US20020013240A1 - Composition and method for removing resist and etching residues using hydroxylammonium carboxylates - Google Patents

Composition and method for removing resist and etching residues using hydroxylammonium carboxylates Download PDF

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US20020013240A1
US20020013240A1 US09/034,552 US3455298A US2002013240A1 US 20020013240 A1 US20020013240 A1 US 20020013240A1 US 3455298 A US3455298 A US 3455298A US 2002013240 A1 US2002013240 A1 US 2002013240A1
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US6432209B2 (en
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Javad J. Sahbari
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Silicon Valley Chemlabs
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Assigned to SILICON VALLEY CHEMLABS, INC. reassignment SILICON VALLEY CHEMLABS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SAHBARI, JAVAD J.
Priority to US09/034,552 priority Critical patent/US6432209B2/en
Priority to CN99800385.9A priority patent/CN1277682A/en
Priority to JP54423799A priority patent/JP2002505765A/en
Priority to AU29318/99A priority patent/AU2931899A/en
Priority to KR19997010103A priority patent/KR20010012158A/en
Priority to PCT/EP1999/001360 priority patent/WO1999045443A1/en
Priority to EP99910318A priority patent/EP0981779A1/en
Publication of US20020013240A1 publication Critical patent/US20020013240A1/en
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • G03F7/422—Stripping or agents therefor using liquids only
    • G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/32—Liquid compositions therefor, e.g. developers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • G03F7/422—Stripping or agents therefor using liquids only
    • G03F7/423—Stripping or agents therefor using liquids only containing mineral acids or salts thereof, containing mineral oxidizing substances, e.g. peroxy compounds
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • G03F7/422—Stripping or agents therefor using liquids only
    • G03F7/426—Stripping or agents therefor using liquids only containing organic halogen compounds; containing organic sulfonic acids or salts thereof; containing sulfoxides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041—Cleaning
    • H01L21/02057—Cleaning during device manufacture
    • H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
    • H01L21/02071—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a delineation, e.g. RIE, of conductive layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31127—Etching organic layers
    • H01L21/31133—Etching organic layers by chemical means
    • H01L21/31138—Etching organic layers by chemical means by dry-etching
    • C—CHEMISTRY; METALLURGY
    • C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10—Objects to be cleaned
    • C11D2111/14—Hard surfaces
    • C11D2111/22—Electronic devices, e.g. PCBs or semiconductors

Definitions

  • This invention is directed to a composition and method for removal of photoresist and photoresist residues from a substrate, such as a silicon wafer.
  • a substrate such as a silicon wafer.
  • Mixtures including hydroxylamine and a weak organic acid are used to strip hard to remove photoresist materials, such as photoresist residue which has been subjected to plasma etching and post-plasma ashing.
  • the composition and method achieve improved strip rates while significantly reducing metal corrosion.
  • Photoresist materials are commonly used as coating masks in the fabrication of integrated circuits. During the fabrication process, photoresist materials are applied to a substrate using various techniques known in the art. The substrate, now coated with photoresist materials, is then exposed to radiation, usually in the UV, e-beam or x-ray wave lengths. After exposure, the coated substrate is developed, leaving a defined pattern of photoresist materials on the substrate. The photoresist materials that remain on the substrate after developing are used to mask the substrate for further processing. After further processing, the photoresist materials are stripped from the substrate using a photoresist stripper. Further processing of the photoresist materials after developing, such as high temperature post-exposure bake, ion implantation and deep UV radiation hardening lead to highly cross-linked photoresist polymer materials which are extremely resistant to dissolution.
  • Schwartzkopf U.S. Pat. No. 5,308,745
  • stripping solvents such as n-methylpyrrolidinone, an alkaline amine such as an aminoalkanol, and a weak acid.
  • these compositions are not effective for polymer removal.
  • Another object of this invention is to provide a method for photoresist and polymer removal which can avoid oxygen ashing.
  • a further object of this invention is to provide such improved non-metal corroding stripper compositions without any undue adverse effect on strip rate of the photoresist for cross-linked or hardened photoresist.
  • Another object of this invention is to provide a photoresist stripper and post-plasma polymer remover that is stable, having extended bath life without any adverse effect of ambient temperature variations on stability and effectiveness of the stripping composition.
  • Another object of this invention is to provide a universally accepted photoresist stripper and post plasma polymer remover that does not contain any toxic additives such as catechol, works effectively on all post plasma etch processes independent of the dry etch equipment or the type of plasma gas used in processing, and is not corrosive to sensitive metal layers.
  • the preferred embodiment of the present invention utilizes a mixture of hydroxylamine partially neutralized with a weak carboxylic acid and a biodegradable organic solvent such as an alkyl sulfoxide, a pyrrolidinone or a sulfone to remove hardened photoresist and photoresist residues from a substrate with reduced metal corrosion.
  • a biodegradable organic solvent such as an alkyl sulfoxide, a pyrrolidinone or a sulfone to remove hardened photoresist and photoresist residues from a substrate with reduced metal corrosion.
  • This invention provides a composition and a method for stripping photoresist and photoresist residues from a substrate, even if the photoresist has been baked and exposed to short wavelength hardening radiation.
  • the composition exhibits short stripping times, long effective bath life, reduced corrosion of metals, is effective to strip both photoresist and polymer residues (thereby avoiding oxygen ashing, which is required for other compositions), and is thermally stable for long shelf life.
  • These stripping composition is comprised of:
  • the remainder is an organic solvent system with components such as dimethylsulfoxide (DMSO), n-hydroxyethyl-pyrrolidinone (HEP), n-methylpyrrolidinone (NMP), other pyrrolidinones, tetramethylene sulfone (sulfolane), or other alkyl sulfoxide or sulfone compounds.
  • DMSO dimethylsulfoxide
  • HEP n-hydroxyethyl-pyrrolidinone
  • NMP n-methylpyrrolidinone
  • other pyrrolidinones tetramethylene sulfone (sulfolane), or other alkyl sulfoxide or sulfone compounds.
  • composition contains 20-30% by weight of hydroxylamine/water solution, sufficient carboxylic acid component to reduce the pH to below 8, and the remainder of the solvent component.
  • Table 1 shows compositions which were used for tests 1 to 24 described in Table 2. The last column of Table 1 shows summary performances of the compositions for polymer cleaning and metal corrosion (on a scale of 1-5, where 1 is best and 5 is worst).
  • TABLE 1 NH 2 OH/H 2 O Polymer clean/ (50—50) Acid Solvent H 2 O PH/Overnight Stabilizer corrosion 1. 30% 0% 35% Sulfolane — 9.77/9.90 1.5% TBC —/5 35% HEP 2. 29% 1% 35% Sulfolane — 7.72/8.04 1.5% TBC —/4.8 Formic 35% HEP 3. 28% 2% 35% Sulfolane — 7.40/7.73 1.5% TBC —/4.5 Formic 35% HEP 4.
  • NH 2 OH/H 2 O refers to a 50% NH 2 OH/50% H 2 O solution (available as FH-50 from Howard Hall Division, R. W. Greef & Co.)
  • DNH 2 OH refers to dehydrated hydroxylamine (less than 5% water)
  • DGA diglycolamine
  • IPA is isopropanolamine
  • MEA is monoethanolamine
  • DMSO is dimethylsulfoxide
  • HEP is n-hydroxyethyl-pyrrolidone
  • NMP n-methylpyrrolidone
  • TBC tertiary butyl catechol (a corrosion inhibitor)
  • the pH is measured at 19:1 volume dilution at the time of preparation and after being left overnight.
  • the percentages are by weight, with the NH 2 OH/H 2 O, acid, solvent and water totaling 100%, and the corrosion inhibitor in addition to this.
  • Table 2 describes tests on wafers from UMC (Taiwan) Fab III, covered with TOK IP 2550 photoresist and dry etched with Lam Research (TCP 9600) and Applied Materials (P5000) plasma metal etchers. “PR” refers to tests in which the photoresist has not been etched, but is removed with the test solution. The tests described are for metal films with TiN (500 ⁇ ) on Al/Cu (8000 ⁇ ) on Ti/TiN (1200 ⁇ ).
  • the test solution was heated to the process temperature (70° C.).
  • the test wafer was immersed in the test solution for the specified time, transferred into an isopropanol bath at room temperature for 2 minutes, rinsed with deionized water, and blow dried with nitrogen gas.
  • the wafer inspection was under microscope (400 ⁇ ) or field emission scanning electron microscope (FESEM) (JEOL 6320F).
  • FESEM field emission scanning electron microscope
  • Tests 1, 2 and 3 show that the gradual addition of formic acid to a hydroxylamine, sulfolane, HEP solution reduces the lift off of metal lines.
  • Tests 4 through 7 show that sidewall polymers can be 100% cleaned by solutions 4 through 7. The more acidic of these solutions, 6 and 7, show some etching on an aluminum/copper layer. Solutions 8, 9, and 10, known in the prior art, show some metal etching and inadequate sidewall polymer removal. Tests 4 to 7 also show that as the solution becomes more acidic, it will attack an Al—Cu layer. The preferred formulation is the solution which is closest to neutral (pH 7).
  • Tests 11 and 12 illustrate that reduction of the amount of water or hydroxylamine, respectively, in the composition results in inadequate cleaning of sidewall polymer.
  • Tests 13 through 16 show that the solution of the present invention is less corrosive than solutions using hydroxylamine and monoethanolamine, isopropanolamine or diglycolamine.
  • Tests 17 and 18 show that a solution using n-methylpyrrolidinone (NMP) instead of HEP is an effective cleaner for sidewall polymer.
  • NMP n-methylpyrrolidinone
  • Test 18 shows that acetic acid is an effective substitute for formic acid.
  • Tests 19 and 20 show that the solutions of tests 17 and 18 do not lift off metal lines after 120 minutes at 70° C.
  • Tests 21 to 24 show that photoresist stripping time for the compositions of the present invention are comparable to those for a photoresist stripper using hydroxylamine, monoethanolamine, and water.
  • Tests 25-27 show that addition of formic acid to a hydroxylamine/DMSO solution or a hydroxylamine/DMSO/HEP solution reduces the lift off of metal lines, and effectively removed sidewall polymer.
  • a copper corrosion test was conducted by placing pieces of copper foil in solutions 5 and 8 for 24 hours at room temperature. After 24 hours, the copper concentration for solution 5 was 360 ppm and the copper concentration for solution 8 was 2,500 ppm measured by an HP-4500 ICP/MS spectrometer. This result is particularly significant for circuit designs which use primarily copper as a metal. Recent trends in technology are leading to use of 100% copper as the metal layer for semiconductor designs (instead of aluminum/copper).

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

A mixture of hydroxylamine partially neutralized with a weak carboxylic acid and an organic solvent such as an alkyl sulfoxide, a pyrrolidinone or a sulfone removes hardened photoresist and polymeric photoresist residues from a substrate with reduced metal corrosion.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0001]
  • This invention is directed to a composition and method for removal of photoresist and photoresist residues from a substrate, such as a silicon wafer. Mixtures including hydroxylamine and a weak organic acid are used to strip hard to remove photoresist materials, such as photoresist residue which has been subjected to plasma etching and post-plasma ashing. The composition and method achieve improved strip rates while significantly reducing metal corrosion. [0002]
  • 2. Brief Description of the Prior Art [0003]
  • Photoresist materials are commonly used as coating masks in the fabrication of integrated circuits. During the fabrication process, photoresist materials are applied to a substrate using various techniques known in the art. The substrate, now coated with photoresist materials, is then exposed to radiation, usually in the UV, e-beam or x-ray wave lengths. After exposure, the coated substrate is developed, leaving a defined pattern of photoresist materials on the substrate. The photoresist materials that remain on the substrate after developing are used to mask the substrate for further processing. After further processing, the photoresist materials are stripped from the substrate using a photoresist stripper. Further processing of the photoresist materials after developing, such as high temperature post-exposure bake, ion implantation and deep UV radiation hardening lead to highly cross-linked photoresist polymer materials which are extremely resistant to dissolution. [0004]
  • The need for plasma etching or reactive ion etching of the metal, oxide, and polysilicon layers has increased. As a result of plasma etching the masking photoresist leaves a substantially hardened organometallic sidewall polymer due to a complex reaction of metallic substrate with resist polymer and halogenated plasma gas molecules. Therefore, the need for post plasma polymer removers and photoresist strippers which work effectively without damaging desired features of the microcircuit has increased. [0005]
  • As semiconductor manufacturing has moved into sub-micron geometries, the need for photoresist and polymer removers which work effectively without damaging desired features of the circuit has increased. Since about 1990, mixtures of hydroxylamine with alkanolamines have been introduced to facilitate the removal of hardened photoresist polymer residues and for stripping. See U.S. Pat. Nos. 5,279,771; 5,334,332, 5,381,807; 5,419,779; and 5,482,566. The alkaline strippers mentioned above may be effective in removing hardened photoresist from substrates, however, in removing post-plasma etch cross-linked organometallic polymer residues from sub-micron geometries they cause undesirable side effects. The use of these alkaline strippers and polymer removers on microcircuit substrates containing metal films, particularly aluminum or various combinations or alloys of active metals such as aluminum or titanium with more electropositive metal such as copper or tungsten, has proven problematic, even without plasma treatment, because of metal corrosion. This problem has been addressed by employing intermediate rinses with non-alkaline organic solvents such as isopropyl alcohol, other alcohols, or glycols, but such rinses add to the expense and complexity of the manufacturing process. Moreover, hydroxylamine/alkanolamine mixtures in an aqueous media undergo thermal decomposition, generating an unstable product. [0006]
  • Schwartzkopf, U.S. Pat. No. 5,308,745, has addressed metal corrosion with photoresist stripper compositions containing stripping solvents such as n-methylpyrrolidinone, an alkaline amine such as an aminoalkanol, and a weak acid. However, these compositions are not effective for polymer removal. [0007]
  • At present, there is a trend toward use of 100% copper in metal layers. Since copper is more subject to corrosion than the metals previously used, the need has increased for a non-corrosive polymer and photoresist remover. [0008]
    • SUMMARY OF THE INVENTION
  • It is an object of the present invention to provide a photoresist stripper which is environmentally friendly, stable, and does not require intermediate rinses to avoid metal corrosion and which still effectively strips plasma treated or hardened photoresist and polymeric residues. [0009]
  • Another object of this invention is to provide a method for photoresist and polymer removal which can avoid oxygen ashing. [0010]
  • A further object of this invention is to provide such improved non-metal corroding stripper compositions without any undue adverse effect on strip rate of the photoresist for cross-linked or hardened photoresist. [0011]
  • Another object of this invention is to provide a photoresist stripper and post-plasma polymer remover that is stable, having extended bath life without any adverse effect of ambient temperature variations on stability and effectiveness of the stripping composition. [0012]
  • Another object of this invention is to provide a universally accepted photoresist stripper and post plasma polymer remover that does not contain any toxic additives such as catechol, works effectively on all post plasma etch processes independent of the dry etch equipment or the type of plasma gas used in processing, and is not corrosive to sensitive metal layers. [0013]
  • Briefly, the preferred embodiment of the present invention utilizes a mixture of hydroxylamine partially neutralized with a weak carboxylic acid and a biodegradable organic solvent such as an alkyl sulfoxide, a pyrrolidinone or a sulfone to remove hardened photoresist and photoresist residues from a substrate with reduced metal corrosion.[0014]
    • DESCRIPTION OF THE PREFERRED EMBODIMENT
  • This invention provides a composition and a method for stripping photoresist and photoresist residues from a substrate, even if the photoresist has been baked and exposed to short wavelength hardening radiation. The composition exhibits short stripping times, long effective bath life, reduced corrosion of metals, is effective to strip both photoresist and polymer residues (thereby avoiding oxygen ashing, which is required for other compositions), and is thermally stable for long shelf life. These stripping composition is comprised of: [0015]
  • (a) from 5% to 50% by weight of a 50% hydroxylamine/50% water solution; [0016]
  • (b) from 0.1% to 25% weight of a monoprotic or diprotic carboxylic acid with four or fewer carbon atoms, such as formic, acetic, propionic acid and the like; and [0017]
  • (c) the remainder is an organic solvent system with components such as dimethylsulfoxide (DMSO), n-hydroxyethyl-pyrrolidinone (HEP), n-methylpyrrolidinone (NMP), other pyrrolidinones, tetramethylene sulfone (sulfolane), or other alkyl sulfoxide or sulfone compounds. [0018]
  • It is more preferred that the composition contains 20-30% by weight of hydroxylamine/water solution, sufficient carboxylic acid component to reduce the pH to below 8, and the remainder of the solvent component. [0019]
  • Table 1 shows compositions which were used for tests 1 to 24 described in Table 2. The last column of Table 1 shows summary performances of the compositions for polymer cleaning and metal corrosion (on a scale of 1-5, where 1 is best and 5 is worst). [0020]
    TABLE 1
    NH2OH/H2O Polymer clean/
    (50—50) Acid Solvent H2O PH/Overnight Stabilizer corrosion
     1. 30% 0%   35% Sulfolane —  9.77/9.90 1.5% TBC —/5 
      35% HEP
     2. 29% 1%   35% Sulfolane —  7.72/8.04 1.5% TBC  —/4.8
    Formic   35% HEP
     3. 28% 2%   35% Sulfolane —  7.40/7.73 1.5% TBC  —/4.5
    Formic   35% HEP
     4. 25% 5%   35% Sulfolane —  6.87/7.24 1.5% TBC 1/1
    Formic   35% HEP
     5. 22.5%   7.5%     35% Sulfolane —  6.57/6.87 1.5% TBC 1/2
    Formic   35% HEP
     6. 20% 10%    35% Sulfolane —  6.20/6.54 1.5% TBC 1/2
    Formic   35% HEP
     7. 16.66%   13.34%      35% Sulfolane —  4.72/5.36 1.5% TBC   1/2.5
    Formic   35% HEP
     8. 25% — 62.5% DGA 12.5% 11.92/11.96   5% Catechol 3/3
     9. 25% — 62.5% IPA 12.5% 11.94/11.97   5% Catechol 3/3
    10. 25% — 62.5% MEA 12.5% 11.96/11.98   5% Catechol 3/3
    11. 15% — 42.5% —  9.65/10.04 — 5/4
    DNH2OH Sulfolane
    42.5% HEP
    12. — 10%   45% Sulfolane —  2.56/2.76 —  4/—
    Formic   45% HEP
    13. 22.5%   7.5%     35% Sulfolane —  6.64/6.74 1.5% TBC 1/2
    Formic   35% NMP
    14. 20% 10%    35% Sulfolane —  6.72/−6.84 1.5% TBC 1/2
    Acetic   35% NMP
    15. 30% 0%   70% DMSO —  9.82/9.94 — 2/2
    16. 30% 5%   65% DMSO —  6.58 — 1/1
    Formic
    17. 30% 0%   35% DMSO —  8.52   1% TBC 1/2
      35% HEP
    18. 25% 5%   35% DMSO —  6.25   1% TBC 1/1
    Formic   35% HEP
  • In Table 1, NH[0021] 2OH/H2O refers to a 50% NH2OH/50% H2O solution (available as FH-50 from Howard Hall Division, R. W. Greef & Co.), DNH2OH refers to dehydrated hydroxylamine (less than 5% water), DGA is diglycolamine, IPA is isopropanolamine, MEA is monoethanolamine, DMSO is dimethylsulfoxide, HEP is n-hydroxyethyl-pyrrolidone, NMP is n-methylpyrrolidone, TBC is tertiary butyl catechol (a corrosion inhibitor), and the pH is measured at 19:1 volume dilution at the time of preparation and after being left overnight. The percentages are by weight, with the NH2OH/H2O, acid, solvent and water totaling 100%, and the corrosion inhibitor in addition to this.
  • Table 2 describes tests on wafers from UMC (Taiwan) Fab III, covered with TOK IP 2550 photoresist and dry etched with Lam Research (TCP 9600) and Applied Materials (P5000) plasma metal etchers. “PR” refers to tests in which the photoresist has not been etched, but is removed with the test solution. The tests described are for metal films with TiN (500 Å) on Al/Cu (8000 Å) on Ti/TiN (1200 Å). [0022]
  • The test solution was heated to the process temperature (70° C.). The test wafer was immersed in the test solution for the specified time, transferred into an isopropanol bath at room temperature for 2 minutes, rinsed with deionized water, and blow dried with nitrogen gas. The wafer inspection was under microscope (400×) or field emission scanning electron microscope (FESEM) (JEOL 6320F). [0023]
    TABLE 2
    Wafer
    Type
    Test (Metal Sol'n Temp Time
    No. Etcher) No. (° C.) (min) Result
    1 TCP 9600 1 70 20 After 14 min metal line began to
    lift off. After 20 min 90% metal
    line lifted off
    2 TCP 9600 2 70 20 After 16 min metal line began to
    lift off. After 20 min 60% metal
    line lifted off
    3 TCP 9600 3 70 20 After 18 min metal line began to
    lift off. After 20 min 20% metal
    line lifted off
    4 TCP 9600 4 70 30 No visible change. From SEM,
    no sidewall polymer was found
    and no attack on metal line.
    5 TCP 9600 5 70 30 No visible change. From SEM,
    no sidewall polymer was found
    but slight etching on Al/Cu
    layer
    6 TCP 9600 6 70 30 No visible change. From SEM,
    no sidewall polymer but slight
    etching on Al/Cu layer
    7 TCP 9600 7 70 30 No visible change. From SEM,
    no sidewall polymer but etching
    on Al/Cu layer
    8 TCP 9600 8 70 30 No visible change. From SEM,
    80% sidewall polymer was clean
    and little etching on Ti/TiN
    bottom layer
    9 TCP 9600 9 70 30 No visible change. From SEM,
    80% sidewall polymer was clean
    and little etching on Ti/TiN
    bottom layer
    10 TCP 9600 10 70 30 No visible change. From SEM,
    90% sidewall polymer was clean
    and some corrosion on Al/Cu
    layer, some etching on Ti/TiN
    bottom layer
    11 TCP 9600 11 70 30 No visible change. From SEM,
    <10% sidewall polymer was
    clean and no attack
    12 TCP 9600 12 70 30 No visible change. From SEM,
    40% sidewall polymer was clean
    and no attack
    13 P 5000 6 70 120 No visible change under
    microscope (400X). No metal
    lift off
    14 P 5000 8 70 120 After 60 min metal line
    started to lift off, and metal
    line was 100% lifted off
    after 2 hr
    15 P 5000 9 70 120 After 60 min metal line started
    to lift off, and metal line was
    100% lifted off after 2 hr
    16 P 5000 10 70 120 After 60 min metal line started
    to lift off, and metal line was
    100% lifted off after 2 hr
    17 P 5000 13 70 30 No visible change. From SEM,
    100% sidewall polymer was
    clean and no etching on Ti/TiN
    bottom layer
    18 P 5000 14 70 30 No visible change. From SEM,
    100% sidewall polymer was
    clean and no etching on Ti/TiN
    bottom layer
    19 P 5000 13 70 120 No visible change under
    microscope (400x). No metal
    lift off
    20 P 5000 14 70 120 No visible change under
    microscope (400x). No metal
    lift off
    21 w/PR 5 70 30 Photoresist was peeled-off in
    2 min
    22 w/PR 10 70 30 Photoresist was peeled-off in
    5 min
    23 w/PR 12 70 30 Photoresist was peeled-off in
    8 min
    24 w/PR 13 70 30 Photoresist was peeled-off in
    5 min
    25 P 5000 16 70 120 From SEM, 100% sidewall
    polymer was cleaned and no
    metal corrosion
    26 P 5000 17 70 120 From SEM, 100% sidewall
    polymer was cleaned, slight
    corrosion on Ti layer, no
    metal lift off
    27 P 5000 18 70 120 From SEM, 100% sidewall
    polymer was cleaned, slight
    corrosion Ti layer, no metal
    lift off
  • The test data summarized in Table 2 demonstrate the effective stripping capacity of the composition while avoiding metal corrosion: [0024]
  • 1. Tests 1, 2 and 3 show that the gradual addition of formic acid to a hydroxylamine, sulfolane, HEP solution reduces the lift off of metal lines. [0025]
  • 2. Tests 4 through 7 show that sidewall polymers can be 100% cleaned by solutions 4 through 7. The more acidic of these solutions, 6 and 7, show some etching on an aluminum/copper layer. Solutions 8, 9, and 10, known in the prior art, show some metal etching and inadequate sidewall polymer removal. Tests 4 to 7 also show that as the solution becomes more acidic, it will attack an Al—Cu layer. The preferred formulation is the solution which is closest to neutral (pH 7). [0026]
  • 3. Tests 11 and 12 illustrate that reduction of the amount of water or hydroxylamine, respectively, in the composition results in inadequate cleaning of sidewall polymer. [0027]
  • 4. Tests 13 through 16 show that the solution of the present invention is less corrosive than solutions using hydroxylamine and monoethanolamine, isopropanolamine or diglycolamine. [0028]
  • 5. Tests 17 and 18 show that a solution using n-methylpyrrolidinone (NMP) instead of HEP is an effective cleaner for sidewall polymer. [0029]
  • 6. Test 18 shows that acetic acid is an effective substitute for formic acid. [0030]
  • 7. Tests 19 and 20 show that the solutions of tests 17 and 18 do not lift off metal lines after 120 minutes at 70° C. [0031]
  • 8. Tests 21 to 24 show that photoresist stripping time for the compositions of the present invention are comparable to those for a photoresist stripper using hydroxylamine, monoethanolamine, and water. [0032]
  • 9. Tests 25-27 show that addition of formic acid to a hydroxylamine/DMSO solution or a hydroxylamine/DMSO/HEP solution reduces the lift off of metal lines, and effectively removed sidewall polymer. [0033]
  • 10. A copper corrosion test was conducted by placing pieces of copper foil in solutions 5 and 8 for 24 hours at room temperature. After 24 hours, the copper concentration for solution 5 was 360 ppm and the copper concentration for solution 8 was 2,500 ppm measured by an HP-4500 ICP/MS spectrometer. This result is particularly significant for circuit designs which use primarily copper as a metal. Recent trends in technology are leading to use of 100% copper as the metal layer for semiconductor designs (instead of aluminum/copper). [0034]
  • Although a preferred embodiment of the present invention has been described above, it will be appreciated that certain alterations and modifications thereof will be apparent to those skilled in the art. It is therefore intended that the appended claims be interpreted as covering all such alterations and modifications as fall within the true spirit and scope of the invention.[0035]

Claims (18)

What is claimed is:
1. A composition for removal of photoresist and photoresist residues from a substrate, comprising:
(a) from 2.5% to 40% by weight hydroxylamine;
(b) from 2.5% to 40% by weight water;
(c) from 0.1% to 25% by weight of a monoprotic or diprotic carboxylic acid with four or fewer carbon atoms; and
(d) from 10l to 90% by weight of an organic solvent selected from the group consisting of alkyl sulfoxides, alkyl sulfones, and pyrrolidinones.
2. The composition of claim 1, wherein the organic solvent is selected from the group consisting of dimethyl sulfoxide, tetramethylene sulfone, n-hydroxyethylpyrrolidinone, and n-methylpyrrolidinone.
3. The composition of claim 1, wherein the hydroxylamine is present in an amount of 10% to 20% by weight, the water is present in an amount of 10% to 20% by weight, and the organic solvent is present in an amount of 40% to 80% by weight.
4. The composition of claim 3, wherein the acid is present in an amount sufficient to reduce the pH below 8, when the pH is measured in water at 19:1 volume dilution.
5. The composition of claim 4, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution.
6. The composition of claim 2, wherein the hydroxylamine is present in an amount of 10% to 20% by weight, the water is present in an amount of 10% to 20% by weight, and the organic solvent is present in an amount of 40% to 80% by weight.
7. The composition of claim 6, wherein the acid is present in an amount sufficient to reduce the pH below 8, when the pH is measured in water at 19:1 volume dilution.
8. The composition of claim 8, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution.
9. A composition for removal of photoresist and photoresist residues from a substrate, consisting essentially of:
(a) from 10% to 20% by weight hydroxylamine;
(b) from 10% to 20% by weight water;
(c) from 0.1% to 25% by weight of a monoprotic or diprotic carboxylic acid with four or fewer carbon atoms, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution; and
(d) from 40% to 80% by weight of an organic solvent selected from the group consisting of dimethyl sulfoxide, tetramethylene sulfone, n-hydroxyethylpyrrolidinone, and n-methylpyrrolidinone.
10. A method for removing photoresist and photoresist residues from a substrate, comprising contacting said substrate with a stripping solution for a time sufficient to remove the photoresist or residues from said substrate, wherein the stripping solution comprises:
(a) from 2.5% to 40% by weight hydroxylamine;
(b) from 2.5% to 40% by weight water;
(c) from 0.1% to 25% by weight of a monoprotic or diprotic carboxylic acid with four or fewer carbon atoms; and
(d) from 10% to 90% by weight of an organic solvent selected from the group consisting of alkyl sulfoxides, alkyl sulfones, and pyrrolidinones.
11. The method of claim 10, wherein the organic solvent is selected from the group consisting of dimethyl sulfoxide, tetramethylene sulfone, n-hydroxyethylpyrrolidinone, and n-methylpyrrolidinone.
12. The method of claim 10, wherein the hydroxylamine is present in an amount of 10% to 20% by weight, the water is present in an amount of 10% to 20% by weight, and the organic solvent is present in an amount of 40% to 80% by weight.
13. The method of claim 12, wherein the acid is present in an amount sufficient to reduce the pH below 8, when the pH is measured in water at 19:1 volume dilution.
14. The method of claim 13, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution.
15. The method of claim 11, wherein the hydroxylamine is present in an amount of 10% to 20% by weight, the water is present in an amount of 10% to 20% by weight, and the organic solvent is present in an amount of 40% to 80% by weight.
16. The method of claim 15, wherein the acid is present in an amount sufficient to reduce the pH below 8, when the pH is measured in water at 19:1 volume dilution.
17. The method of claim 16, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution.
18. A method for removing photoresist and photoresist residues from a substrate, comprising contacting said substrate with a stripping solution for a time sufficient to remove the photoresist or residues from said substrate, wherein the stripping solution consists essentially of:
(a) from 10% to 20% by weight hydroxylamine;
(b) from 10% to 20% by weight water;
(c) from 0.1% to 25% by weight of a monoprotic or diprotic carboxylic acid with four or fewer carbon atoms, wherein the acid is present in an amount sufficient to yield a pH between 6 and 7.5, when the pH is measured in water at 19:1 dilution; and
(d) from 40% to 80% by weight of an organic solvent selected from the group consisting of dimethyl sulfoxide, tetramethylene sulfone, n-hydroxyethylpyrrolidinone, and n-methylpyrrolidinone.
US09/034,552 1998-03-03 1998-03-03 Composition and method for removing resist and etching residues using hydroxylazmmonium carboxylates Expired - Fee Related US6432209B2 (en)

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KR19997010103A KR20010012158A (en) 1998-03-03 1999-03-03 Composition and method for removing resist and etching residues using hydroxylammonium carboxylates
JP54423799A JP2002505765A (en) 1998-03-03 1999-03-03 Composition and method for removing resist and etching residue using hydroxylammonium carboxylate
AU29318/99A AU2931899A (en) 1998-03-03 1999-03-03 Composition and method for removing resist and etching residues using hydroxylammonium carboxylates
CN99800385.9A CN1277682A (en) 1998-03-03 1999-03-03 Composition and method for removing resist and etching residues using hydroxylammonium carboxylates
PCT/EP1999/001360 WO1999045443A1 (en) 1998-03-03 1999-03-03 Composition and method for removing resist and etching residues using hydroxylammonium carboxylates
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040149309A1 (en) * 2001-07-09 2004-08-05 Hsu Chien-Pin Sherman Microelectronic cleaning compositions containing ammonia-free fluoride salts
US20040175964A1 (en) * 2003-03-05 2004-09-09 Chun-Li Chou Aqueous cleaning composition containing copper-specific corrosion inhibitor
US20040220065A1 (en) * 2001-07-09 2004-11-04 Hsu Chien-Pin Sherman Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
US20080053956A1 (en) * 2006-08-29 2008-03-06 Rohm And Haas Electronic Materials Llc Stripping method

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6878213B1 (en) * 1998-12-07 2005-04-12 Scp Global Technologies, Inc. Process and system for rinsing of semiconductor substrates
US6703319B1 (en) 1999-06-17 2004-03-09 Micron Technology, Inc. Compositions and methods for removing etch residue
US6319835B1 (en) * 2000-02-25 2001-11-20 Shipley Company, L.L.C. Stripping method
KR100360985B1 (en) * 2000-04-26 2002-11-18 주식회사 동진쎄미켐 Resist stripper composition
KR100363271B1 (en) * 2000-06-12 2002-12-05 주식회사 동진쎄미켐 Photoresist remover composition
JP3797541B2 (en) * 2001-08-31 2006-07-19 東京応化工業株式会社 Photoresist stripping solution
KR100745892B1 (en) * 2001-12-14 2007-08-02 주식회사 하이닉스반도체 Cleaning solution for photoresist
CN1240816C (en) 2001-12-12 2006-02-08 海力士半导体有限公司 Liquid detergent for removing photoresist
KR100745891B1 (en) * 2001-12-14 2007-08-02 주식회사 하이닉스반도체 Cleaning solution for photoresist
US6773873B2 (en) * 2002-03-25 2004-08-10 Advanced Technology Materials, Inc. pH buffered compositions useful for cleaning residue from semiconductor substrates
KR100862988B1 (en) * 2002-09-30 2008-10-13 주식회사 동진쎄미켐 Photoresist remover composition
KR101164959B1 (en) * 2005-04-06 2012-07-12 주식회사 동진쎄미켐 Remover composition for photoresist of semiconductor device
US7413848B2 (en) * 2005-07-27 2008-08-19 United Microelectronics Corp. Method of removing photoresist and photoresist rework method
US7879782B2 (en) * 2005-10-13 2011-02-01 Air Products And Chemicals, Inc. Aqueous cleaning composition and method for using same
US7976827B2 (en) * 2006-04-04 2011-07-12 Kirker Enterprises, Inc. Nail enamel compositions having a decorative color effect
KR20090023398A (en) * 2006-06-21 2009-03-04 이데미쓰 고산 가부시키가이샤 Stripping composition, tft substrate manufacturing method, and stripping composition recycling method
KR101570256B1 (en) 2008-02-29 2015-11-18 아반토르 퍼포먼스 머티리얼스, 인크. Microelectronic substrate cleaning compositions
WO2010091045A2 (en) * 2009-02-05 2010-08-12 Advanced Technology Materials, Inc. Non-fluoride containing composition for the removal of polymers and other organic material from a surface
CN102051283B (en) * 2009-10-30 2014-11-05 安集微电子（上海）有限公司 Hydroxylamine-containing cleaning solution and use thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4824763A (en) * 1987-07-30 1989-04-25 Ekc Technology, Inc. Triamine positive photoresist stripping composition and prebaking process
US6110881A (en) * 1990-11-05 2000-08-29 Ekc Technology, Inc. Cleaning solutions including nucleophilic amine compound having reduction and oxidation potentials
US5279771A (en) 1990-11-05 1994-01-18 Ekc Technology, Inc. Stripping compositions comprising hydroxylamine and alkanolamine
US5308745A (en) 1992-11-06 1994-05-03 J. T. Baker Inc. Alkaline-containing photoresist stripping compositions producing reduced metal corrosion with cross-linked or hardened resist resins
US5419779A (en) 1993-12-02 1995-05-30 Ashland Inc. Stripping with aqueous composition containing hydroxylamine and an alkanolamine
JP2911792B2 (en) * 1995-09-29 1999-06-23 東京応化工業株式会社 Stripper composition for resist
JP3236220B2 (en) * 1995-11-13 2001-12-10 東京応化工業株式会社 Stripper composition for resist
US5648324A (en) * 1996-01-23 1997-07-15 Ocg Microelectronic Materials, Inc. Photoresist stripping composition
US5665688A (en) * 1996-01-23 1997-09-09 Olin Microelectronics Chemicals, Inc. Photoresist stripping composition
US5780406A (en) * 1996-09-06 1998-07-14 Honda; Kenji Non-corrosive cleaning composition for removing plasma etching residues
US5968848A (en) * 1996-12-27 1999-10-19 Tokyo Ohka Kogyo Co., Ltd. Process for treating a lithographic substrate and a rinse solution for the treatment

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040149309A1 (en) * 2001-07-09 2004-08-05 Hsu Chien-Pin Sherman Microelectronic cleaning compositions containing ammonia-free fluoride salts
US20040220065A1 (en) * 2001-07-09 2004-11-04 Hsu Chien-Pin Sherman Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
US7247208B2 (en) * 2001-07-09 2007-07-24 Mallinckrodt Baker, Inc. Microelectronic cleaning compositions containing ammonia-free fluoride salts
US20070232513A1 (en) * 2001-07-09 2007-10-04 Mallinckrodt Baker, Inc Microelectronic Cleaning Compositions Containing Ammonia-Free Fluoride Salts for Selective Photoresist Stripping and Plasma Ash Residue Cleaning
US7718591B2 (en) 2001-07-09 2010-05-18 Mallinckrodt Baker, Inc. Microelectronic cleaning compositions containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning
US20040175964A1 (en) * 2003-03-05 2004-09-09 Chun-Li Chou Aqueous cleaning composition containing copper-specific corrosion inhibitor
US6864193B2 (en) 2003-03-05 2005-03-08 Taiwan Semiconductor Manufacturing Co., Ltd. Aqueous cleaning composition containing copper-specific corrosion inhibitor
US20080053956A1 (en) * 2006-08-29 2008-03-06 Rohm And Haas Electronic Materials Llc Stripping method
US8012883B2 (en) * 2006-08-29 2011-09-06 Rohm And Haas Electronic Materials Llc Stripping method

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