US4547676A - Photosensor apparatus with light integration control - Google Patents

Photosensor apparatus with light integration control Download PDF

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Publication number
US4547676A
US4547676A US06/460,627 US46062783A US4547676A US 4547676 A US4547676 A US 4547676A US 46062783 A US46062783 A US 46062783A US 4547676 A US4547676 A US 4547676A
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United States
Prior art keywords
light
receiving elements
integration
reference level
outputs
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Expired - Fee Related
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US06/460,627
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Takeomi Suzuki
Kenzo Ishibashi
Isamu Hashimoto
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Pentax Corp
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Asahi Kogaku Kogyo Co Ltd
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Assigned to ASAHI KOGAKU KOGYO KABUSHIKI KAISHA reassignment ASAHI KOGAKU KOGYO KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: HASHIMOTO, ISAMU, ISHIBASHI, KENZO, SUZUKI, TAKEOMI
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

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  • This invention relates to photosensor apparatus.
  • This photosensor is used for such purposes as detecting the focal position by detecting optical image data in a camera, a video camera, etc. with a plurality of light-receiving elements arranged on the image focusing plane of an image focusing optical system.
  • the brightness of an optical image varies over a wide range and also varies with time. Therefore, it is necessary to always vary the light sensitivity to a suitable level and hold optical image data at a certain instant. Since the light sensitivity of the light receiving element is constant, the adjustment of the light sensitivity is done by storing photons produced in the light-receiving elements and controlling the storage time with the storage value as the output signal. To adjust the storage time, the value of stored photons must always be monitored. However, where a large number of light-receiving elements are used, it is difficult to monitor all the stored values. Accordingly, it has been in practice to monitor the average value of the stored value. However, since the average value is monitored, the output of the light-receiving elements on which light of high illumination intensity is incident is liable to exceed the measurement range. In such a case, it is impossible to determine the extent, to which the measurement range is surpassed.
  • the present invention has been intended in the light of the foregoing affairs, and it is an object of the invention to obtain accurate light detection.
  • simultaneous light integration is started with respect to all the light-receiving elements, the outputs of the light-receiving elements are progressively scanned immediately after the start of light integration, and all the outputs are held when at least one of the outputs reaches a first reference level V A of a certain level. If at least one of the held outputs is above a second reference level V B of a different level, check as to whether all the outputs are below the second reference level V B is repeatedly done for progressively reducing light integration period until all the outputs of the light-receiving elements are at a fixed level.
  • FIG. 1 is a block diagram showing an embodiment of the photosensor apparatus according to the present invention
  • FIG. 2 is a view showing the output of the light-receiving element, on which light of maximum illumination intensity is incident, in case where the measurement object (i.e., optical image) is dark;
  • FIGS. 3, 4 and 5 are view showing the output of the light-receiving element, on which light of maximum illumination intensity is incident, in case where the measurement object is bright;
  • FIG. 6 is a schematic showing a detailed example of the circuit shown in FIG. 1.
  • FIG. 1 shows an embodiment of the photosensor apparatus according to the present invention.
  • a photosensor block which includes a receiving-element array consisting of a plurality of light-receiving elements 1a of light integration type.
  • Switches SWl for instance of MOS type, are connected to the respective light-receiving elements 1a.
  • a memory 3 as memory means includes memory elements 3a which are connected to the respective light-receiving elements 1a of the photosensor through MOS type switches SW 2 .
  • a shift register 4 which serves as scanning means is connected to the memory elements 3a of the memory 3 through respective switches SW 3 of MOS type. Through switch SW 3 , memory 3 is connected to a comparator 5 which serves as comparing means.
  • the comparator 5 includes a comparison voltage generating circuit 5a for setting a reference level, a voltage comparator 5b for comparing the output of memory 3 through switch SW 3 with the output of the comparison voltage generating circuit 5a, and a latch circuit 5c for latching the output of the voltage comparator 5b. And through switch SW 3 , memory 3 is connected to an amplifier 7, which is in turn connected to an analog-to-digital (A/D) converter.
  • A/D analog-to-digital
  • a light integration controller is connected to the switches SW 1 , which cause charging when they are turned on and cause light integration when they are turned off, and also to the switches SW 2 , which cause sampling when they are turned on and cause holding when they are turned off.
  • a timer 6, which is counting means for counting light integration period, is connected to the light integration controller 2.
  • the latch circuit 5c of the comparator 5 is also connected to the light integration controller 2.
  • the light-receiving elements 1a of the photosensor 1 are simultaneously charged to an initial stage when an "on" signal is supplied from the light integration controller 2 to the switches SW 1 . More particularly, as shown in FIGS. 2 to 5, a voltage V C is initialized from the instant t c of the start of charging till the instant t s of the start of light integration.
  • the switches SW 1 are turned off causing the light-receiving elements 1a to start light integration, whereby charge is stored according to the intensity of received light as shown by output curves C A and C B .
  • the switches SW 2 are turned on by a sample signal from the light integration controller 2, whereby the output signal from the light-receiving elements 1a is stored in the memory elements 3a (which may be capacitors) in the memory 3.
  • the data is further fed bit after bit to the comparator 5 through the switching of the switches SW 3 and the level is always monitored.
  • the outputs signals of the light-receiving elements 1a are compared with a first reference level V A which is set by the comparison voltage generating circuit 5a.
  • the first reference level V A which is set by the comparison voltage generating circuit 5a.
  • the light integration controller 2 also provides a hold signal to turn off the switches SW 2 , whereby all the outputs of the photosensor 1 at this time are held in the memory 3.
  • the data held in the memory 3 may be lagging against the corresponding data at the time of the judgement by the comparator 5, or it may be considerably above the level of the first reference level V A and, in some case, saturated depending upon the intensity of light incident on the photosensor 1.
  • the comparator 5 and shift register 4 are reset, and the outputs of the memory 3 are compared with a second reference level V B in the comparator 5. If the data stored in the memory 3 is effective (i.e., lower than the second reference level V B ), it is led through an amplifier 7 to the A/D converter for conversion from analog signal to digital signal.
  • a light integration period which is shorter than the integration period from the start of the first integration till the start of holding, as measured by the timer 6, is set, and light integration is effected afresh for this period.
  • the result is compared again with the second reference level V B .
  • the sequence of operation described above is repeated until effective data is obtained.
  • FIG. 2 shows a case where the optical image is comparatively dark.
  • curve C A represents the output of the light-receiving element 1a, on which light of maximum illumination intensity is incident.
  • the output signal of the light-receiving element 1a does not reach the first reference level V A suitable for the light detection until the instant ts 1 when the first scanning is completed. It also does not reach the level V A till the completion of the second scanning, and reaches the level V A only until the instant ts 3 when the third scanning is completed.
  • the outputs of the light-receiving element 1a and the other light-receiving elements 1a are held by a hold signal. In this case, there is no light-receiving element, the output of which exceeds the second reference level V B , because the output signal change is gentle.
  • FIGS. 3 to 5 show cases where the optical image is bright.
  • curve C B represents the output of the light-receiving element 1a, on which light of maximum illumination intensity is incident.
  • the output signal of the light-receiving element 1a is discharged beyond the reference levels V A and V B to reach and be held at the saturation level until the instant ts 1 when the first scanning is completed as shown in FIG. 3. This is because of the fact that the output changes so quickly that it has already exceeded the second reference level V B when it reaches the first reference level V A . Thus, it is necessary to reduce the next light integration period.
  • the light integration period T 0 has been counted by the timer 6 and known.
  • the light integration is repeated a number of times. However, since the integration period necessary when the optical image is bright, the total period necessary for the detection is not so long.
  • FIG. 6 is a block diagram showing a detailed example of the block diagram of FIG. 1.
  • Photosensor 1 includes photosensor cells 1M 1 to 4M 32 which form a matrix array of four rows by 32 columns.
  • the photosensor cells 1M 1 to 4M 32 each include a light-receiving element 1a, a MOS type switch element TF 1 corresponding to the switch SW 1 , a MOS type switch element TF 2 corresponding to the switch SW 2 , and a MOS type switch element TF 3 for selecting the pertaining matrix row of the photosensor 1.
  • the MOS type switch element F 1 is controlled by an integration timing generating circuit 8.
  • the integration timing generating circuit 8 operates when starting the light integration by discharging the light-receiving element 1a.
  • the circuit 8 is controlled by a signal INT of an integration control bus buffer 9, which leads to a bus line from a microcomputer MC constituting control means.
  • the MOS type switch element TF 2 is controlled by a sample/hold timing generating circuit 10.
  • the sample/hold timing generating circuit 10 operates when memory 3 holds the light integration signal obtained from the light-receiving element 1a at a predetermined instant.
  • the circuit 10 is controlled by a signal SH from the integration control buffer 9.
  • the MOS type swtich element TF 3 is controlled by outputs D 1 to D 4 from a decoder 11, which decodes signals LS 1 and LS 2 of an integration control bus buffer 9, for taking out an integration signal from the light-receiving element 1a.
  • the microcomputer MC, integration control bus buffer 9, integration timing generating circuit 9 and sample/hold timing generating circuit 10 constitute the light integration controller 2.
  • the photosensor cells 1M 1 to 4M 32 also each include a capacitor C m , which constitutes the memory element 3a of the memory 3 leading to the MOS type switch element TF 2 .
  • the selection of the matrix columns of the photosensor 1 is done by MOS type switch elements TF 4 which are driven by the shift register 4.
  • the shift register 4 is scanned bit after bit by a signal STEP 1 of the integration control bus buffer 9 and also by a signal STEP 2 from an A/D conversion control bus buffer 12, which, like the integration control bus buffer, the bus line BL of the microcomputer MC is lead.
  • the selection of the signals STEP 1 and STEP 2 is controlled by chip select signals CS 1 and CS 2 respectively supplied to the integration control bus buffer 9 and A/D conversion control bus buffer 12.
  • the light integration signal S out obtained from the individual photosensor cells 1M 1 to 4M 32 of the photosensor 1 is supplied to the voltage comparator 5b constituting the comparator 5.
  • a comparison voltage generating circuit 13 is connected to the voltage comparator 5b, and the voltage comparator 13 provides the first and second reference levels V A and V B .
  • the outputs of cells 14 and 15 serve as level sources for obtaining the first and second reference levels V A and V B .
  • the cell 14 provides its output when the photosensor 1 is saturated, while the cell 15 provides an output before the start of the light integration by the photosensor 1.
  • the first and second reference levels V A and V B are thus in predetermined signal level ranges by the respective cells 14 and 15.
  • the voltage comparator 5b effects comparison with the timing of a clock produced from a timing generating circuit 21.
  • System A clock source is externally supplied to the timing generating circuit 21, which supplies clocks for the shift register 4, integration timing generating circuit 8 and sample/hold timing generating circuit 10 which constitutes the comparator 5 and is operated by the output of a latch circuit 5c to be described later.
  • the voltage comparator 5b compares the output of the photosensor 1 with the first reference level V A . As a result, the output of the voltage comparator 5b is inverted to invert the output of a flip-flop (not shown) which constitutes the latch circuit 5c, whereby the light integration signals of all the photosensor cells 1M 1 to 4M 32 are held.
  • the hold signal obtained thus is supplied to the microcomputer MC, whereby the microcomputer MC acknowledges the end of the first scanning of the photosensor 1.
  • a soft timer which serves as counting means based for counting according to a program of the microcomputer MC, stops the counting of the light integration, whereby data for the integration period for the first light integration can be obtained.
  • the shift register 4 is driven again, and the voltage comparator 5b compares the output of the photosensor 1 with the second reference level V B .
  • the flow of time counting is repeatedly executed until any overranged photosensor cell is no longer detected or until the shortest integration period of the soft timer is reached.
  • the output of the photosensor 1 that is obtained in accordance with this flow is coupled through a level shifter/amplifier 15 and a voltage follower for impedance conversion 16, these constituting the amplifier 7, to the A/D converter 17.
  • the shift range of the level shifter/amplifier 15 is determined by the outputs of the voltage followers 19 and 20, which receive the output of a shift range voltage generating circuit 18.
  • the shift range voltage generating circuit 18 provides output, which is determined by the first and second reference levels V A and V B obtained from the comparison voltage generating circuit.
  • the data thus obtained from the photosensor 1 is fed through the A/D converter 17 to the microcomputer MC for data processing. After the data processing has been ended, similar processing is carried out afresh for the next light integration.
  • switch elements connected to the input terminal of respective voltage followers 19, 16 and 20.
  • the switch elements S 1 to S 3 are controlled by respective signals ⁇ 1 to ⁇ 3 of the A/D conversion control bus buffer 12.
  • Designated at C 1 and C 2 are matching capacitors connected to the input terminal of the respective voltage followers 19 and 20.
  • Designated at D 1 and D 2 are switch elements connected to the output terminal of the respective voltage followers 19 and 20.
  • the switch elements D 1 and D 2 serve to suppress power supply to the A/D converter 17 in response to a signal PD provided from the A/D conversion control bus buffer 12.
  • the shift register 4 is reset by a signal SRST from the integration control bus buffer 9, and the timing generating circuit 21 is reset by a signal CRST from the A/D conversion control bus buffer 12.
  • the integration timing generating circuit 8 and sample/hold timing generating circuit 10 are reset by a reset signal RST from the microcomputer MC.
  • the present invention even where the data of a measurement object has a broad brightness range and has various light intensity distributions, accurate light intensity detection can be obtained in a short period of time without the possibility for the measurement range to be exceeded since the period the light integration is adjusted with respect to the maximum illumination intensity portion. Further, the integrated data is temporarily stored in storing means before it is statically fetched out, so that these is no noise influence of MOS type switches that might otherwise occur at the time of dynamic operation. If this photosensor apparatus is used for the detection of focal position, quicker and more accurate detection compared to the prior art can be obtained.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
US06/460,627 1982-01-25 1983-01-24 Photosensor apparatus with light integration control Expired - Fee Related US4547676A (en)

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JP57008801A JPS58127132A (ja) 1982-01-25 1982-01-25 光検出装置
JP57-8801 1982-01-25

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Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4684798A (en) * 1985-10-03 1987-08-04 Honeywell Inc. Performance improvement for camera autofocus
US4691114A (en) * 1984-02-29 1987-09-01 Canon Kabushiki Kaisha Original reader with variable magnification and time delay
US4707859A (en) * 1985-12-16 1987-11-17 Hughes Aircraft Company Apparatus for high speed analysis of two-dimensional images
US4710816A (en) * 1985-09-30 1987-12-01 Nippon Kogaku K. K. Picture signal generating apparatus
US4714963A (en) * 1986-07-03 1987-12-22 Eastman Kodak Company Asynchronous still timing for a video camera producing movie or still images
US4750210A (en) * 1986-12-16 1988-06-07 Tektronix, Inc. Method and apparatus for finding objects within a visual display
US4754153A (en) * 1986-03-13 1988-06-28 Crosfield Electronics Limited Operating radiation sensors to avoid transfer loss
US4791446A (en) * 1986-02-14 1988-12-13 Minolta Camera Kabushiki Kaisha Light measuring device
US4809077A (en) * 1986-04-22 1989-02-28 Minolta Camera Kabushiki Kaisha Solid state image sensor drive apparatus
US4906856A (en) * 1984-11-20 1990-03-06 Seiko Instruments Inc. Semiconductive photodetection device having coplanar circuit components
WO1992000574A1 (en) * 1990-07-02 1992-01-09 Varian Associates, Inc. Method for improving the dynamic range of an imaging system
US5210402A (en) * 1987-08-05 1993-05-11 B.V. Optische Industies "De Oude Delft" Detection system for a radiation profile line
US5461419A (en) * 1992-10-16 1995-10-24 Casio Computer Co., Ltd. Photoelectric conversion system
US5692507A (en) * 1990-07-02 1997-12-02 Varian Associates, Inc. Computer tomography apparatus using image intensifier detector
US20050128329A1 (en) * 1999-02-16 2005-06-16 Micron Technology, Inc. Technique for flagging oversaturated pixels
US20050146791A1 (en) * 1999-01-25 2005-07-07 Bechtel Jon H. Automatic dimming mirror using semiconductor glare sensor
US20050270394A1 (en) * 2004-05-25 2005-12-08 Bart Dierickx Method and pixel for performing correlated double sampling
US8620523B2 (en) 2011-06-24 2013-12-31 Gentex Corporation Rearview assembly with multiple ambient light sensors
US9207116B2 (en) 2013-02-12 2015-12-08 Gentex Corporation Light sensor
US9224889B2 (en) 2011-08-05 2015-12-29 Gentex Corporation Optical assembly for a light sensor, light sensor assembly using the optical assembly, and vehicle rearview assembly using the light sensor assembly
US9870753B2 (en) 2013-02-12 2018-01-16 Gentex Corporation Light sensor having partially opaque optic

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4297014A (en) * 1979-02-14 1981-10-27 Asahi Kogaku Kogyo Kabushiki Kaisha Camera focus detecting device
US4326127A (en) * 1979-06-18 1982-04-20 Asahi Kogaku Kogyo Kabushiki Kaisha Focus detecting device
US4329577A (en) * 1976-07-27 1982-05-11 Canon Kabushiki Kaisha Focus detecting device with photo-sensor array

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4329577A (en) * 1976-07-27 1982-05-11 Canon Kabushiki Kaisha Focus detecting device with photo-sensor array
US4297014A (en) * 1979-02-14 1981-10-27 Asahi Kogaku Kogyo Kabushiki Kaisha Camera focus detecting device
US4326127A (en) * 1979-06-18 1982-04-20 Asahi Kogaku Kogyo Kabushiki Kaisha Focus detecting device

Cited By (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4691114A (en) * 1984-02-29 1987-09-01 Canon Kabushiki Kaisha Original reader with variable magnification and time delay
US4906856A (en) * 1984-11-20 1990-03-06 Seiko Instruments Inc. Semiconductive photodetection device having coplanar circuit components
US4710816A (en) * 1985-09-30 1987-12-01 Nippon Kogaku K. K. Picture signal generating apparatus
US4684798A (en) * 1985-10-03 1987-08-04 Honeywell Inc. Performance improvement for camera autofocus
US4707859A (en) * 1985-12-16 1987-11-17 Hughes Aircraft Company Apparatus for high speed analysis of two-dimensional images
US4791446A (en) * 1986-02-14 1988-12-13 Minolta Camera Kabushiki Kaisha Light measuring device
US4843417A (en) * 1986-02-14 1989-06-27 Minolta Camera Kabushiki Kaisha Light measuring device
US4754153A (en) * 1986-03-13 1988-06-28 Crosfield Electronics Limited Operating radiation sensors to avoid transfer loss
US4809077A (en) * 1986-04-22 1989-02-28 Minolta Camera Kabushiki Kaisha Solid state image sensor drive apparatus
US4989094A (en) * 1986-04-22 1991-01-29 Minolta Camera Kabushiki Kaisha Solid state image sensor drive apparatus
US4714963A (en) * 1986-07-03 1987-12-22 Eastman Kodak Company Asynchronous still timing for a video camera producing movie or still images
US4750210A (en) * 1986-12-16 1988-06-07 Tektronix, Inc. Method and apparatus for finding objects within a visual display
US5210402A (en) * 1987-08-05 1993-05-11 B.V. Optische Industies "De Oude Delft" Detection system for a radiation profile line
US5168532A (en) * 1990-07-02 1992-12-01 Varian Associates, Inc. Method for improving the dynamic range of an imaging system
WO1992000574A1 (en) * 1990-07-02 1992-01-09 Varian Associates, Inc. Method for improving the dynamic range of an imaging system
US5692507A (en) * 1990-07-02 1997-12-02 Varian Associates, Inc. Computer tomography apparatus using image intensifier detector
US5461419A (en) * 1992-10-16 1995-10-24 Casio Computer Co., Ltd. Photoelectric conversion system
US20050146791A1 (en) * 1999-01-25 2005-07-07 Bechtel Jon H. Automatic dimming mirror using semiconductor glare sensor
US7550703B2 (en) * 1999-01-25 2009-06-23 Gentex Corporation Apparatus including at least one light sensor with an input pin for receiving an integration period signal
US20050128329A1 (en) * 1999-02-16 2005-06-16 Micron Technology, Inc. Technique for flagging oversaturated pixels
US8031260B2 (en) * 1999-02-16 2011-10-04 Aptina Imaging Corporation Technique for flagging oversaturated pixels
US7973845B2 (en) * 2004-05-25 2011-07-05 On Semiconductor Trading, Ltd. Method and pixel for performing correlated double sampling
US20050270394A1 (en) * 2004-05-25 2005-12-08 Bart Dierickx Method and pixel for performing correlated double sampling
US8620523B2 (en) 2011-06-24 2013-12-31 Gentex Corporation Rearview assembly with multiple ambient light sensors
US9224889B2 (en) 2011-08-05 2015-12-29 Gentex Corporation Optical assembly for a light sensor, light sensor assembly using the optical assembly, and vehicle rearview assembly using the light sensor assembly
US9207116B2 (en) 2013-02-12 2015-12-08 Gentex Corporation Light sensor
US9870753B2 (en) 2013-02-12 2018-01-16 Gentex Corporation Light sensor having partially opaque optic
US9961746B2 (en) 2013-02-12 2018-05-01 Gentex Corporation Light sensor
US11006502B2 (en) 2013-02-12 2021-05-11 Gentex Corporation Light sensor
US11017741B2 (en) 2013-02-12 2021-05-25 Gentex Corporation Light sensor having partially opaque optic

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JPH0245813B2 (enrdf_load_stackoverflow) 1990-10-11
JPS58127132A (ja) 1983-07-28

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