US3102194A - Shutter for electron microscopes - Google Patents

Shutter for electron microscopes Download PDF

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Publication number
US3102194A
US3102194A US837800A US83780059A US3102194A US 3102194 A US3102194 A US 3102194A US 837800 A US837800 A US 837800A US 83780059 A US83780059 A US 83780059A US 3102194 A US3102194 A US 3102194A
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US
United States
Prior art keywords
shutter
blades
blade
charged particles
receiving area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US837800A
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English (en)
Inventor
Broek Simon Lourens Van Den
Marien Hendricus Corne Johanna
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
US Philips Corp
North American Philips Co Inc
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US Philips Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Philips Corp filed Critical US Philips Corp
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Publication of US3102194A publication Critical patent/US3102194A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical, image processing or photographic arrangements associated with the tube
    • H01J37/224—Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen

Definitions

  • Such a shutter serves to intercept thecharged particles travelling towards the receiving area (photographic film or fluorescent screen) so long as exposure of the film or screen is not wanted.
  • the shutter according'to the invention allows passage at will of a portion of the projecting beam or the whole of the beam.
  • the user is thus enabled to take a photograph with a portion of the beam of rays and, at a later moment, with the other portion of the beam or with the Whole of the beam.
  • By comparison of the two portions of the image which appear side by side on the film it is thus possible to observe any variations which may have occurred in the object during the period between the two exposures. 7
  • the shutter comprises two halves, one of which may be opened, whereas the other remains closed until a later moment.
  • the shutter according to the invention may' comprise a spring in which the energy required for opening or closing the shutter is stored beforehand.
  • the halves are opened and closed by means of two springs, which are applied to a point of one half of the shutter and to a point of the other half of the shutter, respectively, and applied, at'their other ends,-to a part which can be displaced from without between two extreme positions in which the springs exert opposite torques upon the halves of the shutter.
  • a lock is required which may likewise be operated from without and which in one position prevents one half of the shutter from being turned out of the closed position and which in another position allows such a movement.
  • this lock there are several possibilities. There may be provided a lock for blocking only one half of-the shutter. This is sufficient if it is not necessary to take two complementary photographs. If, however, it is intended to make such photographs, it is possible to provide a separate lock for each half of the shutter. As an alternative, '2. single lock may be designed so that it can block at will one half of the shutter or the other.
  • FIG. 1 is a cross-sectional view of the housing of an electron microscope with a llat plane at right angles to the longitudinal axis of the housing near the shutter;
  • reference numeral 1 indicates part of the steel housing of the microscope which is exhausted during use.
  • table 2 which carries the shutter comprising the halves 3 and 4, each in the form of a metal plate.
  • a dotted line 5 indicates the cross-section of the projecting beam of electrons, the axis of which coincides with that of the cylindrical housing 1.
  • the plates 3 and 4 in common intercept the whole of the beam so that electrons cannot reach the projection surface (photographic film or luminescent screen).
  • The-plates 3 and 4 can pivot upon a shaft 6 and, in this example, are located one on the other sothat their edges 7 and 8 slightly overlap.
  • the wall 1 has an opening in which a rod 9 is slidable.
  • Springs 11 and 12 are applied to rod 9 at 10, the other end of spring 11 being applied to plate 3 at 13 and the other end of spring 12 being applied to plate 4 at 14.
  • FIG. 2 shows a detail of the shutter, as viewed in a and the half 4 of the shutter is opened by the action of 7 spring 12. Point 14 then lies at Ma.
  • the shaft 24 can slide over a limited distance.
  • the arm 23 is remote from the plates 3 and 4, it is thus possible to move the shaft inwards to'an extent such that,
  • the housing 1 contains an electron gun 28 and a number of magnetic lenses of which 29 indicates a condenser lens, 30 an objective lens and 31 Specimen holder 32 is shown between the lenses 29 and 30.
  • the housing 1 has a flared end portion 33 which at its bottom 34 carriers a fluorescent layer '35 onto which an electron image is projected and transformed into a luminescent image.
  • the shutter halves 3, 4 and the mechanism hereinbefore described for operating the shutter are positioned between projection lens 31 and fluorescent layer 35.
  • the shutter may be designed so that one half intercepts a larger proportion of the electron beam than does the other, if such should be desirable for practical reasons.
  • said shutter comprising two blades each of which intercepts a portion of the beam of charged particles travelling toward the receiving area, each of said blades being rotatable about an axis remote from thebeam of charged particles, and means for rotating said blades in the path of said beam to open and close the shutter including a tension spring connected to one blade and a separate tension spring connected to ward a receiving area, and a shutter for intercepting at least a portion of the beam of charged particles before reaching the receiving area, said shutter comprising two blades each of which intercepts a portion of the beam of charged particles travelling toward the receiving area, each of saidblades being rotatable about an axis remote from the beam of charged particles, and means for rotating said blades about a common axis and perpendicular to the path of said beam toopen and close the shutter including a tension spring connected to one blade and a separate tension spring connected to the other blade,
  • a movable member coupled to the ends of the springs remote from each shutter blade, means to move the movable member from outside the chamber whereby the blades can be selectively rotated into a closed and open position, and lock meansoperable from outside the chamber for preventing rotation of one of the blades while the other blade is rotated.
  • An electron microscope comprising an evacuated chamber in which a beam of charged particles travels toward a receiving area, and a shutter for intercepting at least a portion of the beam of charged particles before reaching the receiving area, said shutter comprising two blades each of which intercepts a portion of the beam of charged particles travelling toward the receiving area, each ofsaid blades being rotatable about an axis remote from the beam of charged particles, and means for rotating said blades about a common axis and perpendicular to the path of said beam to open and close the shutter including a tension spring connected to, one blade and a separate tension spring connected to the other blade, a movable member coupled to the ends of the springs remote from each shutter blade, means to move the movable member from outside the chamber including a shaft extending through the wall of said chamber and engaging said movable member to displace the same upon rotation of said shaft whereby the blades can be selectively rotated into a closed and open positiomand lock means operable from outside the chamber for preventing rotation of one of the
  • An electron microscope comprising an evacuated chamber in which a beam of charged particles travels toward a receiving area, and a shutter for intercepting at least a portion of the beam of charged particles before reaching the receiving area, said shutter comprising two blades each of which intercepts a portion of the beam of charged particles travelling toward the receiving area, each of said blades being rotatable about an axis remote from the beam of charged particles, and means for rotating said blades about a common axis and perpendicular to the path of said beam toopen and close the shutter including a tension spring connected to one blade and a separate tension spring connected to the other blade, a movable member coupled to the ends of the springs remote from each shutter blade, means to move the movable member from outside the chamber including a shaft extending through the wall of the chamber, an'ar-m on said shaft, a driving pin on said arm, and a pair of cams on said movable member in engagement with said pin a closed and open position, and lock means operable from outside the chamber for preventing rotation of on of
  • An electron microscope comprising an evacuated chamber in which a beam of charged particles travels toward a receiving area, and a shutter for intercepting'at least a portion of the beam ofscharged particles before reaching the receiving area, said shutter comprising two blades each of which intercepts a portion of the beam.
  • each of said blades being rotatable about an axis remote from the beam ofcharged particles, and means for rotating said blades about a common axis and perpendicular to the path of said beam to open and close the shutter including a tension spring connected to one blade and a separate tension springconnected to the other blade,
  • a movable member coupled to the end-s of the springs remote from each shutter blade, means to move the movable member from outside the chamber whereby the blades can be selectively rotated into a closed and open position, and lock means operable from outside the Ullallk her for preventing rotation of one of the blades while the other blade is rotated, said lock means including a shaft extending hermetically through the Wall of the chamber, said shaft being rotatable and slidable, a lateral arm within the chamber secured to said arm, and a pair of abutment members each associated with one of said blades positioned to engage said arm to prevent movement of the blade.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Shutters For Cameras (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
US837800A 1958-09-13 1959-09-03 Shutter for electron microscopes Expired - Lifetime US3102194A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL231362 1958-09-13

Publications (1)

Publication Number Publication Date
US3102194A true US3102194A (en) 1963-08-27

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ID=19751347

Family Applications (1)

Application Number Title Priority Date Filing Date
US837800A Expired - Lifetime US3102194A (en) 1958-09-13 1959-09-03 Shutter for electron microscopes

Country Status (6)

Country Link
US (1) US3102194A (enrdf_load_stackoverflow)
CH (1) CH383515A (enrdf_load_stackoverflow)
DE (1) DE1205634B (enrdf_load_stackoverflow)
FR (1) FR1235120A (enrdf_load_stackoverflow)
GB (1) GB930853A (enrdf_load_stackoverflow)
NL (1) NL99154C (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3198948A (en) * 1963-04-15 1965-08-03 Packard Instrument Co Inc Apparatus for measuring activity levels of radioactive samples
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US3359418A (en) * 1964-12-11 1967-12-19 Gunter F Bahr Electromagnetic actuating means for a shutter mechanism in an electron microscope
US3395279A (en) * 1964-11-30 1968-07-30 Phillips Petroleum Co Positioning device for a radiation shield having means for cooling said shield
US3664252A (en) * 1969-09-20 1972-05-23 Eastman Kodak Co Camera shutter mechanism
US4205226A (en) * 1978-09-01 1980-05-27 The Perkin-Elmer Corporation Auger electron spectroscopy
US20180218878A1 (en) * 2017-01-27 2018-08-02 Howard Hughes Medical Institute Enhanced FIB-SEM Systems for Large-Volume 3D Imaging

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US494256A (en) * 1893-03-28 William h
DE577042C (de) * 1933-05-22 Gauthier Gmbh A Objektivverschluss
US2224077A (en) * 1939-12-18 1940-12-03 Kelley Koett Mfg Company Inc Shutter for X-ray apparatus and the like
US2331586A (en) * 1941-11-18 1943-10-12 George G Wasisco X-ray shield
US2425833A (en) * 1944-05-20 1947-08-19 Rca Corp Electron optical instrument
US2722611A (en) * 1953-04-30 1955-11-01 Keleket X Ray Corp X-ray apparatus
US2894144A (en) * 1957-10-21 1959-07-07 Picker X Ray Corp Waite Mfg Diaphragm apparatus for x-ray tubes

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE760761C (de) * 1941-06-21 1954-03-08 Siemens & Halske A G Vorrichtung zur Belichtung der Photoschicht in Korpuskular-strahlapparaten, insbesondere Elektronenmikroskopen

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US494256A (en) * 1893-03-28 William h
DE577042C (de) * 1933-05-22 Gauthier Gmbh A Objektivverschluss
US2224077A (en) * 1939-12-18 1940-12-03 Kelley Koett Mfg Company Inc Shutter for X-ray apparatus and the like
US2331586A (en) * 1941-11-18 1943-10-12 George G Wasisco X-ray shield
US2425833A (en) * 1944-05-20 1947-08-19 Rca Corp Electron optical instrument
US2722611A (en) * 1953-04-30 1955-11-01 Keleket X Ray Corp X-ray apparatus
US2894144A (en) * 1957-10-21 1959-07-07 Picker X Ray Corp Waite Mfg Diaphragm apparatus for x-ray tubes

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3198948A (en) * 1963-04-15 1965-08-03 Packard Instrument Co Inc Apparatus for measuring activity levels of radioactive samples
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US3395279A (en) * 1964-11-30 1968-07-30 Phillips Petroleum Co Positioning device for a radiation shield having means for cooling said shield
US3359418A (en) * 1964-12-11 1967-12-19 Gunter F Bahr Electromagnetic actuating means for a shutter mechanism in an electron microscope
US3664252A (en) * 1969-09-20 1972-05-23 Eastman Kodak Co Camera shutter mechanism
US4205226A (en) * 1978-09-01 1980-05-27 The Perkin-Elmer Corporation Auger electron spectroscopy
US20180218878A1 (en) * 2017-01-27 2018-08-02 Howard Hughes Medical Institute Enhanced FIB-SEM Systems for Large-Volume 3D Imaging
US10600615B2 (en) * 2017-01-27 2020-03-24 Howard Hughes Medical Institute Enhanced FIB-SEM systems for large-volume 3D imaging

Also Published As

Publication number Publication date
NL99154C (enrdf_load_stackoverflow)
GB930853A (en) 1963-07-10
CH383515A (de) 1964-10-31
FR1235120A (fr) 1960-07-01
DE1205634B (de) 1965-11-25

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