US3617788A - Method of vacuum-tight closure of thin beryllium windows and x-ray tube provided with such a window - Google Patents
Method of vacuum-tight closure of thin beryllium windows and x-ray tube provided with such a window Download PDFInfo
- Publication number
- US3617788A US3617788A US856647A US3617788DA US3617788A US 3617788 A US3617788 A US 3617788A US 856647 A US856647 A US 856647A US 3617788D A US3617788D A US 3617788DA US 3617788 A US3617788 A US 3617788A
- Authority
- US
- United States
- Prior art keywords
- window
- beryllium
- windows
- ray tube
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 title claims abstract description 28
- 229910052790 beryllium Inorganic materials 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 title claims abstract description 22
- FRWYFWZENXDZMU-UHFFFAOYSA-N 2-iodoquinoline Chemical compound C1=CC=CC2=NC(I)=CC=C21 FRWYFWZENXDZMU-UHFFFAOYSA-N 0.000 claims abstract description 11
- LTPBRCUWZOMYOC-UHFFFAOYSA-N beryllium oxide Inorganic materials O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000011888 foil Substances 0.000 claims abstract description 10
- 239000011148 porous material Substances 0.000 claims abstract description 10
- 239000011248 coating agent Substances 0.000 claims description 15
- 238000000576 coating method Methods 0.000 claims description 15
- 238000012921 fluorescence analysis Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 abstract description 9
- 238000004544 sputter deposition Methods 0.000 abstract description 8
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 239000002245 particle Substances 0.000 abstract description 4
- 238000004458 analytical method Methods 0.000 abstract description 3
- 238000004876 x-ray fluorescence Methods 0.000 abstract description 3
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- -1 argon ions Chemical class 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000005291 magnetic effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/18—Windows, e.g. for X-ray transmission
- H01J2235/183—Multi-layer structures
Definitions
- the practically unavoidable pores or cracks in the beryllium foil are found to be completely closed by a layer thickness of about 1 t.
- rejects in the production due to bad vacuum-tightness can be avoided and it becomes thus possible to manufacture reliable X-ray tubes provided with these extremely thin windows.
- window plates cut from such metal foil and arranged in the window frame are often not vacuum-tight and hence unserviceable. Reinsertion of a window involves additional time and costs. This is not readily avoidable because a preliminary test of cutout window plates for assessing the vacuum-tightness does not always give reliable results. It is furthermore unavoidable that a piece of metal foil of comparatively small size, having many pores, is divided among a plurality of windows during cutting, which are then unserviceable.
- the invention relates to a method of vacuum-tight closure of beryllium windows of a thickness of not more than 100 ,u. for closing exit openings of X-ray tubes and has for its object to obviate said disadvantages.
- the mechanically machined window cut from a thin, rolled plate of beryllium is provided by a particle sputtering technique with a covering layer closing the pores of the window.
- a coating of a thickness of about I 41 applied to a beryllium window by sputtering provides a complete closure of the pores provided these pores do not exceed about 1..
- the material to be sputtered should for this purpose contain only elements of a low atomic number and usually consists of beryllium oxide or beryllium.
- the rolled beryllium foil may be treated before cutting window plates.
- the cutout window plates may be treated separately, while the use of material of apparently bad portions of a metal foil can be avoided.
- the windows already arranged in a frame may be treated, which facilitates handling and checking with respect to vacuum-tightness.
- the treatment may be carried out after the windows, which may no longer be flat but be provided with some profile for special requirements, have been arranged in the window opening of the X-ray tube.
- FIG. I is a quite schematic sectional view of a device for carrying out the method
- FIG. 2 is a sectional view of an X-ray tube provided with a window in accordance with the invention.
- the sputtering space 1 communicates through an opening 2 in a base plate 3 with a suction pump (not shown), while the space 1 is bounded by a bell 4, preferably of glass.
- the sputtering space accommodates a metal electrode 5, to which a beryllium oxide plate 6 is fastened
- the electrode 5 together with the plate 6 is electrically connected via a through-connection 7 to a high-frequency generator 8, which is capable of supplying a voltage up to 4 kv. of a frequency of 20 MHz.
- the electrode 5 and the supply conductor 9 inside the bell are screened by an earth-con nected sheath 10.
- a vapor-deposition table 11, electrically connected to a base plate, can receive the beryllium windows to be treated.
- the base plate has the further required passages,
- the passage 12 for the supply of ar on as to the sputtering space 1 being shown.
- a control v ve 2 the pressure of the argon gas can be adjusted in the space 1.
- This gas pressure is of the order of 5X10 Torr.
- the high-frequency field applied, together with a magnetic field produced by a magnet coil 14, produces a plasma of argon ions and maintains it so that particles are released from the beryllium oxide plate 6 and applied to the window 15 lying on the table 11.
- the thickness of the coating is controlled by the duration of the process and is about 1 u.
- the plate 6 must be replaced by a plate of beryllium metal, in which case a capacitor must be connected between the electrode 5 and the high frequency source in order to cause the process to be performed in the correct sense. It is furthermore possible to volatilize beryllium in an oxygen atmosphere, so that a coating of beryllium oxide is formed. If the window plate is to be treated after mounting in the X-ray tube, an opening (not shown) has to be provided in the bell or in the base plate, through which the window can be disposed approximately at the place of the then failing table 11. The tube to be treated must then be conductively connected to the base plate.
- FIG. 2 One embodiment of an X-ray tube comprising a window thus treated is shown in FIG. 2.
- This tube is of the type disclosed by the applicant in Dutch Pat. application No. 6,708,463, where the desirability of thin windows is indicated and the problem of lack of vacuum-tightness of these windows is involved.
- the tube comprises a glass sheath 20 enclosing a vacuum space in which a cathode 21 is arranged, opposite which a hollow metal tube 22 is arranged, which extends beyond a seal 23 of the sheath 20 and is made of ferromagnetic material, for example, iron.
- this tube accommodates a copper anode 24, which closes the tube in an airtight manner, while the window 25 of a thickness of, for example, 50 [-L is located opposite said anode in the wall of the tube through which window the X-rays released at 26 emerge.
- the projecting tube portion may be arranged in the bell of FIG. 1. The small quantity of beryllium or beryllium oxide deposited on the tube wall during treatment will not give rise to any difficulty. If desired, the tube may be screened against it.
- a method of hermetically sealing beryllium windows of a thickness of less than ,u for closing radiation openings of X-ray tubes comprising the step of sputtering beryllium or beryllium oxide onto a thin rolled sheet of beryllium to form a coating thereon closing the pores in the beryllium sheet.
- window plates are cut from a foil and are fastened in a frame readily mounted in the exit opening of an X-ray tube, said plates then being provided with a coating on at least one side thereof.
- An X-ray tube for producing comparatively soft X-rays for fluorescence analysis of elements of a low atomic number comprising an evacuated envelope provided with anode and cathode electrodes, said envelope having a beryllium exit window having a thickness of about 50 11., said window provided on at least one side with a sputtered coating of beryllium or beryllium oxide closing the pores in the window.
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL6813190A NL6813190A (enrdf_load_stackoverflow) | 1968-09-14 | 1968-09-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
US3617788A true US3617788A (en) | 1971-11-02 |
Family
ID=19804661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US856647A Expired - Lifetime US3617788A (en) | 1968-09-14 | 1969-09-10 | Method of vacuum-tight closure of thin beryllium windows and x-ray tube provided with such a window |
Country Status (6)
Country | Link |
---|---|
US (1) | US3617788A (enrdf_load_stackoverflow) |
AT (1) | AT294263B (enrdf_load_stackoverflow) |
DE (1) | DE1942922A1 (enrdf_load_stackoverflow) |
FR (1) | FR2018139A1 (enrdf_load_stackoverflow) |
GB (1) | GB1232125A (enrdf_load_stackoverflow) |
NL (1) | NL6813190A (enrdf_load_stackoverflow) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4178509A (en) * | 1978-06-02 | 1979-12-11 | The Bendix Corporation | Sensitivity proportional counter window |
US4566116A (en) * | 1982-04-30 | 1986-01-21 | Hitachi, Ltd. | Soft X-ray generator |
US5013922A (en) * | 1990-03-13 | 1991-05-07 | General Electric Company | Reduced thickness radiation window for an ionization detector |
US5418830A (en) * | 1992-05-15 | 1995-05-23 | Scan-Tech S.A. | Radiometric thickness measurement gage |
EP0757362A1 (de) * | 1995-08-02 | 1997-02-05 | INSTITUT FÜR MIKROTECHNIK MAINZ GmbH | Röntgenstrahlendurchlässiges Schichtmaterial, Verfahren zu seiner Herstellung sowie deren Verwendung |
US20070291901A1 (en) * | 2006-06-15 | 2007-12-20 | Varian Medical Systems Technologies, Inc. | X-ray tube window bonding with smooth bonding surface |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2663812A (en) * | 1950-03-04 | 1953-12-22 | Philips Lab Inc | X-ray tube window |
US2866114A (en) * | 1953-06-12 | 1958-12-23 | Philips Corp | Beryllium window x-ray tube |
-
1968
- 1968-09-14 NL NL6813190A patent/NL6813190A/xx unknown
-
1969
- 1969-08-23 DE DE19691942922 patent/DE1942922A1/de active Pending
- 1969-09-10 US US856647A patent/US3617788A/en not_active Expired - Lifetime
- 1969-09-11 GB GB1232125D patent/GB1232125A/en not_active Expired
- 1969-09-11 AT AT862969A patent/AT294263B/de not_active IP Right Cessation
- 1969-09-15 FR FR6931368A patent/FR2018139A1/fr not_active Withdrawn
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2663812A (en) * | 1950-03-04 | 1953-12-22 | Philips Lab Inc | X-ray tube window |
US2866114A (en) * | 1953-06-12 | 1958-12-23 | Philips Corp | Beryllium window x-ray tube |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4178509A (en) * | 1978-06-02 | 1979-12-11 | The Bendix Corporation | Sensitivity proportional counter window |
US4566116A (en) * | 1982-04-30 | 1986-01-21 | Hitachi, Ltd. | Soft X-ray generator |
US5013922A (en) * | 1990-03-13 | 1991-05-07 | General Electric Company | Reduced thickness radiation window for an ionization detector |
US5418830A (en) * | 1992-05-15 | 1995-05-23 | Scan-Tech S.A. | Radiometric thickness measurement gage |
EP0757362A1 (de) * | 1995-08-02 | 1997-02-05 | INSTITUT FÜR MIKROTECHNIK MAINZ GmbH | Röntgenstrahlendurchlässiges Schichtmaterial, Verfahren zu seiner Herstellung sowie deren Verwendung |
US5740228A (en) * | 1995-08-02 | 1998-04-14 | Institut Fur Mikrotechnik Mainz Gmbh | X-ray radiolucent material, method for its manufacture, and its use |
US20070291901A1 (en) * | 2006-06-15 | 2007-12-20 | Varian Medical Systems Technologies, Inc. | X-ray tube window bonding with smooth bonding surface |
Also Published As
Publication number | Publication date |
---|---|
GB1232125A (enrdf_load_stackoverflow) | 1971-05-19 |
NL6813190A (enrdf_load_stackoverflow) | 1970-03-17 |
AT294263B (de) | 1971-11-10 |
FR2018139A1 (enrdf_load_stackoverflow) | 1970-05-29 |
DE1942922A1 (de) | 1970-03-19 |
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