US20120194963A1 - Electronic component and substrate module - Google Patents

Electronic component and substrate module Download PDF

Info

Publication number
US20120194963A1
US20120194963A1 US13/359,520 US201213359520A US2012194963A1 US 20120194963 A1 US20120194963 A1 US 20120194963A1 US 201213359520 A US201213359520 A US 201213359520A US 2012194963 A1 US2012194963 A1 US 2012194963A1
Authority
US
United States
Prior art keywords
external electrode
electronic component
conductor
lead
conductors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US13/359,520
Other versions
US8576538B2 (en
Inventor
Yoichi Kuroda
Yoshio Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Assigned to MURATA MANUFACTURING CO., LTD. reassignment MURATA MANUFACTURING CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAWAGUCHI, YOSHIO, KURODA, YOICHI
Publication of US20120194963A1 publication Critical patent/US20120194963A1/en
Application granted granted Critical
Publication of US8576538B2 publication Critical patent/US8576538B2/en
Active legal-status Critical Current
Adjusted expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/30Stacked capacitors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/005Electrodes
    • H01G4/012Form of non-self-supporting electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/228Terminals
    • H01G4/232Terminals electrically connecting two or more layers of a stacked or rolled capacitor

Definitions

  • the present invention relates to an electronic component and a substrate module, and more particularly to an electronic component and a substrate module, which include a built-in capacitor.
  • FIG. 25 is a cross-sectional structure diagram of a multilayer ceramic capacitor 500 disclosed therein.
  • the multilayer ceramic capacitor 500 includes dielectric layers 502 , internal electrode layers 504 a , 504 b and terminal electrodes 506 a , 506 b.
  • the dielectric layers 502 are stacked and form a multilayered body.
  • the internal electrode layers 504 a and 504 b are included inside the multilayered body, and form a capacitor by facing each other over the dielectric layer 502 .
  • the internal electrode layers 504 a and 504 b are each led out to an opposite end surface of the multilayered body.
  • the terminal electrodes 506 a and 506 b are each provided on the opposite end surface of the multilayered body, and connect to the internal electrode layers 504 a and 504 b , respectively.
  • Preferred embodiments of the present invention provide an electronic component and a substrate module, which are significantly reduce insertion loss in high frequency bands.
  • an electronic component includes a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other; a plurality of first capacitor conductors each being provided on a different one of the dielectric layers; a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body; a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor; a plurality of second capacitor conductors each being provided on a different one of the dielectric layers; a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body; a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching the second lead conductor; a third capacitor conductor provided on
  • an electronic component includes a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other; a plurality of first capacitor conductors each being provided on a different one of the dielectric layers; a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body; a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor; a plurality of second capacitor conductors each being provided on a different one of the dielectric layers and facing one of the first capacitor conductors over the dielectric layer; a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body; a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching
  • a substrate module includes a circuit substrate including a first land and a second land; and an electronic component according to a preferred embodiment of the present invention described above mounted on the circuit substrate; wherein the first external electrode is connected to the first land; and the second external electrode is connected to the second land.
  • the insertion loss in the high frequency bands is significantly reduced.
  • FIG. 1 is an external perspective view of an electronic component according to a first preferred embodiment of the present invention.
  • FIG. 2 is an exploded perspective view of a multilayered body of the electronic component illustrated in FIG. 1 .
  • FIG. 3A and FIG. 3B are internal plane views of the electronic component illustrated in FIG. 1 .
  • FIG. 4A is a cross-sectional structure diagram of a substrate module
  • FIG. 4B is a plane view of the substrate module viewed from the positive side of a Z-axis direction.
  • FIG. 5 is an equivalent circuit schematic of the substrate module illustrated in FIG. 4A and FIG. 4B .
  • FIG. 6 is an external perspective view of an electronic component to be used as a comparative example.
  • FIG. 7 is an exploded perspective view of a multilayered body of the electronic component to be used as a comparative example.
  • FIG. 8 is a graph representing insertion losses (S 21 ) of a first sample and a second sample.
  • FIG. 9 is a graph representing insertion losses (S 21 ) of a third sample and a fourth sample.
  • FIG. 10 is a graph representing insertion losses (S 21 ) of a fifth sample and a sixth sample.
  • FIG. 11 is a graph representing insertion losses (S 21 ) of a seventh sample and an eighth sample.
  • FIG. 12 is an internal plane view of an electronic component according to a second preferred embodiment of the present invention.
  • FIG. 13 is an internal plane view of an electronic component according to a third preferred embodiment of the present invention.
  • FIG. 14 is an internal plane view of an electronic component according to a fourth preferred embodiment of the present invention.
  • FIG. 15 is an internal plane view of an electronic component according to a fifth preferred embodiment of the present invention.
  • FIG. 16 is an internal plane view of an electronic component according to a sixth preferred embodiment of the present invention.
  • FIG. 17A and FIG. 17B are internal plane views of an electronic component according to a seventh preferred embodiment of the present invention.
  • FIG. 18 is an exploded perspective view of a multilayered body of an electronic component according to an eighth preferred embodiment of the present invention.
  • FIG. 19A and FIG. 19B are internal plane views of an electronic component of FIG. 18 .
  • FIG. 20 is a cross-sectional structure diagram of a substrate module.
  • FIG. 21A and FIG. 21B are internal plane views of an electronic component according to a ninth preferred embodiment of the present invention.
  • FIG. 22A and FIG. 22B are internal plane views of an electronic component according to a tenth preferred embodiment of the present invention.
  • FIG. 23 is an external perspective view of an electronic component according to an eleventh preferred embodiment of the present invention.
  • FIG. 24 is an external perspective view of an electronic component according to a twelfth preferred embodiment of the present invention.
  • FIG. 25 is a cross-sectional structure diagram of the multilayer ceramic capacitor disclosed in Japanese Unexamined Patent Application Publication No. 2000-306762.
  • FIG. 1 is an external perspective view of the electronic component 10 according to the first preferred embodiment.
  • FIG. 2 is an exploded perspective view of a multilayered body 11 of the electronic component 10 illustrated in FIG. 1 .
  • FIG. 3A and FIG. 3B are internal plane views of the electronic component 10 illustrated in FIG. 1 .
  • a stacking direction in the multilayered body 11 is defined as a Z-axis.
  • An x-direction is defined as a direction in which a longer side of the multilayered body 11 extends in a plane view when the multilayered body 11 is viewed along the Z-axis direction.
  • a y-direction is defined as a direction in which a shorter side of the multilayered body 11 extends in a plane view when the multilayered body 11 is viewed along the Z-axis direction.
  • the electronic component 10 is, for example, a chip capacitor and includes, for example as illustrated in FIG. 1 to FIG. 3A and FIG. 3B , the multilayered body 11 , external electrodes 12 ( 12 a , 12 b ) and internal conductors 30 ( 30 a - 30 c ), 31 ( 31 a - 31 c ), 32 ( 32 a , 32 b ) (not shown in FIG. 1 ).
  • the multilayered body 11 preferably has a substantially rectangular solid shape except corners and ridges that are chamfered and define roundish shapes, for example.
  • a surface at the positive side of the z-axis direction is defined as an upper surface S 1
  • a surface at the negative side of the z-axis direction is defined as a lower surface S 2 .
  • a surface at the negative side of the x-axis direction is defined as an end surface S 3
  • a surface at the positive side of the x-axis direction is defined as an end surface S 4 .
  • a surface at the positive side of the y-axis direction is defined as a side surface S 5
  • a surface at the negative side of the y-axis direction is defined as a side surface S 6 .
  • the multilayered body 11 is constructed in such a way that a plurality of ceramic layers 17 ( 17 a - 17 g ) are stacked in order of appearance from the positive side to the negative side of the z-axis direction.
  • the ceramic layer 17 preferably has a substantially rectangular shape and is made of dielectric ceramic.
  • a principle surface of the ceramic layer 17 at the positive side of the z-axis direction is referred to as a top surface
  • a principle surface of the ceramic layer 17 at the negative side of the z-axis direction is referred to as a back surface.
  • the upper surface S 1 of the multilayered body 11 is constructed of the top surface of the ceramic layer 17 arranged at the most positive side of the z-axis direction.
  • the lower surface S 2 of the multilayered body 11 is constructed of the back surface of the ceramic layer 17 arranged at the most negative side of the z-axis direction.
  • the end surface S 3 is constructed of stacked shorter sides of the ceramic layers 17 a - 17 g at the most negative side of the x-axis direction.
  • the end surface S 4 is constructed of stacked shorter sides of the ceramic layers 17 a - 17 g at the most positive side of the x-axis direction.
  • the side surface S 5 is constructed of stacked longer sides of the ceramic layers 17 a - 17 g at the most positive side of the y-axis direction.
  • the side surface S 6 is constructed of stacked longer sides of the ceramic layers 17 a - 17 g at the most negative side of the y-axis direction.
  • the plural internal conductors 30 a - 30 c , 31 a - 31 c are provided on the top surfaces of the different ceramic layers 17 b , 17 d , 17 f , respectively, and embedded inside the multilayered body 11 .
  • the internal conductors 32 a and 32 b are provided on the top surfaces of the ceramic layers 17 c and 17 e , respectively, and embedded inside the multilayered body 11 .
  • the internal conductors 30 , 31 and the internal conductors 32 are stacked alternately in the z-axis direction.
  • the internal conductor 30 includes a capacitor conductor 18 ( 18 a - 18 c ) and lead conductors 20 ( 20 a - 20 c ), ( 22 a - 22 c ) and 23 ( 23 a - 23 c ).
  • the capacitor conductors 18 a - 18 c have substantially rectangular shapes, and are arranged on the top surfaces of different ceramic layers 17 b , 17 d , 17 f , respectively, such that they do not touch external edges of the corresponding ceramic layers 17 b , 17 d , 17 f .
  • the capacitor conductor 18 is provided within an area of the ceramic layer 17 , which is about one-half of the whole area of the ceramic layer 17 at the negative side of the x-axis direction.
  • the lead conductors 20 a - 20 c are connected to the capacitor conductors 18 a - 18 c , respectively, and led to the end surface S 3 of the multilayered body 11 to be exposed at the end surface S 3 . More specifically, the lead conductor 20 protrudes toward the negative side of the x-axis direction from the longer side of the capacitor conductor 18 at the negative side of the x-axis direction. Accordingly, the lead conductor 20 is led out to the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • the width of the lead conductor 20 in the y-axis direction is substantially the same as the width of the capacitor conductor 18 in the y-axis direction.
  • the lead conductors 22 a - 22 c are connected to the capacitor conductors 18 a - 18 c , respectively, and are led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 . More specifically, the lead conductor 22 extends toward the positive side of the y-axis direction from an end at the positive side of the x-axis direction of the shorter side of the capacitor conductor 18 at the positive side of the y-axis direction. Accordingly, the lead conductor 22 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. The lead conductor 22 does not touch the lead conductor 20 .
  • the lead conductors 23 a - 23 c are connected to the corresponding capacitor conductors 18 a - 18 c , respectively, and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 . More specifically, the lead conductor 23 extends toward the negative side of the y-axis direction from an end at the positive side of the x-axis direction of the shorter side of the capacitor conductor 18 at the negative side of the y-axis direction. Accordingly, the lead conductor 23 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. The lead conductor 23 does not touch the lead conductor 20 .
  • the internal conductor 31 includes a capacitor conductor 19 ( 19 a - 19 c ) and lead conductors 21 ( 21 a - 21 c ), ( 24 a - 24 c ) and 25 ( 25 a - 25 c ).
  • the capacitor conductors 19 a - 19 c have substantially rectangular shapes, and are arranged on the top surfaces of different ceramic layers 17 b , 17 d and 17 f such that they do not touch external edges of the corresponding ceramic layers 17 b , 17 d and 17 f .
  • the capacitor conductor 19 is provided within an area of the ceramic layer 17 , which is one-half of the whole area of the ceramic layer 17 at the positive side of the x-axis direction.
  • the capacitor conductors 18 and 19 are provided on the same top surface of the ceramic layer 17 , and face each other.
  • the lead conductors 21 a - 21 c are connected to the corresponding capacitor conductors 19 a - 19 c , respectively, and led to the end surface S 4 of the multilayered body 11 to be exposed at the end surface S 4 . More specifically, the lead conductor 21 protrudes toward the positive side of the x-axis direction from the longer side of the capacitor conductor 19 at the positive side of the x-axis direction. Accordingly, the lead conductor 21 is led out to the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • the width of the lead conductor 21 in the y-axis direction is substantially the same as the width of the capacitor conductor 19 in the y-axis direction.
  • the lead conductors 24 a - 24 c are connected to the capacitor conductors 19 a - 19 c , respectively, and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 . More specifically, the lead conductor 24 extends toward the positive side of the y-axis direction from an end at the negative side of the x-axis direction in the shorter side of the capacitor conductor 19 at the positive side of the y-axis direction. Accordingly, the lead conductor 24 is led out to a position at a further positive side of the x-axis direction than the middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. In other words, the lead conductor 24 is disposed at a further positive side of the x-axis direction than the lead conductor 22 in a plane viewed in the z-axis direction. The lead conductor 24 does not touch the lead conductor 21 .
  • the lead conductors 25 a - 25 c are connected to the capacitor conductors 19 a - 19 c , respectively, and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 . More specifically, the lead conductor 25 extends toward the negative side of the y-axis direction from an end at the negative side of the x-axis direction of the shorter side of the capacitor conductor 19 at the negative side of the y-axis direction. Accordingly, the lead conductor 25 is led out to a position at a further positive side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. In other words, the lead conductor 25 is disposed at a further positive side of the x-axis direction than the lead conductor 23 in a plane viewed in the z-axis direction. The lead conductor 25 does not touch the lead conductor 21 .
  • the internal conductors 32 a and 32 b have substantially rectangular shapes, and are arranged on the top surfaces of the ceramic layers 17 c and 17 e , respectively, such that they do not touch external edges of the corresponding ceramic layers 17 c and 17 e .
  • the internal conductor 32 is provided on the top surface of the ceramic layer 17 that is different from the ceramic layer 17 in which the capacitor conductors 18 and 19 are provided, and faces the capacitor conductors 18 and 19 over the ceramic layer 17 .
  • capacitors are defined between the capacitor conductor 18 and the internal conductor 32 and between the capacitor conductor 19 and the internal conductor 32 .
  • the capacitor located between the capacitor conductor 18 and the internal conductor 32 is connected in series to the capacitor formed between the capacitor conductor 19 and the internal conductor 32 .
  • the external electrode 12 a is arranged so as to straddle the end surface S 3 , the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 , and to connect with all the lead conductors 20 a - 20 c , 22 a - 22 c and 23 a - 23 c . More specifically, the external electrode 12 a covers the whole area of the end surface S 3 of the multilayered body 11 so as to cover portions of the lead conductors 20 a - 20 c exposed from the end surface S 3 . Furthermore, the external electrode 12 a is folded down from the end surface S 3 to the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 . The external electrode 12 a covers the side surfaces S 5 and S 6 of the multilayered body 11 so as to cover portions of the lead conductors 22 a - 22 c , 23 a - 23 c exposed from the side surfaces S 5 and S 6 .
  • the external electrode 12 b is arranged so as to straddle the end surface S 4 , the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 , and to connect with all the lead conductors 21 a - 21 c , 24 a - 24 c and 25 a - 25 c . More specifically, the external electrode 12 b covers the whole area of the end surface S 4 of the multilayered body 11 so as to cover portions of the lead conductors 21 a - 21 c exposed from the end surface S 4 . Furthermore, the external electrode 12 b is folded down from the end surface S 4 to the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 . The external electrode 12 b covers the side surfaces S 5 and S 6 of the multilayered body 11 so as to cover portions of the lead conductors 24 a - 24 c , 25 a - 25 c exposed from the side surfaces S 5 and S 6 .
  • the widths of the external electrode 12 a along the x-axis direction in the side surfaces S 5 and S 6 are wider than the widths of the external electrode 12 a along the x-axis direction in the upper surface S 1 and the lower surface S 2 .
  • the widths of the external electrode 12 b along the x-axis direction in the side surfaces S 5 and S 6 are wider than the widths of the external electrode 12 b along the x-axis direction in the upper surface S 1 and the lower surface S 2 .
  • gaps D 1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S 5 and S 6 are smaller than a gap D 2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S 2 .
  • no external electrode that retains a different electrical potential from those of the external electrodes 12 a and 12 b is provided in between the external electrode 12 a and the external electrode 12 b .
  • FIG. 1 , FIG. 2 , FIG. 3A and FIG. 3B are used.
  • BaTiO 3 , CaTiO 3 , SrTiO 3 or CaZrO 3 which is used as a primary component
  • a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound or a rare earth compound, which is used as an accessory component are weighed at a predetermined ratio and are then put in a ball mill, and wet mixing is performed. An obtained mixture is dried and pulverized. Then, an obtained powder is calcined. After a calcined powder is wet-pulverized by a ball mill, drying and pulverizing are performed to obtain a dielectric ceramic powder.
  • the thickness of the ceramic layer 17 after the firing is preferably about 0.5 ⁇ m to about 10 ⁇ m, for example.
  • the internal conductors 30 - 32 are formed on the ceramic green sheets, which are to be formed into the ceramic layers 17 , by applying a paste including a conductive material using a method such as a screen printing or a photolithographic method.
  • a paste including a conductive material for example, a paste formed by adding an organic binder and an organic solvent to a metal powder may preferably be used.
  • the metal powder may be, for example, Ni, Cu, Ag, Pd, Ag—Pd alloy, Au or the like.
  • the thicknesses of the internal conductors 30 - 32 after the firing are preferably about 0.3 ⁇ m to about 2.0 ⁇ m, for example.
  • the ceramic green sheets that are to be formed into the ceramic layers 17 are stacked to obtain a non-fired mother multilayered body. Subsequently, pressure bonding is performed on the non-fired mother multilayered body by using a hydrostatic pressure press.
  • the non-fired mother multilayered body is cut to predetermined sizes to obtain a plurality of non-fired multilayered bodies 11 . Subsequently, a barrel polishing process is performed on the surfaces of the multilayered body 11 .
  • the non-fired multilayered body 11 is fired.
  • the firing temperature for example, a temperature of about 900° C. to about 1,300° C., for example, is preferable. With the foregoing steps, the preparation of the multilayered body 11 is completed.
  • the external electrode 12 is formed on the multilayered body 11 . More specifically, an electrically conductive paste is applied on the surfaces of the multilayered body 11 by using a well-known dip method, a slit method or the like. The electrically conductive paste is then baked at a temperature of about 700° C. to about 900° C., for example, to produce an underlayer electrode of the external electrode 12 .
  • As a material for the electrically conductive paste Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example.
  • the thickness of the underlayer electrode is preferably about 10 ⁇ m to about 50 ⁇ m, for example.
  • plating is performed on the underlayer electrode to complete the external electrode 12 .
  • the electronic component 10 is completed.
  • Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example.
  • the plating may be repeated plural times to form layers of the plating on the underlayer electrode. With the foregoing steps, the electronic component 10 is completed.
  • FIG. 1 A method for manufacturing the electronic component 10 is described. As the drawings, FIG. 1 , FIG. 2 , FIG. 3A and FIG. 3 B are used.
  • BaTiO 3 , CaTiO 3 , SrTiO 3 or CaZrO 3 which is used as a primary component
  • a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound or a rare earth compound, which is used as an accessory component are weighed at a predetermined ratio and are then put in a ball mill, and wet mixing is performed. An obtained mixture is dried and pulverized. Then, an obtained powder is calcined. After a calcined powder is wet-pulverized by a ball mill, drying and pulverizing are performed to obtain a dielectric ceramic powder.
  • the thickness of the ceramic layer 17 after the firing is preferably about 0.5 ⁇ m to about 10 ⁇ m, for example.
  • the internal conductors 30 - 32 are formed on the ceramic green sheets which are to be formed into the ceramic layers 17 by applying a paste including a conductive material using a method such as a screen printing or a photolithographic method.
  • a paste including a conductive material for example, a paste formed by adding an organic binder and an organic solvent to a metal powder may preferably be used.
  • the metal powder may be, for example, Ni, Cu, Ag, Pd, Ag—Pd alloy, Au or other suitable material.
  • the thicknesses of the internal conductors 30 - 32 after the firing are preferably about 0.3 ⁇ m to about 2.0 ⁇ m, for example.
  • the ceramic green sheets that are to be formed into the ceramic layers 17 are stacked to obtain a non-fired mother multilayered body. Subsequently, pressure bonding is performed on the non-fired mother multilayered body by using a hydrostatic pressure press.
  • the non-fired mother multilayered body is cut to predetermined sizes to obtain a plurality of non-fired multilayered bodies 11 . Subsequently, a barrel polishing process is performed on the surfaces of the multilayered body 11 .
  • the non-fired multilayered body 11 is fired.
  • the firing temperature for example, a temperature of about 900° C. to about 1,300° C., for example, is preferable. With the foregoing steps, the preparation of the multilayered body 11 is completed.
  • the external electrode 12 is formed on the multilayered body 11 . More specifically, an electrically conductive paste is applied on the surfaces of the multilayered body 11 by using a well-known dip method, a slit method or the like. The electrically conductive paste is then baked at a temperature of about 700° C. to about 900° C., for example, to produce an underlayer electrode of the external electrode 12 .
  • As a material for the electrically conductive paste Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example.
  • the thickness of the underlayer electrode is preferably about 10 ⁇ m to about 50 ⁇ m, for example.
  • plating is performed on the underlayer electrode to complete the external electrode 12 .
  • the electronic component 10 is completed.
  • Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example.
  • the plating may be repeated plural times to form layers of the plating on the underlayer electrode. With the foregoing steps, the electronic component 10 is completed.
  • FIG. 4A is a cross-sectional structure diagram of the substrate module 40
  • FIG. 4B is a plane view of the substrate module 40 viewed from the positive side of a Z-axis direction.
  • FIG. 5 is an equivalent circuit schematic of the substrate module 40 of FIG. 4A and FIG. 4B .
  • the substrate module 40 includes the electronic component 10 and a circuit substrate 51 .
  • the circuit substrate 51 includes a substrate body 52 , a signal conductor 54 , a ground electrode 55 , a via-hole conductor 56 and a ground conductor G.
  • the substrate body 52 is a multilayer substrate including a plurality of ceramic layers and conductor layers stacked on each other, and includes electronic circuitry on its principle surface and therein.
  • the signal conductor 54 is provided on the principle surface of the substrate body 52 at the positive side of the z-axis direction, and extends in the y-axis direction as illustrated in FIG. 4B .
  • an input port P 1 (not shown in the figure) is provided on an end of the signal conductor 54 at the positive side of the y-axis direction.
  • an output port P 2 (not shown in the figure) is provided.
  • the ground electrode 55 is provided on the principle surface of the circuit substrate 51 at the positive side of the z-axis direction, and has a substantially rectangular shape as illustrated in FIG. 4B .
  • the ground conductor G is provided in the substrate body 52 and kept at the ground potential.
  • the ground conductor G connects to a ground port P 3 , which is not shown in the figure.
  • the via-hole conductor 56 is provided in the substrate body 52 , and connects to the ground electrode 55 and the ground conductor G. According to the above, the ground electrode 55 is also kept at the ground potential.
  • the electronic component 10 is mounted on the circuit substrate 51 . More specifically, the external electrode 12 a is connected to the signal conductor 54 by a solder 60 a . Similarly, the external electrode 12 b is connected to the ground conductor 55 by a solder 60 b . Accordingly, the substrate module 40 has a circuit structure illustrated in FIG. 5 . In other words, the signal conductor 54 connects the input port P 1 and the output port P 2 , and the electronic component 10 is provided between the signal conductor 54 and the ground port P 3 . In FIG. 5 , a capacitor C, a resistor R and an inductor L represent the capacitance, electrical resistance and inductance that the electronic component 10 has. Having the structure illustrated in FIG.
  • a high frequency signal is input to the input port P 1 and output from the output port P 2 . Furthermore, of the high frequency signal input from the input port P 1 , components of the high frequency signal equal to resonance frequencies of the electronic component 10 are output from the ground P 3 and not output from the output port P 2 .
  • the circuitry structure of the substrate module 40 is not limited to that illustrated in FIG. 5 . Alternatively, the electronic component 10 may be provided in between the input port P 1 and the output port P 2 in the substrate module 40 .
  • FIG. 6 is an external perspective view of an electronic component 110 to be used as a comparative example.
  • FIG. 7 is an exploded perspective view of a multilayered body 111 of the electronic component 110 to be used as a comparative example.
  • the comparative example electronic component 110 has the same structure as the electronic component 10 except that the lead electrodes 22 - 25 and the external electrodes 12 on the side surfaces S 5 , S 6 are eliminated therefrom.
  • portions substantially similar or identical to those of the electronic component 10 are denoted by reference numerals that are produced by adding 100 to the corresponding reference numerals of the electronic component 10 .
  • a high frequency signal is input into the electronic component 110 from a signal conductor via an external electrode 112 a and output to a ground electrode via an external electrode 112 b .
  • the high frequency signal flows in the order of the signal conductor, the external electrode 112 a , a lead conductor 120 , a capacitor conductor 118 , an internal conductor 132 , a capacitor conductor 119 , a lead conductor 121 , the external electrode 112 b and the ground electrode.
  • the high frequency signal passes through only one path.
  • the high frequency signal is input into the electronic component 10 from the signal conductor 54 via the external electrode 12 a and output to the ground electrode 55 via the external electrode 12 b .
  • the following first to fifth paths may be available as paths through which the high frequency signal flows.
  • the first path is a path such that the high frequency signal flows in the order of the signal conductor 54 , the external electrode 12 a , the lead conductor 20 , the capacitor conductor 18 , the internal conductor 32 , the capacitor conductor 19 , the lead conductor 21 , the external electrode 12 b and the ground electrode 55 .
  • the second path is a path such that the high frequency signal flows in the order of the signal conductor 54 , the external electrode 12 a , the lead conductor 20 , the capacitor conductor 18 , the lead conductors 22 , 23 , the external electrode 12 a , the external electrode 12 b and the ground electrode 55 .
  • the third path is a path such that the high frequency signal flows in the order of the signal conductor 54 , the external electrode 12 a , the lead conductors 22 , 23 , the capacitor conductor 18 , the internal conductor 32 , the capacitor conductor 19 , the lead conductor 21 , the external electrode 12 b and the ground electrode 55 .
  • the fourth path is a path such that the high frequency signal flows in the order of the signal conductor 54 , the external electrode 12 a , the lead conductors 22 , 23 , the capacitor conductor 18 , the internal conductor 32 , the capacitor conductor 19 , the lead conductors 24 , 25 , the external electrode 12 b and the ground electrode 55 .
  • the fifth path is a path such that the high frequency signal flows in the order of the signal conductor 54 , the external electrode 12 a , the external electrode 12 b and the ground electrode 55 .
  • the high frequency signal flows from the external electrode 12 a to the external electrode 12 b by passing through inside the multilayered body 11 in between the external electrode 12 a and the external electrode 12 b .
  • High frequency signals having frequencies higher than the first resonance point may flow through these paths.
  • the gap between the external electrode 12 a and the external electrode 12 b may be made minimal, and more preferably about 50 ⁇ m to about 200 ⁇ m, for example.
  • the electronic component 10 in comparison with the electronic component 110 , includes more paths, i.e., the second to fifth paths. That feature may contribute to the reduction of ESL. Furthermore, that feature may result the shifting of the first resonance point and the second resonance point in the electronic component 10 to higher frequency sides and the reduction of the insertion loss thereof in the high frequency bands, in comparison with the electronic component 110 .
  • the shift width of the first resonance point tends to become larger in comparison with that of the second resonance point. This may be caused by having the second to fifth paths in the electronic component 10 .
  • the flow of high frequency signals having frequencies higher than the first resonance point may tend to concentrate in part close to the circuit substrate 51 . This may provide a relatively small capacitor in a vicinity of the lower surface, and its resonance point may appeared as the second resonance point.
  • the large shifting of the second resonance point toward the higher frequency side may be caused by the particular reduction of ESL in a relatively small capacitor due to the high frequency signals flowing through the second to fifth paths.
  • the separation of the second resonance point from the first resonance point and the shallow valley at the second resonance point as described in the above may prevent a device, which operates at a frequency between the first resonance point and the second resonance point, from malfunctioning.
  • the possibility of a short-circuit may be reduced with the electronic component 10 when it is mounted on the circuit substrate 51 .
  • the gaps D 1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S 5 and S 6 are smaller than the gap D 2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S 2 .
  • the gap between the external electrode 12 a and the external electrode 12 b is made larger in the bottom surface S 2 .
  • the risk of connecting the external electrode 12 a and the external electrode 12 b by solder is smaller. Accordingly, the possibility of a short-circuit may be reduced with the electronic component 10 when mounting on the circuit substrate 51 .
  • the possibility of delamination may be reduced.
  • delamination is prone to occur at corners of multilayered body.
  • delamination may occur between a lead electrode and a ceramic layer.
  • the lead electrodes 20 and 21 are not led out to corners of the multilayered body 10 .
  • the possibility of delamination is reduced.
  • the lead electrodes 20 and 21 are not exposed in the corners of the multilayered body 11 . This improves moisture resistance of the electronic component 10 .
  • samples hereinafter referred to as first sample, third sample, fifth sample and seventh sample
  • samples second sample, fourth sample, sixth sample and eighth sample
  • the first to eighth samples were each mounted in a circuit substrate as illustrated in FIG. 4A and FIG. 4B
  • ESL and the insertion loss (S 21 ) between the input port P 1 and the output port P 2 were measured by using an network analyzer (Product No. 8722D manufactured by Agilent Technologies).
  • Outer layer's thickness (distance from the internal conductors 30 a , 31 a to the upper surface S 1 of the multilayered body 11 and distance from the internal conductors 30 c , 31 c to the lower surface S 2 of the multilayered body 11 ): 88 ⁇ m
  • Table 1 indicates the condition of each sample.
  • the electronic component 10 had about 20% less ESL than the electronic component 110 .
  • FIG. 8 is a graph representing the insertion loss (S 21 ) of the first sample and the second sample.
  • FIG. 9 is a graph representing the insertion loss (S 21 ) of the third sample and the fourth sample.
  • FIG. 10 is a graph representing the insertion loss (S 21 ) of the fifth sample and the sixth sample.
  • FIG. 11 is a graph representing the insertion loss (S 21 ) of the seventh sample and the eighth sample.
  • the vertical axis represents the insertion loss
  • the horizontal axis represents the frequency.
  • the first resonance points f 1 of the first sample, the third sample, the fifth sample and the seventh sample are higher than the corresponding first resonance points f 1 of the second sample, the fourth sample, the sixth sample and the eighth sample, respectively.
  • Table 3 indicates the first resonance points of the first to eighth samples.
  • the first resonance point f 1 of the electronic component 10 is higher than the first resonance point f 1 of the electronic component 110 . Accordingly, it is clear that the high frequency characteristic of the electronic component 10 is superior to that of the electronic component 110 . More specifically, the first resonance point f 1 of the electronic component 10 is about 10% higher than that of the electronic component 110 .
  • the second resonance point f 2 of the electronic component 10 is higher than that of the electronic component 110 .
  • the second resonance point f 2 of the eighth sample is about 8 GHz while the second resonance point f 2 of the seventh sample is about 10 GHz.
  • the insertion loss of the electronic component 10 at its second resonance point f 2 is less than that of electronic component 110 at its second resonance point f 2 . Accordingly, with the electronic component 10 , the insertion loss in the high frequency bands is significantly reduced.
  • FIG. 12 is an internal plane view of the electronic component 10 a according to the second preferred embodiment.
  • An external perspective view of the electronic component 10 a is the same as that of the electronic component 10 , and thus FIG. 1 is also used below.
  • a difference between the electronic component 10 and the electronic component 10 a lies in the shape of the internal conductors 30 and 31 . More specifically, the internal conductors and 31 (capacitor conductors 18 and 19 ) of the electronic component 10 a are closer to each other than those of the electronic component 10 . According to the above, in the electronic component 10 a , areas of portions where the capacitor conductors 18 , 19 are facing to the internal conductor 32 are larger than corresponding areas of the electronic component 10 . Accordingly, the electronic component 10 a has a significantly larger capacitance.
  • FIG. 13 is an internal plane view of the electronic component 10 b according to the third preferred embodiment.
  • An external perspective view of the electronic component 10 b is the same as that of the electronic component 10 , and thus FIG. 1 is also used below.
  • a difference between the electronic component 10 and the electronic component 10 b lies in whether or not there are lead electrodes 72 ( 72 a - 72 c ), 73 ( 73 a - 73 c ), 74 ( 74 a - 74 c ) and 75 ( 75 a - 75 c ).
  • the lead conductor 72 is connected to a connecting conductor 20 , and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 .
  • the lead conductor 72 is in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction. Accordingly, the lead conductor 72 connects to the external electrode 12 a at the longer side at the positive side of the y-axis direction and the shorter side at the negative side of the x-axis direction of the ceramic layer 17 .
  • the lead conductor 73 is connected to a connecting conductor 20 , and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 .
  • the lead conductor 73 is in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction. Accordingly, the lead conductor 73 connects to the external electrode 12 a at the longer side at the negative side of the y-axis direction and the shorter side at the negative side of the x-axis direction of the ceramic layer 17 .
  • the lead conductor 74 is connected to a connecting conductor 21 , and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 .
  • the lead conductor 74 is in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction. Accordingly, the lead conductor 74 connects to the external electrode 12 b at the longer side at the positive side of the y-axis direction and the shorter side at the positive side of the x-axis direction of the ceramic layer 17 .
  • the lead conductor 75 is connected to a connecting conductor 21 , and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 .
  • the lead conductor 75 is in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction. Accordingly, the lead conductor 75 is connected to the external electrode 12 b at the longer side at the negative side of the y-axis direction and the shorter side at the positive side of the x-axis direction of the ceramic layer 17 .
  • the electronic component 10 b is provided with the lead conductors 72 - 75 , more electric current flow paths are available in the electronic component 10 b than the electronic component 10 . As a result, in the electronic component 10 b , the reduction of ESL is achieved more effectively.
  • FIG. 14 is an internal plane view of the electronic component 10 c according to the fourth preferred embodiment.
  • An external perspective view of the electronic component 10 c is the same as that of the electronic component 10 , and thus FIG. 1 is also used.
  • a difference between the electronic component 10 and the electronic component 10 c lies in positions of the lead electrodes 72 ( 72 a - 72 c ), 73 ( 73 a - 73 c ), 74 ( 74 a - 74 c ) and 75 ( 75 a - 75 c ). More specifically, in the electronic component 10 c , none of the lead conductors 72 - 75 is in contact with the shorter sides of the ceramic layer 17 at the positive and negative sides of the x-axis direction. In other words, in the corners of the ceramic layer 17 , none of the lead conductors 72 - 75 are provided.
  • none of the lead conductors 72 - 75 is provided in the corner of the multilayered body 11 . Accordingly, the possibility of delamination is significantly reduced.
  • FIG. 15 is an internal plane view of the electronic component 10 d according to the fifth preferred embodiment.
  • An external perspective view of the electronic component 10 d is the same as that of the electronic component 10 , and thus FIG. 1 is also used.
  • a difference between the electronic component 10 and the electronic component 10 d lies in the shapes of the lead conductors 20 and 21 . More specifically, the widths of the lead conductors 20 , 21 of the electronic component 10 d in the y-axis direction are narrower than those of the electronic component 10 .
  • the widths of the lead conductors 20 , 21 are narrower, and thus areas of portions of the internal conductors 30 , 31 exposed at the multilayered body 11 are smaller. As a result, in the electronic component 10 d , the entering of moisture into the multilayered body 11 is prevented.
  • FIG. 16 is an internal plane view of the electronic component 10 e according to the sixth preferred embodiment.
  • the electronic component 10 e differs from the electronic component 10 in not having the lead conductors 23 and 25 .
  • the electronic component 10 e is mounted on the circuit substrate 51 in such a way that the side surface S 5 faces the circuit substrate 51 .
  • FIG. 17A and FIG. 17B are internal plane views of the electronic component 10 f according to the seventh preferred embodiment.
  • thicknesses of the external electrodes 12 a and 12 b in the side surfaces S 5 and S 6 may be made smaller than thicknesses of the external electrodes 12 a and 12 b in the end surfaces S 3 and S 4 .
  • the external electrode 12 may be manufactured by the following steps. First, an electrically conductive paste is applied on the end surfaces S 5 and S 6 of the multilayered body 11 by the use of a dip method to form underlayer electrodes. Then, the electrically conductive paste is baked at a temperature of about 700° C. to about 900° C., for example. Next, plating is performed on the underlayer electrodes and the lead conductors 22 - 25 to complete the external electrodes 12 . At this time, the external electrodes 12 on the side surfaces S 5 and S 6 are formed when the plating layer spreads toward surroundings of the lead electrodes 22 - 25 .
  • FIG. 18 is an exploded perspective view of the multilayered body 11 of the electronic component 10 g according to the eighth preferred embodiment.
  • FIG. 19A and FIG. 19B are internal plane views of the electronic component 10 g illustrated in FIG. 18 .
  • An external perspective view of the electronic component 10 g is the same as that of the electronic component 10 , and thus FIG. 1 is also used.
  • the electronic component 10 g includes, for example as illustrated in FIG. 1 , FIG. 18 , FIG. 19A and FIG. 19B , the multilayered body 11 , external electrodes 12 ( 12 a , 12 b ) and internal conductors 230 ( 230 a - 230 c ), 231 ( 231 a - 231 c ) (not shown in FIG. 1 ).
  • the multilayered body 11 has a substantially rectangular solid shape except corners and ridges that are chamfered and form roundish shapes.
  • the multilayered body 11 is constructed in such a way that a plurality of ceramic layers 17 ( 17 a - 17 g ) are stacked in order of appearance from the positive side to the negative side of the z-axis direction.
  • the plural internal conductors 230 a - 230 c are provided on the top surfaces of different ceramic layers 17 b , 17 d , 17 f , respectively, and embedded inside the multilayered body 11 .
  • the internal conductors 231 a and 231 b are provided on the top surfaces of different ceramic layers 17 c and 17 e , respectively, and embedded inside the multilayered body 11 .
  • the internal conductor 230 and the internal conductor 231 are stacked alternately in the z-axis direction.
  • the internal conductors 230 have capacitor conductors 218 ( 218 a - 218 c ) and lead conductors 220 ( 220 a - 220 c ), 222 ( 222 a - 222 c ) and 223 ( 223 a - 223 c ).
  • the capacitor conductors 218 a - 218 c have substantially rectangular shapes, and are provided on the top surfaces of different ceramic layers 17 b , 17 d , 17 f , respectively, in such a way that they do not touch external edges of the corresponding ceramic layers 17 b , 17 d , 17 f.
  • the lead conductors 220 a - 220 c are connected to the capacitor conductors 218 a - 218 c , respectively, and led to the end surface S 3 of the multilayered body 11 to be exposed at the end surface S 3 . More specifically, the lead conductor 220 protrudes toward the negative side of the x-axis direction from the shorter side of the capacitor conductor 218 at the negative side of the x-axis direction. Accordingly, the lead conductor 220 is led out to the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • the lead conductors 222 a - 222 c are connected to the capacitor conductors 218 a - 218 c , respectively, and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 . More specifically, the lead conductor 222 extends toward the positive side of the y-axis direction from a position at a further negative side of the x-axis direction than a middle point of the longer side of the capacitor conductor 218 at the positive side of the y-axis direction. Accordingly, the lead conductor 222 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction.
  • the lead conductors 223 a - 223 c are connected to the capacitor conductors 218 a - 218 c , respectively, and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 . More specifically, the lead conductor 223 extends toward the negative side of the y-axis direction from a position at a further negative side of the x-axis direction than a middle point of the longer side of the capacitor conductor 218 at the negative side of the y-axis direction. Accordingly, the lead conductor 223 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction.
  • the internal conductor 231 ( 231 a , 231 b ) includes a capacitor conductor 219 ( 219 a , 219 b ) and lead conductors 221 ( 221 a , 221 b ), 224 ( 224 a , 224 b ) and 225 ( 225 a , 225 b ).
  • the capacitor conductors 219 a and 219 b have substantially rectangular shapes, and are provided on the top surfaces of the ceramic layers 17 c and 17 e , respectively, in such a way that they do not touch external edges of the corresponding ceramic layers 17 c and 17 e .
  • the capacitor conductor 219 faces the capacitor conductor 218 over the ceramic layer 17 . Accordingly, capacitance (i.e., capacitor) is formed between the capacitor conductors 218 and 219 .
  • the lead conductors 221 a and 221 b are connected to the capacitor conductors 219 a and 219 b , respectively, and led to the side surface S 4 of the multilayered body 11 to be exposed at the side surface S 4 . More specifically, the lead conductor 221 protrudes toward the positive side of the x-axis direction from the shorter side of the capacitor conductor 219 at the positive side of the x-axis direction. Accordingly, the lead conductor 221 is led out to the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • the lead conductors 224 a and 224 b are connected to the capacitor conductors 219 a and 219 b , respectively, and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 . More specifically, the lead conductor 224 extends toward the positive side of the y-axis direction from a position at a further positive side of the x-axis direction than a middle point of the longer side of the capacitor conductor 219 at the positive side of the y-axis direction. Accordingly, the lead conductor 224 is led out to a position at a further positive side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. In other words, the lead conductor 224 is disposed at a further positive side of the x-axis direction than the lead conductor 222 in a plane viewed in the z-axis direction.
  • the lead conductors 225 a and 225 b are connected to the capacitor conductors 219 a and 219 b , respectively, and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 . More specifically, the lead conductor 225 extends toward the negative side of the y-axis direction from a position at a further positive side of the x-axis direction than a middle point of the longer side of the capacitor conductor 219 at the negative side of the y-axis direction. Accordingly, the lead conductor 225 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. In other words, the lead conductor 225 is disposed at a further positive side of the x-axis direction than the lead conductor 223 in a plane viewed in the z-axis direction.
  • the external electrode 12 a is arranged so as to straddle the end surface S 3 , the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 , and to connect with all the lead conductors 220 a - 220 c , 222 a - 222 c and 223 a - 223 c . More specifically, the external electrode 12 a covers the whole area of the end surface S 3 of the multilayered body 11 so as to cover portions of the lead conductors 220 a - 220 c exposed from the end surface S 3 . Furthermore, the external electrode 12 a is folded down from the end surface S 3 to the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 .
  • the external electrode 12 a further covers the side surfaces S 5 and S 6 of the multilayered body 11 so as to cover portions of the lead conductors 222 a - 222 c , 223 a - 223 c exposed from the side surfaces S 5 and S 6 .
  • the external electrode 12 b is arranged so as to straddle the end surface S 4 , the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 , and to connect with all the lead conductors 221 a , 221 b , 224 a , 224 b , 225 a and 225 b . More specifically, the external electrode 12 b covers the whole area of the end surface S 4 of the multilayered body 11 so as to cover portions of the lead conductors 221 a and 221 b exposed from the end surface S 4 . Furthermore, the external electrode 12 b is folded down from the end surface S 4 to the upper surface S 1 , the lower surface S 2 and the side surfaces S 5 , S 6 .
  • the external electrode 12 b further covers the side surfaces S 5 and S 6 of the multilayered body 11 so as to cover portions of the lead conductors 224 a , 224 b , 225 a and 225 b exposed from the side surfaces S 5 and S 6 .
  • the widths of the external electrode 12 a along the x-axis direction in the side surfaces S 5 and S 6 are wider than the widths of the external electrode 12 a along the x-axis direction in the upper surface S 1 and the lower surface S 2 .
  • the widths of the external electrode 12 b along the x-axis direction in the side surfaces S 5 and S 6 are wider than the widths of the external electrode 12 b along the x-axis direction in the upper surface S 1 and the lower surface S 2 .
  • the gaps D 1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S 5 and S 6 are smaller than the gap D 2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S 2 .
  • no external electrode that retains a different electrical potential from those of the external electrodes 12 a and 12 b is provided in between the external electrodes 12 a and 12 b .
  • FIG. 20 is a cross-sectional structure diagram of the substrate module 40 a.
  • the substrate module 40 a includes the electronic component 10 g and a circuit substrate 51 .
  • the circuit substrate 51 of FIG. 20 is the same as the circuit substrate 51 of FIG. 4A and FIG. 4B , and the description thereof is omitted.
  • the electronic component 10 g is mounted on the circuit substrate 51 . More specifically, the external electrode 12 a is connected to the signal conductor 54 by the solder 60 a . The external electrode 12 b is connected to the ground conductor 55 by the solder 60 b.
  • the insertion loss in the high frequency bands may be reduced in a similar way as in the electronic component 10 .
  • the possibility of a short-circuit may be reduced with the electronic component 10 g when mounting on the circuit substrate 51 .
  • the reduction of ESL may be achieved with the electronic component 10 g in a similar way as in the electronic component 10 .
  • the possibility of delamination may be reduced in a similar way as in the electronic component 10 .
  • the lead electrodes 220 and 221 are not exposed at the corners of the multilayered body 11 in a similar way as in the electronic component 10 . Accordingly, the moisture resistance of the electronic component 10 g may be improved.
  • FIG. 21A and FIG. 21B are internal plane views of the electronic component 10 h according to the ninth preferred embodiment.
  • An external perspective view of the electronic component 10 h is the same as that of the electronic component 10 , and thus FIG. 1 is also used.
  • a difference between the electronic component 10 g and the electronic component 10 h lies in whether or not there are lead electrodes 272 ( 272 a - 272 c ), 273 ( 273 a - 273 c ), 274 ( 274 a - 274 c ) and 275 ( 275 a , 275 b ).
  • the lead conductor 272 is connected to a connecting conductor 220 , and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 .
  • the lead conductor 272 is not in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • the lead conductor 273 is connected to a connecting conductor 220 , and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 .
  • the lead conductor 273 is not in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • the lead conductor 274 is connected to a connecting conductor 221 , and led to the side surface S 5 of the multilayered body 11 to be exposed at the side surface S 5 .
  • the lead conductor 274 is not in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • the lead conductor 275 is connected to a connecting conductor 221 , and led to the side surface S 6 of the multilayered body 11 to be exposed at the side surface S 6 .
  • the lead conductor 275 is not in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • the electronic component 10 h is provided with the lead conductors 272 - 275 , more electric current flow paths are available in the electronic component 10 h than the electronic component 10 g . As a result, in the electronic component 10 h , the reduction of ESL is achieved more effectively.
  • FIG. 22A and FIG. 22B are internal plane views of the electronic component 10 i according to the tenth preferred embodiment.
  • the electronic component 10 i differs from the electronic component 10 g in not having the lead conductors 223 and 225 .
  • the electronic component 10 i is mounted on the circuit substrate 51 in such a way that the side surface S 5 faces the circuit substrate 51 .
  • FIG. 23 is an external perspective view of the electronic component 10 j according to the eleventh preferred embodiment.
  • the external electrodes 12 a and the external electrodes 12 b each cover edges between the upper surface S 1 and the side surfaces S 5 , S 6 and edges between the lower surface S 2 and the side surfaces S 5 , S 6 .
  • the external electrodes 12 a and 12 b are folded down from the side surfaces S 5 and S 6 to the upper surface S 1 and the lower surface S 2 .
  • the y-axis direction widths of the folded-down portions of the external electrodes 12 a and 12 b , which are folded down on the upper surface S 1 and the lower surface S 2 do not exceed about one-quarter of the width of the multilayered body 11 along the y-axis direction. According to the above, the possibility of a short-circuit may be reduced when the electronic component 10 j is mounted on the circuit substrate 51 .
  • any one of the internal structures of the electronic components 10 , 10 a - 10 j may be adopted.
  • FIG. 24 is an external perspective view of the electronic component 10 k according to the twelfth preferred embodiment.
  • the gaps D 1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S 5 and S 6 may be set to equal to or approximately the same as the gap D 2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S 2 .
  • Preferred embodiments of the present invention are not limited to the electronic components 10 , 10 a - 10 k and the substrate modules 40 , 40 a described above, and modifications may be possible within the scope of the present invention.
  • a resin material such as epoxy resin, polypropylene, etc. may be used.
  • preferred embodiments of the present invention are useful for electronic components and substrate modules, and particularly valuable to significantly reduce the insertion loss in the high frequency bands.

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Ceramic Capacitors (AREA)

Abstract

A multilayered body includes capacitor conductors and an internal conductor, which together define a capacitor. A first external electrode is connected to one of the capacitor conductors via a set of lead electrodes. A second external electrode is connected to the other capacitor conductor via another set of lead electrodes. The internal conductor faces the capacitor conductors.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The present invention relates to an electronic component and a substrate module, and more particularly to an electronic component and a substrate module, which include a built-in capacitor.
  • 2. Description of the Related Art
  • As a related electronic component, for example, a multilayer ceramic capacitor disclosed in Japanese Unexamined Patent Application Publication No. 2000-306762 is known. FIG. 25 is a cross-sectional structure diagram of a multilayer ceramic capacitor 500 disclosed therein.
  • The multilayer ceramic capacitor 500 includes dielectric layers 502, internal electrode layers 504 a, 504 b and terminal electrodes 506 a, 506 b.
  • The dielectric layers 502 are stacked and form a multilayered body. The internal electrode layers 504 a and 504 b are included inside the multilayered body, and form a capacitor by facing each other over the dielectric layer 502. The internal electrode layers 504 a and 504 b are each led out to an opposite end surface of the multilayered body. The terminal electrodes 506 a and 506 b are each provided on the opposite end surface of the multilayered body, and connect to the internal electrode layers 504 a and 504 b, respectively.
  • With regard to the multilayer ceramic capacitor 500, there is a need to reduce the insertion loss in high frequency bands.
  • SUMMARY OF THE INVENTION
  • Preferred embodiments of the present invention provide an electronic component and a substrate module, which are significantly reduce insertion loss in high frequency bands.
  • According to a preferred embodiment of the present invention, an electronic component includes a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other; a plurality of first capacitor conductors each being provided on a different one of the dielectric layers; a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body; a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor; a plurality of second capacitor conductors each being provided on a different one of the dielectric layers; a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body; a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching the second lead conductor; a third capacitor conductor provided on the dielectric layer, the third capacitor conductor facing the first capacitor conductor and the second capacitor conductor over the dielectric layer; a first external electrode arranged so as to straddle the first end surface, the first side surface and a bottom surface of the multilayered body, the first external electrode connected to the plurality of first lead conductors and the plurality of third lead conductors; and a second external electrode arranged so as to straddle the second end surface, the first side surface and the bottom surface, the second external electrode connected to the plurality of second lead conductors and the plurality of fourth lead conductors.
  • According to another preferred embodiment of the present invention, an electronic component includes a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other; a plurality of first capacitor conductors each being provided on a different one of the dielectric layers; a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body; a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor; a plurality of second capacitor conductors each being provided on a different one of the dielectric layers and facing one of the first capacitor conductors over the dielectric layer; a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body; a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching the second lead conductor; a first external electrode arranged so as to straddle the first end surface, the first side surface and a bottom surface of the multilayered body, the first external electrode connected to the plurality of first lead conductors and the plurality of third lead conductors; and a second external electrode arranged so as to straddle the second end surface, the first side surface and the bottom surface, the second external electrode connected to the plurality of second lead conductors and the plurality of fourth lead conductors.
  • According to still another preferred embodiment of the present invention, a substrate module includes a circuit substrate including a first land and a second land; and an electronic component according to a preferred embodiment of the present invention described above mounted on the circuit substrate; wherein the first external electrode is connected to the first land; and the second external electrode is connected to the second land.
  • According to various preferred embodiments of the present invention, the insertion loss in the high frequency bands is significantly reduced.
  • The above and other elements, features, steps, characteristics and advantages of the present invention will become more apparent from the following detailed description of the preferred embodiments with reference to the attached drawings.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is an external perspective view of an electronic component according to a first preferred embodiment of the present invention.
  • FIG. 2 is an exploded perspective view of a multilayered body of the electronic component illustrated in FIG. 1.
  • FIG. 3A and FIG. 3B are internal plane views of the electronic component illustrated in FIG. 1.
  • FIG. 4A is a cross-sectional structure diagram of a substrate module, and FIG. 4B is a plane view of the substrate module viewed from the positive side of a Z-axis direction.
  • FIG. 5 is an equivalent circuit schematic of the substrate module illustrated in FIG. 4A and FIG. 4B.
  • FIG. 6 is an external perspective view of an electronic component to be used as a comparative example.
  • FIG. 7 is an exploded perspective view of a multilayered body of the electronic component to be used as a comparative example.
  • FIG. 8 is a graph representing insertion losses (S21) of a first sample and a second sample.
  • FIG. 9 is a graph representing insertion losses (S21) of a third sample and a fourth sample.
  • FIG. 10 is a graph representing insertion losses (S21) of a fifth sample and a sixth sample.
  • FIG. 11 is a graph representing insertion losses (S21) of a seventh sample and an eighth sample.
  • FIG. 12 is an internal plane view of an electronic component according to a second preferred embodiment of the present invention.
  • FIG. 13 is an internal plane view of an electronic component according to a third preferred embodiment of the present invention.
  • FIG. 14 is an internal plane view of an electronic component according to a fourth preferred embodiment of the present invention.
  • FIG. 15 is an internal plane view of an electronic component according to a fifth preferred embodiment of the present invention.
  • FIG. 16 is an internal plane view of an electronic component according to a sixth preferred embodiment of the present invention.
  • FIG. 17A and FIG. 17B are internal plane views of an electronic component according to a seventh preferred embodiment of the present invention.
  • FIG. 18 is an exploded perspective view of a multilayered body of an electronic component according to an eighth preferred embodiment of the present invention.
  • FIG. 19A and FIG. 19B are internal plane views of an electronic component of FIG. 18.
  • FIG. 20 is a cross-sectional structure diagram of a substrate module.
  • FIG. 21A and FIG. 21B are internal plane views of an electronic component according to a ninth preferred embodiment of the present invention.
  • FIG. 22A and FIG. 22B are internal plane views of an electronic component according to a tenth preferred embodiment of the present invention.
  • FIG. 23 is an external perspective view of an electronic component according to an eleventh preferred embodiment of the present invention.
  • FIG. 24 is an external perspective view of an electronic component according to a twelfth preferred embodiment of the present invention.
  • FIG. 25 is a cross-sectional structure diagram of the multilayer ceramic capacitor disclosed in Japanese Unexamined Patent Application Publication No. 2000-306762.
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • Preferred embodiments of an electronic component and a substrate module according to the present invention will be described below with reference to drawings.
  • First Preferred Embodiment
  • A structure of an electronic component according to the first preferred embodiment will be described with reference to drawings. FIG. 1 is an external perspective view of the electronic component 10 according to the first preferred embodiment. FIG. 2 is an exploded perspective view of a multilayered body 11 of the electronic component 10 illustrated in FIG. 1. FIG. 3A and FIG. 3B are internal plane views of the electronic component 10 illustrated in FIG. 1. Below, a stacking direction in the multilayered body 11 is defined as a Z-axis. An x-direction is defined as a direction in which a longer side of the multilayered body 11 extends in a plane view when the multilayered body 11 is viewed along the Z-axis direction. A y-direction is defined as a direction in which a shorter side of the multilayered body 11 extends in a plane view when the multilayered body 11 is viewed along the Z-axis direction.
  • The electronic component 10 is, for example, a chip capacitor and includes, for example as illustrated in FIG. 1 to FIG. 3A and FIG. 3B, the multilayered body 11, external electrodes 12 (12 a, 12 b) and internal conductors 30 (30 a-30 c), 31 (31 a-31 c), 32 (32 a, 32 b) (not shown in FIG. 1).
  • The multilayered body 11 preferably has a substantially rectangular solid shape except corners and ridges that are chamfered and define roundish shapes, for example. Below, in the multilayered body 11, a surface at the positive side of the z-axis direction is defined as an upper surface S1, and a surface at the negative side of the z-axis direction is defined as a lower surface S2. Furthermore, a surface at the negative side of the x-axis direction is defined as an end surface S3, and a surface at the positive side of the x-axis direction is defined as an end surface S4. Furthermore, a surface at the positive side of the y-axis direction is defined as a side surface S5, and a surface at the negative side of the y-axis direction is defined as a side surface S6.
  • As illustrated in FIG. 2, the multilayered body 11 is constructed in such a way that a plurality of ceramic layers 17 (17 a-17 g) are stacked in order of appearance from the positive side to the negative side of the z-axis direction. The ceramic layer 17 preferably has a substantially rectangular shape and is made of dielectric ceramic. Below, a principle surface of the ceramic layer 17 at the positive side of the z-axis direction is referred to as a top surface, and a principle surface of the ceramic layer 17 at the negative side of the z-axis direction is referred to as a back surface.
  • The upper surface S1 of the multilayered body 11 is constructed of the top surface of the ceramic layer 17 arranged at the most positive side of the z-axis direction. The lower surface S2 of the multilayered body 11 is constructed of the back surface of the ceramic layer 17 arranged at the most negative side of the z-axis direction. Furthermore, the end surface S3 is constructed of stacked shorter sides of the ceramic layers 17 a-17 g at the most negative side of the x-axis direction. The end surface S4 is constructed of stacked shorter sides of the ceramic layers 17 a-17 g at the most positive side of the x-axis direction. The side surface S5 is constructed of stacked longer sides of the ceramic layers 17 a-17 g at the most positive side of the y-axis direction. The side surface S6 is constructed of stacked longer sides of the ceramic layers 17 a-17 g at the most negative side of the y-axis direction.
  • As illustrated in FIG. 2 and FIG. 3A, the plural internal conductors 30 a-30 c, 31 a-31 c are provided on the top surfaces of the different ceramic layers 17 b, 17 d, 17 f, respectively, and embedded inside the multilayered body 11. Furthermore, as illustrated in FIG. 2 and FIG. 3B, the internal conductors 32 a and 32 b are provided on the top surfaces of the ceramic layers 17 c and 17 e, respectively, and embedded inside the multilayered body 11. In other words, the internal conductors 30, 31 and the internal conductors 32 are stacked alternately in the z-axis direction.
  • The internal conductor 30 (30 a-30 c) includes a capacitor conductor 18 (18 a-18 c) and lead conductors 20 (20 a-20 c), (22 a-22 c) and 23 (23 a-23 c). The capacitor conductors 18 a-18 c have substantially rectangular shapes, and are arranged on the top surfaces of different ceramic layers 17 b, 17 d, 17 f, respectively, such that they do not touch external edges of the corresponding ceramic layers 17 b, 17 d, 17 f. The capacitor conductor 18 is provided within an area of the ceramic layer 17, which is about one-half of the whole area of the ceramic layer 17 at the negative side of the x-axis direction.
  • The lead conductors 20 a-20 c are connected to the capacitor conductors 18 a-18 c, respectively, and led to the end surface S3 of the multilayered body 11 to be exposed at the end surface S3. More specifically, the lead conductor 20 protrudes toward the negative side of the x-axis direction from the longer side of the capacitor conductor 18 at the negative side of the x-axis direction. Accordingly, the lead conductor 20 is led out to the shorter side of the ceramic layer 17 at the negative side of the x-axis direction. The width of the lead conductor 20 in the y-axis direction is substantially the same as the width of the capacitor conductor 18 in the y-axis direction.
  • The lead conductors 22 a-22 c are connected to the capacitor conductors 18 a-18 c, respectively, and are led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. More specifically, the lead conductor 22 extends toward the positive side of the y-axis direction from an end at the positive side of the x-axis direction of the shorter side of the capacitor conductor 18 at the positive side of the y-axis direction. Accordingly, the lead conductor 22 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. The lead conductor 22 does not touch the lead conductor 20.
  • The lead conductors 23 a-23 c are connected to the corresponding capacitor conductors 18 a-18 c, respectively, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. More specifically, the lead conductor 23 extends toward the negative side of the y-axis direction from an end at the positive side of the x-axis direction of the shorter side of the capacitor conductor 18 at the negative side of the y-axis direction. Accordingly, the lead conductor 23 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. The lead conductor 23 does not touch the lead conductor 20.
  • The internal conductor 31 (31 a-31 c) includes a capacitor conductor 19 (19 a-19 c) and lead conductors 21 (21 a-21 c), (24 a-24 c) and 25 (25 a-25 c). The capacitor conductors 19 a-19 c have substantially rectangular shapes, and are arranged on the top surfaces of different ceramic layers 17 b, 17 d and 17 f such that they do not touch external edges of the corresponding ceramic layers 17 b, 17 d and 17 f. The capacitor conductor 19 is provided within an area of the ceramic layer 17, which is one-half of the whole area of the ceramic layer 17 at the positive side of the x-axis direction. The capacitor conductors 18 and 19 are provided on the same top surface of the ceramic layer 17, and face each other.
  • The lead conductors 21 a-21 c are connected to the corresponding capacitor conductors 19 a-19 c, respectively, and led to the end surface S4 of the multilayered body 11 to be exposed at the end surface S4. More specifically, the lead conductor 21 protrudes toward the positive side of the x-axis direction from the longer side of the capacitor conductor 19 at the positive side of the x-axis direction. Accordingly, the lead conductor 21 is led out to the shorter side of the ceramic layer 17 at the positive side of the x-axis direction. The width of the lead conductor 21 in the y-axis direction is substantially the same as the width of the capacitor conductor 19 in the y-axis direction.
  • The lead conductors 24 a-24 c are connected to the capacitor conductors 19 a-19 c, respectively, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. More specifically, the lead conductor 24 extends toward the positive side of the y-axis direction from an end at the negative side of the x-axis direction in the shorter side of the capacitor conductor 19 at the positive side of the y-axis direction. Accordingly, the lead conductor 24 is led out to a position at a further positive side of the x-axis direction than the middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. In other words, the lead conductor 24 is disposed at a further positive side of the x-axis direction than the lead conductor 22 in a plane viewed in the z-axis direction. The lead conductor 24 does not touch the lead conductor 21.
  • The lead conductors 25 a-25 c are connected to the capacitor conductors 19 a-19 c, respectively, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. More specifically, the lead conductor 25 extends toward the negative side of the y-axis direction from an end at the negative side of the x-axis direction of the shorter side of the capacitor conductor 19 at the negative side of the y-axis direction. Accordingly, the lead conductor 25 is led out to a position at a further positive side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. In other words, the lead conductor 25 is disposed at a further positive side of the x-axis direction than the lead conductor 23 in a plane viewed in the z-axis direction. The lead conductor 25 does not touch the lead conductor 21.
  • The internal conductors 32 a and 32 b have substantially rectangular shapes, and are arranged on the top surfaces of the ceramic layers 17 c and 17 e, respectively, such that they do not touch external edges of the corresponding ceramic layers 17 c and 17 e. The internal conductor 32 is provided on the top surface of the ceramic layer 17 that is different from the ceramic layer 17 in which the capacitor conductors 18 and 19 are provided, and faces the capacitor conductors 18 and 19 over the ceramic layer 17. As a result, capacitors are defined between the capacitor conductor 18 and the internal conductor 32 and between the capacitor conductor 19 and the internal conductor 32. The capacitor located between the capacitor conductor 18 and the internal conductor 32 is connected in series to the capacitor formed between the capacitor conductor 19 and the internal conductor 32.
  • The external electrode 12 a is arranged so as to straddle the end surface S3, the upper surface S1, the lower surface S2 and the side surfaces S5, S6, and to connect with all the lead conductors 20 a-20 c, 22 a-22 c and 23 a-23 c. More specifically, the external electrode 12 a covers the whole area of the end surface S3 of the multilayered body 11 so as to cover portions of the lead conductors 20 a-20 c exposed from the end surface S3. Furthermore, the external electrode 12 a is folded down from the end surface S3 to the upper surface S1, the lower surface S2 and the side surfaces S5, S6. The external electrode 12 a covers the side surfaces S5 and S6 of the multilayered body 11 so as to cover portions of the lead conductors 22 a-22 c, 23 a-23 c exposed from the side surfaces S5 and S6.
  • The external electrode 12 b is arranged so as to straddle the end surface S4, the upper surface S1, the lower surface S2 and the side surfaces S5, S6, and to connect with all the lead conductors 21 a-21 c, 24 a-24 c and 25 a-25 c. More specifically, the external electrode 12 b covers the whole area of the end surface S4 of the multilayered body 11 so as to cover portions of the lead conductors 21 a-21 c exposed from the end surface S4. Furthermore, the external electrode 12 b is folded down from the end surface S4 to the upper surface S1, the lower surface S2 and the side surfaces S5, S6. The external electrode 12 b covers the side surfaces S5 and S6 of the multilayered body 11 so as to cover portions of the lead conductors 24 a-24 c, 25 a-25 c exposed from the side surfaces S5 and S6.
  • Note that, as illustrated in FIG. 1, the widths of the external electrode 12 a along the x-axis direction in the side surfaces S5 and S6 are wider than the widths of the external electrode 12 a along the x-axis direction in the upper surface S1 and the lower surface S2. Similarly, the widths of the external electrode 12 b along the x-axis direction in the side surfaces S5 and S6 are wider than the widths of the external electrode 12 b along the x-axis direction in the upper surface S1 and the lower surface S2. According to the above, gaps D1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S5 and S6 are smaller than a gap D2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S2.
  • Furthermore, in the side surface S5 and S6, no external electrode that retains a different electrical potential from those of the external electrodes 12 a and 12 b is provided in between the external electrode 12 a and the external electrode 12 b. In other words, there is no external electrode provided between the external electrodes 12 a and 12 b.
  • A non-limiting example of a method for manufacturing the electronic component 10 is described. As the drawings, FIG. 1, FIG. 2, FIG. 3A and FIG. 3B are used.
  • First, BaTiO3, CaTiO3, SrTiO3 or CaZrO3, which is used as a primary component, and a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound or a rare earth compound, which is used as an accessory component, are weighed at a predetermined ratio and are then put in a ball mill, and wet mixing is performed. An obtained mixture is dried and pulverized. Then, an obtained powder is calcined. After a calcined powder is wet-pulverized by a ball mill, drying and pulverizing are performed to obtain a dielectric ceramic powder.
  • To this dielectric ceramic powder, an organic binder and an organic solvent are added, and mixing is then performed using a ball mill. An obtained ceramic slurry is formed into sheets on a carrier sheet by a doctor blade method. The sheets are then dried to form ceramic green sheets that are to be used as the ceramic layers 17. The thickness of the ceramic layer 17 after the firing is preferably about 0.5 μm to about 10 μm, for example.
  • Next, the internal conductors 30-32 are formed on the ceramic green sheets, which are to be formed into the ceramic layers 17, by applying a paste including a conductive material using a method such as a screen printing or a photolithographic method. As the paste including a conductive material, for example, a paste formed by adding an organic binder and an organic solvent to a metal powder may preferably be used. The metal powder may be, for example, Ni, Cu, Ag, Pd, Ag—Pd alloy, Au or the like. The thicknesses of the internal conductors 30-32 after the firing are preferably about 0.3 μm to about 2.0 μm, for example.
  • The ceramic green sheets that are to be formed into the ceramic layers 17 are stacked to obtain a non-fired mother multilayered body. Subsequently, pressure bonding is performed on the non-fired mother multilayered body by using a hydrostatic pressure press.
  • The non-fired mother multilayered body is cut to predetermined sizes to obtain a plurality of non-fired multilayered bodies 11. Subsequently, a barrel polishing process is performed on the surfaces of the multilayered body 11.
  • The non-fired multilayered body 11 is fired. As the firing temperature, for example, a temperature of about 900° C. to about 1,300° C., for example, is preferable. With the foregoing steps, the preparation of the multilayered body 11 is completed.
  • Next, the external electrode 12 is formed on the multilayered body 11. More specifically, an electrically conductive paste is applied on the surfaces of the multilayered body 11 by using a well-known dip method, a slit method or the like. The electrically conductive paste is then baked at a temperature of about 700° C. to about 900° C., for example, to produce an underlayer electrode of the external electrode 12. As a material for the electrically conductive paste, Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example. The thickness of the underlayer electrode is preferably about 10 μm to about 50 μm, for example. Next, plating is performed on the underlayer electrode to complete the external electrode 12. As a material for the plating, Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example. The plating may be repeated plural times to form layers of the plating on the underlayer electrode. With the foregoing steps, the electronic component 10 is completed.
  • A method for manufacturing the electronic component 10 is described. As the drawings, FIG. 1, FIG. 2, FIG. 3A and FIG. 3B are used.
  • First, BaTiO3, CaTiO3, SrTiO3 or CaZrO3, which is used as a primary component, and a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound or a rare earth compound, which is used as an accessory component, are weighed at a predetermined ratio and are then put in a ball mill, and wet mixing is performed. An obtained mixture is dried and pulverized. Then, an obtained powder is calcined. After a calcined powder is wet-pulverized by a ball mill, drying and pulverizing are performed to obtain a dielectric ceramic powder.
  • To this dielectric ceramic powder, an organic binder and an organic solvent are added, and mixing is then performed using a ball mill. An obtained ceramic slurry is formed into sheets on a carrier sheet by a doctor blade method. The sheets are then dried to form ceramic green sheets that are to be used as the ceramic layers 17. The thickness of the ceramic layer 17 after the firing is preferably about 0.5 μm to about 10 μm, for example.
  • Next, the internal conductors 30-32 are formed on the ceramic green sheets which are to be formed into the ceramic layers 17 by applying a paste including a conductive material using a method such as a screen printing or a photolithographic method. As the paste including a conductive material, for example, a paste formed by adding an organic binder and an organic solvent to a metal powder may preferably be used. The metal powder may be, for example, Ni, Cu, Ag, Pd, Ag—Pd alloy, Au or other suitable material. The thicknesses of the internal conductors 30-32 after the firing are preferably about 0.3 μm to about 2.0 μm, for example.
  • The ceramic green sheets that are to be formed into the ceramic layers 17 are stacked to obtain a non-fired mother multilayered body. Subsequently, pressure bonding is performed on the non-fired mother multilayered body by using a hydrostatic pressure press.
  • The non-fired mother multilayered body is cut to predetermined sizes to obtain a plurality of non-fired multilayered bodies 11. Subsequently, a barrel polishing process is performed on the surfaces of the multilayered body 11.
  • The non-fired multilayered body 11 is fired. As the firing temperature, for example, a temperature of about 900° C. to about 1,300° C., for example, is preferable. With the foregoing steps, the preparation of the multilayered body 11 is completed.
  • Next, the external electrode 12 is formed on the multilayered body 11. More specifically, an electrically conductive paste is applied on the surfaces of the multilayered body 11 by using a well-known dip method, a slit method or the like. The electrically conductive paste is then baked at a temperature of about 700° C. to about 900° C., for example, to produce an underlayer electrode of the external electrode 12. As a material for the electrically conductive paste, Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example. The thickness of the underlayer electrode is preferably about 10 μm to about 50 μm, for example. Next, plating is performed on the underlayer electrode to complete the external electrode 12. As a material for the plating, Cu, Ni, Ag, Pd, Ag—Pd alloy, Au or the like may be used, for example. The plating may be repeated plural times to form layers of the plating on the underlayer electrode. With the foregoing steps, the electronic component 10 is completed.
  • A substrate module 40 including the electronic component 10 is described with reference to the drawings. FIG. 4A is a cross-sectional structure diagram of the substrate module 40, and FIG. 4B is a plane view of the substrate module 40 viewed from the positive side of a Z-axis direction. FIG. 5 is an equivalent circuit schematic of the substrate module 40 of FIG. 4A and FIG. 4B.
  • As illustrated in FIG. 4A, the substrate module 40 includes the electronic component 10 and a circuit substrate 51. The circuit substrate 51 includes a substrate body 52, a signal conductor 54, a ground electrode 55, a via-hole conductor 56 and a ground conductor G.
  • The substrate body 52 is a multilayer substrate including a plurality of ceramic layers and conductor layers stacked on each other, and includes electronic circuitry on its principle surface and therein. The signal conductor 54 is provided on the principle surface of the substrate body 52 at the positive side of the z-axis direction, and extends in the y-axis direction as illustrated in FIG. 4B. On an end of the signal conductor 54 at the positive side of the y-axis direction, an input port P1 (not shown in the figure) is provided. On an end of the signal conductor 54 at the negative side of the y-axis direction, an output port P2 (not shown in the figure) is provided. The ground electrode 55 is provided on the principle surface of the circuit substrate 51 at the positive side of the z-axis direction, and has a substantially rectangular shape as illustrated in FIG. 4B.
  • The ground conductor G is provided in the substrate body 52 and kept at the ground potential. The ground conductor G connects to a ground port P3, which is not shown in the figure. The via-hole conductor 56 is provided in the substrate body 52, and connects to the ground electrode 55 and the ground conductor G. According to the above, the ground electrode 55 is also kept at the ground potential.
  • The electronic component 10 is mounted on the circuit substrate 51. More specifically, the external electrode 12 a is connected to the signal conductor 54 by a solder 60 a. Similarly, the external electrode 12 b is connected to the ground conductor 55 by a solder 60 b. Accordingly, the substrate module 40 has a circuit structure illustrated in FIG. 5. In other words, the signal conductor 54 connects the input port P1 and the output port P2, and the electronic component 10 is provided between the signal conductor 54 and the ground port P3. In FIG. 5, a capacitor C, a resistor R and an inductor L represent the capacitance, electrical resistance and inductance that the electronic component 10 has. Having the structure illustrated in FIG. 5 in the substrate module 40, a high frequency signal is input to the input port P1 and output from the output port P2. Furthermore, of the high frequency signal input from the input port P1, components of the high frequency signal equal to resonance frequencies of the electronic component 10 are output from the ground P3 and not output from the output port P2. Note that the circuitry structure of the substrate module 40 is not limited to that illustrated in FIG. 5. Alternatively, the electronic component 10 may be provided in between the input port P1 and the output port P2 in the substrate module 40.
  • According to the electronic component 10 described above, the insertion loss in high frequency bands may be reduced as described below. FIG. 6 is an external perspective view of an electronic component 110 to be used as a comparative example. FIG. 7 is an exploded perspective view of a multilayered body 111 of the electronic component 110 to be used as a comparative example. The comparative example electronic component 110 has the same structure as the electronic component 10 except that the lead electrodes 22-25 and the external electrodes 12 on the side surfaces S5, S6 are eliminated therefrom. Thus, in the electronic component 110, portions substantially similar or identical to those of the electronic component 10 are denoted by reference numerals that are produced by adding 100 to the corresponding reference numerals of the electronic component 10.
  • In the comparative example electronic component 110, a high frequency signal is input into the electronic component 110 from a signal conductor via an external electrode 112 a and output to a ground electrode via an external electrode 112 b. In this arrangement, the high frequency signal flows in the order of the signal conductor, the external electrode 112 a, a lead conductor 120, a capacitor conductor 118, an internal conductor 132, a capacitor conductor 119, a lead conductor 121, the external electrode 112 b and the ground electrode. In other words, in the comparative example electronic component 110, the high frequency signal passes through only one path.
  • On the other hand, in the electronic component 10, the high frequency signal is input into the electronic component 10 from the signal conductor 54 via the external electrode 12 a and output to the ground electrode 55 via the external electrode 12 b. In this arrangement, the following first to fifth paths may be available as paths through which the high frequency signal flows.
  • The first path is a path such that the high frequency signal flows in the order of the signal conductor 54, the external electrode 12 a, the lead conductor 20, the capacitor conductor 18, the internal conductor 32, the capacitor conductor 19, the lead conductor 21, the external electrode 12 b and the ground electrode 55. The second path is a path such that the high frequency signal flows in the order of the signal conductor 54, the external electrode 12 a, the lead conductor 20, the capacitor conductor 18, the lead conductors 22, 23, the external electrode 12 a, the external electrode 12 b and the ground electrode 55. The third path is a path such that the high frequency signal flows in the order of the signal conductor 54, the external electrode 12 a, the lead conductors 22, 23, the capacitor conductor 18, the internal conductor 32, the capacitor conductor 19, the lead conductor 21, the external electrode 12 b and the ground electrode 55. The fourth path is a path such that the high frequency signal flows in the order of the signal conductor 54, the external electrode 12 a, the lead conductors 22, 23, the capacitor conductor 18, the internal conductor 32, the capacitor conductor 19, the lead conductors 24, 25, the external electrode 12 b and the ground electrode 55. The fifth path is a path such that the high frequency signal flows in the order of the signal conductor 54, the external electrode 12 a, the external electrode 12 b and the ground electrode 55.
  • Note that, in the second to fifth paths, the high frequency signal flows from the external electrode 12 a to the external electrode 12 b by passing through inside the multilayered body 11 in between the external electrode 12 a and the external electrode 12 b. High frequency signals having frequencies higher than the first resonance point may flow through these paths.
  • Note that, to ensure the flow of the high frequency signals from the external electrode 12 a to the external electrode 12 b, it is preferable to have no external electrode, which retains a different electrical potential from those of the external electrodes 12 a, 12 b, in between the external electrode 12 a and the external electrode 12 b on the side surfaces S5, S6.
  • Furthermore, to ensure the flow of the high frequency signal from the external electrode 12 a to the external electrode 12 b, it is preferable that the gap between the external electrode 12 a and the external electrode 12 b may be made minimal, and more preferably about 50 μm to about 200 μm, for example.
  • As described in the above, in comparison with the electronic component 110, the electronic component 10 includes more paths, i.e., the second to fifth paths. That feature may contribute to the reduction of ESL. Furthermore, that feature may result the shifting of the first resonance point and the second resonance point in the electronic component 10 to higher frequency sides and the reduction of the insertion loss thereof in the high frequency bands, in comparison with the electronic component 110.
  • When the electronic component 10 and the electronic component 110 are compared, the shift width of the first resonance point tends to become larger in comparison with that of the second resonance point. This may be caused by having the second to fifth paths in the electronic component 10. In the electronic component 10 and the electronic component 110, the flow of high frequency signals having frequencies higher than the first resonance point may tend to concentrate in part close to the circuit substrate 51. This may provide a relatively small capacitor in a vicinity of the lower surface, and its resonance point may appeared as the second resonance point. In the electronic component 10, the large shifting of the second resonance point toward the higher frequency side may be caused by the particular reduction of ESL in a relatively small capacitor due to the high frequency signals flowing through the second to fifth paths.
  • Furthermore, when the electronic component 10 and the electronic component 110 are compared, a valley of the second resonance point in the electronic component 10 tends to be shallower.
  • The separation of the second resonance point from the first resonance point and the shallow valley at the second resonance point as described in the above may prevent a device, which operates at a frequency between the first resonance point and the second resonance point, from malfunctioning.
  • Furthermore, the possibility of a short-circuit may be reduced with the electronic component 10 when it is mounted on the circuit substrate 51. More specifically, the gaps D1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S5 and S6 are smaller than the gap D2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S2. In other words, the gap between the external electrode 12 a and the external electrode 12 b is made larger in the bottom surface S2. Thus, the risk of connecting the external electrode 12 a and the external electrode 12 b by solder is smaller. Accordingly, the possibility of a short-circuit may be reduced with the electronic component 10 when mounting on the circuit substrate 51.
  • With the electronic component 10, the possibility of delamination may be reduced. In electronic components, delamination is prone to occur at corners of multilayered body. Particularly, in the case where lead electrodes and ceramic layers are stacked at a corner, delamination may occur between a lead electrode and a ceramic layer. In view of the above, in the electronic component 10, the lead electrodes 20 and 21 are not led out to corners of the multilayered body 10. As a result, in the electronic component 10, the possibility of delamination is reduced. Furthermore, in the electronic component 10, the lead electrodes 20 and 21 are not exposed in the corners of the multilayered body 11. This improves moisture resistance of the electronic component 10.
  • The inventors of the present application carried out the following experiment to further clarify advantageous effects produced by the electronic component 10. Specifically, samples (hereinafter referred to as first sample, third sample, fifth sample and seventh sample) of the electronic component 10 illustrated in FIG. 1 and FIG. 2, and samples (second sample, fourth sample, sixth sample and eighth sample) of the electronic component 110 illustrated in FIG. 6 and FIG. 7 were prepared. Subsequently, the first to eighth samples were each mounted in a circuit substrate as illustrated in FIG. 4A and FIG. 4B, and ESL and the insertion loss (S21) between the input port P1 and the output port P2 were measured by using an network analyzer (Product No. 8722D manufactured by Agilent Technologies). First, the condition of each sample is described.
  • Dimension: 1.60 mm (L)×0.85 mm (W)×1.70 mm (T)
  • Material of the internal conductor and the external electrode: Cu
  • Relative permittivity (∈) of the ceramic layer: 27
  • Device thickness (gap between the internal conductors 30, 31): 122 μm
  • Outer layer's thickness (distance from the internal conductors 30 a, 31 a to the upper surface S1 of the multilayered body 11 and distance from the internal conductors 30 c, 31 c to the lower surface S2 of the multilayered body 11): 88 μm
  • Table 1 indicates the condition of each sample.
  • TABLE 1
    EXISTENCE OF
    EXTERNAL GAP BETWEEN
    ELECTRODE 12 AND CAPACITOR NUMBER OF
    LEAD CONDUCTORS CONDUCTOR 18, 19, INTERNAL
    22-25 ON SIDE 118, 119 AND INTERNAL CONDUCTORS CAPACITANCE
    SURFACES S5, S6 CONDUCTOR 32, 132 30-32, 130-132 (pF)
    FIRST SAMPLE YES 77 7 3.01
    SECOND SAMPLE NO 77 7 3.01
    THIRD SAMPLE YES 55 9 5.13
    FOURTH SAMPLE NO 55 9 5.13
    FIFTH SAMPLE YES 44 11 7.61
    SIXTH SAMPLE NO 44 11 7.61
    SEVENTH SAMPLE YES 33 15 13.8
    EIGHTH SAMPLE NO 33 15 13.8
  • With the first to eighth samples with the above conditions, the following ESL values were obtained. These ESL values were measured in the frequency band from 0.5-20 GHz. Table 2 indicates the ESL values of the first to eighth samples.
  • TABLE 2
    ESL (pH)
    FIRST SAMPLE 388
    SECOND SAMPLE 489
    THIRD SAMPLE 373
    FOURTH SAMPLE 480
    FIFTH SAMPLE 383
    SIXTH SAMPLE 489
    SEVENTH SAMPLE 363
    EIGHTH SAMPLE 459
  • According to this experiment, it is clear that the electronic component 10 had about 20% less ESL than the electronic component 110.
  • FIG. 8 is a graph representing the insertion loss (S21) of the first sample and the second sample. FIG. 9 is a graph representing the insertion loss (S21) of the third sample and the fourth sample. FIG. 10 is a graph representing the insertion loss (S21) of the fifth sample and the sixth sample. FIG. 11 is a graph representing the insertion loss (S21) of the seventh sample and the eighth sample. The vertical axis represents the insertion loss, and the horizontal axis represents the frequency.
  • According to FIG. 8 to FIG. 11, it is clear that the first resonance points f1 of the first sample, the third sample, the fifth sample and the seventh sample are higher than the corresponding first resonance points f1 of the second sample, the fourth sample, the sixth sample and the eighth sample, respectively. Table 3 indicates the first resonance points of the first to eighth samples.
  • TABLE 3
    SELF-RESONANT
    FREQUENCY (GHz)
    FIRST SAMPLE 4.66
    SECOND SAMPLE 4.15
    THIRD SAMPLE 3.64
    FOURTH SAMPLE 3.21
    FIFTH SAMPLE 2.95
    SIXTH SAMPLE 2.61
    SEVENTH SAMPLE 2.25
    EIGHTH SAMPLE 2.00
  • As described in the above, according to the experiment results illustrated in FIG. 8 to FIG. 11, it is clear that the first resonance point f1 of the electronic component 10 is higher than the first resonance point f1 of the electronic component 110. Accordingly, it is clear that the high frequency characteristic of the electronic component 10 is superior to that of the electronic component 110. More specifically, the first resonance point f1 of the electronic component 10 is about 10% higher than that of the electronic component 110.
  • Furthermore, according to the experimental results illustrated in FIG. 8 to FIG. 11, it is clear that the second resonance point f2 of the electronic component 10 is higher than that of the electronic component 110. For example, in the graph of FIG. 11, the second resonance point f2 of the eighth sample is about 8 GHz while the second resonance point f2 of the seventh sample is about 10 GHz. Furthermore, the insertion loss of the electronic component 10 at its second resonance point f2 is less than that of electronic component 110 at its second resonance point f2. Accordingly, with the electronic component 10, the insertion loss in the high frequency bands is significantly reduced.
  • Second Preferred Embodiment
  • A structure of an electronic component 10 a according to the second preferred embodiment will be described below with reference to drawings. FIG. 12 is an internal plane view of the electronic component 10 a according to the second preferred embodiment. An external perspective view of the electronic component 10 a is the same as that of the electronic component 10, and thus FIG. 1 is also used below.
  • A difference between the electronic component 10 and the electronic component 10 a lies in the shape of the internal conductors 30 and 31. More specifically, the internal conductors and 31 (capacitor conductors 18 and 19) of the electronic component 10 a are closer to each other than those of the electronic component 10. According to the above, in the electronic component 10 a, areas of portions where the capacitor conductors 18, 19 are facing to the internal conductor 32 are larger than corresponding areas of the electronic component 10. Accordingly, the electronic component 10 a has a significantly larger capacitance.
  • Third Preferred Embodiment
  • A structure of an electronic component 10 b according to the third preferred embodiment will be described below with reference to drawings. FIG. 13 is an internal plane view of the electronic component 10 b according to the third preferred embodiment. An external perspective view of the electronic component 10 b is the same as that of the electronic component 10, and thus FIG. 1 is also used below.
  • A difference between the electronic component 10 and the electronic component 10 b lies in whether or not there are lead electrodes 72 (72 a-72 c), 73 (73 a-73 c), 74 (74 a-74 c) and 75 (75 a-75 c).
  • The lead conductor 72 is connected to a connecting conductor 20, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. The lead conductor 72 is in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction. Accordingly, the lead conductor 72 connects to the external electrode 12 a at the longer side at the positive side of the y-axis direction and the shorter side at the negative side of the x-axis direction of the ceramic layer 17.
  • The lead conductor 73 is connected to a connecting conductor 20, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. The lead conductor 73 is in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction. Accordingly, the lead conductor 73 connects to the external electrode 12 a at the longer side at the negative side of the y-axis direction and the shorter side at the negative side of the x-axis direction of the ceramic layer 17.
  • The lead conductor 74 is connected to a connecting conductor 21, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. The lead conductor 74 is in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction. Accordingly, the lead conductor 74 connects to the external electrode 12 b at the longer side at the positive side of the y-axis direction and the shorter side at the positive side of the x-axis direction of the ceramic layer 17.
  • The lead conductor 75 is connected to a connecting conductor 21, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. The lead conductor 75 is in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction. Accordingly, the lead conductor 75 is connected to the external electrode 12 b at the longer side at the negative side of the y-axis direction and the shorter side at the positive side of the x-axis direction of the ceramic layer 17.
  • Since the electronic component 10 b is provided with the lead conductors 72-75, more electric current flow paths are available in the electronic component 10 b than the electronic component 10. As a result, in the electronic component 10 b, the reduction of ESL is achieved more effectively.
  • Fourth Preferred Embodiment
  • A structure of an electronic component 10 c according to the fourth preferred embodiment will be described below with reference to drawings. FIG. 14 is an internal plane view of the electronic component 10 c according to the fourth preferred embodiment. An external perspective view of the electronic component 10 c is the same as that of the electronic component 10, and thus FIG. 1 is also used.
  • A difference between the electronic component 10 and the electronic component 10 c lies in positions of the lead electrodes 72 (72 a-72 c), 73 (73 a-73 c), 74 (74 a-74 c) and 75 (75 a-75 c). More specifically, in the electronic component 10 c, none of the lead conductors 72-75 is in contact with the shorter sides of the ceramic layer 17 at the positive and negative sides of the x-axis direction. In other words, in the corners of the ceramic layer 17, none of the lead conductors 72-75 are provided.
  • In the electronic component 10 c, none of the lead conductors 72-75 is provided in the corner of the multilayered body 11. Accordingly, the possibility of delamination is significantly reduced.
  • Fifth Preferred Embodiment
  • A structure of an electronic component 10 d according to the fifth preferred embodiment will be described below with reference to drawings. FIG. 15 is an internal plane view of the electronic component 10 d according to the fifth preferred embodiment. An external perspective view of the electronic component 10 d is the same as that of the electronic component 10, and thus FIG. 1 is also used.
  • A difference between the electronic component 10 and the electronic component 10 d lies in the shapes of the lead conductors 20 and 21. More specifically, the widths of the lead conductors 20, 21 of the electronic component 10 d in the y-axis direction are narrower than those of the electronic component 10.
  • In the electronic component 10 d, the widths of the lead conductors 20, 21 are narrower, and thus areas of portions of the internal conductors 30, 31 exposed at the multilayered body 11 are smaller. As a result, in the electronic component 10 d, the entering of moisture into the multilayered body 11 is prevented.
  • Sixth Preferred Embodiment
  • A structure of an electronic component 10 e according to the sixth preferred embodiment will be described below with reference to drawings. FIG. 16 is an internal plane view of the electronic component 10 e according to the sixth preferred embodiment.
  • As illustrated in FIG. 16, the electronic component 10 e differs from the electronic component 10 in not having the lead conductors 23 and 25. In this preferred embodiment, the electronic component 10 e is mounted on the circuit substrate 51 in such a way that the side surface S5 faces the circuit substrate 51.
  • Seventh Preferred Embodiment
  • An electronic component 10 f according to the seventh preferred embodiment will be described below with reference to drawings. FIG. 17A and FIG. 17B are internal plane views of the electronic component 10 f according to the seventh preferred embodiment.
  • As illustrated in FIG. 17A and FIG. 17B, thicknesses of the external electrodes 12 a and 12 b in the side surfaces S5 and S6 may be made smaller than thicknesses of the external electrodes 12 a and 12 b in the end surfaces S3 and S4.
  • The external electrode 12 may be manufactured by the following steps. First, an electrically conductive paste is applied on the end surfaces S5 and S6 of the multilayered body 11 by the use of a dip method to form underlayer electrodes. Then, the electrically conductive paste is baked at a temperature of about 700° C. to about 900° C., for example. Next, plating is performed on the underlayer electrodes and the lead conductors 22-25 to complete the external electrodes 12. At this time, the external electrodes 12 on the side surfaces S5 and S6 are formed when the plating layer spreads toward surroundings of the lead electrodes 22-25.
  • Eighth Preferred Embodiment
  • An electronic component 10 g according to the eighth preferred embodiment will be described below with reference to drawings. FIG. 18 is an exploded perspective view of the multilayered body 11 of the electronic component 10 g according to the eighth preferred embodiment. FIG. 19A and FIG. 19B are internal plane views of the electronic component 10 g illustrated in FIG. 18. An external perspective view of the electronic component 10 g is the same as that of the electronic component 10, and thus FIG. 1 is also used.
  • The electronic component 10 g includes, for example as illustrated in FIG. 1, FIG. 18, FIG. 19A and FIG. 19B, the multilayered body 11, external electrodes 12 (12 a, 12 b) and internal conductors 230 (230 a-230 c), 231 (231 a-231 c) (not shown in FIG. 1).
  • The multilayered body 11 has a substantially rectangular solid shape except corners and ridges that are chamfered and form roundish shapes.
  • As illustrated in FIG. 18, the multilayered body 11 is constructed in such a way that a plurality of ceramic layers 17 (17 a-17 g) are stacked in order of appearance from the positive side to the negative side of the z-axis direction.
  • As illustrated in FIG. 18 and FIG. 19A, the plural internal conductors 230 a-230 c are provided on the top surfaces of different ceramic layers 17 b, 17 d, 17 f, respectively, and embedded inside the multilayered body 11. The internal conductors 231 a and 231 b are provided on the top surfaces of different ceramic layers 17 c and 17 e, respectively, and embedded inside the multilayered body 11. In other words, the internal conductor 230 and the internal conductor 231 are stacked alternately in the z-axis direction.
  • The internal conductors 230 (230 a-230 c) have capacitor conductors 218 (218 a-218 c) and lead conductors 220 (220 a-220 c), 222 (222 a-222 c) and 223 (223 a-223 c). The capacitor conductors 218 a-218 c have substantially rectangular shapes, and are provided on the top surfaces of different ceramic layers 17 b, 17 d, 17 f, respectively, in such a way that they do not touch external edges of the corresponding ceramic layers 17 b, 17 d, 17 f.
  • The lead conductors 220 a-220 c are connected to the capacitor conductors 218 a-218 c, respectively, and led to the end surface S3 of the multilayered body 11 to be exposed at the end surface S3. More specifically, the lead conductor 220 protrudes toward the negative side of the x-axis direction from the shorter side of the capacitor conductor 218 at the negative side of the x-axis direction. Accordingly, the lead conductor 220 is led out to the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • The lead conductors 222 a-222 c are connected to the capacitor conductors 218 a-218 c, respectively, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. More specifically, the lead conductor 222 extends toward the positive side of the y-axis direction from a position at a further negative side of the x-axis direction than a middle point of the longer side of the capacitor conductor 218 at the positive side of the y-axis direction. Accordingly, the lead conductor 222 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction.
  • The lead conductors 223 a-223 c are connected to the capacitor conductors 218 a-218 c, respectively, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. More specifically, the lead conductor 223 extends toward the negative side of the y-axis direction from a position at a further negative side of the x-axis direction than a middle point of the longer side of the capacitor conductor 218 at the negative side of the y-axis direction. Accordingly, the lead conductor 223 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction.
  • The internal conductor 231 (231 a, 231 b) includes a capacitor conductor 219 (219 a, 219 b) and lead conductors 221 (221 a, 221 b), 224 (224 a, 224 b) and 225 (225 a, 225 b). The capacitor conductors 219 a and 219 b have substantially rectangular shapes, and are provided on the top surfaces of the ceramic layers 17 c and 17 e, respectively, in such a way that they do not touch external edges of the corresponding ceramic layers 17 c and 17 e. Furthermore, the capacitor conductor 219 faces the capacitor conductor 218 over the ceramic layer 17. Accordingly, capacitance (i.e., capacitor) is formed between the capacitor conductors 218 and 219.
  • The lead conductors 221 a and 221 b are connected to the capacitor conductors 219 a and 219 b, respectively, and led to the side surface S4 of the multilayered body 11 to be exposed at the side surface S4. More specifically, the lead conductor 221 protrudes toward the positive side of the x-axis direction from the shorter side of the capacitor conductor 219 at the positive side of the x-axis direction. Accordingly, the lead conductor 221 is led out to the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • The lead conductors 224 a and 224 b are connected to the capacitor conductors 219 a and 219 b, respectively, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. More specifically, the lead conductor 224 extends toward the positive side of the y-axis direction from a position at a further positive side of the x-axis direction than a middle point of the longer side of the capacitor conductor 219 at the positive side of the y-axis direction. Accordingly, the lead conductor 224 is led out to a position at a further positive side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the positive side of the y-axis direction. In other words, the lead conductor 224 is disposed at a further positive side of the x-axis direction than the lead conductor 222 in a plane viewed in the z-axis direction.
  • The lead conductors 225 a and 225 b are connected to the capacitor conductors 219 a and 219 b, respectively, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. More specifically, the lead conductor 225 extends toward the negative side of the y-axis direction from a position at a further positive side of the x-axis direction than a middle point of the longer side of the capacitor conductor 219 at the negative side of the y-axis direction. Accordingly, the lead conductor 225 is led out to a position at a further negative side of the x-axis direction than a middle point of the longer side of the ceramic layer 17 at the negative side of the y-axis direction. In other words, the lead conductor 225 is disposed at a further positive side of the x-axis direction than the lead conductor 223 in a plane viewed in the z-axis direction.
  • The external electrode 12 a is arranged so as to straddle the end surface S3, the upper surface S1, the lower surface S2 and the side surfaces S5, S6, and to connect with all the lead conductors 220 a-220 c, 222 a-222 c and 223 a-223 c. More specifically, the external electrode 12 a covers the whole area of the end surface S3 of the multilayered body 11 so as to cover portions of the lead conductors 220 a-220 c exposed from the end surface S3. Furthermore, the external electrode 12 a is folded down from the end surface S3 to the upper surface S1, the lower surface S2 and the side surfaces S5, S6. The external electrode 12 a further covers the side surfaces S5 and S6 of the multilayered body 11 so as to cover portions of the lead conductors 222 a-222 c, 223 a-223 c exposed from the side surfaces S5 and S6.
  • The external electrode 12 b is arranged so as to straddle the end surface S4, the upper surface S1, the lower surface S2 and the side surfaces S5, S6, and to connect with all the lead conductors 221 a, 221 b, 224 a, 224 b, 225 a and 225 b. More specifically, the external electrode 12 b covers the whole area of the end surface S4 of the multilayered body 11 so as to cover portions of the lead conductors 221 a and 221 b exposed from the end surface S4. Furthermore, the external electrode 12 b is folded down from the end surface S4 to the upper surface S1, the lower surface S2 and the side surfaces S5, S6. The external electrode 12 b further covers the side surfaces S5 and S6 of the multilayered body 11 so as to cover portions of the lead conductors 224 a, 224 b, 225 a and 225 b exposed from the side surfaces S5 and S6.
  • Note that, as illustrated in FIG. 1, the widths of the external electrode 12 a along the x-axis direction in the side surfaces S5 and S6 are wider than the widths of the external electrode 12 a along the x-axis direction in the upper surface S1 and the lower surface S2. Similarly, the widths of the external electrode 12 b along the x-axis direction in the side surfaces S5 and S6 are wider than the widths of the external electrode 12 b along the x-axis direction in the upper surface S1 and the lower surface S2. According to the above, the gaps D1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S5 and S6 are smaller than the gap D2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S2.
  • Furthermore, in the side surface S5 and S6, no external electrode that retains a different electrical potential from those of the external electrodes 12 a and 12 b is provided in between the external electrodes 12 a and 12 b. In other words, there is no external electrode provided between the external electrodes 12 a and 12 b.
  • A substrate module 40 a on which the electronic component 10 g is mounted is described with reference to the drawings. FIG. 20 is a cross-sectional structure diagram of the substrate module 40 a.
  • As illustrated in FIG. 20, the substrate module 40 a includes the electronic component 10 g and a circuit substrate 51. The circuit substrate 51 of FIG. 20 is the same as the circuit substrate 51 of FIG. 4A and FIG. 4B, and the description thereof is omitted.
  • The electronic component 10 g is mounted on the circuit substrate 51. More specifically, the external electrode 12 a is connected to the signal conductor 54 by the solder 60 a. The external electrode 12 b is connected to the ground conductor 55 by the solder 60 b.
  • According to the aforementioned electronic component 10 g, the insertion loss in the high frequency bands may be reduced in a similar way as in the electronic component 10. Furthermore, in a similar way as in the electronic component 10, the possibility of a short-circuit may be reduced with the electronic component 10 g when mounting on the circuit substrate 51. Furthermore, the reduction of ESL may be achieved with the electronic component 10 g in a similar way as in the electronic component 10. Furthermore, in the electronic component 10 g, the possibility of delamination may be reduced in a similar way as in the electronic component 10. Furthermore, in the electronic component 10 g, the lead electrodes 220 and 221 are not exposed at the corners of the multilayered body 11 in a similar way as in the electronic component 10. Accordingly, the moisture resistance of the electronic component 10 g may be improved.
  • Ninth Preferred Embodiment
  • A structure of an electronic component 10 h according to the ninth preferred embodiment will be described below with reference to drawings. FIG. 21A and FIG. 21B are internal plane views of the electronic component 10 h according to the ninth preferred embodiment. An external perspective view of the electronic component 10 h is the same as that of the electronic component 10, and thus FIG. 1 is also used.
  • A difference between the electronic component 10 g and the electronic component 10 h lies in whether or not there are lead electrodes 272 (272 a-272 c), 273 (273 a-273 c), 274 (274 a-274 c) and 275 (275 a, 275 b).
  • The lead conductor 272 is connected to a connecting conductor 220, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. The lead conductor 272 is not in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • The lead conductor 273 is connected to a connecting conductor 220, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. The lead conductor 273 is not in contact with the shorter side of the ceramic layer 17 at the negative side of the x-axis direction.
  • The lead conductor 274 is connected to a connecting conductor 221, and led to the side surface S5 of the multilayered body 11 to be exposed at the side surface S5. The lead conductor 274 is not in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • The lead conductor 275 is connected to a connecting conductor 221, and led to the side surface S6 of the multilayered body 11 to be exposed at the side surface S6. The lead conductor 275 is not in contact with the shorter side of the ceramic layer 17 at the positive side of the x-axis direction.
  • Since the electronic component 10 h is provided with the lead conductors 272-275, more electric current flow paths are available in the electronic component 10 h than the electronic component 10 g. As a result, in the electronic component 10 h, the reduction of ESL is achieved more effectively.
  • Tenth Preferred Embodiment
  • A structure of an electronic component 10 i according to the tenth preferred embodiment will be described below with reference to drawings. FIG. 22A and FIG. 22B are internal plane views of the electronic component 10 i according to the tenth preferred embodiment.
  • As illustrated in FIG. 22A and FIG. 22B, the electronic component 10 i differs from the electronic component 10 g in not having the lead conductors 223 and 225. In this preferred embodiment, the electronic component 10 i is mounted on the circuit substrate 51 in such a way that the side surface S5 faces the circuit substrate 51.
  • Eleventh Preferred Embodiment
  • A structure of an electronic component 10 j according to the eleventh preferred embodiment will be described below with reference to drawings. FIG. 23 is an external perspective view of the electronic component 10 j according to the eleventh preferred embodiment.
  • In the electronic component 10 j, the external electrodes 12 a and the external electrodes 12 b each cover edges between the upper surface S1 and the side surfaces S5, S6 and edges between the lower surface S2 and the side surfaces S5, S6. In other words, the external electrodes 12 a and 12 b are folded down from the side surfaces S5 and S6 to the upper surface S1 and the lower surface S2.
  • Note, however, that it is preferable that the y-axis direction widths of the folded-down portions of the external electrodes 12 a and 12 b, which are folded down on the upper surface S1 and the lower surface S2, do not exceed about one-quarter of the width of the multilayered body 11 along the y-axis direction. According to the above, the possibility of a short-circuit may be reduced when the electronic component 10 j is mounted on the circuit substrate 51.
  • With regard to the internal structure of the electronic component 10 j, any one of the internal structures of the electronic components 10, 10 a-10 j may be adopted.
  • Twelfth Preferred Embodiment
  • A structure of an electronic component 10 k according to the twelfth preferred embodiment will be described below with reference to drawings. FIG. 24 is an external perspective view of the electronic component 10 k according to the twelfth preferred embodiment.
  • As illustrated in FIG. 24, the gaps D1 between the external electrode 12 a and the external electrode 12 b in the side surfaces S5 and S6 may be set to equal to or approximately the same as the gap D2 between the external electrode 12 a and the external electrode 12 b in the bottom surface S2.
  • Other Preferred Embodiments
  • Preferred embodiments of the present invention are not limited to the electronic components 10, 10 a-10 k and the substrate modules 40, 40 a described above, and modifications may be possible within the scope of the present invention.
  • For example, in place of the ceramic layer 17, a resin material such as epoxy resin, polypropylene, etc. may be used.
  • As mentioned in the above, preferred embodiments of the present invention are useful for electronic components and substrate modules, and particularly valuable to significantly reduce the insertion loss in the high frequency bands.
  • While preferred embodiments of the present invention have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing from the scope and spirit of the present invention. The scope of the present invention, therefore, is to be determined solely by the following claims.

Claims (10)

1. An electronic component comprising:
a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other;
a plurality of first capacitor conductors each being provided on a different one of the dielectric layers;
a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body;
a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor;
a plurality of second capacitor conductors each being provided on a different one of the dielectric layers;
a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body;
a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching the second lead conductor;
a third capacitor conductor provided on the dielectric layer, the third capacitor conductor facing the first capacitor conductor and the second capacitor conductor over the dielectric layer;
a first external electrode arranged so as to straddle the first end surface, the first side surface and a bottom surface of the multilayered body, the first external electrode connected to the plurality of first lead conductors and the plurality of third lead conductors; and
a second external electrode arranged so as to straddle the second end surface, the first side surface and the bottom surface, the second external electrode connected to the plurality of second lead conductors and the plurality of fourth lead conductors.
2. The electronic component according to claim 1, wherein a gap between the first external electrode and the second external electrode in the side surface is smaller than a gap between the first external electrode and the second external electrode in the bottom surface.
3. The electronic component according to claim 1, wherein no external electrode that retains an electrical potential is provided in between the first external electrode and the second external electrode in the first side surface, the electrical potential being different from an electrical potential of the first external electrode and an electrical potential of the second external electrode.
4. The electronic component according to claim 1, further comprising:
a plurality of fifth lead conductors each connected to the first capacitor conductor and being led out to a second side surface of the multilayered body; and
a plurality of sixth lead conductors each connected to the second capacitor conductor and being led out to the second side surface; wherein
the first external electrode is arranged so as to straddle the first end surface, the first side surface, the second side surface and the bottom surface, and is connected to the plurality of fifth lead conductors; and
the second external electrode is arranged so as to straddle the second end surface, the first side surface, the second side surface and the bottom surface, and is connected to the plurality of sixth lead conductors.
5. A substrate module comprising:
a circuit substrate including a first land and a second land; and
the electronic component according to claim 1, the electronic component being mounted on the circuit substrate; wherein
the first external electrode is connected to the first land; and
the second external electrode is connected to the second land.
6. An electronic component comprising:
a multilayered body having a substantially rectangular solid shape and including a plurality of dielectric layers stacked on each other;
a plurality of first capacitor conductors each being provided on a different one of the dielectric layers;
a plurality of first lead conductors each connected to the first capacitor conductor and being led out to a first end surface of the multilayered body;
a plurality of third lead conductors each connected to the first capacitor conductor and being led out to a first side surface of the multilayered body, the third lead conductor not touching the first lead conductor;
a plurality of second capacitor conductors each being provided on a different one of the dielectric layers and facing one of the first capacitor conductors over the dielectric layer;
a plurality of second lead conductors each connected to the second capacitor conductor and being led out to a second end surface of the multilayered body;
a plurality of fourth lead conductors each connected to the second capacitor conductor and being led out to the first side surface, the fourth lead conductor not touching the second lead conductor;
a first external electrode arranged so as to straddle the first end surface, the first side surface and a bottom surface of the multilayered body, the first external electrode connected to the plurality of first lead conductors and the plurality of third lead conductors; and
a second external electrode arranged so as to straddle the second end surface, the first side surface and the bottom surface, the second external electrode connected to the plurality of second lead conductors and the plurality of fourth lead conductors.
7. The electronic component according to claim 6, wherein a gap between the first external electrode and the second external electrode in the side surface is smaller than a gap between the first external electrode and the second external electrode in the bottom surface.
8. The electronic component according to claim 6, wherein no external electrode that retains an electrical potential is provided in between the first external electrode and the second external electrode in the first side surface, the electrical potential being different from an electrical potential of the first external electrode and an electrical potential of the second external electrode.
9. The electronic component according to claim 6, further comprising:
a plurality of fifth lead conductors each connected to the first capacitor conductor and being led out to a second side surface of the multilayered body; and
a plurality of sixth lead conductors each connected to the second capacitor conductor and being led out to the second side surface; wherein
the first external electrode is arranged so as to straddle the first end surface, the first side surface, the second side surface and the bottom surface, and is connected to the plurality of fifth lead conductors; and
the second external electrode is arranged so as to straddle the second end surface, the first side surface, the second side surface and the bottom surface, and is connected to the plurality of sixth lead conductors.
10. A substrate module comprising:
a circuit substrate including a first land and a second land; and
the electronic component according to claim 6, the electronic component being mounted on the circuit substrate; wherein
the first external electrode is connected to the first land; and
the second external electrode is connected to the second land.
US13/359,520 2011-01-28 2012-01-27 Electronic component and substrate module Active 2032-03-25 US8576538B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011-016824 2011-01-28
JP2011016824A JP5353911B2 (en) 2011-01-28 2011-01-28 Electronic components and board modules

Publications (2)

Publication Number Publication Date
US20120194963A1 true US20120194963A1 (en) 2012-08-02
US8576538B2 US8576538B2 (en) 2013-11-05

Family

ID=46563035

Family Applications (1)

Application Number Title Priority Date Filing Date
US13/359,520 Active 2032-03-25 US8576538B2 (en) 2011-01-28 2012-01-27 Electronic component and substrate module

Country Status (3)

Country Link
US (1) US8576538B2 (en)
JP (1) JP5353911B2 (en)
CN (1) CN102623179A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150310994A1 (en) * 2013-01-22 2015-10-29 Murata Manufacturing Co., Ltd. Lc composite component
US9226401B2 (en) 2013-08-30 2015-12-29 Samsung Electro-Mechanics Co., Ltd. Multilayer ceramic electronic part to be embedded in board and printed circuit board having multilayer ceramic electronic part embedded therein
US20160099106A1 (en) * 2014-10-07 2016-04-07 Murata Manufacturing Co., Ltd. Ceramic electronic component
US9431174B2 (en) 2012-11-21 2016-08-30 Tdk Corporation Multilayer capacitor
US10121596B2 (en) 2015-12-11 2018-11-06 Murata Manufacturing Co., Ltd. Multilayer ceramic capacitor

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5811114B2 (en) * 2013-02-28 2015-11-11 株式会社村田製作所 Electronic components
KR101452126B1 (en) * 2013-08-08 2014-10-16 삼성전기주식회사 Embedded multilayer ceramic electronic part and print circuit board having embedded multilayer ceramic electronic part
JP7051283B2 (en) * 2016-10-17 2022-04-11 太陽誘電株式会社 Multilayer ceramic capacitors
US11031183B2 (en) 2018-03-06 2021-06-08 Avx Corporation Multilayer ceramic capacitor having ultra-broadband performance
CN114709075A (en) 2018-03-06 2022-07-05 京瓷Avx元器件公司 Multilayer ceramic capacitor with ultra-wideband performance
DE112020000563T5 (en) 2019-01-28 2021-10-28 Avx Corporation Multi-layer ceramic capacitor with ultra broadband performance
US11270842B2 (en) 2019-01-28 2022-03-08 KYOCERA AVX Components Corporation Multilayer ceramic capacitor having ultra-broadband performance
WO2020159809A1 (en) 2019-01-28 2020-08-06 Avx Corporation Multilayer ceramic capacitor having ultra-broadband performance
KR20210098546A (en) 2019-01-28 2021-08-10 에이브이엑스 코포레이션 Multilayer Ceramic Capacitors with Ultra-Wideband Performance
JP7446318B2 (en) 2019-01-28 2024-03-08 キョーセラ・エイブイエックス・コンポーネンツ・コーポレーション Multilayer ceramic capacitor with ultra-wideband performance
US11705280B2 (en) 2019-04-25 2023-07-18 KYOCERA AVX Components Corporation Multilayer capacitor having open mode electrode configuration and flexible terminations

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6191932B1 (en) * 1998-05-21 2001-02-20 Murata Manfacturing Co., Ltd. Monolithic capacitor
US6331930B1 (en) * 1999-05-10 2001-12-18 Murata Manufacturing Co., Ltd. Multilayer capacitor, electronic device and high frequency circuit using the same
US6519134B1 (en) * 2000-07-19 2003-02-11 Intel Corporation Universal capacitor terminal design
US7046500B2 (en) * 2004-07-20 2006-05-16 Samsung Electro-Mechanics Co., Ltd. Laminated ceramic capacitor
US7339781B2 (en) * 2005-02-28 2008-03-04 Tdk Corporation Electronic component and electronic device
US7411776B2 (en) * 2006-07-12 2008-08-12 Tdk Corporation Multilayer capacitor array
US7558049B1 (en) * 2007-12-20 2009-07-07 Tdk Corporation Multilayer capacitor array
US7710710B2 (en) * 2004-03-01 2010-05-04 Epcos Ag Electrical component and circuit configuration with the electrical component
US7995325B2 (en) * 2007-08-23 2011-08-09 Tdk Corporation Multilayer capacitor
US8014125B2 (en) * 2007-11-26 2011-09-06 Ati Technologies Ulc Chip capacitor
US8085524B2 (en) * 2005-11-08 2011-12-27 Ipdia Integrated capacitor arrangement for ultrahigh capacitance values
US8194389B2 (en) * 2008-02-21 2012-06-05 Samsung Electro-Mechanics Co., Ltd. Multilayer chip capacitor including two terminals

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11312622A (en) 1998-04-27 1999-11-09 Kyocera Corp Laminated ceramic capacitor
JP2000106320A (en) * 1998-09-29 2000-04-11 Kyocera Corp Laminated ceramic capacitor
JP2000306762A (en) 1999-04-22 2000-11-02 Matsushita Electric Ind Co Ltd Multilayer ceramic capacitor
JP2001185440A (en) 1999-12-24 2001-07-06 Kyocera Corp Laminated ceramic capacitor
JP4864271B2 (en) 2002-10-17 2012-02-01 株式会社村田製作所 Multilayer capacitor
JP2004319597A (en) * 2003-04-11 2004-11-11 Rohm Co Ltd Multilayer ceramic capacitor
JP4370352B2 (en) * 2007-10-31 2009-11-25 Tdk株式会社 Multilayer capacitor
JP4835686B2 (en) * 2008-12-22 2011-12-14 Tdk株式会社 Multilayer capacitor
JP5267363B2 (en) * 2009-07-08 2013-08-21 Tdk株式会社 Multilayer electronic components
JP5251834B2 (en) 2009-11-05 2013-07-31 Tdk株式会社 Multilayer capacitor

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6191932B1 (en) * 1998-05-21 2001-02-20 Murata Manfacturing Co., Ltd. Monolithic capacitor
US6331930B1 (en) * 1999-05-10 2001-12-18 Murata Manufacturing Co., Ltd. Multilayer capacitor, electronic device and high frequency circuit using the same
US6519134B1 (en) * 2000-07-19 2003-02-11 Intel Corporation Universal capacitor terminal design
US7710710B2 (en) * 2004-03-01 2010-05-04 Epcos Ag Electrical component and circuit configuration with the electrical component
US7046500B2 (en) * 2004-07-20 2006-05-16 Samsung Electro-Mechanics Co., Ltd. Laminated ceramic capacitor
US7339781B2 (en) * 2005-02-28 2008-03-04 Tdk Corporation Electronic component and electronic device
US8085524B2 (en) * 2005-11-08 2011-12-27 Ipdia Integrated capacitor arrangement for ultrahigh capacitance values
US7411776B2 (en) * 2006-07-12 2008-08-12 Tdk Corporation Multilayer capacitor array
US7995325B2 (en) * 2007-08-23 2011-08-09 Tdk Corporation Multilayer capacitor
US8014125B2 (en) * 2007-11-26 2011-09-06 Ati Technologies Ulc Chip capacitor
US7558049B1 (en) * 2007-12-20 2009-07-07 Tdk Corporation Multilayer capacitor array
US8194389B2 (en) * 2008-02-21 2012-06-05 Samsung Electro-Mechanics Co., Ltd. Multilayer chip capacitor including two terminals

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9431174B2 (en) 2012-11-21 2016-08-30 Tdk Corporation Multilayer capacitor
US20150310994A1 (en) * 2013-01-22 2015-10-29 Murata Manufacturing Co., Ltd. Lc composite component
US9960746B2 (en) 2013-01-22 2018-05-01 Murata Manufacturing Co., Ltd. LC composite component
US9577597B2 (en) * 2013-01-22 2017-02-21 Murata Manufacturing Co., Ltd. LC composite component
US9226401B2 (en) 2013-08-30 2015-12-29 Samsung Electro-Mechanics Co., Ltd. Multilayer ceramic electronic part to be embedded in board and printed circuit board having multilayer ceramic electronic part embedded therein
US20170186549A1 (en) * 2014-10-07 2017-06-29 Murata Manufacturing Co., Ltd. Ceramic electronic component
US20170186550A1 (en) * 2014-10-07 2017-06-29 Murata Manufacturing Co., Ltd. Ceramic electronic component
US9818546B2 (en) * 2014-10-07 2017-11-14 Murata Manufacturing Co., Ltd. Ceramic electronic component
US20170365413A1 (en) * 2014-10-07 2017-12-21 Murata Manufacturing Co., Ltd. Ceramic electronic component
US9870864B2 (en) * 2014-10-07 2018-01-16 Murata Manufacturing Co., Ltd. Ceramic electronic component
US9892856B2 (en) * 2014-10-07 2018-02-13 Murata Manufacturing Co., Ltd. Ceramic electronic component
US9911537B2 (en) * 2014-10-07 2018-03-06 Murata Manufacturing Co., Ltd. Ceramic electronic component
US20160099106A1 (en) * 2014-10-07 2016-04-07 Murata Manufacturing Co., Ltd. Ceramic electronic component
US10074483B2 (en) * 2014-10-07 2018-09-11 Murata Manufacturing Co., Ltd. Ceramic electronic component
US10121596B2 (en) 2015-12-11 2018-11-06 Murata Manufacturing Co., Ltd. Multilayer ceramic capacitor

Also Published As

Publication number Publication date
JP2012156471A (en) 2012-08-16
JP5353911B2 (en) 2013-11-27
US8576538B2 (en) 2013-11-05
CN102623179A (en) 2012-08-01

Similar Documents

Publication Publication Date Title
US8576538B2 (en) Electronic component and substrate module
US10163568B2 (en) Multilayer ceramic capacitor, method of fabrication thereof and circuit board having electronic component mounted thereon
US8988853B2 (en) Multilayer ceramic capacitor
US8922975B2 (en) Multilayer ceramic capacitor
US8614877B2 (en) Multilayer ceramic capacitor
US11817263B2 (en) Electronic component, circuit board, and method of mounting electronic component on circuit board
US20130050899A1 (en) Multilayer ceramic capacitor
US10593473B2 (en) Multilayer ceramic capacitor and board having the same
US20130020905A1 (en) Multilayer ceramic electronic component
US8743530B2 (en) Electronic component and substrate module including an embedded capacitor
US9536647B2 (en) Multi-layered chip electronic component
JP2011238724A (en) Electronic component
US20160268044A1 (en) Multilayer ceramic component
US9444424B2 (en) Polar-type low pass filter and demultiplexer equipped therewith
US20150187486A1 (en) Multilayer electronic component and manufacturing method thereof
JP2011233840A (en) Electronic component
US9236184B2 (en) Monolithic ceramic electronic component and method for manufacturing the same
US10115528B2 (en) Multilayer ceramic electronic component
CN103177875B (en) Monolithic ceramic electronic component
US8508911B2 (en) Electronic component and substrate module
US8729999B2 (en) Multi-layered chip electronic component

Legal Events

Date Code Title Description
AS Assignment

Owner name: MURATA MANUFACTURING CO., LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KURODA, YOICHI;KAWAGUCHI, YOSHIO;REEL/FRAME:027605/0274

Effective date: 20120119

STCF Information on status: patent grant

Free format text: PATENTED CASE

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FEPP Fee payment procedure

Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 8