US20120146511A1 - Plasma light source - Google Patents
Plasma light source Download PDFInfo
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- US20120146511A1 US20120146511A1 US13/390,361 US201013390361A US2012146511A1 US 20120146511 A1 US20120146511 A1 US 20120146511A1 US 201013390361 A US201013390361 A US 201013390361A US 2012146511 A1 US2012146511 A1 US 2012146511A1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/003—X-ray radiation generated from plasma being produced from a liquid or gas
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/003—X-ray radiation generated from plasma being produced from a liquid or gas
- H05G2/006—X-ray radiation generated from plasma being produced from a liquid or gas details of the ejection system, e.g. constructional details of the nozzle
Definitions
- the present invention relates to a plasma light source for EUV (Extreme ultraviolet) radiation.
- Lithography which uses an extreme ultraviolet light source for the microfabrication of next-generation semiconductors has been expected.
- Lithography is a technique which reduces and projects light or beams onto a silicon substrate through a mask having a circuit pattern drawn thereon and which forms an electronic circuit by exposing a resist material.
- the minimal processing dimensions of the circuit formed by optical lithography are basically dependent on the wavelength of the light source. Accordingly, the wavelength of the light source used for the development of next-generation semiconductors needs to be shortened, and thus a study for the development of such a light source has been conducted.
- EUV Extreme ultraviolet
- the light of the range has high absorptivity with respect to all materials, and a transmissive optical system such as a lens cannot be used, a reflective optical system is used. Further, it is very difficult to develop the optical system of the EUV light range, and this optical system exhibits reflection characteristics only for a restricted wavelength.
- the generation of light source plasma may be largely classified into laser produced plasma (LPP) using the radiation of laser and discharge produced plasma (DPP) using the discharge of a gas and driven by the pulse power technique.
- LPP laser produced plasma
- DPP discharge produced plasma
- the input power is directly converted into plasma energy.
- the DPP has better energy converting efficiency than that of the LPP, and has an advantage in that the device is small and cheap.
- the radiation spectrum from hot and highly dense plasma using the DPP is basically determined by the temperature and the density of the target material.
- the electron temperature and the electron density are respectively optimized as about several 10 eV and 10 18 cm ⁇ 3 in the case of Xe and Sn, and are respectively optimized as about 20 eV and 10 18 cm ⁇ 3 in the case of Li.
- Non-Patent Documents 1 and 2 and Patent Document 1 disclose the plasma light source in Non-Patent Documents 1 and 2 and Patent Document 1.
- the EUV lithography light source there is a demand for the average output to be high, the size of the light source to be minute, the amount of the scattering particles (debris) to be small, and the like.
- the EUV emitting amount is extremely low compared to the output demand, and an increase in output is a major challenge to be overcome.
- damage caused by the thermal load reduces the life span of the plasma generating device or the optical system. Accordingly, in order to meet both high EUV output and low thermal load, high energy converting efficiency is essentially needed.
- a solid medium such as Sn or Li at a room temperature has a high spectrum converting efficiency, but a change in phase such as melting and evaporation occurs with the generation of plasma. For this reason, the inside of the device may be greatly contaminated by debris (derivatives produced with the discharge) such as neutral particles. Therefore, there is a similar demand for the reinforcement of a system which supplies and collects the target.
- the radiation time of the general EUV plasma light source is about 100 nsec, so that the output is extremely insufficient.
- an EUV radiation time of several ⁇ sec for one shot In order to obtain both high converting efficiency and high average output for the industrial application, there is a need to attain an EUV radiation time of several ⁇ sec for one shot. That is, in order to develop a plasma light source with high converting efficiency, there is a need to maintain plasma in a temperature-and-density state appropriate for the target for several ⁇ sec (at least 1 ⁇ sec or more) to attain the stable EUV radiation.
- a plasma light source comprising:
- a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma
- a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes
- each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds the facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
- the insulation member is formed of partially porous ceramics that include an insulative dense portion which does not permit the continuous permeation of the liquefied plasma medium and a porous portion which permits the continuous permeation of the liquefied plasma medium, and
- the insulative dense portion includes a reservoir that holds the plasma medium therein, and by the porous portion, the inner surface of the reservoir communicates with the gap between the center electrode and the guide electrode, through the inside of the insulative dense portion.
- the plasma light source further includes a temperature-adjustable heating device that heats the insulation member so as to liquefy the plasma medium therein.
- the plasma light source further includes a gas-supply device that supplies an inert gas into the reservoir, and a pressure-adjusting device that adjusts a supply pressure of the inert gas.
- a plasma light source comprising:
- a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma
- a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes
- each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds the facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
- the insulation member is formed of porous ceramics that has a front surface positioned at the side of the front end portion of the center electrode and has a rear surface at the opposite side thereof, and
- the plasma light source further comprises:
- a hollow reservoir that is opened to the rear surface of the insulation member and holds the plasma medium therein;
- a gas-supply device that supplies an inert gas into the reservoir
- a pressure-adjusting device that adjusts a supply pressure of the inert gas
- a temperature-adjustable heating device that heats and liquefies the plasma medium inside the reservoir.
- the voltage-applying device may include a positive voltage source that applies a positive discharge voltage which is higher than that of the guide electrode of one of the coaxial electrodes, to the center electrode of the one of the coaxial electrodes, a negative voltage source that applies a negative discharge voltage which is lower than that of the guide electrode of the other of the coaxial electrodes, to the center electrode of the other of the coaxial electrodes, and a trigger switch that causes the positive voltage source and the negative voltage source to simultaneously apply the discharge voltages to the respective coaxial electrodes.
- the pair of facing coaxial electrodes are provided, the planar discharge current (the planar discharge) is generated in each of the pair of coaxial electrodes, a single plasma is formed at the middle position between the respective facing coaxial electrodes by the planar discharges, and then the planar discharges are connected to form the tubular discharge between the pair of coaxial electrodes so as to generate the magnetic field (the magnetic bottle) which confines the plasma, thereby stably generating the plasma light for EUV radiation for a long period of time (in an order of ⁇ sec).
- the single plasma is formed at the middle position between the pair of facing coaxial electrodes, and the energy converting efficiency may be improved to a great extent compared to a capillary discharge or a vacuum discharge metal plasma of the related art, the thermal load of each electrode is reduced during the formation of plasma, so that damage caused by the thermal load of the component may be remarkably reduced.
- the plasma which is the light emitting source of the plasma light is formed at the middle position between the pair of facing coaxial electrodes, the effective radiation solid angle of the generated plasma light may be made large.
- FIG. 1 is a diagram showing a first embodiment of a plasma light source according to the invention.
- FIG. 2 is an enlarged view of a coaxial electrode of FIG. 1 .
- FIG. 3A is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a planar discharge is generated.
- FIG. 3B is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where the planar discharge moves.
- FIG. 3C is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a plasma is formed.
- FIG. 3D is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a plasma-confining magnetic field is formed.
- FIG. 4 is a diagram showing a second embodiment of a plasma light source according to the invention.
- FIG. 5 is an enlarged view of a coaxial electrode of FIG. 4 .
- FIG. 1 is a diagram showing a first embodiment of a plasma light source according to the invention.
- a plasma light source includes a pair of coaxial electrodes 10 , a discharge-environment-maintaining device 20 , a voltage-applying device 30 , and a heating device 40 .
- the pair of coaxial electrodes 10 are arranged so as to face each other with respect to a symmetry plane 1 .
- Each coaxial electrode 10 includes a rod-shaped center electrode 12 , a guide electrode 14 , and an insulation member 16 .
- the rod-shaped center electrode 12 is a conductive electrode which extends on a single axis Z-Z.
- the end surface of the center electrode 12 facing the symmetry plane 1 has a circular-arc shape. Furthermore, this structure is not essential, and a recessed portion may be formed in the end surface so as to stabilize a planar discharge current 2 and a tubular discharge 4 to be described later, or the end surface may be a plane.
- the guide electrode 14 surrounds the facing front end portion of the center electrode 12 with a predetermined gap therebetween, and holds a plasma medium therebetween.
- the guide electrode 14 includes, in this example, a small diameter hollow cylindrical portion 14 a which is positioned at the side of the symmetry plane 1 , and a large diameter hollow portion 14 b which is positioned at the opposite side thereof and has a larger diameter than that of the small diameter hollow cylindrical portion 14 a.
- the end surface of the small diameter hollow cylindrical portion 14 a facing the symmetry plane 1 in the guide electrode 14 has a circular-arc shape in this example, but may have a plane shape.
- the plasma medium may be a solid plasma medium such as Sn and Li at a room temperature.
- the insulation member 16 is an electrical insulator which is positioned between the center electrode 12 and the guide electrode 14 , and has a hollow cylindrical shape, and electrically insulates the center electrode 12 and the guide electrode 14 from each other.
- the insulation member 16 is formed of porous ceramics having a front surface positioned at the side of the front end portion of the center electrode 12 and a rear surface positioned at the opposite side thereof.
- the insulation member 16 includes a small diameter portion which is fitted into the inside of the small diameter hollow cylindrical portion 14 a, and a large diameter portion which is fitted into the inside of the large diameter hollow portion 14 b.
- the large diameter portion is integrally connected to the guide electrode 14 by a bolt 17 (refer to FIG. 2 ).
- the respective center electrodes 12 are positioned on the same axis Z-Z, and are positioned so as to be symmetry to each other with a predetermined gap therebetween.
- the discharge-environment-maintaining device 20 maintains the coaxial electrode 10 to be in a state where the plasma medium inside the coaxial electrode 10 has a temperature and a pressure appropriate for the generation of plasma.
- the discharge-environment-maintaining device 20 may include, for example, a vacuum chamber, a temperature controller, a vacuum device, and a plasma medium supply device. Furthermore, this structure is not essential, and the other structures may be used.
- the voltage-applying device 30 applies a discharge voltage having reversed polarities to the respective coaxial electrodes 10 .
- the voltage-applying device 30 includes, in this example, a positive voltage source 32 , a negative voltage source 34 , and a trigger switch 36 .
- the positive voltage source 32 applies a positive discharge voltage, which is higher than that of the guide electrode 14 of one of the coaxial electrodes 10 (in this example, the left electrode 10 ), to the center electrode 12 of the same coaxial electrode 10 .
- the negative voltage source 34 applies a negative discharge voltage, which is lower than that of the guide electrode 14 of the other of the coaxial electrodes 10 (in this example, the right electrode 10 ), to the center electrode 12 of the same coaxial electrode 10 .
- the trigger switch 36 simultaneously applies positive and negative discharge voltage to the respective coaxial electrodes 10 by simultaneously activating the positive voltage source 32 and the negative voltage source 34 .
- the plasma light source according to the first embodiment of the invention is configured to confine plasma in the axial direction by forming a tubular discharge (described later) between the pair of coaxial electrodes 10 .
- the heating device 40 includes an electric heater 42 which heats the insulation member 16 , and a heating power supply 44 which supplies heating power to the electric heater 42 .
- the heating device 40 heats the insulation member 16 so as to liquefy the plasma medium therein. Especially, the heating device 40 heats and liquefies the plasma medium inside a reservoir 18 described later by heating the insulation member 16 .
- the electric heater 42 is arranged in a groove formed in the outer periphery of the large diameter portion of the insulation member 16 .
- the electric heater 42 receives power from the heating power supply 44 through a power supply line which penetrates the large diameter hollow portion 14 b of the guide electrode 14 .
- the electric heater 42 includes a temperature sensor (not shown) to heat the insulation member 16 and maintain the insulation member 16 at a predetermined temperature.
- FIG. 2 is an enlarged view of the coaxial electrode of FIG. 1 .
- the insulation member 16 is formed of partially porous ceramics obtained by integrally molding an insulative dense portion and a porous portion such that the liquefied plasma medium does not continuously permeate the insulative dense portion 16 a, but continuously permeates the porous portion 16 b.
- the insulative dense portion 16 a insulates the center electrode 12 and the guide electrode 14 from each other.
- the porous portion 16 b continuously extends from the rear surface of the insulation member 16 to the front surface thereof through the inside of the insulative dense portion 16 a.
- ceramics forming the insulative dense portion 16 a and the porous portion 16 b is insulative ceramics such as alumina (Al 2 O 3 ), aluminum nitride (AlN), zirconia (ZrO), and silicon carbide (SiC).
- insulative ceramics such as alumina (Al 2 O 3 ), aluminum nitride (AlN), zirconia (ZrO), and silicon carbide (SiC).
- the particle diameter and the burning temperature of the insulative dense portion 16 a are set so that the liquefied plasma medium does not continuously permeate the insulative dense portion 16 a.
- the particle diameter and the burning temperature of the porous portion 16 b are set so that the liquefied plasma medium continuously permeate the insulative dense portion 16 a.
- the insulative dense portion 16 a includes the reservoir 18 which holds the plasma medium therein.
- the reservoir 18 is a cylindrical cavity which is provided inside the insulative dense portion 16 a and which centers the axis Z-Z.
- the reservoir 18 is opened to the rear surface of the insulation member 16 , and the rear surface (the left side of the drawing) of the reservoir 18 is closed by a closing plate 15 .
- the closing plate 15 is attachably and detachably fixed by the nut 13 into which a screw shaft 12 a provided at the rear surface side of the center electrode 12 is screwed.
- the closing plate 15 may be formed of a heat-resistant metal plate or heat-resistant ceramics which withstands the temperature of the liquefied plasma medium.
- the reservoir 18 may be appropriately replenished with the plasma medium by the attachment and detachment of the closing plate 15 .
- the plasma medium inside the reservoir 18 is Sn, Li, or the like, and is liquefied by the heating device 40 .
- the plasma light source of FIG. 1 further includes a gas-supply device 50 and a pressure-adjusting device 52 .
- the gas-supply device 50 supplies an inert gas into the reservoir 18 . It is desirable that the inert gas be a rare gas such as argon and xenon.
- the pressure-adjusting device 52 is installed at an intermediate position in the gas supply line of the gas-supply device 50 so as to adjust the supply pressure of the inert gas.
- the gas-supply device 50 and the pressure-adjusting device 52 may be omitted.
- the insulation member 16 is heated and maintained at a temperature at which the vapor pressure of the plasma medium 6 (Sn, Li, and the like) becomes a pressure (in an order of Torr) appropriate for the generation of plasma, and the inside of the coaxial electrode 10 (the gap between the center electrode 12 and the guide electrode 14 ) is made to be a vapor atmosphere of the plasma medium 6 having a pressure in an order of Torr.
- the electrode conductors (the center electrode 12 and the guide electrode 14 ) are maintained at a high temperature at which the vapor of the plasma medium 6 does not aggregate.
- the plasma medium 6 may be made to flow out in a liquid metal state from the surface (the end surface) of the porous portion 16 b of the insulation member 16 to the inside of the coaxial electrode 10 (the gap between the center electrode 12 and the guide electrode 14 ).
- the plasma medium 6 may be supplied as a metal vapor gas from the surface (the end surface) of the porous portion 16 b of the insulation member 16 to the inside of the coaxial electrode 10 (the gap between the center electrode 12 and the guide electrode 14 ).
- the heating device 40 liquefies the plasma medium 6 inside the reservoir 18 , and vaporizes the liquefied plasma medium 6 so as to be changed into a metal vapor gas.
- the insulative dense portion 16 b be formed such that a gas cannot pass through the insulative dense portion 16 b.
- the shapes of the insulative dense portion 16 a and the porous portion 16 b are not limited to this example, and may be other shapes as long as the center electrode 12 and the guide electrode 14 are electrically insulated from each other.
- FIGS. 3A to 3D are diagrams illustrating the operation of the plasma light source of FIG. 1 .
- FIG. 3A shows the state where the planar discharge is generated
- FIG. 3B shows the state where the planar discharge moves
- FIG. 3C shows the state where the plasma is formed
- FIG. 3D shows the state where the plasma-confining magnetic field is formed.
- the above-described pair of coaxial electrodes 10 are disposed so as to face each other, the plasma medium is supplied to the insides of the coaxial electrodes 10 by the discharge-environment-maintaining device 20 so as to be maintained at a temperature and a pressure appropriate for the generation of plasma, and discharge voltages having reversed polarities are applied to the respective coaxial electrodes 10 by the voltage-applying device 30 .
- planar discharge 2 As shown in FIG. 3A , due to the application of voltages, a planar discharge current (hereinafter, referred to as a planar discharge 2 ) is generated in the surfaces of the insulation members 16 of the pair of coaxial electrodes 10 .
- the planar discharge 2 is a planar discharge current which is spread two-dimensionally, and is referred to as “a current sheet” hereinafter.
- a positive voltage (+) is applied to the center electrode 12 of the left coaxial electrode 10
- a negative voltage ( ⁇ ) is applied to the guide electrode 14
- a negative voltage ( ⁇ ) is applied to the center electrode 12 of the right coaxial electrode 10
- a positive voltage (+) is applied to the guide electrode 14 .
- both guide electrodes 14 may be grounded so as to be maintained at 0 V, a positive voltage (+) may be applied to one center electrode 12 , and a negative voltage ( ⁇ ) may be applied to the other center electrode 12 .
- the planar discharge 2 moves in the direction (the direction toward the center of the drawing) of being discharged from the electrode by the self magnetic field.
- the plasma medium 6 which is interposed between the pair of planar discharges 2 is changed to have a high density and a high temperature, so that a single plasma 3 is formed at the middle position (the symmetry plane 1 of the center electrode 12 ) between the facing coaxial electrodes 10 .
- the pair of facing center electrodes 12 are respectively held at a positive voltage (+) and a negative voltage ( ⁇ ), and the pair of facing guide electrodes 14 are respectively held at a positive voltage (+) and a negative voltage ( ⁇ ).
- the planar discharges 2 of the pair of facing center electrodes 12 may be connected to each other to form the tubular discharge 4 discharged between the pair of facing guide electrodes 14 .
- the tubular discharge 4 indicates a hollow cylindrical discharge current which surrounds the axis Z-Z.
- a plasma-confining magnetic field (a magnetic bottle) which is indicated by the reference numeral 5 is formed so as to confine the plasma 3 in the radial direction and the axial direction.
- the magnetic bottle 5 when the magnetic bottle 5 is formed in a shape of which the center portion is large and both sides are small due to the pressure of the plasma 3 , an axial magnetic pressure gradient toward the plasma 3 is formed, and the plasma 3 is confined at the middle position by the magnetic pressure gradient. Moreover, the plasma 3 is compressed (Z-pinched) toward the center by the self magnetic field of the plasma current, so that it is also confined in the radial direction by the self magnetic field.
- the energy corresponding to the light emitting energy of the plasma 3 is continuously supplied from the voltage-applying device 30 , so that it is possible to stably generate the plasma light 8 (EUV) with a high energy converting efficiency for a long period of time.
- EUV plasma light 8
- FIG. 4 is a diagram showing a second embodiment of a plasma light source according to the invention
- FIG. 5 is an enlarged view of the coaxial electrode of FIG. 4 .
- a center electrode 12 B, a guide electrode 14 B, an insulation member 16 B, a reservoir 18 B, and an electric heater 42 B are respectively provided instead of the center electrode 12 , the guide electrode 14 , the insulation member 16 , the reservoir 18 , and the electric heater 42 of the first embodiment.
- each coaxial electrode 10 includes a rod-shaped center electrode 12 B, a tubular guide electrode 14 B, and a ring-shaped insulation member 16 B.
- the ring-shaped insulation member 16 B is an electrical insulator which is positioned between the center electrode 12 B and the guide electrode 14 B, and has a hollow cylindrical shape, and electrically insulates the center electrode 12 B and the guide electrode 14 B from each other.
- the ring-shaped insulation member 16 B is formed of porous ceramics.
- the plasma light source of FIG. 4 further includes a hollow reservoir 18 B which is opened to the rear surface of the insulation member 16 B and which holds the plasma medium therein.
- the heating device 40 includes, in this example, an electric heater 42 B which heats the reservoir 18 B, and a heating power supply 44 which supplies heating power to the electric heater 42 B.
- the heating device 40 heats and liquefies the plasma medium inside the reservoir 18 B.
- the other structures of the second embodiment are the same as those of the first embodiment. However, in the second embodiment, the gas-supply device 50 and the pressure-adjusting device 52 are not omitted.
- the pair of facing coaxial electrodes 10 are provided, the planar discharge current (the planar discharge 2 ) is generated in each of the pair of coaxial electrodes 10 , the single plasma 3 is formed at the middle position between the respective facing coaxial electrodes 10 by the planar discharges 2 , and then the planar discharges 2 are connected to form the tubular discharge 4 between the pair of coaxial electrodes so as to generate the plasma-confining magnetic field 5 (the magnetic bottle 5 ) which confines the plasma 3 , thereby stably generating the plasma light for EUV radiation for a long period of time (in an order of ⁇ sec).
- the single plasma 3 is formed at the middle position between the pair of facing coaxial electrodes 10 , and the energy converting efficiency is improved to a great extent (ten times or more) compared to a capillary discharge or a vacuum discharge metal plasma of the related art, the thermal load of each electrode is reduced during the formation of plasma, so that damage caused by the thermal load of the component may be remarkably reduced.
- the plasma 3 which is the light emitting source of the plasma light is formed at the middle position between the pair of facing coaxial electrodes 10 , the effective radiation solid angle of the plasma light can be made large.
- the insulation member 16 is formed of the partially porous ceramics obtained by integrally molding the insulative dense portion 16 a and the porous portion 16 b, the insulative dense portion 16 a is provided with the reservoir 18 which holds the plasma medium therein, and by the porous portion 16 b, the inner surface of the reservoir 18 communicates with the gap between the center electrode 12 and the guide electrode 14 , through the inside of the insulative dense portion 16 a. Accordingly, due to the presence of the insulative dense portion 16 a, the insulation in the coaxial electrode may be maintained even when a liquid metal as a plasma medium flows through the porous portion 16 b, whereby the plasma medium may be continuously supplied between the center electrode 12 and the guide electrode 14 .
- the insulation member 16 be obtained by integrally molding the insulative dense portion 16 a and the porous portion 16 b in consideration of the structure of the device.
- the insulative dense portion 16 a and the porous portion 16 b may be bonded to each other (by adhering, brazing, or the like), or a seal structure is provided to prevent the plasma medium from leaking from a clearance between the insulative dense portion 16 a and the porous portion 16 b.
- the hollow reservoir 18 or 18 B which is opened to the rear surface of the insulation member 16 or 16 B and which holds the plasma medium therein, the gas-supply device 50 which supplies the inert gas into the reservoir 18 or 18 B, the pressure-adjusting device 52 which adjusts the supply pressure of the inert gas, and the temperature-adjustable heating device 40 which heats and liquefies the plasma medium inside the reservoir 18 or 18 B. Accordingly, it is possible to control the vapor pressure of the plasma medium at the front surface of the insulation member 16 or 16 B through the temperature adjustment of the heating device 40 . Further, at the same time, it is possible to control the supply amount of the plasma medium (the liquid metal) by adjusting the pressure of the inert gas to be supplied into the reservoir 18 or 18 B by the gas-supply device 50 and the pressure-adjusting device 52 .
- 16 , 16 B INSULATION MEMBER (PARTIALLY POROUS CERAMICS)
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Abstract
A pair of coaxial electrodes 10 that face each other, a discharge-environment-maintaining device 20, and a voltage-applying device 30 are provided. Each coaxial electrode 10 includes a center electrode 12, a guide electrode 14 which surrounds the front end portion of the facing center electrode, and an insulation member 16 which insulates the center electrode and the guide electrode from each other. The insulation member 16 is formed of partially porous ceramics including an insulative dense portion 16 a and a porous portion 16 b. The insulative dense portion 16 a includes a reservoir 18 which holds a plasma medium therein, and by the porous portion 16 b, the inner surface of the reservoir 18 communicates with a gap between the center electrode 12 and the guide electrode 14 through the inside of the insulative dense portion 16 a.
Description
- The present invention relates to a plasma light source for EUV (Extreme ultraviolet) radiation.
- Lithography which uses an extreme ultraviolet light source for the microfabrication of next-generation semiconductors has been expected. Lithography is a technique which reduces and projects light or beams onto a silicon substrate through a mask having a circuit pattern drawn thereon and which forms an electronic circuit by exposing a resist material. The minimal processing dimensions of the circuit formed by optical lithography are basically dependent on the wavelength of the light source. Accordingly, the wavelength of the light source used for the development of next-generation semiconductors needs to be shortened, and thus a study for the development of such a light source has been conducted.
- Extreme ultraviolet (EUV) is most expected as the next-generation lithography light source, and the light has a wavelength in the range of approximately 1 to 100 nm. Since the light of the range has high absorptivity with respect to all materials, and a transmissive optical system such as a lens cannot be used, a reflective optical system is used. Further, it is very difficult to develop the optical system of the EUV light range, and this optical system exhibits reflection characteristics only for a restricted wavelength.
- Currently, a Mo/Si multilayer film reflection mirror with sensitivity of 13.5 nm has been developed. Then, by developing lithography techniques obtained by the combination of the light of this wavelength and the reflection mirror, it is expected that processing dimensions of 30 nm or less may be realized. In order to realize a new microfabrication technique, there is an immediate need for the development of a lithography light source with a wavelength of 13.5 nm, and radiant light from plasma with high energy density has gained attention.
- The generation of light source plasma may be largely classified into laser produced plasma (LPP) using the radiation of laser and discharge produced plasma (DPP) using the discharge of a gas and driven by the pulse power technique. In DPP, the input power is directly converted into plasma energy. For this reason, the DPP has better energy converting efficiency than that of the LPP, and has an advantage in that the device is small and cheap.
- The radiation spectrum from hot and highly dense plasma using the DPP is basically determined by the temperature and the density of the target material. According to the calculation result for the atomic process of the plasma, in order to obtain plasma of the EUV radiation range, the electron temperature and the electron density are respectively optimized as about several 10 eV and 1018 cm−3 in the case of Xe and Sn, and are respectively optimized as about 20 eV and 1018 cm−3 in the case of Li.
- Furthermore, the plasma light source is disclosed in
Non-Patent Documents Patent Document 1. - [Non-Patent Document 1]
- Hiroto Sato and others, “Discharge-Produced Plasma EUV Source for Microlithography”, OQD-08-28
- [Non-Patent Document 2]
- Jeroen Jonkers, “High power extreme ultra-violet (EUV) light sources for future lithography”, Plasma Sources Science and Technology, 15(2006) S8-S16
- [Patent Document 1]
- Japanese Patent Application Laid-Open No. 2004-226244, “Extreme ultra-violet light source and semiconductor exposure apparatus”
- Regarding the EUV lithography light source, there is a demand for the average output to be high, the size of the light source to be minute, the amount of the scattering particles (debris) to be small, and the like. At present, the EUV emitting amount is extremely low compared to the output demand, and an increase in output is a major challenge to be overcome. However, when the input energy is set to be large to obtain a high output, damage caused by the thermal load reduces the life span of the plasma generating device or the optical system. Accordingly, in order to meet both high EUV output and low thermal load, high energy converting efficiency is essentially needed.
- At the beginning of forming plasma, a great deal of energy is consumed for heating or ionization, and hot and highly dense plasma radiating EUV is generally expanded rapidly. For this reason, the radiation sustaining time T is extremely short. Accordingly, in order to improve the converting efficiency, it is important to maintain the plasma in a hot temperature and a highly dense state appropriate for EUV radiation for a long period of time (in an order of μsec).
- A solid medium such as Sn or Li at a room temperature has a high spectrum converting efficiency, but a change in phase such as melting and evaporation occurs with the generation of plasma. For this reason, the inside of the device may be greatly contaminated by debris (derivatives produced with the discharge) such as neutral particles. Therefore, there is a similar demand for the reinforcement of a system which supplies and collects the target.
- Currently, the radiation time of the general EUV plasma light source is about 100 nsec, so that the output is extremely insufficient. In order to obtain both high converting efficiency and high average output for the industrial application, there is a need to attain an EUV radiation time of several μsec for one shot. That is, in order to develop a plasma light source with high converting efficiency, there is a need to maintain plasma in a temperature-and-density state appropriate for the target for several μsec (at least 1 μsec or more) to attain the stable EUV radiation.
- In addition, in a capillary discharge of the related art, since the plasma is confined inside the capillary, there is a disadvantage in that the effective radiation solid angle is small.
- Therefore, it is an object of the invention to provide a plasma light source which stably generates plasma light for EUV radiation for a long period of time (in an order of μsec), which suffers little damage due to the thermal load of the component, and which obtains a large effective radiation solid angle of the plasma light.
- In order to attain the above-described object, according to a first invention, there is provided a plasma light source comprising:
- a pair of coaxial electrodes that face each other;
- a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma; and
- a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes,
- wherein a tubular discharge is formed between the pair of coaxial electrodes so as to confine the plasma in the axial direction,
- wherein each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds the facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
- wherein the insulation member is formed of partially porous ceramics that include an insulative dense portion which does not permit the continuous permeation of the liquefied plasma medium and a porous portion which permits the continuous permeation of the liquefied plasma medium, and
- wherein the insulative dense portion includes a reservoir that holds the plasma medium therein, and by the porous portion, the inner surface of the reservoir communicates with the gap between the center electrode and the guide electrode, through the inside of the insulative dense portion.
- According to the preferred embodiments of the first invention, the plasma light source further includes a temperature-adjustable heating device that heats the insulation member so as to liquefy the plasma medium therein.
- According to the preferred embodiments of the first invention, the plasma light source further includes a gas-supply device that supplies an inert gas into the reservoir, and a pressure-adjusting device that adjusts a supply pressure of the inert gas.
- In order to attain the above-described object, according to a second invention, there is provided a plasma light source comprising:
- a pair of coaxial electrodes that face each other;
- a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma; and
- a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes,
- wherein a tubular discharge is formed between the pair of coaxial electrodes so as to confine the plasma in the axial direction,
- wherein each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds the facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
- wherein the insulation member is formed of porous ceramics that has a front surface positioned at the side of the front end portion of the center electrode and has a rear surface at the opposite side thereof, and
- wherein the plasma light source further comprises:
- a hollow reservoir that is opened to the rear surface of the insulation member and holds the plasma medium therein;
- a gas-supply device that supplies an inert gas into the reservoir;
- a pressure-adjusting device that adjusts a supply pressure of the inert gas; and
- a temperature-adjustable heating device that heats and liquefies the plasma medium inside the reservoir.
- According to the preferred embodiments of the first or second invention, the voltage-applying device may include a positive voltage source that applies a positive discharge voltage which is higher than that of the guide electrode of one of the coaxial electrodes, to the center electrode of the one of the coaxial electrodes, a negative voltage source that applies a negative discharge voltage which is lower than that of the guide electrode of the other of the coaxial electrodes, to the center electrode of the other of the coaxial electrodes, and a trigger switch that causes the positive voltage source and the negative voltage source to simultaneously apply the discharge voltages to the respective coaxial electrodes.
- According to the device of the first and second inventions, the pair of facing coaxial electrodes are provided, the planar discharge current (the planar discharge) is generated in each of the pair of coaxial electrodes, a single plasma is formed at the middle position between the respective facing coaxial electrodes by the planar discharges, and then the planar discharges are connected to form the tubular discharge between the pair of coaxial electrodes so as to generate the magnetic field (the magnetic bottle) which confines the plasma, thereby stably generating the plasma light for EUV radiation for a long period of time (in an order of μsec).
- Further, since the single plasma is formed at the middle position between the pair of facing coaxial electrodes, and the energy converting efficiency may be improved to a great extent compared to a capillary discharge or a vacuum discharge metal plasma of the related art, the thermal load of each electrode is reduced during the formation of plasma, so that damage caused by the thermal load of the component may be remarkably reduced.
- Further, since the plasma which is the light emitting source of the plasma light is formed at the middle position between the pair of facing coaxial electrodes, the effective radiation solid angle of the generated plasma light may be made large.
-
FIG. 1 is a diagram showing a first embodiment of a plasma light source according to the invention. -
FIG. 2 is an enlarged view of a coaxial electrode ofFIG. 1 . -
FIG. 3A is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a planar discharge is generated. -
FIG. 3B is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where the planar discharge moves. -
FIG. 3C is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a plasma is formed. -
FIG. 3D is a diagram illustrating the operation of the plasma light source of the first embodiment of the invention, and shows the state where a plasma-confining magnetic field is formed. -
FIG. 4 is a diagram showing a second embodiment of a plasma light source according to the invention. -
FIG. 5 is an enlarged view of a coaxial electrode ofFIG. 4 . - Hereinafter, exemplary embodiments of the invention will be described on the basis of the accompanying drawings. Furthermore, the same reference numerals will be given to common parts in the respective drawings, and repetitive description thereof will be omitted.
-
FIG. 1 is a diagram showing a first embodiment of a plasma light source according to the invention. - In this drawing, a plasma light source according to a first embodiment of the invention includes a pair of
coaxial electrodes 10, a discharge-environment-maintainingdevice 20, a voltage-applyingdevice 30, and aheating device 40. - The pair of
coaxial electrodes 10 are arranged so as to face each other with respect to asymmetry plane 1. - Each
coaxial electrode 10 includes a rod-shapedcenter electrode 12, aguide electrode 14, and aninsulation member 16. - The rod-shaped
center electrode 12 is a conductive electrode which extends on a single axis Z-Z. - In this example, the end surface of the
center electrode 12 facing thesymmetry plane 1 has a circular-arc shape. Furthermore, this structure is not essential, and a recessed portion may be formed in the end surface so as to stabilize a planar discharge current 2 and atubular discharge 4 to be described later, or the end surface may be a plane. - The
guide electrode 14 surrounds the facing front end portion of thecenter electrode 12 with a predetermined gap therebetween, and holds a plasma medium therebetween. Theguide electrode 14 includes, in this example, a small diameter hollowcylindrical portion 14 a which is positioned at the side of thesymmetry plane 1, and a large diameterhollow portion 14 b which is positioned at the opposite side thereof and has a larger diameter than that of the small diameter hollowcylindrical portion 14 a. Further, the end surface of the small diameter hollowcylindrical portion 14 a facing thesymmetry plane 1 in theguide electrode 14 has a circular-arc shape in this example, but may have a plane shape. - In this example, the plasma medium may be a solid plasma medium such as Sn and Li at a room temperature.
- The
insulation member 16 is an electrical insulator which is positioned between thecenter electrode 12 and theguide electrode 14, and has a hollow cylindrical shape, and electrically insulates thecenter electrode 12 and theguide electrode 14 from each other. Theinsulation member 16 is formed of porous ceramics having a front surface positioned at the side of the front end portion of thecenter electrode 12 and a rear surface positioned at the opposite side thereof. - In this example, the
insulation member 16 includes a small diameter portion which is fitted into the inside of the small diameter hollowcylindrical portion 14 a, and a large diameter portion which is fitted into the inside of the large diameterhollow portion 14 b. The large diameter portion is integrally connected to theguide electrode 14 by a bolt 17 (refer toFIG. 2 ). - In the above-described pair of
coaxial electrodes 10, therespective center electrodes 12 are positioned on the same axis Z-Z, and are positioned so as to be symmetry to each other with a predetermined gap therebetween. - The discharge-environment-maintaining
device 20 maintains thecoaxial electrode 10 to be in a state where the plasma medium inside thecoaxial electrode 10 has a temperature and a pressure appropriate for the generation of plasma. - The discharge-environment-maintaining
device 20 may include, for example, a vacuum chamber, a temperature controller, a vacuum device, and a plasma medium supply device. Furthermore, this structure is not essential, and the other structures may be used. - The voltage-applying
device 30 applies a discharge voltage having reversed polarities to the respectivecoaxial electrodes 10. - The voltage-applying
device 30 includes, in this example, apositive voltage source 32, anegative voltage source 34, and atrigger switch 36. - The
positive voltage source 32 applies a positive discharge voltage, which is higher than that of theguide electrode 14 of one of the coaxial electrodes 10 (in this example, the left electrode 10), to thecenter electrode 12 of the samecoaxial electrode 10. - The
negative voltage source 34 applies a negative discharge voltage, which is lower than that of theguide electrode 14 of the other of the coaxial electrodes 10 (in this example, the right electrode 10), to thecenter electrode 12 of the samecoaxial electrode 10. - The
trigger switch 36 simultaneously applies positive and negative discharge voltage to the respectivecoaxial electrodes 10 by simultaneously activating thepositive voltage source 32 and thenegative voltage source 34. - With this structure, the plasma light source according to the first embodiment of the invention is configured to confine plasma in the axial direction by forming a tubular discharge (described later) between the pair of
coaxial electrodes 10. - The
heating device 40 includes anelectric heater 42 which heats theinsulation member 16, and aheating power supply 44 which supplies heating power to theelectric heater 42. Theheating device 40 heats theinsulation member 16 so as to liquefy the plasma medium therein. Especially, theheating device 40 heats and liquefies the plasma medium inside areservoir 18 described later by heating theinsulation member 16. - In this example, the
electric heater 42 is arranged in a groove formed in the outer periphery of the large diameter portion of theinsulation member 16. In this example, theelectric heater 42 receives power from theheating power supply 44 through a power supply line which penetrates the large diameterhollow portion 14 b of theguide electrode 14. Further, theelectric heater 42 includes a temperature sensor (not shown) to heat theinsulation member 16 and maintain theinsulation member 16 at a predetermined temperature. -
FIG. 2 is an enlarged view of the coaxial electrode ofFIG. 1 . - In this drawing, the
insulation member 16 is formed of partially porous ceramics obtained by integrally molding an insulative dense portion and a porous portion such that the liquefied plasma medium does not continuously permeate the insulativedense portion 16 a, but continuously permeates theporous portion 16 b. - The insulative
dense portion 16 a insulates thecenter electrode 12 and theguide electrode 14 from each other. - Further, in this example, the
porous portion 16 b continuously extends from the rear surface of theinsulation member 16 to the front surface thereof through the inside of the insulativedense portion 16 a. - Preferably, ceramics forming the insulative
dense portion 16 a and theporous portion 16 b is insulative ceramics such as alumina (Al2O3), aluminum nitride (AlN), zirconia (ZrO), and silicon carbide (SiC). - Further, the particle diameter and the burning temperature of the insulative
dense portion 16 a are set so that the liquefied plasma medium does not continuously permeate the insulativedense portion 16 a. Moreover, the particle diameter and the burning temperature of theporous portion 16 b are set so that the liquefied plasma medium continuously permeate the insulativedense portion 16 a. - Further, the insulative
dense portion 16 a includes thereservoir 18 which holds the plasma medium therein. In this example, thereservoir 18 is a cylindrical cavity which is provided inside the insulativedense portion 16 a and which centers the axis Z-Z. - Furthermore, in this example, the
reservoir 18 is opened to the rear surface of theinsulation member 16, and the rear surface (the left side of the drawing) of thereservoir 18 is closed by aclosing plate 15. The closingplate 15 is attachably and detachably fixed by the nut 13 into which ascrew shaft 12 a provided at the rear surface side of thecenter electrode 12 is screwed. The closingplate 15 may be formed of a heat-resistant metal plate or heat-resistant ceramics which withstands the temperature of the liquefied plasma medium. - With this structure, the
reservoir 18 may be appropriately replenished with the plasma medium by the attachment and detachment of theclosing plate 15. Further, in this example, the plasma medium inside thereservoir 18 is Sn, Li, or the like, and is liquefied by theheating device 40. - The plasma light source of
FIG. 1 further includes a gas-supply device 50 and a pressure-adjustingdevice 52. - The gas-
supply device 50 supplies an inert gas into thereservoir 18. It is desirable that the inert gas be a rare gas such as argon and xenon. - The pressure-adjusting
device 52 is installed at an intermediate position in the gas supply line of the gas-supply device 50 so as to adjust the supply pressure of the inert gas. - Furthermore, in the first embodiment, the gas-
supply device 50 and the pressure-adjustingdevice 52 may be omitted. - By using the above-described plasma light source, the
insulation member 16 is heated and maintained at a temperature at which the vapor pressure of the plasma medium 6 (Sn, Li, and the like) becomes a pressure (in an order of Torr) appropriate for the generation of plasma, and the inside of the coaxial electrode 10 (the gap between thecenter electrode 12 and the guide electrode 14) is made to be a vapor atmosphere of theplasma medium 6 having a pressure in an order of Torr. - Further, the electrode conductors (the
center electrode 12 and the guide electrode 14) are maintained at a high temperature at which the vapor of theplasma medium 6 does not aggregate. - The
plasma medium 6 may be made to flow out in a liquid metal state from the surface (the end surface) of theporous portion 16 b of theinsulation member 16 to the inside of the coaxial electrode 10 (the gap between thecenter electrode 12 and the guide electrode 14). - Instead, the
plasma medium 6 may be supplied as a metal vapor gas from the surface (the end surface) of theporous portion 16 b of theinsulation member 16 to the inside of the coaxial electrode 10 (the gap between thecenter electrode 12 and the guide electrode 14). In this case, theheating device 40 liquefies theplasma medium 6 inside thereservoir 18, and vaporizes the liquefiedplasma medium 6 so as to be changed into a metal vapor gas. Furthermore, in order to supply theplasma medium 6 as a metal vapor gas from the surface (the end surface) of theporous portion 16 b to the inside of thecoaxial electrode 10, it is desirable that the insulativedense portion 16 b be formed such that a gas cannot pass through the insulativedense portion 16 b. - Furthermore, the shapes of the insulative
dense portion 16 a and theporous portion 16 b are not limited to this example, and may be other shapes as long as thecenter electrode 12 and theguide electrode 14 are electrically insulated from each other. -
FIGS. 3A to 3D are diagrams illustrating the operation of the plasma light source ofFIG. 1 .FIG. 3A shows the state where the planar discharge is generated,FIG. 3B shows the state where the planar discharge moves,FIG. 3C shows the state where the plasma is formed, andFIG. 3D shows the state where the plasma-confining magnetic field is formed. - Hereinafter, referring to these drawings, a method of generating plasma light using the device of the first embodiment of the invention will be described.
- In the plasma light source according to the first embodiment of the invention, the above-described pair of
coaxial electrodes 10 are disposed so as to face each other, the plasma medium is supplied to the insides of thecoaxial electrodes 10 by the discharge-environment-maintainingdevice 20 so as to be maintained at a temperature and a pressure appropriate for the generation of plasma, and discharge voltages having reversed polarities are applied to the respectivecoaxial electrodes 10 by the voltage-applyingdevice 30. - As shown in
FIG. 3A , due to the application of voltages, a planar discharge current (hereinafter, referred to as a planar discharge 2) is generated in the surfaces of theinsulation members 16 of the pair ofcoaxial electrodes 10. Theplanar discharge 2 is a planar discharge current which is spread two-dimensionally, and is referred to as “a current sheet” hereinafter. - In addition, at this time, a positive voltage (+) is applied to the
center electrode 12 of the leftcoaxial electrode 10, a negative voltage (−) is applied to theguide electrode 14, a negative voltage (−) is applied to thecenter electrode 12 of the rightcoaxial electrode 10, and a positive voltage (+) is applied to theguide electrode 14. - Furthermore, both guide
electrodes 14 may be grounded so as to be maintained at 0 V, a positive voltage (+) may be applied to onecenter electrode 12, and a negative voltage (−) may be applied to theother center electrode 12. - As shown in
FIG. 3B , theplanar discharge 2 moves in the direction (the direction toward the center of the drawing) of being discharged from the electrode by the self magnetic field. - As shown in
FIG. 3C , when theplanar discharge 2 reaches the front ends of the pair ofcoaxial electrodes 10, theplasma medium 6 which is interposed between the pair ofplanar discharges 2 is changed to have a high density and a high temperature, so that asingle plasma 3 is formed at the middle position (thesymmetry plane 1 of the center electrode 12) between the facingcoaxial electrodes 10. - Further, in this state, the pair of facing
center electrodes 12 are respectively held at a positive voltage (+) and a negative voltage (−), and the pair of facingguide electrodes 14 are respectively held at a positive voltage (+) and a negative voltage (−). Accordingly, as shown inFIG. 3D , theplanar discharges 2 of the pair of facingcenter electrodes 12 may be connected to each other to form thetubular discharge 4 discharged between the pair of facingguide electrodes 14. Here, thetubular discharge 4 indicates a hollow cylindrical discharge current which surrounds the axis Z-Z. - When the
tubular discharge 4 is formed, a plasma-confining magnetic field (a magnetic bottle) which is indicated by the reference numeral 5 is formed so as to confine theplasma 3 in the radial direction and the axial direction. - That is, when the magnetic bottle 5 is formed in a shape of which the center portion is large and both sides are small due to the pressure of the
plasma 3, an axial magnetic pressure gradient toward theplasma 3 is formed, and theplasma 3 is confined at the middle position by the magnetic pressure gradient. Moreover, theplasma 3 is compressed (Z-pinched) toward the center by the self magnetic field of the plasma current, so that it is also confined in the radial direction by the self magnetic field. - In this state, the energy corresponding to the light emitting energy of the
plasma 3 is continuously supplied from the voltage-applyingdevice 30, so that it is possible to stably generate the plasma light 8 (EUV) with a high energy converting efficiency for a long period of time. -
FIG. 4 is a diagram showing a second embodiment of a plasma light source according to the invention, andFIG. 5 is an enlarged view of the coaxial electrode ofFIG. 4 . - In the second embodiment, a
center electrode 12B, aguide electrode 14B, aninsulation member 16B, areservoir 18B, and anelectric heater 42B are respectively provided instead of thecenter electrode 12, theguide electrode 14, theinsulation member 16, thereservoir 18, and theelectric heater 42 of the first embodiment. - In
FIGS. 4 and 5 , eachcoaxial electrode 10 includes a rod-shapedcenter electrode 12B, atubular guide electrode 14B, and a ring-shapedinsulation member 16B. - The ring-shaped
insulation member 16B is an electrical insulator which is positioned between thecenter electrode 12B and theguide electrode 14B, and has a hollow cylindrical shape, and electrically insulates thecenter electrode 12B and theguide electrode 14B from each other. In this example, the ring-shapedinsulation member 16B is formed of porous ceramics. - Further, the plasma light source of
FIG. 4 further includes ahollow reservoir 18B which is opened to the rear surface of theinsulation member 16B and which holds the plasma medium therein. - Moreover, the
heating device 40 includes, in this example, anelectric heater 42B which heats thereservoir 18B, and aheating power supply 44 which supplies heating power to theelectric heater 42B. Theheating device 40 heats and liquefies the plasma medium inside thereservoir 18B. - The other structures of the second embodiment are the same as those of the first embodiment. However, in the second embodiment, the gas-
supply device 50 and the pressure-adjustingdevice 52 are not omitted. - According to the device of the above-described first or second embodiment of the invention, the pair of facing
coaxial electrodes 10 are provided, the planar discharge current (the planar discharge 2) is generated in each of the pair ofcoaxial electrodes 10, thesingle plasma 3 is formed at the middle position between the respective facingcoaxial electrodes 10 by theplanar discharges 2, and then theplanar discharges 2 are connected to form thetubular discharge 4 between the pair of coaxial electrodes so as to generate the plasma-confining magnetic field 5 (the magnetic bottle 5) which confines theplasma 3, thereby stably generating the plasma light for EUV radiation for a long period of time (in an order of μsec). - Further, since the
single plasma 3 is formed at the middle position between the pair of facingcoaxial electrodes 10, and the energy converting efficiency is improved to a great extent (ten times or more) compared to a capillary discharge or a vacuum discharge metal plasma of the related art, the thermal load of each electrode is reduced during the formation of plasma, so that damage caused by the thermal load of the component may be remarkably reduced. - Further, since the
plasma 3 which is the light emitting source of the plasma light is formed at the middle position between the pair of facingcoaxial electrodes 10, the effective radiation solid angle of the plasma light can be made large. - Moreover, in the first embodiment of the invention, the
insulation member 16 is formed of the partially porous ceramics obtained by integrally molding the insulativedense portion 16 a and theporous portion 16 b, the insulativedense portion 16 a is provided with thereservoir 18 which holds the plasma medium therein, and by theporous portion 16 b, the inner surface of thereservoir 18 communicates with the gap between thecenter electrode 12 and theguide electrode 14, through the inside of the insulativedense portion 16 a. Accordingly, due to the presence of the insulativedense portion 16 a, the insulation in the coaxial electrode may be maintained even when a liquid metal as a plasma medium flows through theporous portion 16 b, whereby the plasma medium may be continuously supplied between thecenter electrode 12 and theguide electrode 14. - Furthermore, it is desirable that the
insulation member 16 be obtained by integrally molding the insulativedense portion 16 a and theporous portion 16 b in consideration of the structure of the device. However, the insulativedense portion 16 a and theporous portion 16 b may be bonded to each other (by adhering, brazing, or the like), or a seal structure is provided to prevent the plasma medium from leaking from a clearance between the insulativedense portion 16 a and theporous portion 16 b. - Moreover, in the first embodiment or the second embodiment of the invention, there are provided the
hollow reservoir insulation member supply device 50 which supplies the inert gas into thereservoir device 52 which adjusts the supply pressure of the inert gas, and the temperature-adjustable heating device 40 which heats and liquefies the plasma medium inside thereservoir insulation member heating device 40. Further, at the same time, it is possible to control the supply amount of the plasma medium (the liquid metal) by adjusting the pressure of the inert gas to be supplied into thereservoir supply device 50 and the pressure-adjustingdevice 52. - Therefore, it is possible to continuously supply the plasma medium, supply the plasma medium at the sufficient supply speed, and independently control the supply amount and the vapor pressure of the plasma medium.
- Furthermore, it should be understood that the invention is not limited to the above-described embodiments and all modifications may be included in the scope of the appended claims or the equivalents thereof.
- 1: SYMMETRY PLANE
- 2: PLANAR DISCHARGE (CURRENT SHEET)
- 3: PLASMA
- 4: TUBULAR DISCHARGE
- 5: PLASMA-CONFINING MAGNETIC FIELD
- 6: PLASMA MEDIUM
- 8: PLASMA LIGHT (EUV)
- 10: COAXIAL ELECTRODE
- 12, 12B: CENTER ELECTRODE
- 12 a: SCREW SHAFT
- 13: NUT
- 14, 14B: GUIDE ELECTRODE
- 15: CLOSING PLATE
- 16, 16B: INSULATION MEMBER (PARTIALLY POROUS CERAMICS)
- 16 a: INSULATIVE DENSE PORTION
- 16 b: POROUS PORTION
- 18, 18B: RESERVOIR
- 20: DISCHARGE-ENVIRONMENT-MAINTAINING DEVICE
- 30: VOLTAGE-APPLYING DEVICE
- 32: POSITIVE VOLTAGE SOURCE
- 34: NEGATIVE VOLTAGE SOURCE
- 36: TRIGGER SWITCH
- 40: HEATING DEVICE
- 42, 42B: ELECTRIC HEATER
- 44: HEATING POWER SUPPLY
Claims (7)
1. A plasma light source comprising:
a pair of coaxial electrodes that face each other;
a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma; and
a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes,
wherein a tubular discharge is formed between the pair of coaxial electrodes so as to confine the plasma in an axial direction,
wherein each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds a facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
wherein the insulation member is formed of partially porous ceramics that include an insulative dense portion which does not permit the continuous permeation of the liquefied plasma medium and a porous portion which permits the continuous permeation of the liquefied plasma medium, and
wherein the insulative dense portion includes a reservoir that holds the plasma medium therein, and by the porous portion, the inner surface of the reservoir communicates with the gap between the center electrode and the guide electrode, through the inside of the insulative dense portion.
2. The plasma light source according to claim 1 , further comprising:
a temperature-adjustable heating device that heats the insulation member so as to liquefy the plasma medium therein.
3. The plasma light source according to claim 1 , further comprising:
a gas-supply device that supplies an inert gas into the reservoir; and
a pressure-adjusting device that adjusts a supply pressure of the inert gas.
4. A plasma light source comprising:
a pair of coaxial electrodes that face each other;
a discharge-environment-maintaining device that maintains a plasma medium inside the coaxial electrodes at a temperature and a pressure appropriate for the generation of plasma; and
a voltage-applying device that applies discharge voltages having reversed polarities to the respective coaxial electrodes,
wherein a tubular discharge is formed between the pair of coaxial electrodes so as to confine the plasma in an axial direction,
wherein each of the respective coaxial electrodes includes a rod-shaped center electrode that extends on a single axis, a guide electrode that surrounds a facing front end portion of the center electrode with a predetermined gap therebetween, and an insulation member that insulates the center electrode and the guide electrode from each other,
wherein the insulation member is formed of porous ceramics that has a front surface positioned at the side of the front end portion of the center electrode and has a rear surface at the opposite side thereof, and
wherein the plasma light source further comprises:
a hollow reservoir that is opened to the rear surface of the insulation member and holds the plasma medium therein;
a gas-supply device that supplies an inert gas into the reservoir;
a pressure-adjusting device that adjusts a supply pressure of the inert gas; and
a temperature-adjustable heating device that heats and liquefies the plasma medium inside the reservoir.
5. The plasma light source according to claim 1 ,
wherein the voltage-applying device includes
a positive voltage source that applies a positive discharge voltage which is higher than that of the guide electrode of one of the coaxial electrodes, to the center electrode of the one of the coaxial electrodes,
a negative voltage source that applies a negative discharge voltage which is lower than that of the guide electrode of the other of the coaxial electrodes, to the center electrode of the other of the coaxial electrodes, and
a trigger switch that causes the positive voltage source and the negative voltage source to simultaneously apply the discharge voltages to the respective coaxial electrodes.
6. The plasma light source according to claim 4 ,
wherein the voltage-applying device includes
a positive voltage source that applies a positive discharge voltage which is higher than that of the guide electrode of one of the coaxial electrodes, to the center electrode of the one of the coaxial electrodes,
a negative voltage source that applies a negative discharge voltage which is lower than that of the guide electrode of the other of the coaxial electrodes, to the center electrode of the other of the coaxial electrodes, and
a trigger switch that causes the positive voltage source and the negative voltage source to simultaneously apply the discharge voltages to the respective coaxial electrodes
7. The plasma light source according to claim 2 , further comprising:
a gas-supply device that supplies an inert gas into the reservoir; and
a pressure-adjusting device that adjusts a supply pressure of the inert gas.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
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JP2009-201836 | 2009-09-01 | ||
JP2009201836A JP5212918B2 (en) | 2009-09-01 | 2009-09-01 | Plasma light source |
JP2009-201835 | 2009-09-01 | ||
JP2009201835A JP5212917B2 (en) | 2009-09-01 | 2009-09-01 | Plasma light source |
PCT/JP2010/064757 WO2011027737A1 (en) | 2009-09-01 | 2010-08-31 | Plasma light source |
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US20120146511A1 true US20120146511A1 (en) | 2012-06-14 |
US8648536B2 US8648536B2 (en) | 2014-02-11 |
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US13/390,361 Expired - Fee Related US8648536B2 (en) | 2009-09-01 | 2010-08-31 | Plasma light source |
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US (1) | US8648536B2 (en) |
EP (1) | EP2475229A4 (en) |
KR (1) | KR101415886B1 (en) |
CN (1) | CN102484938B (en) |
TW (1) | TWI432098B (en) |
WO (1) | WO2011027737A1 (en) |
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JP2013062348A (en) * | 2011-09-13 | 2013-04-04 | Ihi Corp | Plasma light source and plasma light generating method |
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Also Published As
Publication number | Publication date |
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WO2011027737A1 (en) | 2011-03-10 |
KR20120049269A (en) | 2012-05-16 |
TW201130388A (en) | 2011-09-01 |
TWI432098B (en) | 2014-03-21 |
CN102484938A (en) | 2012-05-30 |
KR101415886B1 (en) | 2014-07-04 |
CN102484938B (en) | 2014-12-10 |
EP2475229A4 (en) | 2015-03-18 |
EP2475229A1 (en) | 2012-07-11 |
US8648536B2 (en) | 2014-02-11 |
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