US20020055284A1 - Socket apparatus for removably mounting electronic packages - Google Patents
Socket apparatus for removably mounting electronic packages Download PDFInfo
- Publication number
- US20020055284A1 US20020055284A1 US09/999,134 US99913401A US2002055284A1 US 20020055284 A1 US20020055284 A1 US 20020055284A1 US 99913401 A US99913401 A US 99913401A US 2002055284 A1 US2002055284 A1 US 2002055284A1
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- US
- United States
- Prior art keywords
- base
- contact
- socket
- support member
- cover
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
Definitions
- This invention relates generally to a socket for removably mounting an electronic part that has a large number of terminals on its lower surface in order to electrically connect each terminal to a circuit path which in turn is connected to test equipment for testing such electronic parts and more particularly to sockets of the type which employ a flexible contact sheet or film as a contact interface member.
- socket 101 has a rectangular base 102 and a cover 103 pivotably mounted on the base and being movable between an opened position away from the base and a closed position engaged with the base.
- a contact film support 105 capable of supporting a contact film 104 , to be described later, is provided at the central part of base 102 .
- a thin flat rubber sheet 106 is disposed in a recessed portion formed on the upper surface of support 105 .
- Compression coil springs 107 disposed between support 105 and base 102 provide an upwardly directed bias to support 105 .
- a generally square shaped contact film 104 has a plurality of inner conductive pads 104 b arranged at the center of the film in conformity with the pattern of solder balls 108 a of BGA package 108 .
- Inner pads 104 b are respectively connected to outer conductive pads 104 d arranged along the outer peripheral part of film 104 a through a selected wiring pattern 104 c.
- an adapter 109 capable of seating BGA package 108 with solder balls 108 a exposed in an opening in the adapter, is removably provided on support 105 of base 102 .
- Adapter 109 is placed over contact film 104 with the inner pads 104 b of contact film 104 disposed at the opening of the adapter and with the outer peripheral part of the contact film bent by rib 109 a of the adapter into a recess 102 a formed in the base.
- the outer peripheral part of the contact film is received between rib 109 a and contacts 111 mounted in the recess with the outer pads 104 d electrically connected to respective contacts 111 .
- an electrical connection is made from solder balls 108 a to inner pads 104 b which are connected by wiring pattern 104 c to outer pads 104 d and then to contacts 111 which in turn are connected to external substrate 110 .
- Cover member 103 has a compression member 112 for engaging adapter 109 as well as a BGA package 108 received in adapter 109 .
- Compression member 112 is biased in a direction away from cover member 103 by means of a compression coil spring 113 .
- a BGA package 108 is arranged on contact film 104 through the opening in adapter 109 and cover member 103 is then closed, thereby causing the solder balls 108 a of the BGA package and respective inner pads 104 b of the contact film 104 to be connected with a compressive force applied from both base 102 through support 105 and cover member 103 through engagement portion 112 .
- rubber sheet 106 which is interposed between support 105 and contact film 104 is plastically deformed when it is heated in a compressed state in connection with burn-in tests, thereby adversely affecting the effectiveness of the desired function of elastically receiving BGA package 108 and contact film 104 between support 105 and engagement member 112 .
- a socket made in accordance with a preferred embodiment of the invention comprises a base wherein electrically conductive contact members capable of contacting each terminal of an electronic package having terminals arranged according to a selected pattern and a plurality of electrically conductive spring contact elements capable of applying force to the contact members from below are mounted and aligned respectively with each terminal of the electronic package.
- a compression member capable of moving in a direction either toward or away from the base is provided for applying a force from above tending to compress the spring contact elements.
- the contact members are mounted on an interface contact film which is received on a surface of a support member which is also formed with a plurality of bores therethrough in alignment with the contact members of the contact film.
- the electrically conductive spring contact elements are in the form of a coil spring received in each bore and adapted to apply a force to each contact member of the contact film from below.
- an adapter capable of accommodating an electronic package and exposing the package terminals and each of the contact members.
- the terminals of the electronic package are connectable with the contact members of the interface contact film which is arranged between the adapter and the base, and a cover is provided that has a compression member capable of applying a force to the electronic package against the spring contact elements.
- the cover is mounted on the base and is pivotable between opened and closed positions in linkage with the compression member.
- an inter-terminal pitch expansion substrate can be installed in the socket.
- the substrate has a plurality of terminals spaced apart a distance greater than the distance between the terminals of the electronic package inter-connected to the spring contact elements through a selected wiring pattern on the substrate.
- the spring contact elements comprise a first axial length coil portion having a selected outer diameter and a second axial length coil portion having an outer diameter which is greater than the outer diameter of the first coil portion.
- the plurality of bores formed through the support member for receiving the spring contact elements have a first bore portion formed larger than the outer diameter of the first axial length portion and a second bore portion having a diameter formed somewhat smaller than the outer diameter of the second coil portion allowing fixation of the second coil portion in a respective bore of the support member while allowing free movement of the first coil portion and making it easier to install the spring contact elements.
- the contact members of the interface contact film have a terminal engagement part formed in such a manner as to be engaged with a package terminal in conformity with the configuration of the terminals of the electronic package and, at the same time, have a contact engagement part for contacting a flattened end of a respective spring contact element.
- FIG. 1 is a side elevational cross section of a socket made according to a first embodiment of the invention shown with the cover thereof in the closed position;
- FIG. 2 is a side elevational cross section of the FIG. 1 socket shown with the cover in the opened position and shown with an exploded view of the components of the socket;
- FIG. 3( a ) is an enlarged, broken away portion of FIG. 1;
- FIG. 3( b ) is a further enlarged portion of FIG. 3( a );
- FIG. 4 is another enlarged fragmentary portion of FIG. 1;
- FIGS. 5 ( a ) and 5 ( b ) are further enlarged portions of FIG. 4;
- FIG. 6( a ) is a top plan view of an interface contact film used in the FIGS. 1, 2 embodiment
- FIG. 6( b ) is a cross section taken on line A-A of FIG. 6( a ) showing contact members
- FIG. 6( c ) is a top plan view showing one of the contact members of FIG. 6( b );
- FIGS. 7 ( a ) and 7 ( b ) show side elevational cross sections of another embodiment of the invention shown with a cover in the raised and the lowered positions, respectively;
- FIG. 8 is a side elevational cross section of a prior art socket.
- FIG. 9 is a top plan view of an interface contact film used in the FIG. 8 prior art socket.
- a socket 1 made in accordance with a first preferred embodiment of the invention is adapted for mounting an electronic package having a BGA terminal array (hereafter called package or electronic package) 2 with globular solder balls (terminals) 2 a being formed in a selected pattern.
- the socket has a base (main socket body) 10 and a cover 20 pivotably mounted thereon and being movable between opened and closed positions relative to base 10 .
- Base 10 is formed in the shape of a box by using suitable resinous material such as a polyether imide, and has a wall 10 b that surrounds a generally squared shaped bottom 10 a.
- Location pins 10 c for mounting the socket on an external substrate 50 are provided extending from the lower surface of bottom 10 a.
- a recessed portion 10 d of a prescribed size is formed in base 10 for receiving a pitch expansion substrate (inter-terminal expansion substrate) 11 , a support member 12 , and an adapter 13 in this order. These components are assembled, maintaining them parallel with bottom 10 b of the base.
- a recessed contact film receiving surface 12 a is formed at the top of the support member for placing thereon a sheet of interface contact film 14 , to be described below. Surface 12 a is formed to be lower than the top surface of support member 12 by a depth somewhat greater than the thickness of the interface contact film 14 .
- interface contact film 14 formed of a generally square sheet 14 a of suitable material, such as polyimide, has a plurality of contacts (contact members) 14 b arranged in accordance with the selected pattern of solder balls 2 a of package 2 at the central part of the film 14 a.
- Each contact member 14 b comprises a disc-shaped flat plate portion (contact part) 14 b 1 and a ball engagement part (terminal engagement part) 14 b 2 that is cylindrically formed having a diameter somewhat less than the diameter of the solder balls so as to be engageable with a part of the surface of the solder ball 2 a as shown in FIG. 6( b ).
- Contact member 14 b preferably is provided with a plated layer of nickel, gold or the like. Each contact member 14 b is placed at a selected location on contact film 14 a, with plate part 14 b 1 on lower surface of contact film 14 a, while the ball engagement part 14 b 2 extends through an aperture in the contact film to a location above the top surface thereof.
- a plurality of spring contact elements 15 capable of contacting the plate part 14 b 1 of each contact 14 b of the contact film are provided at the central portion of contact film receiving surface 12 a of support member 12 .
- Spring contact elements 15 are compression coil springs made of wiring material whose electrical conductivity is high, such as beryllium copper.
- the contact spring elements comprise first spring portion 15 a of a selected outer diameter and a second spring portion 15 b having an outer diameter which is larger than the selected diameter, forming a step-like shape.
- the free end of the first spring portion 15 a is preferably ground to form a flat surface.
- Each spring contact element 15 is formed so that its length is such that it extends beyond contact film receiving surface 12 a a distance somewhat greater than the height of the recess in the top surface of support member 12 and, at the same time, the diameter of first spring part 15 a is selected to be smaller than the diameter of plate part 14 b 1 of contact film 14 a.
- a plurality of spring receiving bores 12 b capable of receiving a respective spring contact element 15 , are formed through support member 12 .
- Bores 12 b have a longitudinal axis normal to the top surface of support member 12 and are stepped having a first diameter portion 12 b 1 larger than the outer diameter of the first spring portion 15 a and a second diameter portion 12 b 2 somewhat smaller than the outer diameter of the second spring portion 15 b.
- a respective spring contact element 15 is inserted in diameter portion 12 b 2 with second portion 15 b fixed therein with the lower end of second portion 15 b protruding somewhat from the lower surface of support member 12 and with the top of the first portion 15 a extending above the contact film receiving surface 12 a of support member 12 by a selected amount.
- pitch expansion member 11 disposed in base 10 , is arranged between support member 12 and bottom 10 a of the base.
- a recess 12 c is formed in the bottom surface of support member 12 aligned with connective pins 11 b, to be described.
- a space 12 d is preferably formed between the central portions of support member 12 and pitch expansion member 11 .
- a plurality of pads 11 a engageable with the lower part of each spring contact element 15 , are formed on the central portion of the upper surface of pitch expansion member 11 .
- a plurality of connective pins 11 b extend through bores along the edge part of pitch expansion substrate 11 and are capable of being connected with respective circuit paths of external substrate 50 .
- Wiring pattern 11 c is formed on the upper surface of pitch expansion substrate 11 for electrically connecting each pad 11 a and the corresponding connective pin 11 b.
- pitch expansion substrate 11 increases the spacing among the plurality of connective pins 11 b relative to the spacing among the plurality of solder balls 2 a.
- adapter 13 is arranged over support member 12 with the lower surface of adapter 13 engaging the upper, outer peripheral surface around the edge of the support member, that is, excluding contact film receiving surface 12 a.
- An electronic package seating portion 13 a capable of accommodating package 2 , is centrally provided on adapter 13 and is formed somewhat larger than the outer shape of package 2 .
- An inclined surface guide 13 c is provided on the outer periphery of seating portion 13 a for guiding package 2 to seat 13 b at the bottom of seating portion 13 a.
- Opening 13 d is provided at seat 13 b at the bottom of seating portion 13 a.
- each spring contact 15 in support member 12 extends into opening 13 d of adapter 13 .
- cover 20 is pivotably supported on wall 10 b on one side of base 10 by means of a shaft 21 and is movable between an opened position away from base 10 and a closed position on the base.
- a coil spring 22 is arranged on shaft 21 with opposite ends received in base 10 and cover 20 to apply a bias to the cover in an opening direction.
- a lever 23 is pivotably mounted at a location intermediate its ends at an opposite side of cover 20 .
- One end 23 a of the lever is biased away from the cover by a first compressive coil spring 24 , so that an engagement part 23 b formed at the other end can be engaged with a catch 10 e on base 10 .
- a compression member 30 is pivotably mounted on shaft 21 and arranged within the cover. Compression member 30 is biased in a direction away from cover member 20 by a second compression coil spring 31 disposed between cover 20 and compression member 30 . Movement of compression member 30 away from cover 20 is limited by an engagement part 30 a formed at a side of compression member 30 opposite to the pivotable mounting side and is engageable with an engagement part 20 a provided on cover 20 . Because of this, compression member 30 pivots along with cover 20 when engagement parts 30 a, 20 a are engaged and moves independently of cover 20 when engagement parts 30 a, 20 a separate from each other.
- a first boss-shaped engagement portion 30 b is formed at a selected location of compression member 30 facing base 10 and is configured for receipt in the recess of seating portion 13 a of the adapter.
- a generally flat surface 30 c is formed on the bottom of first engagement portion 30 b for engagement with a package received on seat 13 b.
- Second protruding engagement portions 30 d are formed on the bottom of compression member 30 spaced apart from boss 30 b, preferably on opposite sides of the boss relative to a direction extending away from the pivoted connection of compression member 30 .
- the socket is prepared for use by mounting the socket on external substrate 50 using location pins 10 c as shown in FIGS. 1 and 2.
- Cover 20 is placed in the opened position; the pitch expansion substrate 11 is inserted into recess 10 d of base 10 and connective pins 11 b are connected to external substrate 50 .
- a spring contact element 15 is inserted into each spring receiving bore 12 b of support member 12 and the support member is arranged on the pitch expansion substrate 11 .
- the lower face of the support member is spaced from the wiring pattern 11 c on pitch expansion substrate 11 and only the lower part of the spring contact elements 15 contact pads 11 a of the pitch expansion substrate.
- the sheet of contact film 14 is placed on the contact film receiving surface 12 a of support member 12 and the plate portion 14 b 1 of each contact member 14 b is caused to engage the top of a respective spring contact element 15 .
- Contact film 14 is supported at a position where the force that is received from each spring contact element 15 is balanced against the component of weight of the contact film and is placed in a state where it is positioned above receiving surface 12 a.
- the contact film 14 tends to equalize the position of the tops of the spring contact elements 15 and forms a surface for receiving thereon solder balls 2 a of package 2 .
- Package 2 is placed in a state of equilibrium at a location which is somewhat lowered from the holding position of the contact film alone due to the weight of the package 2 itself but is maintained spaced above seat 13 b of seating portion 13 a as each solder ball 2 a is biased upwardly by a respective spring contact element 15 .
- first engagement portion 30 b of the compression member enters through the recess of the seating portion 13 a of the adapter and surface 30 c of first engagement portion 30 b engages package 2 with an orientation which is somewhat tilted compared with the upper surface of package 2 , and starts compressing the package from this position.
- package 2 will be inclined somewhat in conformity with the inclination of surface 30 c.
- each solder ball 2 a maintains a state of engagement with the ball engagement portion 14 b 2 of contact film 14 .
- second engagement portion 30 d engages the upper surface of adapter 13 and stops, while cover 20 moves on without being affected by the arrested motion of compression member 30 .
- the opening and closing lever 23 is being engaged with catch 10 e of base 10
- the cover stops on base 10 with compression member 30 pressed against adapter 13 by second compression coil spring 31 .
- package 2 will be oriented in parallel with support member 12 with the package pressed down further from the original state of equilibrium.
- each solder ball 2 a of package 2 is independently compressed as it receives the compressive force of a respective spring contact element 15 through ball engagement portion 14 b 2 of contact film 14 despite any deviation from parallelism between the upper surface of package 2 and an imaginary plane formed by the bottom of solder balls 2 a or the variations in the distance between the upper surface of package 2 and the solder balls 2 a in the perpendicular direction.
- Film 14 a of contact film 14 is free to flex in conformity with upward or downward movement of the tip of each spring contact element 15 in the space between the receiving surface 12 a of support member 12 and adapter 13 .
- contact members 14 b of contact film 14 are not subject to any unnecessary tension from film 14 a, with a result that the distance from other contact members 14 b can be maintained approximately constant. Accordingly, a respective contact member does not move from the position of engagement with a solder ball 2 a at ball engagement portion 14 b 2 or the position of the contact member with the top of the spring contact element 15 at the plate portion 14 b 1 .
- the solder balls of package 2 are received by spring contact elements 15 made of metal. Therefore, even if heated in a burn-in test, the contact elements 15 themselves will not be plastically deformed, thereby stabilizing the force with which the solder balls 2 a of package 2 are received. Moreover, solder balls 2 a of package 2 are received by spring contact elements 15 independently through ball engagement portions 14 b 2 of the contact film, thereby making it possible to absorb any variations in the position of the solder balls relative to package 2 by spring contact elements 15 . Therefore, it becomes possible to more reliably provide a suitable pressure between the solder balls of package 2 and the ball engagement portions 14 b 2 of contact film 14 , thereby bringing about a stabilized state of connection.
- solder balls 2 a of package 2 do not directly engage spring contact elements 15 since contact member 14 b of the contact film has been interposed between the two.
- a contact interface is provided where each solder ball 2 a of package 2 can be arranged at the top of a respective spring contact element 15 and a stable connection of solder balls 2 a of package 2 to the top of a respective contact element 15 is provided irrespective of the variations in the height of the spring of the spring contact element 15 .
- contact members 14 b of contact film 14 are held between each solder ball 2 a and a respective spring contact element 15 without contacting other parts. Accordingly, it becomes possible to cause the contact members 14 b to be engaged with solder balls 2 a by receiving only the compressive force from spring contact elements 15 , without receiving any restraining force from film 14 a, thereby making it possible to maintain them without shifting the position of engagement between ball engagement portions 14 b 2 and solder balls 2 or the contact position between plate portions 14 b 1 and the top of contact elements 15 .
- pads 11 a are adapted to be connected to respective spring contact elements 15 , facilitating the use of pitch expansion substrate 11 on base 10 , thereby making it unnecessary to form a wiring pattern on the contact film in the manner of the prior art. Therefore, it becomes only necessary to arrange contact members 14 b in accordance with the pattern of solder balls 2 a even when there are a large number of solder balls of package 2 . Moreover, the flexibility of film 14 a itself does not have to be compromised. Because of this, it becomes possible to use contact film 14 with a package 2 that has a large number of solder balls 2 a. Further, since a wiring pattern on contact film 14 is unnecessary, the size of contact film 14 itself can be reduced and the expense required for the wiring pattern can be eliminated.
- the shape of contact member 14 b of contact film 14 has been so adapted that the shape of the ball engagement part 14 b 2 is made cylindrical in conformity with solder ball 2 a of package 2 and, at the same time, plate portion 14 b 1 is made flat in conformity with the top of the spring contact 15 . Accordingly, it becomes possible to insert the bottom portion of a solder ball 2 a into the ball engagement portion 14 b 2 with spring contact 15 being received approximately evenly at the plate portion 14 b 1 , thereby enhancing the state of connection between each solder ball 2 a and the respective spring contact element 15 .
- a part of the spring contact element 15 is fixed to support member 12 merely by inserting the spring element into a bore in the member. Therefore, it becomes easier to install the spring contact elements 15 .
- FIGS. 7 ( a ) and 7 ( b ) show a socket 1 ′ having a different force application mechanism.
- cover 201 is vertically movable relative to base 10 ′ and compression member 300 is linked to cover 201 by means of a link member 202 for applying a force to package 2 in dependence upon the vertical movement of cover 201 .
- Base 10 ′ pitch expansion substrate 11 ′ and support member 12 ′ serve the same functions as corresponding components in the first described embodiment and are merely modified to conform to the different force application mechanism.
- the ball engagement portions 14 b 2 of contact film 14 are cylindrical in shape in conformity with solder balls 2 a of package 2 .
- LGA Land Grid Array
- compression coil springs are used as the spring contact element 15 in the above described embodiments, a part or the whole of the spring contact elements could be replaced with some other kind of spring such as a plate spring, or similar conductive elastic members.
- a pitch expansion substrate 11 is described.
- the pitch expansion substrate may be unnecessary when the socket is used with a package in which the number of solder balls 2 a is not so great and the distances among the terminals of the external substrate 50 can be made to conform with the distances among the solder balls.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
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- General Physics & Mathematics (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
- This invention relates generally to a socket for removably mounting an electronic part that has a large number of terminals on its lower surface in order to electrically connect each terminal to a circuit path which in turn is connected to test equipment for testing such electronic parts and more particularly to sockets of the type which employ a flexible contact sheet or film as a contact interface member.
- It is conventional to subject semiconductor (IC) packages having resin sealed IC chips to various tests including a reliability test, called a burn-in test, to identify packages which do not meet required specifications. One such socket for use with semiconductor packages having terminals arranged in a Ball Grid Array (BGA) is shown in FIG. 8. As shown in the figure,
socket 101 has arectangular base 102 and acover 103 pivotably mounted on the base and being movable between an opened position away from the base and a closed position engaged with the base. Acontact film support 105, capable of supporting acontact film 104, to be described later, is provided at the central part ofbase 102. A thinflat rubber sheet 106 is disposed in a recessed portion formed on the upper surface ofsupport 105.Compression coil springs 107 disposed betweensupport 105 andbase 102 provide an upwardly directed bias to support 105. - With reference to FIG. 9, a generally square
shaped contact film 104 has a plurality of innerconductive pads 104 b arranged at the center of the film in conformity with the pattern ofsolder balls 108 a ofBGA package 108.Inner pads 104 b are respectively connected to outerconductive pads 104 d arranged along the outer peripheral part offilm 104 a through a selectedwiring pattern 104 c. - Again, with reference to FIG. 8, an
adapter 109, capable ofseating BGA package 108 withsolder balls 108 a exposed in an opening in the adapter, is removably provided onsupport 105 ofbase 102.Adapter 109 is placed overcontact film 104 with theinner pads 104 b ofcontact film 104 disposed at the opening of the adapter and with the outer peripheral part of the contact film bent by rib 109 a of the adapter into a recess 102 a formed in the base. The outer peripheral part of the contact film is received between rib 109 a andcontacts 111 mounted in the recess with theouter pads 104 d electrically connected torespective contacts 111. Thus, an electrical connection is made fromsolder balls 108 a toinner pads 104 b which are connected bywiring pattern 104 c toouter pads 104 d and then tocontacts 111 which in turn are connected toexternal substrate 110. -
Cover member 103 has acompression member 112 forengaging adapter 109 as well as a BGApackage 108 received inadapter 109.Compression member 112 is biased in a direction away fromcover member 103 by means of acompression coil spring 113. - A BGA
package 108 is arranged oncontact film 104 through the opening inadapter 109 andcover member 103 is then closed, thereby causing thesolder balls 108 a of the BGA package and respectiveinner pads 104 b of thecontact film 104 to be connected with a compressive force applied from bothbase 102 throughsupport 105 andcover member 103 throughengagement portion 112. In the prior art socket described above,rubber sheet 106 which is interposed betweensupport 105 andcontact film 104 is plastically deformed when it is heated in a compressed state in connection with burn-in tests, thereby adversely affecting the effectiveness of the desired function of elastically receivingBGA package 108 andcontact film 104 betweensupport 105 andengagement member 112. As a result, it has been difficult to produce a suitable pressure betweensolder balls 108 a ofBGA package 108 and respectiveinner pads 104 b ofcontact film 104 by merely employing thecompression coil springs support 105 andengagement member 112. Further, with respect tocontact film 104 used in the prior art socket, it has been necessary to arrange the same number ofinner pads 104 b andouter pads 104 d as thesolder balls 108 a of the BGA package as well as the number of interconnecting paths between respective inner and outer pads. As the number of the solder balls ofBGA package 108 increase, theinner pads 104 b of the contact film are made smaller, thereby making it more difficult to form awiring pattern 104 c oncontact film 104. Although it may be possible to form the contact film as a multi-layer substrate in order to facilitate forming the interconnections, such a substrate reduces flexibility, thereby making it unsuitable for use in this kind of socket. - It is an object of the present invention to provide a socket free of the above described prior art limitations. Another object of the invention is the provision of a socket in which the electrical connection between the terminals of an electronic package and the contacts of an interface contact film are optimized. Yet another object is the provision of a socket having an interface contact film particularly adapted for electronic packages having a large number of terminals.
- A socket made in accordance with a preferred embodiment of the invention comprises a base wherein electrically conductive contact members capable of contacting each terminal of an electronic package having terminals arranged according to a selected pattern and a plurality of electrically conductive spring contact elements capable of applying force to the contact members from below are mounted and aligned respectively with each terminal of the electronic package. A compression member capable of moving in a direction either toward or away from the base is provided for applying a force from above tending to compress the spring contact elements.
- According to a feature of the invention, the contact members are mounted on an interface contact film which is received on a surface of a support member which is also formed with a plurality of bores therethrough in alignment with the contact members of the contact film. The electrically conductive spring contact elements are in the form of a coil spring received in each bore and adapted to apply a force to each contact member of the contact film from below.
- According to another feature of the invention, an adapter is provided capable of accommodating an electronic package and exposing the package terminals and each of the contact members. The terminals of the electronic package are connectable with the contact members of the interface contact film which is arranged between the adapter and the base, and a cover is provided that has a compression member capable of applying a force to the electronic package against the spring contact elements. The cover is mounted on the base and is pivotable between opened and closed positions in linkage with the compression member.
- According to another feature of the invention, an inter-terminal pitch expansion substrate can be installed in the socket. The substrate has a plurality of terminals spaced apart a distance greater than the distance between the terminals of the electronic package inter-connected to the spring contact elements through a selected wiring pattern on the substrate.
- According to yet another feature of the invention, the spring contact elements comprise a first axial length coil portion having a selected outer diameter and a second axial length coil portion having an outer diameter which is greater than the outer diameter of the first coil portion. The plurality of bores formed through the support member for receiving the spring contact elements have a first bore portion formed larger than the outer diameter of the first axial length portion and a second bore portion having a diameter formed somewhat smaller than the outer diameter of the second coil portion allowing fixation of the second coil portion in a respective bore of the support member while allowing free movement of the first coil portion and making it easier to install the spring contact elements.
- According to a feature of the invention, the contact members of the interface contact film have a terminal engagement part formed in such a manner as to be engaged with a package terminal in conformity with the configuration of the terminals of the electronic package and, at the same time, have a contact engagement part for contacting a flattened end of a respective spring contact element.
- The accompanying drawings, incorporated in and constituting a part of the specification illustrate preferred embodiments of the invention and, together with the description, serve to explain the objects, advantages and principles of the invention. In the drawings:
- FIG. 1 is a side elevational cross section of a socket made according to a first embodiment of the invention shown with the cover thereof in the closed position;
- FIG. 2 is a side elevational cross section of the FIG. 1 socket shown with the cover in the opened position and shown with an exploded view of the components of the socket;
- FIG. 3(a) is an enlarged, broken away portion of FIG. 1;
- FIG. 3(b) is a further enlarged portion of FIG. 3(a);
- FIG. 4 is another enlarged fragmentary portion of FIG. 1;
- FIGS.5(a) and 5(b) are further enlarged portions of FIG. 4;
- FIG. 6(a) is a top plan view of an interface contact film used in the FIGS. 1, 2 embodiment,
- FIG. 6(b) is a cross section taken on line A-A of FIG. 6(a) showing contact members;
- FIG. 6(c) is a top plan view showing one of the contact members of FIG. 6(b);
- FIGS.7(a) and 7(b) show side elevational cross sections of another embodiment of the invention shown with a cover in the raised and the lowered positions, respectively;
- FIG. 8 is a side elevational cross section of a prior art socket; and
- FIG. 9 is a top plan view of an interface contact film used in the FIG. 8 prior art socket.
- As shown in FIGS. 1 and 2, a socket1 made in accordance with a first preferred embodiment of the invention is adapted for mounting an electronic package having a BGA terminal array (hereafter called package or electronic package) 2 with globular solder balls (terminals) 2 a being formed in a selected pattern. The socket has a base (main socket body) 10 and a
cover 20 pivotably mounted thereon and being movable between opened and closed positions relative tobase 10.Base 10 is formed in the shape of a box by using suitable resinous material such as a polyether imide, and has awall 10 b that surrounds a generally squared shapedbottom 10 a.Location pins 10 c for mounting the socket on anexternal substrate 50 are provided extending from the lower surface ofbottom 10 a. - A
recessed portion 10 d of a prescribed size is formed inbase 10 for receiving a pitch expansion substrate (inter-terminal expansion substrate) 11, asupport member 12, and anadapter 13 in this order. These components are assembled, maintaining them parallel withbottom 10 b of the base. A recessed contactfilm receiving surface 12 a is formed at the top of the support member for placing thereon a sheet ofinterface contact film 14, to be described below.Surface 12 a is formed to be lower than the top surface ofsupport member 12 by a depth somewhat greater than the thickness of theinterface contact film 14. - As shown in FIG. 6(a),
interface contact film 14, formed of a generallysquare sheet 14 a of suitable material, such as polyimide, has a plurality of contacts (contact members) 14 b arranged in accordance with the selected pattern ofsolder balls 2 a ofpackage 2 at the central part of thefilm 14 a. Eachcontact member 14 b comprises a disc-shaped flat plate portion (contact part) 14 b 1 and a ball engagement part (terminal engagement part) 14b 2 that is cylindrically formed having a diameter somewhat less than the diameter of the solder balls so as to be engageable with a part of the surface of thesolder ball 2 a as shown in FIG. 6(b).Contact member 14 b preferably is provided with a plated layer of nickel, gold or the like. Eachcontact member 14 b is placed at a selected location oncontact film 14 a, withplate part 14 b 1 on lower surface ofcontact film 14 a, while theball engagement part 14b 2 extends through an aperture in the contact film to a location above the top surface thereof. - As shown in FIGS.1, 3(a) and 6(b), a plurality of
spring contact elements 15, capable of contacting theplate part 14 b 1 of eachcontact 14 b of the contact film are provided at the central portion of contactfilm receiving surface 12 a ofsupport member 12.Spring contact elements 15 are compression coil springs made of wiring material whose electrical conductivity is high, such as beryllium copper. With reference to FIG. 3(b), the contact spring elements comprisefirst spring portion 15 a of a selected outer diameter and asecond spring portion 15 b having an outer diameter which is larger than the selected diameter, forming a step-like shape. The free end of thefirst spring portion 15 a is preferably ground to form a flat surface. Eachspring contact element 15 is formed so that its length is such that it extends beyond contactfilm receiving surface 12 a a distance somewhat greater than the height of the recess in the top surface ofsupport member 12 and, at the same time, the diameter offirst spring part 15 a is selected to be smaller than the diameter ofplate part 14 b 1 ofcontact film 14 a. - A plurality of spring receiving bores12 b, capable of receiving a respective
spring contact element 15, are formed throughsupport member 12.Bores 12 b have a longitudinal axis normal to the top surface ofsupport member 12 and are stepped having afirst diameter portion 12 b 1 larger than the outer diameter of thefirst spring portion 15 a and asecond diameter portion 12b 2 somewhat smaller than the outer diameter of thesecond spring portion 15 b. A respectivespring contact element 15 is inserted indiameter portion 12b 2 withsecond portion 15 b fixed therein with the lower end ofsecond portion 15 b protruding somewhat from the lower surface ofsupport member 12 and with the top of thefirst portion 15 a extending above the contactfilm receiving surface 12 a ofsupport member 12 by a selected amount. - As shown in FIGS. 1 and 4,
pitch expansion member 11, disposed inbase 10, is arranged betweensupport member 12 and bottom 10 a of the base. With reference to FIG. 4, a recess 12 c is formed in the bottom surface ofsupport member 12 aligned withconnective pins 11 b, to be described. Further, a space 12 d is preferably formed between the central portions ofsupport member 12 andpitch expansion member 11. With reference to FIGS. 4 and 5(b), a plurality ofpads 11 a, engageable with the lower part of eachspring contact element 15, are formed on the central portion of the upper surface ofpitch expansion member 11. A plurality ofconnective pins 11 b extend through bores along the edge part ofpitch expansion substrate 11 and are capable of being connected with respective circuit paths ofexternal substrate 50.Wiring pattern 11 c is formed on the upper surface ofpitch expansion substrate 11 for electrically connecting eachpad 11 a and the correspondingconnective pin 11 b. As a result,pitch expansion substrate 11 increases the spacing among the plurality ofconnective pins 11 b relative to the spacing among the plurality ofsolder balls 2 a. - As shown in FIGS. 1 and 3(a),
adapter 13 is arranged oversupport member 12 with the lower surface ofadapter 13 engaging the upper, outer peripheral surface around the edge of the support member, that is, excluding contactfilm receiving surface 12 a. An electronicpackage seating portion 13 a, capable of accommodatingpackage 2, is centrally provided onadapter 13 and is formed somewhat larger than the outer shape ofpackage 2. An inclined surface guide 13 c is provided on the outer periphery of seatingportion 13 a for guidingpackage 2 toseat 13 b at the bottom ofseating portion 13 a.Opening 13 d, somewhat larger than the area occupied bysolder balls 2 a, is provided atseat 13 b at the bottom ofseating portion 13 a. - As noted above, each
spring contact 15 insupport member 12 extends into opening 13 d ofadapter 13. As shown in FIGS. 1 and 2, cover 20 is pivotably supported onwall 10 b on one side ofbase 10 by means of ashaft 21 and is movable between an opened position away frombase 10 and a closed position on the base. Acoil spring 22 is arranged onshaft 21 with opposite ends received inbase 10 and cover 20 to apply a bias to the cover in an opening direction. Alever 23 is pivotably mounted at a location intermediate its ends at an opposite side ofcover 20. Oneend 23 a of the lever is biased away from the cover by a firstcompressive coil spring 24, so that anengagement part 23 b formed at the other end can be engaged with acatch 10 e onbase 10. - A
compression member 30 is pivotably mounted onshaft 21 and arranged within the cover.Compression member 30 is biased in a direction away fromcover member 20 by a secondcompression coil spring 31 disposed betweencover 20 andcompression member 30. Movement ofcompression member 30 away fromcover 20 is limited by anengagement part 30 a formed at a side ofcompression member 30 opposite to the pivotable mounting side and is engageable with anengagement part 20 a provided oncover 20. Because of this,compression member 30 pivots along withcover 20 whenengagement parts cover 20 whenengagement parts - A first boss-shaped
engagement portion 30 b is formed at a selected location ofcompression member 30 facingbase 10 and is configured for receipt in the recess ofseating portion 13 a of the adapter. A generallyflat surface 30 c, approximately the same size as the outer shape of apackage 2, is formed on the bottom offirst engagement portion 30 b for engagement with a package received onseat 13 b. Second protrudingengagement portions 30 d are formed on the bottom ofcompression member 30 spaced apart fromboss 30 b, preferably on opposite sides of the boss relative to a direction extending away from the pivoted connection ofcompression member 30. Whencover 20 is in the closed position,second engagement portions 30 d engageadapter 13 and withsurface 30 c offirst engagement portion 30 b placed in parallel with bottom 10 a ofbase 10 orsupport member 12. - The socket is prepared for use by mounting the socket on
external substrate 50 using location pins 10 c as shown in FIGS. 1 and 2.Cover 20 is placed in the opened position; thepitch expansion substrate 11 is inserted intorecess 10 d ofbase 10 andconnective pins 11 b are connected toexternal substrate 50. Next, aspring contact element 15 is inserted into each spring receiving bore 12 b ofsupport member 12 and the support member is arranged on thepitch expansion substrate 11. As noted above, the lower face of the support member is spaced from thewiring pattern 11 c onpitch expansion substrate 11 and only the lower part of thespring contact elements 15contact pads 11 a of the pitch expansion substrate. The sheet ofcontact film 14 is placed on the contactfilm receiving surface 12 a ofsupport member 12 and theplate portion 14 b 1 of eachcontact member 14 b is caused to engage the top of a respectivespring contact element 15.Contact film 14 is supported at a position where the force that is received from eachspring contact element 15 is balanced against the component of weight of the contact film and is placed in a state where it is positioned above receivingsurface 12 a. Thus, thecontact film 14 tends to equalize the position of the tops of thespring contact elements 15 and forms a surface for receiving thereonsolder balls 2 a ofpackage 2. - When
adapter 13 is placed onsupport member 12, the recess in which surface 12 a is formed is essentially closed by the lower surface of the adapter withcontact film 14 being accommodated in the recess, while eachball engagement part 14b 2 ofcontact film 14 is exposed to opening 13 d ofadapter 13. When apackage 2 is dropped intoseating portion 13 a ofadapter 13 and guided byguide portion 13 c, the lower part of eachsolder ball 2 a ofpackage 2 is inserted into a respectiveball engagement portion 14b 2 ofcontact film 14.Package 2 is placed in a state of equilibrium at a location which is somewhat lowered from the holding position of the contact film alone due to the weight of thepackage 2 itself but is maintained spaced aboveseat 13 b ofseating portion 13 a as eachsolder ball 2 a is biased upwardly by a respectivespring contact element 15. - As shown in FIG. 1, when
cover 20 is moved to the closed position,compression member 30 moves along withcover 20 in engagement with the latter. As the cover closes,first engagement portion 30 b of the compression member enters through the recess of theseating portion 13 a of the adapter andsurface 30 c offirst engagement portion 30 b engagespackage 2 with an orientation which is somewhat tilted compared with the upper surface ofpackage 2, and starts compressing the package from this position. Thus,package 2 will be inclined somewhat in conformity with the inclination ofsurface 30 c. As thespring contact elements 15 absorb the tilting ofpackage 2 by expanding or contracting, eachsolder ball 2 a maintains a state of engagement with theball engagement portion 14b 2 ofcontact film 14. Thereafter,second engagement portion 30 d engages the upper surface ofadapter 13 and stops, whilecover 20 moves on without being affected by the arrested motion ofcompression member 30. As the opening and closinglever 23 is being engaged withcatch 10 e ofbase 10, the cover stops onbase 10 withcompression member 30 pressed againstadapter 13 by secondcompression coil spring 31. At this stage,package 2 will be oriented in parallel withsupport member 12 with the package pressed down further from the original state of equilibrium. - As a result of what has been described above, each
solder ball 2 a ofpackage 2 is independently compressed as it receives the compressive force of a respectivespring contact element 15 throughball engagement portion 14b 2 ofcontact film 14 despite any deviation from parallelism between the upper surface ofpackage 2 and an imaginary plane formed by the bottom ofsolder balls 2 a or the variations in the distance between the upper surface ofpackage 2 and thesolder balls 2 a in the perpendicular direction. -
Film 14 a ofcontact film 14 is free to flex in conformity with upward or downward movement of the tip of eachspring contact element 15 in the space between the receivingsurface 12 a ofsupport member 12 andadapter 13. Thus,contact members 14 b ofcontact film 14 are not subject to any unnecessary tension fromfilm 14 a, with a result that the distance fromother contact members 14 b can be maintained approximately constant. Accordingly, a respective contact member does not move from the position of engagement with asolder ball 2 a atball engagement portion 14b 2 or the position of the contact member with the top of thespring contact element 15 at theplate portion 14 b 1. - According to an aspect of the embodiment as described above, the solder balls of
package 2 are received byspring contact elements 15 made of metal. Therefore, even if heated in a burn-in test, thecontact elements 15 themselves will not be plastically deformed, thereby stabilizing the force with which thesolder balls 2 a ofpackage 2 are received. Moreover,solder balls 2 a ofpackage 2 are received byspring contact elements 15 independently throughball engagement portions 14b 2 of the contact film, thereby making it possible to absorb any variations in the position of the solder balls relative topackage 2 byspring contact elements 15. Therefore, it becomes possible to more reliably provide a suitable pressure between the solder balls ofpackage 2 and theball engagement portions 14b 2 ofcontact film 14, thereby bringing about a stabilized state of connection. - In the present embodiment,
solder balls 2 a ofpackage 2 do not directly engagespring contact elements 15 sincecontact member 14 b of the contact film has been interposed between the two. As a result, a contact interface is provided where eachsolder ball 2 a ofpackage 2 can be arranged at the top of a respectivespring contact element 15 and a stable connection ofsolder balls 2 a ofpackage 2 to the top of arespective contact element 15 is provided irrespective of the variations in the height of the spring of thespring contact element 15. - In the present embodiment, moreover,
contact members 14 b ofcontact film 14 are held between eachsolder ball 2 a and a respectivespring contact element 15 without contacting other parts. Accordingly, it becomes possible to cause thecontact members 14 b to be engaged withsolder balls 2 a by receiving only the compressive force fromspring contact elements 15, without receiving any restraining force fromfilm 14 a, thereby making it possible to maintain them without shifting the position of engagement betweenball engagement portions 14 b 2 andsolder balls 2 or the contact position betweenplate portions 14 b 1 and the top ofcontact elements 15. - According to this embodiment, further,
pads 11 a are adapted to be connected to respectivespring contact elements 15, facilitating the use ofpitch expansion substrate 11 onbase 10, thereby making it unnecessary to form a wiring pattern on the contact film in the manner of the prior art. Therefore, it becomes only necessary to arrangecontact members 14 b in accordance with the pattern ofsolder balls 2 a even when there are a large number of solder balls ofpackage 2. Moreover, the flexibility offilm 14 a itself does not have to be compromised. Because of this, it becomes possible to usecontact film 14 with apackage 2 that has a large number ofsolder balls 2 a. Further, since a wiring pattern oncontact film 14 is unnecessary, the size ofcontact film 14 itself can be reduced and the expense required for the wiring pattern can be eliminated. - According to this embodiment, the shape of
contact member 14 b ofcontact film 14 has been so adapted that the shape of theball engagement part 14b 2 is made cylindrical in conformity withsolder ball 2 a ofpackage 2 and, at the same time,plate portion 14 b 1 is made flat in conformity with the top of thespring contact 15. Accordingly, it becomes possible to insert the bottom portion of asolder ball 2 a into theball engagement portion 14b 2 withspring contact 15 being received approximately evenly at theplate portion 14 b 1, thereby enhancing the state of connection between eachsolder ball 2 a and the respectivespring contact element 15. - According to this embodiment, moreover, a part of the
spring contact element 15 is fixed to supportmember 12 merely by inserting the spring element into a bore in the member. Therefore, it becomes easier to install thespring contact elements 15. - It should be noted that this invention does not have to be limited to the above described embodiment but that it can be modified in various ways. For example, FIGS.7(a) and 7(b) show a socket 1′ having a different force application mechanism. As shown in the figures,
cover 201 is vertically movable relative to base 10′ andcompression member 300 is linked to cover 201 by means of alink member 202 for applying a force topackage 2 in dependence upon the vertical movement ofcover 201.Base 10′pitch expansion substrate 11′ andsupport member 12′ serve the same functions as corresponding components in the first described embodiment and are merely modified to conform to the different force application mechanism. - In the above described embodiments, the
ball engagement portions 14b 2 ofcontact film 14 are cylindrical in shape in conformity withsolder balls 2 a ofpackage 2. However, when used with LGA (Land Grid Array) packages where no solder balls are provided, it is also possible to form the ball engagement part conically with the apex of the conical portion engaging respective pads of the LGA. - Further, although compression coil springs are used as the
spring contact element 15 in the above described embodiments, a part or the whole of the spring contact elements could be replaced with some other kind of spring such as a plate spring, or similar conductive elastic members. - In the above described embodiments, a
pitch expansion substrate 11 is described. However, the pitch expansion substrate may be unnecessary when the socket is used with a package in which the number ofsolder balls 2 a is not so great and the distances among the terminals of theexternal substrate 50 can be made to conform with the distances among the solder balls. - It is the intention that the appended claims be interpreted as broadly as possible in view of the prior art to include all such socket variations and modifications in which the terminals of the electronic parts are elastically received and the connection with the contact member of the contact film is stabilized as well as a socket useful with electronic parts having a large number of terminals.
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000336996A JP2002141151A (en) | 2000-11-06 | 2000-11-06 | Socket |
JP2000-336996 | 2000-11-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20020055284A1 true US20020055284A1 (en) | 2002-05-09 |
US6439897B1 US6439897B1 (en) | 2002-08-27 |
Family
ID=18812448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/999,134 Expired - Lifetime US6439897B1 (en) | 2000-11-06 | 2001-11-01 | Socket apparatus for removably mounting electronic packages with improved contacting system |
Country Status (4)
Country | Link |
---|---|
US (1) | US6439897B1 (en) |
JP (1) | JP2002141151A (en) |
KR (1) | KR100816620B1 (en) |
TW (1) | TW524978B (en) |
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-
2000
- 2000-11-06 JP JP2000336996A patent/JP2002141151A/en active Pending
-
2001
- 2001-11-01 US US09/999,134 patent/US6439897B1/en not_active Expired - Lifetime
- 2001-11-05 TW TW090127374A patent/TW524978B/en not_active IP Right Cessation
- 2001-11-06 KR KR1020010068791A patent/KR100816620B1/en not_active IP Right Cessation
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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DE10323224B4 (en) * | 2002-05-27 | 2012-11-22 | Yamaichi Electronics Co., Ltd. | Method for restoring contact surfaces of an electrode |
US20050250363A1 (en) * | 2002-07-09 | 2005-11-10 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
CN100362707C (en) * | 2002-07-09 | 2008-01-16 | 山一电机株式会社 | Socket for semiconductor device |
TWI798310B (en) * | 2017-12-27 | 2023-04-11 | 日商恩普樂股份有限公司 | The opening and closing mechanism of the opening and closing body |
US11022645B2 (en) * | 2019-11-05 | 2021-06-01 | Prowell | Semiconductor element test device |
Also Published As
Publication number | Publication date |
---|---|
KR20020035465A (en) | 2002-05-11 |
TW524978B (en) | 2003-03-21 |
US6439897B1 (en) | 2002-08-27 |
JP2002141151A (en) | 2002-05-17 |
KR100816620B1 (en) | 2008-03-24 |
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