US20090029497A1 - Semiconductor light-emitting device and method of fabricating the same - Google Patents
Semiconductor light-emitting device and method of fabricating the same Download PDFInfo
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- US20090029497A1 US20090029497A1 US12/246,339 US24633908A US2009029497A1 US 20090029497 A1 US20090029497 A1 US 20090029497A1 US 24633908 A US24633908 A US 24633908A US 2009029497 A1 US2009029497 A1 US 2009029497A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
Definitions
- the invention relates to a semiconductor light-emitting device, and more particularly, to one with II-V group (or II-IV-V group) compound contact layer.
- II-V group or II-IV-V group
- Light-emitting diodes can be applied to various kinds of equipments, such as 1 optical display equipments, regulatory signs, telecommunication equipments, and illuminating equipments. Light-emitting diodes, distinct from the conventional light sources, are applicable to different industries.
- light-emitting diodes consume less electricity and respond more quickly. Furthermore, light-emitting diodes have better illuminating efficiency, longer life time, and smaller size; they also consume less power and do not have hazardous substances like mercury.
- the radiating principle of the light-emitting diodes is that the bonding of electrons and holes in the light-emitting layer of P-type and N-type semiconductors forms photons to generate light on forward bias. Because the P-type GaN semiconductor is hard to be doped, the contact of P-type GaN semiconductor and conductive layer produces higher resistance and consequently decreases the efficiency of P-type GaN semiconductor.
- Taiwanese Patent No. 459,407 provides a proposal to reduce the contact resistance between a P-type GaN semiconductor layer and a conductive layer.
- FIG. 1 illustrates a light-emitting diode structure having an n+ type reverse tunneling layer.
- the light-emitting diode structure includes an insulated sapphire substrate 11 , a GaN buffer layer 12 , an N-type GaN contact layer 13 , an N-type AlGaN constraint layer 14 , an InGaN light-emitting layer 15 , a P-type Al GaN constraint layer 16 , a P-type GaN contact layer 17 , an n+ type reverse tunneling layer 18 , a transparent conductive layer 19 , a first electrode 21 , and a second electrode 22 .
- the GaN buffer layer 12 is formed on the insulated sapphire substrate 11 .
- An N-type GaN contact layer 13 is formed on the GaN buffer layer 12 such that a partial area of the N-type GaN contact layer 13 is exposed.
- the first electrode 21 is formed on the exposed partial area of the N-type GaN contact layer 13 .
- the N-type A1GaN constraint layer 14 is formed on the N-type GaN contact layer 13 .
- the InGaN light-emitting layer 15 is formed on the N-type A1GaN constraint layer 14 .
- AlGaN constraint layer 16 is formed on the InGaN light-emitting layer 15 .
- the P-type GaN contact layer 17 is formed on the P-type Al GaN constraint layer 16 .
- the n+ type reverse tunneling layer 18 is formed on the P-type GaN contact layer 17 .
- the transparent conductive layer 19 is formed on the n+ type reverse tunneling layer 18 such that a partial area of the n+ type reverse tunneling layer 18 is exposed.
- the second electrode 22 is formed on the exposed partial area of the n+ type reverse tunneling layer 18 and contacts the transparent conductive layer 19 .
- the light-emitting diode improves the ohmic contact between the P-type GaN contact layer 17 and the transparent conductive layer 19 by adding an n+ type reverse tunneling layer 18 between them.
- the finished products of light-emitting diodes are not stable and have a higher production cost as well.
- a scope of the invention is to provide a semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer, capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer.
- the semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer has an easier manufacturing process; it also increases the stability for production and consequently has a lower production cost.
- a scope of the invention is to provide a semiconductor light-emitting device, with II-V group (or II-IV-V group) compound contact layer, capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer.
- a semiconductor light-emitting device includes a substrate, a first conductive type semiconductor material layer, a light-emitting layer, a first electrode, a second conductive type semiconductor material layer, a II-V group compound contact layer, a transparent conductive layer, and a second electrode.
- the first conductive type semiconductor material layer is formed on the substrate.
- the light-emitting layer is formed on the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed.
- the first electrode is formed on the exposed partial area of the first conductive type semiconductor material layer.
- the second conductive type semiconductor material layer is formed on the light-emitting layer.
- the II-V group compound contact layer is formed on the second conductive type semiconductor material layer.
- the transparent conductive layer is formed on the II-V group compound contact layer such that a partial area of the 11-V group compound contact layer is exposed.
- the second electrode is formed on the exposed partial area of the II-V group compound contact layer and contacts the transparent conductive layer.
- a semiconductor light-emitting device is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer is substituted by a II-IV-V group compound contact layer.
- a method of making a semiconductor light-emitting device is provided.
- the method according to the invention prepares a substrate.
- the method forms a first conductive type semiconductor material layer on the substrate.
- the method forms a light-emitting layer on the first conductive type semiconductor material layer.
- the method forms a second conductive type semiconductor material layer on the light-emitting layer.
- the method forms a II-V group compound contact layer on the second conductive type semiconductor material layer.
- the method partially removes the II-V group compound contact layer, the second conductive type semiconductor material layer, the light-emitting layer, and the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed.
- the method forms a first electrode on the exposed partial area of the first conductive type semiconductor material layer.
- the method forms a transparent conductive layer on the II-V group compound contact layer.
- the method partially removes the transparent conductive layer such that a partial area of the II-V group compound contact layer is exposed.
- the method forms a second electrode on the exposed partial area of the II-V group compound contact layer such that the second electrode contacts the transparent conductive layer.
- a method according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer is substituted by a II-TV-V group compound contact layer.
- FIG. 1 is the schematic sectional view of a light-emitting diode device with n+ type reverse tunneling layer.
- FIGS. 2A through 2G are the schematic sectional views illustrating a method of making a semiconductor light-emitting device with a II-V group compound contact layer according to a preferred embodiment of the invention.
- FIG. 3 is the graph of the I-V test conducted for the LEDs with and without a II-V group compound contact layer.
- FIGS. 2A through 2G are the schematic sectional views illustrating a method of making a semiconductor light-emitting device according to a preferred embodiment of the invention.
- the method according to the preferred embodiment of the invention prepares a substrate 31 and forms a first conductive type semiconductor material layer 32 on the substrate 31 .
- the material of the substrate 31 can be Si, GaN, AlN, sapphire, spinner SiC, GaAs, Al 2 O 3 , LiGaO 2 , LiAlO 2 , or MgAl 2 O 4 .
- the first conductive type semiconductor material layer 32 can be formed of a GaN material, and the first conductive type can be N-type.
- the method forms a light-emitting layer 33 on the first conductive type semiconductor material layer 32 .
- the material of the light-emitting layer 33 can be InGaN, AlGaN, or InGaAs.
- the method forms a second conductive type semiconductor material layer 34 on the light-emitting layer 33 .
- the second conductive type semiconductor material layer 34 can be formed of a GaN material, and the second conductive type can be P-type.
- the method forms a II-V group compound contact layer 35 on the second conductive type semiconductor material layer 34 .
- the II-V group compound contact layer 35 can be represented by the general formula: M,N Y , where M represents the H group chemical element, N represents the V group chemical element, 1 ⁇ x ⁇ 3, and 1 ⁇ y ⁇ 3; x and y are molar numbers.
- a II group chemical element in the H-V group compound contact layer 35 can be Zn, Be, Mg, Ca, Sr, Ba, or Ra. Furthermore, a V group chemical element in the II-V group compound contact layer 35 can be N, P, As, Sb, or Bi.
- the thickness of the II-V group compound contact layer 35 can range from 0.5 Angstroms to 500 Angstroms.
- the II-V group compound contact layer 35 can be formed at a temperature ranging from 400° C. to 1100° C.
- the method partially removes the II-V group compound contact layer 35 , the second conductive type semiconductor material layer 34 , the light-emitting layer 33 , and the first conductive type semiconductor material layer 32 such that a partial area of the first conductive type semiconductor material layer 32 is exposed. Then, the method forms a first electrode 37 on the exposed partial area of the first conductive type semiconductor material layer 32 .
- the method forms a transparent conductive layer 36 on the II-V group compound contact layer 35 . Then, the method partially removes the transparent conductive layer 36 such that a partial area of the II-V group compound contact layer 35 is exposed.
- the material of the transparent conductive layer 36 can be Ni/Au, ITO, CTO, TiWN, In 2 O 3 , SnO 2 , CdO, ZnO, CuGaO 2 , or SrCu 2 O 2 .
- the method forms a second electrode 38 on the exposed partial area of the II-V group compound contact layer 35 such that the second electrode contacts, the transparent conductive layer 36 .
- a method according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer 35 is substituted by a II-IV-V group compound contact layer.
- a IV group chemical element in the II-IV-V group compound contact layer can be C, Si, Ge, Sn, or Pb.
- the material of the II-IV-V group compound contact layer can be MgSiN 2 .
- FIG. 2G is the cross section view of the semiconductor light-emitting device according to a preferred embodiment of the invention.
- the semiconductor light-emitting device includes a substrate 31 , a first conductive type semiconductor material layer 32 , a light-emitting layer 33 , a first electrode 37 , a second conductive type semiconductor material layer 34 , a II-V group compound contact layer 35 , a transparent conductive layer 36 , and a second electrode 38 .
- the first conductive type semiconductor material layer 32 is formed on the substrate 31 .
- the material of the substrate 31 can be Si, GaN, AlN, sapphire, spinnel, SiC, GaAs, Al 2 O 3 , LiGaO 2 , LiAlO 2 , or MgAl 2 O 4 .
- the first conductive type semiconductor material layer 32 can be formed of a GaN material, and the first conductive type can be N-type.
- the light-emitting layer 33 is formed on the first conductive type semiconductor material layer 32 such that a partial area of the first conductive type semiconductor material layer 32 is exposed.
- the material of the light-emitting layer 33 can be InGaN, AlGaN, or InGaAs
- the first electrode 37 is formed on the exposed partial area of the first conductive type semiconductor material layer 32 .
- the second conductive type semiconductor material layer 34 is formed on the light-emitting layer 33 .
- the second conductive type semiconductor material layer 34 can be formed of a GaN material, and the second conductive type can be P-type.
- the II-V group compound contact layer 35 is formed on the second conductive type semiconductor material layer 34 .
- the II-V group compound contact layer 35 can be represented by the general formula: M x N y , where M represents the II group chemical element, N represents the V group chemical element, 1 ⁇ x ⁇ 3, and 1 ⁇ y ⁇ 3; x and y are molar numbers.
- a II group chemical element in the II-V group compound contact layer 35 can be Zn, Be, Mg, Ca, Sr, Ba, or Ra, Furthermore, a V group chemical element in the II-V group compound contact layer 35 can be N, P, As, Sb, or Bi.
- the thickness of the II-V group compound contact layer 35 can range from 0.5 Angstroms to 500 Angstroms.
- the II-V group compound contact layer 35 can be formed at a temperature ranging from 400° C. to 1100° C.
- the transparent conductive layer 36 is formed on the II-V group compound contact layer 35 such that a partial area of the II-V group compound contact layer 35 is exposed.
- the material of the transparent conductive layer 36 can be Ni/Au, ITO, CTO, TiWN, In 2 O 3 , SnO 2 , CdO, ZnO, CuGaO 2 , or SrCu 2 O 2 .
- the second electrode 38 is formed on the exposed partial area of the 11-V group compound contact layer 35 such that the second electrode contacts the transparent conductive layer 36 .
- a semiconductor light-emitting device is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer 35 is substituted by a II-IVV group compound contact layer.
- the material of the II-IV-V group compound contact layer can be MgSiN 2 .
- FIG. 3 is the drawing of the I-V test conducted for the LEDs with and without a II-V group compound contact layer according to a preferred embodiment of the invention.
- the II-V group compound contact layer, included in the LED is prepared by the reaction between ammonia and Cp 2 Mg; the II-V group compound contact layer is Mg 3 N 2 , where Mg originates from Cp 2 Mg.
- the LED with a II-V group compound contact layer has a lower resistance value than that without a II-V group compound contact layer.
- the II-V group compound contact layer provided by the invention is certainly applicable to other semiconductor light-emitting devices not described in the specification.
- the semiconductor light-emitting device with H-V group (or II-IV-V group) compound contact layer is capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer.
- the semiconductor light-emitting device with II-V group (or II-1V-V group) compound contact layer has an easier manufacturing process; it also increases the stability for production and consequently has lower cost for production.
Abstract
The invention provides a semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer and a method of fabricating the same. The semiconductor light-emitting device according to a preferred embodiment of the invention includes a substrate, a first conductive type semiconductor material layer, a light-emitting layer, a first electrode, a second conductive type semiconductor material layer, a H-V group (or II-W-V group) compound contact layer, a transparent conductive layer, and a second electrode. The existence of the II-V group (or II-IV-V group) compound contact layer improves the ohmic contact between the second conductive type semiconductor material layer and the transparent conductive layer.
Description
- This application is a Divisional of co-pending application Ser. No. 11/798,873 filed on Aug. 25, 2008, and for which priority is claimed under 35 U.S.C. § 120; and this application claims priority of Application No. 095127869 filed in Taiwan R.O.C. on Jul. 28, 2006 under 35 U.S.C. § 119; the entire contents of all are hereby incorporated by reference.
- 1. Field of the Invention
- The invention relates to a semiconductor light-emitting device, and more particularly, to one with II-V group (or II-IV-V group) compound contact layer. With respect to the technology background of the invention, please refer to the following references:
- [1] K. Kuriyama, Yukimi Takahashi, F. Sunohara. Optical band gap of Zn3N2 films. PHYSICAL REVIEW B 1993; 48(4):2781-2782;
- [2] B. Chelluri, T. Y. Chang, A. Ourmazd, A. H. Dayem, J. L. Zyskind, A. Srivastava. Molecular beam epitaxial growth of the II-V semiconductor compound Zn3As2 . Appi. Phys. Lett. 1986; 49(24):1665-1667;
- [3] M. Sieberer, J. Redinger, S. K melevskyi, P. Mohn. Ferromagnetism in tetrahedrally coordinated compounds of I/H-V elements: Ab initio calculations. PHYSICAL REVIEW B 2006; 73(024404): 1-9; and
- [4] C M Fang, R A de Groot, R J Bruls, H T Hintzen, G de With. Ab initio band structure calculations of Mg3N2 and MgSiN2 . J. Phys. 1999; Condens. Matter 11:4833-4842.
- 2. Description of the Prior Art
- Light-emitting diodes can be applied to various kinds of equipments, such as 1 optical display equipments, regulatory signs, telecommunication equipments, and illuminating equipments. Light-emitting diodes, distinct from the conventional light sources, are applicable to different industries.
- Compared to the tungsten lamps of prior art, light-emitting diodes consume less electricity and respond more quickly. Furthermore, light-emitting diodes have better illuminating efficiency, longer life time, and smaller size; they also consume less power and do not have hazardous substances like mercury.
- The radiating principle of the light-emitting diodes is that the bonding of electrons and holes in the light-emitting layer of P-type and N-type semiconductors forms photons to generate light on forward bias. Because the P-type GaN semiconductor is hard to be doped, the contact of P-type GaN semiconductor and conductive layer produces higher resistance and consequently decreases the efficiency of P-type GaN semiconductor.
- Taiwanese Patent No. 459,407 provides a proposal to reduce the contact resistance between a P-type GaN semiconductor layer and a conductive layer. Referring to
FIG. 1 ,FIG. 1 illustrates a light-emitting diode structure having an n+ type reverse tunneling layer. The light-emitting diode structure includes aninsulated sapphire substrate 11, aGaN buffer layer 12, an N-typeGaN contact layer 13, an N-typeAlGaN constraint layer 14, an InGaN light-emitting layer 15, a P-type Al GaNconstraint layer 16, a P-typeGaN contact layer 17, an n+ typereverse tunneling layer 18, a transparentconductive layer 19, afirst electrode 21, and asecond electrode 22. - The GaN
buffer layer 12 is formed on the insulatedsapphire substrate 11. An N-typeGaN contact layer 13 is formed on the GaNbuffer layer 12 such that a partial area of the N-typeGaN contact layer 13 is exposed. Thefirst electrode 21 is formed on the exposed partial area of the N-typeGaN contact layer 13. The N-typeA1GaN constraint layer 14 is formed on the N-typeGaN contact layer 13. The InGaN light-emitting layer 15 is formed on the N-typeA1GaN constraint layer 14. The P-type - AlGaN
constraint layer 16 is formed on the InGaN light-emitting layer 15. The P-typeGaN contact layer 17 is formed on the P-type Al GaNconstraint layer 16. The n+ typereverse tunneling layer 18 is formed on the P-typeGaN contact layer 17. The transparentconductive layer 19 is formed on the n+ typereverse tunneling layer 18 such that a partial area of the n+ typereverse tunneling layer 18 is exposed. Thesecond electrode 22 is formed on the exposed partial area of the n+ typereverse tunneling layer 18 and contacts the transparentconductive layer 19. - The light-emitting diode improves the ohmic contact between the P-type
GaN contact layer 17 and the transparentconductive layer 19 by adding an n+ typereverse tunneling layer 18 between them. - However, due to a complex manufacturing process and difficult control of the n+ type
reverse tunneling layer 18, the finished products of light-emitting diodes are not stable and have a higher production cost as well. - Accordingly, a scope of the invention is to provide a semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer, capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer. Moreover, the semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer has an easier manufacturing process; it also increases the stability for production and consequently has a lower production cost.
- A scope of the invention is to provide a semiconductor light-emitting device, with II-V group (or II-IV-V group) compound contact layer, capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer.
- A semiconductor light-emitting device according to a preferred embodiment of the invention includes a substrate, a first conductive type semiconductor material layer, a light-emitting layer, a first electrode, a second conductive type semiconductor material layer, a II-V group compound contact layer, a transparent conductive layer, and a second electrode. The first conductive type semiconductor material layer is formed on the substrate. The light-emitting layer is formed on the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed. The first electrode is formed on the exposed partial area of the first conductive type semiconductor material layer. The second conductive type semiconductor material layer is formed on the light-emitting layer. The II-V group compound contact layer is formed on the second conductive type semiconductor material layer. The transparent conductive layer is formed on the II-V group compound contact layer such that a partial area of the 11-V group compound contact layer is exposed. The second electrode is formed on the exposed partial area of the II-V group compound contact layer and contacts the transparent conductive layer.
- A semiconductor light-emitting device according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer is substituted by a II-IV-V group compound contact layer.
- According to a preferred embodiment of the invention, a method of making a semiconductor light-emitting device is provided. First, the method according to the invention prepares a substrate. Then, the method forms a first conductive type semiconductor material layer on the substrate. Next, the method forms a light-emitting layer on the first conductive type semiconductor material layer. Next, the method forms a second conductive type semiconductor material layer on the light-emitting layer. Next, the method forms a II-V group compound contact layer on the second conductive type semiconductor material layer. Next, the method partially removes the II-V group compound contact layer, the second conductive type semiconductor material layer, the light-emitting layer, and the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed. Then, the method forms a first electrode on the exposed partial area of the first conductive type semiconductor material layer. Next, the method forms a transparent conductive layer on the II-V group compound contact layer. Then, the method partially removes the transparent conductive layer such that a partial area of the II-V group compound contact layer is exposed. Finally, the method forms a second electrode on the exposed partial area of the II-V group compound contact layer such that the second electrode contacts the transparent conductive layer.
- A method according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group compound contact layer is substituted by a II-TV-V group compound contact layer.
- The advantage and spirit of the invention may be understood by the following recitations together with the appended drawings.
-
FIG. 1 is the schematic sectional view of a light-emitting diode device with n+ type reverse tunneling layer. -
FIGS. 2A through 2G are the schematic sectional views illustrating a method of making a semiconductor light-emitting device with a II-V group compound contact layer according to a preferred embodiment of the invention. -
FIG. 3 is the graph of the I-V test conducted for the LEDs with and without a II-V group compound contact layer. - Referring to
FIGS. 2A through 2G ,FIGS. 2A through 2G are the schematic sectional views illustrating a method of making a semiconductor light-emitting device according to a preferred embodiment of the invention. - First, referring to
FIG. 2A , the method according to the preferred embodiment of the invention prepares asubstrate 31 and forms a first conductive typesemiconductor material layer 32 on thesubstrate 31. - In one embodiment, the material of the
substrate 31 can be Si, GaN, AlN, sapphire, spinner SiC, GaAs, Al2O3, LiGaO2, LiAlO2, or MgAl2O4. - In one embodiment, the first conductive type
semiconductor material layer 32 can be formed of a GaN material, and the first conductive type can be N-type. - Next, referring to
FIG. 2B , the method forms a light-emittinglayer 33 on the first conductive typesemiconductor material layer 32. - In one embodiment, the material of the light-emitting
layer 33 can be InGaN, AlGaN, or InGaAs. - Next, referring to
FIG. 2C , the method forms a second conductive typesemiconductor material layer 34 on the light-emittinglayer 33. - In one embodiment, the second conductive type
semiconductor material layer 34 can be formed of a GaN material, and the second conductive type can be P-type. - Next, referring to
FIG. 2D , the method forms a II-V groupcompound contact layer 35 on the second conductive typesemiconductor material layer 34. - In one embodiment, the II-V group
compound contact layer 35 can be represented by the general formula: M,NY, where M represents the H group chemical element, N represents the V group chemical element, 1≦x≦3, and 1≦y≦3; x and y are molar numbers. - In one embodiment, a II group chemical element in the H-V group
compound contact layer 35 can be Zn, Be, Mg, Ca, Sr, Ba, or Ra. Furthermore, a V group chemical element in the II-V groupcompound contact layer 35 can be N, P, As, Sb, or Bi. - In one embodiment, the thickness of the II-V group
compound contact layer 35 can range from 0.5 Angstroms to 500 Angstroms. - In one embodiment, the II-V group
compound contact layer 35 can be formed at a temperature ranging from 400° C. to 1100° C. - Next, referring to
FIG. 2E , the method partially removes the II-V groupcompound contact layer 35, the second conductive typesemiconductor material layer 34, the light-emittinglayer 33, and the first conductive typesemiconductor material layer 32 such that a partial area of the first conductive typesemiconductor material layer 32 is exposed. Then, the method forms afirst electrode 37 on the exposed partial area of the first conductive typesemiconductor material layer 32. - Next, referring to
FIG. 2F , the method forms a transparentconductive layer 36 on the II-V groupcompound contact layer 35. Then, the method partially removes the transparentconductive layer 36 such that a partial area of the II-V groupcompound contact layer 35 is exposed. - In one embodiment, the material of the transparent
conductive layer 36 can be Ni/Au, ITO, CTO, TiWN, In2O3, SnO2, CdO, ZnO, CuGaO2, or SrCu2O2. - Finally, referring to
FIG. 2G , the method forms asecond electrode 38 on the exposed partial area of the II-V groupcompound contact layer 35 such that the second electrode contacts, the transparentconductive layer 36. - A method according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group
compound contact layer 35 is substituted by a II-IV-V group compound contact layer. A IV group chemical element in the II-IV-V group compound contact layer can be C, Si, Ge, Sn, or Pb. For example, the material of the II-IV-V group compound contact layer can be MgSiN2. - Again, referring to
FIG. 2G ,FIG. 2G is the cross section view of the semiconductor light-emitting device according to a preferred embodiment of the invention. - The semiconductor light-emitting device according to the preferred embodiment of the invention includes a
substrate 31, a first conductive typesemiconductor material layer 32, a light-emittinglayer 33, afirst electrode 37, a second conductive typesemiconductor material layer 34, a II-V groupcompound contact layer 35, a transparentconductive layer 36, and asecond electrode 38. - The first conductive type
semiconductor material layer 32 is formed on thesubstrate 31. - In one embodiment, the material of the
substrate 31 can be Si, GaN, AlN, sapphire, spinnel, SiC, GaAs, Al2O3, LiGaO2, LiAlO2, or MgAl2O4. - In one embodiment, the first conductive type
semiconductor material layer 32 can be formed of a GaN material, and the first conductive type can be N-type. - The light-emitting
layer 33 is formed on the first conductive typesemiconductor material layer 32 such that a partial area of the first conductive typesemiconductor material layer 32 is exposed. - In one embodiment, the material of the light-emitting
layer 33 can be InGaN, AlGaN, or InGaAs - The
first electrode 37 is formed on the exposed partial area of the first conductive typesemiconductor material layer 32. - The second conductive type
semiconductor material layer 34 is formed on the light-emittinglayer 33. - In one embodiment, the second conductive type
semiconductor material layer 34 can be formed of a GaN material, and the second conductive type can be P-type. - The II-V group
compound contact layer 35 is formed on the second conductive typesemiconductor material layer 34. - In one embodiment, the II-V group
compound contact layer 35 can be represented by the general formula: MxNy, where M represents the II group chemical element, N represents the V group chemical element, 1≦x≦3, and 1≦y≦3; x and y are molar numbers. - In one embodiment, a II group chemical element in the II-V group
compound contact layer 35 can be Zn, Be, Mg, Ca, Sr, Ba, or Ra, Furthermore, a V group chemical element in the II-V groupcompound contact layer 35 can be N, P, As, Sb, or Bi. - In one embodiment, the thickness of the II-V group
compound contact layer 35 can range from 0.5 Angstroms to 500 Angstroms. - In one embodiment, the II-V group
compound contact layer 35 can be formed at a temperature ranging from 400° C. to 1100° C. - The transparent
conductive layer 36 is formed on the II-V groupcompound contact layer 35 such that a partial area of the II-V groupcompound contact layer 35 is exposed. - In one embodiment, the material of the transparent
conductive layer 36 can be Ni/Au, ITO, CTO, TiWN, In2O3, SnO2, CdO, ZnO, CuGaO2, or SrCu2O2. - The
second electrode 38 is formed on the exposed partial area of the 11-V groupcompound contact layer 35 such that the second electrode contacts the transparentconductive layer 36. - A semiconductor light-emitting device according to another preferred embodiment of the invention is substantially the same as mentioned above, where the only difference is the II-V group
compound contact layer 35 is substituted by a II-IVV group compound contact layer. For example, the material of the II-IV-V group compound contact layer can be MgSiN2. - The experimental result, according to “Ab initio band structure calculations of Mg3N2 and Mg31N2” of Condens.
Matter 11, J. Phys (1999), proves that the energy gap of Mg3N2 is about 2.8 eV, while that of MgSiN2 is about 4.8 eV. Because the energy gap width of Mg3N2 and MgSiN2 is similar to that of InGaN, it is helpful to decrease the resistance value between the P-type GaN contact layer and the transparent conductive layer. - Referring to
FIG. 3 ,FIG. 3 is the drawing of the I-V test conducted for the LEDs with and without a II-V group compound contact layer according to a preferred embodiment of the invention. The II-V group compound contact layer, included in the LED, is prepared by the reaction between ammonia and Cp2Mg; the II-V group compound contact layer is Mg3N2, where Mg originates from Cp2Mg. Referring toFIG. 3 , the LED with a II-V group compound contact layer has a lower resistance value than that without a II-V group compound contact layer. Moreover, from the technical viewpoint, the II-V group compound contact layer provided by the invention is certainly applicable to other semiconductor light-emitting devices not described in the specification. - Obviously, the semiconductor light-emitting device with H-V group (or II-IV-V group) compound contact layer, according to a preferred embodiment of the invention, is capable of improving the ohmic contact between the P-type GaN contact layer and the transparent conductive layer. Moreover, compared to the prior art, the semiconductor light-emitting device with II-V group (or II-1V-V group) compound contact layer has an easier manufacturing process; it also increases the stability for production and consequently has lower cost for production.
- With the example and explanations above, the features and spirits of the invention will be hopefully well described. Those skilled in the art will readily observe that numerous modifications and alterations of the device may be made while retaining the teaching of the invention. Accordingly, the above disclosure should be construed as limited only by the metes and bounds of the appended claims.
Claims (20)
1. A method of making a semiconductor light-emitting device, said method comprising the steps of:
preparing a substrate;
forming a first conductive type semiconductor material layer on the substrate;
forming a light-emitting layer on the first conductive type semiconductor material layer;
forming a second conductive type semiconductor material layer on the light-emitting layer;
forming a II-V group compound contact layer on the second conductive type semiconductor material layer;
partially removing the TI-V group compound contact layer, the second conductive type semiconductor material layer, the light-emitting layer, and the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed;
forming a first electrode on the exposed partial area of the first conductive type semiconductor material layer;
forming a transparent conductive layer on the II-V group compound contact layer;
partially removing the transparent conductive layer such that a partial area of the II-V group compound contact layer is exposed; and
forming a second electrode on the exposed partial area of the II-V group compound contact layer such that the second electrode contacts the transparent conductive layer.
2. The method of claim 1 , wherein the substrate is formed of a material selected from a group consisting of Si, GaN, AlN, sapphire, spinnel, SiC, GaAs, Al2O3, LiGaO2, LiAlO2, and MgAl2O4.
3. The method of claim 11 , wherein the first conductive type semiconductor material layer and the second conductive type semiconductor material layer are formed of a GaN material, respectively.
4. The method of claim 1 , wherein the first conductive type is N-type, and the second conductive type is P-type.
5. The method of claim 1 , wherein the light-emitting layer is formed of a material selected from a group consisting of InGaN, AlGaN, and InGaAs.
6. The method of claim 1 , wherein a II group chemical element in the II-V group compound contact layer is one selected from the group consisting of Zn, Be, Mg, Ca, Sr, Ba, and Ra, and a V group chemical element in the TI-V group compound contact layer is one selected from the group consisting of N, P, As, Sb, and Bi.
7. The method of claim 1 , wherein the material of the II-V group compound contact layer is represented by the general formula: MxNy, where M represents the II group chemical element, N represents the V group chemical element, 1≦x≦3, and 1≦y≦3; x and y are molar numbers.
8. The method of claim 1 , wherein the thickness of the II-V group compound contact layer ranges from 0.5 Angstroms to 500 Angstroms.
9. The method of claim 1 , wherein the II-V group compound contact layer is formed at a temperature ranging from 400° C. to 1100° C.
10. The method of claim 1 , wherein the transparent conductive layer is formed of a material selected from a group consisting of Ni/Au, ITO, CTO, TiWN, In2O3, SnO2, CdO, ZnO, CuGaO2, and SrCu2O2.
11. A method of making a semiconductor light-emitting device, said method comprising the steps of:
preparing a substrate;
forming a first conductive type semiconductor material layer on the substrate;
forming a light-emitting layer on the first conductive type semiconductor material layer;
forming a second conductive type semiconductor material layer on the light-emitting layer;
forming a II-IV-V group compound contact layer on the second conductive type semiconductor material layer;
partially removing the II-IV-V group compound contact layer, the second conductive type semiconductor material layer, the light-emitting layer, and the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed;
forming a first electrode on the exposed partial area of the first conductive type semiconductor material layer;
forming a transparent conductive layer on the II-IV-V group compound contact layer;
partially removing the transparent conductive layer such that a partial area of the II-IV-V group compound contact layer is exposed; and
forming a second electrode on the exposed partial area of the II-IV-V group compound contact layer such that the second electrode contacts the transparent conductive layer.
12. The method of claim 11 , wherein the substrate is formed of a material selected from a group consisting of Si, GaN, AlN, sapphire, spinnel, SiC, GaAs, Al2O3, LiGaO2, LiAlO2, and MgAl2O4.
13. The method of claim 11 , wherein the first conductive type semiconductor material layer and the second conductive type semiconductor material layer are formed of a GaN material, respectively.
14. The method of claim 11 , wherein the first conductive type is N-type, and the second conductive type is P-type.
15. The method of claim 11 , wherein the light-emitting layer is formed of a material selected from a group consisting of InGaN, AlGaN, and, InGaAs.
16. The method of claim 11 , wherein a II group chemical element in the II-IV-V group compound contact layer is one selected from the group consisting of Zn, Be, Mg, Ca, Sr, Ba, and Ra, and a IV group chemical element in the II-IV-V group compound contact layer is one selected from the group consisting of C, Si, Ge, Sn, and Pb, and a V group chemical element in the II-IV-V group compound contact layer is one selected from the group consisting of N, P, As, Sb, and Bi.
17. The method of claim 11 , wherein the material of the II-IV-V group compound contact layer is represented by the general formula: MxNyQz, where M represents the II group chemical element, N represents the IV group chemical element, Q represents the V group chemical element, 1≦x≦3, 1≦y≦3 and 1≦z≦3; and x and y and z are molar numbers.
18. The method of claim 11 , wherein the thickness of the II-IV-V group compound contact layer ranges from 0.5 Angstroms to 500 Angstroms.
19. The method of claim 11 , wherein the II-IV-V group compound contact layer is formed at a temperature ranging from 400° C. to 1100° C.
20. The method of claim 11 , wherein the transparent conductive layer is formed of a material selected from a group consisting of Ni/Au, ITO, CTO, TiWN, In2O3, SnO2, CdO, ZnO, CuGaO2, and SrCu2O2.
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TW095127869A TWI306316B (en) | 2006-07-28 | 2006-07-28 | Semiconductor light emitting device and method of fabricating the same |
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US11/798,873 US7659557B2 (en) | 2006-07-28 | 2007-05-17 | Semiconductor light-emitting device and method of fabricating the same |
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US11/798,873 Expired - Fee Related US7659557B2 (en) | 2006-07-28 | 2007-05-17 | Semiconductor light-emitting device and method of fabricating the same |
US12/246,339 Abandoned US20090029497A1 (en) | 2006-07-28 | 2008-10-06 | Semiconductor light-emitting device and method of fabricating the same |
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US9331233B2 (en) | 2011-12-20 | 2016-05-03 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Method for manufacturing a semiconductor micro- or nano-wire, semiconductor structure comprising such a micro- or nano-wire, and method for manufacturing a semiconductor structure |
US20180307642A1 (en) * | 2017-04-25 | 2018-10-25 | Realtek Semiconductor Corp. | Apparatus and method for multiplexing data transport |
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TWI306316B (en) * | 2006-07-28 | 2009-02-11 | Huga Optotech Inc | Semiconductor light emitting device and method of fabricating the same |
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KR101020958B1 (en) * | 2008-11-17 | 2011-03-09 | 엘지이노텍 주식회사 | Method for manufacturing a gallium oxide substrate, light emitting device and method for fabricating the same |
TWI380481B (en) * | 2009-01-13 | 2012-12-21 | Huga Optotech Inc | Light-emitting diode with high light-emitting efficiency |
WO2010116422A1 (en) | 2009-04-09 | 2010-10-14 | パナソニック株式会社 | Nitride semiconductor light-emitting element, illuminating device, liquid crystal display device, method for producing nitride semiconductor light-emitting element and method for manufacturing illuminating device |
US8129574B2 (en) * | 2009-08-31 | 2012-03-06 | Honeywell International Inc. | Hydrogenation process for fluorocarbons |
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CN102648535A (en) * | 2009-12-09 | 2012-08-22 | 松下电器产业株式会社 | Nitride-based semiconductor light-emitting element, lighting device, liquid crystal display device, and method for producing lighting device |
WO2012145658A1 (en) | 2011-04-20 | 2012-10-26 | Magnetation, Inc. | Iron ore separation device |
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US7659557B2 (en) | 2010-02-09 |
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US20090200667A1 (en) | 2009-08-13 |
US20080023835A1 (en) | 2008-01-31 |
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US20080023709A1 (en) | 2008-01-31 |
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