US20120305942A1 - Epitaxial substrate, light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode - Google Patents
Epitaxial substrate, light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode Download PDFInfo
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- US20120305942A1 US20120305942A1 US13/406,023 US201213406023A US2012305942A1 US 20120305942 A1 US20120305942 A1 US 20120305942A1 US 201213406023 A US201213406023 A US 201213406023A US 2012305942 A1 US2012305942 A1 US 2012305942A1
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- 239000000758 substrate Substances 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 33
- 239000000463 material Substances 0.000 claims abstract description 33
- 239000004065 semiconductor Substances 0.000 claims description 23
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 12
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 claims description 8
- 238000001312 dry etching Methods 0.000 claims description 6
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 6
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 6
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 6
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 5
- 230000009477 glass transition Effects 0.000 claims description 5
- 229910001635 magnesium fluoride Inorganic materials 0.000 claims description 5
- 238000000605 extraction Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 238000004088 simulation Methods 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 230000002708 enhancing effect Effects 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- XPDWGBQVDMORPB-UHFFFAOYSA-N Fluoroform Chemical compound FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
- H01L33/007—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/58—Optical field-shaping elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/12—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a stress relaxation structure, e.g. buffer layer
Definitions
- This invention relates to an epitaxial substrate, a light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode, more particularly to an epitaxial substrate having light-transmissive members, a light-emitting diode having the epitaxial substrate, and methods for making the epitaxial substrate and the light-emitting diode.
- a conventional light-emitting diode includes an epitaxial substrate 11 , a light-emitting unit 12 , and an electrode unit 13 .
- the epitaxial substrate 11 has a rough structure 111 formed thereon.
- the light-emitting unit 12 includes a first-type semiconductor layer 121 formed on the rough structure 111 of the epitaxial substrate 11 , a light-emitting layer 122 formed on a portion of the first-type semiconductor layer 121 , and a second-type semiconductor layer 123 formed on the light-emitting layer 122 .
- the electrode unit 13 includes a first electrode 131 electrically connected to the first-type semiconductor layer 121 , and a second electrode 132 electrically connected to the second-type semiconductor layer 123 .
- the light-emitting unit 12 will emit light by virtue of the photovoltaic effect.
- the light from the light-emitting layer 122 travels to the rough structure 111 of the epitaxial substrate 11 , it may be reflected or refracted so as to vary the travelling direction of the light to emit the light outwardly, thereby enhancing the light extraction efficiency of the LED.
- the epitaxial substrate 11 and the rough structure 111 are made of the same material, and the rough structure 111 is usually made by roughening or patterning an upper surface of the epitaxial substrate 11 using an etching process.
- the epitaxial substrate 11 for the LED is commonly made of silicon, silicon carbide, aluminum oxide, etc., and is difficult to be etched. Accordingly, the etching process is time-consuming. Beside, the rough structure 111 may have poor dimensional accuracy, thereby resulting in uneven luminance of the LED.
- an object of the present invention is to provide an epitaxial substrate, a light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode, which can overcome the aforesaid drawbacks associated with the prior art.
- an epitaxial substrate comprises:
- a plurality of spaced apart light-transmissive members each of which is formed on and tapers from an upper surface of the base member, and each of which is made of a light-transmissive material having a refractive index lower than that of the base member.
- a method for making an epitaxial substrate comprises:
- a light-emitting diode comprises:
- an epitaxial substrate including a base member, and a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of the base member, and each of which is made of a light-transmissive material having a refractive index lower than that of the base member;
- a light-emitting unit formed on the epitaxial substrate to cover the light-transmissive members.
- a method for making a light-emitting diode comprises:
- FIG. 1 is a schematic diagram of a conventional light-emitting diode
- FIG. 2 is a schematic diagram of the preferred embodiment of a light-emitting diode according to this invention.
- FIG. 3 is a fragmentary enlarged diagram of the preferred embodiment of an epitaxial substrate according to this invention.
- FIG. 4 illustrates relations between a light extraction efficiency ratio and a height of a rough structure of the light-emitting diodes shown in FIGS. 1 and 2 ;
- FIG. 5 is a fragmentary enlarged diagram of another preferred embodiment of a light-emitting diode according to this invention.
- FIG. 6 is a flow chart showing the preferred embodiment of a method for making the light-emitting diode according to this invention.
- FIG. 7 is a flow diagram illustrating consecutive steps of the method shown in FIG. 6 .
- the preferred embodiment of a light-emitting diode (LED) according to this invention includes an epitaxial substrate 2 and a light-emitting unit 3 .
- the epitaxial substrate 2 includes a base member 21 and a plurality of spaced apart light-transmissive members 22 that serve as a rough structure of the epitaxial substrate 2 .
- the base member 21 has an upper surface 211 , and is made from a material selected from the group consisting of silicon, aluminum oxide, silicon carbide, and aluminum nitride.
- Each of the light-transmissive members 22 is formed on and tapers from the upper surface 211 of the base member 21 , and is made of a light-transmissive material having a refractive index lower than that of the base member 21 .
- the light-transmissive material is selected from the group consisting of silicon oxide (SiO x ), silicon oxynitride (SiON x ), and magnesium fluoride (MgF 2 ).
- silicon oxide and the magnesium fluoride are preferable.
- each of the light-transmissive members 22 is in a cone-shape, and has a bottom face 221 and a height (H) from the bottom face 221 .
- the bottom face 221 contacts the upper surface 211 of the base member and has a maximum width (W).
- W maximum width
- the traveling direction of the light can be easily changed.
- the ratio of the height (H) to the maximum width (W) is preferably not less than 0.25.
- the incident angle of the light means an angle between a light incident on a surface of the light-transmissive member 22 and a tangent line of the surface at the point of light incidence.
- the light-emitting unit 3 includes a first-type semiconductor layer 31 that is connected to the base member 21 and the light-transmissive members 22 , a light-emitting layer 32 that is formed on a portion of the first-type semiconductor layer 31 , a second-type semiconductor layer 33 that is formed on the light-emitting layer 32 and that has an electrical property opposite to that of the first-type semiconductor layer 31 , a first electrode 34 that is formed on the first-type semiconductor layer 31 , and a second electrode 35 that is formed on the second-type semiconductor layer 33 .
- the light-emitting layer 32 When electricity is applied to the light-emitting layer 32 through the first and second electrodes 34 , 35 , the light-emitting layer 32 emits light by virtue of the photovoltaic effect. After the light from the light-emitting layer 32 travels to the base member 21 and the light-transmissive members 22 , it may be reflected or refracted so as to vary the travelling direction of the light and to emit the light outwardly, thereby enhancing the light extraction efficiency of the LED of this invention. Since the materials for forming the light-emitting unit 3 are well-known in the art, detailed descriptions thereof are omitted herein for the sake of brevity.
- the base member 21 is made of sapphire
- the rough structure i.e., the light-transmissive members 22
- the maximum width (W) of the bottom face 221 in each of the light-transmissive members 22 is controlled at 4 ⁇ m
- the current applied to the LED is controlled at 20 mA.
- the epitaxial substrate 11 is made of sapphire (i.e., the rough structure 111 is also made of sapphire), and the current applied to the LED is controlled at 20 mA.
- a light extraction efficiency means a ratio of the amount of light emitted by the LED to the amount of light generated by the LED
- a light extraction efficiency ratio means a ratio of the light extraction efficiency of the LED having the rough structure to the light extraction efficiency of the LED without the rough structure.
- the light extraction efficiency ratio of the LED according to this invention is greater than that of the conventional LED by about 20%.
- the height of the rough structure i.e., the H/W ratio of the rough structure
- a desired light extraction efficiency can be obtained.
- the refractive index and H/W ratio of the light-transmissive member the light from the light-emitting layer 32 toward the base member 21 may travel to and be efficiently refracted twice and reflected by the light-transmissive members 22 to emit outwardly.
- the light extraction efficiency of the LED of this invention can be effectively improved.
- each of the light-transmissive members 22 has a relatively large curvature.
- a light incident at different points on the light-transmissive members 22 may have different incident angles, and may be reflected to travel in different directions, thereby further enhancing the light extraction efficiency (ratio) of the LED compared to the conventional LED.
- the ratio of the height (H) to the maximum width (W) preferably ranges between 0.25 and 1.0, more preferably between 0.6 and 1.0.
- the light-transmissive members 22 are spaced apart from one another by a distance not greater than 1 ⁇ m.
- the first-type semiconductor layer 31 of the light-emitting unit 3 and the light-transmissive members 22 cooperatively define at least one cavity 23 therebetween (see FIG. 5 ). With the cavity 23 , a relatively large refractive index difference is formed between the cavity 23 and the first-type semiconductor layer 31 , and thus, the light traveling toward the base member 21 may be easily reflected to emit outwardly.
- the preferred embodiment of a method for forming the light emitting diode according to this invention comprises the following steps.
- a light-transmissive layer 200 is formed over a base member 21 using a chemical vapor deposition process
- a mask Layer 300 is formed over the light-transmissive layer 200
- the mask layer 300 is patterned by a lithography process using a patterned photomask 100 to obtain a patterned mask 301 that partially exposes the light-transmissive layer 200 . Since the chemical vapor deposition process and the lithography process are well-known in the art, detailed descriptions thereof are omitted herein for the sake of brevity.
- the mask layer 300 can be made of positive-type or negative-type photoresist material.
- the mask layer 300 is made of the positive-type photoresist material.
- the light-transmissive layer 200 is made of a light-transmissive material having a refractive index lower than that of the base member 21 , such as silicon oxide (SiO x ), silicon oxynitride (SiON x ), and magnesium fluoride (MgF 2 ).
- the light-transmissive material preferably has a heat resistivity of not less than 1000° C.
- the refractive index and the light transmittance of the light-transmissive material would not be significantly changed at a temperature of not less than 1000° C.
- the light-transmissive material will not be processed at a temperature greater than 1200° C.
- the light-transmissive material preferably has the refractive index lower than both of the base member 21 and the first-type semiconductor layer 31 , and thus, is preferably made of silicon oxide (SiO x ) or magnesium fluoride (MgF 2 ).
- the patterned mask 301 is heat-treated at a temperature not higher than a glass transition temperature (Tg) of the patterned mask 301 , and is preferably heat-treated at a temperature of about 5° C. to 10° C. lower than the Tg of the patterned mask 301 for about 60 minutes. At such temperature, molecular chain movement inside the patterned mask 301 occurs so that the patterned mask 301 is deformed to have a plurality of arch-shaped structures each of which is in a state of its lowest surface energy.
- Tg glass transition temperature
- step 43 a dry-etching treatment is performed to anisotropically etch the light-transmissive layer 200 and the patterned mask 301 that is heat-treated, so that the light-transmissive layer 200 is formed into a plurality of spaced apart light-transmissive members 22 . Thereafter, the patterned mask 301 is fully removed from the light-transmissive members 22 , thereby obtaining an epitaxial substrate 2 that has the base member 21 and the light-transmissive members 22 .
- the radio frequency power ranges from about 200 W to 400 W
- the etching gas may be fluorine-containing gas, such as CF 4 , SF 6 , CHF 3 , etc.
- an etching ratio of the light-transmissive layer 200 to the pattered mask 301 preferably ranges from 1:0.5 to 1:1.5.
- step 44 a light-emitting unit 3 is formed over the light-transmissive members 22 .
- a metal organic chemical vapor deposition (MOCVD) process is conducted, and includes the following substeps: (1) forming a first-type semiconductor layer 31 over the base member 21 and the light-transmissive members 22 , (2) forming a light-emitting layer 32 on a portion of the first-type semiconductor layer 3 , (3) forming a second-type semiconductor layer 33 over the light-emitting layer 32 , and (4) forming first and second electrodes 34 , 35 respectively on the first-type semi conductor layer 31 that is exposed and the second-type semiconductor layer 33 .
- the material selection and the MOCVD process are well-known in the art, and detailed descriptions thereof are omitted herein for the sake of brevity.
- At least one cavity 23 may be formed between the first-type semiconductor layer 31 and the light-transmissive members 22 if the epitaxial parameters, such as background gas composition, pressure, temperature, etc., are well-controlled.
- the etching problem for the epitaxial substrate can be eliminated, and thus, the processing time for making the LED of this invention can be reduced.
- the method of this invention is relatively simple, and the uniformity and the dimensional accuracy of the light-transmissive members 22 can be easily controlled. As such, the LED made by the method of this invention can emit light evenly.
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Abstract
An epitaxial substrate includes: a base member; and a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of the base member, and each of which is made of a light-transmissive material having a refractive index lower than that of the base member. A light-emitting diode having the epitaxial substrate, and methods for making the epitaxial substrate and the light-emitting diode are also disclosed.
Description
- This application claims priority of Taiwanese application no. 100119057, filed on May 31, 2011.
- 1. Field of the Invention
- This invention relates to an epitaxial substrate, a light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode, more particularly to an epitaxial substrate having light-transmissive members, a light-emitting diode having the epitaxial substrate, and methods for making the epitaxial substrate and the light-emitting diode.
- 2. Description of the Related Art
- Referring to
FIG. 1 , a conventional light-emitting diode (LED) includes anepitaxial substrate 11, a light-emitting unit 12, and anelectrode unit 13. Theepitaxial substrate 11 has arough structure 111 formed thereon. The light-emittingunit 12 includes a first-type semiconductor layer 121 formed on therough structure 111 of theepitaxial substrate 11, a light-emittinglayer 122 formed on a portion of the first-type semiconductor layer 121, and a second-type semiconductor layer 123 formed on the light-emitting layer 122. Theelectrode unit 13 includes afirst electrode 131 electrically connected to the first-type semiconductor layer 121, and asecond electrode 132 electrically connected to the second-type semiconductor layer 123. When electricity is supplied to the light-emittingunit 12 through the first andsecond electrodes unit 12 will emit light by virtue of the photovoltaic effect. After the light from the light-emittinglayer 122 travels to therough structure 111 of theepitaxial substrate 11, it may be reflected or refracted so as to vary the travelling direction of the light to emit the light outwardly, thereby enhancing the light extraction efficiency of the LED. - In the conventional LED, the
epitaxial substrate 11 and therough structure 111 are made of the same material, and therough structure 111 is usually made by roughening or patterning an upper surface of theepitaxial substrate 11 using an etching process. However, theepitaxial substrate 11 for the LED is commonly made of silicon, silicon carbide, aluminum oxide, etc., and is difficult to be etched. Accordingly, the etching process is time-consuming. Beside, therough structure 111 may have poor dimensional accuracy, thereby resulting in uneven luminance of the LED. - Therefore, an object of the present invention is to provide an epitaxial substrate, a light-emitting diode, and methods for making the epitaxial substrate and the light-emitting diode, which can overcome the aforesaid drawbacks associated with the prior art.
- According to a first aspect of this invention, an epitaxial substrate comprises:
- a base member; and
- a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of the base member, and each of which is made of a light-transmissive material having a refractive index lower than that of the base member.
- According to a second aspect of this invention, a method for making an epitaxial substrate comprises:
- (a) forming over a base member a light-transmissive layer that is made of a light-transmissive material having a refractive index lower than that of the base member;
- (b) forming a patterned mask over the light-transmissive layer;
- (c) heat-treating the patterned mask at a temperature not higher than a glass transition temperature of the patterned mask;
- (d) performing a dry-etching treatment on the light-transmissive layer and the patterned mask that is heat-treated, so that the light-transmissive layer is formed into a plurality of spaced apart light-transmissive members; and
- (e) removing the patterned mask from the light-transmissive members.
- According to a third aspect of this invention, a light-emitting diode comprises:
- an epitaxial substrate including a base member, and a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of the base member, and each of which is made of a light-transmissive material having a refractive index lower than that of the base member; and
- a light-emitting unit formed on the epitaxial substrate to cover the light-transmissive members.
- According to a fourth aspect of this invention, a method for making a light-emitting diode comprises:
- (a) forming over a base member a light-transmissive layer that is made of a light-transmissive material having a refractive index lower than that of the base member;
- (b) forming a patterned mask over the light-transmissive Layer;
- (c) heat-treating the patterned mask at a temperature not higher than a glass transition temperature of the patterned mask;
- (d) performing a dry-etching treatment on the light-transmissive layer and the patterned mask that is heat-treated, so that the light-transmissive layer is formed into a plurality of spaced apart light-transmissive members, followed by removing the patterned mask from the light-transmissive members; and
- (e) forming a light-emitting unit over the light-transmissive members.
- Other features and advantages of the pre sent invention will become apparent in the following detailed description of the preferred embodiments of the invention, with reference to the accompanying drawings, in which:
-
FIG. 1 is a schematic diagram of a conventional light-emitting diode; -
FIG. 2 is a schematic diagram of the preferred embodiment of a light-emitting diode according to this invention; -
FIG. 3 is a fragmentary enlarged diagram of the preferred embodiment of an epitaxial substrate according to this invention; -
FIG. 4 illustrates relations between a light extraction efficiency ratio and a height of a rough structure of the light-emitting diodes shown inFIGS. 1 and 2 ; -
FIG. 5 is a fragmentary enlarged diagram of another preferred embodiment of a light-emitting diode according to this invention; -
FIG. 6 is a flow chart showing the preferred embodiment of a method for making the light-emitting diode according to this invention; and -
FIG. 7 is a flow diagram illustrating consecutive steps of the method shown inFIG. 6 . - Referring to
FIG. 2 , the preferred embodiment of a light-emitting diode (LED) according to this invention includes anepitaxial substrate 2 and a light-emittingunit 3. - The
epitaxial substrate 2 includes abase member 21 and a plurality of spaced apart light-transmissive members 22 that serve as a rough structure of theepitaxial substrate 2. Thebase member 21 has anupper surface 211, and is made from a material selected from the group consisting of silicon, aluminum oxide, silicon carbide, and aluminum nitride. Each of the light-transmissive members 22 is formed on and tapers from theupper surface 211 of thebase member 21, and is made of a light-transmissive material having a refractive index lower than that of thebase member 21. The light-transmissive material is selected from the group consisting of silicon oxide (SiOx), silicon oxynitride (SiONx), and magnesium fluoride (MgF2). The silicon oxide and the magnesium fluoride are preferable. - Referring to
FIG. 3 , each of the light-transmissive members 22 is in a cone-shape, and has a bottom face 221 and a height (H) from the bottom face 221. The bottom face 221 contacts theupper surface 211 of the base member and has a maximum width (W). With the light-transmissive member 22 in the cone-shape, the traveling direction of the light can be easily changed. When a ratio of the height (H) to the maximum width (W) is too small, the height (H) of the light-transmissive members 22 is insufficient so that the incident angle of light may be too large, thereby reducing the light extraction efficiency. Accordingly, the ratio of the height (H) to the maximum width (W) is preferably not less than 0.25. It should be noted that, in this specification, the incident angle of the light means an angle between a light incident on a surface of the light-transmissive member 22 and a tangent line of the surface at the point of light incidence. - Referring back to
FIG. 2 , the light-emitting unit 3 includes a first-type semiconductor layer 31 that is connected to thebase member 21 and the light-transmissive members 22, a light-emitting layer 32 that is formed on a portion of the first-type semiconductor layer 31, a second-type semiconductor layer 33 that is formed on the light-emittinglayer 32 and that has an electrical property opposite to that of the first-type semiconductor layer 31, afirst electrode 34 that is formed on the first-type semiconductor layer 31, and asecond electrode 35 that is formed on the second-type semiconductor layer 33. When electricity is applied to the light-emittinglayer 32 through the first andsecond electrodes layer 32 emits light by virtue of the photovoltaic effect. After the light from the light-emittinglayer 32 travels to thebase member 21 and the light-transmissive members 22, it may be reflected or refracted so as to vary the travelling direction of the light and to emit the light outwardly, thereby enhancing the light extraction efficiency of the LED of this invention. Since the materials for forming the light-emittingunit 3 are well-known in the art, detailed descriptions thereof are omitted herein for the sake of brevity. - Simulation experiments were conducted to determine the relationship between height of the rough structure and light extraction efficiency ratio in the LED of this invention and the conventional LED. The results are shown in
FIG. 4 . - Concerning the simulation parameters for the LED of this invention (
FIG. 2 ), thebase member 21 is made of sapphire, the rough structure (i.e., the light-transmissive members 22) is made of silicon oxide, the maximum width (W) of the bottom face 221 in each of the light-transmissive members 22 is controlled at 4 μm, and the current applied to the LED is controlled at 20 mA. - As to the simulation parameters for the conventional LED (
FIG. 1 ), theepitaxial substrate 11 is made of sapphire (i.e., therough structure 111 is also made of sapphire), and the current applied to the LED is controlled at 20 mA. - The simulation results are shown in
FIG. 4 . In this specification, the term“a light extraction efficiency” means a ratio of the amount of light emitted by the LED to the amount of light generated by the LED, and the term “a light extraction efficiency ratio” means a ratio of the light extraction efficiency of the LED having the rough structure to the light extraction efficiency of the LED without the rough structure. - From
FIG. 4 , it is found that, by virtue of use of the material having a refractive index lower than that of the base member in the light-transmissive members, the light extraction efficiency ratio of the LED according to this invention is greater than that of the conventional LED by about 20%. In addition, by controlling the height of the rough structure, i.e., the H/W ratio of the rough structure, a desired light extraction efficiency can be obtained. In sum, by controlling the refractive index and H/W ratio of the light-transmissive member, the light from the light-emittinglayer 32 toward thebase member 21 may travel to and be efficiently refracted twice and reflected by the light-transmissive members 22 to emit outwardly. Thus, the light extraction efficiency of the LED of this invention can be effectively improved. - Besides, when the ratio of the height (H) to the maximum width (W) is not less than 0.25 (i.e., the height (H) in
FIG. 4 is not less than 1.0 μm), each of the light-transmissive members 22 has a relatively large curvature. Thus, a light incident at different points on the light-transmissive members 22 may have different incident angles, and may be reflected to travel in different directions, thereby further enhancing the light extraction efficiency (ratio) of the LED compared to the conventional LED. Accordingly, the ratio of the height (H) to the maximum width (W) preferably ranges between 0.25 and 1.0, more preferably between 0.6 and 1.0. - Furthermore, by increasing the density of the light-
transmissive members 22, the light can be reflected and refracted more efficiently. Preferably, the light-transmissive members 22 are spaced apart from one another by a distance not greater than 1 μm. - In another preferred embodiment, the first-
type semiconductor layer 31 of the light-emittingunit 3 and the light-transmissive members 22 cooperatively define at least onecavity 23 therebetween (seeFIG. 5 ). With thecavity 23, a relatively large refractive index difference is formed between thecavity 23 and the first-type semiconductor layer 31, and thus, the light traveling toward thebase member 21 may be easily reflected to emit outwardly. - Referring to
FIGS. 6 and 7 , the preferred embodiment of a method for forming the light emitting diode according to this invention comprises the following steps. - In
step 41, a light-transmissive layer 200 is formed over abase member 21 using a chemical vapor deposition process, amask Layer 300 is formed over the light-transmissive layer 200, and themask layer 300 is patterned by a lithography process using a patternedphotomask 100 to obtain apatterned mask 301 that partially exposes the light-transmissive layer 200. Since the chemical vapor deposition process and the lithography process are well-known in the art, detailed descriptions thereof are omitted herein for the sake of brevity. - Based on process requirements, the
mask layer 300 can be made of positive-type or negative-type photoresist material. In this embodiment, themask layer 300 is made of the positive-type photoresist material. The light-transmissive layer 200 is made of a light-transmissive material having a refractive index lower than that of thebase member 21, such as silicon oxide (SiOx), silicon oxynitride (SiONx), and magnesium fluoride (MgF2). In consideration of the subsequent high-temperature process for forming a light-emittingunit 3, the light-transmissive material preferably has a heat resistivity of not less than 1000° C. That is to say, the refractive index and the light transmittance of the light-transmissive material would not be significantly changed at a temperature of not less than 1000° C. In practice, the light-transmissive material will not be processed at a temperature greater than 1200° C. Besides, the light-transmissive material preferably has the refractive index lower than both of thebase member 21 and the first-type semiconductor layer 31, and thus, is preferably made of silicon oxide (SiOx) or magnesium fluoride (MgF2). - In
step 42, the patternedmask 301 is heat-treated at a temperature not higher than a glass transition temperature (Tg) of the patternedmask 301, and is preferably heat-treated at a temperature of about 5° C. to 10° C. lower than the Tg of the patternedmask 301 for about 60 minutes. At such temperature, molecular chain movement inside the patternedmask 301 occurs so that the patternedmask 301 is deformed to have a plurality of arch-shaped structures each of which is in a state of its lowest surface energy. - In
step 43, a dry-etching treatment is performed to anisotropically etch the light-transmissive layer 200 and the patternedmask 301 that is heat-treated, so that the light-transmissive layer 200 is formed into a plurality of spaced apart light-transmissive members 22. Thereafter, the patternedmask 301 is fully removed from the light-transmissive members 22, thereby obtaining anepitaxial substrate 2 that has thebase member 21 and the light-transmissive members 22. - In the dry-etching treatment, the radio frequency power ranges from about 200 W to 400 W, and the etching gas may be fluorine-containing gas, such as CF4, SF6, CHF3, etc. In this step, an etching ratio of the light-
transmissive layer 200 to the patteredmask 301 preferably ranges from 1:0.5 to 1:1.5. - In
step 44, a light-emittingunit 3 is formed over the light-transmissive members 22. - In this step, a metal organic chemical vapor deposition (MOCVD) process is conducted, and includes the following substeps: (1) forming a first-
type semiconductor layer 31 over thebase member 21 and the light-transmissive members 22, (2) forming a light-emittinglayer 32 on a portion of the first-type semiconductor layer 3, (3) forming a second-type semiconductor layer 33 over the light-emittinglayer 32, and (4) forming first andsecond electrodes semi conductor layer 31 that is exposed and the second-type semiconductor layer 33. In this step, the material selection and the MOCVD process are well-known in the art, and detailed descriptions thereof are omitted herein for the sake of brevity. - In should be noted that, when forming the first-
type semiconductor layer 31 instep 44, at least one cavity 23 (seeFIG. 5 ) may be formed between the first-type semiconductor layer 31 and the light-transmissive members 22 if the epitaxial parameters, such as background gas composition, pressure, temperature, etc., are well-controlled. - By the method of this invention, the etching problem for the epitaxial substrate can be eliminated, and thus, the processing time for making the LED of this invention can be reduced. Besides, the method of this invention is relatively simple, and the uniformity and the dimensional accuracy of the light-
transmissive members 22 can be easily controlled. As such, the LED made by the method of this invention can emit light evenly. - While the present invention has been described in connection with what are considered the most practical and preferred embodiments, it is understood that this invention is not limited to the disclosed embodiments but is intended to cover various arrangements included within the spirit, and scope of the broadest interpretations and equivalent arrangements.
Claims (21)
1. An epitaxial substrate, comprising:
a base member; and
a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of said base member, and each of which is made of a light-transmissive material having a refractive index lower than that of said base member.
2. The epitaxial substrate of claim 1 , wherein each of said light-transmissive members is in a cone-shape, and has a bottom face that contacts said upper surface of said base member and that has a maximum width, and a height from said bottom face, a ratio of said height to said maximum width being not less than 0.25.
3. The epitaxial substrate of claim 1 , wherein said light-transmissive members are spaced apart from one another by a distance not greater than 1 μm.
4. The epitaxial substrate of claim 1 , wherein said light-transmissive material has a heat resistivity of not less than 1000° C.
5. The epitaxial substrate of claim 1 , wherein said light-transmissive material is selected from the group consisting of silicon oxide, silicon oxynitride, and magnesium fluoride.
6. The epitaxial substrate of claim 1 , wherein said base member is made from a material selected from the group consisting of aluminum oxide, silicon carbide, silicon, and aluminum nitride.
7. A method for making an epitaxial substrate, comprising:
(a) forming over a base member a light-transmissive layer that is made of a light-transmissive material having a refractive index lower than that of the base member;
(b) forming a patterned mask over the light-transmissive layer;
(c) heat-treating the patterned mask at a temperature not higher than a glass transition temperature of the patterned mask;
(d) performing a dry-etching treatment on the light-transmissive layer and the patterned mask that is heat-treated, so that the light-transmissive layer is formed into a plurality of spaced apart light-transmissive members; and
(e) removing the patterned mask from the light-transmissive members.
8. The method of claim 7 , wherein each of the light-transmissive members is in a cone-shape, and has a bottom face that contacts an upper surface of said base member and that has a maximum width, and a height from the bottom face, a ratio of the height to the maximum width being not less than 0.25, the light-transmissive members being spaced apart from one another by a distance not greater than 1 μm.
9. The method of claim 7 , wherein the light-transmissive material has a heat resistivity of not less than 1000° C.
10. The method of claim 7 , wherein the light-transmissive material is selected from the group consisting of silicon oxide, silicon oxynitride, and magnesium fluoride.
11. The method of claim 7 , wherein the base member is made from a material selected from the group consisting of aluminum oxide, silicon carbide, silicon, and aluminum nitride.
12. A light-emitting diode, comprising:
an epitaxial substrate including a base member, and a plurality of spaced apart light-transmissive members, each of which is formed on and tapers from an upper surface of said base member, and each of which is made of a light-transmissive material having a refractive index lower than that of said base member; and
a light-emitting unit formed on said epitaxial substrate to cover said light-transmissive members.
13. The light-emitting diode of claim 12 , wherein each of said light-transmissive members is in a cone-shape, and has a bottom face that contacts said upper surface of said base member and that has a maximum width, and a height from the bottom face, a ratio of the height to the maximum width being not less than 0.25, said light-transmissive members being spaced apart from one another by a distance not greater than 1 μm.
14. The light-emitting diode of claim 12 , wherein said light-emitting unit and said light-transmissive members cooperatively define at least one cavity therebetween.
15. The light-emitting diode of claim 12 , wherein said base member is made from a material selected from the group consisting of aluminum oxide, silicon carbide, silicon, and aluminum nitride.
16. The light-emitting diode of claim 12 , wherein said light-transmissive material is selected from the group consisting of silicon oxide, silicon oxynitride, and magnesium fluoride.
17. A method for making a light-emitting diode, comprising:
(a) forming over a base member a light-transmissive layer that is made of a light-transmissive material having a refractive index lower than that of the base member;
(b) forming a patterned mask over the light-transmissive Layer;
(c) heat-treating the patterned mask at a temperature not higher than a glass transition temperature of the patterned mask;
(d) performing a dry-etching treatment on the light-transmissive layer and the patterned mask that is heat-treated, so that the light-transmissive layer is formed into a plurality of spaced apart light-transmissive members, followed by removing the patterned mask from the light-transmissive members; and
(e) forming a light-emitting unit over the light-transmissive members.
18. The method claim 17 , wherein each of the light-transmissive members is in a cone-shape, and has a bottom face that contacts an upper surface of said base member and that has a maximum width, and a height from the bottom face, a ratio of the height to the maximum width being not less than 0.25, the light-transmissive members being spaced apart from one another by a distance not greater than 1 μm.
19. The method of claim 17 , wherein the step (e) includes:
laterally and epitaxially growing a first-type semiconductor layer over the light-transmissive members, the first-type semiconductor layer and the light-transmissive members cooperatively defining at least one cavity therebetween.
20. The method of claim 17 , wherein the base member is made from a material selected from the group consisting of aluminum oxide, silicon carbide, silicon, and aluminum nitride.
21. The method of claim 17 , wherein the light-transmissive material is selected from the group consisting of silicon oxide, silicon oxynitride, and magnesium fluoride.
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TW100119057 | 2011-05-31 | ||
TW100119057A TW201248725A (en) | 2011-05-31 | 2011-05-31 | Epitaxial substrate with transparent cone, LED, and manufacturing method thereof. |
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Publication number | Priority date | Publication date | Assignee | Title |
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US20120273821A1 (en) * | 2011-04-27 | 2012-11-01 | Sino-American Silicon Prodcuts Inc. | Method for patterning an epitaxial substrate, a light emitting diode and a method for forming a light emitting diode |
US20140131731A1 (en) * | 2012-11-09 | 2014-05-15 | Seoul Viosys Co., Ltd. | Light emitting device and method of fabricating the same |
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US20150115278A1 (en) * | 2013-10-28 | 2015-04-30 | Nichia Corporation | Light emitting device, and method for manufacturing thereof |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020071963A1 (en) * | 2000-12-13 | 2002-06-13 | Sanyo Electric Co., Ltd. | Organic light emitting device |
US20040113166A1 (en) * | 2001-03-21 | 2004-06-17 | Kazuyuki Tadatomo | Semiconductor light-emitting device |
US20100075452A1 (en) * | 2004-12-08 | 2010-03-25 | Samsung Electro-Mechanics Co., Ltd. | Semiconductor light emitting diode having high efficiency and method of manufacturing the same |
US8502190B2 (en) * | 2009-03-30 | 2013-08-06 | Industrial Technology Research Institute | Device of light-emitting diode |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006140357A (en) * | 2004-11-12 | 2006-06-01 | Mitsubishi Cable Ind Ltd | Nitride semiconductor light emitting device |
KR101449000B1 (en) * | 2007-09-06 | 2014-10-13 | 엘지이노텍 주식회사 | Semiconductor light emitting device and fabrication method thereof |
KR101009651B1 (en) * | 2008-10-15 | 2011-01-19 | 박은현 | Iii-nitride semiconductor light emitting device |
CN101504964A (en) * | 2008-12-16 | 2009-08-12 | 杭州士兰明芯科技有限公司 | Gallium nitride based LED epitaxial substrate and preparing process thereof |
TWI407596B (en) * | 2009-03-06 | 2013-09-01 | Advanced Optoelectronic Tech | Lateral heat dissipation type led and fabrication method thereof |
-
2011
- 2011-05-31 TW TW100119057A patent/TW201248725A/en not_active IP Right Cessation
- 2011-11-08 CN CN201410630773.8A patent/CN104465923A/en active Pending
- 2011-11-08 CN CN201110349583.5A patent/CN102810611B/en not_active Expired - Fee Related
-
2012
- 2012-02-27 US US13/406,023 patent/US20120305942A1/en not_active Abandoned
-
2014
- 2014-01-06 US US14/147,931 patent/US9263650B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020071963A1 (en) * | 2000-12-13 | 2002-06-13 | Sanyo Electric Co., Ltd. | Organic light emitting device |
US20040113166A1 (en) * | 2001-03-21 | 2004-06-17 | Kazuyuki Tadatomo | Semiconductor light-emitting device |
US20100075452A1 (en) * | 2004-12-08 | 2010-03-25 | Samsung Electro-Mechanics Co., Ltd. | Semiconductor light emitting diode having high efficiency and method of manufacturing the same |
US8502190B2 (en) * | 2009-03-30 | 2013-08-06 | Industrial Technology Research Institute | Device of light-emitting diode |
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US11778842B2 (en) | 2013-03-15 | 2023-10-03 | Apple Inc. | Light emitting diode display with redundancy scheme |
US20200013975A1 (en) * | 2013-03-15 | 2020-01-09 | Apple Inc. | Light emitting diode display with redundancy scheme |
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US10854780B2 (en) | 2017-11-05 | 2020-12-01 | Genesis Photonics Inc. | Light emitting apparatus and manufacturing method thereof |
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Also Published As
Publication number | Publication date |
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CN102810611B (en) | 2015-09-30 |
CN102810611A (en) | 2012-12-05 |
US9263650B2 (en) | 2016-02-16 |
CN104465923A (en) | 2015-03-25 |
TWI442472B (en) | 2014-06-21 |
TW201248725A (en) | 2012-12-01 |
US20140117398A1 (en) | 2014-05-01 |
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