US20020140431A1 - Radiation test system - Google Patents
Radiation test system Download PDFInfo
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- US20020140431A1 US20020140431A1 US09/819,374 US81937401A US2002140431A1 US 20020140431 A1 US20020140431 A1 US 20020140431A1 US 81937401 A US81937401 A US 81937401A US 2002140431 A1 US2002140431 A1 US 2002140431A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
Definitions
- the present invention relates to a radiation test system. More particularly, the present invention relates to a radiation system having a set of testing steps capable of reducing setup time and facilitating operation.
- one object of the present invention is to provide a radiation test system having a set of testing steps capable of reducing setup time and facilitating operation.
- the invention provides a radiation test system.
- the radiation test system is coupled to a radiation test field and a radiation controller.
- the radiation controller records flow of radiation particles and test results of a test component.
- the radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam.
- the radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor.
- the daughter board holds and makes electrical connections with the test component.
- the motherboard is coupled to the radiation controller.
- the motherboard houses and makes electrical connections with the daughter board.
- the power source provides necessary electrical power to the motherboard and the test component.
- the near-end monitor is connected to the motherboard via a short transmission cable.
- the far-end monitor is connected to the near-end monitor through a long transmission cable.
- the radiation controller transmits irradiation signals to the motherboard and informs the motherboard about the irradiation period.
- the motherboard transmits error signals resulting from an overload current in the test component to the radiation controller and informs the radiation controller to stop radiation count.
- Bi-directional transmission between the motherboard and the radiation controller is achieved through an RS-232 interface.
- the near-end monitor triggers a testing program driving the motherboard such that current testing state is monitored and testing data are recorded.
- the motherboard also transmits test data produced by the test components to the near-end monitor.
- the far-end monitor is capable of remotely controlling the near-end monitor so that irradiation test on the test component can be executed. Furthermore, the far-end monitor is capable of receiving test data submitted by the near-end monitor so that post-irradiation status of the test component can be gauged.
- This invention also provides an alternative radiation test system.
- the radiation test system is coupled to a radiation test field and a radiation controller.
- the radiation controller records the flow of radiation particles and test results of a test component.
- the radiation controller also controls a radiation particle accelerator to produce a cyclically varying irradiation on the test component.
- the radiation test system further includes a daughter board, a transmission cable connector, a digital signal processor, a data buffer, a first address & control buffer, a decoder & universal asynchronous transceiver circuit, a power protection circuit & data latch, a second address & control buffer, a control buffer, a power supply, a near-end monitor and a far-end monitor.
- the daughter board holds and makes electrical connections with the test component.
- the transmission cable connector is a connector with a short transmission cable.
- the digital signal processor is coupled to the transmission cable connector and driven by a test program to produce a test pattern.
- Test data produced by the test component is transmitted by the transmission cable connector.
- the data buffer is a data bus for isolating the digital signal processor and the daughter board.
- the data buffer also provides data bus signals for driving the digital signal processor.
- the first address & control buffer is an address and control signal bus for isolating the digital signal processor and the daughter board.
- the decoder & universal asynchronous transceiver circuit decodes data from the data bus signal so that control signals for controlling the test component is generated.
- the decoder & universal asynchronous transceiver circuit also receives irradiation signals produced by the radiation controller and outputs an error signal due to an overload current in the test component to the radiation controller.
- a bi-directional transmission of commands and test results is achieved via an RS-232 interface.
- the power protection circuit & data latch is coupled to the decoder & universal asynchronous transceiver circuit for providing power to the test component. When current load occurs in the test component, power to the test component is cut and a current overload signal is transmitted to the digital signal processor. In the meantime, data signals from the digital signal processor are latched so that necessary preset signals, reset signals, power-triggering signals and error signals are provided.
- the second address & control buffer is able to providing necessary signal to the digital signal processor for driving the decoder/general-purpose asynchronous transceiver circuit.
- the control buffer picks up control signals from the decoder & universal asynchronous transceiver circuit and transmits the signals to the daughter board.
- the power supplier provides power to various modules and the test component in the radiation test system.
- the near-end monitor is connected to the transmission cable connector via a short electrical cable.
- the near-end monitor is responsible for triggering and terminating test programs as well as monitoring and recording test status and test data of the test component.
- the far-end monitor is connected to the near-end monitor through a long electrical cable. The far-end monitor not only receives test status and data from the test component, but also controls the near-end monitor to initiate radiation test.
- FIG. 1 is a schematic showing components and interconnections of a radiation test system according to one preferred embodiment of this invention.
- FIG. 2 is a block diagram showing a motherboard system for the radiation test system according to this invention.
- FIG. 1 is a schematic showing components and interconnections of a radiation test system according to one preferred embodiment of this invention.
- a radiation controller 106 is placed inside a control room 102 of a radiation test field.
- the radiation controller 106 records the flow of radiation particles and the test results of a test component (the test component can be a SDRAM, a Flash ROM, a CPLD or a Watch-dog Timer, for example).
- the radiation controller 106 also controls the generation of radiation particles by an accelerator (not shown) so that the test component is irradiated with cyclically varying radiation.
- the test component (not shown) is plugged into the socket on a replaceable daughter board 108 .
- the daughter board 108 has connecting pins that can be reset to produce the test signals required by the test component.
- the daughter board 108 is also capable of testing two functionally identical test components (not shown) at the same time. During testing, only the test component (not shown) and the daughter board 108 are subjected to irradiation.
- a motherboard 110 is coupled to the radiation controller 106 .
- the daughter board 108 and the motherboard 110 are electrically connected.
- a power supplier 112 provides necessary power (a 5V or a 3.3V) to the motherboard 110 and the test component (not shown).
- a computer 114 is connected to the motherboard 110 through a J-Tag transmission cable connector. Through an Ethernet transmission cable, the computer 116 may hook up with another computer 114 .
- the radiation controller 106 transmits irradiation signals (radiation beam on/off signals) to the motherboard 110 to inform the motherboard 110 about the radiation status. Should current overload occurs while the test component (not shown) is undergoing a testing, the motherboard 110 will transmit a veto signal to the radiation controller 106 informing the controller 106 to terminate the radiation count. As soon as all test equipment is ready, the radiation controller 106 and the motherboard 110 communicate with each other through an RS-232 interface. To begin the testing, an INIT command is issued from the radiation controller 106 inside the control room 102 to the motherboard 110 .
- the motherboard 110 On receiving the initiation signal, the motherboard 110 transmits a group of test data to the computer 114 after each irradiation cycle (each cycle includes a radiation-off and a radiation-on). After the completion of several tens of irradiation cycles, the testing operation is temporarily suspended by the motherboard 110 and the test data is stored inside the computer 114 . Thereafter, the irradiation strength, angle or radiation type is changed before the testing operation is continued.
- the computer 114 uses triggered testing programs to drive the motherboard 110 so that the test component is activated, status of the test component is monitored and the resulting test data is recorded.
- the computer 116 also receives test data from the computer 114 through an Ethernet transmission cable so that radiation test status of the test component (not shown) is monitored. Should the computer 116 discover any abnormality of the test component (not shown), the computer 116 may signal to the computer 114 so that the radiation testing is immediately halted.
- FIG. 2 is a block diagram showing a motherboard system for the radiation test system according to this invention.
- the motherboard 200 includes a JTAG connector 202 , a digital signal processor 204 , a data bus 206 , a data buffer 208 , a data bus 212 , a decoder & universal asynchronous transceiver circuit 214 , a power protection circuit & data latch 216 , a data bus 218 , an address & control buffer 220 , an address & control signal bus 222 , an address & control signal bus 224 , a RS-232 interface, an address & control buffer 226 , a control buffer 228 , an address & control signal bus 230 , a bus 232 and another bus 234 .
- the JTAG connector 202 on the motherboard 200 is a J-tag transmission cable connector.
- the digital data processor 204 is connected to the JTAG connector 202 and the JTAG connector 202 is in turn connected to a near-end computer 114 (refer to FIG. 1).
- the digital signal processor 204 is driven by a test program submitted by the near-end computer 114 .
- the digital signal processor 204 not only provides a test pattern to the data bus 206 , but also reads test data from the data bus 206 and transmits the data back to the computer 114 (refer to FIG. 1).
- the data buffer 208 isolates the data bus 206 and the data bus 212 between the digital signal processor 204 from the daughter board 210 . Hence, normal operation of the digital signal processor 204 is safeguarded against the effect of any current overload in the test component (not shown).
- the data buffer 208 also provides data to the data bus 218 . Signals sent to the data bus 218 drives the digital signal processor, the decoder & universal asynchronous transceiver circuit 214 and the power protection circuit & data latch 216 .
- the address & control buffer 220 isolates the address & control signal bus 222 and the address & control signal bus 224 between the digital signal processor 204 and the daughter board 210 . Similarly, this is to safeguard the digital signal processor 204 against any effect due to current overload in the test component (not shown).
- the decoder & universal asynchronous transceiver circuit 214 decodes signals on the data bus 218 so that signals necessary for controlling the test component (not shown) is produced.
- instructions and test results shuttle between the transceiver circuit 214 and a radiation controller (not shown).
- radiation test signals (radiation on/off) and veto signals also shuttle between the transceiver circuit 214 and the radiation controller via signal lines (not shown).
- the decoder & universal asynchronous transceiver circuit 214 may also include an asynchronous transceiver control circuit (not shown).
- the asynchronous transceiver control circuit may further include random generator modules, serial-to-parallel receiving modules, parallel-to-serial receiving modules, receiving and transmitting status and output modules, odd-even generator & detection modules and interface control module (all the modules not shown). Signals or data are transmitted according to their respective functions of the modules.
- the power protection circuit & data latch 216 is coupled to the decoder & universal asynchronous transceiver circuit 214 for providing power to the testing component (not shown). Should current overload occur in the test component, the power protection & data latch 216 will cut off power to the test component and send a current overload signal to the digital signal processor 204 via the data buses 218 and 206 . In the meantime, data signals sent from the digital signal processor 204 is arrested serving as subsequent set-reset signals, power-triggering signals and veto signals for the power protection circuit & data latch 216 . Hence, the power protection circuit & data latch 216 can be set or reset so that power is supplied to the test component again.
- the address & control buffer 226 provides signals from the digital signal processor 204 to the decoder & universal asynchronous transceiver circuit 214 via the address and control signal bus 230 .
- the control buffer 228 receives decoded control signals from the decoder & universal asynchronous transceiver circuit 214 and retransmits the signals to the daughter board 210 .
- the control buffer 228 isolates the buses 232 and 234 between the decoder & universal asynchronous transceiver circuit 214 and the daughter board 210 . Hence, normal operation of the decoder & universal asynchronous transceiver circuit 214 is safeguarded against the effect of any current overload in the test component (not shown).
- one major advantage of using the general-purpose testing board to test different components is that independent design of the testing board is not required. By changing the testing steps, local on-site pre-simulation can be conducted. Hence, time required to set up an actual testing field is greatly reduced. Ultimately, an easy to maintain and operate radiation test system capable of on-line monitoring of test component is produced.
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Abstract
Description
- 1. Field of Invention
- The present invention relates to a radiation test system. More particularly, the present invention relates to a radiation system having a set of testing steps capable of reducing setup time and facilitating operation.
- 2. Description of Related Art
- In aerospace industry, electronic components are often sent to outer spacer for a particular mission. Since these components may be bombarded by intense radiation in outer space for long periods, stringent radiation checks are required. For example, components used on satellites have to undergo intensive radiation testing. Those failing the radiation test are immediately discarded. For those that pass the radiation test, only the best component is selected.
- The setup and maintenance of a radiation test field is expensive. Due to special shielding regulations, facilities within the testing field may not be modified at will. Most often than not, a test is carried out using original equipment within the testing field. Components to be tested are usually placed inside the radiation field connected to a nearby computer. All testing is controlled at a remote site through keyboards and monitors connected to the in-field computer by extension cables. In general, different test components may require different control interface and hence a different setup.
- To protect people against hazardous radiation, personnel involved in radiation testing must be confined to the remote control center. Should any problem occur inside the radiation field, error rectification has to be delay until radiation has died down. However, testing time within a radiation test field is usually limited. For example, if three components each requiring 7 hours of continuous testing need to be tested in a day, actual time remaining for error detection and wire changing is minimal. In addition, the cost of operating a radiation test field is astronomical. Hence, slight increase in operational time may entail a huge monetary waste.
- Accordingly, one object of the present invention is to provide a radiation test system having a set of testing steps capable of reducing setup time and facilitating operation.
- To achieve these and other advantages and in accordance with the purpose of the invention, as embodied and broadly described herein, the invention provides a radiation test system. The radiation test system is coupled to a radiation test field and a radiation controller. The radiation controller records flow of radiation particles and test results of a test component. The radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam. The radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor. The daughter board holds and makes electrical connections with the test component. The motherboard is coupled to the radiation controller. The motherboard houses and makes electrical connections with the daughter board. The power source provides necessary electrical power to the motherboard and the test component. The near-end monitor is connected to the motherboard via a short transmission cable. The far-end monitor is connected to the near-end monitor through a long transmission cable.
- The radiation controller transmits irradiation signals to the motherboard and informs the motherboard about the irradiation period. The motherboard transmits error signals resulting from an overload current in the test component to the radiation controller and informs the radiation controller to stop radiation count. Bi-directional transmission between the motherboard and the radiation controller is achieved through an RS-232 interface. The near-end monitor triggers a testing program driving the motherboard such that current testing state is monitored and testing data are recorded. During a continuous irradiation cycle, the motherboard also transmits test data produced by the test components to the near-end monitor. The far-end monitor is capable of remotely controlling the near-end monitor so that irradiation test on the test component can be executed. Furthermore, the far-end monitor is capable of receiving test data submitted by the near-end monitor so that post-irradiation status of the test component can be gauged.
- This invention also provides an alternative radiation test system. The radiation test system is coupled to a radiation test field and a radiation controller. The radiation controller records the flow of radiation particles and test results of a test component. The radiation controller also controls a radiation particle accelerator to produce a cyclically varying irradiation on the test component. The radiation test system further includes a daughter board, a transmission cable connector, a digital signal processor, a data buffer, a first address & control buffer, a decoder & universal asynchronous transceiver circuit, a power protection circuit & data latch, a second address & control buffer, a control buffer, a power supply, a near-end monitor and a far-end monitor.
- The daughter board holds and makes electrical connections with the test component. The transmission cable connector is a connector with a short transmission cable. The digital signal processor is coupled to the transmission cable connector and driven by a test program to produce a test pattern. Test data produced by the test component is transmitted by the transmission cable connector. The data buffer is a data bus for isolating the digital signal processor and the daughter board. The data buffer also provides data bus signals for driving the digital signal processor. The first address & control buffer is an address and control signal bus for isolating the digital signal processor and the daughter board. The decoder & universal asynchronous transceiver circuit decodes data from the data bus signal so that control signals for controlling the test component is generated. The decoder & universal asynchronous transceiver circuit also receives irradiation signals produced by the radiation controller and outputs an error signal due to an overload current in the test component to the radiation controller. A bi-directional transmission of commands and test results is achieved via an RS-232 interface. The power protection circuit & data latch is coupled to the decoder & universal asynchronous transceiver circuit for providing power to the test component. When current load occurs in the test component, power to the test component is cut and a current overload signal is transmitted to the digital signal processor. In the meantime, data signals from the digital signal processor are latched so that necessary preset signals, reset signals, power-triggering signals and error signals are provided. The second address & control buffer is able to providing necessary signal to the digital signal processor for driving the decoder/general-purpose asynchronous transceiver circuit. The control buffer picks up control signals from the decoder & universal asynchronous transceiver circuit and transmits the signals to the daughter board. The power supplier provides power to various modules and the test component in the radiation test system. The near-end monitor is connected to the transmission cable connector via a short electrical cable. The near-end monitor is responsible for triggering and terminating test programs as well as monitoring and recording test status and test data of the test component. The far-end monitor is connected to the near-end monitor through a long electrical cable. The far-end monitor not only receives test status and data from the test component, but also controls the near-end monitor to initiate radiation test.
- It is to be understood that both the foregoing general description and the following detailed description are exemplary, and are intended to provide further explanation of the invention as claimed.
- The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention. In the drawings,
- FIG. 1 is a schematic showing components and interconnections of a radiation test system according to one preferred embodiment of this invention; and
- FIG. 2 is a block diagram showing a motherboard system for the radiation test system according to this invention.
- Reference will now be made in detail to the present preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
- FIG. 1 is a schematic showing components and interconnections of a radiation test system according to one preferred embodiment of this invention. As shown in FIG. 1, a
radiation controller 106 is placed inside acontrol room 102 of a radiation test field. Theradiation controller 106 records the flow of radiation particles and the test results of a test component (the test component can be a SDRAM, a Flash ROM, a CPLD or a Watch-dog Timer, for example). Theradiation controller 106 also controls the generation of radiation particles by an accelerator (not shown) so that the test component is irradiated with cyclically varying radiation. - The test component (not shown) is plugged into the socket on a
replaceable daughter board 108. Thedaughter board 108 has connecting pins that can be reset to produce the test signals required by the test component. Thedaughter board 108 is also capable of testing two functionally identical test components (not shown) at the same time. During testing, only the test component (not shown) and thedaughter board 108 are subjected to irradiation. - A
motherboard 110 is coupled to theradiation controller 106. Thedaughter board 108 and themotherboard 110 are electrically connected. Apower supplier 112 provides necessary power (a 5V or a 3.3V) to themotherboard 110 and the test component (not shown). Acomputer 114 is connected to themotherboard 110 through a J-Tag transmission cable connector. Through an Ethernet transmission cable, thecomputer 116 may hook up with anothercomputer 114. - The
radiation controller 106 transmits irradiation signals (radiation beam on/off signals) to themotherboard 110 to inform themotherboard 110 about the radiation status. Should current overload occurs while the test component (not shown) is undergoing a testing, themotherboard 110 will transmit a veto signal to theradiation controller 106 informing thecontroller 106 to terminate the radiation count. As soon as all test equipment is ready, theradiation controller 106 and themotherboard 110 communicate with each other through an RS-232 interface. To begin the testing, an INIT command is issued from theradiation controller 106 inside thecontrol room 102 to themotherboard 110. On receiving the initiation signal, themotherboard 110 transmits a group of test data to thecomputer 114 after each irradiation cycle (each cycle includes a radiation-off and a radiation-on). After the completion of several tens of irradiation cycles, the testing operation is temporarily suspended by themotherboard 110 and the test data is stored inside thecomputer 114. Thereafter, the irradiation strength, angle or radiation type is changed before the testing operation is continued. - The
computer 114 uses triggered testing programs to drive themotherboard 110 so that the test component is activated, status of the test component is monitored and the resulting test data is recorded. During the testing operation, thecomputer 116 also receives test data from thecomputer 114 through an Ethernet transmission cable so that radiation test status of the test component (not shown) is monitored. Should thecomputer 116 discover any abnormality of the test component (not shown), thecomputer 116 may signal to thecomputer 114 so that the radiation testing is immediately halted. - FIG. 2 is a block diagram showing a motherboard system for the radiation test system according to this invention. As shown in FIG. 2, the
motherboard 200 includes aJTAG connector 202, adigital signal processor 204, adata bus 206, adata buffer 208, adata bus 212, a decoder & universalasynchronous transceiver circuit 214, a power protection circuit &data latch 216, adata bus 218, an address &control buffer 220, an address &control signal bus 222, an address & control signal bus 224, a RS-232 interface, an address &control buffer 226, acontrol buffer 228, an address &control signal bus 230, abus 232 and anotherbus 234. - The
JTAG connector 202 on themotherboard 200 is a J-tag transmission cable connector. Thedigital data processor 204 is connected to theJTAG connector 202 and theJTAG connector 202 is in turn connected to a near-end computer 114 (refer to FIG. 1). Thedigital signal processor 204 is driven by a test program submitted by the near-end computer 114. Thedigital signal processor 204 not only provides a test pattern to thedata bus 206, but also reads test data from thedata bus 206 and transmits the data back to the computer 114 (refer to FIG. 1). - The
data buffer 208 isolates thedata bus 206 and thedata bus 212 between thedigital signal processor 204 from thedaughter board 210. Hence, normal operation of thedigital signal processor 204 is safeguarded against the effect of any current overload in the test component (not shown). Thedata buffer 208 also provides data to thedata bus 218. Signals sent to thedata bus 218 drives the digital signal processor, the decoder & universalasynchronous transceiver circuit 214 and the power protection circuit &data latch 216. The address &control buffer 220 isolates the address &control signal bus 222 and the address & control signal bus 224 between thedigital signal processor 204 and thedaughter board 210. Similarly, this is to safeguard thedigital signal processor 204 against any effect due to current overload in the test component (not shown). - The decoder & universal
asynchronous transceiver circuit 214 decodes signals on thedata bus 218 so that signals necessary for controlling the test component (not shown) is produced. Through the RS-232 interface, instructions and test results shuttle between thetransceiver circuit 214 and a radiation controller (not shown). Furthermore, radiation test signals (radiation on/off) and veto signals also shuttle between thetransceiver circuit 214 and the radiation controller via signal lines (not shown). - The decoder & universal
asynchronous transceiver circuit 214 may also include an asynchronous transceiver control circuit (not shown). The asynchronous transceiver control circuit (not shown) may further include random generator modules, serial-to-parallel receiving modules, parallel-to-serial receiving modules, receiving and transmitting status and output modules, odd-even generator & detection modules and interface control module (all the modules not shown). Signals or data are transmitted according to their respective functions of the modules. - The power protection circuit & data latch216 is coupled to the decoder & universal
asynchronous transceiver circuit 214 for providing power to the testing component (not shown). Should current overload occur in the test component, the power protection & data latch 216 will cut off power to the test component and send a current overload signal to thedigital signal processor 204 via thedata buses digital signal processor 204 is arrested serving as subsequent set-reset signals, power-triggering signals and veto signals for the power protection circuit &data latch 216. Hence, the power protection circuit & data latch 216 can be set or reset so that power is supplied to the test component again. - The address &
control buffer 226 provides signals from thedigital signal processor 204 to the decoder & universalasynchronous transceiver circuit 214 via the address and controlsignal bus 230. Thecontrol buffer 228 receives decoded control signals from the decoder & universalasynchronous transceiver circuit 214 and retransmits the signals to thedaughter board 210. Thecontrol buffer 228 isolates thebuses asynchronous transceiver circuit 214 and thedaughter board 210. Hence, normal operation of the decoder & universalasynchronous transceiver circuit 214 is safeguarded against the effect of any current overload in the test component (not shown). - In conclusion, one major advantage of using the general-purpose testing board to test different components is that independent design of the testing board is not required. By changing the testing steps, local on-site pre-simulation can be conducted. Hence, time required to set up an actual testing field is greatly reduced. Ultimately, an easy to maintain and operate radiation test system capable of on-line monitoring of test component is produced.
- It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
Claims (9)
Priority Applications (2)
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US09/819,374 US6456084B1 (en) | 2001-03-28 | 2001-03-28 | Radiation test system |
JP2001123236A JP2002328153A (en) | 2001-03-28 | 2001-04-20 | Radiation test system |
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US09/819,374 US6456084B1 (en) | 2001-03-28 | 2001-03-28 | Radiation test system |
JP2001123236A JP2002328153A (en) | 2001-03-28 | 2001-04-20 | Radiation test system |
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US6456084B1 US6456084B1 (en) | 2002-09-24 |
US20020140431A1 true US20020140431A1 (en) | 2002-10-03 |
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Cited By (2)
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JP2013168092A (en) * | 2012-02-17 | 2013-08-29 | Hitachi Ltd | Electronic equipment, soft error resistance evaluation system and evaluation method |
CN104267274A (en) * | 2014-09-11 | 2015-01-07 | 上海大学 | System and method for recording and storing running condition of electronic component under radiation environment |
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AU2004231962A1 (en) * | 2003-04-21 | 2004-11-04 | Vg Games Ltd | Systems and methods for generating random numbers from astonomical events |
US6930488B1 (en) | 2003-12-17 | 2005-08-16 | Sun Microsystems, Inc. | Method and apparatus for accelerated SER testing of circuitry |
US20060112316A1 (en) * | 2004-11-18 | 2006-05-25 | Jui-Kuo Chiang | Method of monitoring status of processor |
JP4817836B2 (en) | 2004-12-27 | 2011-11-16 | 株式会社東芝 | Card and host equipment |
US8566930B2 (en) * | 2009-02-27 | 2013-10-22 | Science Applications International Corporation | Monitoring module |
CN111398778A (en) * | 2020-03-16 | 2020-07-10 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | Online monitoring device and monitoring method for irradiation of sensitive structure of MEMS device |
CN112198862B (en) * | 2020-09-18 | 2022-01-18 | 中国辐射防护研究院 | On-line experimental test system for total dose effect of extensible microcontroller |
CN118091356A (en) * | 2024-04-18 | 2024-05-28 | 南京大学 | Semiconductor device characteristic parameter monitoring system and method in irradiation scene |
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US3723873A (en) * | 1971-01-21 | 1973-03-27 | Singer Co | Radiation method for determining semiconductor stability and reliability |
US4172228A (en) * | 1978-06-30 | 1979-10-23 | Nasa | Method for analyzing radiation sensitivity of integrated circuits |
US4575676A (en) * | 1983-04-04 | 1986-03-11 | Advanced Research And Applications Corporation | Method and apparatus for radiation testing of electron devices |
FR2599544B1 (en) * | 1986-05-27 | 1993-09-10 | Commissariat Energie Atomique | IRRADIATION APPARATUS FOR ELECTRONIC CIRCUITS |
US4816753A (en) * | 1987-05-21 | 1989-03-28 | Advanced Research And Applications Corporation | Method for reliability testing of integrated circuits |
US5753920A (en) * | 1995-07-26 | 1998-05-19 | California Institute Of Technology | Integrated charge monitor |
-
2001
- 2001-03-28 US US09/819,374 patent/US6456084B1/en not_active Expired - Lifetime
- 2001-04-20 JP JP2001123236A patent/JP2002328153A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2013168092A (en) * | 2012-02-17 | 2013-08-29 | Hitachi Ltd | Electronic equipment, soft error resistance evaluation system and evaluation method |
CN104267274A (en) * | 2014-09-11 | 2015-01-07 | 上海大学 | System and method for recording and storing running condition of electronic component under radiation environment |
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JP2002328153A (en) | 2002-11-15 |
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