US20020096766A1 - Package structure of integrated circuits and method for packaging the same - Google Patents

Package structure of integrated circuits and method for packaging the same Download PDF

Info

Publication number
US20020096766A1
US20020096766A1 US09/770,054 US77005401A US2002096766A1 US 20020096766 A1 US20020096766 A1 US 20020096766A1 US 77005401 A US77005401 A US 77005401A US 2002096766 A1 US2002096766 A1 US 2002096766A1
Authority
US
United States
Prior art keywords
integrated circuit
substrate
package structure
recesses
wirings
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US09/770,054
Inventor
Wen Chen
Kuo Peng
C. Chou
Allis Chen
Nai Yeh
Yen Huang
C. Wang
Chen Peng
Wen Lee
Jichen Wu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kingpak Technology Inc
Original Assignee
Kingpak Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kingpak Technology Inc filed Critical Kingpak Technology Inc
Priority to US09/770,054 priority Critical patent/US20020096766A1/en
Assigned to KINGPAK TECHNOLOGY INC. reassignment KINGPAK TECHNOLOGY INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHEN, ALLIS, CHEN, WEN CHUAN, CHOU, C. H., HUANG, YEN CHENG, LEE, WEN TSE, PENG, CHEN PIN, PENG, KUO-FENG, WANG, C. F., WU, JICHEN, YEH, NAI HUA
Priority to US10/147,029 priority patent/US6642137B2/en
Publication of US20020096766A1 publication Critical patent/US20020096766A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3135Double encapsulation or coating and encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05599Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/2612Auxiliary members for layer connectors, e.g. spacers
    • H01L2224/26122Auxiliary members for layer connectors, e.g. spacers being formed on the semiconductor or solid-state body to be connected
    • H01L2224/26145Flow barriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/27Manufacturing methods
    • H01L2224/27011Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature
    • H01L2224/27013Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature for holding or confining the layer connector, e.g. solder flow barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/83009Pre-treatment of the layer connector or the bonding area
    • H01L2224/83051Forming additional members, e.g. dam structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01027Cobalt [Co]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015Shape
    • H01L2924/10155Shape being other than a cuboid
    • H01L2924/10158Shape being other than a cuboid at the passive surface
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Definitions

  • the invention relates to a package structure and method for integrated circuits, in particular, to a package structure in which integrated circuits can be easily adhered to the substrate in order to solve the problem caused by the overflowed glue, thereby implementing a chip scale package.
  • the integrated circuit has a small volume in order to meet the demands of the products.
  • the technology of a chip scale package can reduce the volume of an integrated circuit after packaging, thereby making the product small, thin, and light.
  • the overflowed glue 16 may cover the signal input terminals 18 of the substrate 12 and influence the wire bonding processes in which a plurality of wirings 20 are formed.
  • the substrate 12 has to be enlarged. By doing so, the signal input terminals 18 are far away from the integrated circuit 10 . In this case, the signal input terminals 18 of the substrate 12 are free from being covered by the overflowed glue 16 . Therefore, the problem caused by the overflowed glue can be solved.
  • the overall volume of the package of the integrated circuit enlarges as the size of the substrate 12 increases.
  • a chip scale package cannot be implemented, and the product cannot be made small, thin, and light.
  • a package structure for an integrated circuit includes a substrate, an integrated circuit, an adhesive layer, a plurality of wirings, and a glue layer.
  • the substrate has a first surface and a second surface.
  • the first surface is formed with a plurality of signal input terminals.
  • the second surface is formed with a plurality of signal output terminals for electrically connecting to the circuit board.
  • the integrated circuit has a lower surface and an upper surface. Recesses are formed at two sides of the lower surface, and a plurality of bonding pads are formed on the upper surface.
  • the adhesive layer is used for adhering the lower surface of the integrated circuit to the first surface of the substrate.
  • the wirings are electrically connected to the bonding pads of the integrated circuit and to the signal input terminals of the substrate.
  • the glue layer is used for sealing the plurality of wirings and the integrated circuits.
  • FIG. 1 is a schematically cross-sectional view showing a conventional package structure of an integrated circuit.
  • FIG. 2 is a cross-sectional view showing a package structure of an integrated circuit in accordance with one embodiment of the invention.
  • FIG. 3 is a schematic view showing a package structure of an integrated circuit in accordance with another embodiment of the invention.
  • FIG. 4 is a top view showing a wafer of the invention.
  • FIG. 5 is a schematic illustration showing the scribing of the integrated circuit of the invention.
  • the package structure of the integrated circuit of the invention includes a substrate 24 , an integrated circuit 32 , a plurality of wirings 42 , and an adhesive layer 44 .
  • the substrate 24 has a first surface 26 and a second surface 28 opposite to the first surface 26 .
  • the first surface 26 is formed with a plurality of signal input terminals 30 for transmitting the signals from the integrated circuit 32 to the substrate 24 .
  • the second surface 28 of the substrate 24 is formed with a plurality of signal output terminals 34 for transmitting the signals from the integrated circuit 32 to the circuit board (not shown).
  • the signal output terminals 34 can be metallic balls arranged in the form of a ball grid array (BGA).
  • the integrated circuit 32 has a lower surface 36 and an upper surface 38 opposite to the lower surface 36 .
  • Two vertical recesses 40 are formed on two sides of the lower surface 36 of the integrated circuit 32 .
  • the lower surface 36 is adhered onto the first surface 26 of the substrate 24 .
  • the upper surface 38 is formed with a plurality of bonding pads 39 for electrically connecting to the substrate 24 .
  • Each of the wirings 42 has a first end and a second end away from the first end.
  • the first ends of the wirings 42 are electrically connected to the bonding pads 39 of the integrated circuit 32 , respectively.
  • the second ends of the wirings 42 are electrically connected to the signal input terminals 30 of the substrate 24 , respectively.
  • the signals from the integrated circuit 32 can be transmitted to the substrate 24 .
  • the plurality of wirings 42 may be connected to the bonding pads 39 of the integrated circuit 32 by way of wedge bonding.
  • the first ends of the plurality of wirings 42 are located on the periphery of the upper surface 38 of the integrated circuit 32 .
  • the plurality of wirings 42 may be electrically connected to the bonding pads 39 of the integrated circuit 32 by way of ball bonding.
  • the adhesive layer 44 is coated in between the integrated circuit 32 and the substrate 24 for adhering the integrated circuit 32 to the substrate 24 . Since the quantity of the glue forming the adhesive layer 44 cannot be easily controlled, the glue forming the adhesive layer 44 often overflows from the lower surface 36 of the integrated circuit 32 . Thus, according the structure of the invention, the overflowed glue 46 overflowed from the adhesive layer 44 fills the recesses 40 of the integrated circuit 32 . In this case, the signal input terminals 30 of the substrate 24 are free from being covered.
  • the recesses 40 of the integrated circuit 32 may be made to be of the shapes of slant planes. In this case, when the quantity of the overflowed glue can be controlled to be small, the overflowed glue can be totally filled into the recesses 40 . Thus, relatively large gaps will never exist in the recesses 40 .
  • a glue layer 47 is used for sealing the integrated circuit 32 and the plurality of wirings 42 for protecting the integrated circuit 32 and the wirings 42 .
  • a wafer 48 includes a plurality of integrated circuits 32 .
  • a plurality of scribing lines 50 are formed in between two adjacent integrated circuits 32 .
  • recesses 40 not penetrating through the wafer 48 are formed by scribing the scribing lines 50 using a scribing tool having a large width.
  • the wafer 48 is scribed at the scribing lines 50 using another scribing tool having a small width. Therefore, each of the integrated circuits 32 on the wafer 48 can be separated and recesses 40 can be formed in each of the integrated circuits 32 .
  • the package structure of the integrated circuit of the invention has the following advantages.
  • the recesses 40 of the integrated circuit 32 can be easily manufactured, so the manufacturing costs of the integrated circuit 32 will not be greatly increased.
  • the integrated circuit 32 with recesses 40 are used for packaging, the overflowed glue will not cause any problem.
  • the package structure can be easily manufactured, the manufacturing costs can be lowered, and the yield can be improved.
  • the size of the substrate 24 can be the same as that of the chip.
  • a chip scale package can be implemented so as to make the products small, thin, and light.

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

A package structure for an integrated circuit includes a substrate, an integrated circuit, an adhesive layer, a plurality of wirings, and a glue layer. The substrate has a first surface and a second surface. The first surface is formed with a plurality of signal input terminals. The second surface is formed with a plurality of signal output terminals for electrically connecting to the circuit board. The integrated circuit has a lower surface and an upper surface. Recesses are formed at two sides of the lower surface, and a plurality of bonding pads are formed on the upper surface. The adhesive layer is used for adhering the lower surface of the integrated circuit to the first surface of the substrate. The wirings are electrically connecting to the bonding pads of the integrated circuit and to the signal input terminals of the substrate. The glue layer is used for sealing the plurality of wirings and the integrated circuits. According to the structure, the problem caused by the overflowed glue in the integrated circuit can be effectively avoided. A method for manufacturing the structure is also disclosed.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the invention [0001]
  • The invention relates to a package structure and method for integrated circuits, in particular, to a package structure in which integrated circuits can be easily adhered to the substrate in order to solve the problem caused by the overflowed glue, thereby implementing a chip scale package. [0002]
  • 2. Description of the related art [0003]
  • In the current technological field, every product needs to be light, thin, and small. Therefore, it is preferable that the integrated circuit has a small volume in order to meet the demands of the products. The technology of a chip scale package can reduce the volume of an integrated circuit after packaging, thereby making the product small, thin, and light. [0004]
  • Referring to FIG. 1, in the technology of a conventional package or a chip scale package, when the [0005] integrated circuit 10 is adhered onto the substrate 12, the glue often overflows into the substrate 12 from the adhering surface of the integrated circuit 10 due to the improper control of the adhesive layer 14. Thus, the overflowed glue 16 may cover the signal input terminals 18 of the substrate 12 and influence the wire bonding processes in which a plurality of wirings 20 are formed. As a result, in order to prevent the signal input terminals 18 of the substrate 12 from being covered by the overflowed glue 16, the substrate 12 has to be enlarged. By doing so, the signal input terminals 18 are far away from the integrated circuit 10. In this case, the signal input terminals 18 of the substrate 12 are free from being covered by the overflowed glue 16. Therefore, the problem caused by the overflowed glue can be solved.
  • However, the overall volume of the package of the integrated circuit enlarges as the size of the [0006] substrate 12 increases. Thus, a chip scale package cannot be implemented, and the product cannot be made small, thin, and light.
  • To solve this problem caused by the overflowed glue, there is provided a package structure in which integrated circuits can be easily adhered to the substrate, thereby implementing a chip scale package. [0007]
  • SUMMARY OF THE INVENTION
  • It is therefore an object of the invention to provide a package structure and method for the integrated circuit for solving the problem caused by the overflowed glue and for facilitating the manufacturing processes. [0008]
  • It is therefore another object of the invention to provide a package structure and method for the integrated circuit capable of scaling down the package structure to make the products small, thin, and light. [0009]
  • According to one aspect of the invention, a package structure for an integrated circuit includes a substrate, an integrated circuit, an adhesive layer, a plurality of wirings, and a glue layer. The substrate has a first surface and a second surface. The first surface is formed with a plurality of signal input terminals. The second surface is formed with a plurality of signal output terminals for electrically connecting to the circuit board. The integrated circuit has a lower surface and an upper surface. Recesses are formed at two sides of the lower surface, and a plurality of bonding pads are formed on the upper surface. The adhesive layer is used for adhering the lower surface of the integrated circuit to the first surface of the substrate. The wirings are electrically connected to the bonding pads of the integrated circuit and to the signal input terminals of the substrate. The glue layer is used for sealing the plurality of wirings and the integrated circuits. [0010]
  • According to the structure, the problem caused by the overflowed glue in the integrated circuit can be effectively avoided.[0011]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a schematically cross-sectional view showing a conventional package structure of an integrated circuit. [0012]
  • FIG. 2 is a cross-sectional view showing a package structure of an integrated circuit in accordance with one embodiment of the invention. [0013]
  • FIG. 3 is a schematic view showing a package structure of an integrated circuit in accordance with another embodiment of the invention. [0014]
  • FIG. 4 is a top view showing a wafer of the invention. [0015]
  • FIG. 5 is a schematic illustration showing the scribing of the integrated circuit of the invention.[0016]
  • DETAIL DESCRIPTION OF THE INVENTION
  • The embodiments of the invention will now be described with reference to the drawings. [0017]
  • Referring to FIG. 2, the package structure of the integrated circuit of the invention includes a [0018] substrate 24, an integrated circuit 32, a plurality of wirings 42, and an adhesive layer 44.
  • The [0019] substrate 24 has a first surface 26 and a second surface 28 opposite to the first surface 26. The first surface 26 is formed with a plurality of signal input terminals 30 for transmitting the signals from the integrated circuit 32 to the substrate 24. The second surface 28 of the substrate 24 is formed with a plurality of signal output terminals 34 for transmitting the signals from the integrated circuit 32 to the circuit board (not shown). The signal output terminals 34 can be metallic balls arranged in the form of a ball grid array (BGA).
  • The integrated [0020] circuit 32 has a lower surface 36 and an upper surface 38 opposite to the lower surface 36. Two vertical recesses 40 are formed on two sides of the lower surface 36 of the integrated circuit 32. The lower surface 36 is adhered onto the first surface 26 of the substrate 24. The upper surface 38 is formed with a plurality of bonding pads 39 for electrically connecting to the substrate 24.
  • Each of the [0021] wirings 42 has a first end and a second end away from the first end. The first ends of the wirings 42 are electrically connected to the bonding pads 39 of the integrated circuit 32, respectively. The second ends of the wirings 42 are electrically connected to the signal input terminals 30 of the substrate 24, respectively. Thus, the signals from the integrated circuit 32 can be transmitted to the substrate 24. The plurality of wirings 42 may be connected to the bonding pads 39 of the integrated circuit 32 by way of wedge bonding. The first ends of the plurality of wirings 42 are located on the periphery of the upper surface 38 of the integrated circuit 32. In addition, the plurality of wirings 42 may be electrically connected to the bonding pads 39 of the integrated circuit 32 by way of ball bonding.
  • The [0022] adhesive layer 44 is coated in between the integrated circuit 32 and the substrate 24 for adhering the integrated circuit 32 to the substrate 24. Since the quantity of the glue forming the adhesive layer 44 cannot be easily controlled, the glue forming the adhesive layer 44 often overflows from the lower surface 36 of the integrated circuit 32. Thus, according the structure of the invention, the overflowed glue 46 overflowed from the adhesive layer 44 fills the recesses 40 of the integrated circuit 32. In this case, the signal input terminals 30 of the substrate 24 are free from being covered.
  • Referring to FIG. 3, the [0023] recesses 40 of the integrated circuit 32 may be made to be of the shapes of slant planes. In this case, when the quantity of the overflowed glue can be controlled to be small, the overflowed glue can be totally filled into the recesses 40. Thus, relatively large gaps will never exist in the recesses 40.
  • A [0024] glue layer 47 is used for sealing the integrated circuit 32 and the plurality of wirings 42 for protecting the integrated circuit 32 and the wirings 42.
  • Referring to FIG. 4, a [0025] wafer 48 includes a plurality of integrated circuits 32. A plurality of scribing lines 50 are formed in between two adjacent integrated circuits 32.
  • Referring to FIG. 5, the processes for manufacturing the [0026] recesses 40 of the integrated circuits 32 will be described in detail. First, recesses 40 not penetrating through the wafer 48 are formed by scribing the scribing lines 50 using a scribing tool having a large width. Next, the wafer 48 is scribed at the scribing lines 50 using another scribing tool having a small width. Therefore, each of the integrated circuits 32 on the wafer 48 can be separated and recesses 40 can be formed in each of the integrated circuits 32.
  • According to the above-mentioned structure, the package structure of the integrated circuit of the invention has the following advantages. [0027]
  • 1. The [0028] recesses 40 of the integrated circuit 32 can be easily manufactured, so the manufacturing costs of the integrated circuit 32 will not be greatly increased.
  • 2. Since the [0029] integrated circuit 32 with recesses 40 are used for packaging, the overflowed glue will not cause any problem. Thus, the package structure can be easily manufactured, the manufacturing costs can be lowered, and the yield can be improved.
  • 3. Since the problem caused by the overflowed glue can be solved, the size of the [0030] substrate 24 can be the same as that of the chip. Thus, a chip scale package can be implemented so as to make the products small, thin, and light.
  • While the invention has been described by way of example and in terms of preferred embodiments, it is to be understood that the invention is not limited to the disclosed embodiments. To the contrary, it is intended to cover various modifications. Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications. [0031]

Claims (11)

What is claimed is:
1. A package structure of an integrated circuit for electrically connecting to a circuit board, comprising:
a substrate having a first surface and a second surface opposite to the first surface, the first surface being formed with a plurality of signal input terminals, the second surface being formed with a plurality of signal output terminals for electrically connecting to the circuit board;
an integrated circuit having a lower surface and an upper surface opposite to the lower surface, recesses being formed at two sides of the lower surface, a plurality of bonding pads being formed on the upper surface;
an adhesive layer for adhering the lower surface of the integrated circuit to the first surface of the substrate;
a plurality of wirings electrically connecting to the bonding pads of the integrated circuit and to the signal input terminals of the substrate; and
a glue layer for sealing the plurality of wirings and the integrated circuits.
2. The package structure of the integrated circuit according to claim 1, wherein the signal output terminals on the second surface of the substrate are metallic balls arranged in the form of a ball grid array (BGA).
3. The package structure of the integrated circuit according to claim 1, wherein the overflowed glue from the adhesive layer fills the recesses of the lower surface of the integrated circuit when the integrated circuit is adhered to the substrate.
4. The package structure of the integrated circuit according to claim 1, wherein the recesses are perpendicular to the lower surface of the integrated circuit.
5. The package structure of the integrated circuit according to claim 1, wherein the recesses of the lower surface of the integrated circuit are slant.
6. The package structure of the integrated circuit according to claim 1, wherein the recesses of the second surface of the integrated circuit are formed by using a scribing tool.
7. A method for manufacturing a package structure of an integrated circuit, comprising the steps of:
providing a substrate;
providing a wafer formed with a plurality of integrated circuits, a plurality of scribing lines being formed between adjacent integrated circuits;
scribing the wafer along each of the scribing lines to predetermined depths using a scribing tool having a larger width so as to form recesses at two sides of each of the integrated circuits;
cutting the wafer along each of the scribing lines using a scribing tool having a smaller width to separate each of the integrated circuits;
coating an adhesive layer to adhere the integrated circuit onto the substrate;
electrically connecting the plurality of wirings to the integrated circuit and to the substrate; and
providing a glue layer for sealing the plurality of wirings and the integrated circuit.
8. The method for manufacturing the package structure of the integrated circuit according to claim 7, wherein the substrate includes metallic balls arranged in the form of a ball grid array (BGA).
9. The method for manufacturing the package structure of the integrated circuit according to claim 7, wherein the overflowed glue from the adhesive layer fills the recesses of the lower surface of the integrated circuit when the integrated circuit is adhered to the substrate.
10. The method for manufacturing the package structure of the integrated circuit according to claim 7, wherein the recesses are perpendicular to the lower surface of the integrated circuit.
11. The method for manufacturing the package structure of the integrated circuit according to claim 7, wherein the recesses of the lower surface of the integrated circuit are slant.
US09/770,054 2001-01-24 2001-01-24 Package structure of integrated circuits and method for packaging the same Abandoned US20020096766A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US09/770,054 US20020096766A1 (en) 2001-01-24 2001-01-24 Package structure of integrated circuits and method for packaging the same
US10/147,029 US6642137B2 (en) 2001-01-24 2002-05-15 Method for manufacturing a package structure of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/770,054 US20020096766A1 (en) 2001-01-24 2001-01-24 Package structure of integrated circuits and method for packaging the same

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/147,029 Division US6642137B2 (en) 2001-01-24 2002-05-15 Method for manufacturing a package structure of integrated circuits

Publications (1)

Publication Number Publication Date
US20020096766A1 true US20020096766A1 (en) 2002-07-25

Family

ID=25087327

Family Applications (2)

Application Number Title Priority Date Filing Date
US09/770,054 Abandoned US20020096766A1 (en) 2001-01-24 2001-01-24 Package structure of integrated circuits and method for packaging the same
US10/147,029 Expired - Lifetime US6642137B2 (en) 2001-01-24 2002-05-15 Method for manufacturing a package structure of integrated circuits

Family Applications After (1)

Application Number Title Priority Date Filing Date
US10/147,029 Expired - Lifetime US6642137B2 (en) 2001-01-24 2002-05-15 Method for manufacturing a package structure of integrated circuits

Country Status (1)

Country Link
US (2) US20020096766A1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040046253A1 (en) * 2002-01-18 2004-03-11 Newman Robert A. Method for controlling die attach fillet height to reduce die shear stress
SG104291A1 (en) * 2001-12-08 2004-06-21 Micron Technology Inc Die package
US20050093174A1 (en) * 2003-10-31 2005-05-05 Seng Eric T.S. Reduced footprint packaged microelectronic components and methods for manufacturing such microelectronic components
US20080273312A1 (en) * 2007-05-04 2008-11-06 Henry Descalzo Bathan Integrated circuit package system with interference-fit feature
EP2230688A1 (en) * 2009-03-20 2010-09-22 Nxp B.V. Fan out semiconductor package and manufacturing method
US20110089556A1 (en) * 2009-10-19 2011-04-21 National Semiconductor Corporation Leadframe packages having enhanced ground-bond reliability
US20130037966A1 (en) * 2011-08-10 2013-02-14 Freescale Semiconductor, Inc Semiconductor device die bonding
CN111929468A (en) * 2019-04-26 2020-11-13 精工爱普生株式会社 Inertial sensor, electronic apparatus, moving object, and method for manufacturing inertial sensor

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003291199A1 (en) * 2002-12-09 2004-06-30 Advanced Interconnect Technologies Limited Package having exposed integrated circuit device
US7612443B1 (en) 2003-09-04 2009-11-03 University Of Notre Dame Du Lac Inter-chip communication
US6972243B2 (en) * 2003-09-30 2005-12-06 International Business Machines Corporation Fabrication of semiconductor dies with micro-pins and structures produced therewith
US7323675B2 (en) * 2005-09-21 2008-01-29 Sigurd Microelectronics Corp. Packaging structure of a light-sensing device with a spacer wall
US9620473B1 (en) 2013-01-18 2017-04-11 University Of Notre Dame Du Lac Quilt packaging system with interdigitated interconnecting nodules for inter-chip alignment
KR102495911B1 (en) 2016-06-14 2023-02-03 삼성전자 주식회사 Semiconductor package
US10535588B2 (en) * 2017-01-18 2020-01-14 Stmicroelectronics, Inc. Die with metallized sidewall and method of manufacturing

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2718901B2 (en) * 1994-10-31 1998-02-25 ローム株式会社 Method for manufacturing semiconductor device
US5742100A (en) * 1995-03-27 1998-04-21 Motorola, Inc. Structure having flip-chip connected substrates
JPH1140522A (en) * 1997-07-17 1999-02-12 Rohm Co Ltd Semiconductor wafer and manufacture thereof, semiconductor chip and manufacture thereof, and ic card with the semiconductor chip
JP3310617B2 (en) * 1998-05-29 2002-08-05 シャープ株式会社 Resin-sealed semiconductor device and method of manufacturing the same
US6307479B1 (en) * 2000-08-07 2001-10-23 Harvatek Corp. Running indicator for integrated circuit package

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG104291A1 (en) * 2001-12-08 2004-06-21 Micron Technology Inc Die package
US7489028B2 (en) 2001-12-08 2009-02-10 Micron Technology, Inc. Die package
US20040046253A1 (en) * 2002-01-18 2004-03-11 Newman Robert A. Method for controlling die attach fillet height to reduce die shear stress
US7691726B2 (en) * 2003-10-31 2010-04-06 Micron Technology, Inc. Reduced footprint packaged microelectronic components and methods for manufacturing such microelectronic components
US20050093174A1 (en) * 2003-10-31 2005-05-05 Seng Eric T.S. Reduced footprint packaged microelectronic components and methods for manufacturing such microelectronic components
US7218001B2 (en) * 2003-10-31 2007-05-15 Micron Technology, Inc. Reduced footprint packaged microelectronic components and methods for manufacturing such microelectronic components
US20080067634A1 (en) * 2003-10-31 2008-03-20 Micron Technology, Inc. Reduced footprint packaged microelectronic components and methods for manufacturing such microelectronic components
US7977778B2 (en) * 2007-05-04 2011-07-12 Stats Chippac Ltd. Integrated circuit package system with interference-fit feature
US20080273312A1 (en) * 2007-05-04 2008-11-06 Henry Descalzo Bathan Integrated circuit package system with interference-fit feature
EP2230688A1 (en) * 2009-03-20 2010-09-22 Nxp B.V. Fan out semiconductor package and manufacturing method
WO2010106515A1 (en) * 2009-03-20 2010-09-23 Nxp B.V. Fan out semiconductor package and manufacturing method
US20110089556A1 (en) * 2009-10-19 2011-04-21 National Semiconductor Corporation Leadframe packages having enhanced ground-bond reliability
WO2011049764A2 (en) * 2009-10-19 2011-04-28 National Semiconductor Corporation Leadframe packages having enhanced ground-bond reliability
WO2011049764A3 (en) * 2009-10-19 2011-11-17 National Semiconductor Corporation Leadframe packages having enhanced ground-bond reliability
US8093707B2 (en) 2009-10-19 2012-01-10 National Semiconductor Corporation Leadframe packages having enhanced ground-bond reliability
US20130037966A1 (en) * 2011-08-10 2013-02-14 Freescale Semiconductor, Inc Semiconductor device die bonding
CN111929468A (en) * 2019-04-26 2020-11-13 精工爱普生株式会社 Inertial sensor, electronic apparatus, moving object, and method for manufacturing inertial sensor
US11282808B2 (en) * 2019-04-26 2022-03-22 Seiko Epson Corporation Inertial sensor, electronic instrument, vehicle, and method for manufacturing inertial sensor

Also Published As

Publication number Publication date
US20020130391A1 (en) 2002-09-19
US6642137B2 (en) 2003-11-04

Similar Documents

Publication Publication Date Title
US7586184B2 (en) Electronic package
US6642137B2 (en) Method for manufacturing a package structure of integrated circuits
US6441496B1 (en) Structure of stacked integrated circuits
US6353267B1 (en) Semiconductor device having first and second sealing resins
US5668409A (en) Integrated circuit with edge connections and method
US20080111224A1 (en) Multi stack package and method of fabricating the same
US20030001281A1 (en) Stacked chip package having upper chip provided with trenches and method of manufacturing the same
US6677219B2 (en) Method of forming a ball grid array package
US20060157830A1 (en) Semiconductor package using flexible film and method of manufacturing the same
US20020096754A1 (en) Stacked structure of integrated circuits
US6855573B2 (en) Integrated circuit package and manufacturing method therefor with unique interconnector
US7132740B2 (en) Semiconductor package with conductor impedance selected during assembly
US20120264257A1 (en) Mold array process method to prevent exposure of substrate peripheries
KR100601762B1 (en) flip chip bonding fabrication method using non-conductive adhesive
US20070284756A1 (en) Stacked chip package
US8159063B2 (en) Substrate and package with micro BGA configuration
US8975738B2 (en) Structure for microelectronic packaging with terminals on dielectric mass
EP1093165A1 (en) Integrated circuit assembly
JP2005101186A (en) Laminated semiconductor integrated circuit
US20030116817A1 (en) Image sensor structure
US20020096761A1 (en) Structure of stacked integrated circuits and method for manufacturing the same
KR0180332B1 (en) Film carrier tape for semiconductor devices
KR100526845B1 (en) Circuit board and its manufacturing method
US20020096762A1 (en) Structure of stacked integrated circuits and method for manufacturing the same
KR20010019260A (en) PCB having dam for protecting adhesive overflow and fine pitch ball grid array(FBGA) package using the same

Legal Events

Date Code Title Description
AS Assignment

Owner name: KINGPAK TECHNOLOGY INC., TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:CHEN, WEN CHUAN;PENG, KUO-FENG;CHOU, C. H.;AND OTHERS;REEL/FRAME:011504/0670

Effective date: 20010103

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION