US20220187056A1 - Dimension measurement apparatus - Google Patents
Dimension measurement apparatus Download PDFInfo
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- US20220187056A1 US20220187056A1 US17/369,196 US202117369196A US2022187056A1 US 20220187056 A1 US20220187056 A1 US 20220187056A1 US 202117369196 A US202117369196 A US 202117369196A US 2022187056 A1 US2022187056 A1 US 2022187056A1
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- 238000005259 measurement Methods 0.000 title claims description 29
- 238000013459 approach Methods 0.000 claims description 4
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0004—Supports
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
Definitions
- the present disclosure relates in general to a dimension measurement apparatus applied for machining process.
- Machining process that utilizes processing machinery to change the shape or performance of the workpiece, and usually integrates a plurality of procedures to form a production line.
- a first process is applied to form a characteristic.
- another process is applied to form another characteristic.
- every process is performed upon the workpiece in order. For example, a process is firstly applied to machine a central hole and part of a wheel wall of a workpiece, and then a further process will be applied to perform processing upon the upper surface of the workpiece. Between these two processes, a measurement device would be introduced to measure dimensions at some key characteristics of the workpiece. Practically, before the second process is performed, an investigation of the workpiece upon dimensions, i.e., size and roundness of the central hole and a level height of the upper surface, should be performed.
- a measuring equipment applied to carry a workpiece to be measured, includes a main base and a positioning device.
- the main base includes a measuring center axis.
- the positioning device includes at least two positioning elements. Each of the at least two positioning elements is disposed movably on the main base, and each of the at least two positioning elements is moved with respect to the measuring center axis. An identical distance is there from each of the at least two positioning elements to the measuring center axis.
- Each of the at least two positioning elements is used for the workpiece to contact and to be positioned to the measuring center axis.
- each of the positioning elements can be adjusted to have all the distances from individual positioning elements to the measuring center axis to be equal to the radius of the inscribed circle of the workpiece. Thereupon, as the workpiece is placed against each of the positioning elements, the corresponding measuring point at the workpiece would be aligned with the measuring center axis, and so the workpiece can resume its original positioning. Further, such a measuring equipment in accordance with the present disclosure can be widely applied, with an enhanced measuring precision.
- FIG. 1 is a schematic top view of an embodiment of the dimension measurement apparatus in accordance with this disclosure
- FIG. 2 is a schematic perspective view of another embodiment of the dimension measurement apparatus in accordance with this disclosure.
- FIG. 3 is a schematic side view of FIG. 2 ;
- FIG. 4 is a schematic perspective view of a further embodiment of the measuring equipment in accordance with this disclosure.
- FIG. 5A demonstrates schematically an exemplary example of the main base and the positioning device of FIG. 4 ;
- FIG. 5B is a schematic top view of the main base of FIG. 5A ;
- FIG. 6 demonstrates schematically another exemplary example of the main base and the positioning device of FIG. 4 ;
- FIG. 7A demonstrates schematically a further exemplary example of the main base and the positioning device of FIG. 4 ;
- FIG. 7B is a schematic top view of FIG. 7A ;
- FIG. 8 is a schematic perspective view of one more embodiment of the measuring equipment in accordance with this disclosure.
- FIG. 9 is a schematic top view of an exemplary example of the main base and the positioning device of FIG. 8 ;
- FIG. 10 demonstrates schematically a tilt state of FIG. 8 ;
- FIG. 11 demonstrates schematically another exemplary example of the main base of FIG. 8 ;
- FIG. 12 demonstrates schematically a further exemplary example of the main base of FIG. 8 .
- FIG. 1 is a schematic top view of an embodiment of the measuring equipment in accordance with this disclosure.
- the measuring equipment 100 can be applied to carry a workpiece 50 to be tested, and used for measuring geometric dimensions of key characteristics, such as roundness and sizes of a central hole of the workpiece 50 and a level height of an upper surface of the workpiece 50 .
- the workpiece 50 can be a cylinder such as a wheel frame.
- the workpiece can be a polygonal object.
- the measuring equipment 100 includes a main base 110 and a positioning device 120 .
- the main base 110 includes a measuring center axis A.
- the positioning device 120 includes a first positioning element 122 and a second positioning element 124 , and both of the first positioning element 122 and the second positioning element 124 are disposed at the main base 110 and movably positioned.
- the first positioning element 122 and the second positioning element 124 are located oppositely to each other with respect to the measuring center axis A, and move therealong, such that a first distance D 1 between the first positioning element 122 and the measuring center axis A can be equal to a second distance D 2 between the second positioning element 124 and the measuring center axis A.
- the first distance D 1 and the second distance D 2 can be modulated to fit the size of the workpiece 50 .
- the first distance D 1 and the second distance D 2 from the first positioning element 122 and the second positioning element 124 , respectively, to the measuring center axis A can be further set according to the dimensions of the workpiece 50 .
- the first distance D 1 and the second distance D 2 can be set to an R, equal to the radius R of the workpiece 50 .
- a measuring point B can be set to a center of the workpiece 50 , and a distance from the measuring point B to a peripheral surface 52 of the workpiece 50 is set to the radius R.
- the radius of the workpiece can be set to a radius of an inscribed circle of the polygon, the measuring point of the workpiece is set at the center of the inscribed circle of the workpiece, and the first distance D 1 and the second distance D 2 are set to be equal to the radius of the inscribed circle of the workpiece.
- the workpiece 50 can be located onto the main base 110 , and the first positioning element 122 and the second positioning element 124 are applied to contact against the workpiece 50 , so that the workpiece 50 can be positioned to the measuring center axis A.
- the appearance of the workpiece 50 can be circular, and thus, when a peripheral surface 52 of the workpiece 50 is contacted by the first positioning element 122 and the second positioning element 124 , the measuring point B of the workpiece 50 would lie right on the measuring center axis A. This measuring point B is herein the center of the circle.
- the first distance D 1 between the first positioning element 122 and the measuring center axis A and the second distance D 2 between the measuring center axis A and the second positioning element 124 are both set to be the radius of the inscribed of the polygon. Any two outer walls of the side walls of the polygonal workpiece 50 is individually contacted by the first positioning element 122 and the second positioning element 124 . Thereby, the center of the workpiece 50 can still coincide with the measuring center axis A.
- the measuring equipment 100 can connect a processor (not shown in the figure) for receiving dimensions (such as the radius) of the workpiece 50 , and/or coordinate information of the first positioning element 122 , the second positioning element 124 and the measuring center axis A, for further controlling a motor (not shown herein) to adjust the positions of the first positioning element 122 and the second positioning element 124 .
- a processor not shown in the figure
- the adjustment of the first positioning element 122 and the second positioning element 124 can be performed manually, and further applies a fixing and positioning means of magnetic force or hole-and-latch pairs.
- this disclosure is not limited to the processor and the motor.
- the measuring equipment 100 further includes a measuring module 160 assembled together with the main base 110 .
- the measuring module 160 is used for measuring the workpiece 50 .
- the measuring center axis A is coaxial with the measuring module 160 .
- the measuring module 160 can be disposed above or under the main base 110 .
- the measuring center axis A can be an image center of the measuring module 160 (i.e., the measuring center axis A is coincided with the measuring module 160 ), a geometric center or any relevant position of the main base 110 , or an element or a target point (such as the center of the through hole 216 in FIG. 2 ) disposed on the main base 110 .
- the cutting point of the tooling can be set to be the measuring center axis A.
- the optical axis of the laser can be set to be the measuring center axis A.
- FIG. 2 is a schematic perspective view of another embodiment of the measuring equipment in accordance with this disclosure
- FIG. 3 is a schematic side view of the measuring equipment in FIG. 2
- the main base 210 of the measuring equipment 200 includes oppositely a top surface 212 and a bottom surface 214 .
- the measuring center axis A penetrates through both the top surface 212 and the bottom surface 214 .
- the top surface 212 of the main base 210 is provided to place thereon the workpiece 50 .
- the first positioning element 122 and the second positioning element 124 are individually protrusive over the top surface 212 of the main base 210 from different positions thereof. It shall be explained that, in this embodiment, both the first positioning element 122 and the second positioning element 124 are round cylinders. In another embodiment, the first positioning element 122 and the second positioning element 124 can be other shapes.
- the first positioning element 122 and the second positioning element 124 are individually to move in the first direction L 1 so as to have either of the first positioning element 122 and the second positioning element 124 to be separated from the measuring center axis A by a distance equal to the radius of the inscribed circle of the workpiece 50 . Then, the workpiece 50 is moved to position on the top surface 212 of the main base 210 .
- the workpiece 50 can be pushed (such as the push from the rear peripheral surface 52 B of the workpiece 50 ) or pulled, so as to move the workpiece 50 toward the first positioning element 122 and the second positioning element 124 till to contact both of the first positioning element 122 and the second positioning element 124 .
- the measuring module 160 can include a first sensing element 162 and a second sensing element 164 for performing different scales of measurement upon the workpiece 50 .
- the first sensing element 162 and the second sensing element 164 are individually disposed to opposite sides of the main base 210 , and the workpiece 50 is placed on the main base 210 .
- the first sensing element 162 and the second sensing element 164 of the measuring module 160 are then to measure the workpiece 50 , respectively.
- the main base 210 further includes a through hole 216 penetrating through the main base 210 by extending from the top surface 212 to the bottom surface 214 , and the measuring center axis A is set to be coaxial with a center of the through hole 216 .
- the upper side of the through hole 216 is right facing the first sensing element 162
- the lower side thereof is right facing the second sensing element 164 .
- the measuring module 160 can simply include the first sensing element 162 disposed on the main base 210 .
- the main base 210 can exclude the through hole 216 (as the embodiment shown in FIG. 1 ).
- the main base 110 of FIG. 1 is used to replace the main base 210 of FIG. 2 or FIG. 3 .
- the positioning device 120 can be also applied to align the measuring point B of the workpiece 50 with the measuring center axis A, such that the workpiece 50 can be precisely positioned for enhancing the measuring accuracy of the first sensing element.
- the type of the measuring module 160 and the ways for assembling the measuring module 160 and the main base 210 are not specifically defined.
- the first sensing element 162 can be a laser displacement detector
- the second sensing element 164 can be an optical camera.
- the measuring equipment 200 further includes a measuring base 162 A and a connecting element 170 .
- the connecting element 170 is used to connect the main base 210 and the measuring base 162 A.
- the measuring base 162 A is further connected with the first sensing element 162 , such that the measuring module 160 can be fixed and movable with the main base 210 .
- the sensing elements of the measuring module 160 can be adjusted to different types according to the practical manufacturing processes. Since the measuring center axis A, the first sensing element 162 and the second sensing element 164 are co-axial, thus, as long as the workpiece 50 is positioned to the measuring center axis A, the measuring accuracy upon the workpiece 50 can be substantially enhanced.
- the second sensing element 164 located under the main base 110 is an optical lens for capturing an image of the workpiece 50 for further analysis through the through hole 216 .
- the first sensing element 162 located above the main base 210 is a contact-type geometric probe for detecting the surface of the workpiece 50 so as to provide coordinate information for further calculation.
- the workpiece 50 can be a semi-finished wheel frame having a central hole requiring an optical investigation by the optical lens of the second sensing element 164 so as to realize whether or not the geometric dimensions of the workpiece 50 (such as the outer radius and the roundness can meet the tolerance requirements. Also, through the probe of the first sensing element 162 to realize level height information around the central hole.
- the geometric dimensions and the level height information of the workpiece 50 can be set as initial coordinates for the following manufacturing process.
- the measuring device for this disclosure is not specifically limited, and actually any measuring device that can serve the similar purpose can be one of the measuring elements qualified for this disclosure.
- FIG. 4 is a schematic perspective view of a further embodiment of the measuring equipment in accordance with this disclosure
- FIG. 5A demonstrates schematically an exemplary example of the main base and the positioning device of FIG. 4
- FIG. 5B is a schematic top view of the main base of FIG. 5A
- the measuring equipment 300 is similar to the measuring equipment 200 of FIG. 2 and FIG. 3 , but differences between the main base 310 of this embodiment and the main base 210 of FIG. 2 and FIG. 3 include at least that, in this embodiment, the main base 310 further includes a first positioning slot 317 and a second positioning slot 318 , formed at the main base 310 at different locations thereof.
- the first positioning slot 317 includes two opposite ends, a near end E 11 and a far end E 21 ; and, the second positioning slot 318 also includes two opposite ends, another near end E 12 and another far end E 22 .
- a distance from the near end E 11 of the first positioning slot 317 to the measuring center axis A is equal to another distance from the near end E 12 of the second positioning slot 318 to the measuring center axis A, and this distance is defined as H 1 .
- a distance from the far end E 21 of the first positioning slot 317 to the measuring center axis A is equal to another distance from the far end E 22 of the second positioning slot 318 to the measuring center axis A, and this distance is defined as H 2 .
- the distance H 1 is less than the distance H 2 .
- the first positioning element 122 is disposed in the first positioning slot 317 , and able to slide along the first positioning slot 317 for determining a position suitable to the workpiece.
- the second positioning element 124 is disposed in the second positioning slot 318 , and able to slide along the second positioning slot 318 for determining a position suitable to the workpiece.
- this embodiment can be used to measure a workpiece with a smaller radius of the inscribed circle.
- the first positioning element 122 and the second positioning element 124 can be adjusted to anchor at specific sections of the first positioning slot 317 and the second positioning slot 318 to support the measuring upon the workpiece having the radius of the inscribed circle radius to be greater than or equal to the distance H 1 , but smaller than the distance H 2 .
- the first positioning slot 317 and the second positioning slot 318 have the same length H, and this length H can be adjusted according to the practical dimensions of the workpiece.
- the first positioning element 122 and the second positioning element 124 can be synchronously driven by an actuator (such as a motor, not shown in the figure) moving inside the first positioning slot 317 or the second positioning slot 318 .
- an actuator such as a motor, not shown in the figure
- the distance from either of these two positioning elements 122 , 124 to the measuring center axis A can be equal to the radius of the inscribed circle of the workpiece.
- the positioning device 420 of the main base 410 can further includes a connecting bar 423 connecting the first positioning element 122 to the second positioning element 124 .
- this connecting bar 423 the first positioning element 122 and the second positioning element 124 can displace synchronously.
- the first positioning element 122 and the second positioning element 124 can move individually, but meet the criterion that the distance from either of the first positioning element 122 and the second positioning element 124 to the measuring center axis A should be equal to the radius of the inscribed circle of the workpiece, finally.
- the first positioning slot 317 and the second positioning slot 318 are extended in a parallel manner, from the near end E 11 to the far end E 21 for the first positioning slot 317 , and from the near end E 12 to the far end E 22 for the second positioning slot 318 .
- a distance H 3 between the two near ends E 11 , E 12 is, but not limited to, equal to another distance H 4 between the two far ends E 21 , E 22 .
- the first positioning slot 317 and the second positioning slot 318 can also extend in a non-parallel manner. For example, as shown in FIG.
- the first positioning slot 517 of the main base 510 and the second positioning slot 518 thereof are extended toward the through hole 216 in a non-parallel manner.
- a distance H 5 between the two near ends E 13 , E 14 is less than another distance H 6 between the two far ends E 23 , E 24 .
- a distance from the near end E 13 to the measuring center axis A is equal to another distance from another near end E 14 to the measuring center axis A
- a distance from the far end E 23 to the measuring center axis A is equal to another distance from another far end E 24 to the measuring center axis A.
- the first positioning element 122 and the second positioning element 124 are displaced inside and along the first positioning slot 517 and the second positioning slot 518 , respectively. Though the first positioning element 122 and the second positioning element 124 don't move in a parallel manner, yet the first positioning element 122 and the second positioning element 124 can still move to keep the same distancing to the measuring center axis A.
- first positioning element 122 and the second positioning element 124 can be moved manually, and fixed by magnetic forcing or hole-and-latch pairs. As such, the distance from either of these two positioning elements 122 , 124 to the measuring center axis A can be equal to the radius of the inscribed circle of the workpiece.
- FIG. 8 is a schematic perspective view of one more embodiment of the measuring equipment in accordance with this disclosure
- FIG. 9 is a schematic top view of an exemplary example of the main base and the positioning device of FIG. 8 .
- FIG. 8 and FIG. 9 by comparing to the main base 110 of FIG. 1 , the main base 210 of FIG. 2 and FIG. 3 , the main base 310 of FIG. 4 , FIG. 5A and FIG. 5B , the main base 410 of FIG. 6 , and the main base 510 of FIG. 7A and FIG.
- the measuring equipment 600 further includes an auxiliary device 640 having a first auxiliary element 642 and a second auxiliary element 644 . As shown in FIG.
- the first auxiliary element 642 and the second auxiliary element 644 can be movably or rationally disposed on the top surface 212 of the main base 310 , the auxiliary device 640 (such as the first auxiliary element 642 and the second auxiliary element 644 ) and the positioning device 120 (such as the first positioning element 122 and the second positioning element 124 ) are disposed to opposite sides of the measuring center axis A on the main base 310 , or to opposite sides of the through hole 316 of the main base 310 .
- the main base 310 includes oppositely a first end F 1 and a second end F 2 , the first auxiliary element 642 and the second auxiliary element 644 are disposed close to the second end F 2 of the main base 310 , and the first positioning element 122 and the second positioning element 124 are disposed close to the first end F 1 of the main base 310 .
- this first direction L 1 can be identical to the first direction L 1 shown in FIG. 1 to FIG. 6 , or FIG. 8 to FIG. 9 .
- the first positioning element 122 and the second positioning element 124 are moved in a parallel manner; i.e., along the same moving direction.
- the first positioning element 122 and the second positioning element 124 can be moved in a non-parallel manner; i.e., moved along different moving directions. Even that the first positioning element 122 and the second positioning element 124 do not move in the same direction, both the first positioning element 122 and the second positioning element 124 can be still moved individually toward the measuring center axis A.
- the workpiece 50 can be located onto the main base 310 , and the first positioning element 122 and the second positioning element 124 are directly applied to contact against the peripheral surface 52 of the workpiece 50 .
- a mechanical arm not shown herein
- a conveying belt not shown herein
- any human or other means the workpiece 50 can be located onto the main base 310 , and the first positioning element 122 and the second positioning element 124 are directly applied to contact against the peripheral surface 52 of the workpiece 50 .
- the first auxiliary element 642 and the second auxiliary element 644 of this embodiment can be driven by an actuator (such as a motor, but not shown herein) to displace or rotate in the second direction L 2 so as to contact the workpiece 50 ; i.e., to have the workpiece 50 to approach the first positioning element 122 and the second positioning element 124 till the workpiece 50 contacts both the first positioning element 122 and the second positioning element 124 .
- an actuator such as a motor, but not shown herein
- the first auxiliary element 642 and the second auxiliary element 644 can push the workpiece 50 so as to have the peripheral surface 52 to contact against the first positioning element 122 and the second positioning element 124 , such that the workpiece 50 can be positioned to the measuring center axis A.
- the second direction L 2 is a direction toward the first positioning element 122 and the second positioning element 124 , and the first auxiliary element 642 and the second auxiliary element 644 are moved in the same moving direction.
- the first auxiliary element 642 and the second auxiliary element 644 can be designed to approach the measuring center axis A in an individual manner.
- the first auxiliary element 642 moves toward the measuring center axis A in the third direction L 31
- the second auxiliary element 644 moves toward the measuring center axis A in the fourth direction L 32 .
- the first auxiliary element 642 and the second auxiliary element 644 follow different moving directions, yet the workpiece 50 can be still contacted finally.
- the aforesaid first auxiliary element 642 and the aforesaid second auxiliary element 644 are moved individually in the third direction L 31 and the fourth direction L 32 , respectively, to approach the same measuring center axis A.
- first auxiliary element 642 and the second auxiliary element 644 can follow the corresponding third and fourth directions L 31 , L 32 to move away from the measuring center axis A, such that the first auxiliary element 642 and the second auxiliary element 644 can move closer to the corner positions P 1 , P 2 at the second end F 2 of the main base 310 , respectively.
- the distance between the first auxiliary element 642 and the second auxiliary element 644 would become larger and easier for another workpiece 50 to be placed on the main base 310 from the second end F 2 thereof.
- the top surface 212 of the main base 310 can be provided to be a plane with a low friction coefficient, such that the friction between the workpiece 50 and the top surface 212 can be substantially reduced.
- this surface finish of the top surface 212 plays a role of auxiliary sliding structure for easing the movement of the workpiece 50 on the main base 310 .
- a plane with a lower friction coefficient can be achieved by adding a lubricant, a slip tape or the like film structure, or by introducing slipping balls, air-float nozzles or the like structure.
- the measuring equipment 600 further includes a support device 130 for supporting the main base 310 .
- the support device 130 includes a plurality of foot plates 132 and a plurality of support legs 134 .
- Each of the support legs 134 is connected between the main base 310 and the corresponding foot plate 132 , so as to stand the main base 310 over the ground, and also to provide functions related to earthquake safety and level adjustment.
- the support device 130 (shown in FIG. 2 to FIG. 4 ) can be provided to the measuring equipment 100 , 200 , 300 shown in FIG. 1 to FIG. 4 .
- the support legs 134 and the foot plates 132 shown in the drawings are simply one of many exemplary examples for a demonstrative purpose, not for limiting the scope of this disclosure.
- FIG. 10 demonstrates schematically measuring equipment in a tilt state.
- the measuring equipment 600 can further includes a tilting device 150 connected with the main base 310 and used for moving the main base 310 to switch around between a first state S 1 and a second state S 2 .
- a tilting device 150 connected with the main base 310 and used for moving the main base 310 to switch around between a first state S 1 and a second state S 2 .
- the level height of the first end F 1 of the main base 310 is lower than that of the second end F 2 thereof.
- the main base 310 is in the second state S 2
- the level height of the first end F 1 of the main base 310 is not lower than that of the second end F 2 thereof (namely, as shown in FIG.
- the level height of the first end F 1 of the main base 310 is equal to that of the second end F 2 thereof, such that the main base 310 is in a horizontal state), or the level height of the first end F 1 of the main base 310 is higher than that of the second end F 2 thereof.
- the tilting device 150 since the tilting device 150 is located close to the second end F 2 of the main base 310 , as the tilting device 150 pushes the bottom surface 214 of the main base 310 in a pushing direction L 4 to tilt the main base 310 , then the level height of the first end F 1 of the main base 310 would be lower than that of the second end F 2 thereof.
- the measuring module 160 is fixed to the main base 310 , thus, while the main base 310 is tilted, the measuring module 160 would be tilted as well, such that the related position of the measuring center axis A with respect to the main base 310 would keep the same, and so the parameters for the first sensing element 162 and the second sensing element 164 of the measuring module 160 do not need to be re-calibrated.
- the tilting device 150 can include a hydraulic rod 152 disposed between the main base 310 and the support leg 134 connecting the foot plate 132 .
- the hydraulic rod 152 can be driven by an actuator (not shown in the figure) to perform extending and retrieving for varying the tilt angle of the main base 310 ; i.e., to switch around the first state S 1 and the second state S 2 .
- this disclosure does not place any limitation for the type of the tilting device 150 , and actually any mechanism that can push and tilt the main base 310 is a qualified candidate for the tilting device 150 of this disclosure.
- the first auxiliary element 642 and the second auxiliary element 644 can be applied to push the workpiece 50 , so as to have the front peripheral surface 52 A of the workpiece 50 to contact both of the first positioning element 122 and the second positioning element 124 .
- this disclosure can further tilt the main base 310 to make the workpiece 50 move in the moving direction L and further contact the first positioning element 122 and the second positioning element 124 .
- the workpiece 50 can be also positioned to the measuring center axis A. It shall be explained that the moving direction L herein is directed to the direction from the second end F 2 of the main base 310 to the first end F 1 thereof.
- the hydraulic rod 152 of the tilting device 150 can protrude upward so as to tilt the main base 310 , thus the first sensing element 162 and the second sensing element 164 of the measuring module 160 , and also the workpiece 50 are tilted to the left side of FIG. 10 , and so the level height of the first end F 1 of the main base 310 would be lower than that of the second end F 2 thereof.
- cutting fluid and chips on the workpiece 50 would slip down by gravity along the tilted main base 310 and finally leave the main base 310 .
- no excessive pollutants can leave on the main base 310 to affect the measurement, and the entire measuring area can be kept clean.
- the measurement process can keep running. Further, the second sensing element 164 under the main base 310 can still perform measuring upon the workpiece 50 through the through hole 316 of the main base 310 , since the second sensing element 164 as well as the main base 310 can be synchronously tilted by the same slope (such as 20 degrees).
- the length of the support leg 134 at the first end F 1 of the main base 310 can be less than that of another support leg 134 at the second end F 2 thereof, such that the level height of the first end F 1 is lower than that of the second end F 2 .
- the measuring center axis A and the first sensing element 162 and the second sensing element 164 are aligned in an early stage, thus the measuring can still work in the tilt state.
- the main base 310 while the main base 310 is in the tilt state, the workpiece 50 can slide along the main base 310 by its own gravity to reach both the first positioning element 122 and the second positioning element 124 .
- first state S 1 and the second state S 2 of the main base 310 are elucidated, but not limited to, by FIG. 10 and FIG. 8 , respectively.
- the second state S 2 is shown to the main base 210 of FIG. 2 and FIG. 3 , and to the main base 310 of FIG. 4 .
- the main base 110 of FIG. 1 is seen as a top view for either the first state S 1 or the second state S 2 .
- the main base 110 of FIG. 1 can be used to replace the main base 310 of FIG. 8 or FIG. 10 .
- the main base 310 of FIG. 5A and FIG. 5B , the main base 410 of FIG. 6 , and the main base 510 of FIG. 7A and FIG. 7B can be replaced by the main base 310 of FIG. 8 and FIG. 10 for demonstrating the first state S 1 , second state S 2 , respectively.
- FIG. 11 demonstrates schematically another exemplary example of the main base of FIG. 8 .
- the main base 710 and the positioning device 120 similar to FIG. 8 and FIG. 10 , are included in FIG. 11 .
- the differences between the embodiment of FIG. 11 and that of FIG. 8 or FIG. 10 include at least that, in this embodiment, the main base 710 of the measuring equipment 700 further includes a surrounding side wall 711 protrusive around the through hole 216 on the top surface 212 of the main base 710 .
- the surrounding side wall 711 surrounds the measuring center axis A. Referring also to FIG.
- the tilting device 150 would tilt the main base 710 , the workpiece 50 , the first sensing element 162 and the second sensing element 164 to the same direction, then the fluid on the main base 710 would move in the moving direction L.
- the surrounding side wall 711 would prevent the fluid from dropping into the through hole 216 , and then to the space having the second sensing element 164 , such that possible interference or contamination can be avoided.
- FIG. 12 where a further exemplary example of the main base of measuring equipment as shown in FIG. 8 or FIG. 12 is demonstrated schematically.
- FIG. 12 only elements similar to the main base 310 and the positioning device 120 of measuring equipment as shown in FIG. 8 or FIG. 10 are schematically provided in FIG. 12 .
- the differences between this embodiment of FIG. 12 and the previous embodiment of FIG. 8 or FIG. 10 ) include at least that, in this embodiment of FIG. 8 or FIG. 10 , the through hole 316 of the measuring equipment 800 includes an upper opening 316 A close to the top surface 212 .
- the main base 810 further includes a first drainage channel 815 and a second drainage channel 813 .
- the first drainage channel 815 and the second drainage channel 813 are structured deeply into the main base 810 from the top surface 212 .
- the first drainage channel 815 is disposed to surround the upper opening 316 A of the through hole 316 , and to have the upper opening 316 A of the through hole 316 as its surrounding center.
- the first drainage channel 815 can be one or a plurality of concentric grooves surrounding the upper opening 316 A for guiding the fluid on the main base 810 from the workpiece 50 to a specific region, such that the possibility of the fluid dropping into the through hole 316 can be significantly reduced.
- the second drainage channel 813 is formed as a straight groove deep to almost penetrate the main base 810 from the top surface 212 to barely reach the bottom surface 214 (i.e., the second drainage channel 813 does not penetrate through the bottom surface 214 ).
- the second drainage channel 813 is connected with the first drainage channel 815 by cutting geometrically straight into the winding thereof, and thus the fluid guided by the first drainage channel 815 can be collected into the second drainage channel 813 before being discharged out of the main base 810 .
- each of the positioning elements can be adjusted according to the dimensions (such as the radius) of the workpiece, such that the distance from each of the positioning elements to the measuring center axis can be equal to the radius of the inscribed circle of the workpiece.
- the measuring point of the workpiece can be aligned with the measuring center axis, such that the workpiece can resume its original position after the measurement.
- this disclosure introduces a method of tilting the main base for sliding the workpiece along the main base by its own gravity to reach and contact every positioning elements, and to position the workpiece purposely with respect to the measuring center axis.
- this tilting method excessive cutting fluid and chips on the workpiece or main base can be driven to leave the main base, and so the main base can be kept away from the excessive pollutants.
- the pollutant factor on the measurement can be waived, and the entire measuring region can be kept clean.
- this disclosure further utilizes the auxiliary element to push the workpiece so as to ensure the workpiece to contact against each of the positioning elements, such that the workpiece can be purposely positioned to the measuring center axis.
- this disclosure further introduces the upstanding wall or the drainage channel to surround the through hole of the main base, such that the excessive cutting fluid and chips on the workpiece or the main base can be better guided to leave the main base.
Abstract
Description
- This application claims the benefits of Taiwan application Serial No. 109144106, filed on Dec. 14, 2020, the disclosures of which are incorporated by references herein in its entirety.
- The present disclosure relates in general to a dimension measurement apparatus applied for machining process.
- Machining process that utilizes processing machinery to change the shape or performance of the workpiece, and usually integrates a plurality of procedures to form a production line. As soon as a workpiece is fed, a first process is applied to form a characteristic. After this characteristic is formed, another process is applied to form another characteristic. As such, every process is performed upon the workpiece in order. For example, a process is firstly applied to machine a central hole and part of a wheel wall of a workpiece, and then a further process will be applied to perform processing upon the upper surface of the workpiece. Between these two processes, a measurement device would be introduced to measure dimensions at some key characteristics of the workpiece. Practically, before the second process is performed, an investigation of the workpiece upon dimensions, i.e., size and roundness of the central hole and a level height of the upper surface, should be performed.
- However, among current measurement designs, a mechanical arm is provided to carry and then places the workpiece onto a measuring platform. In this case, a problem of shaking of the suspended workpiece often occurs, and it would lead to position inaccuracy and measuring errors.
- In addition, some contaminants such as cutting fluid and chips are usually left on the surface of the workpiece after a machining process. Though the machining process is generally accompanied by steps of air blowing and cleaning, yet it cannot ensure that those contaminants on the workpiece surface could be removed completely. If the workpiece is directly placed on the measuring platform, these contaminants, such as surface chips or fluids, would make the measuring platform dirty and interfere the measurement. Thus, to improve the measurement process is one of crucial issues urgent to the skill in the art.
- In one embodiment of this disclosure, a measuring equipment, applied to carry a workpiece to be measured, includes a main base and a positioning device. The main base includes a measuring center axis. The positioning device includes at least two positioning elements. Each of the at least two positioning elements is disposed movably on the main base, and each of the at least two positioning elements is moved with respect to the measuring center axis. An identical distance is there from each of the at least two positioning elements to the measuring center axis. Each of the at least two positioning elements is used for the workpiece to contact and to be positioned to the measuring center axis.
- As stated, in the measuring equipment provided by this disclosure, based on the dimension (particularly, the radius) of the workpiece, each of the positioning elements can be adjusted to have all the distances from individual positioning elements to the measuring center axis to be equal to the radius of the inscribed circle of the workpiece. Thereupon, as the workpiece is placed against each of the positioning elements, the corresponding measuring point at the workpiece would be aligned with the measuring center axis, and so the workpiece can resume its original positioning. Further, such a measuring equipment in accordance with the present disclosure can be widely applied, with an enhanced measuring precision.
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FIG. 1 is a schematic top view of an embodiment of the dimension measurement apparatus in accordance with this disclosure; -
FIG. 2 is a schematic perspective view of another embodiment of the dimension measurement apparatus in accordance with this disclosure; -
FIG. 3 is a schematic side view ofFIG. 2 ; -
FIG. 4 is a schematic perspective view of a further embodiment of the measuring equipment in accordance with this disclosure; -
FIG. 5A demonstrates schematically an exemplary example of the main base and the positioning device ofFIG. 4 ; -
FIG. 5B is a schematic top view of the main base ofFIG. 5A ; -
FIG. 6 demonstrates schematically another exemplary example of the main base and the positioning device ofFIG. 4 ; -
FIG. 7A demonstrates schematically a further exemplary example of the main base and the positioning device ofFIG. 4 ; -
FIG. 7B is a schematic top view ofFIG. 7A ; -
FIG. 8 is a schematic perspective view of one more embodiment of the measuring equipment in accordance with this disclosure; -
FIG. 9 is a schematic top view of an exemplary example of the main base and the positioning device ofFIG. 8 ; -
FIG. 10 demonstrates schematically a tilt state ofFIG. 8 ; -
FIG. 11 demonstrates schematically another exemplary example of the main base ofFIG. 8 ; and -
FIG. 12 demonstrates schematically a further exemplary example of the main base ofFIG. 8 . - In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the disclosed embodiments. It will be apparent, however, that one or more embodiments may be practiced without these specific details. In other instances, well-known structures and devices are schematically shown in order to simplify the drawing.
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FIG. 1 is a schematic top view of an embodiment of the measuring equipment in accordance with this disclosure. Referring toFIG. 1 , in this embodiment, themeasuring equipment 100 can be applied to carry aworkpiece 50 to be tested, and used for measuring geometric dimensions of key characteristics, such as roundness and sizes of a central hole of theworkpiece 50 and a level height of an upper surface of theworkpiece 50. It shall be explained, but not limited to, that theworkpiece 50 can be a cylinder such as a wheel frame. In one embodiment not shown herein, the workpiece can be a polygonal object. - In this embodiment, the
measuring equipment 100 includes amain base 110 and apositioning device 120. Themain base 110 includes a measuring center axis A. Thepositioning device 120 includes afirst positioning element 122 and asecond positioning element 124, and both of thefirst positioning element 122 and thesecond positioning element 124 are disposed at themain base 110 and movably positioned. Thefirst positioning element 122 and thesecond positioning element 124 are located oppositely to each other with respect to the measuring center axis A, and move therealong, such that a first distance D1 between thefirst positioning element 122 and the measuring center axis A can be equal to a second distance D2 between thesecond positioning element 124 and the measuring center axis A. Thus, it can be realized that, through adjusting positioning of thefirst positioning element 122 and thesecond positioning element 124 at themain base 110, the first distance D1 and the second distance D2 can be modulated to fit the size of theworkpiece 50. - Under such an arrangement, in this embodiment, the first distance D1 and the second distance D2 from the
first positioning element 122 and thesecond positioning element 124, respectively, to the measuring center axis A can be further set according to the dimensions of theworkpiece 50. For example, provided that theworkpiece 50 has a cylindrical appearance with a radius R, then the first distance D1 and the second distance D2 can be set to an R, equal to the radius R of theworkpiece 50. In addition, a measuring point B can be set to a center of theworkpiece 50, and a distance from the measuring point B to aperipheral surface 52 of theworkpiece 50 is set to the radius R. When the workpiece is a polygon (not shown herein), the radius of the workpiece can be set to a radius of an inscribed circle of the polygon, the measuring point of the workpiece is set at the center of the inscribed circle of the workpiece, and the first distance D1 and the second distance D2 are set to be equal to the radius of the inscribed circle of the workpiece. - Then, by utilizing a mechanical arm (not shown herein), a conveying belt (not shown herein) or any human or other means, the
workpiece 50 can be located onto themain base 110, and thefirst positioning element 122 and thesecond positioning element 124 are applied to contact against theworkpiece 50, so that theworkpiece 50 can be positioned to the measuring center axis A. In this embodiment, the appearance of theworkpiece 50 can be circular, and thus, when aperipheral surface 52 of theworkpiece 50 is contacted by thefirst positioning element 122 and thesecond positioning element 124, the measuring point B of theworkpiece 50 would lie right on the measuring center axis A. This measuring point B is herein the center of the circle. On the other hand, if theworkpiece 50 has an appearance of polygon, then the first distance D1 between thefirst positioning element 122 and the measuring center axis A and the second distance D2 between the measuring center axis A and thesecond positioning element 124 are both set to be the radius of the inscribed of the polygon. Any two outer walls of the side walls of thepolygonal workpiece 50 is individually contacted by thefirst positioning element 122 and thesecond positioning element 124. Thereby, the center of theworkpiece 50 can still coincide with the measuring center axis A. As such, no matter what the appearance or size of theworkpiece 50 is, or no matter how many times of theworkpiece 50 are located or relocated onto themain base 110, as theperipheral surface 52 of theworkpiece 50 is contacted against thefirst positioning element 122 or thesecond positioning element 124, the measuring point B of theworkpiece 50 would coincide the measuring center axis A. Thus, no matter what the time is to place theworkpiece 50, the aforesaid problem in re-positioning theworkpiece 50 can be resolved. - It shall be explained, but not limited to, that this disclosure is not only to disclose the technique how the positions of the
first positioning element 122 and thesecond positioning element 124 can be adjusted on themain base 110. For example, in this embodiment, the measuringequipment 100 can connect a processor (not shown in the figure) for receiving dimensions (such as the radius) of theworkpiece 50, and/or coordinate information of thefirst positioning element 122, thesecond positioning element 124 and the measuring center axis A, for further controlling a motor (not shown herein) to adjust the positions of thefirst positioning element 122 and thesecond positioning element 124. However, the adjustment of thefirst positioning element 122 and thesecond positioning element 124 can be performed manually, and further applies a fixing and positioning means of magnetic force or hole-and-latch pairs. Further, this disclosure is not limited to the processor and the motor. - In this embodiment, the measuring
equipment 100 further includes ameasuring module 160 assembled together with themain base 110. After theworkpiece 50 is positioned by the aforesaid process, the measuringmodule 160 is used for measuring theworkpiece 50. In this embodiment, the measuring center axis A is coaxial with the measuringmodule 160. In addition, the measuringmodule 160 can be disposed above or under themain base 110. It shall be explained that the measuring center axis A can be an image center of the measuring module 160 (i.e., the measuring center axis A is coincided with the measuring module 160), a geometric center or any relevant position of themain base 110, or an element or a target point (such as the center of the throughhole 216 inFIG. 2 ) disposed on themain base 110. In one example of cutting, the cutting point of the tooling can be set to be the measuring center axis A. In another example of laser application, the optical axis of the laser can be set to be the measuring center axis A. -
FIG. 2 is a schematic perspective view of another embodiment of the measuring equipment in accordance with this disclosure, andFIG. 3 is a schematic side view of the measuring equipment inFIG. 2 . Referring toFIG. 2 andFIG. 3 , in this embodiment, themain base 210 of themeasuring equipment 200 includes oppositely atop surface 212 and abottom surface 214. The measuring center axis A penetrates through both thetop surface 212 and thebottom surface 214. Thetop surface 212 of themain base 210 is provided to place thereon theworkpiece 50. Thefirst positioning element 122 and thesecond positioning element 124 are individually protrusive over thetop surface 212 of themain base 210 from different positions thereof. It shall be explained that, in this embodiment, both thefirst positioning element 122 and thesecond positioning element 124 are round cylinders. In another embodiment, thefirst positioning element 122 and thesecond positioning element 124 can be other shapes. - In adjusting the positions of the
first positioning element 122 and thesecond positioning element 124 on themain base 210 according to the dimension of theworkpiece 50, thefirst positioning element 122 and thesecond positioning element 124 are individually to move in the first direction L1 so as to have either of thefirst positioning element 122 and thesecond positioning element 124 to be separated from the measuring center axis A by a distance equal to the radius of the inscribed circle of theworkpiece 50. Then, theworkpiece 50 is moved to position on thetop surface 212 of themain base 210. If the frontperipheral surface 52A of theworkpiece 50 has not yet contacted thefirst positioning element 122 and/or thesecond positioning element 124, then theworkpiece 50 can be pushed (such as the push from the rearperipheral surface 52B of the workpiece 50) or pulled, so as to move theworkpiece 50 toward thefirst positioning element 122 and thesecond positioning element 124 till to contact both of thefirst positioning element 122 and thesecond positioning element 124. - In addition, the measuring
module 160 can include afirst sensing element 162 and asecond sensing element 164 for performing different scales of measurement upon theworkpiece 50. By having the embodiment shown inFIG. 2 andFIG. 3 as an example, thefirst sensing element 162 and thesecond sensing element 164 are individually disposed to opposite sides of themain base 210, and theworkpiece 50 is placed on themain base 210. Thefirst sensing element 162 and thesecond sensing element 164 of themeasuring module 160 are then to measure theworkpiece 50, respectively. In this embodiment, themain base 210 further includes a throughhole 216 penetrating through themain base 210 by extending from thetop surface 212 to thebottom surface 214, and the measuring center axis A is set to be coaxial with a center of the throughhole 216. Referring toFIG. 3 , the upper side of the throughhole 216 is right facing thefirst sensing element 162, while the lower side thereof is right facing thesecond sensing element 164. After theworkpiece 50 has been placed on themain base 210, thefirst sensing element 162 can measure theworkpiece 50, and also thesecond sensing element 164 can measure theworkpiece 50 through the throughhole 216. - In some other embodiments, the measuring
module 160 can simply include thefirst sensing element 162 disposed on themain base 210. In this circumstance, themain base 210 can exclude the through hole 216 (as the embodiment shown inFIG. 1 ). Namely, themain base 110 ofFIG. 1 is used to replace themain base 210 ofFIG. 2 orFIG. 3 . In this embodiment, thepositioning device 120 can be also applied to align the measuring point B of theworkpiece 50 with the measuring center axis A, such that theworkpiece 50 can be precisely positioned for enhancing the measuring accuracy of the first sensing element. - In this disclosure, the type of the
measuring module 160 and the ways for assembling themeasuring module 160 and themain base 210 are not specifically defined. For example, thefirst sensing element 162 can be a laser displacement detector, and thesecond sensing element 164 can be an optical camera. The measuringequipment 200 further includes a measuringbase 162A and a connectingelement 170. The connectingelement 170 is used to connect themain base 210 and the measuringbase 162A. The measuringbase 162A is further connected with thefirst sensing element 162, such that the measuringmodule 160 can be fixed and movable with themain base 210. The sensing elements of themeasuring module 160 can be adjusted to different types according to the practical manufacturing processes. Since the measuring center axis A, thefirst sensing element 162 and thesecond sensing element 164 are co-axial, thus, as long as theworkpiece 50 is positioned to the measuring center axis A, the measuring accuracy upon theworkpiece 50 can be substantially enhanced. - In this embodiment, the
second sensing element 164 located under themain base 110 is an optical lens for capturing an image of theworkpiece 50 for further analysis through the throughhole 216. On the other hand, thefirst sensing element 162 located above themain base 210 is a contact-type geometric probe for detecting the surface of theworkpiece 50 so as to provide coordinate information for further calculation. For example, theworkpiece 50 can be a semi-finished wheel frame having a central hole requiring an optical investigation by the optical lens of thesecond sensing element 164 so as to realize whether or not the geometric dimensions of the workpiece 50 (such as the outer radius and the roundness can meet the tolerance requirements. Also, through the probe of thefirst sensing element 162 to realize level height information around the central hole. Thereupon, the geometric dimensions and the level height information of theworkpiece 50 can be set as initial coordinates for the following manufacturing process. Nevertheless, the measuring device for this disclosure is not specifically limited, and actually any measuring device that can serve the similar purpose can be one of the measuring elements qualified for this disclosure. -
FIG. 4 is a schematic perspective view of a further embodiment of the measuring equipment in accordance with this disclosure,FIG. 5A demonstrates schematically an exemplary example of the main base and the positioning device ofFIG. 4 , andFIG. 5B is a schematic top view of the main base ofFIG. 5A . In this embodiment ofFIG. 4 , the measuringequipment 300 is similar to themeasuring equipment 200 ofFIG. 2 andFIG. 3 , but differences between themain base 310 of this embodiment and themain base 210 ofFIG. 2 andFIG. 3 include at least that, in this embodiment, themain base 310 further includes afirst positioning slot 317 and asecond positioning slot 318, formed at themain base 310 at different locations thereof. Thefirst positioning slot 317 includes two opposite ends, a near end E11 and a far end E21; and, thesecond positioning slot 318 also includes two opposite ends, another near end E12 and another far end E22. A distance from the near end E11 of thefirst positioning slot 317 to the measuring center axis A is equal to another distance from the near end E12 of thesecond positioning slot 318 to the measuring center axis A, and this distance is defined as H1. In addition, a distance from the far end E21 of thefirst positioning slot 317 to the measuring center axis A is equal to another distance from the far end E22 of thesecond positioning slot 318 to the measuring center axis A, and this distance is defined as H2. In this embodiment, the distance H1 is less than the distance H2. - In this embodiment, the
first positioning element 122 is disposed in thefirst positioning slot 317, and able to slide along thefirst positioning slot 317 for determining a position suitable to the workpiece. Thesecond positioning element 124 is disposed in thesecond positioning slot 318, and able to slide along thesecond positioning slot 318 for determining a position suitable to the workpiece. When thefirst positioning element 122 and thesecond positioning element 124 reach the corresponding far ends E21, E22 of thefirst positioning slot 317 and thesecond positioning slot 318, respectively, the distance from either of thefirst positioning element 122 and thesecond positioning element 124 to the measuring center axis A is close to the distance H2. When thefirst positioning element 122 and thesecond positioning element 124 reach the corresponding near ends E11, E12 of thefirst positioning slot 317 and thesecond positioning slot 318, respectively, the distance from either of thefirst positioning element 122 and thesecond positioning element 124 to the measuring center axis A is close to the distance H1, which is less than the distance H2. Thus, this embodiment can be used to measure a workpiece with a smaller radius of the inscribed circle. Namely, in this embodiment, thefirst positioning element 122 and thesecond positioning element 124 can be adjusted to anchor at specific sections of thefirst positioning slot 317 and thesecond positioning slot 318 to support the measuring upon the workpiece having the radius of the inscribed circle radius to be greater than or equal to the distance H1, but smaller than the distance H2. In addition, as shown inFIG. 5B , thefirst positioning slot 317 and thesecond positioning slot 318 have the same length H, and this length H can be adjusted according to the practical dimensions of the workpiece. - The
first positioning element 122 and thesecond positioning element 124 can be synchronously driven by an actuator (such as a motor, not shown in the figure) moving inside thefirst positioning slot 317 or thesecond positioning slot 318. Thus, while thefirst positioning element 122 and thesecond positioning element 124 moves, the distance from either of these twopositioning elements - In another embodiment shown in
FIG. 6 , thepositioning device 420 of themain base 410 can further includes a connectingbar 423 connecting thefirst positioning element 122 to thesecond positioning element 124. With this connectingbar 423, thefirst positioning element 122 and thesecond positioning element 124 can displace synchronously. In some other embodiments, thefirst positioning element 122 and thesecond positioning element 124 can move individually, but meet the criterion that the distance from either of thefirst positioning element 122 and thesecond positioning element 124 to the measuring center axis A should be equal to the radius of the inscribed circle of the workpiece, finally. - In addition, as shown in
FIG. 4 ,FIG. 5A ,FIG. 5B orFIG. 6 , thefirst positioning slot 317 and thesecond positioning slot 318 are extended in a parallel manner, from the near end E11 to the far end E21 for thefirst positioning slot 317, and from the near end E12 to the far end E22 for thesecond positioning slot 318. Namely, in thefirst positioning slot 317 and thesecond positioning slot 318, a distance H3 between the two near ends E11, E12 is, but not limited to, equal to another distance H4 between the two far ends E21, E22. However, thefirst positioning slot 317 and thesecond positioning slot 318 can also extend in a non-parallel manner. For example, as shown inFIG. 7A andFIG. 7B , thefirst positioning slot 517 of themain base 510 and thesecond positioning slot 518 thereof are extended toward the throughhole 216 in a non-parallel manner. In thisfirst positioning slot 317 and thissecond positioning slot 318, a distance H5 between the two near ends E13, E14 is less than another distance H6 between the two far ends E23, E24. Similar to the aforesaidFIG. 5B , in thefirst positioning slot 517 and thesecond positioning slot 518, a distance from the near end E13 to the measuring center axis A is equal to another distance from another near end E14 to the measuring center axis A, and a distance from the far end E23 to the measuring center axis A is equal to another distance from another far end E24 to the measuring center axis A. Thefirst positioning element 122 and thesecond positioning element 124 are displaced inside and along thefirst positioning slot 517 and thesecond positioning slot 518, respectively. Though thefirst positioning element 122 and thesecond positioning element 124 don't move in a parallel manner, yet thefirst positioning element 122 and thesecond positioning element 124 can still move to keep the same distancing to the measuring center axis A. In addition, in an embodiment not shown herein, thefirst positioning element 122 and thesecond positioning element 124 can be moved manually, and fixed by magnetic forcing or hole-and-latch pairs. As such, the distance from either of these twopositioning elements -
FIG. 8 is a schematic perspective view of one more embodiment of the measuring equipment in accordance with this disclosure, andFIG. 9 is a schematic top view of an exemplary example of the main base and the positioning device ofFIG. 8 . Referring toFIG. 8 andFIG. 9 , by comparing to themain base 110 ofFIG. 1 , themain base 210 ofFIG. 2 andFIG. 3 , themain base 310 ofFIG. 4 ,FIG. 5A andFIG. 5B , themain base 410 ofFIG. 6 , and themain base 510 ofFIG. 7A andFIG. 7B , all of whom are furnished with thefirst positioning element 122 and thesecond positioning element 124 to position theworkpiece 50, in this embodiment, the measuringequipment 600 further includes anauxiliary device 640 having a firstauxiliary element 642 and a secondauxiliary element 644. As shown inFIG. 8 , the firstauxiliary element 642 and the secondauxiliary element 644 can be movably or rationally disposed on thetop surface 212 of themain base 310, the auxiliary device 640 (such as the firstauxiliary element 642 and the second auxiliary element 644) and the positioning device 120 (such as thefirst positioning element 122 and the second positioning element 124) are disposed to opposite sides of the measuring center axis A on themain base 310, or to opposite sides of the throughhole 316 of themain base 310. In this embodiment, themain base 310 includes oppositely a first end F1 and a second end F2, the firstauxiliary element 642 and the secondauxiliary element 644 are disposed close to the second end F2 of themain base 310, and thefirst positioning element 122 and thesecond positioning element 124 are disposed close to the first end F1 of themain base 310. - Under such an arrangement, according to the radius R of the
workpiece 50, when thefirst positioning element 122 and thesecond positioning element 124 have been adjusted on themain base 310 by displacing individually thefirst positioning element 122 and thesecond positioning element 124 along the first direction L1, and the first distance D1 from thefirst positioning element 122 to the measuring center axis A is equal to the second distance D2 from thesecond positioning element 124 to the measuring center axis A. It shall be explained that this first direction L1 can be identical to the first direction L1 shown inFIG. 1 toFIG. 6 , orFIG. 8 toFIG. 9 . Thefirst positioning element 122 and thesecond positioning element 124 are moved in a parallel manner; i.e., along the same moving direction. However, in some other embodiments, as shown inFIG. 7A andFIG. 7B , thefirst positioning element 122 and thesecond positioning element 124 can be moved in a non-parallel manner; i.e., moved along different moving directions. Even that thefirst positioning element 122 and thesecond positioning element 124 do not move in the same direction, both thefirst positioning element 122 and thesecond positioning element 124 can be still moved individually toward the measuring center axis A. - Then, by utilizing a mechanical arm (not shown herein), a conveying belt (not shown herein) or any human or other means, the
workpiece 50 can be located onto themain base 310, and thefirst positioning element 122 and thesecond positioning element 124 are directly applied to contact against theperipheral surface 52 of theworkpiece 50. In some other embodiments, as shown inFIG. 9 , when theworkpiece 50 is placed on thetop surface 212 of themain base 310, if theperipheral surface 52 of theworkpiece 50 is yet to contact against thefirst positioning element 122 and thesecond positioning element 124, then the firstauxiliary element 642 and the secondauxiliary element 644 of this embodiment can be driven by an actuator (such as a motor, but not shown herein) to displace or rotate in the second direction L2 so as to contact theworkpiece 50; i.e., to have theworkpiece 50 to approach thefirst positioning element 122 and thesecond positioning element 124 till the workpiece 50 contacts both thefirst positioning element 122 and thesecond positioning element 124. Thus, in this disclosure, the firstauxiliary element 642 and the secondauxiliary element 644 can push theworkpiece 50 so as to have theperipheral surface 52 to contact against thefirst positioning element 122 and thesecond positioning element 124, such that theworkpiece 50 can be positioned to the measuring center axis A. It shall be explained that, in this embodiment, the second direction L2 is a direction toward thefirst positioning element 122 and thesecond positioning element 124, and the firstauxiliary element 642 and the secondauxiliary element 644 are moved in the same moving direction. Yet, in some other embodiments in accordance with this disclosure, the firstauxiliary element 642 and the secondauxiliary element 644 can be designed to approach the measuring center axis A in an individual manner. Namely, the firstauxiliary element 642 moves toward the measuring center axis A in the third direction L31, but the secondauxiliary element 644 moves toward the measuring center axis A in the fourth direction L32. Though the firstauxiliary element 642 and the secondauxiliary element 644 follow different moving directions, yet theworkpiece 50 can be still contacted finally. In the aforesaid descriptions, the aforesaid firstauxiliary element 642 and the aforesaid secondauxiliary element 644 are moved individually in the third direction L31 and the fourth direction L32, respectively, to approach the same measuring center axis A. Similarly, the firstauxiliary element 642 and the secondauxiliary element 644 can follow the corresponding third and fourth directions L31, L32 to move away from the measuring center axis A, such that the firstauxiliary element 642 and the secondauxiliary element 644 can move closer to the corner positions P1, P2 at the second end F2 of themain base 310, respectively. At this time, the distance between the firstauxiliary element 642 and the secondauxiliary element 644 would become larger and easier for anotherworkpiece 50 to be placed on themain base 310 from the second end F2 thereof. - Except for utilizing the aforesaid
auxiliary device 640 to push and position theworkpiece 50, in one embodiment, thetop surface 212 of themain base 310 can be provided to be a plane with a low friction coefficient, such that the friction between the workpiece 50 and thetop surface 212 can be substantially reduced. Namely, this surface finish of thetop surface 212 plays a role of auxiliary sliding structure for easing the movement of theworkpiece 50 on themain base 310. Practically, a plane with a lower friction coefficient can be achieved by adding a lubricant, a slip tape or the like film structure, or by introducing slipping balls, air-float nozzles or the like structure. - In one embodiment, the measuring
equipment 600 further includes asupport device 130 for supporting themain base 310. Thesupport device 130 includes a plurality offoot plates 132 and a plurality ofsupport legs 134. Each of thesupport legs 134 is connected between themain base 310 and thecorresponding foot plate 132, so as to stand themain base 310 over the ground, and also to provide functions related to earthquake safety and level adjustment. Similarly, in this disclosure, the support device 130 (shown inFIG. 2 toFIG. 4 ) can be provided to themeasuring equipment FIG. 1 toFIG. 4 . In this embodiment, thesupport legs 134 and thefoot plates 132 shown in the drawings are simply one of many exemplary examples for a demonstrative purpose, not for limiting the scope of this disclosure. -
FIG. 10 demonstrates schematically measuring equipment in a tilt state. Referring toFIG. 8 andFIG. 10 , the measuringequipment 600 can further includes atilting device 150 connected with themain base 310 and used for moving themain base 310 to switch around between a first state S1 and a second state S2. As shown inFIG. 10 , while themain base 310 is in the first state S1, the level height of the first end F1 of themain base 310 is lower than that of the second end F2 thereof. While themain base 310 is in the second state S2, the level height of the first end F1 of themain base 310 is not lower than that of the second end F2 thereof (namely, as shown inFIG. 8 , the level height of the first end F1 of themain base 310 is equal to that of the second end F2 thereof, such that themain base 310 is in a horizontal state), or the level height of the first end F1 of themain base 310 is higher than that of the second end F2 thereof. In detail, since thetilting device 150 is located close to the second end F2 of themain base 310, as thetilting device 150 pushes thebottom surface 214 of themain base 310 in a pushing direction L4 to tilt themain base 310, then the level height of the first end F1 of themain base 310 would be lower than that of the second end F2 thereof. Besides, for themeasuring module 160 is fixed to themain base 310, thus, while themain base 310 is tilted, the measuringmodule 160 would be tilted as well, such that the related position of the measuring center axis A with respect to themain base 310 would keep the same, and so the parameters for thefirst sensing element 162 and thesecond sensing element 164 of themeasuring module 160 do not need to be re-calibrated. - It shall be explained that, for example, the
tilting device 150 can include ahydraulic rod 152 disposed between themain base 310 and thesupport leg 134 connecting thefoot plate 132. Thehydraulic rod 152 can be driven by an actuator (not shown in the figure) to perform extending and retrieving for varying the tilt angle of themain base 310; i.e., to switch around the first state S1 and the second state S2. Similarly, this disclosure does not place any limitation for the type of thetilting device 150, and actually any mechanism that can push and tilt themain base 310 is a qualified candidate for thetilting device 150 of this disclosure. - Under such an arrangement, as shown in
FIG. 10 , after the positions of thefirst positioning element 122 and thesecond positioning element 124 on themain base 310 have been adjusted according to the dimensions of theworkpiece 50, then the distance from either of thefirst positioning element 122 and thesecond positioning element 124 to the measuring center axis A would be equal to the radius of the inscribed circle of theworkpiece 50. At this time, theworkpiece 50 is moved to be positioned on thetop surface 212 of themain base 210. If the frontperipheral surface 52A of theworkpiece 50 has not yet contacted thefirst positioning element 122 and/or thesecond positioning element 124, then the firstauxiliary element 642 and the secondauxiliary element 644 can be applied to push theworkpiece 50, so as to have the frontperipheral surface 52A of theworkpiece 50 to contact both of thefirst positioning element 122 and thesecond positioning element 124. In some other embodiments, this disclosure can further tilt themain base 310 to make theworkpiece 50 move in the moving direction L and further contact thefirst positioning element 122 and thesecond positioning element 124. As such, theworkpiece 50 can be also positioned to the measuring center axis A. It shall be explained that the moving direction L herein is directed to the direction from the second end F2 of themain base 310 to the first end F1 thereof. - Besides, the
hydraulic rod 152 of thetilting device 150 can protrude upward so as to tilt themain base 310, thus thefirst sensing element 162 and thesecond sensing element 164 of themeasuring module 160, and also theworkpiece 50 are tilted to the left side ofFIG. 10 , and so the level height of the first end F1 of themain base 310 would be lower than that of the second end F2 thereof. At this time, cutting fluid and chips on theworkpiece 50 would slip down by gravity along the tiltedmain base 310 and finally leave themain base 310. Thereupon, no excessive pollutants can leave on themain base 310 to affect the measurement, and the entire measuring area can be kept clean. In addition, even in the tilt state, since the relative position relationship between the workpiece 50 and themeasuring module 160 including thefirst sensing element 162 and thesecond sensing element 164 is not changed, the measurement process can keep running. Further, thesecond sensing element 164 under themain base 310 can still perform measuring upon theworkpiece 50 through the throughhole 316 of themain base 310, since thesecond sensing element 164 as well as themain base 310 can be synchronously tilted by the same slope (such as 20 degrees). Thus, by relevantly arranging the distance between thesensing element 164 and themain base 310 or thebottom surface 214, and the angle formed by themain base 310 and the ground, excessive cutting fluid and chips can be dropped vertically down through the throughhole 316 without hitting thesecond sensing element 164. - It shall be explained that, in this embodiment, the length of the
support leg 134 at the first end F1 of themain base 310 can be less than that of anothersupport leg 134 at the second end F2 thereof, such that the level height of the first end F1 is lower than that of the second end F2. While in the tilt state, since the measuring center axis A and thefirst sensing element 162 and thesecond sensing element 164 are aligned in an early stage, thus the measuring can still work in the tilt state. In addition, in anther embodiment of this disclosure, while themain base 310 is in the tilt state, theworkpiece 50 can slide along themain base 310 by its own gravity to reach both thefirst positioning element 122 and thesecond positioning element 124. - In addition, the first state S1 and the second state S2 of the
main base 310 are elucidated, but not limited to, byFIG. 10 andFIG. 8 , respectively. For example, the second state S2 is shown to themain base 210 ofFIG. 2 andFIG. 3 , and to themain base 310 ofFIG. 4 . Or, in another embodiment, themain base 110 ofFIG. 1 is seen as a top view for either the first state S1 or the second state S2. Or, themain base 110 ofFIG. 1 can be used to replace themain base 310 ofFIG. 8 orFIG. 10 . Similarly, themain base 310 ofFIG. 5A andFIG. 5B , themain base 410 ofFIG. 6 , and themain base 510 ofFIG. 7A andFIG. 7B can be replaced by themain base 310 ofFIG. 8 andFIG. 10 for demonstrating the first state S1, second state S2, respectively. -
FIG. 11 demonstrates schematically another exemplary example of the main base ofFIG. 8 . Referring toFIG. 11 , in order to explain concisely, only themain base 710 and thepositioning device 120, similar toFIG. 8 andFIG. 10 , are included inFIG. 11 . The differences between the embodiment ofFIG. 11 and that ofFIG. 8 orFIG. 10 include at least that, in this embodiment, themain base 710 of themeasuring equipment 700 further includes asurrounding side wall 711 protrusive around the throughhole 216 on thetop surface 212 of themain base 710. In addition, the surroundingside wall 711 surrounds the measuring center axis A. Referring also toFIG. 10 , after theworkpiece 50 is placed on themain base 710, thetilting device 150 would tilt themain base 710, theworkpiece 50, thefirst sensing element 162 and thesecond sensing element 164 to the same direction, then the fluid on themain base 710 would move in the moving direction L. At this time, the surroundingside wall 711 would prevent the fluid from dropping into the throughhole 216, and then to the space having thesecond sensing element 164, such that possible interference or contamination can be avoided. - Except for adopting the surrounding
side wall 711 to avoid the fluid pollutants to contaminate the space where themeasuring module 160 locates, please refer toFIG. 12 , where a further exemplary example of the main base of measuring equipment as shown inFIG. 8 orFIG. 12 is demonstrated schematically. In order to explain concisely, only elements similar to themain base 310 and thepositioning device 120 of measuring equipment as shown inFIG. 8 orFIG. 10 are schematically provided inFIG. 12 . The differences between this embodiment ofFIG. 12 and the previous embodiment ofFIG. 8 orFIG. 10 ) include at least that, in this embodiment ofFIG. 8 orFIG. 10 , the throughhole 316 of themeasuring equipment 800 includes anupper opening 316A close to thetop surface 212. Themain base 810 further includes afirst drainage channel 815 and asecond drainage channel 813. Thefirst drainage channel 815 and thesecond drainage channel 813 are structured deeply into themain base 810 from thetop surface 212. Thefirst drainage channel 815 is disposed to surround theupper opening 316A of the throughhole 316, and to have theupper opening 316A of the throughhole 316 as its surrounding center. In this embodiment, thefirst drainage channel 815 can be one or a plurality of concentric grooves surrounding theupper opening 316A for guiding the fluid on themain base 810 from theworkpiece 50 to a specific region, such that the possibility of the fluid dropping into the throughhole 316 can be significantly reduced. In addition, thesecond drainage channel 813 is formed as a straight groove deep to almost penetrate themain base 810 from thetop surface 212 to barely reach the bottom surface 214 (i.e., thesecond drainage channel 813 does not penetrate through the bottom surface 214). Thesecond drainage channel 813 is connected with thefirst drainage channel 815 by cutting geometrically straight into the winding thereof, and thus the fluid guided by thefirst drainage channel 815 can be collected into thesecond drainage channel 813 before being discharged out of themain base 810. - In summary, in the measuring equipment provided by this disclosure, each of the positioning elements can be adjusted according to the dimensions (such as the radius) of the workpiece, such that the distance from each of the positioning elements to the measuring center axis can be equal to the radius of the inscribed circle of the workpiece. Thereupon, when the workpiece is contacted against all the positioning elements, the measuring point of the workpiece can be aligned with the measuring center axis, such that the workpiece can resume its original position after the measurement. Thus, the measuring equipment according to this disclosure can be widely applied with enhanced measuring accuracy.
- Further, this disclosure introduces a method of tilting the main base for sliding the workpiece along the main base by its own gravity to reach and contact every positioning elements, and to position the workpiece purposely with respect to the measuring center axis. In addition, with this tilting method, excessive cutting fluid and chips on the workpiece or main base can be driven to leave the main base, and so the main base can be kept away from the excessive pollutants. Hence, the pollutant factor on the measurement can be waived, and the entire measuring region can be kept clean. With the adverse effect upon the measuring of the measuring module being reduced to a minimum, and with the relative position relationship between the measuring module and workpiece being kept even under a tilt of the main base, the measuring accuracy of the measuring equipment of this disclosure can be thus substantially enhanced.
- In addition, this disclosure further utilizes the auxiliary element to push the workpiece so as to ensure the workpiece to contact against each of the positioning elements, such that the workpiece can be purposely positioned to the measuring center axis.
- Further, this disclosure further introduces the upstanding wall or the drainage channel to surround the through hole of the main base, such that the excessive cutting fluid and chips on the workpiece or the main base can be better guided to leave the main base.
- With respect to the above description then, it is to be realized that the optimum dimensional relationships for the parts of the disclosure, to include variations in size, materials, shape, form, function and manner of operation, assembly and use, are deemed readily apparent and obvious to one skilled in the art, and all equivalent relationships to those illustrated in the drawings and described in the specification are intended to be encompassed by the present disclosure.
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TWI806294B (en) | 2021-12-17 | 2023-06-21 | 財團法人工業技術研究院 | 3d measuring equipment and 3d measuring method |
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CN114623742A (en) | 2022-06-14 |
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