, are detected by the comparators 17-1 and 17-2, respectively.
  • the wavelength values ⁇ 1 and ⁇ 2 are operated upon by the processing circuit 20 to obtain a shortest wavelength ⁇ 0 , which is a fixed value inherent to the temperature sensor 9, that is, it is fixed regardless of variations of the light intensity from the light-emitting element 6 and/or variations of the center wavelength of the light from the light-emitting element 6, with the assumption that the curve is substantially linear.
  • the processing circuit 20 may be implemented with a microprocessor in which the above calculation is performed digitally.
  • the converted electric signals are obtained after the spectroscopic treatment of the light passing through the temperature sensor, and therefore, the signal levels are relatively low and, in some cases, contain errors due to dark current.
  • the possibility of such error is removed by introducing a light intensity modulation system to the temperature sensing device.
  • FIG. 6 a conventional photodiode array 16 is used and a series connection of a capacitor 19 and an amplifier 21 is inserted between each of the photodiodes and each of comparators 17. Outputs of the comparators 17 are connected to a conventional processing circuit 18. A pulse generator 22 is connected to a light-emitting element drive circuit 1.
  • the drive circuit 1 is driven by the pulse generator 22 to energize the light-emitting element 6 intermittently in synchronism with the pulse output of the generator 22.
  • the operation is the same as that of the conventional device, that is, light from the element 6 passes through the optical fiber 2, the temperature sensor 9, and the optical fiber 4, and the resultant light has a spectrum as shown by the hatched portions in FIGS. 5A and 5B, which is spectroscopically separated by the diffraction grating 15.
  • outputs of the respective photodiodes of the array 16 become dark currents.
  • the dark current components are removed and only the electric signals related to the light components are amplified, which are compared with the different reference levels by the comparators 17.
  • the processing circuit 18 operates upon by the processing circuit 18 to obtain the lowest wavelength values of the spectroscopically separated light components.
  • the photodiode array 16 is used in this embodiment, it is of course possible to replace it with a CCD array 19.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Radiation Pyrometers (AREA)
  • Spectrometry And Color Measurement (AREA)
US06/787,592 1984-10-17 1985-10-15 Temperature measuring device Expired - Fee Related US4669872A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP59-219122 1984-10-17
JP59-157607[U] 1984-10-17
JP59219122A JPS6196427A (ja) 1984-10-17 1984-10-17 温度測定装置
JP1984157607U JPS6172653U (ko) 1984-10-17 1984-10-17

Publications (1)

Publication Number Publication Date
US4669872A true US4669872A (en) 1987-06-02

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US06/787,592 Expired - Fee Related US4669872A (en) 1984-10-17 1985-10-15 Temperature measuring device

Country Status (5)

Country Link
US (1) US4669872A (ko)
EP (1) EP0179400B1 (ko)
KR (1) KR900005778B1 (ko)
CN (1) CN85108209B (ko)
DE (1) DE3568871D1 (ko)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4790669A (en) * 1986-04-08 1988-12-13 Cv Technology, Inc. Spectroscopic method and apparatus for optically measuring temperature
US4863270A (en) * 1988-08-31 1989-09-05 Simmonds Precision Products, Inc. Multi-mode optical fiber sensor and method
US5118200A (en) * 1990-06-13 1992-06-02 Varian Associates, Inc. Method and apparatus for temperature measurements
US5348396A (en) * 1992-11-20 1994-09-20 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for optical temperature measurement
US20090213898A1 (en) * 2005-02-14 2009-08-27 Jean-Francois Meilleur Fiber Optic Temperature Probe for Oil-Filled Power Transformers
CN105258809A (zh) * 2015-11-06 2016-01-20 广西职业技术学院 一种适合泡绿茶的温度指示器
CN105509925A (zh) * 2015-11-30 2016-04-20 苏州佳像视讯科技有限公司 一种ccd温度检测装置
US10473492B2 (en) * 2014-06-23 2019-11-12 Gwangju Institute Of Science And Technology Optical characteristic measuring apparatus using interrogation optical fiber, optical fiber sensor system having the same, and optical characteristic measuring method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4890933A (en) * 1988-02-17 1990-01-02 Itt Corporation Transmission method to determine and control the temperature of wafers or thin layers with special application to semiconductors
CA2748240C (en) * 2008-12-26 2015-01-27 Ysystems Ltd. Method and device for measuring temperature during deposition of semiconductor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0014848A2 (en) * 1979-01-22 1980-09-03 Rockwell International Corporation Method and apparatus for an optical sensor utilizing semiconductor filters
DE3208447A1 (de) * 1981-03-09 1982-09-23 Siemens AG, 1000 Berlin und 8000 München Farbmodulierter faseroptischer wandler
US4462699A (en) * 1981-09-10 1984-07-31 Board Of Trustees Of The Leland Stanford Junior University Fiber coupler temperature transducer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0014848A2 (en) * 1979-01-22 1980-09-03 Rockwell International Corporation Method and apparatus for an optical sensor utilizing semiconductor filters
DE3208447A1 (de) * 1981-03-09 1982-09-23 Siemens AG, 1000 Berlin und 8000 München Farbmodulierter faseroptischer wandler
US4462699A (en) * 1981-09-10 1984-07-31 Board Of Trustees Of The Leland Stanford Junior University Fiber coupler temperature transducer

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4790669A (en) * 1986-04-08 1988-12-13 Cv Technology, Inc. Spectroscopic method and apparatus for optically measuring temperature
US4863270A (en) * 1988-08-31 1989-09-05 Simmonds Precision Products, Inc. Multi-mode optical fiber sensor and method
US5118200A (en) * 1990-06-13 1992-06-02 Varian Associates, Inc. Method and apparatus for temperature measurements
US5348396A (en) * 1992-11-20 1994-09-20 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for optical temperature measurement
US20090213898A1 (en) * 2005-02-14 2009-08-27 Jean-Francois Meilleur Fiber Optic Temperature Probe for Oil-Filled Power Transformers
US8568025B2 (en) * 2005-02-14 2013-10-29 Jean-François Meilleur Fiber optic temperature probe for oil-filled power transformers
US10473492B2 (en) * 2014-06-23 2019-11-12 Gwangju Institute Of Science And Technology Optical characteristic measuring apparatus using interrogation optical fiber, optical fiber sensor system having the same, and optical characteristic measuring method
CN105258809A (zh) * 2015-11-06 2016-01-20 广西职业技术学院 一种适合泡绿茶的温度指示器
CN105509925A (zh) * 2015-11-30 2016-04-20 苏州佳像视讯科技有限公司 一种ccd温度检测装置

Also Published As

Publication number Publication date
EP0179400A2 (en) 1986-04-30
EP0179400A3 (en) 1986-09-10
CN85108209A (zh) 1986-05-10
CN85108209B (zh) 1988-08-10
EP0179400B1 (en) 1989-03-15
KR900005778B1 (ko) 1990-08-11
DE3568871D1 (en) 1989-04-20
KR860003504A (ko) 1986-05-26

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