US20020002108A1 - Dielectric ceramic composition, ceramic capacitor using the composition and method of producing thereof - Google Patents
Dielectric ceramic composition, ceramic capacitor using the composition and method of producing thereof Download PDFInfo
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- US20020002108A1 US20020002108A1 US09/822,869 US82286901A US2002002108A1 US 20020002108 A1 US20020002108 A1 US 20020002108A1 US 82286901 A US82286901 A US 82286901A US 2002002108 A1 US2002002108 A1 US 2002002108A1
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- 239000000919 ceramic Substances 0.000 title claims abstract description 61
- 238000000034 method Methods 0.000 title claims abstract description 16
- 239000003985 ceramic capacitor Substances 0.000 title claims description 42
- 239000011521 glass Substances 0.000 claims abstract description 42
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 claims abstract description 42
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(iii) oxide Chemical compound O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims abstract description 34
- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 claims abstract description 19
- YEXPOXQUZXUXJW-UHFFFAOYSA-N lead(II) oxide Inorganic materials [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 claims abstract description 19
- 239000010953 base metal Substances 0.000 claims abstract description 13
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Inorganic materials O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 claims abstract description 12
- YEAUATLBSVJFOY-UHFFFAOYSA-N tetraantimony hexaoxide Chemical compound O1[Sb](O2)O[Sb]3O[Sb]1O[Sb]2O3 YEAUATLBSVJFOY-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000003575 carbonaceous material Substances 0.000 claims abstract description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 38
- 229910001404 rare earth metal oxide Inorganic materials 0.000 claims description 22
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 19
- 229910052681 coesite Inorganic materials 0.000 claims description 19
- 229910052593 corundum Inorganic materials 0.000 claims description 19
- 229910052906 cristobalite Inorganic materials 0.000 claims description 19
- 239000000377 silicon dioxide Substances 0.000 claims description 19
- 229910052682 stishovite Inorganic materials 0.000 claims description 19
- 229910052905 tridymite Inorganic materials 0.000 claims description 19
- 229910001845 yogo sapphire Inorganic materials 0.000 claims description 19
- 239000000843 powder Substances 0.000 claims description 14
- 238000010304 firing Methods 0.000 claims description 7
- 229910008556 Li2O—Al2O3—SiO2 Inorganic materials 0.000 claims description 6
- 229910007676 ZnO—SiO2 Inorganic materials 0.000 claims description 6
- 238000010030 laminating Methods 0.000 claims description 6
- GHPGOEFPKIHBNM-UHFFFAOYSA-N antimony(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Sb+3].[Sb+3] GHPGOEFPKIHBNM-UHFFFAOYSA-N 0.000 claims description 5
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum oxide Inorganic materials [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 claims description 5
- KTUFCUMIWABKDW-UHFFFAOYSA-N oxo(oxolanthaniooxy)lanthanum Chemical compound O=[La]O[La]=O KTUFCUMIWABKDW-UHFFFAOYSA-N 0.000 claims description 5
- 229910002637 Pr6O11 Inorganic materials 0.000 claims description 3
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 claims description 3
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 claims description 3
- NLQFUUYNQFMIJW-UHFFFAOYSA-N dysprosium(III) oxide Inorganic materials O=[Dy]O[Dy]=O NLQFUUYNQFMIJW-UHFFFAOYSA-N 0.000 claims description 3
- VQCBHWLJZDBHOS-UHFFFAOYSA-N erbium(III) oxide Inorganic materials O=[Er]O[Er]=O VQCBHWLJZDBHOS-UHFFFAOYSA-N 0.000 claims description 3
- JYTUFVYWTIKZGR-UHFFFAOYSA-N holmium oxide Inorganic materials [O][Ho]O[Ho][O] JYTUFVYWTIKZGR-UHFFFAOYSA-N 0.000 claims description 3
- PLDDOISOJJCEMH-UHFFFAOYSA-N neodymium oxide Inorganic materials [O-2].[O-2].[O-2].[Nd+3].[Nd+3] PLDDOISOJJCEMH-UHFFFAOYSA-N 0.000 claims description 3
- FKTOIHSPIPYAPE-UHFFFAOYSA-N samarium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Sm+3].[Sm+3] FKTOIHSPIPYAPE-UHFFFAOYSA-N 0.000 claims description 3
- ZIKATJAYWZUJPY-UHFFFAOYSA-N thulium (III) oxide Inorganic materials [O-2].[O-2].[O-2].[Tm+3].[Tm+3] ZIKATJAYWZUJPY-UHFFFAOYSA-N 0.000 claims description 3
- FIXNOXLJNSSSLJ-UHFFFAOYSA-N ytterbium(III) oxide Inorganic materials O=[Yb]O[Yb]=O FIXNOXLJNSSSLJ-UHFFFAOYSA-N 0.000 claims description 3
- 238000005245 sintering Methods 0.000 abstract description 19
- 239000003990 capacitor Substances 0.000 abstract description 11
- 239000007772 electrode material Substances 0.000 abstract description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 12
- 239000000654 additive Substances 0.000 description 10
- 230000000996 additive effect Effects 0.000 description 10
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- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 8
- 229910052802 copper Inorganic materials 0.000 description 7
- 229910052721 tungsten Inorganic materials 0.000 description 6
- 229910052799 carbon Inorganic materials 0.000 description 5
- 229910002804 graphite Inorganic materials 0.000 description 5
- 239000010439 graphite Substances 0.000 description 5
- 229910052759 nickel Inorganic materials 0.000 description 5
- 239000004372 Polyvinyl alcohol Substances 0.000 description 4
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- 239000003795 chemical substances by application Substances 0.000 description 4
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- 239000003960 organic solvent Substances 0.000 description 4
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- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- 230000002542 deteriorative effect Effects 0.000 description 3
- 230000001747 exhibiting effect Effects 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
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- 239000001856 Ethyl cellulose Substances 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
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- 229910052751 metal Inorganic materials 0.000 description 2
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910002971 CaTiO3 Inorganic materials 0.000 description 1
- 229910017676 MgTiO3 Inorganic materials 0.000 description 1
- 229910002370 SrTiO3 Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
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- 229910052709 silver Inorganic materials 0.000 description 1
- 238000010345 tape casting Methods 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/48—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates
- C04B35/49—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates containing also titanium oxides or titanates
- C04B35/491—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates containing also titanium oxides or titanates based on lead zirconates and lead titanates, e.g. PZT
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/48—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates
- C04B35/49—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates containing also titanium oxides or titanates
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/46—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates
- C04B35/462—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates
- C04B35/465—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates
- C04B35/47—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates based on strontium titanates
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/48—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zirconium or hafnium oxides, zirconates, zircon or hafnates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B3/00—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties
- H01B3/02—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of inorganic substances
- H01B3/12—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of inorganic substances ceramics
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
Definitions
- the present invention relates to a dielectric ceramic composition, more particular to a dielectric ceramic composition, a ceramic capacitor using the composition and the producing method, thereof having a lower dielectric loss and stable characteristics in high frequency bandwidth, and enabling to use a base metal (eg. Cu, W etc.) or a carbon-based material as an electrode material by allowing sintering at a low temperature, and thereby reducing the production cost.
- a base metal eg. Cu, W etc.
- a carbon-based material as an electrode material by allowing sintering at a low temperature, and thereby reducing the production cost.
- a dielectric property of a ceramic provides a ceramic capacitor having larger capacitance and being more miniature in size.
- the ceramic capacitor may be made of a material selected from TiO 2 having a rutile structure, BaTiO 3 , MgTiO 3 , CaTiO 3 and SrTiO 3 , having a perovskite structure and the mixture thereof.
- This ceramic capacitor may be classified into a platelike type and a laminate type.
- the platelike type capacitor is produced by forming said material powder into some shaped body, such as pellet (disc), rod (cylinder) or chip (angular), under pressure, sintering the shaped body at 1200° C.-1400° C. to a sintered body, and forming electrode at each surface of the sintered body.
- the laminated type ceramic capacitor is produced by mixing said material powder with organic binder and organic solvent to prepare a slurry, forming green sheets from the slurry through a doctor bladding, printing the pattern of electrode comprising of a noble metal, such as Pt and Pd, on each of the green sheets, subsequently laminating said green sheets in the thickness direction under pressure to form a laminate, and sintering the laminate at 1200° C.-1400° C.
- a noble metal such as Pt and Pd
- the sintering process must be performed at a high temperature ranging 1200° C.-1400° C., to obtain the sintered body exhibiting a good electric characteristics and having a high density.
- the laminated ceramic capacitor particularly, in the case of using a base metal as an electrode material, there has been a problem to oxidize the base metal during the sintering process, which occurs a high resistance layer formation between the ceramic layers.
- the noble metal material being stable at high temperature, must be employed as an electrode material, thereby resulting in high cost.
- a base metal such as Cu and W
- a carbon-based material as an electrode material
- the present invention provides the dielectric ceramic composition
- FIG. 1 illustrates cross-sectional structural views of a platelike ceramic capacitor in accordance with example 1.
- FIG. 2 illustrates cross-sectional structural views of a laminated ceramic capacitor in accordance with example 2.
- the dielectric ceramic composition is characterized ill comprising a main component of formula Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1; 0.9 ⁇ y ⁇ 1), to which MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 , and a glass component of 0.5-15 wt % are added based on the weight of the main component.
- the dielectric ceramic composition is produced by adding MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass component 0.5-15 wt % based on the weight of the component to a main component of formula Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1; 0.9 ⁇ y ⁇ 1).
- the resulting composition can exhibit a high dielectric constant, a good temperature property and a high quality value (Q).
- the dielectric ceramic composition is suitable for using at high frequency bandwidth.
- the mole fraction of Sr is preferably 0.8 (80 mol %) or more, when the composition containing Sr of less than 0.8 is fired at 925° C.-1080° C. The sintering property of the resultant is deteriorated.
- the mole fraction of Ti is preferably 0.1 (10 mol %) or less. When the mole fraction of Ti is more than 0.1, the temperature property as well as the quality factor (Q) are deteriorated.
- MnO 2 is added to the main component as a sintering aid agent for enabling to sinter at a low temperature.
- the amount of the agent is preferably 0.05-15 wt %.
- the amount of MiO 2 is less than 0.05 wt %, it does little function as an additive, resulting in a lower density of the sintered body.
- the amount of MnO 2 is more than 15 wt %, the quality value is deteriorated.
- a metal oxide having a low melting point is added to the main component for improving the temperature property.
- the metal may be at least one selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 .
- the additive amount is preferably 0.001-5 wt %. When the additive is less than 0.001 wt %, the temperature property cannot be improved. When the additive is more than 5 wt %, the quality value is deteriorated.
- the glass component is added thereto as a sintering aid agent for enabling to sinter at a low temperature.
- the additive amount is preferably 0.5-15 wt %.
- the temperature property cannot be improved.
- the glass component is more than 15 wt %, the quality value is deteriorated.
- the glass component employed in the present invention preferably has a good wettability to the main component Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1, 0.9 ⁇ y ⁇ 1) and is softened and/or melted at 925-1080° C.
- such glass component may be ZnO—SiO 2 based glass or Li 2 O—Al 2 O 3 —SiO 2 based glass.
- SiO 2 of 0.01-5 wt % and Al 2 O 3 of 0.01-5 wt % based on the weight of the main component are further added to the dielectric ceramic composition to provide another dielectric ceramic composition.
- SiO 2 is used as an additive for improving the temperature property.
- the amount of SiO 2 is preferably about 0.01-5 wt %. When the amount of SiO 2 is less than 0.01 wt %, the temperature property cannot be improved. When the amount of SiO 2 is more than 5 wt %, the quality value is deteriorated.
- Al 2 O 3 is used as an additive for improving the quality value.
- the amount of Al 2 O 3 is preferably about 0.01-5 wt %. When the amount of Al 2 O 3 is less than 0.01 wt %, the quality value cannot be improved. When the amount of Al 2 O 3 is more, than 5 wt %, the temperature property is deteriorated.
- a rare earth oxide of 0.001-2 wt % is further added to the dielectric ceramic composition to provide another dielectric ceramic composition based on the weight of the main component.
- the rare earth oxide is used as an additive for improving the temperature property.
- the amount of the rare earth oxide is about 0.001-2 wt %.
- the amount of the rare earth oxide is less than 0.001 wt %, the temperature property cannot be improved.
- the amount of the rare earth oxide is more than 2 wt %, the quality value is deteriorated.
- the rare earth oxide employed in the present invention has preferably a good wettability to the main composition Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1; 0.9 ⁇ y ⁇ 1) and has a grain boundary layer, which is used to improve the sintering property.
- such rare earth oxide may include at least one selected from the group consisting of La 2 O 3 , CeO 2 , Pr 6 O 11 , Nd 2 O 3 , Sm 2 O 3 , Dy 2 O 3 , Ho 2 O 3 , Er 2 O 3 , Tm 2 O 3 and Yb 2 O 3 .
- the present invention provides a ceramic capacitor with the opposed surfaces comprising one of the dielectric ceramic compositions as described above, each of which an electrode is formed on.
- the electrode of the ceramic capacitor may be base metal or carbon-based material, since the capacitor can be produced through sintering at the low temperature.
- the present invention provides a ceramic capacitor made by laminating alternatively electrodes and sheets comprising one of the dielectric ceramic compositions as describe above.
- the ceramic capacitor according to the present invention exhibits a lower dielectric loss and stable characteristics, by using one of the dielectric ceramic compositions as describe above. Therefore, the ceramic capacitor is expected to have more improved reliability. Moreover, it is advantageous that the dielectric ceramic composition can be sintered at a low temperature of 925-1080° C. Therefore, an inexpensive metal, such as a base metal and a carbon-based material, can be used as an internal electrode, thereby reducing the production cost.
- the base metal having a good conductibility and a high reliability is preferably employed as the electrode, which may be at least one selected from the group consisting of Cu, Ni, W and Mo, and the carbon-based material employed as the electrode may be carbon (amorphous), graphite or the mixture.
- a ceramic capacitor fabricating method comprises the steps of forming powder comprising a main component of formula Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1; 0.9 ⁇ y ⁇ 1), to which MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 , and a glass component of 0.5-15 wt % are added based on the weight of the main component, into a bulk or a sheet; and sintering the bulk or a sheet at about 925-1080° C.
- a sintering aid agent of MnO 2 and glass composition can improve a wettability of a grain boundary layer to bind powder particles and reduce the void fraction during the sintering process even at low temperature of about 925-1080° C.
- the sintered body having a high strength and high density can be obtained at the low temperature.
- the method may comprise the additional step of providing an electrode on a main surface of the sheet; laminating the sheet in the thickness direction under pressure to form a laminate; and sintering the laminate at about 925-1080° C.
- a base metal such as Cu and Ni, or a carbon-based material, such as amorphous carbon and graphite, is used as an internal electrode, which is less expensive than noble metal, such as Pt and Pd, resulting in the lower cost without deteriorating the characteristics.
- FIG. 1 cross-sectional structural view of a platelike ceramic capacitor in accordance with a first example is shown in FIG. 1.
- the capacitor comprises a bulk shape dielectric body 1 , terminal electrodes 2 formed on the opposed surfaces of the dielectric body 1 , lead lines 3 connecting to the terminal electrode, and an epoxy resin 4 encapsulating the dielectric body 1 and the terminal electrode 2 .
- the dielectric body 1 is made of a dielectric ceramic composition comprising a main component of formula Sr x Mg 1-x (Zr y Ti 1-y )O 3 (where 0.8 ⁇ x ⁇ 1; 0.9 ⁇ y ⁇ 1), to which MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass frit (glass component) of 0.5-15 wt % are added based on the weight of the main component.
- the dielectric body 1 may include one of to the dielectric ceramic composition further containing SiO 2 of 0.01-5 wt % and Al 2 O 3 of 0.01-5 wt %, the dielectric ceramic composition further containing a rare earth oxide of 0.001-2 wt %, and the dielectric ceramic composition further containing SiO 2 of 0.01-5 wt %, Al 2 O 3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt %.
- the terminal electrode 2 comprises a conductive material having a high reliability, such as Ag and Ag alloy.
- Ag alloy may include 90Ag-10Pd.
- the material of the terminal electrode 2 may also include at least one selected from the group consisting of Cu, Ni, W and Mo, or carbon, graphite or the mixture.
- This ceramic capacitor exhibits a stable dielectric constant ( ⁇ ), quality factor (Q) and temperature property (Tc) even in high frequency bandwidth.
- Each of Powdered SMZT, MnO 2 , at least one selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 , glass frit, SiO 2 , Al 2 O 3 and rare earth oxide were weighed as the predetermined amount.
- each of powdered Sr 0.95 Mg 0.05 (Zr 0.95 Ti 0.05 )O 3 , MnO 2 , PbO, glass component (ZnO—SiO 2 based glass or Li 2 O—Al 2 O 3 —SiO 2 based glass), SiO 2 , Al 2 O 3 and La 2 O 3 was weighed to prepare a dielectric ceramic composition as shown in Table 1.
- the prepared components were wet-milled with water or organic solvent such as ethanol and acetone) in ball mill for predetermined time, such as 24 hours.
- the resultant mixture was dehydrated (or removal of the solvent, such as ethanol and acetone) and dried.
- Specimen comprising different composition from thereof the present invention was prepared as comparison (indicated by ⁇ in the Table 1).
- dried mixture was preliminary fired at 550-750° C., for 05-5.0 hours, followed by pulverizing for 1-24 hour with a mortar machine (or automatic pestle) to obtain the fired powder having the desired granularity.
- an appropriate amount of an organic binder was added to the fired powder.
- the resultant was mixed and granularized uniformly using a mortar machine and a like to obtain granular powder having the desired granularity.
- Polyvinyl alcohol (PVA) was employed as a organic binder.
- Other organic binder may include ethylcellulose aqueous solution and acryl resin solution (acryl binder)
- the pellet having a diameter of 20 mm and a thickness of 0.5 mm is formed from the granular powder using a forming machine, followed by firing at 925-1080° C., for 0.5-10 hours under atmosphere, to obtain a disk-shaped dielectric body 1 .
- composition of the present invention was fired at the other temperature to prepare another specimen as comparison (indicated by ⁇ in the Table 1).
- Table 2 shows electric characteristics of each specimen, and the comparison is indicated by “ ⁇ ”.
- TABLE 2 Temperature Specimen Dielectric Quality Resistance property (Tc) number constant ( ⁇ ) value (Q) ( ⁇ ⁇ cm) (ppm/° C.) 1 ⁇ 13 230 1.6 ⁇ 10 11 96 2 19 950 1.3 ⁇ 10 12 93 3 23 2300 1.9 ⁇ 10 12 60 4 ⁇ 22 380 1.5 ⁇ 10 12 180 5 28 2680 1.7 ⁇ 10 12 58 6 27 3630 1.5 ⁇ 10 12 63 7 24 190 1.6 ⁇ 10 12 56 8 33 180 1.5 ⁇ 10 12 26 9 31 6000 2.0 ⁇ 10 12 35 10 29 2670 1.8 ⁇ 10 12 38 11 27 2980 1.6 ⁇ 10 12 32 12 ⁇ 12 310 1.5 ⁇ 10 12 15 13 ⁇ 28 60 1.8 ⁇ 10 12 27 14 26 790 1.9 ⁇ 10 12 43 15 25 2340 2.0 ⁇ 10 12 36 16 ⁇ 18 370 1.9 ⁇ 10 12 32 17 ⁇ 16 270 2.1 ⁇ 10 12 27 18 23 25
- the dielectric constant ( ⁇ ) was measured at 25° C. under the condition of frequency of 1 MHz and an input voltage of 1V rms .
- the Q value was measured under the condition of frequency of 1 MHz and an input voltage of 1V rms .
- the temperature property (Tc) was calculated from the following equation
- Tc (ppm/° C.) ( C 2 ⁇ C 1 ⁇ 10 6 )/( C 1 ⁇ (125 ⁇ 25))
- the C 1 is the capacitance at 125° C. and the C 2 is the capacitance at 25° C.
- the dielectric composition exhibiting high dielectric constant, high Q value and good temperature property can be obtained by adding MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass frit 0.5-15 wt % to a main component of SMZT based on the weight of the main component and optionally further adding SiO 2 of 0.01-5 wt % and Al 2 O 3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % thereto.
- the dielectric composition is capable of a dielectric capacitor having stable characteristics and improved reliability.
- the ceramic capacitor having high density and strength can be provided at the low temperature by forming a bulk or a sheet from powder comprising a main component of SMZT to which MnO 2 of 0.05-15 wt %, at least one 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass component of 0.5-15 wt % are added based on the weight of the component, and which optionally SiO 2 of 0.01-5 wt % and Al 2 O 3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % are added thereto and firing the sheet or other resultant at 925-1080° C.
- FIG. 2 illustrates cross-sectional structural view of a laminated ceramic capacitor in accordance with second example.
- the capacitor comprises a sheet-shaped dielectric layers 11 , thin internal electrodes 12 and terminal electrodes 13 , 14 .
- This laminated ceramic capacitor is comprised of eight dielectric layers 11 and seven thin internal electrodes 12 , which are alternatively laminated.
- the dielectric layer 11 is made of sheet-shaped ceramic composition comprising a main component of SMZT to which MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass frit (glass component) of 0.5-15 wt % are added based on the weight of the main component.
- the dielectric layer 11 may include one of the dielectric ceramic composition further containing SiO 2 of 0.01-5 wt % and Al 2 O 3 of 0.01-5 wt %, the dielectric ceramic composition further containing rare earth oxide of 0.001-2 wt %, and the dielectric ceramic composition further containing SiO 2 of 0.01-5 wt %, Al 2 O 3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % is added.
- the internal electrode 12 and the terminal electrodes 13 , 14 include a conductive material having high reliability, for example, Cu, Ni, W and Mo, or carbon, graphite or the mixture.
- This laminated ceramic capacitor exhibits a stable dielectric constant ( ⁇ ), quality factor (Q) and temperature property (Tc) even in RF region.
- Each of powdered SMZT, MnO 2 , at least one selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 , glass frit, SiO 2 , Al 2 O 3 and rare earth oxide were weighed as the predetermined amount.
- Each composition was wet-milled with water (or organic solvent such as ethanol and acetone) in ball mill for predetermined time, such as 24 hours.
- the resultant mixture was dehydrated (or removal of the solvent, such as ethanol and acetone) and dried.
- Specimens comprising different compositions from thereof the present invention were prepared as comparisons (indicated by ⁇ in the Table 1).
- an appropriate amount of an organic binder was added to the dried powder. Subsequently, the resultant powder was mixed using a mortar machine, a mixing mill and a like to obtain a slurry having desired viscosity.
- Polyvinyl alcohol (PVA) was employed as the organic binder.
- Other organic binder may be employed, such as ethylcellulose aqueous solution and acryl resin solution (acryl binder).
- the conductive paste may include alloy containing at least one selected from a group consisting of Cu, Ni, W and Mo, or carbon, graphite or the mixture.
- the conductive paste employed in present invention may be a carbon paste made from a mixture powder of a carbon powder and a graphite powder, W paste and Mo paste, as well as a Cu paste, which is obtained by adding organic binder, dispersing agent, organic solvent and, if necessary, reducing agent, to Cu powder and then mixing thereof.
- the green sheets were laminated in the thickness direction under pressure to form a laminate, followed by firing at 925-1080° C., under inert gas atmosphere, such as N 2 gas, or N 2 —H 2 reductive atmosphere.
- inert gas atmosphere such as N 2 gas, or N 2 —H 2 reductive atmosphere.
- Each terminal electrode was formed on the opposed sides of the laminate.
- the laminated ceramic capacitor can be produced through the step of laminating alternatively the dielectric layer 11 and the internal electrode 12 .
- the laminated ceramic capacitor according to this example can exhibit high dielectric constant, high Q value and good temperature property, since it is comprised of the composition obtained by adding MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass frit of 0.5-15 wt % to a main component of SMZT based on the weight of the component and optionally further adding 0.01-5 wt % of SiO 2 and 0.01-5 wt % of Al 2 O 3 and 0.001-2 wt % of rare earth oxide thereto.
- the laminated ceramic capacitor is capable of exhibiting stable characteristics and improved reliability in high frequency.
- the laminated ceramic capacitor having high density and strength can be produced by forming the internal electrode on the green sheet comprising a main component of SMZT to which MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass component of 0.5-15wt % are added based on the weight of the component, and which optionally 0.01-5 wt % of SiO 2 and 0.01-5 wt % of Al 2 O 3 and 0.001-2 wt % of rare earth oxide are added thereto, laminating the green sheet in the thickness direction to form a laminate, firing the laminate at 925-1080° C.
- an inexpensive base metal and carbon-based material can be used as an electrode material, in lie of a noble metal, such as Pt or Pd, since the laminated ceramic capacitor is produced by the process of firing at relatively low temperature. Therefore, the manufacturing method according to the present invention can realize the lower cost without deteriorating the characteristics.
- the dielectric composition is produced by adding MnO 2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi 2 O 3 , PbO and Sb 2 O 3 and a glass frit of 0.5-15 wt %, to a main component of SMZT based on the weight of the component and optionally further adding 0.01-5 wt % of SiO 2 and 0.01-5 wt % of Al 2 O 3 and 0.001-2 wt % of rare earth oxide thereto.
- the dielectric composition can exhibit high dielectric constant, high Q value and good temperature property, resulting in the stable characteristics and improved reliability at high frequency region, such as microwave.
- the capacitor can exhibit a low dielectric loss even at high frequency bandwidth, since it is made of the dielectric ceramic composition. Therefore, the present capacitor is suitable for RF device.
- the present capacitor can also realize the lower cost without deteriorating the characteristics, since an inexpensive base metal or carbon-based material can be used as an electrode material due to the low sintering temperature of 925-1080° C.
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Abstract
Description
- The present invention relates to a dielectric ceramic composition, more particular to a dielectric ceramic composition, a ceramic capacitor using the composition and the producing method, thereof having a lower dielectric loss and stable characteristics in high frequency bandwidth, and enabling to use a base metal (eg. Cu, W etc.) or a carbon-based material as an electrode material by allowing sintering at a low temperature, and thereby reducing the production cost.
- Conventionally, a dielectric property of a ceramic provides a ceramic capacitor having larger capacitance and being more miniature in size. The ceramic capacitor may be made of a material selected from TiO2 having a rutile structure, BaTiO3, MgTiO3, CaTiO3 and SrTiO3, having a perovskite structure and the mixture thereof.
- This ceramic capacitor may be classified into a platelike type and a laminate type. The platelike type capacitor is produced by forming said material powder into some shaped body, such as pellet (disc), rod (cylinder) or chip (angular), under pressure, sintering the shaped body at 1200° C.-1400° C. to a sintered body, and forming electrode at each surface of the sintered body.
- Also, the laminated type ceramic capacitor is produced by mixing said material powder with organic binder and organic solvent to prepare a slurry, forming green sheets from the slurry through a doctor bladding, printing the pattern of electrode comprising of a noble metal, such as Pt and Pd, on each of the green sheets, subsequently laminating said green sheets in the thickness direction under pressure to form a laminate, and sintering the laminate at 1200° C.-1400° C.
- As described above, however, in the conventional ceramic capacitor, the sintering process must be performed at a high temperature ranging 1200° C.-1400° C., to obtain the sintered body exhibiting a good electric characteristics and having a high density.
- For the laminated ceramic capacitor, particularly, in the case of using a base metal as an electrode material, there has been a problem to oxidize the base metal during the sintering process, which occurs a high resistance layer formation between the ceramic layers. To avoid the problem, the noble metal material, being stable at high temperature, must be employed as an electrode material, thereby resulting in high cost.
- On application of a device for high frequency bandwidth, such as microwave, it is preferred to have a low dielectric loss. And such device is required to have a good electric characteristics such as a quality value (Q), temperature property (this term means temperature changing ratio of the capacity), and a high reliability. However, no current dielectric material meets all the conditions.
- Accordingly, there has been a need in the art to provide a dielectric ceramic composition, ceramic capacitor using the composition and the producing method to solve the problem as described above.
- It is an object of the present invention to provide a dielectric ceramic composition and a producing method of the dielectric ceramic composition of having a lower dielectric loss and a stable characteristics in high frequency bandwidth, and enabling to use a base metal, such as Cu and W, or a carbon-based material as an electrode material by allowing sintering at a low temperature, thereby reducing the production cost.
- To achieve the above object, the present invention provides the dielectric ceramic composition comprising a main component of formula SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1) to which 0.05-15 wt % of MnO2, 0.001-5 wt % of at least one selected from the group consisting of Bi2O3, PbO and Sb2O3 and 0.5-15 wt % of a glass component are added based on the weight of the main component.
- It is another object of the present invention to provide a ceramic capacitor using the composition and a method of manufacturing the ceramic capacitor.
- The present invention will become more fully understood from the detailed description given hereinbelow and the accompanying drawings which are given by way of illustration only, and thus, are not limitative of the present invention and wherein:
- FIG. 1 illustrates cross-sectional structural views of a platelike ceramic capacitor in accordance with example 1.
- FIG. 2 illustrates cross-sectional structural views of a laminated ceramic capacitor in accordance with example 2.
- According to the present invention, the dielectric ceramic composition is characterized ill comprising a main component of formula SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1), to which MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3, and a glass component of 0.5-15 wt % are added based on the weight of the main component.
- In the preferred embodiment, the dielectric ceramic composition is produced by adding MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass component 0.5-15 wt % based on the weight of the component to a main component of formula SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1). The resulting composition can exhibit a high dielectric constant, a good temperature property and a high quality value (Q). As a result, the dielectric ceramic composition is suitable for using at high frequency bandwidth.
- The mole fraction of Sr is preferably 0.8 (80 mol %) or more, when the composition containing Sr of less than 0.8 is fired at 925° C.-1080° C. The sintering property of the resultant is deteriorated.
- The mole fraction of Ti is preferably 0.1 (10 mol %) or less. When the mole fraction of Ti is more than 0.1, the temperature property as well as the quality factor (Q) are deteriorated.
- MnO2 is added to the main component as a sintering aid agent for enabling to sinter at a low temperature. The amount of the agent is preferably 0.05-15 wt %. When the amount of MiO2 is less than 0.05 wt %, it does little function as an additive, resulting in a lower density of the sintered body. When the amount of MnO2 is more than 15 wt %, the quality value is deteriorated.
- A metal oxide having a low melting point is added to the main component for improving the temperature property. The metal may be at least one selected from the group consisting of Bi2O3, PbO and Sb2O3. The additive amount is preferably 0.001-5 wt %. When the additive is less than 0.001 wt %, the temperature property cannot be improved. When the additive is more than 5 wt %, the quality value is deteriorated.
- The glass component is added thereto as a sintering aid agent for enabling to sinter at a low temperature. The additive amount is preferably 0.5-15 wt %. When the glass component is less than 0.5 wt %, the temperature property cannot be improved. When the glass component is more than 15 wt %, the quality value is deteriorated.
- The glass component employed in the present invention preferably has a good wettability to the main component SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1, 0.9≦y≦1) and is softened and/or melted at 925-1080° C. Specifically, such glass component may be ZnO—SiO2 based glass or Li2O—Al2O3—SiO2 based glass.
- In second embodiment of the present invention, SiO2 of 0.01-5 wt % and Al2O3 of 0.01-5 wt % based on the weight of the main component are further added to the dielectric ceramic composition to provide another dielectric ceramic composition.
- SiO2 is used as an additive for improving the temperature property. The amount of SiO2 is preferably about 0.01-5 wt %. When the amount of SiO2 is less than 0.01 wt %, the temperature property cannot be improved. When the amount of SiO2 is more than 5 wt %, the quality value is deteriorated.
- Al2O3 is used as an additive for improving the quality value. The amount of Al2O3 is preferably about 0.01-5 wt %. When the amount of Al2O3 is less than 0.01 wt %, the quality value cannot be improved. When the amount of Al2O3 is more, than 5 wt %, the temperature property is deteriorated.
- In the third embodiment of the present invention, a rare earth oxide of 0.001-2 wt % is further added to the dielectric ceramic composition to provide another dielectric ceramic composition based on the weight of the main component.
- The rare earth oxide is used as an additive for improving the temperature property. Preferably, the amount of the rare earth oxide is about 0.001-2 wt %. When the amount of the rare earth oxide is less than 0.001 wt %, the temperature property cannot be improved. When the amount of the rare earth oxide is more than 2 wt %, the quality value is deteriorated.
- The rare earth oxide employed in the present invention has preferably a good wettability to the main composition SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1) and has a grain boundary layer, which is used to improve the sintering property. Specifically, such rare earth oxide may include at least one selected from the group consisting of La2O3, CeO2, Pr6O11, Nd2O3, Sm2O3, Dy2O3, Ho2O3, Er2O3, Tm2O3 and Yb2O3.
- Also, the present invention provides a ceramic capacitor with the opposed surfaces comprising one of the dielectric ceramic compositions as described above, each of which an electrode is formed on. The electrode of the ceramic capacitor may be base metal or carbon-based material, since the capacitor can be produced through sintering at the low temperature.
- Further, the present invention provides a ceramic capacitor made by laminating alternatively electrodes and sheets comprising one of the dielectric ceramic compositions as describe above.
- The ceramic capacitor according to the present invention exhibits a lower dielectric loss and stable characteristics, by using one of the dielectric ceramic compositions as describe above. Therefore, the ceramic capacitor is expected to have more improved reliability. Moreover, it is advantageous that the dielectric ceramic composition can be sintered at a low temperature of 925-1080° C. Therefore, an inexpensive metal, such as a base metal and a carbon-based material, can be used as an internal electrode, thereby reducing the production cost.
- The base metal having a good conductibility and a high reliability is preferably employed as the electrode, which may be at least one selected from the group consisting of Cu, Ni, W and Mo, and the carbon-based material employed as the electrode may be carbon (amorphous), graphite or the mixture.
- In present invention, a ceramic capacitor fabricating method comprises the steps of forming powder comprising a main component of formula SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1), to which MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3, and a glass component of 0.5-15 wt % are added based on the weight of the main component, into a bulk or a sheet; and sintering the bulk or a sheet at about 925-1080° C.
- According to the method, a sintering aid agent of MnO2 and glass composition can improve a wettability of a grain boundary layer to bind powder particles and reduce the void fraction during the sintering process even at low temperature of about 925-1080° C. Thus, the sintered body having a high strength and high density can be obtained at the low temperature.
- In another embodiment of the present method, the method may comprise the additional step of providing an electrode on a main surface of the sheet; laminating the sheet in the thickness direction under pressure to form a laminate; and sintering the laminate at about 925-1080° C.
- According to this method, a base metal, such as Cu and Ni, or a carbon-based material, such as amorphous carbon and graphite, is used as an internal electrode, which is less expensive than noble metal, such as Pt and Pd, resulting in the lower cost without deteriorating the characteristics.
- The embodiments of the present invention will now be described by way of example.
- Referring to FIG. 1, cross-sectional structural view of a platelike ceramic capacitor in accordance with a first example is shown in FIG. 1. The capacitor comprises a bulk shape
dielectric body 1,terminal electrodes 2 formed on the opposed surfaces of thedielectric body 1,lead lines 3 connecting to the terminal electrode, and an epoxy resin 4 encapsulating thedielectric body 1 and theterminal electrode 2. - The
dielectric body 1 is made of a dielectric ceramic composition comprising a main component of formula SrxMg1-x(ZryTi1-y)O3 (where 0.8≦x≦1; 0.9≦y≦1), to which MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass frit (glass component) of 0.5-15 wt % are added based on the weight of the main component. - The
dielectric body 1 may include one of to the dielectric ceramic composition further containing SiO2 of 0.01-5 wt % and Al2O3 of 0.01-5 wt %, the dielectric ceramic composition further containing a rare earth oxide of 0.001-2 wt %, and the dielectric ceramic composition further containing SiO2 of 0.01-5 wt %, Al2O3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt %. - The
terminal electrode 2 comprises a conductive material having a high reliability, such as Ag and Ag alloy. Preferably, Ag alloy may include 90Ag-10Pd. The material of theterminal electrode 2 may also include at least one selected from the group consisting of Cu, Ni, W and Mo, or carbon, graphite or the mixture. - This ceramic capacitor exhibits a stable dielectric constant (ε), quality factor (Q) and temperature property (Tc) even in high frequency bandwidth.
- The method of manufacturing this capacitor will now be described.
- Each of Powdered SMZT, MnO2, at least one selected from the group consisting of Bi2O3, PbO and Sb2O3, glass frit, SiO2, Al2O3 and rare earth oxide were weighed as the predetermined amount.
- In this example, each of powdered Sr0.95Mg0.05(Zr0.95Ti0.05)O3, MnO2, PbO, glass component (ZnO—SiO2 based glass or Li2O—Al2O3—SiO2 based glass), SiO2, Al2O3 and La2O3 was weighed to prepare a dielectric ceramic composition as shown in Table 1.
TABLE 1 Main component (mole fraction) Additive A Additive B Sintering Speci- SrxMg1−x(ZryTi1−y)O3 (wt %) (wt %) temperature men Sr Mg Zr Ti MnO2 Al203 SiO2 Glass frit PbO La2O3 (° C.) 1 1 0 1 0 0 0 0 0 0 0 1050 2 1 0 1 0 0.3 0 0 0.5 1.0 0 1000 3 1 0 1 0 0.3 0 0 3.0 1.0 0 950 4 1 0 1 0 0.3 0 0 11.0 1.0 0 950 5 1 0 0.95 0.05 5.0 0.1 0.05 2.5 0.5 0.01 950 6 1 0 0.95 0.05 5.0 0.1 0.05 2.5 0.5 0.01 1000 7 1 0 0.95 0.05 5.0 0.1 0.05 2.5 0.5 0.01 900 8 1 0 0.95 0.05 5.0 0.1 0.05 2.5 8.0 0.01 950 9 1 0 0.95 0.05 5.0 0.1 0.05 2.5 0.5 0.01 950 10 0.98 0.02 0.95 0.05 5.0 0.05 0.05 2.6 0.5 0.01 950 11 0.98 0.02 0.95 0.05 5.0 0.5 0.05 2.5 0.5 0.01 950 12 0.98 0.02 0.95 0.05 5.0 0.5 0.05 2.5 1.0 0.01 900 13 0.98 0.02 0.95 0.05 5.0 0.5 0.05 11.0 1.0 0.01 950 14 0.98 0.02 0.95 0.05 5.0 5.0 0.05 2.5 0.5 0.01 950 15 0.98 0.02 0.95 0.05 5.0 0.1 0.5 2.5 0.5 0.01 950 16 0.95 0.05 0.95 0.05 0.04 0 0 3.5 0 0 925 17 0.95 0.05 0.95 0.05 2.6 0 0 0.4 0 0 925 18 0.95 0.05 0.95 0.05 2.5 0 0 3.5 0 0 925 19 0.95 0.05 0.95 0.05 3 0.2 0.3 0.4 0.5 0.00 950 20 0.95 0.05 0.95 0.05 5 0.1 0.06 5 0.5 0.03 900 21 0.95 0.05 0.95 0.05 5 0.1 0.05 5 0.5 0.03 950 22 0.96 0.05 0.95 0.05 5 0.05 0.06 5 0.5 0.03 975 23 0.95 0.05 0.95 0.05 5 0.5 0.05 5 0.5 0.03 975 24 0.95 0.05 0.95 0.05 6 5.0 0.06 5 0.5 0.03 976 25 0.95 0.05 0.95 0.05 5 0.1 0.5 5 0.5 0.03 975 26 0.95 0.05 0.95 0.05 5 0.1 5.0 5 0.6 0.03 975 27 0.95 0.06 0.95 0.05 5 0.1 0.1 5 0.5 0.03 1050 28 0.8 0.2 0.95 0.05 5 0.1 0.05 3.5 0.5 0.03 950 29 0.8 0.2 0.95 0.05 5 0.1 0.05 5 0.5 0.03 900 30 0.75 0.25 0.95 0.05 5 0.1 0.05 5 0.5 0.03 950 - The prepared components were wet-milled with water or organic solvent such as ethanol and acetone) in ball mill for predetermined time, such as 24 hours. The resultant mixture was dehydrated (or removal of the solvent, such as ethanol and acetone) and dried. Specimen comprising different composition from thereof the present invention was prepared as comparison (indicated by in the Table 1).
- Then, dried mixture was preliminary fired at 550-750° C., for 05-5.0 hours, followed by pulverizing for 1-24 hour with a mortar machine (or automatic pestle) to obtain the fired powder having the desired granularity.
- Subsequently, an appropriate amount of an organic binder was added to the fired powder. The resultant was mixed and granularized uniformly using a mortar machine and a like to obtain granular powder having the desired granularity. Polyvinyl alcohol (PVA) was employed as a organic binder. Other organic binder may include ethylcellulose aqueous solution and acryl resin solution (acryl binder)
- Then, the pellet having a diameter of 20 mm and a thickness of 0.5 mm is formed from the granular powder using a forming machine, followed by firing at 925-1080° C., for 0.5-10 hours under atmosphere, to obtain a disk-shaped
dielectric body 1. - The composition of the present invention was fired at the other temperature to prepare another specimen as comparison (indicated by in the Table 1).
- Table 2 shows electric characteristics of each specimen, and the comparison is indicated by “”.
TABLE 2 Temperature Specimen Dielectric Quality Resistance property (Tc) number constant (ε) value (Q) (Ω · cm) (ppm/° C.) 1 13 230 1.6 × 1011 96 2 19 950 1.3 × 1012 93 3 23 2300 1.9 × 1012 60 4 22 380 1.5 × 1012 180 5 28 2680 1.7 × 1012 58 6 27 3630 1.5 × 1012 63 7 24 190 1.6 × 1012 56 8 33 180 1.5 × 1012 26 9 31 6000 2.0 × 1012 35 10 29 2670 1.8 × 1012 38 11 27 2980 1.6 × 1012 32 12 12 310 1.5 × 1012 15 13 28 60 1.8 × 1012 27 14 26 790 1.9 × 1012 43 15 25 2340 2.0 × 1012 36 16 18 370 1.9 × 1012 32 17 16 270 2.1 × 1012 27 18 23 2560 1.8 × 1012 68 19 12 320 1.6 × 1012 71 20 17 150 1.3 × 1011 29 21 25 1700 2.2 × 1012 75 22 25 2550 2.1 × 1012 58 23 22 2500 1.7 × 1012 82 24 26 2700 1.1 × 1013 105 25 24 2300 1.9 × 1012 74 26 22 1970 1.5 × 1012 23 27 23 2200 2.1 × 1012 63 28 17 1290 2.0 × 1012 32 29 12 200 1.8 × 1012 17 30 11 170 1.9 × 1012 40 - Wherein, the dielectric constant (ε) was measured at 25° C. under the condition of frequency of 1 MHz and an input voltage of 1Vrms. The Q value was measured under the condition of frequency of 1 MHz and an input voltage of 1Vrms. The temperature property (Tc) was calculated from the following equation
- Tc(ppm/° C.)=(
C 2−C 1×106)/(C 1×(125−25)) - Wherein, the C1 is the capacitance at 125° C. and the C2 is the capacitance at 25° C.
- And the resistance (R(Ω×cm)) was calculated by using the voltage and the current, which were measured on applying a direct voltage of 1000V for 1 minute at 25° C.
- Referring to the result of Table 2, the dielectric constant (ε), Q value and temperature property (Tc) were stable even at high frequency in this example, while the characteristics of all the comparisons were deteriorated.
- Further, when the specimen surfaces of these examples were observed through a metallurgical microscope, it will be known that no void was present at grain boundary and a dense sintering body was constructed.
- As described above, according to this example, the dielectric composition exhibiting high dielectric constant, high Q value and good temperature property, can be obtained by adding MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass frit 0.5-15 wt % to a main component of SMZT based on the weight of the main component and optionally further adding SiO2 of 0.01-5 wt % and Al2O3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % thereto. Thus, the dielectric composition is capable of a dielectric capacitor having stable characteristics and improved reliability.
- According to the method of manufacturing the ceramic capacitor, the ceramic capacitor having high density and strength can be provided at the low temperature by forming a bulk or a sheet from powder comprising a main component of SMZT to which MnO2 of 0.05-15 wt %, at least one 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass component of 0.5-15 wt % are added based on the weight of the component, and which optionally SiO2 of 0.01-5 wt % and Al2O3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % are added thereto and firing the sheet or other resultant at 925-1080° C.
- FIG. 2 illustrates cross-sectional structural view of a laminated ceramic capacitor in accordance with second example. The capacitor comprises a sheet-shaped dielectric layers11, thin
internal electrodes 12 andterminal electrodes dielectric layers 11 and seven thininternal electrodes 12, which are alternatively laminated. - The
dielectric layer 11 is made of sheet-shaped ceramic composition comprising a main component of SMZT to which MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass frit (glass component) of 0.5-15 wt % are added based on the weight of the main component. - Alternatively, the
dielectric layer 11 may include one of the dielectric ceramic composition further containing SiO2 of 0.01-5 wt % and Al2O3 of 0.01-5 wt %, the dielectric ceramic composition further containing rare earth oxide of 0.001-2 wt %, and the dielectric ceramic composition further containing SiO2 of 0.01-5 wt %, Al2O3 of 0.01-5 wt % and rare earth oxide of 0.001-2 wt % is added. - The
internal electrode 12 and theterminal electrodes - This laminated ceramic capacitor exhibits a stable dielectric constant (ε), quality factor (Q) and temperature property (Tc) even in RF region.
- The method of manufacturing this laminated ceramic capacitor will be described now.
- Each of powdered SMZT, MnO2, at least one selected from the group consisting of Bi2O3, PbO and Sb2O3, glass frit, SiO2, Al2O3 and rare earth oxide were weighed as the predetermined amount. Each composition was wet-milled with water (or organic solvent such as ethanol and acetone) in ball mill for predetermined time, such as 24 hours. The resultant mixture was dehydrated (or removal of the solvent, such as ethanol and acetone) and dried. Specimens comprising different compositions from thereof the present invention were prepared as comparisons (indicated by in the Table 1).
- Then, an appropriate amount of an organic binder was added to the dried powder. Subsequently, the resultant powder was mixed using a mortar machine, a mixing mill and a like to obtain a slurry having desired viscosity. Polyvinyl alcohol (PVA) was employed as the organic binder. Other organic binder may be employed, such as ethylcellulose aqueous solution and acryl resin solution (acryl binder).
- Then, the slurry was deaired and formed into sheets through doctor blading to obtaining a ceramic green sheet. A conductive paste was printed as desired pattern on the green sheet. Thereby the internal electrode layer was formed on the green sheet. The conductive paste may include alloy containing at least one selected from a group consisting of Cu, Ni, W and Mo, or carbon, graphite or the mixture.
- Particularly, the conductive paste employed in present invention may be a carbon paste made from a mixture powder of a carbon powder and a graphite powder, W paste and Mo paste, as well as a Cu paste, which is obtained by adding organic binder, dispersing agent, organic solvent and, if necessary, reducing agent, to Cu powder and then mixing thereof.
- Then, the green sheets were laminated in the thickness direction under pressure to form a laminate, followed by firing at 925-1080° C., under inert gas atmosphere, such as N2 gas, or N2—H2 reductive atmosphere. Each terminal electrode was formed on the opposed sides of the laminate. Thus, the laminated ceramic capacitor can be produced through the step of laminating alternatively the
dielectric layer 11 and theinternal electrode 12. - As described above, for the laminated ceramic capacitor according to this example, it can exhibit high dielectric constant, high Q value and good temperature property, since it is comprised of the composition obtained by adding MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass frit of 0.5-15 wt % to a main component of SMZT based on the weight of the component and optionally further adding 0.01-5 wt % of SiO2 and 0.01-5 wt % of Al2O3 and 0.001-2 wt % of rare earth oxide thereto. Thus, the laminated ceramic capacitor is capable of exhibiting stable characteristics and improved reliability in high frequency.
- According to the method of manufacturing the laminated ceramic capacitor, the laminated ceramic capacitor having high density and strength can be produced by forming the internal electrode on the green sheet comprising a main component of SMZT to which MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass component of 0.5-15wt % are added based on the weight of the component, and which optionally 0.01-5 wt % of SiO2 and 0.01-5 wt % of Al2O3 and 0.001-2 wt % of rare earth oxide are added thereto, laminating the green sheet in the thickness direction to form a laminate, firing the laminate at 925-1080° C. under inert gas atmosphere or N2—H2 seductive atmosphere. Thus, an inexpensive base metal and carbon-based material can be used as an electrode material, in lie of a noble metal, such as Pt or Pd, since the laminated ceramic capacitor is produced by the process of firing at relatively low temperature. Therefore, the manufacturing method according to the present invention can realize the lower cost without deteriorating the characteristics.
- As described above, according to the dielectric ceramic composition of the present invention, the dielectric composition is produced by adding MnO2 of 0.05-15 wt %, at least one of 0.001-5 wt % selected from the group consisting of Bi2O3, PbO and Sb2O3 and a glass frit of 0.5-15 wt %, to a main component of SMZT based on the weight of the component and optionally further adding 0.01-5 wt % of SiO2 and 0.01-5 wt % of Al2O3 and 0.001-2 wt % of rare earth oxide thereto. Thus, the dielectric composition can exhibit high dielectric constant, high Q value and good temperature property, resulting in the stable characteristics and improved reliability at high frequency region, such as microwave.
- For a ceramic capacitor, according to the present invention, the capacitor can exhibit a low dielectric loss even at high frequency bandwidth, since it is made of the dielectric ceramic composition. Therefore, the present capacitor is suitable for RF device. The present capacitor can also realize the lower cost without deteriorating the characteristics, since an inexpensive base metal or carbon-based material can be used as an electrode material due to the low sintering temperature of 925-1080° C.
- While the invention has been described in its preferred embodiments, this should not be construed as limitation on the scope of the present invention and can be modified and changed to other various embodiments. Accordingly, the scope of the present invention should be determined not by the embodiments illustrated, but by the appended claims and their legal equivalents. In second example, eight dielectric layers and seven internal electrodes are laminated to form a laminate, but the number of the dielectric or internal electrode may be changed to be suitable for the desired capacitor and characteristics.
Claims (20)
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CN103539447A (en) * | 2013-10-08 | 2014-01-29 | 江苏大学 | Low-temperature sintered piezoelectric ceramic material and preparation method thereof |
WO2017148606A1 (en) * | 2016-03-04 | 2017-09-08 | Epcos Ag | Dielectric ceramic composition, method for the production and use thereof |
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JPH0831284B2 (en) * | 1986-11-14 | 1996-03-27 | 株式会社村田製作所 | Dielectric ceramic composition for non-reducing temperature compensation |
JPS63289710A (en) * | 1987-05-20 | 1988-11-28 | Murata Mfg Co Ltd | Nonreducible dielectric ceramic constituent |
JPH0734326B2 (en) * | 1990-03-13 | 1995-04-12 | 株式会社村田製作所 | Non-reducing dielectric ceramic composition |
JPH0446053A (en) * | 1990-06-12 | 1992-02-17 | Asahi Glass Co Ltd | Oxide superconductor and its production |
DE4141648C2 (en) * | 1990-12-17 | 1997-01-09 | Toshiba Kawasaki Kk | Ceramic capacitor |
DE69209417T2 (en) * | 1991-09-25 | 1996-11-28 | Murata Manufacturing Co | Non-reducible dielectric ceramic composition |
JP3514810B2 (en) * | 1994-03-29 | 2004-03-31 | Tdk株式会社 | Method of manufacturing voltage-dependent nonlinear resistor |
JP3229528B2 (en) * | 1994-11-22 | 2001-11-19 | 松下電器産業株式会社 | Dielectric porcelain and dielectric resonator |
JP3346293B2 (en) * | 1998-08-07 | 2002-11-18 | 株式会社村田製作所 | Non-reducing dielectric ceramic composition and multilayer ceramic capacitor using the same |
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CN103539447A (en) * | 2013-10-08 | 2014-01-29 | 江苏大学 | Low-temperature sintered piezoelectric ceramic material and preparation method thereof |
WO2017148606A1 (en) * | 2016-03-04 | 2017-09-08 | Epcos Ag | Dielectric ceramic composition, method for the production and use thereof |
US10892097B2 (en) | 2016-03-04 | 2021-01-12 | Tdk Electronics Ag | Dielectric ceramic composition, method for the production and use thereof |
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US6432857B2 (en) | 2002-08-13 |
KR100415558B1 (en) | 2004-01-24 |
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