US20060215469A1 - Semiconductor device and skew adjusting method - Google Patents
Semiconductor device and skew adjusting method Download PDFInfo
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- US20060215469A1 US20060215469A1 US11/260,199 US26019905A US2006215469A1 US 20060215469 A1 US20060215469 A1 US 20060215469A1 US 26019905 A US26019905 A US 26019905A US 2006215469 A1 US2006215469 A1 US 2006215469A1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
Definitions
- the present invention relates to a semiconductor device and a skew adjusting method, and in detail to a skew adjusting technique between chips in circuits divided into the plural chips.
- a method to adjust a clock skew generated according to a difference of memory capacities (load capacitance) by each SDRAM module is proposed (for example, refer to Patent Document 1).
- phase adjustments of clocks supplied to the SDRAM modules are performed by controlling a phase adjuster based on stored adjusting value setting information and memory capacity information obtained from the attached SDRAM modules.
- Patent Document 1 Japanese Patent Application Laid-open No. 2003-271447
- One possible object is to adjust a skew generated by dividing circuits into plural chips automatically, and to enable proper operations of the circuits as a whole when the circuits corresponding to one function macro of a memory controller and so on are realized by being divided into the plural chips.
- function circuits composing one function macro are divided and mounted on plural chips, internal clock signals having different phases with one another are generated based on a clock signal to be a reference, one of the generated internal clock signals is selected, and a phase of a clock signal supplied to the function circuits within the chips is adjusted based on a result of a test operation executed by using the selected internal clock signal.
- the clock signal having an optimal phase which is phase adjusted based on the result of the test operation can be obtained from among the plural internal clock signals having different phases with one another, even through the circuits composing one function macro are divided into the plural chips.
- FIG. 1 is a block diagram showing a function configuration example of a memory system according to an embodiment of the present invention
- FIG. 2 is a view showing a configuration example of a memory controller according to the present embodiment
- FIG. 3 is a view showing a configuration of a clock generation circuit
- FIG. 4 is a flow chart showing an adjusting process of a clock phase according to the present embodiment.
- FIG. 5 is a view showing another configuration example of the memory controller according to the present embodiment.
- a memory controller (memory control circuit) is shown as an example of a semiconductor device according to the embodiment of the present invention, but the present invention is not limited to this.
- the present invention is applicable for other circuits, for example, an interface circuit, a clock data recovery circuit, and so on, including the exemplified memory controller, of which operations are influenced by a skew.
- FIG. 1 is a block diagram showing a function configuration example of a memory system having the memory controller applying the semiconductor device according to one embodiment of the present invention.
- a reference numeral 1 denotes a control unit
- a reference numeral 5 denotes an external memory
- the control unit 1 has a memory controller (memory control circuit) 2 and plural macros 4 A to 4 C.
- the memory controller 2 performs an access and so on to an external memory 5 in accordance with a request from external, and controls the external memory 5 .
- the memory controller 2 supplies the external memory 5 with an address signal ADD and a command signal CMD in accordance with a request and so on from external, and exchanges a data signal DT with the external memory 5 .
- the data signals DT are shown in the drawing divided into the data signal DT (0: x) corresponding to lower side (x+1) bits, and the data signal DT (x+1: E) corresponding to upper side (E ⁇ x) bits.
- the memory controller 2 has a memory control test circuit 3 .
- the memory control test circuit 3 is a function circuit performing a self test of a memory, and it is so-called a BIST (Built In Self Test) circuit (RAMBIST circuit in more detail).
- the macros 4 A to 4 C are circuits for achieving respective arbitrary functions.
- circuits composing the memory controller 2 as one function macro such as shown in FIG. 1 are conventionally mounted in bulk on one chip, but in the present embodiment, the circuits are mounted while being divided into plural chips.
- an address generation portion and a data input/output portion in the memory controller 2 are respectively constituted on other chips, namely on different chips.
- the memory control test circuit 3 is also divided into a function portion concerning an address and a function portion concerning a data as well as the memory controller 2 .
- the data input/output portion in the memory controller 2 is further divided into an upper data side and a lower data side, and they are respectively constituted on other chips.
- the address generation portion and the data input/output portions in the memory controller 2 are constituted on other chips, and therefore, normally, a skew between address and data, in other words between chips are generated.
- the skew between address and data generated by being divided into plural chips are adjusted by using a function of the memory control test circuit 3 to realize a reduction of the skew.
- FIG. 2 is a view showing a configuration example of the memory controller according to the embodiment of the present invention. Incidentally, in FIG. 2 , only a portion relating to a skew adjustment (phase adjustment of clock signal) within the memory controller is shown, and the other configuration is not shown because it is the same as conventional one except for being divided into the address portion and the data portion (upper side and lower side).
- a skew adjustment phase adjustment of clock signal
- a reference numeral 10 denotes an address generation circuit
- a reference numeral 20 denotes a first data input/output circuit (divided circuit A)
- a reference numeral 30 denotes a second data input/output circuit (divided circuit B)
- a reference numeral 40 denotes an external memory.
- the address generation circuit 10 , the first data input/output circuit 20 , and the second data input/output circuit 30 are constituted on different chips with one another.
- the first data input/output circuit 20 corresponds to upper side (E ⁇ x) bits of data, in detail, from (x+1) bit to E bit of data.
- the second data input/output circuit 30 corresponds to lower side (x+1) bits of data, in detail, from 0 bit to x bit of data.
- the address generation circuit 10 has a control circuit 11 , a test controller (for address) 12 , and a wrapper circuit (for address) 13 .
- the control circuit 11 achieves an overall control of the address generation circuit 10 .
- a reset signal RST from external is inputted to the control circuit 11 .
- Test mode signals T_A 1 , T_A 2 are inputted from the first and second data input/output circuits 20 , 30 to the control circuit 11 .
- the control circuit 11 outputs a test signal TST and a test mode signal T_AD indicating whether it is in a test operation state or not in accordance with the reset signal RST and the test mode signals T_A 1 , T_A 2 .
- the test controller 12 performs a state transition control and a generation of a test address for executing a test algorithm necessary for a memory test at the time of the test operation.
- the test mode signal T_AD is inputted from the control circuit 11 to the test controller 12 .
- the test controller 12 operates in accordance with the test mode signal T_AD.
- the wrapper circuit 13 is a circuit for wrapping a memory.
- the wrapper circuit 13 receives a control by the test controller 12 , and supplies the external memory 40 being a test object with the test address and a command generated at the test controller 12 by an address signal ADD and a command signal CMD.
- a clock signal CLK to be a reference is supplied to the test controller 12 and the wrapper circuit 13 .
- the test address and the command are supplied to the external memory 40 based on (for example, in synchronization with) this clock signal CLK.
- the clock signal CLK to be the reference is also supplied to the external memory 40 .
- the first data input/output circuit 20 has a control circuit 21 , a test controller (for data) 22 , a wrapper circuit (for data) 23 , a counter circuit 24 , a clock generation circuit 25 , and a clock selection circuit 26 .
- the second data input/output circuit 30 has a control circuit 31 , a test controller (for data) 32 , a wrapper circuit (for data) 33 , a counter circuit 34 , a clock generation circuit 35 , and a clock selection circuit 36 .
- first and second data input/output circuits 20 , 30 are the same, and therefore, it is described in detail as for the first data input/output circuit 20 in the following, and the description of the second data input/output circuit 30 is not given.
- the control circuit 21 achieves an overall control of the data input/output circuit 20 .
- the reset signal RST from external is inputted to the control circuit 21 .
- a test mode signal T_R 1 showing a test result is inputted from the wrapper circuit 23 to the control circuit 21 .
- the control circuit 21 outputs the test mode signals T_A 1 , T_D 1 , and a counter enable signal EN 1 in accordance with the reset signal RST and the test mode signal T_R 1 .
- the test controller 22 performs a state transition control and a generation of a test data for executing a test algorithm required for a memory test at a time of a test operation.
- the test mode signal T_D 1 is inputted to the test controller 22 from the control circuit 21 .
- the test controller 22 operates in accordance with the test mode signal T_D 1 .
- the wrapper circuit 23 is a circuit for wrapping a memory.
- the wrapper circuit 23 receives a control by the test controller 22 , supplies the external memory 40 being the test object with the test data generated at the test controller 22 by a data signal DT (x+1: E), and receives an output from the external memory 40 .
- the wrapper circuit 23 compares an output result from the external memory 40 and the supplied test data, judges if they are consistent or not, and outputs the judged result as the test mode signal T_R 1 .
- the counter circuit 24 performs a count operation in accordance with the counter enable signal EN 1 supplied from the control circuit 21 , and outputs a counter value CNT to the clock selection circuit 26 .
- the clock signal CLK to be the reference is inputted to the clock generation circuit 25 .
- the clock generation circuit 25 generates and outputs plural internal clock signals having different phases with one another based on the clock signal CLK.
- the internal clock signals having the different phases with one another generated at the clock generation circuit 25 are inputted to the clock selection circuit 26 .
- the clock selection circuit 26 selects one internal clock signal in accordance with the counter value CNT supplied from the counter circuit 24 from among the inputted internal clock signals, to output as an internal clock signal CKI 1 .
- the internal clock signal CKI 1 outputted from the clock selection circuit 26 is supplied to the test controller 22 .
- the test data is supplied to the external memory 40 based on (for example, in synchronization with) this internal clock signal CKI 1 .
- FIG. 3 is a view showing a configuration of the clock generation circuit held by the data input/output circuits 20 , 30 shown in FIG. 2 .
- a clock generation circuit 51 generating six internal clock signals having different phases with one another based on the clock signal CLK to be the reference is shown as an example.
- the clock generation circuit 51 is constituted by connecting delay elements 52 - 1 to 52 - 6 in cascade as shown in FIG. 3 .
- the clock signal CLK to be the reference is supplied to an input end of the delay element 52 - 1 at a first stage.
- junction points of the respective delay elements 52 - 1 to 52 - 6 are connected to input ends of a clock selection circuit 53 , and thereby, internal clock signals CK 1 to CK 6 having different phases with one another generated based on the clock signal CLK are supplied to the clock selection circuit 53 .
- the clock selection circuit 53 outputs a supplied internal clock signal CKi as an internal clock signal CKI when the count value CNT supplied from the counter circuit is “i” (“i” is a natural number from 1 to 6) as shown in the drawing.
- the clock generation circuit 51 generating the six internal clock signals CK 1 to CK 6 having the different phases with one another by using the six delay elements 52 - 1 to 52 - 6 is shown as an example, but the present invention is not limited to this, and any conventionally known clock generation circuit generating clock signals having different phases with one another based on a clock signal to be a reference can be applied.
- FIG. 4 is a flow chart showing a phase adjusting process of the clock signal in the present embodiment.
- the reset signal RST supplied from external is activated, and an initialization process is performed (step S 1 ).
- the initialization process of the step S 1 logical values of the respective signals become as follows, the test signal TST is “0” (zero), the test mode signals T_A 1 , T_A 2 , T_D 1 , and T_D 2 are “0”, respective control circuit internal logical signals PASS (not shown) are “0”, and the counter value CNT is “1”.
- the control circuit internal logical signal PASS is a signal indicating a selection of the clock signal. When the signal is “0”, it means to go next, and when the signal is “1”, it means to be a final decision. Namely, the adjustment of the skew is performed during the control circuit internal logical signal PASS is “0”.
- test data are written to the external memory 40 by the address generation circuit 10 and the data input/output circuits 20 , 30 in accordance with the controls of the respective test controllers 12 , 22 , and 32 (step S 2 ).
- the data are read from the external memory 40 by the address generation circuit 10 and the data input/output circuits 20 , 30 in accordance with the controls of the respective test controllers 12 , 22 , and 32 (step S 3 ).
- the data is read from a region in the external memory 40 where the test data is written at the step S 2 .
- the wrapper circuits 23 , 33 in the data input/output circuits 20 , 30 compare the test data written at the step S 2 and the data read at the step S 3 (step S 4 ).
- the wrapper circuits 23 , 33 judge that the test result is FAIL (abnormal operation is verified at the test operation), and change the logical values of the test mode signals T_R 1 , T_R 2 to “0”.
- step S 5 When the logical values of the test mode signals T_R 1 , T_R 2 are “0”, the logical values of the test signal TST, the test mode signals T_A 1 , T_A 2 , T_D 1 , and T_D 2 are not changed, the logical values of the counter enable signals EN 1 , EN 2 are “0”, and only the counter value CNT is incremented by “1” (step S 5 ) Incidentally, it may be decremented depending on a specification of the counter circuit.
- the process goes back to the step S 2 , and the processes subsequent to the step S 2 are performed again.
- the test result is judged as FAIL (abnormal operation is verified at the test operation)
- the counter value CNT is updated, and thereby, the next internal clock signal having the different phase is selected automatically, and the processes stated above are performed.
- the wrapper circuits 23 , 33 judge that the test result is PASS (normal operation is verified at the test operation), and change the logical values of the test mode signals T_R 1 , T_R 2 to “1”.
- the logical values of the test signal TST, the test mode signals T_A 1 , T_A 2 , T_D 1 , and T_D 2 are changed to “1”
- the logical value of the control circuit internal logical signal PASS is changed to “1”
- the internal clock signals CKI 1 , CKI 2 at that time are determined as the internal clock signals of which clock phases are adjusted (skew adjusted) (step S 6 ).
- the operations of the data input/output circuits 20 , 30 are described all at once, but the judges of the test results and the determinations of the internal clocks in accordance with the test results are performed by the data input/output circuits 20 , 30 independently.
- the test operation is performed one after another while shifting the phases of the internal clock signals CKI 1 , CKI 2 , and thereby, the phase adjustments of the clock signals at the respective chips on which the data input/output circuits 20 , 30 are constituted are achieved.
- the memory controller When the memory controller is constituted as shown in FIG. 5 , it becomes possible to share the address signal ADD and the command signal CMD from the address generation circuit 10 constituted on one chip with the plural external memories, and thereby, a reduction of a cost can be realized when considered as a whole system. Incidentally, it goes without saying that further more external memories may be controlled similarly without limiting to the two external memories.
- the skew can be adjusted automatically when the memory controller is constituted by the plural chips while being divided into the address generation circuit 10 being the address generation portion and the data input/output circuits 20 , 30 being the data input/output portions.
- the internal clock signals having the different phases generated at the clock generation circuits 25 , 26 based on the clock signal CLK to be the reference are automatically selected sequentially so as to shift the phase one after another based on the test result, the verification of the test operation is performed, and thereby, it becomes possible to select the clock signals with optimal phases for the respective chips to achieve the adjustment of the skew generated by being divided into the plural chips automatically, and to make the circuits operate properly as the memory controller. Consequently, a size is inevitably increasing in accordance with a function mountable on one chip becomes complicated and multifunctioned including the memory controller. However, reductions of the size and the electric power consumption can be expected by dividing the circuits into plural chips as stated above.
- plural internal clock signals having different phases with one another are generated based on a clock signal to be a reference, and phases of clock signals supplied to circuits within chips are adjusted based on results of test operations executed by using the internal clock signals.
- a clock signal having an optimal phase can be obtained from among the plural internal clock signals, and a skew generated by being divided into plural chips can be adjusted automatically. Consequently, according to the present invention, it is possible to make circuits operate properly as a whole, even though the circuits composing one function macro are divided into plural chips.
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Abstract
Description
- This application is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 2005-092064, filed on Mar. 28, 2005, the entire contents of which are incorporated herein by reference.
- 1. Field of the Invention
- The present invention relates to a semiconductor device and a skew adjusting method, and in detail to a skew adjusting technique between chips in circuits divided into the plural chips.
- 2. Description of the Related Art
- Conventionally, in a memory controller, a reduction of a skew between an address signal and a data signal (hereinafter, called also as “between address and data”) has been realized by mounting every circuit composing the memory controller on one chip. However, there are quite a lot of cases in which an enough number of pins (number of external terminals) cannot be secured on one chip in accordance with improvements of functions according to complication, multifunction, and so on of functions, regardless of a multi-pin packaging in recent years.
- When the memory controller is realized by being divided into plural chips, a skew adjusting between address and data becomes very hard. This becomes a factor disturbing the memory controller from being divided into plural chips.
- Here, in a memory system having replaceable SDRAM modules, a method to adjust a clock skew generated according to a difference of memory capacities (load capacitance) by each SDRAM module, is proposed (for example, refer to Patent Document 1). In the method shown in the
Patent Document 1, phase adjustments of clocks supplied to the SDRAM modules are performed by controlling a phase adjuster based on stored adjusting value setting information and memory capacity information obtained from the attached SDRAM modules. However, in the method shown in thePatent Document 1, it is necessary to set and store the adjusting value setting information and the memory capacity information beforehand, and therefore, it is difficult to flexibly correspond to arbitrary SDRAM module. - Besides, there is a case when it is impossible to mount the memory controller on one chip according to not only a restriction of number of pins held by the chip, but also a restriction of electric power consumption caused by an increase of a circuit scale and so on.
- [Patent Document 1] Japanese Patent Application Laid-open No. 2003-271447
- One possible object is to adjust a skew generated by dividing circuits into plural chips automatically, and to enable proper operations of the circuits as a whole when the circuits corresponding to one function macro of a memory controller and so on are realized by being divided into the plural chips.
- In a semiconductor device of the present invention, function circuits composing one function macro are divided and mounted on plural chips, internal clock signals having different phases with one another are generated based on a clock signal to be a reference, one of the generated internal clock signals is selected, and a phase of a clock signal supplied to the function circuits within the chips is adjusted based on a result of a test operation executed by using the selected internal clock signal.
- Herewith, the clock signal having an optimal phase which is phase adjusted based on the result of the test operation can be obtained from among the plural internal clock signals having different phases with one another, even through the circuits composing one function macro are divided into the plural chips.
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FIG. 1 is a block diagram showing a function configuration example of a memory system according to an embodiment of the present invention; -
FIG. 2 is a view showing a configuration example of a memory controller according to the present embodiment; -
FIG. 3 is a view showing a configuration of a clock generation circuit; -
FIG. 4 is a flow chart showing an adjusting process of a clock phase according to the present embodiment; and -
FIG. 5 is a view showing another configuration example of the memory controller according to the present embodiment. - Hereinafter, an embodiment of the present invention is described based on the drawings.
- Incidentally, in the following description, a memory controller (memory control circuit) is shown as an example of a semiconductor device according to the embodiment of the present invention, but the present invention is not limited to this. The present invention is applicable for other circuits, for example, an interface circuit, a clock data recovery circuit, and so on, including the exemplified memory controller, of which operations are influenced by a skew.
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FIG. 1 is a block diagram showing a function configuration example of a memory system having the memory controller applying the semiconductor device according to one embodiment of the present invention. - In
FIG. 1 , areference numeral 1 denotes a control unit, and areference numeral 5 denotes an external memory. Thecontrol unit 1 has a memory controller (memory control circuit) 2 andplural macros 4A to 4C. - The
memory controller 2 performs an access and so on to anexternal memory 5 in accordance with a request from external, and controls theexternal memory 5. In the present embodiment, thememory controller 2 supplies theexternal memory 5 with an address signal ADD and a command signal CMD in accordance with a request and so on from external, and exchanges a data signal DT with theexternal memory 5. Incidentally, inFIG. 1 , the data signals DT are shown in the drawing divided into the data signal DT (0: x) corresponding to lower side (x+1) bits, and the data signal DT (x+1: E) corresponding to upper side (E−x) bits. - Besides, the
memory controller 2 has a memorycontrol test circuit 3. The memorycontrol test circuit 3 is a function circuit performing a self test of a memory, and it is so-called a BIST (Built In Self Test) circuit (RAMBIST circuit in more detail). - The
macros 4A to 4C are circuits for achieving respective arbitrary functions. - Here, the circuits composing the
memory controller 2 as one function macro such as shown inFIG. 1 are conventionally mounted in bulk on one chip, but in the present embodiment, the circuits are mounted while being divided into plural chips. - Concretely speaking, an address generation portion and a data input/output portion in the
memory controller 2 are respectively constituted on other chips, namely on different chips. Besides, the memorycontrol test circuit 3 is also divided into a function portion concerning an address and a function portion concerning a data as well as thememory controller 2. Incidentally, in the following description, the data input/output portion in thememory controller 2 is further divided into an upper data side and a lower data side, and they are respectively constituted on other chips. - As stated above, the address generation portion and the data input/output portions in the
memory controller 2 are constituted on other chips, and therefore, normally, a skew between address and data, in other words between chips are generated. In the present embodiment, the skew between address and data generated by being divided into plural chips are adjusted by using a function of the memorycontrol test circuit 3 to realize a reduction of the skew. -
FIG. 2 is a view showing a configuration example of the memory controller according to the embodiment of the present invention. Incidentally, inFIG. 2 , only a portion relating to a skew adjustment (phase adjustment of clock signal) within the memory controller is shown, and the other configuration is not shown because it is the same as conventional one except for being divided into the address portion and the data portion (upper side and lower side). - In
FIG. 2 , areference numeral 10 denotes an address generation circuit, areference numeral 20 denotes a first data input/output circuit (divided circuit A), areference numeral 30 denotes a second data input/output circuit (divided circuit B), and areference numeral 40 denotes an external memory. Theaddress generation circuit 10, the first data input/output circuit 20, and the second data input/output circuit 30 are constituted on different chips with one another. Incidentally, the first data input/output circuit 20 corresponds to upper side (E−x) bits of data, in detail, from (x+1) bit to E bit of data. Similarly, the second data input/output circuit 30 corresponds to lower side (x+1) bits of data, in detail, from 0 bit to x bit of data. - The
address generation circuit 10 has acontrol circuit 11, a test controller (for address) 12, and a wrapper circuit (for address) 13. - The
control circuit 11 achieves an overall control of theaddress generation circuit 10. A reset signal RST from external is inputted to thecontrol circuit 11. Test mode signals T_A1, T_A2 are inputted from the first and second data input/output circuits control circuit 11. Thecontrol circuit 11 outputs a test signal TST and a test mode signal T_AD indicating whether it is in a test operation state or not in accordance with the reset signal RST and the test mode signals T_A1, T_A2. - The
test controller 12 performs a state transition control and a generation of a test address for executing a test algorithm necessary for a memory test at the time of the test operation. The test mode signal T_AD is inputted from thecontrol circuit 11 to thetest controller 12. Thetest controller 12 operates in accordance with the test mode signal T_AD. - The
wrapper circuit 13 is a circuit for wrapping a memory. Thewrapper circuit 13 receives a control by thetest controller 12, and supplies theexternal memory 40 being a test object with the test address and a command generated at thetest controller 12 by an address signal ADD and a command signal CMD. - Incidentally, a clock signal CLK to be a reference is supplied to the
test controller 12 and thewrapper circuit 13. The test address and the command are supplied to theexternal memory 40 based on (for example, in synchronization with) this clock signal CLK. Incidentally, the clock signal CLK to be the reference is also supplied to theexternal memory 40. - The first data input/
output circuit 20 has acontrol circuit 21, a test controller (for data) 22, a wrapper circuit (for data) 23, acounter circuit 24, aclock generation circuit 25, and aclock selection circuit 26. Besides, the second data input/output circuit 30 has acontrol circuit 31, a test controller (for data) 32, a wrapper circuit (for data) 33, acounter circuit 34, aclock generation circuit 35, and aclock selection circuit 36. Incidentally, as it is obvious, the configurations of the first and second data input/output circuits output circuit 20 in the following, and the description of the second data input/output circuit 30 is not given. - The
control circuit 21 achieves an overall control of the data input/output circuit 20. The reset signal RST from external is inputted to thecontrol circuit 21. A test mode signal T_R1 showing a test result is inputted from thewrapper circuit 23 to thecontrol circuit 21. Thecontrol circuit 21 outputs the test mode signals T_A1, T_D1, and a counter enable signal EN1 in accordance with the reset signal RST and the test mode signal T_R1. - The test controller 22 performs a state transition control and a generation of a test data for executing a test algorithm required for a memory test at a time of a test operation. The test mode signal T_D1 is inputted to the test controller 22 from the
control circuit 21. The test controller 22 operates in accordance with the test mode signal T_D1. - The
wrapper circuit 23 is a circuit for wrapping a memory. Thewrapper circuit 23 receives a control by the test controller 22, supplies theexternal memory 40 being the test object with the test data generated at the test controller 22 by a data signal DT (x+1: E), and receives an output from theexternal memory 40. Besides, thewrapper circuit 23 compares an output result from theexternal memory 40 and the supplied test data, judges if they are consistent or not, and outputs the judged result as the test mode signal T_R1. - The
counter circuit 24 performs a count operation in accordance with the counter enable signal EN1 supplied from thecontrol circuit 21, and outputs a counter value CNT to theclock selection circuit 26. - The clock signal CLK to be the reference is inputted to the
clock generation circuit 25. Theclock generation circuit 25 generates and outputs plural internal clock signals having different phases with one another based on the clock signal CLK. - The internal clock signals having the different phases with one another generated at the
clock generation circuit 25 are inputted to theclock selection circuit 26. Theclock selection circuit 26 selects one internal clock signal in accordance with the counter value CNT supplied from thecounter circuit 24 from among the inputted internal clock signals, to output as an internal clock signal CKI1. - Here, the internal clock signal CKI1 outputted from the
clock selection circuit 26 is supplied to the test controller 22. The test data is supplied to theexternal memory 40 based on (for example, in synchronization with) this internal clock signal CKI1. -
FIG. 3 is a view showing a configuration of the clock generation circuit held by the data input/output circuits FIG. 2 . Incidentally, inFIG. 3 , aclock generation circuit 51 generating six internal clock signals having different phases with one another based on the clock signal CLK to be the reference is shown as an example. - The
clock generation circuit 51 is constituted by connecting delay elements 52-1 to 52-6 in cascade as shown inFIG. 3 . The clock signal CLK to be the reference is supplied to an input end of the delay element 52-1 at a first stage. Besides, junction points of the respective delay elements 52-1 to 52-6 are connected to input ends of aclock selection circuit 53, and thereby, internal clock signals CK1 to CK6 having different phases with one another generated based on the clock signal CLK are supplied to theclock selection circuit 53. - In the example shown in
FIG. 3 , theclock selection circuit 53 outputs a supplied internal clock signal CKi as an internal clock signal CKI when the count value CNT supplied from the counter circuit is “i” (“i” is a natural number from 1 to 6) as shown in the drawing. - Incidentally, in
FIG. 3 , theclock generation circuit 51 generating the six internal clock signals CK1 to CK6 having the different phases with one another by using the six delay elements 52-1 to 52-6 is shown as an example, but the present invention is not limited to this, and any conventionally known clock generation circuit generating clock signals having different phases with one another based on a clock signal to be a reference can be applied. - Next, operations are described.
- Incidentally, only a skew adjusting operation (phase adjusting operation of clock signal) is described below. The other operations at a normal time may be performed as same as the conventional way, and therefore, the description will not be given.
-
FIG. 4 is a flow chart showing a phase adjusting process of the clock signal in the present embodiment. - First, the reset signal RST supplied from external is activated, and an initialization process is performed (step S1). By the initialization process of the step S1, logical values of the respective signals become as follows, the test signal TST is “0” (zero), the test mode signals T_A1, T_A2, T_D1, and T_D2 are “0”, respective control circuit internal logical signals PASS (not shown) are “0”, and the counter value CNT is “1”. Here, the control circuit internal logical signal PASS is a signal indicating a selection of the clock signal. When the signal is “0”, it means to go next, and when the signal is “1”, it means to be a final decision. Namely, the adjustment of the skew is performed during the control circuit internal logical signal PASS is “0”.
- Next, the test data are written to the
external memory 40 by theaddress generation circuit 10 and the data input/output circuits respective test controllers 12, 22, and 32 (step S2). - Next, the data are read from the
external memory 40 by theaddress generation circuit 10 and the data input/output circuits respective test controllers 12, 22, and 32 (step S3). Concretely speaking, the data is read from a region in theexternal memory 40 where the test data is written at the step S2. - Subsequently, the
wrapper circuits output circuits - As a result, when the test data and the read data are inconsistent, the
wrapper circuits - Then, the process goes back to the step S2, and the processes subsequent to the step S2 are performed again. Herewith, when the test result is judged as FAIL (abnormal operation is verified at the test operation), the counter value CNT is updated, and thereby, the next internal clock signal having the different phase is selected automatically, and the processes stated above are performed.
- Meanwhile, when the test data and the read data are consistent as a result of the comparison at the step S4, the
wrapper circuits - Incidentally, in the description stated above, the operations of the data input/
output circuits output circuits output circuits - In the description stated above, the case when one
external memory 40 is controlled by theaddress generation circuit 10, and the data input/output circuits FIG. 5 ,external memories output circuits external memories address generation circuit 10 and the data input/output circuits address generation circuit 10, the data input/output circuits FIG. 2 , and therefore the explanation is not given. - When the memory controller is constituted as shown in
FIG. 5 , it becomes possible to share the address signal ADD and the command signal CMD from theaddress generation circuit 10 constituted on one chip with the plural external memories, and thereby, a reduction of a cost can be realized when considered as a whole system. Incidentally, it goes without saying that further more external memories may be controlled similarly without limiting to the two external memories. - As stated above, according to the present embodiment, the skew can be adjusted automatically when the memory controller is constituted by the plural chips while being divided into the
address generation circuit 10 being the address generation portion and the data input/output circuits clock generation circuits - According to the present invention, plural internal clock signals having different phases with one another are generated based on a clock signal to be a reference, and phases of clock signals supplied to circuits within chips are adjusted based on results of test operations executed by using the internal clock signals. Herewith, a clock signal having an optimal phase can be obtained from among the plural internal clock signals, and a skew generated by being divided into plural chips can be adjusted automatically. Consequently, according to the present invention, it is possible to make circuits operate properly as a whole, even though the circuits composing one function macro are divided into plural chips.
- Incidentally, the present embodiment stated above is to be considered in all respects as illustrative and no restrictive, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. The invention may be embodied in other specific forms without departing from the spirit of essential characteristics thereof.
Claims (13)
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JP2005092064A JP2006275616A (en) | 2005-03-28 | 2005-03-28 | Semiconductor device and skew adjustment method |
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US7206239B2 US7206239B2 (en) | 2007-04-17 |
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Cited By (3)
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US20080189555A1 (en) * | 2007-02-06 | 2008-08-07 | Samsung Electronics Co., Ltd. | Smart cards including separate clocks for key processing and non-volatile memory interface communications and methods of operating the same |
CN101930790A (en) * | 2009-06-26 | 2010-12-29 | 扬智科技股份有限公司 | Data access system and adaptive frequency signal controller thereof |
CN115862707A (en) * | 2022-11-25 | 2023-03-28 | 湖南兴芯微电子科技有限公司 | PSRAM phase calibration method and controller |
Families Citing this family (6)
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KR100903367B1 (en) * | 2007-11-02 | 2009-06-23 | 주식회사 하이닉스반도체 | Semiconductor memory device for transmitting data in high speed and system having the same |
JP2009282721A (en) * | 2008-05-21 | 2009-12-03 | Nec Electronics Corp | Memory controller, memory control system, and method of controlling amount of delay in memory |
JP2010146627A (en) * | 2008-12-18 | 2010-07-01 | Elpida Memory Inc | Dynamic type semiconductor memory device and refresh control method thereof |
JP5473986B2 (en) | 2011-05-27 | 2014-04-16 | 株式会社日立製作所 | Driver integrated circuit |
US9076553B2 (en) * | 2013-11-13 | 2015-07-07 | Taiwan Semiconductor Manufacturing Company Limited | SPSRAM wrapper |
US10037811B1 (en) * | 2017-01-31 | 2018-07-31 | SK Hynix Inc. | Integrated circuits compensating for timing skew difference between signals |
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JPH11316619A (en) * | 1998-05-01 | 1999-11-16 | Nec Corp | Clock skew control circuit |
JP3479032B2 (en) * | 2000-06-20 | 2003-12-15 | シャープ株式会社 | Semiconductor integrated circuit |
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US5995441A (en) * | 1998-04-27 | 1999-11-30 | Mitsubishi Denki Kabushiki Kaisha | Synchronous semiconductor memory device capable of rapidly, highly precisely matching internal clock phase to external clock phase |
US6489819B1 (en) * | 1998-10-27 | 2002-12-03 | Mitsubishi Denki Kabushiki Kaisha | Clock synchronous semiconductor memory device allowing testing by low speed tester |
US6915443B2 (en) * | 2001-07-13 | 2005-07-05 | Hewlett-Packard Development Company, L.P. | System and method for adaptively adjusting clock skew in a variably loaded memory bus |
US20030226055A1 (en) * | 2002-03-12 | 2003-12-04 | Seiko Epson Corporation | Controller of electronic equipment and clock skew adjusting method |
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US20080189555A1 (en) * | 2007-02-06 | 2008-08-07 | Samsung Electronics Co., Ltd. | Smart cards including separate clocks for key processing and non-volatile memory interface communications and methods of operating the same |
US8195954B2 (en) | 2007-02-06 | 2012-06-05 | Samsung Electronics Co., Ltd. | Smart cards including separate clocks for key processing and non-volatile memory interface communications and methods of operating the same |
CN101930790A (en) * | 2009-06-26 | 2010-12-29 | 扬智科技股份有限公司 | Data access system and adaptive frequency signal controller thereof |
CN115862707A (en) * | 2022-11-25 | 2023-03-28 | 湖南兴芯微电子科技有限公司 | PSRAM phase calibration method and controller |
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