US20120073867A1 - Circuit structure - Google Patents
Circuit structure Download PDFInfo
- Publication number
- US20120073867A1 US20120073867A1 US13/313,896 US201113313896A US2012073867A1 US 20120073867 A1 US20120073867 A1 US 20120073867A1 US 201113313896 A US201113313896 A US 201113313896A US 2012073867 A1 US2012073867 A1 US 2012073867A1
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- United States
- Prior art keywords
- conductive layer
- patterned conductive
- patterned
- circuit structure
- solder mask
- Prior art date
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/243—Reinforcing the conductive pattern characterised by selective plating, e.g. for finish plating of pads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0364—Conductor shape
- H05K2201/0367—Metallic bump or raised conductor not used as solder bump
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/0989—Coating free areas, e.g. areas other than pads or lands free of solder resist
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10674—Flip chip
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0562—Details of resist
- H05K2203/0574—Stacked resist layers used for different processes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/108—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by semi-additive methods; masks therefor
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3452—Solder masks
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49126—Assembling bases
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
- Y10T29/49165—Manufacturing circuit on or in base by forming conductive walled aperture in base
Definitions
- the present invention generally relates to a circuit structure and a manufacturing method thereof, and more particularly, to a circuit structure disposed on a circuit substrate and a manufacturing method of the circuit structure.
- Typical electronic products include a chip and a substrate (e.g., chip carrier) connected to the chip.
- the chip includes an active surface with a plurality of bumps (e.g., gold bumps) disposed thereon, and is electrically connected to a circuit structure of the substrate by flip-chip bonding.
- the chip can receive a signal from or transmit a signal to the circuit structure of the substrate via the bumps. Therefore, the high reliability of the connecting between the bumps and the circuit structure of the substrate is critically important to the quality of signal transmission.
- a thermal stress may be generated between the chip and the substrate due to unmatched coefficient of thermal expansion. Therefore, an underfill is typically filled in between the chip and the substrate to enclose the bumps to avoid transverse crack of the bumps that could result from a long time influence by the thermal stress between the chip and the substrate.
- FIG. 1 is a cross-sectional view of a conventional flip-chip package structure.
- the chip 110 is disposed on a substrate 120 by flip-chip bonding, and the chip 110 includes a plurality of bumps 112 for electrically connecting to a circuit structure 122 of the substrate 120 .
- a solder mask 130 is disposed on the substrate 120 for covering a part of the circuit structure 122 . Because the solder mask 130 needs to protect this part of the circuit structure 122 from being influenced during a soldering process, the solder mask 130 needs to maintain a certain thickness.
- the present invention is directed to a method for making a circuit structure, through which the interval between a chip and a solder mask can be increased.
- the present invention is also directed to a circuit structure which, when connected to a chip, has an increased interval between the chip and a solder mask.
- the present invention provides a method for making a circuit structure as follows. Firstly, a base conductive layer is formed on a carrier board. A first patterned plating-resistant layer is then formed on the base conductive layer. The first patterned plating-resistant layer comprises at least one trench which exposes a part of the base conductive layer. A first patterned conductive layer is formed in the trench. Next, a second patterned plating-resistant layer is formed which covers the first patterned conductive layer and a part of the first plating-resistant layer. The second patterned plating-resistant layer comprises an opening to expose a part of the first patterned conductive layer. A second patterned conductive layer is then formed on the first patterned conductive layer that is exposed by the opening.
- the first patterned plating-resistant layer and the second patterned plating-resistant layer are removed.
- the base conductive layer exposed by the first patterned conductive layer is removed.
- a patterned solder mask is formed which covers a part of the first patterned conductive layer.
- the patterned solder mask comprises at least one opening to expose the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
- the material of the first patterned conductive layer is one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof.
- the material of the second patterned conductive layer is the same as the material of the first patterned conductive layer.
- the material of the first patterned plating-resistant layer and the second patterned plating-resistant layer comprises a photosensitive material.
- the first patterned conductive layer is formed by a plating process, a physical deposition process, or a chemical deposition process.
- the second patterned conductive layer is formed by a plating process, a physical deposition process, or a chemical deposition process.
- the present invention also provides a circuit structure suitable for being disposed on a carrier board.
- the circuit structure comprises a first patterned conductive layer, a second patterned conductive layer, and a solder mask.
- the first patterned conductive layer is disposed on the carrier board.
- the second patterned conductive layer is disposed on a part of the first patterned conductive layer.
- a part of the edge of the second patterned conductive layer and a part of the edge of the first patterned conductive layer are substantially coplanar.
- the patterned solder mask covers a part of the first patterned conductive layer and has at least one opening for exposing the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
- the material of the first patterned conductive layer is one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof.
- the material of the second patterned conductive layer is the same as the material of the first patterned conductive layer.
- the circuit structure further comprises a base conductive layer disposed between the first patterned conductive layer and the carrier board.
- the second patterned conductive layer is only formed at locations where the circuit structure and bumps of the chip are connected, and the patterned solder mask merely covers the first patterned conductive layer. Therefore, the second patterned conductive layer not only can raise the height of the solder pad, but also can increase the interval between the chip and the patterned solder mask, thereby overcoming the problem in the prior art that the underfill is difficult to fill in the interval between the chip and the solder mask due to the small interval between the chip and the solder mask.
- FIG. 1 is a cross-sectional view of a conventional circuit structure.
- FIGS. 2A through 2G are perspective views illustrating a process for making a circuit structure according to one embodiment of the present invention.
- FIG. 3 is a cross-sectional view of a flip-chip package structure formed by a circuit structure according to one embodiment of the present invention and a chip.
- FIGS. 2A through 2G are perspective views illustrating a process for making a circuit structure according to one embodiment of the present invention.
- a base conductive layer 210 is formed on a carrier board 202 .
- the carrier board 202 may be, for example, a dielectric substrate, a single layer circuit substrate, or a multi-layered circuit substrate.
- the carrier board 202 is illustrated as a dielectric substrate for the purpose of description only and should not be regarded as limiting.
- the base conductive layer 210 may be formed by electroless plating or physical vapor deposition.
- the electroless plating may be, for example, chemical deposition of copper film.
- the material of the base conductive layer 210 may be, for example, one of copper, aluminum, gold, platinum, nickel, tin, alloy of the above metals, or any combination thereof, or alternatively be another suitable conductive material.
- a first patterned plating-resistant layer 220 is formed on the base conductive layer 210 .
- the first patterned plating-resistant layer 220 has at least one trench 222 which exposes a part of the base conductive layer 210 .
- the material of the first patterned plating-resistant layer 220 is, for example, a photosensitive material, such as, a dry film or a liquid film.
- the first patterned plating-resistant layer 220 may be formed, for example, by first attaching a layer of photosensitive material on the base conductive layer 210 and subsequently patterning the photosensitive material layer.
- the first patterned plating-resistant layer 220 may be formed, for example, by first coating a layer of photosensitive material on the base conductive layer 210 and subsequently patterning the photosensitive material layer.
- the patterning process used herein includes an exposure and development process or a photo etching process, or the like.
- the photo etching process includes using a light source, such as, an ultraviolet light, an infrared light or an excimer laser, to directly form the trench 222 in the photosensitive material layer.
- a first patterned conductive layer 230 is formed in the trench 222 .
- the first patterned conductive layer 230 is, for example, a circuitry layer.
- the first patterned conductive layer 230 may be formed by a plating process or an electroless plating process.
- the electroless plating process may be a physical deposition or a chemical deposition.
- the first patterned plating-resistant layer 220 is formed on the base conductive layer 210 , in the illustrated embodiment, the first patterned conductive layer 230 may be formed in a specific area (i.e., the area exposed by the trench 222 ) on the base conductive layer 210 by using the plating process or the electroless plating process.
- the material of the first patterned conductive layer 230 may be, for example, one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material.
- a second patterned plating-resistant layer 240 is formed on the first patterned conductive layer 230 and a part of the first patterned plating-resistant layer, 220 .
- the second patterned plating-resistant layer 240 has at least one first opening 242 for exposing a part of the first patterned conductive layer 230 .
- the second patterned plating-resistant layer 240 may be formed in the same way as the first patterned plating-resistant layer 220 .
- the material of the second patterned plating-resistant layer 240 may be a photosensitive material such as a dry film or a liquid film.
- a second patterned conductive layer 250 is formed on the first patterned conductive layer 230 that is exposed by the first opening 242 of the second patterned plating-resistant layer 240 .
- the second patterned conductive layer 250 may be formed in the same way as the first patterned conductive layer 230 . It is noted that, since the second patterned plating-resistant layer 240 covers a part of the first patterned conductive layer 230 , the second patterned conductive layer 250 can be selectively formed in a specific area on the first patterned conductive layer 230 (i.e., the area exposed by the first opening 242 ).
- the material of the second patterned conductive layer 250 may be, for example, one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material.
- the material of the first patterned conductive layer 230 may be the same as the material of the second patterned conductive layer 250 .
- the first patterned plating-resistant layer 220 and the second patterned plating-resistant layer 240 are removed.
- the base conductive layer 210 exposed by the first patterned conductive layer 230 is removed by using, for example, an etching process.
- a patterned solder mask 260 is formed to cover a part of the first patterned conductive layer 230 .
- the patterned soldering layer 260 includes at least one second opening 262 for exposing the second patterned conductive layer 250 and a part of the first patterned conductive layer 230 adjacent to the second patterned conductive layer 250 .
- the patterned solder mask 260 may be formed by, for example, an ink jet printing process or a traditional image transfer process which involves coating of a soldering-resistant material and a subsequent exposure and development process.
- the first patterned conductive layer 230 , the second patterned conductive layer 250 , and the patterned solder mask 260 collectively form a circuit structure 300 .
- the surfaces of the conductive layers 210 , 230 , 250 exposed by the solder mask 260 are subjected to a surface anti-oxidation treatment to form an anti-oxidation layer (not shown).
- These anti-oxidation layers can prevent oxidation of the exposed conductive layer 210 , 230 , 250 .
- the material of the anti-oxidation layer may be one of nickel and gold, silver, tin, organic solderability preservative (OSP), and any combination thereof, or alternatively be another suitable anti-oxidation material.
- circuit structure 300 The construction of the circuit structure 300 is described in greater detail below.
- the circuit structure 300 includes a first patterned conductive layer 230 , a second patterned conductive layer 250 , and a patterned solder mask 260 .
- the first patterned conductive layer 230 is disposed on a carrier 202 .
- the carrier 202 may be, for example, a dielectric substrate, a single-layered circuit substrate or multi-layered circuit substrate.
- the second patterned conductive layer 250 is disposed on a part of the first patterned conductive layer 230 , with a part of an edge 252 of the second patterned conductive layer 250 and a part of an edge 232 of the first patterned conductive layer 230 are coplanar.
- the first patterned conductive layer 230 has a first sidewall 234
- the second patterned conductive layer 250 has a second sidewall 254 substantially coplanar with the first sidewall 234 .
- the material of the first patterned conductive layer 230 may be the same as the material of the second patterned conductive layer 250 .
- a base conductive layer 210 may further be disposed between the first patterned conductive layer 230 and the carrier board 202 .
- the material of the base conductive layer 210 is, for example, one of copper, aluminum, gold, platinum, nickel, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material.
- the material of the base conductive layer 210 is, for example, the same as the material of the first patterned conductive layer 230 and the second patterned conductive layer 250 (e.g., the material of the base conductive layer 210 , first conductive layer 230 and second conductive layer 250 are all copper).
- a patterned solder mask 260 is formed to cover a part of the first patterned conductive layer 230 .
- the patterned solder mask 260 has at least one second opening 262 for exposing the second patterned conductive layer 250 and a part of the first patterned conductive layer 230 adjacent to the second patterned conductive layer 250 .
- the second patterned layer 250 and the portion of the first patterned conductive layer 230 adjacent to the second patterned conductive layer 250 which are exposed by the second opening 262 , may be used as a solder pad P suitable for being connected to bumps of a chip (not shown).
- FIG. 3 is a cross-sectional view of a flip-chip package structure formed by a circuit structure according to one embodiment of the present invention and a chip.
- the circuit structure 300 of this embodiment is the same as the circuit structure 300 shown in FIG. 2G and, therefore, its construction is not repeated herein.
- the chip 410 has an active surface 412 with a plurality of bumps 414 formed thereon. While two bumps 414 are shown in FIG. 3 , the number of the bumps 414 should not be limited to two and, thus, in other embodiments, the number of the bumps 414 could be more than two.
- the bumps 414 extend into the second openings 262 of the patterned solder mask 260 to be connected to the second patterned conductive layer 250 .
- the second patterned conductive layer 250 is only formed at locations where the circuit structure 300 and the bumps 414 are connected, the second patterned conductive layer 250 can raise the thickness of the solder pad P thus increasing the height of the solder pad P.
- the patterned solder mask 260 merely covers the first patterned conductive layer 230 . Therefore, when the height of the solder pad P is raised by the second patterned conductive layer 250 , the height of the patterned solder mask 260 will not be increased correspondingly.
- the increased height of the solder pad P raised by the second patterned conductive layer 250 can increase the interval H 2 between the chip 410 and the patterned solder mask 260 , thus facilitating filling the underfill 420 in the interval between the chip 410 and the patterned solder mask 260 .
- the second patterned conductive layer is only formed at locations where the circuit structure and bumps of the chip are connected, and the patterned solder mask merely covers the first patterned conductive layer. Therefore, the second patterned conductive layer not only can raise the height of the solder pad, but also can increase the interval between the chip and the patterned solder mask, thus facilitating filling the underfill in the interval between the chip and the patterned solder mask, so as to raise the reliability of the connection between bumps of a chip and the circuit structure.
Abstract
A circuit structure suitable for being disposed on a carrier board. The circuit structure comprises a first patterned conductive layer, a second patterned conductive layer, and a solder mask. The first patterned conductive layer is disposed on the carrier board. The second patterned conductive layer is disposed on a part of the first patterned conductive layer. A part of the edge of the second patterned conductive layer and a part of the edge of the first patterned conductive layer are substantially coplanar. The patterned solder mask covers a part of the first patterned conductive layer and has at least one opening for exposing the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
Description
- This is a divisional application of and claims priority benefit of an U.S. application Ser. No. 12/181,556, filed on Jul. 29, 2008, now in condition of allowance. The prior U.S. application Ser. No. 12/181,556 claims the priority benefit of Taiwan application serial no. 97119179, filed on May 23, 2008. The entirety of each of the above-mentioned patent applications is hereby incorporated by reference herein and made a part of this specification.
- 1. Field of the Invention
- The present invention generally relates to a circuit structure and a manufacturing method thereof, and more particularly, to a circuit structure disposed on a circuit substrate and a manufacturing method of the circuit structure.
- 2. Description of Related Art
- In this information society, people are pursuing products with high speed, high quality and multifunction. As to the product appearance, it is trending toward light, thin and small. Typical electronic products include a chip and a substrate (e.g., chip carrier) connected to the chip. The chip includes an active surface with a plurality of bumps (e.g., gold bumps) disposed thereon, and is electrically connected to a circuit structure of the substrate by flip-chip bonding. The chip can receive a signal from or transmit a signal to the circuit structure of the substrate via the bumps. Therefore, the high reliability of the connecting between the bumps and the circuit structure of the substrate is critically important to the quality of signal transmission.
- In addition, a thermal stress may be generated between the chip and the substrate due to unmatched coefficient of thermal expansion. Therefore, an underfill is typically filled in between the chip and the substrate to enclose the bumps to avoid transverse crack of the bumps that could result from a long time influence by the thermal stress between the chip and the substrate.
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FIG. 1 is a cross-sectional view of a conventional flip-chip package structure. Referring toFIG. 1 , thechip 110 is disposed on asubstrate 120 by flip-chip bonding, and thechip 110 includes a plurality ofbumps 112 for electrically connecting to acircuit structure 122 of thesubstrate 120. Asolder mask 130 is disposed on thesubstrate 120 for covering a part of thecircuit structure 122. Because thesolder mask 130 needs to protect this part of thecircuit structure 122 from being influenced during a soldering process, thesolder mask 130 needs to maintain a certain thickness. However, if the interval H1 between thechip 110 and thesolder mask 130 is too small, theunderfill 140 cannot easily be filled in the interval between thechip 110 and thesubstrate 120, which may affect the reliability of the connecting between thebumps 112 and thecircuit structure 122 of thesubstrate 120. What needed, therefore, is to increase the interval H1 between thechip 110 and thesolder mask 130. - Accordingly, the present invention is directed to a method for making a circuit structure, through which the interval between a chip and a solder mask can be increased.
- The present invention is also directed to a circuit structure which, when connected to a chip, has an increased interval between the chip and a solder mask.
- The present invention provides a method for making a circuit structure as follows. Firstly, a base conductive layer is formed on a carrier board. A first patterned plating-resistant layer is then formed on the base conductive layer. The first patterned plating-resistant layer comprises at least one trench which exposes a part of the base conductive layer. A first patterned conductive layer is formed in the trench. Next, a second patterned plating-resistant layer is formed which covers the first patterned conductive layer and a part of the first plating-resistant layer. The second patterned plating-resistant layer comprises an opening to expose a part of the first patterned conductive layer. A second patterned conductive layer is then formed on the first patterned conductive layer that is exposed by the opening. Next, the first patterned plating-resistant layer and the second patterned plating-resistant layer are removed. The base conductive layer exposed by the first patterned conductive layer is removed. Finally, a patterned solder mask is formed which covers a part of the first patterned conductive layer. The patterned solder mask comprises at least one opening to expose the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
- According to one embodiment of the present invention, the material of the first patterned conductive layer is one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof.
- According to one embodiment of the present invention, the material of the second patterned conductive layer is the same as the material of the first patterned conductive layer.
- According to one embodiment of the present invention, the material of the first patterned plating-resistant layer and the second patterned plating-resistant layer comprises a photosensitive material.
- According to one embodiment of the present invention, the first patterned conductive layer is formed by a plating process, a physical deposition process, or a chemical deposition process.
- According to one embodiment of the present invention, the second patterned conductive layer is formed by a plating process, a physical deposition process, or a chemical deposition process.
- The present invention also provides a circuit structure suitable for being disposed on a carrier board. The circuit structure comprises a first patterned conductive layer, a second patterned conductive layer, and a solder mask. The first patterned conductive layer is disposed on the carrier board. The second patterned conductive layer is disposed on a part of the first patterned conductive layer. A part of the edge of the second patterned conductive layer and a part of the edge of the first patterned conductive layer are substantially coplanar. The patterned solder mask covers a part of the first patterned conductive layer and has at least one opening for exposing the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
- According to one embodiment of the present invention, the material of the first patterned conductive layer is one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof.
- According to one embodiment of the present invention, the material of the second patterned conductive layer is the same as the material of the first patterned conductive layer.
- According to one embodiment of the present invention, the circuit structure further comprises a base conductive layer disposed between the first patterned conductive layer and the carrier board.
- In summary, since in the circuit structure of the present invention, the second patterned conductive layer is only formed at locations where the circuit structure and bumps of the chip are connected, and the patterned solder mask merely covers the first patterned conductive layer. Therefore, the second patterned conductive layer not only can raise the height of the solder pad, but also can increase the interval between the chip and the patterned solder mask, thereby overcoming the problem in the prior art that the underfill is difficult to fill in the interval between the chip and the solder mask due to the small interval between the chip and the solder mask.
- In order to make the aforementioned and other features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below.
-
FIG. 1 is a cross-sectional view of a conventional circuit structure. -
FIGS. 2A through 2G are perspective views illustrating a process for making a circuit structure according to one embodiment of the present invention. -
FIG. 3 is a cross-sectional view of a flip-chip package structure formed by a circuit structure according to one embodiment of the present invention and a chip. -
FIGS. 2A through 2G are perspective views illustrating a process for making a circuit structure according to one embodiment of the present invention. - Referring to
FIG. 2A , firstly, a baseconductive layer 210 is formed on acarrier board 202. In various embodiments of the present invention, thecarrier board 202 may be, for example, a dielectric substrate, a single layer circuit substrate, or a multi-layered circuit substrate. In this illustrated embodiment, thecarrier board 202 is illustrated as a dielectric substrate for the purpose of description only and should not be regarded as limiting. The baseconductive layer 210 may be formed by electroless plating or physical vapor deposition. The electroless plating may be, for example, chemical deposition of copper film. The material of the baseconductive layer 210 may be, for example, one of copper, aluminum, gold, platinum, nickel, tin, alloy of the above metals, or any combination thereof, or alternatively be another suitable conductive material. - Next, as shown in
FIG. 2A , a first patterned plating-resistant layer 220 is formed on the baseconductive layer 210. The first patterned plating-resistant layer 220 has at least onetrench 222 which exposes a part of the baseconductive layer 210. The material of the first patterned plating-resistant layer 220 is, for example, a photosensitive material, such as, a dry film or a liquid film. In case the photosensitive material is the dry film, the first patterned plating-resistant layer 220 may be formed, for example, by first attaching a layer of photosensitive material on the baseconductive layer 210 and subsequently patterning the photosensitive material layer. In case the photosensitive material is the liquid film, the first patterned plating-resistant layer 220 may be formed, for example, by first coating a layer of photosensitive material on the baseconductive layer 210 and subsequently patterning the photosensitive material layer. The patterning process used herein includes an exposure and development process or a photo etching process, or the like. The photo etching process includes using a light source, such as, an ultraviolet light, an infrared light or an excimer laser, to directly form thetrench 222 in the photosensitive material layer. - Afterwards, referring to 2B, a first patterned
conductive layer 230 is formed in thetrench 222. In the illustrated embodiment, the first patternedconductive layer 230 is, for example, a circuitry layer. In addition, in the illustrated embodiment, the first patternedconductive layer 230 may be formed by a plating process or an electroless plating process. The electroless plating process may be a physical deposition or a chemical deposition. It is noted that, since the first patterned plating-resistant layer 220 is formed on the baseconductive layer 210, in the illustrated embodiment, the first patternedconductive layer 230 may be formed in a specific area (i.e., the area exposed by the trench 222) on the baseconductive layer 210 by using the plating process or the electroless plating process. In various embodiments of the present invention, the material of the first patternedconductive layer 230 may be, for example, one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material. - Next, referring to
FIG. 2C , a second patterned plating-resistant layer 240 is formed on the first patternedconductive layer 230 and a part of the first patterned plating-resistant layer, 220. The second patterned plating-resistant layer 240 has at least onefirst opening 242 for exposing a part of the first patternedconductive layer 230. The second patterned plating-resistant layer 240 may be formed in the same way as the first patterned plating-resistant layer 220. The material of the second patterned plating-resistant layer 240 may be a photosensitive material such as a dry film or a liquid film. - Next, referring to
FIG. 2D , a second patternedconductive layer 250 is formed on the first patternedconductive layer 230 that is exposed by thefirst opening 242 of the second patterned plating-resistant layer 240. In the illustrate embodiment, the second patternedconductive layer 250 may be formed in the same way as the first patternedconductive layer 230. It is noted that, since the second patterned plating-resistant layer 240 covers a part of the first patternedconductive layer 230, the second patternedconductive layer 250 can be selectively formed in a specific area on the first patterned conductive layer 230 (i.e., the area exposed by the first opening 242). - In addition, the material of the second patterned
conductive layer 250 may be, for example, one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material. Besides, in the illustrated embodiment, the material of the first patternedconductive layer 230 may be the same as the material of the second patternedconductive layer 250. - Afterwards, referring to
FIG. 2E , the first patterned plating-resistant layer 220 and the second patterned plating-resistant layer 240 are removed. Subsequently, referring toFIG. 2F , the baseconductive layer 210 exposed by the first patternedconductive layer 230 is removed by using, for example, an etching process. - Next, referring to
FIG. 2G , apatterned solder mask 260 is formed to cover a part of the first patternedconductive layer 230. The patternedsoldering layer 260 includes at least onesecond opening 262 for exposing the second patternedconductive layer 250 and a part of the first patternedconductive layer 230 adjacent to the second patternedconductive layer 250. In this illustrated embodiment, the patternedsolder mask 260 may be formed by, for example, an ink jet printing process or a traditional image transfer process which involves coating of a soldering-resistant material and a subsequent exposure and development process. The first patternedconductive layer 230, the second patternedconductive layer 250, and the patternedsolder mask 260 collectively form acircuit structure 300. - In addition, in the illustrated embodiment, the surfaces of the
conductive layers solder mask 260 are subjected to a surface anti-oxidation treatment to form an anti-oxidation layer (not shown). These anti-oxidation layers can prevent oxidation of the exposedconductive layer - The construction of the
circuit structure 300 is described in greater detail below. - Referring to
FIG. 2G , thecircuit structure 300 includes a first patternedconductive layer 230, a second patternedconductive layer 250, and apatterned solder mask 260. The first patternedconductive layer 230 is disposed on acarrier 202. In various embodiments of the present invention, thecarrier 202 may be, for example, a dielectric substrate, a single-layered circuit substrate or multi-layered circuit substrate. - The second patterned
conductive layer 250 is disposed on a part of the first patternedconductive layer 230, with a part of anedge 252 of the second patternedconductive layer 250 and a part of anedge 232 of the first patternedconductive layer 230 are coplanar. For example, in the illustrated embodiment, the first patternedconductive layer 230 has afirst sidewall 234, and the second patternedconductive layer 250 has asecond sidewall 254 substantially coplanar with thefirst sidewall 234. - In addition, in the illustrated embodiment, the material of the first patterned
conductive layer 230 may be the same as the material of the second patternedconductive layer 250. Besides, in the illustrated embodiment, a baseconductive layer 210 may further be disposed between the first patternedconductive layer 230 and thecarrier board 202. The material of the baseconductive layer 210 is, for example, one of copper, aluminum, gold, platinum, nickel, tin, alloy of the above metals, and any combination thereof, or alternatively be another suitable conductive material. Furthermore, the material of the baseconductive layer 210 is, for example, the same as the material of the first patternedconductive layer 230 and the second patterned conductive layer 250 (e.g., the material of the baseconductive layer 210, firstconductive layer 230 and secondconductive layer 250 are all copper). - A patterned
solder mask 260 is formed to cover a part of the first patternedconductive layer 230. The patternedsolder mask 260 has at least onesecond opening 262 for exposing the second patternedconductive layer 250 and a part of the first patternedconductive layer 230 adjacent to the second patternedconductive layer 250. The secondpatterned layer 250 and the portion of the first patternedconductive layer 230 adjacent to the second patternedconductive layer 250, which are exposed by thesecond opening 262, may be used as a solder pad P suitable for being connected to bumps of a chip (not shown). -
FIG. 3 is a cross-sectional view of a flip-chip package structure formed by a circuit structure according to one embodiment of the present invention and a chip. Referring toFIG. 3 , thecircuit structure 300 of this embodiment is the same as thecircuit structure 300 shown inFIG. 2G and, therefore, its construction is not repeated herein. Thechip 410 has anactive surface 412 with a plurality ofbumps 414 formed thereon. While twobumps 414 are shown inFIG. 3 , the number of thebumps 414 should not be limited to two and, thus, in other embodiments, the number of thebumps 414 could be more than two. Thebumps 414 extend into thesecond openings 262 of the patternedsolder mask 260 to be connected to the second patternedconductive layer 250. - Since in the
circuit structure 300 of the illustrated embodiment, the second patternedconductive layer 250 is only formed at locations where thecircuit structure 300 and thebumps 414 are connected, the second patternedconductive layer 250 can raise the thickness of the solder pad P thus increasing the height of the solder pad P. In addition, the patternedsolder mask 260 merely covers the first patternedconductive layer 230. Therefore, when the height of the solder pad P is raised by the second patternedconductive layer 250, the height of the patternedsolder mask 260 will not be increased correspondingly. As a result, the increased height of the solder pad P raised by the second patternedconductive layer 250 can increase the interval H2 between thechip 410 and the patternedsolder mask 260, thus facilitating filling theunderfill 420 in the interval between thechip 410 and the patternedsolder mask 260. - In summary, since in the circuit structure of the present invention, the second patterned conductive layer is only formed at locations where the circuit structure and bumps of the chip are connected, and the patterned solder mask merely covers the first patterned conductive layer. Therefore, the second patterned conductive layer not only can raise the height of the solder pad, but also can increase the interval between the chip and the patterned solder mask, thus facilitating filling the underfill in the interval between the chip and the patterned solder mask, so as to raise the reliability of the connection between bumps of a chip and the circuit structure.
- It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
Claims (4)
1. A circuit structure, suitable for being disposed on a carrier board, comprising:
a first patterned conductive layer disposed on the carrier board;
a second patterned conductive layer disposed on a part of the first patterned conductive layer, a part of the edge of the second patterned conductive layer and a part of the edge of the first patterned conductive layer are substantially coplanar; and
a patterned solder mask covering a part of the first patterned conductive layer, the patterned solder mask having at least one opening for exposing the second patterned conductive layer and a part of the first patterned conductive layer adjacent to the second patterned conductive layer.
2. The circuit structure according to claim 1 , wherein the material of the first patterned conductive layer is one of copper, aluminum, gold, platinum, nickel, silver, tin, alloy of the above metals, and any combination thereof.
3. The circuit structure according to claim 1 , wherein the material of the second patterned conductive layer is the same as the material of the first patterned conductive layer.
4. The circuit structure according to claim 1 , further comprising a base conductive layer disposed between the first patterned conductive layer and the carrier board.
Priority Applications (1)
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US13/313,896 US20120073867A1 (en) | 2008-05-23 | 2011-12-07 | Circuit structure |
Applications Claiming Priority (4)
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TW97119179 | 2008-05-23 | ||
US12/181,556 US8186049B2 (en) | 2008-05-23 | 2008-07-29 | Method of making a circuit structure |
US13/313,896 US20120073867A1 (en) | 2008-05-23 | 2011-12-07 | Circuit structure |
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US12/181,556 Division US8186049B2 (en) | 2008-05-23 | 2008-07-29 | Method of making a circuit structure |
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TWI365517B (en) * | 2008-05-23 | 2012-06-01 | Unimicron Technology Corp | Circuit structure and manufactring method thereof |
MY193261A (en) * | 2015-07-01 | 2022-09-28 | Qdos Interconnect Sdn Bhd | Integrated circuit package |
US10340173B2 (en) | 2016-10-11 | 2019-07-02 | Micron Technology, Inc. | System for handling semiconductor dies |
US10424553B2 (en) | 2016-10-31 | 2019-09-24 | Micron Technology, Inc. | Semiconductor devices with underfill control features, and associated systems and methods |
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US20080121417A1 (en) * | 2006-11-07 | 2008-05-29 | Unimicron Technology Corp. | Package substrate having embedded capacitor |
US20080160334A1 (en) * | 2007-01-02 | 2008-07-03 | Unimicron Technology Corp. | Circuit substrate and surface treatment process thereof |
US20080272489A1 (en) * | 2007-05-04 | 2008-11-06 | Powertech Technology Inc. | Package substrate and its solder pad |
US20090095508A1 (en) * | 2007-10-16 | 2009-04-16 | Samsung Electro-Mechanics Co., Ltd. | Printed circuit board and method for manufacturing the same |
US20090288858A1 (en) * | 2008-05-23 | 2009-11-26 | Unimicron Technology Corp. | Circuit structure and manufacturing method thereof |
Also Published As
Publication number | Publication date |
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US8186049B2 (en) | 2012-05-29 |
TWI365517B (en) | 2012-06-01 |
TW200950018A (en) | 2009-12-01 |
US20090288858A1 (en) | 2009-11-26 |
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