US20070057670A1 - Signal Detection Circuit of Magnetic Sensor - Google Patents
Signal Detection Circuit of Magnetic Sensor Download PDFInfo
- Publication number
- US20070057670A1 US20070057670A1 US11/531,198 US53119806A US2007057670A1 US 20070057670 A1 US20070057670 A1 US 20070057670A1 US 53119806 A US53119806 A US 53119806A US 2007057670 A1 US2007057670 A1 US 2007057670A1
- Authority
- US
- United States
- Prior art keywords
- signal
- magnetic sensor
- circuit
- detecting
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/04—Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle
Definitions
- the same signal detection circuit can process the output voltages of a plurality of the detecting coils and variations are constrained at the time of the measurement.
- the component count and chip area of the signal detection circuit can be reduced.
- a measurement start signal is input from the microcomputer 71 to the control circuit 41 via the bus line 61 (t 1 ).
- the control circuit 41 When inputting the measurement start signal, the control circuit 41 outputs a signal (hereinafter, x-axis selection signal) for turning on the x-axis contacts of the excitation switch circuit 21 and the detection switch circuit 31 (t 2 ).
- the excitation switch circuit 21 and the detection switch circuit 31 turn on the contacts of the exciting coil 112 and the detecting coil 113 of the magnetic sensor 11 for measuring the magnetic field in the x-axis direction. In this way, the excitation switch circuit 21 selects the exciting coils 112 , 122 , 132 to which a drive signal P and a drive signal N are applied as described below.
- the same differential amplifier 33 and the same hysteresis comparator 34 perform processes for the output voltages of a plurality of the detecting coils 113 , 123 , 133 , variations are reduced in the measurement values of the detecting coils 113 , 123 , 133 . Since the same circuits are used in the processes for the output voltages of the detecting coils 113 , 123 , 133 in this way, the component count and the chip area can be reduced at the time of integration.
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
Description
- The present application claims priority from Japanese Patent Application No. 2005-264285 filed on Sep. 12, 2005, which is herein incorporated by reference.
- 1. Field of the Invention
- The present invention relates to a signal detection circuit of a magnetic sensor and, particularly, relates to technology for providing a highly-accurate and stable signal detection circuit of a magnetic sensor.
- 2. Description of the Related Art
- A so-called flux gate magnetometer is known which saturates a magnetic flux by inputting periodical drive signals to an exciting coil wound on a soft magnetic core to measure intensity of an external magnetic field from saturation time intervals changed depending on the size of the external magnetic field that is measured. The flux gate magnetometer has various excellent features for a magnetometer, such as (1) high sensitivity and magnetic field resolution, (2) capability of measuring a weak magnetic field, (3) a wide measurement range, (4) temperature stability better than magnetometers of other modes, and (5) high linearity to an input magnetic field.
- Japanese Patent Application Laid-Open Publication No. 2005-147947 is an example of such a flux gate magnetometer and discloses a flux gate magnetometer with a magnetic sensor that excites a ring core composed of a magnetic detecting material up to a saturated magnetic field area by electrifying an exciting coil with an alternating signal to measure a magnetic flux density using symmetric property of a saturated magnetic flux density induced in the ring core. Japanese Patent Application Laid-Open Publication No. 1996-285929 discloses a magnetometer that supplies an excitation current from an oscillator to an exciting coil at a flux gate formed by winding the exciting coil and a detecting coil on a core to perform synchronous rectification of the output of the detecting coil with a synchronous rectification circuit. Recently, the flux gate magnetometer is expected to be applied to small devices such as a magnetic sensor for a portable compass. Japanese Patent Application Laid-Open Publication No. 2005-61969 discloses a flux gate magnetometer for accomplishing further improvement in accuracy in measurement of a magnetic force.
- High accuracy and stability are required for a signal detection circuit detecting an output voltage of a detecting coil of the magnetic sensor in the flux gate magnetometer. For example, when the magnetic field measurement is performed in a plurality of spatial axis directions, a plurality of flux gate magnetometers is often used at the same time and, therefore, manufacturing variations must be reduced in each flux gate magnetometer in the case of mass production. When applying to small devices, a smaller component count is required and a chip area must not be occupied at the time of integration.
- The present invention was conceived in consideration of such circumstances and it is therefore one object of the present invention to provide a highly-accurate and stable signal detection circuit of a magnetic sensor having fewer manufacturing variations, which can be miniaturized.
- In order to achieve the above and other objects, according to a major aspect of the present invention there is provided a signal detection circuit of a magnetic sensor comprising a differential amplifier to which an output voltage of a detecting coil of the magnetic sensor is applied; a comparator to which an output of the differential amplifier is input, the comparator outputting a digital signal having one logical value during a period defined between two adjacent spike voltages included in the output voltage; and a counter that counts a number of pulses of a clock in a period when the output of the comparator has one logical value.
- Since the signal detection circuit of the magnetic sensor of the present invention counts the number of the pulses with the counter to digitally measure time intervals of two spike voltages included in the output voltage of the detecting coil, a magnetic field can be measured highly accurately. Since the counter is used instead of an analog circuit, the measurement can be performed in a short time. Since the output voltage of the magnetic sensor is immediately digitalized by the hysteresis comparator, the present invention is less affected by temperature and noises. Since the differential amplifier is used for amplifying the output voltages, the effect of the common-mode noise is reduced.
- According to another major aspect of the present invention there is provided a signal detection circuit of a magnetic sensor of
claim 1, comprising a switch circuit that is connected to a plurality of the detecting coils to select the detecting coil that is a target of detection. - Since the detecting coil to be detected is selected by the switch as needed, the same signal detection circuit can process the output voltages of a plurality of the detecting coils and variations are constrained at the time of the measurement. The component count and chip area of the signal detection circuit can be reduced.
- The present invention can thus provide a highly-accurate and stable signal detection circuit of a magnetic sensor having fewer manufacturing variations, which can be miniaturized.
- The above and other objects, aspects, features and advantages of the present invention will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings, in which:
-
FIG. 1 shows a configuration of aflux gate magnetometer 1 described as one embodiment of the present invention; -
FIG. 2 is a timing chart for describing the operation of theflux gate magnetometer 1 described as one embodiment of the present invention; -
FIG. 3 is shows an example of aSC integrator 80 described as one embodiment of the present invention; -
FIGS. 4A and 4B show states of switches SW1 to SW4 of theSC integrator 80 when generating signals in a step-up period of a drive signal; -
FIGS. 5A and 5B show states of the switches SW1 to SW4 of theSC integrator 80 when generating signals in a step-down period of the drive signal; and -
FIGS. 6A and 6B show examples of the drive signal generated by theSC integrator 80. - An embodiment of the present invention will hereinafter be described in detail.
FIG. 1 shows a configuration of a flux gate magnetometer described as one embodiment of the present invention. A flux gate magnetometer shown inFIG. 1 has threemagnetic sensors magnetic sensor exciting coil detecting coil magnetic core exciting coil excitation switch circuit 21, anoninverting amplifier 22, an invertingamplifier 23, a D/A converter 24, and a control logic that controls the operation of the D/A converter 24 (hereinafter, DAC control logic 25). The output voltage of thedetecting coil detection switch circuit 31, avoltage adjustment circuit 32 that adjusts the output voltage to a predetermined voltage level, adifferential amplifier 33 that amplifies the output voltage, ahysteresis comparator 34 that outputs a low level digital signal in a period between two spike voltages included in the output voltage, and acounter 35 that counts the number of pulses of a clock signal in a period when the digital signal output from thehysteresis comparator 34 is in the low level. - A
control circuit 41 controls theDAC control logic 25. Thecontrol circuit 41 receives and stores a count value input from thecounter 35 into aninternal memory 411. Thecontrol circuit 41 is connected to acontrol line 51 of theexcitation switch circuit 21 and thedetection switch circuit 31 and thecontrol circuit 41 controls the opening/closing of theswitch 21 and theswitch 31 through thecontrol line 51. Thecontrol circuit 41 is communicatably connected to a microcomputer 71 (external apparatus) via abus line 61 and transmits the count value stored in thememory 411 to themicrocomputer 71 as needed. -
FIG. 2 is a timing chart of the operation of theflux gate magnetometer 1 of the embodiment. The operation of theflux gate magnetometer 1 will be described with reference to the timing chart ofFIG. 2 . In the following description, it is assumed that all the contacts of theexcitation switch circuit 21 and thedetection switch circuit 31 are opened (turned off) in advance. - As shown in
FIG. 2 , a measurement start signal is input from themicrocomputer 71 to thecontrol circuit 41 via the bus line 61 (t1). When inputting the measurement start signal, thecontrol circuit 41 outputs a signal (hereinafter, x-axis selection signal) for turning on the x-axis contacts of theexcitation switch circuit 21 and the detection switch circuit 31 (t2). When inputting the x-axis selection signal, theexcitation switch circuit 21 and thedetection switch circuit 31 turn on the contacts of theexciting coil 112 and the detectingcoil 113 of themagnetic sensor 11 for measuring the magnetic field in the x-axis direction. In this way, theexcitation switch circuit 21 selects theexciting coils - The
control signal 41 then outputs a drive start enable signal to the DAC control logic 25 (t3). When inputting the drive start enable signal to theDAC control logic 25, DAC data are input to the D/A converter 24. Specifically, down-count data are input as the DAC data (t4 to t5). Because of the down-count data, a signal is applied immediately before a step-up period to prevent theexciting coil 112 from generating a high-voltage back electromotive force causing damages of circuit elements such as thenoninverting amplifier 22 and the invertingamplifier 23. TheDAC control logic 25 then outputs up-count data to the D/A converter 24 for the DAC data (t5). As a result, the D/A converter 24 outputs a signal for a step-up period of a triangular wave (t5 to t8). - The
DAC control logic 25 stops the output of the up-count data to the D/A converter 24 at t8 and then outputs the down-count data. As a result, the D/A converter 24 outputs a signal for a step-down period of the triangular wave (t8 to t11). TheDAC control logic 25 stops the output of the down-count data to the D/A converter 24 at t11 and then outputs the up-count data. Because of the down-count data, a signal is applied immediately after the step-down period to prevent the exciting coil from generating a high-voltage back electromotive force causing damages of circuit elements such as thenoninverting amplifier 22 and the invertingamplifier 23. - A drive signal of the D/
A converter 24 is supplied to the noninverting input terminal of thenoninverting amplifier 22. A Vref signal of the D/A converter 24 is supplied to the noninverting input terminal of the invertingamplifier 23. The output of thenoninverting amplifier 22 is fed back negatively to the inverting input terminal of thenoninverting amplifier 22. The output of thenoninverting amplifier 22 is input to the inverting input terminal of the invertingamplifier 23. As a result, thenoninverting amplifier 22 outputs a signal shown by a solid line ofFIG. 2 (hereinafter, drive signal P), which is acquired by amplifying the output signal of the D/A converter 24, and the invertingamplifier 23 outputs a signal shown by a dotted line ofFIG. 2 (hereinafter, drive signal N), which is acquired by inverting the oscillation of the drive signal P. - The drive signal P output from the
noninverting amplifier 22 is applied to one of two terminals of theexciting coil 112. The drive signal N output from the invertingamplifier 23 is applied to the other of two terminals of theexciting coil 112. Therefore, a difference voltage between the drive signal P and the drive signal N is applied to the exciting coil 112 (hereinafter, this voltage is referred to as an exciting voltage). - As shown in
FIG. 2 , spike voltages (t7, t10) generated between the terminals of the detectingcoil 113 are caused by the electromotive force generated in a non-saturated section of a B-H curve (B: magnetic flux density, H: magnetic field) of themagnetic sensor 11. A time interval (Tx) of two spike voltages at t7 and t10 is changed depending on an external magnetic field AH applied to themagnetic sensor 11. That is, information about intensity, etc. of the external magnetic field AH can be acquired by measuring the time interval (Tx) of the output of the two spike voltages. - The spike voltages generated in the detecting
coil 113 are converted to predetermined voltage levels by thevoltage adjustment circuit 32 and are input to thedifferential amplifier 33 for amplification. The output voltage amplified by thedifferential amplifier 33 is input to thehysteresis comparator 34. - The
hysteresis comparator 34 outputs a digital signal becoming low level in a period sandwiched by adjacent spike voltages included in the output voltage and becoming high level in other periods. In an initial state, thehysteresis comparator 34 outputs the high level. Thehysteresis comparator 34 starts the output of the low level at the timing of the input of the spike voltage generated due to the polarity inversion of the exciting voltage at t6 (t7). Thehysteresis comparator 34 switches the output to the high level at the timing of the input of the spike voltage generated due to the polarity inversion of the exciting voltage at t9 (t10). - The digital signal output from the
hysteresis comparator 34 is input to thecounter 35. The clock signal is input to thecounter 35, and the counter 35 counts the number of pulses of the clock signal in a period when the digital signal output from thehysteresis comparator 34 is in the low level. When the digital signal becomes high level and the counting of the number of the pulses is terminated, thecounter 35 outputs the count value to thecontrol circuit 41. Thecontrol circuit 41 stores the input count value to thememory 411. - The
control circuit 41 then turns off the drive start enable signal that is input to the DAC control logic 25 (t13). Thecontrol circuit 41 stops the input of the X-axis selection signal to theexcitation switch circuit 21 and the detection switch circuit 31 (t14) As a result, the contacts are turned off in theexciting coil 112 and the detectingcoil 113 of themagnetic sensor 11 for measuring the magnetic field in the x-axis direction. - The
control circuit 41 then transmits a signal (hereinafter, Y-axis selection signal) for turning on the Y-axis contacts of theexcitation switch circuit 21 and the detection switch circuit 31 (t15). As a result, the process for the Y-axis is started. The process for the Y-axis is performed in a period from t15 to t16 as is the case with the X-axis. The process for the Z-axis is also performed in a period from t17 to t18 as is the case with the X-axis. - When the count value is stored in the
memory 411 for each of the X-axis, Y-axis, and Z-axis, thecontrol circuit 41 transmits to themicrocomputer 71 an interrupt signal notifying that the writing of the count values is completed (t19). When receiving the interrupt signal, themicrocomputer 71 transmits a read request to thecontrol circuit 41. As a result, themicrocomputer 71 reads the count value stored in thememory 411 of thecontrol circuit 41 for each of the X-axis, Y-axis, and Z-axis (t20). The count values read by themicrocomputer 71 are utilized for measuring the intensity, etc. of the external magnetic field ΔH. - By the way, in the
flux gate magnetometer 1 of the embodiment with the configuration described above, the signals for driving theexciting coils DAC control logic 25 and the D/A converter 24. Therefore, the highly-accurate and stable drive signals are generated which are less affected by the temperature, etc., as compared to the case of using analog circuits. The manufacturing variations are also constrained by using the digital circuits. - In the
flux gate magnetometer 1 of the embodiment, a plurality of theexciting coils A converter 24. Therefore, the uniform exciting voltage can be applied to each of theexciting coils - Since the digital circuits are used in the
flux gate magnetometer 1 of the embodiment, the lengths of the step-up period (t5 to t8) and the step-down period (t8 to t11) of the drive signal can be matched highly accurately to improve the measurement accuracy. Since some circuits necessary in the case of the analog circuit are not needed which are, for example, circuits measuring the overall lengths of the drive signals for correcting the effects of the measurement intervals of errors included in the time intervals (Tx, Ty, Tz), the small-sizedflux gate magnetometer 1 with lower electric power consumption can be achieved. - Since the
flux gate magnetometer 1 of the embodiment counts the number of the pulses of the clock signal with thecounter 35 to measure the time intervals (Tx, Ty, Tz) of two spike voltages, the measurement can be performed with accuracy higher than the case of using the analog circuits. Although an A/D converter occupying large chip area is generally needed at the time of integration if the analog circuits measure the time intervals (Tx, Ty, Tz), since thecounter 35 is acounter 35 occupying small chip area, the small-sizedflux gate magnetometer 1 can be achieved. - Although an integrator is needed for improving accuracy of a measurement value and it is difficult to reduce the measurement time in a conventional method of measuring the time intervals (Tx, Ty, Tz) with the use of the combination of phase detection and filters, the measurement can be performed in a short time since the
counter 35 is used. This constrains consumption currents as well. - The
flux gate magnetometer 1 of the embodiment is less affected by temperature and noises since the output voltage of the detectingcoil hysteresis comparator 33 at an early stage. - In the
flux gate magnetometer 1 of the embodiment, since the samedifferential amplifier 33 and thesame hysteresis comparator 34 perform processes for the output voltages of a plurality of the detectingcoils coils coils - In the
flux gate magnetometer 1 of the embodiment, since thedifferential amplifier 33 is used for amplifying the output voltages, less common-mode noise is mixed. Since the detectingcoils - Although one embodiment of the present invention has been described in detail as above, the description of the embodiment is for the purpose of facilitating the understanding of the present invention and does not limit the present invention. The present invention may be changed and altered without departing from the spirit thereof and the present invention includes the equivalents thereof. For example, a low-pass filter may be inserted at the stage after the D/
A converter 24 to smooth the drive signal output from the D/A converter 24. - The drive signal maybe generated by an SC (switched capacitor) integrator with a configuration shown in
FIG. 3 instead of the D/A converter 24. TheSC integrator 80 shown inFIG. 3 is constituted by four switches SW1 to SW4, a capacitor C1, and anintegration circuit 81 using an operational amplifier. The switch SW1, the capacitor C1, and SW4 are serially connected in this order; SW1 is connected to a direct-current power source Vin; and the output of SW4 is input to the noninverting input terminal of the operational amplifier constituting theintegration circuit 81. The switch SW2 is connected between the switch SW1 and the capacitor C1 and one end of the switch SW2 is grounded. The switch SW3 is connected between the capacitor C1 and the switch SW4 and one end of the switch SW3 is grounded. - When the
SC integrator 80 ofFIG. 3 generates signals in the step-up period of the drive signal constituted by a triangular wave, the switches SW1 to SW4 are switched at constant intervals Δt1 such that states shown inFIGS. 4A and 4B are achieved alternately (crawl type driving mode). Therefore, as shown inFIG. 6A , a drive signal can be acquired which is pressured up stepwise at constant inclination. When generating signals in the step-down period of the drive signal, the switches SW1 to SW4 are switched at constant intervals Δt2 such that states shown inFIGS. 5A and 5B are achieved alternately (butterfly type driving mode). Therefore, as shown inFIG. 6B , a drive signal can be acquired which is pressured down stepwise at constant inclination. A linear drive signal can be acquired by smoothing the drive signal output from theSC integrator 80 through the low-pass filter. - The
SC integrator 80 can match Δt1 and Δt2 accurately with the use of known digital circuits and can generate the exact triangular wave with the step-up period and the step-down period having inclinations matched highly accurately. Therefore, when theSC integrator 80 is used, theflux gate magnetometer 1 can also be achieved which can measure a magnetic field highly accurately as is the case with the D/A converter 24. - While the illustrative and presently preferred embodiment of the present invention has been described in detail herein, it is to be understood that the inventive concepts may otherwise variously be embodied and employed and that the appended claims are intended to be construed to include such variations except insofar as limited by the prior art.
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005264285A JP4856916B2 (en) | 2005-09-12 | 2005-09-12 | Magnetic sensor signal detection circuit |
JP2005-264285 | 2005-09-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20070057670A1 true US20070057670A1 (en) | 2007-03-15 |
US7652472B2 US7652472B2 (en) | 2010-01-26 |
Family
ID=37565291
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/531,198 Active US7652472B2 (en) | 2005-09-12 | 2006-09-12 | Magnetic sensor signal detection circuit using a counter |
Country Status (7)
Country | Link |
---|---|
US (1) | US7652472B2 (en) |
EP (1) | EP1762859B1 (en) |
JP (1) | JP4856916B2 (en) |
KR (1) | KR100804390B1 (en) |
CN (1) | CN1932541B (en) |
DE (1) | DE602006019676D1 (en) |
TW (1) | TWI293124B (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070063699A1 (en) * | 2002-09-18 | 2007-03-22 | Samsung Electronics Co., Ltd. | Sensing apparatus having fluxgate and control method thereof |
US20080292044A1 (en) * | 2007-05-24 | 2008-11-27 | Sanyo Electric Co., Ltd. | Signal Detection Circuit |
CN104079858A (en) * | 2014-07-14 | 2014-10-01 | 天津瑞发科半导体技术有限公司 | Backward signal transmitting and mixing device |
US20160259017A1 (en) * | 2015-03-05 | 2016-09-08 | Sii Semiconductor Corporation | Magnetic sensor circuit |
US20170310254A1 (en) * | 2016-04-26 | 2017-10-26 | Johnson Electric S.A. | Magnetic sensor integrated circuit, motor assembly and application device |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7898250B2 (en) * | 2004-06-18 | 2011-03-01 | The United States Of America As Represented By The Secretary Of The Navy | Coupled fluxgate magnetometers for DC and time-varying target magnetic field detection |
JP5060871B2 (en) * | 2007-08-22 | 2012-10-31 | セイコーインスツル株式会社 | Variable voltage dividing circuit and magnetic sensor circuit |
KR100977460B1 (en) | 2008-12-09 | 2010-08-24 | 한국전기연구원 | Method for detecting failure of thyristor power converter circuit |
CN103023584B (en) * | 2010-05-10 | 2015-08-12 | 国民技术股份有限公司 | A kind ofly to detect and the analog front-end device of transmission system for low frequency signal |
US10449815B2 (en) * | 2011-10-12 | 2019-10-22 | Horizon Global Americas Inc. | Current sensing electrical converter |
TWI436083B (en) * | 2011-11-02 | 2014-05-01 | Ind Tech Res Inst | Proximity current sensing apparatus and method |
JP5948105B2 (en) * | 2012-03-28 | 2016-07-06 | 株式会社フジクラ | Signal detection circuit, electronic compass, current sensor |
JP5364814B2 (en) | 2012-05-15 | 2013-12-11 | 株式会社フジクラ | Magnetic element control device, magnetic element control method, and magnetic detection device |
JP5364816B1 (en) | 2012-06-08 | 2013-12-11 | 株式会社フジクラ | Magnetic element control device, magnetic element control method, and magnetic detection device |
JP5393844B2 (en) | 2012-06-08 | 2014-01-22 | 株式会社フジクラ | Magnetic element control device, magnetic element control method, and magnetic detection device |
US10085328B2 (en) | 2014-08-11 | 2018-09-25 | RAB Lighting Inc. | Wireless lighting control systems and methods |
US10531545B2 (en) | 2014-08-11 | 2020-01-07 | RAB Lighting Inc. | Commissioning a configurable user control device for a lighting control system |
US10039174B2 (en) | 2014-08-11 | 2018-07-31 | RAB Lighting Inc. | Systems and methods for acknowledging broadcast messages in a wireless lighting control network |
US10517164B1 (en) | 2019-05-09 | 2019-12-24 | RAB Lighting Inc. | Universal phase control dimmer for wireless lighting control |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4918824A (en) * | 1988-10-05 | 1990-04-24 | International Navigation, Inc. | Electronic digital compass |
US5229725A (en) * | 1992-04-07 | 1993-07-20 | Moore Products Co. | Electrical fault detector in remote systems using a saturable core |
US5757184A (en) * | 1995-09-29 | 1998-05-26 | Sony Corporation | Magnetic field detection apparatus with bilateral electrical switch for inverting magnetic sensor current |
US6166539A (en) * | 1996-10-30 | 2000-12-26 | Regents Of The University Of Minnesota | Magnetoresistance sensor having minimal hysteresis problems |
US6282803B1 (en) * | 1998-04-24 | 2001-09-04 | Laser Technology, Inc. | Self calibration circuit for determining an accurate zero compensation for a fluxgate compass |
US6411080B1 (en) * | 2001-04-02 | 2002-06-25 | Delphi Technologies, Inc. | Signal processing method for a variable reluctance vehicle speed sensing mechanism |
US20050110483A1 (en) * | 2003-11-26 | 2005-05-26 | Samsung Electronics Co., Ltd. | Three-axis fluxgate-type magnetism detecting device and method |
US7208945B2 (en) * | 2001-10-30 | 2007-04-24 | Tt Electronics Technology Limited | Sensing apparatus and method |
US7355398B2 (en) * | 2005-09-12 | 2008-04-08 | Sanyo Electric Co., Ltd. | Exciting coil drive circuit of magnetic sensor |
US7366619B2 (en) * | 2006-02-27 | 2008-04-29 | Denso Corporation | Signal-processing unit for fluxgate magnetometers |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US539A (en) | 1837-12-26 | Standard measurer for taking measure for coats | ||
US6166A (en) | 1849-03-10 | Improvement in rope machinery | ||
JPS63115231A (en) * | 1986-10-31 | 1988-05-19 | Nok Corp | Function signal generator |
JPH03272483A (en) * | 1990-02-28 | 1991-12-04 | Nkk Corp | Detecting device of magnetism |
JP2617615B2 (en) * | 1990-10-19 | 1997-06-04 | 日本鋼管株式会社 | Magnetic measurement method and device |
SE502773C2 (en) * | 1990-01-04 | 1996-01-08 | Instrument Verken Ab | magnetic field detector |
JP3353533B2 (en) | 1995-04-19 | 2002-12-03 | 株式会社島津製作所 | Magnetometer |
JP3360550B2 (en) | 1996-10-17 | 2002-12-24 | 住友電気工業株式会社 | Magnetic sensor drive circuit device |
JP3063654B2 (en) | 1996-12-06 | 2000-07-12 | 住友電気工業株式会社 | Voltage amplifier circuit for magnetic sensor |
JPH11142191A (en) * | 1997-11-13 | 1999-05-28 | Yokogawa Electric Corp | Measuring apparatus |
JP2000337808A (en) | 1999-05-26 | 2000-12-08 | Matsushita Electric Works Ltd | Sensor |
KR20030093427A (en) * | 2002-06-03 | 2003-12-11 | 최규철 | Magnetic sensor |
KR100465335B1 (en) * | 2002-09-18 | 2005-01-13 | 삼성전자주식회사 | Sensing apparatus having pluxgate sensor |
KR100464541B1 (en) * | 2003-06-10 | 2005-01-03 | 삼성전자주식회사 | Fluxgate type magnetometer capable of reducing power consumption |
JP2005061969A (en) | 2003-08-11 | 2005-03-10 | Asahi Kasei Electronics Co Ltd | Azimuthal angle measuring instrument and azimuthal angle measuring method |
KR100555668B1 (en) * | 2003-11-11 | 2006-03-03 | 삼성전자주식회사 | Fluxgate sensor for calibrating azimuth at slope and calibration method thereof |
JP2005147947A (en) | 2003-11-18 | 2005-06-09 | Meisei Electric Co Ltd | Core for magnetic sensor, magnetic sensor, and flux gate magnetometer |
JP2005227038A (en) * | 2004-02-10 | 2005-08-25 | Sanyo Electric Co Ltd | Measuring instrument |
-
2005
- 2005-09-12 JP JP2005264285A patent/JP4856916B2/en not_active Expired - Fee Related
-
2006
- 2006-07-12 CN CN2006101015599A patent/CN1932541B/en not_active Expired - Fee Related
- 2006-08-16 TW TW095130172A patent/TWI293124B/en not_active IP Right Cessation
- 2006-09-11 KR KR1020060087226A patent/KR100804390B1/en not_active IP Right Cessation
- 2006-09-12 EP EP06254747A patent/EP1762859B1/en not_active Not-in-force
- 2006-09-12 US US11/531,198 patent/US7652472B2/en active Active
- 2006-09-12 DE DE602006019676T patent/DE602006019676D1/en active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4918824A (en) * | 1988-10-05 | 1990-04-24 | International Navigation, Inc. | Electronic digital compass |
US5229725A (en) * | 1992-04-07 | 1993-07-20 | Moore Products Co. | Electrical fault detector in remote systems using a saturable core |
US5757184A (en) * | 1995-09-29 | 1998-05-26 | Sony Corporation | Magnetic field detection apparatus with bilateral electrical switch for inverting magnetic sensor current |
US6166539A (en) * | 1996-10-30 | 2000-12-26 | Regents Of The University Of Minnesota | Magnetoresistance sensor having minimal hysteresis problems |
US6282803B1 (en) * | 1998-04-24 | 2001-09-04 | Laser Technology, Inc. | Self calibration circuit for determining an accurate zero compensation for a fluxgate compass |
US6411080B1 (en) * | 2001-04-02 | 2002-06-25 | Delphi Technologies, Inc. | Signal processing method for a variable reluctance vehicle speed sensing mechanism |
US7208945B2 (en) * | 2001-10-30 | 2007-04-24 | Tt Electronics Technology Limited | Sensing apparatus and method |
US20050110483A1 (en) * | 2003-11-26 | 2005-05-26 | Samsung Electronics Co., Ltd. | Three-axis fluxgate-type magnetism detecting device and method |
US7355398B2 (en) * | 2005-09-12 | 2008-04-08 | Sanyo Electric Co., Ltd. | Exciting coil drive circuit of magnetic sensor |
US7366619B2 (en) * | 2006-02-27 | 2008-04-29 | Denso Corporation | Signal-processing unit for fluxgate magnetometers |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070063699A1 (en) * | 2002-09-18 | 2007-03-22 | Samsung Electronics Co., Ltd. | Sensing apparatus having fluxgate and control method thereof |
US7405561B2 (en) * | 2002-09-18 | 2008-07-29 | Samsung Electronics Co., Ltd. | Reduced power sensing apparatus having fluxgate and control method thereof |
US20080292044A1 (en) * | 2007-05-24 | 2008-11-27 | Sanyo Electric Co., Ltd. | Signal Detection Circuit |
US7746973B2 (en) | 2007-05-24 | 2010-06-29 | Sanyo Electric Co., Ltd. | Signal detection circuit |
CN104079858A (en) * | 2014-07-14 | 2014-10-01 | 天津瑞发科半导体技术有限公司 | Backward signal transmitting and mixing device |
US20160259017A1 (en) * | 2015-03-05 | 2016-09-08 | Sii Semiconductor Corporation | Magnetic sensor circuit |
US9746531B2 (en) * | 2015-03-05 | 2017-08-29 | Sii Semiconductor Corporation | Magnetic sensor circuit |
US20170310254A1 (en) * | 2016-04-26 | 2017-10-26 | Johnson Electric S.A. | Magnetic sensor integrated circuit, motor assembly and application device |
US10153717B2 (en) * | 2016-04-26 | 2018-12-11 | Johnson Electric S.A. | Magnetic sensor integrated circuit, motor assembly and application device |
Also Published As
Publication number | Publication date |
---|---|
KR100804390B1 (en) | 2008-02-15 |
US7652472B2 (en) | 2010-01-26 |
DE602006019676D1 (en) | 2011-03-03 |
CN1932541B (en) | 2011-02-02 |
KR20070030136A (en) | 2007-03-15 |
JP4856916B2 (en) | 2012-01-18 |
JP2007078423A (en) | 2007-03-29 |
TWI293124B (en) | 2008-02-01 |
EP1762859A2 (en) | 2007-03-14 |
TW200710420A (en) | 2007-03-16 |
CN1932541A (en) | 2007-03-21 |
EP1762859B1 (en) | 2011-01-19 |
EP1762859A3 (en) | 2009-05-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7652472B2 (en) | Magnetic sensor signal detection circuit using a counter | |
US7355398B2 (en) | Exciting coil drive circuit of magnetic sensor | |
US7746973B2 (en) | Signal detection circuit | |
US9239365B2 (en) | Magnetic element control device, magnetic element control method and magnetic detection device | |
US9157969B2 (en) | Magnetic element control device, magnetic device control method, and magnetic detecting device | |
US5168223A (en) | High sensitivity saturable core magnetic field sensor with symmetrical structure | |
JP5948105B2 (en) | Signal detection circuit, electronic compass, current sensor | |
JP3318762B2 (en) | Electronic compass | |
JP2006098306A (en) | Magnetic measuring apparatus | |
JP4496907B2 (en) | Magnetic measurement circuit | |
JP2006098307A (en) | Magnetic measuring apparatus | |
JP3794122B2 (en) | Magnetic detector | |
JP7295516B2 (en) | Magnetic sensor and biomagnetic measuring device | |
JP2006098308A (en) | Magnetometric device | |
JP3714225B2 (en) | Magnetic detection circuit and orientation detection circuit | |
JP2006098305A (en) | Magnetic measuring apparatus | |
KR100464546B1 (en) | Fluxgate type magnetometer capable of reducing power consumption | |
JP2015114205A (en) | Magnetic field detector and control method of magnetic field detector | |
JPH112548A (en) | Displacement quantity detecting device | |
JP2003121521A (en) | Magnetism detecting circuit | |
KR19980060390A (en) | Micro Magnetic Measuring Device | |
JP2004347495A (en) | Magnetic sensor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: SANYO ELECTRIC CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KOBAYASHI, KAZUYUKI;KANETA, YASUHIRO;SUZUKI, TATSUYA;REEL/FRAME:018408/0749 Effective date: 20060915 |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
AS | Assignment |
Owner name: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, ARIZONA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SANYO ELECTRIC CO., LTD.;REEL/FRAME:026594/0385 Effective date: 20110101 |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
AS | Assignment |
Owner name: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, ARIZONA Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNOR:SANYO ELECTRIC CO., LTD;REEL/FRAME:032836/0342 Effective date: 20110101 |
|
AS | Assignment |
Owner name: DEUTSCHE BANK AG NEW YORK BRANCH, NEW YORK Free format text: SECURITY INTEREST;ASSIGNOR:SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC;REEL/FRAME:038620/0087 Effective date: 20160415 |
|
AS | Assignment |
Owner name: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT, NEW YORK Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST;ASSIGNOR:SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC;REEL/FRAME:039853/0001 Effective date: 20160415 Owner name: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AG Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST;ASSIGNOR:SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC;REEL/FRAME:039853/0001 Effective date: 20160415 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 12 |
|
AS | Assignment |
Owner name: FAIRCHILD SEMICONDUCTOR CORPORATION, ARIZONA Free format text: RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087;ASSIGNOR:DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT;REEL/FRAME:064070/0001 Effective date: 20230622 Owner name: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, ARIZONA Free format text: RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087;ASSIGNOR:DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT;REEL/FRAME:064070/0001 Effective date: 20230622 |