US10876870B2 - Method of determining flow rate of a gas in a substrate processing system - Google Patents
Method of determining flow rate of a gas in a substrate processing system Download PDFInfo
- Publication number
- US10876870B2 US10876870B2 US16/238,834 US201916238834A US10876870B2 US 10876870 B2 US10876870 B2 US 10876870B2 US 201916238834 A US201916238834 A US 201916238834A US 10876870 B2 US10876870 B2 US 10876870B2
- Authority
- US
- United States
- Prior art keywords
- flow channel
- gas flow
- measured value
- gas
- tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/05—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects
- G01F1/34—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure
- G01F1/50—Correcting or compensating means
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
- G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
- G01F15/02—Compensating or correcting for variations in pressure, density or temperature
- G01F15/04—Compensating or correcting for variations in pressure, density or temperature of gases to be measured
-
- G01F25/0053—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F25/00—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume
- G01F25/10—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters
- G01F25/15—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters specially adapted for gas meters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F3/00—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow
- G01F3/36—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow with stationary measuring chambers having constant volume during measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F3/00—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow
- G01F3/36—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow with stationary measuring chambers having constant volume during measurement
- G01F3/38—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow with stationary measuring chambers having constant volume during measurement having only one measuring chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
Definitions
- Exemplary embodiments of the present disclosure relate to a method of determining a flow rate of a gas in a substrate processing system.
- a substrate In substrate processing, a substrate is disposed in an internal space of a chamber body, a gas is supplied to the internal space, and the substrate is processed by the supplied gas.
- a flow rate of a gas supplied to the internal space of the chamber body is controlled by a flow rate controller. The accuracy of control of the flow rate of a gas influences a result of substrate processing. Therefore, the flow rate of a gas which is output by the flow rate controller is measured.
- a build-up method is used as one of methods of measuring a flow rate of a gas.
- the build-up method is disclosed in Japanese Patent Application Laid-Open Publication No. 2012-32983.
- a volume of a gas flow channel is determined in advance.
- a flow rate is determined from a rise rate for pressure within the gas flow channel, a temperature within the gas flow channel, and the determined volume.
- the substrate processing system includes a plurality of chamber bodies, a plurality of gas supply units, and a plurality of exhaust apparatuses.
- Each of the plurality of gas supply units is configured to supply a gas to an internal space of a corresponding chamber body among the plurality of chamber bodies.
- Each of the plurality of gas supply units has a housing, a plurality of flow rate controllers, a plurality of primary valves, a plurality of secondary valves, and a first gas flow channel.
- the plurality of flow rate controllers are provided within the housing.
- the plurality of primary valves are connected to primary sides of the plurality of flow rate controllers, respectively.
- the plurality of secondary valves are connected to secondary sides of the plurality of flow rate controllers, respectively.
- the first gas flow channel includes a plurality of first ends, a second end, and a third end.
- the plurality of first ends are connected to the plurality of secondary valves, respectively.
- the plurality of first ends, the second end, and a portion extending from the plurality of first ends to the second end are provided within the housing.
- the third end is provided outside the housing.
- the third end is connected to the internal space of the corresponding chamber body through an on/off valve.
- the plurality of exhaust apparatuses are connected to internal spaces of the plurality of chamber bodies through a plurality of exhaust flow channels, respectively.
- the flow rate measurement system includes a second gas flow channel, a third gas flow channel, a first valve, a second valve, one or more first pressure sensors, and a first temperature sensor.
- the second gas flow channel includes a plurality of fourth ends and a fifth end. Each of the plurality of fourth ends is connected to the second end of a corresponding gas supply unit among the plurality of gas supply units.
- the third gas flow channel has a sixth end and a seventh end.
- the first valve is connected between the fifth end of the second gas flow channel and the sixth end of the third gas flow channel.
- the second valve is connected to the seventh end of the third gas flow channel, and is provided to be capable of being connected to the plurality of exhaust apparatuses.
- the one or more first pressure sensors are configured to measure a pressure within the third gas flow channel.
- the first temperature sensor is configured to measure a temperature within the third gas flow channel.
- the method according to the one aspect includes:
- ⁇ t is a time length of an execution period of the raising a pressure
- R is a gas constant
- (V/T) includes ⁇ V 3 /T 12 ⁇ (P 12 ⁇ P 13 )/(P 12 ⁇ P 14 ) ⁇
- V 3 is a default value of a volume of the third gas flow channel.
- FIG. 1 is a flow diagram illustrating a method of determining a flow rate of a gas according to an exemplary embodiment.
- FIG. 2 schematically illustrates a substrate processing system according to an exemplary embodiment.
- FIG. 3 illustrates a structure of a pressure control-type flow rate controller of an example.
- FIG. 4 is a flow diagram illustrating the detail of step STA of the method shown in FIG. 1 .
- FIG. 5 is a flow diagram illustrating the detail of step STB of the method shown in FIG. 1 .
- FIG. 6 is a timing diagram relating to the method shown in FIG. 1 .
- the substrate processing system includes a plurality of chamber bodies, a plurality of gas supply units, and a plurality of exhaust apparatuses.
- Each of the plurality of gas supply units is configured to supply a gas to an internal space of a corresponding chamber body among the plurality of chamber bodies.
- Each of the plurality of gas supply units has a housing, a plurality of flow rate controllers, a plurality of primary valves, a plurality of secondary valves, and a first gas flow channel.
- the plurality of flow rate controllers are provided within the housing.
- the plurality of primary valves are connected to primary sides of the plurality of flow rate controllers, respectively.
- the plurality of secondary valves are connected to secondary sides of the plurality of flow rate controllers, respectively.
- the first gas flow channel includes a plurality of first ends, a second end, and a third end.
- the plurality of first ends are connected to the plurality of secondary valves, respectively.
- the plurality of first ends, the second end, and a portion extending from the plurality of first ends to the second end are provided within the housing.
- the third end is provided outside the housing.
- the third end is connected to the internal space of the corresponding chamber body through a on/off valve.
- the plurality of exhaust apparatuses are connected to internal spaces of the plurality of chamber bodies through a plurality of exhaust flow channels, respectively.
- the flow rate measurement system includes a second gas flow channel, a third gas flow channel, a first valve, a second valve, one or more first pressure sensors, and a first temperature sensor.
- the second gas flow channel includes a plurality of fourth ends and a fifth end. Each of the plurality of fourth ends is connected to the second end of a corresponding gas supply unit among the plurality of gas supply units.
- the third gas flow channel has a sixth end and a seventh end.
- the first valve is connected between the fifth end of the second gas flow channel and the sixth end of the third gas flow channel.
- the second valve is connected to the seventh end of the third gas flow channel, and is provided to be capable of being connected to the plurality of exhaust apparatuses.
- the one or more first pressure sensors are configured to measure a pressure within the third gas flow channel.
- the first temperature sensor is configured to measure a temperature within the third gas flow channel.
- the method according to the one aspect includes:
- a pressure rise is caused by supplying a gas from the one flow rate controller to the first gas flow channel, the second gas flow channel, and the third gas flow channel of the one gas supply unit in a state where the second valve is closed.
- the rate of this pressure rise that is, the rate of rise in pressure is used in Expression (1), so that a flow rate of a gas output from the one flow rate controller is determined.
- V/T should include a sum of (V E /T E ) and (V 3 /T 12 ).
- V E is a sum of the volume of the first gas flow channel and the volume of the second gas flow channel
- T E is a temperature in the first gas flow channel and the second gas flow channel in the third state.
- the first gas flow channel is disposed within the housing, a temperature within the first gas flow channel is less influenced by the surrounding environment.
- the third gas flow channel is connected to the first gas flow channel through the second gas flow channel, a temperature in the third gas flow channel is less influenced by the plurality of chamber bodies.
- the second gas flow channel may be influenced the surrounding environment, for example, the temperature of any of the plurality of chamber bodies.
- V 3 /T 12 ⁇ (P 12 ⁇ P 13 )/(P 12 ⁇ P 14 ) is used in Expression (1) instead of the sum of (V E /T E ) and (V 3 /T 12 ).
- a sixth state is formed by diffusing a gas confined in the first gas flow channel and the second gas flow channel in the third state to the third gas flow channel, and thus the measured value P 14 is acquired in the sixth state. That is, a gas used for forming a state during the acquisition of the measured value P 12 is reused for forming a state during the acquisition of the measured value P 14 . Therefore, it is possible to efficiently determine a flow rate.
- the pressure within the third gas flow channel in the fifth state is set to be higher than the pressure within the third gas flow channel which is evacuated.
- the fifth state is formed by a gas contained within the third gas flow channel in the third state being partially discharged, that is, without being completely discharged. Therefore, a time length required for forming the fifth state from the second state is shortened.
- a flow rate measurement system further includes a fourth gas flow channel, a third valve, and a fourth valve.
- the fourth gas flow channel has an eighth end, a ninth end, a tenth end, a first partial flow channel extending between the eighth end and the ninth end, and a second partial flow channel branching from the first partial flow channel to extend to the tenth end.
- the second valve is connected between the seventh end of the third gas flow channel and the eighth end of the fourth gas flow channel.
- the third valve is connected between the ninth end of the fourth gas flow channel and each of the plurality of exhaust apparatuses.
- the fourth valve is provided on the second partial flow channel.
- the method further includes:
- a tank of a reference device to the tenth end, the reference device having the tank, a second temperature sensor that measures a temperature in an internal space of the tank, a second pressure sensor that measures a pressure in the internal space of the tank, and a fifth valve connected between the fourth valve and the internal space of the tank;
- V 4 V r ⁇ ( P r1 /T r1 ⁇ P r2 /T r2 ) ⁇ T r2 /P r2 (2)
- V 3C ( V r ⁇ P r1 /T r1 ⁇ V 4 ⁇ P r3 /T r3 ⁇ V r ⁇ P r3 /T r3 ) ⁇ T 1f /P r3 (3)
- the calculated value V 3C of the volume of the third gas flow channel is acquired on the basis of the Boyle-Charles' law.
- the calculated value V 3C and the default value V 3 are compared with each other, and thus the reliability of the default value V 3 is verified.
- the method further includes:
- the default value V 3 is updated by an average value of the plurality of calculated values V 3C , the default value V 3 having high reliability is obtained. Accordingly, the accuracy of calculation of a flow rate based on Expression (1) is further improved.
- the method further includes:
- the acquiring a measured value group is executed at each of a plurality of cycles.
- the gas confined in the fourth gas flow channel at a (k ⁇ 1)-th cycle among the plurality of cycles is discharged, and the gas confined in the third gas flow channel and the internal space of the tank at the (k ⁇ 1)-th cycle is diffused into the fourth gas flow channel, whereby the state in which the gas is confined in the third gas flow channel, the fourth gas flow channel, and the internal space of the tank is formed.
- k is an integer equal to or greater than 2.
- the method further includes calibrating a pressure sensor identified from each of the plurality of measured value groups as one which acquires a measured value having an error which is not included in a predetermined allowable range with respect to the measured value of the reference pressure sensor, among the one or more first pressure sensors and the second pressure sensor.
- one or more first pressure sensors and the second pressure sensor are appropriately calibrated. As a result, the accuracy of calculation of a flow rate based on Expression (1) is further improved.
- FIG. 1 is a flow diagram illustrating a method of determining a flow rate of a gas according to an exemplary embodiment.
- a method MT shown in FIG. 1 is executed using a flow rate measurement system in order to determine a flow rate of a gas in a substrate processing system.
- FIG. 2 schematically illustrates a substrate processing system according to an exemplary embodiment. The method MT can be applied to a substrate processing system 10 shown in FIG. 2 .
- the substrate processing system 10 include a plurality of chamber bodies 12 , a plurality of gas supply units 14 , and, a plurality of exhaust apparatuses 16 .
- each of the number of chamber bodies 12 and the number of exhaust apparatuses 16 is N.
- the number of gas supply units 14 is (N+1). “N” is an integer equal to or greater than 2. In the following description and the drawings, in a case where one element among N or (N+1) elements of the substrate processing system 10 is referred to, the subscript of “i” is added to the end of a reference symbol indicating the element.
- the substrate processing system 10 includes a plurality of process modules.
- Each of a plurality of process modules includes a chamber body 12 i , a gas supply unit 14 i , and, an exhaust apparatus 16 i which have the same number i.
- a substrate is accommodated in the internal space of each of the plurality of chamber bodies 12 for substrate processing.
- Each of the plurality of gas supply units 14 is configured to supply a gas to the internal space of a corresponding chamber body among the plurality of chamber bodies 12 .
- the gas supply units 14 1 to 14 N are configured to supply a gas into the chamber bodies 12 1 to 12 N , respectively.
- the gas supply unit 14 N+1 is configured to supply a gas into the chamber body 12 1 . It should be noted that the gas supply unit 14 N+1 may also be configured to supply a gas to the internal space of the chamber body other than the chamber body 12 1 among the plurality of chamber bodies 12 .
- Each of the plurality of gas supply units 14 includes a housing 17 , a plurality of flow rate controllers 18 , a plurality of primary valves 19 , a plurality of secondary valves 20 , and a first gas flow channel 21 .
- Each of the plurality of gas supply units 14 may further include a valve 22 .
- each of N gas supply units 14 1 to 14 N includes M flow rate controllers 18 , M primary valves 19 , and M secondary valves 20 .
- M is an integer equal to or greater than 2.
- the gas supply unit 14 N+1 includes two flow rate controllers 18 , two primary valves 19 , and two secondary valves 20 .
- the subscript of “j” is added to the end of a reference symbol indicating the element.
- the reference symbols of “18 j ” is used.
- j is an integer equal to or greater than 1.
- the housing 17 is a container providing an internal space.
- the plurality of flow rate controllers 18 are accommodated within the housing 17 .
- a flow rate controller other than the flow rate controller 18 1 of the gas supply unit 14 N+1 is a mass flow controller or a pressure control-type flow rate controller.
- FIG. 3 illustrates a structure of a pressure control-type flow rate controller of an example.
- a flow rate controller FC shown in FIG. 3 may be used as a flow rate controller other than the flow rate controller 18 1 of the gas supply unit 14 N+1 among the plurality of flow rate controllers 18 of the plurality of gas supply units 14 .
- the flow rate controller FC includes a control valve CV, a flow channel IL, an orifice member OF, a pressure sensor FP 1 , a temperature sensor FT, and a pressure sensor FP 2 .
- One end of the flow channel IL is connected to the primary valve.
- the other end of the flow channel IL is connected to the secondary valve.
- the orifice member OF partially reduces the cross-sectional area of the flow channel IL between one end and the other end of the flow channel IL. ⁇ t the upstream side of the orifice member OF, the control valve CV is provided on the flow channel IL.
- the pressure sensor FP 1 is configured to measure a pressure within the flow channel IL between the control valve CV and the orifice member OF, that is, on the primary side of the orifice member OF.
- the temperature sensor FT is configured to measure a temperature within the flow channel IL between the control valve CV and the orifice member OF, that is, on the primary side of the orifice member OF.
- the pressure sensor FP 2 is configured to measure a pressure within the flow channel IL between the orifice member OF and the other end of the flow channel IL.
- the degree of opening of the control valve CV is controlled by a control unit CU so as to reduce a difference between a set flow rate and a flow rate which is determined from the measured value of a pressure acquired by the pressure sensor FP 1 .
- the degree of opening of the control valve CV is controlled by the control unit CU so as to reduce a difference between a set flow rate and a flow rate which is determined from a difference between the measured value of a pressure acquired by the pressure sensor FP 1 and the measured value of a pressure acquired by the pressure sensor FP 2 .
- the flow rate controller FC may not include the pressure sensor FP 2 in a case of being used in a state where the pressure on the primary side (upstream side) of the orifice member OF is two or more times the pressure of the flow channel IL on the downstream side (secondary side) of the orifice member OF.
- a flow rate controller other than the flow rate controller 18 1 of the gas supply unit 14 N+1 may be a mass flow controller.
- the mass flow controller has a temperature sensor similarly to a pressure control-type flow rate controller.
- the flow rate controller 18 1 of the gas supply unit 14 N+1 is a mass flow controller, and may have a function of vaporizing a liquid.
- the plurality of primary valves 19 are connected to the primary sides of the plurality of flow rate controllers 18 , respectively.
- the plurality of primary valves 19 are provided within the housing 17 .
- a primary valve other than the primary valve 19 1 of the gas supply unit 14 N+1 among the plurality of primary valves 19 is connected to a corresponding gas source provided on the primary side (upstream side) thereof.
- the primary valve 19 1 of the gas supply unit 14 N+1 is connected to a liquid source provided on the primary side thereof.
- the plurality of secondary valves 20 are connected to the secondary sides of the plurality of flow rate controllers 18 , respectively.
- the plurality of secondary valves 20 are provided within the housing 17 .
- the first gas flow channel 21 includes a plurality of first ends 21 a , a second end 21 b , and a third end 21 c .
- the plurality of first ends 21 a are connected to the plurality of secondary valves 20 , respectively. That is, the plurality of first ends 21 a are connected to the secondary sides of the plurality of flow rate controllers 18 , respectively, through the plurality of secondary valves 20 .
- the first gas flow channel 21 includes a plurality of flow channels extending from the plurality of first ends 21 a , and the plurality of flow channels are connected to a common flow channel. One end of the common flow channel of the first gas flow channel 21 is the second end 21 b .
- a portion of the first gas flow channel 21 extending from the plurality of first ends 21 a to the second end 21 b is provided within the housing 17 .
- the third end 21 c is provided outside the housing 17 .
- a flow channel including the third end 21 c is connected to the common flow channel of the first gas flow channel 21 .
- the third end 21 c is connected to the internal space of a corresponding chamber body among the plurality of chamber bodies 12 through a corresponding on/off valve 30 ( 30 i ).
- the valve 22 is connected to the second end 21 b .
- the valve 22 is provided within the housing 17 .
- the substrate processing system 10 includes a plurality of pressure control valves 32 , a plurality of turbo-molecular pumps 34 , a plurality of exhaust flow channels 36 , and, a plurality of valves 38 .
- Each of the plurality of pressure control valves 32 is, for example, an automatic pressure control valve.
- a pressure control valve 32 i is configured to adjust the pressure of the internal space of a corresponding chamber body 12 i .
- An exhaust flow channel 36 i is connected to the internal space of a corresponding chamber body 12 i through a pressure control valve 32 i and a turbo-molecular pump 34 i .
- a valve 38 i is provided on the exhaust flow channel 36 i .
- the exhaust apparatus 16 i is connected to the exhaust flow channel 36 i .
- Each of the plurality of exhaust apparatuses 16 may be, for example, a dry pump.
- a flow rate measurement system 40 is connected to the substrate processing system 10 in order to measure a flow rate of a gas which is output by each of the plurality of flow rate controllers 18 .
- the flow rate measurement system 40 is provided with a gas flow channel and various sensors which are used in the measurement of a flow rate of a gas according to a build-up method.
- the flow rate measurement system 40 includes a second gas flow channel 42 , a third gas flow channel 43 , a pressure sensor 47 , a pressure sensor 48 , a temperature sensor 49 , a first valve 51 , and a second valve 52 .
- the second gas flow channel 42 includes a plurality of fourth ends 42 a and a fifth end 42 b , and extends from the plurality of fourth ends 42 a to the fifth end 42 b .
- Each of the plurality of fourth ends 42 a is connected to the second end 21 b of the first gas flow channel 21 of a corresponding gas supply unit among the plurality of gas supply units 14 .
- each of the plurality of fourth ends 42 a is connected to the valve 22 of a corresponding gas supply unit among the plurality of gas supply units 14 .
- the second gas flow channel 42 includes a plurality of flow channels including the plurality of fourth ends 42 a , respectively, and a common flow channel to which the plurality of flow channels are connected.
- the common flow channel of the second gas flow channel 42 includes the fifth end 42 b.
- the third gas flow channel 43 includes a sixth end 43 a and a seventh end 43 b , and extends from the sixth end 43 a to the seventh end 43 b .
- the first valve 51 is connected between the fifth end 42 b of the second gas flow channel 42 and the sixth end 43 a of the third gas flow channel 43 .
- the second valve 52 is connected to the seventh end 43 b of the third gas flow channel 43 , and is provided so as to be capable of being connected to the plurality of exhaust apparatuses 16 .
- Each of the pressure sensor 47 and the pressure sensor 48 is configured to measure a pressure within the third gas flow channel 43 .
- the temperature sensor 49 (first temperature sensor) is configured to measure a temperature within the third gas flow channel 43 .
- the flow rate measurement system 40 may have at least one of the pressure sensor 47 and the pressure sensor 48 . That is, the flow rate measurement system 40 may have one or more pressure sensors (one or more first pressure sensors) that measure a pressure within the third gas flow channel 43 .
- the flow rate measurement system 40 may further include a fourth gas flow channel 44 , a third valve 53 , and a fourth valve 54 .
- the fourth gas flow channel 44 has an eighth end 44 a , a ninth end 44 b , and a tenth end 44 c .
- the fourth gas flow channel 44 has a first partial flow channel 44 d and a second partial flow channel 44 e .
- the first partial flow channel 44 d extends between the eighth end 44 a and the ninth end 44 b .
- the second partial flow channel 44 e is branched from the first partial flow channel 44 d to extend to the tenth end 44 c .
- the above-described second valve 52 is connected between the seventh end 43 b of the third gas flow channel 43 and the eighth end 44 a of the fourth gas flow channel 44 .
- the third valve 53 is connected between the ninth end 44 b of the fourth gas flow channel 44 and each of the plurality of exhaust apparatuses 16 .
- N valves 58 are connected to the plurality of exhaust flow channels 36 , respectively.
- the third valve 53 is connected to the exhaust apparatus 16 , through the valve 58 , and the exhaust flow channel 36 i .
- the fourth valve 54 is provided on the second partial flow channel 44 e.
- the reference device 60 includes a tank 62 , a pressure sensor 63 (second pressure sensor), a temperature sensor 64 (second temperature sensor), and a valve 65 (fifth valve).
- the tank 62 provides an internal space.
- the pressure sensor 63 is configured to measure a pressure in the internal space of the tank 62 .
- the temperature sensor 64 is configured to measure a temperature in the internal space of the tank 62 .
- the valve 65 is connected to the tank 62 .
- the valve 65 is connected between the fourth valve 54 and the internal space of the tank 62 when the reference device 60 is connected to the tenth end 44 c of the fourth gas flow channel 44 .
- the reference pressure sensor 70 can be connected to the tank 62 .
- the reference device 60 may further include a valve 66 .
- the reference pressure sensor 70 may be connected to the internal space of the tank 62 through the valve 66 .
- the reference pressure sensor 70 is configured to measure a pressure in the internal space of the tank 62 when the reference pressure sensor is connected to the internal space of the tank 62 .
- the substrate processing system 10 may further include a main control unit MU.
- the main control unit MU may be a computer device including a processor such as a CPU, a storage device such as a memory, an input device such as a keyboard, a display device, and the like.
- the main control unit MU executes a control program stored in the storage device by the processor, and controls each unit of the substrate processing system 10 and each unit of the flow rate measurement system 40 in accordance with recipe data stored in the storage device.
- the method MT may be performed by controlling each unit of the substrate processing system 10 and each unit of the flow rate measurement system 40 by the main control unit MU.
- valves 22 of the plurality of gas supply units 14 other than the gas supply unit 14 i are closed.
- valves other than one valve among the plurality of valves 58 are closed.
- it is assumed that valves other than the valve 58 i among the plurality of valves 58 are closed.
- the plurality of primary valves 19 and the plurality of secondary valves 20 connected to the plurality of flow rate controllers 18 other than the flow rate controller 18 j of one gas supply unit 14 i are closed.
- the method MT includes steps ST 1 to ST 15 .
- the method MT may further include step STA in addition to steps ST 1 to ST 15 .
- the method MT may further include step STB.
- step STA calibration of the pressure sensor 47 , the pressure sensor 48 , the pressure sensor 63 , the temperature sensor 49 , and the temperature sensor 64 is performed.
- FIG. 4 is a flow diagram illustrating the detail of step STA of the method illustrated in FIG. 1 . As shown in FIG. 4 , step STA includes steps STA 1 to STA 14 .
- step STA 1 the tank 62 of the reference device 60 is connected to the tenth end 44 c of the fourth gas flow channel 44 .
- the valve 65 of the reference device 60 is connected to the tenth end 44 c of the fourth gas flow channel 44 .
- step STA 2 the reference pressure sensor 70 is connected to the internal space of the tank 62 of the reference device 60 .
- the reference pressure sensor 70 is connected to the valve 66 .
- step STA 3 the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 are evacuated.
- a primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is closed, and a secondary valve 20 j connected to the flow rate controller 18 , of the gas supply unit 14 i is opened.
- the valve 22 of the gas supply unit 14 i , the first valve 51 , the second valve 52 , the third valve 53 , the fourth valve 54 , the valve 65 , the valve 66 , and the valve 58 i are opened.
- step STA 3 the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 are connected to the exhaust apparatus 16 i and evacuated.
- a zero point of a measured value of each of the pressure sensor 47 , the pressure sensor 48 , and the pressure sensor 63 is adjusted in a state where the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 are evacuated. That is, in step STA 4 , each of the pressure sensor 47 , the pressure sensor 48 , and the pressure sensor 63 is calibrated so that the measured value thereof indicates zero.
- the primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is opened, and the third valve 53 is closed in a state where a gas is output from the flow rate controller 18 j .
- the subsequent step STA 6 the supply of a gas from the flow rate controller 18 j of the gas supply unit 14 i is stopped, and the first valve 51 is closed.
- a standby state continues until a measured value of the reference pressure sensor 70 is stabilized and a measured value of the temperature sensor 64 is stabilized. It is determined that the measured value of the reference pressure sensor 70 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value. In addition, it is determined that the measured value of the temperature sensor 64 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- step STA 6 when the measured value of the reference pressure sensor 70 is stabilized and the measured value of the temperature sensor 64 is stabilized, a state where a gas is confined in the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 which communicate with each other so that a pressure in the third gas flow channel 43 , a pressure in the fourth gas flow channel 44 , and a pressure in the internal space of the tank 62 are set to be the same pressure is formed. In such a state, the subsequent step STA 7 is executed.
- step STA 7 a measured value T ra of the temperature sensor 64 and a measured value T 1a of the temperature sensor 49 are acquired, and the measured value T ra and the measured value T 1a are compared with each other. Specifically, it is determined whether or not an absolute value of a difference between the measured value T ra and the measured value T 1a falls within a predetermined allowable range. For example, it is determined whether or not a relation of
- T THa is a numerical value which defines the predetermined allowable range. In a case where the absolute value of the difference between the measured value T ra and the measured value T 1a does not fall within the predetermined allowable range, the temperature sensor 49 is calibrated or replaced.
- a measured value group is acquired in the above-described state formed in step STA 6 .
- the measured value group acquired in step STA 8 includes a measured value P A ( 1 ) of the pressure sensor 47 , a measured value P B ( 1 ) of the pressure sensor 48 , a measured value P r ( 1 ) of the pressure sensor 63 , and a measured value P S ( 1 ) of the reference pressure sensor 70 .
- step STA 9 the second valve 52 and the valve 65 are closed, and the third valve 53 is opened.
- a gas in the fourth gas flow channel 44 is at least partially discharged by the execution of step STA 9 .
- step STA 10 the third valve 53 is closed, and the second valve 52 and the valve 65 are opened. Gases in the third gas flow channel 43 and the internal space of the tank 62 diffuse in the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 by the execution of step STA 10 .
- a standby state continues until the measured value of the reference pressure sensor 70 is stabilized. It is determined that the measured value of the reference pressure sensor 70 is stabilized in a case where the amount of fluctuation is equal to or less than a predetermined value.
- step STA 10 In a case where it is determined in step STA 10 that the measured value of the reference pressure sensor 70 is stabilized, a state where a gas is confined in the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 which communicate with each other so that a pressure in the third gas flow channel 43 , a pressure in the fourth gas flow channel 44 , and a pressure in the internal space of the tank 62 are set to be the same pressure is formed. In such a state, the subsequent step STA 11 is executed. In step STA 11 , a measured value group is acquired.
- the measured value group acquired in step STA 11 includes a measured value P A (k) of the pressure sensor 47 , a measured value P B (k) of the pressure sensor 48 , a measured value P r (k) of the pressure sensor 63 , and a measured value P S (k) of the reference pressure sensor 70 .
- k denotes a numerical value indicating the order of a cycle to be described later, and is an integer equal to or greater than 1.
- step STA 12 it is determined whether or not a stop condition is satisfied. It is determined in step STA 12 that the stop condition is satisfied in a case where the number of times of the execution of a cycle including steps STA 9 to STA 11 reaches a predetermined number of times. In a case where it is determined in step STA 12 that the stop condition is not satisfied, steps STA 9 to STA 11 are executed again. On the other hand, in a case where it is determined in step STA 12 that the stop condition is satisfied, the process proceeds to step STA 13 .
- step STA step STA 8 and the repetition of step STA 11 are executed as described above.
- a step of acquiring a measured value group is executed in each of a plurality of cycles by step STA 8 and the repetition of step STA 11 .
- a plurality of measured value groups are acquired.
- a gas confined in the fourth gas flow channel 44 in a (k ⁇ 1)-th cycle among the plurality of cycles is discharged, and gases confined in the third gas flow channel 43 and the internal space of the tank 62 in the (k ⁇ 1)-th cycle are diffused to the fourth gas flow channel 44 , so that a state where a gas is confined in the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 is formed.
- step STA 13 a pressure sensor identified from each of the plurality of measured value groups as a sensor among the pressure sensor 47 , the pressure sensor 48 , and the pressure sensor 63 which has acquired a measured value having an error that does not fall within a predetermined allowable range from the measured value of the reference pressure sensor 70 is calibrated. For example, in a case where a relation of
- the reference pressure sensor 70 is removed. Specifically, the valve 66 is closed, and the reference pressure sensor 70 is removed from the valve 66 .
- step STA the pressure sensor 47 , the pressure sensor 48 , and the pressure sensor 63 are appropriately calibrated. As a result, the accuracy of calculation of a flow rate Q to be described later is improved.
- the method MT further includes step STB.
- step STB is executed after step STA is executed.
- the reliability of a default value V 3 is verified.
- the default value V 3 is the volume of the third gas flow channel 43 , and is set in advance.
- FIG. 5 is a flow diagram illustrating the detail of step STB of the method illustrated in FIG. 1 . As shown in FIG. 5 , step STB includes steps STB 1 to STB 14 .
- step STB 1 the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 are evacuated.
- step STB 1 the primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is closed, and the secondary valve 20 j connected to the flow rate controller 18 j of the gas supply unit 14 i is opened.
- step STB 1 the valve 22 of the gas supply unit 14 i , the first valve 51 , the second valve 52 , the third valve 53 , the fourth valve 54 , the valve 65 , and the valve 58 i are opened, and the valve 66 is closed.
- step STB 1 the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 are connected to the exhaust apparatus 16 i and evacuated.
- step STB 2 the primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is opened, and the third valve 53 is closed in a state where a gas is output from the flow rate controller 18 j .
- a gas is confined in the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , the fourth gas flow channel 44 , and the internal space of the tank 62 by the execution of step STB 2 .
- step STB 3 the supply of a gas from the flow rate controller 18 j of the gas supply unit 14 i is stopped, the valve 65 is closed, and the third valve 53 is opened. A state where a gas is confined in the internal space of the tank 62 is formed by the execution of step STB 3 . In addition, gases confined in the third gas flow channel 43 and the fourth gas flow channel 44 are discharged by the execution of step STB 3 .
- the first valve 51 , the second valve 52 , and the third valve 53 are closed.
- the fourth valve 54 remains open.
- a measured value P r1 of a pressure in the internal space of the tank 62 and a measured value T r1 of temperature in the internal space of the tank 62 are acquired using the pressure sensor 63 and the temperature sensor 64 in a state where a gas is confined in the internal space of the tank 62 .
- step STB 6 the valve 65 is opened.
- a standby state continues until a measured value of the pressure sensor 63 is stabilized. It is determined that the measured value of the pressure sensor 63 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- step STB 6 when the measured value of the pressure sensor 63 is stabilized, a state where a gas confined in the internal space of the tank 62 is diffused in the internal space of the tank 62 and the fourth gas flow channel 44 is formed.
- a measured value P r2 of a pressure in the internal space of the tank 62 and a measured value T r2 of temperature in the internal space of the tank 62 are acquired using the pressure sensor 63 and the temperature sensor 64 , respectively, in the state formed in step STB 6 .
- a calculated value V 4 of the volume of the fourth gas flow channel 44 is determined.
- an arithmetic operation of the following Expression (2) is executed in order to determine the calculated value V 4 .
- an already-known volume V r of the internal space of the tank 62 the measured value P r1 , the measured value T r1 , the measured value P r2 , and the measured value T r2 are used.
- V 4 V r ⁇ ( P r1 /T r1 ⁇ P r2 /T r2 ) ⁇ T r2 /P r2 (2)
- step STB 9 the second valve 52 is opened.
- a standby state continues until the measured value of the pressure sensor 63 is stabilized. It is determined that the measured value of the pressure sensor 63 is stabilized in a case where the amount of fluctuation there is equal to or less than a predetermined value.
- step STB 9 when the measured value of the pressure sensor 63 is stabilized, a state where gases diffused in the internal space of the tank 62 and the fourth gas flow channel 44 are diffused in the internal space of the tank 62 , the third gas flow channel 43 , and the fourth gas flow channel 44 is formed.
- a measured value T 1f of temperature in the third gas flow channel 43 a measured value P r3 of a pressure in the internal space of the tank 62 , and a measured value T r3 of temperature in the internal space of the tank 62 are acquired using the temperature sensor 49 , the pressure sensor 63 , and the temperature sensor 64 , respectively, in the state formed in step STB 9 .
- a calculated value V 3C of the volume of the third gas flow channel 43 is determined.
- an arithmetic operation of the following Expression (3) is executed in order to determine the calculated value V 3C .
- the already-known volume V r of the internal space of the tank 62 , the measured value P r1 , the measured value T r1 , the calculated value V 4 , the measured value P r3 , the measured value T r3 , and the measured value T 1f are used.
- V 3C ( V r ⁇ P r1 /T r1 ⁇ V 4 ⁇ P r3 /T r3 ⁇ V r ⁇ P r3 /T r3 ) ⁇ T 1f /P r3 (3)
- an absolute value of a difference between the calculated value V 3C and the default value V 3 falls within a predetermined allowable range. For example, it is determined whether or not a relation of
- V TH is a numerical value which defines the predetermined allowable range. On the other hand, in a case where the relation of
- step S 1 B 13 is executed.
- steps STB 1 to STB 11 are repeatedly executed.
- a plurality of calculated values V 3C are acquired.
- the default value V 3 is updated using an average value of the plurality of calculated values V 3C . That is, the default value V 3 is replaced with the average value of the plurality of calculated values V 3C .
- step STB 14 After the execution of step STB 14 or in a case where it is determined in step STB 12 that the absolute value of the difference between the calculated value V 3C and the default value V 3 falls within the predetermined allowable range, the execution of step STB is terminated.
- the fourth valve 54 and the valve 65 may be closed before step STB is terminated, and then the reference device 60 may be removed from the tenth end 44 c.
- step STB the calculated value V 3C of the volume of the third gas flow channel 43 is acquired on the basis of the Boyle-Charles' law.
- the calculated value V 3C and the default value V 3 are compared with each other, and thus the reliability of the default value V 3 is verified.
- the default value V 3 is updated using the average value of the plurality of calculated values V 3C , and thus the default value V 3 with high reliability is obtained. Accordingly, the accuracy of calculation of the flow rate Q to be described later is improved.
- FIG. 6 is a timing diagram relating to the method illustrated in FIG. 1 .
- the horizontal axis represents a time.
- the vertical axis represents a measured value of the pressure of the third gas flow channel 43 , an open/close state of the secondary valve 20 j connected to the flow rate controller 18 j of the gas supply unit 14 i , an open/close state of the first valve 51 , an open/close state of the second valve 52 , and an open/close state of the third valve 53 .
- step ST 1 of the method MT the first gas flow channel 21 , the second gas flow channel 42 , and the third gas flow channel 43 are evacuated.
- step ST 1 the fourth gas flow channel 44 is also evacuated.
- the primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is closed, and the secondary valve 20 j connected to the flow rate controller 18 j of the gas supply unit 14 i is opened.
- the valve 22 of the gas supply unit 14 i , the first valve 51 , the second valve 52 , the third valve 53 , and the valve 58 i are opened.
- the fourth valve 54 is closed.
- step ST 1 the first gas flow channel 21 , the second gas flow channel 42 , the third gas flow channel 43 , and the fourth gas flow channel 44 are connected to the exhaust apparatus 16 i and evacuated.
- step ST 2 the primary valve 19 j connected to the flow rate controller 18 j of the gas supply unit 14 i is opened, and the supply of a gas from the flow rate controller 18 j is started.
- step ST 3 the secondary valve 20 j connected to the flow rate controller 18 j of the gas supply unit 14 i and the second valve 52 are closed.
- a first state where a gas output from the flow rate controller 18 j of the gas supply unit 14 i is confined between the secondary valve 20 j of the gas supply unit 14 i and the second valve 52 , that is, in the first gas flow channel 21 of the gas supply unit 14 i , the second gas flow channel 42 , and the third gas flow channel 43 is formed by the execution of step ST 3 .
- a measured value P 11 of a pressure is acquired.
- the measured value P 11 is a measured value of a pressure in the third gas flow channel 43 in the first state.
- the measured value P 11 is a measured value acquired by the pressure sensor 47 or the pressure sensor 48 .
- the measured value P 11 may be an average value between the measured value acquired by the pressure sensor 47 and the measured value acquired by the pressure sensor 48 .
- the measured value P 11 may be acquired when the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized. It is determined that the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- step ST 5 the secondary valve 20 j connected to the flow rate controller 18 j of the gas supply unit 14 i and the second valve 52 are opened.
- step ST 6 a pressure in the first gas flow channel 21 of the gas supply unit 14 i , the second gas flow channel 42 , and the third gas flow channel 43 is increased.
- step ST 6 the second valve 52 is closed. That is, in step ST 6 , a second state where a gas is supplied to the first gas flow channel 21 of the gas supply unit 14 i , the second gas flow channel 42 , and the third gas flow channel 43 from the flow rate controller 18 j of the gas supply unit 14 i , and the second valve 52 is closed is formed. In the second state, a pressure in the first gas flow channel 21 of the gas supply unit 14 i , the second gas flow channel 42 , and the third gas flow channel 43 rises.
- step ST 7 the secondary valve 20 1 connected to the flow rate controller 18 j of the gas supply unit 14 i and the second valve 52 are closed. As a result of the execution of step ST 7 , a third state is formed.
- a measured value P 12 and a measured value T 12 are acquired.
- the measured value P 12 is a measured value of a pressure in the third gas flow channel 43 in the third state.
- the measured value P 12 is a measured value acquired by the pressure sensor 47 or the pressure sensor 48 .
- the measured value P 12 may be an average value between the measured value acquired by the pressure sensor 47 and the measured value acquired by the pressure sensor 48 .
- the measured value T 12 is a measured value of a temperature in the third gas flow channel 43 in the third state.
- the measured value T 12 is a measured value acquired by the temperature sensor 49 .
- the measured value P 12 and the measured value T 12 may be acquired when the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized and the measured value acquired by the temperature sensor 49 is stabilized. It is determined that the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value. In addition, it is determined that the measured value acquired by the temperature sensor 49 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- the first valve 51 and the third valve 53 are closed.
- the second valve 52 is opened. That is, in step ST 10 , the second valve 52 is opened and the first valve 51 is closed, so that a fourth state is formed from the third state.
- a gas in the third gas flow channel 43 is at least partially discharged.
- the gas in the third gas flow channel 43 is partially discharged to the fourth gas flow channel 44 .
- the gas in the third gas flow channel 43 may be completely discharged through the fourth gas flow channel 44 .
- step ST 11 the second valve 52 is closed, so that a fifth state is formed from the fourth state.
- the gas in the third gas flow channel 43 is partially discharged in the above-described fourth state, so that a pressure in the third gas flow channel 43 in the fifth state may be set to be higher than a pressure in the evacuated third gas flow channel 43 .
- the fifth state is formed by a gas confined in the third gas flow channel 43 being partially discharged in the third state, that is, without being completely discharged. Therefore, a time length required for forming the fifth state from the third state is shortened.
- step 11 a for opening the third valve 53 is added after step ST 11 and steps ST 9 to ST 11 a are repeated, so that a pressure in the third gas flow channel 43 may be reduced.
- a measured value P 13 of a pressure is acquired.
- the measured value P 13 is a measured value of a pressure in the third gas flow channel 43 in the fifth state.
- the measured value P 13 is a measured value acquired by the pressure sensor 47 or the pressure sensor 48 .
- the measured value P 13 may be an average value between the measured value acquired by the pressure sensor 47 and the measured value acquired by the pressure sensor 48 .
- the measured value P 13 may be acquired when the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized. It is determined that the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- a measured value P 14 of pressure is acquired.
- the measured value P 14 is a measured value of a pressure in the third gas flow channel 43 in the sixth state.
- the measured value P 14 is a measured value acquired by the pressure sensor 47 or the pressure sensor 48 .
- the measured value P 14 may be an average value between the measured value acquired by the pressure sensor 47 and the measured value acquired by the pressure sensor 48 .
- the measured value P 14 may be acquired when the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized. It is determined that the measured value acquired by the pressure sensor 47 and/or the pressure sensor 48 is stabilized in a case where the amount of fluctuation thereof is equal to or less than a predetermined value.
- the flow rate Q is determined.
- the flow rate Q is a flow rate of a gas output from the flow rate controller 18 j of the gas supply unit 14 1 in the second state.
- an arithmetic operation of the following Expression (1) is executed in order to determine the flow rate Q.
- Q ( P 12 ⁇ P 11 )/ ⁇ t ⁇ (1/ R ) ⁇ ( V/T ) (1)
- ⁇ t denotes a time length of an execution period of step ST 6
- R denotes a gas constant
- (V/T) includes ⁇ V 3 /T 12 ⁇ (P 12 ⁇ P 13 )/(P 12 ⁇ P 14 ) ⁇ .
- a specific arithmetic operation of step ST 15 is an arithmetic operation of the following Expression (1a).
- Q ( P 12 ⁇ P 11 )/ ⁇ t ⁇ (1/ R ) ⁇ V st /T st +V 3 /T 12 ⁇ ( P 12 ⁇ P 13 )/( P 12 ⁇ P 14 ) ⁇ (1a)
- V st denotes the volume of a flow channel between an orifice member of the flow rate controller 18 j of the gas supply unit 14 i and the valve of the secondary valve 20 j , and is a design value which is set in advance.
- T st denotes a temperature in the flow channel between the orifice member of the flow rate controller 18 j of the gas supply unit 14 i and the valve of the secondary valve 20 j , and is acquired by a temperature sensor of the flow rate controller 18 j .
- T st may be a temperature to be acquired in the third state.
- (V st /T st ) may be omitted.
- a pressure rise is caused by supplying a gas from one flow rate controller 18 j of one gas supply unit 14 i to the first gas flow channel 21 of the gas supply unit 14 i , the second gas flow channel 42 , and the third gas flow channel 43 in a state where the second valve 52 is closed.
- the rate of this pressure rise that is, the rate of rise in pressure is used in Expression (1), so that a flow rate of a gas output from the flow rate controller 18 j is determined.
- V/T should include a sum of (V E /T E ) and (V 3 /T 12 ). That is, the arithmetic operation of Expression (1) should be the following Expression (1b).
- Q ( P 12 ⁇ P 11 ) ⁇ t ⁇ (1/ R ) ⁇ ( V st /T st +V E /T E +V 3 /T 12 ) (1b)
- V E denotes the sum of the volume of the first gas flow channel 21 of the gas supply unit 14 i and the volume of the second gas flow channel 42
- T E denotes temperature in the first gas flow channel 21 of the gas supply unit 14 i and the second gas flow channel 42 in the third state.
- V 3 /T 12 ⁇ (P 12 ⁇ T 13 )/(P 12 ⁇ P 14 ) can be used instead of the sum of (V E /T E ) and (V 3 /T 12 ).
- the first gas flow channel 21 is disposed inside the housing 17 , a temperature in the first gas flow channel 21 is less influenced by the surrounding environment.
- the third gas flow channel 43 is connected to the first gas flow channel 21 through the second gas flow channel 42 , the third gas flow channel may be disposed in a region away from the plurality of chamber bodies 12 . Therefore, a temperature in the third gas flow channel 43 is less influenced by the plurality of chamber bodies 12 .
- the second gas flow channel 42 may be influenced by the surrounding environment, for example, the temperature of any of the plurality of chamber bodies 12 .
- V 3 /T 12 ⁇ (P 12 ⁇ P 13 )/(P 12 ⁇ P 14 ) is used in Expression (1) instead of the sum of (V E /T E ) and (V 3 /T 12 ). That is, in the method MT, it is possible to use a measured value acquired from a location which is not likely to be influenced by temperature from the surrounding environment in the calculation of the flow rate Q. Therefore, according to the method MT, it is possible to determine the flow rate Q with a high degree of accuracy.
- a sixth state is formed by diffusing gases confined in the first gas flow channel 21 and the second gas flow channel 42 in the third state to the third gas flow channel 43 , and a measured value P 14 is acquired in the sixth state. That is, a gas used for forming a state during the acquisition of the measured value P 12 is reused for forming a state during the acquisition of the measured value P 14 . Therefore, it is possible to efficiently determine the flow rate Q.
- the flow rate Q may be determined for all of the flow rate controllers 18 of the gas supply unit 14 i .
- the method MT may be executed in order for all of the plurality of gas supply units 14 .
- a pressure in each gas flow channel of a gas output from the flow rate controller 18 1 of the gas supply unit 14 N+1 is set to be a pressure lower than saturated vapor pressure of the gas.
- the pressure of the gas which is set to be pressure lower than the saturated vapor pressure may be the pressure of a single gas in a case where a gas generated by the vaporization of liquid is used as a single gas.
- the pressure of the gas which is set to be pressure lower than the saturated vapor pressure is partial pressure of the gas generated by the vaporization of liquid.
- a substrate processing system in a modified embodiment may not include the gas supply unit 14 N+1 .
Abstract
Description
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (1)
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (1)
-
- In Expression (1), Δt is a time length of an execution period of the raising a pressure, R is a gas constant, (V/T) includes {V3/T12×(P12−P13)/(P12−P14)}, and V3 is a default value of a volume of the third gas flow channel.
V 4 =V r×(P r1 /T r1 −P r2 /T r2)×T r2 /P r2 (2)
V 3C=(V r ×P r1 /T r1 −V 4 ×P r3 /T r3 −V r ×P r3 /T r3)×T 1f /P r3 (3)
V 4 =V r×(P r1 /T r1 −P r2 /T r2)×T r2 /P r2 (2)
V 3C=(V r ×P r1 /T r1 −V 4 ×P r3 /T r3 −V r ×P r3 /T r3)×T 1f /P r3 (3)
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (1)
Q=(P 12 −P 11)/Δt×(1/R)×{V st /T st +V 3 /T 12×(P 12 −P 13)/(P 12 −P 14)} (1a)
Q=(P 12 −P 11)Δt×(1/R)×(V st /T st +V E /T E +V 3 /T 12) (1b)
P 12 ×V E /T E +P 13 ×V 3 /T 12 =P 14 ×V E /T E +P 14 ×V 3 /T 12 (4)
V E /T E +V 3 /T 12 =V 3 /T 12 +V 3 /T 12×(P 14 −P 13)/(P 12 −P 14)=V 3 /T 12×(P 12 −P 13)/(P 12 −P 14) (5)
Claims (9)
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (1)
V 4 =V r×(P r1 /T r1 −P r2 /T r2)×T r2 /P r2 (2)
V 3C=(V r ×P r1 /T r1 −V 4 ×P r3 /T r3 −V r ×P r3 /T r3)×T 1f /P r3 (3)
V 4 =V r×(P r1 /T r1 −P r2 /T r2)×T r2 /P r2 (E1)
V 3C=(V r ×P r1 /T r1 −V 4 ×P r3 /T r3 −V r ×P r3 /T r3)×T 1f /P r3 (E2)
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (E3)
V 4 =V rλ(P r1 /T r1 −P r2 /T r2)λT r2 /P r2 (E1)
V 3C=(V r ×P r1 /T r1 −V 4 ×P r3 /T r3 −V r ×P r3 /T r3)×T 1f /P r3 (E2)
Q=(P 12 −P 11)/Δt×(1/R)×(V/T) (E3)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-001420 | 2018-01-09 | ||
JP2018001420A JP6956014B2 (en) | 2018-01-09 | 2018-01-09 | How to find the gas flow rate |
Publications (2)
Publication Number | Publication Date |
---|---|
US20190212176A1 US20190212176A1 (en) | 2019-07-11 |
US10876870B2 true US10876870B2 (en) | 2020-12-29 |
Family
ID=67140614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/238,834 Active 2039-03-21 US10876870B2 (en) | 2018-01-09 | 2019-01-03 | Method of determining flow rate of a gas in a substrate processing system |
Country Status (6)
Country | Link |
---|---|
US (1) | US10876870B2 (en) |
JP (1) | JP6956014B2 (en) |
KR (1) | KR102613325B1 (en) |
CN (1) | CN110017877B (en) |
SG (1) | SG10201900046YA (en) |
TW (1) | TWI787427B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4249889A1 (en) | 2022-03-23 | 2023-09-27 | Nebulum Technologies Co., Ltd. | Methods for preparing and analyzing biopsies and biological samples |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10218524B2 (en) | 2013-09-17 | 2019-02-26 | Cisco Technology, Inc. | Bit indexed explicit replication for layer 2 networking |
US9806897B2 (en) | 2013-09-17 | 2017-10-31 | Cisco Technology, Inc. | Bit indexed explicit replication forwarding optimization |
US10225090B2 (en) | 2013-09-17 | 2019-03-05 | Cisco Technology, Inc. | Bit indexed explicit replication using multiprotocol label switching |
US10341221B2 (en) | 2015-02-26 | 2019-07-02 | Cisco Technology, Inc. | Traffic engineering for bit indexed explicit replication |
US10447496B2 (en) | 2017-03-30 | 2019-10-15 | Cisco Technology, Inc. | Multicast traffic steering using tree identity in bit indexed explicit replication (BIER) |
US10164794B2 (en) | 2017-04-28 | 2018-12-25 | Cisco Technology, Inc. | Bridging of non-capable subnetworks in bit indexed explicit replication |
JP7042134B2 (en) * | 2018-03-29 | 2022-03-25 | 東京エレクトロン株式会社 | Substrate processing system and method for determining the flow rate of gas |
US10760944B2 (en) * | 2018-08-07 | 2020-09-01 | Lam Research Corporation | Hybrid flow metrology for improved chamber matching |
JP7175210B2 (en) * | 2019-02-04 | 2022-11-18 | 東京エレクトロン株式会社 | Exhaust device, treatment system and treatment method |
JP2022547969A (en) * | 2019-09-11 | 2022-11-16 | ラム リサーチ コーポレーション | Flow meter calibration for improved matching of process chambers in substrate processing systems |
JP7411479B2 (en) | 2020-03-31 | 2024-01-11 | 東京エレクトロン株式会社 | How to calibrate multiple chamber pressure sensors |
JP2023018337A (en) | 2021-07-27 | 2023-02-08 | 東京エレクトロン株式会社 | Substrate processing system and substrate processing method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012032983A (en) | 2010-07-30 | 2012-02-16 | Fujikin Inc | Calibration method of flow rate controller for gas supply device and flow rate measuring method |
US20180299908A1 (en) * | 2017-04-18 | 2018-10-18 | Tokyo Electron Limited | Method of obtaining output flow rate of flow rate controller and method of processing workpiece |
US20190063987A1 (en) * | 2017-08-31 | 2019-02-28 | Tokyo Electron Limited | Method of inspecting flow rate measuring system |
US20190301912A1 (en) * | 2018-03-29 | 2019-10-03 | Tokyo Electron Limited | Substrate processing system and method of determining flow rate of gas |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100501343C (en) * | 2004-03-31 | 2009-06-17 | 高砂热学工业株式会社 | Energy metering method |
US7376520B2 (en) * | 2005-03-16 | 2008-05-20 | Lam Research Corporation | System and method for gas flow verification |
EP1884751A1 (en) * | 2006-08-01 | 2008-02-06 | N & P Gas | System and method for processing data related to a volumetric flow rate |
JP5703032B2 (en) * | 2011-01-06 | 2015-04-15 | 株式会社フジキン | Flow rate measuring method of flow controller for gas supply device |
JP2015114966A (en) * | 2013-12-13 | 2015-06-22 | アドバンス電気工業株式会社 | Flow control valve and flow controller using the same |
JP6600568B2 (en) * | 2015-09-16 | 2019-10-30 | 東京エレクトロン株式会社 | How to find the output flow rate of the flow controller |
US10031007B2 (en) * | 2015-09-16 | 2018-07-24 | Tokyo Electron Limited | Method of calculating output flow rate of flow rate controller |
JP6366021B2 (en) * | 2015-12-24 | 2018-08-01 | パナソニックIpマネジメント株式会社 | Flow measuring device |
JP6754648B2 (en) * | 2016-09-15 | 2020-09-16 | 東京エレクトロン株式会社 | Inspection method of gas supply system, calibration method of flow controller, and calibration method of secondary reference device |
-
2018
- 2018-01-09 JP JP2018001420A patent/JP6956014B2/en active Active
-
2019
- 2019-01-02 CN CN201910001569.2A patent/CN110017877B/en active Active
- 2019-01-03 US US16/238,834 patent/US10876870B2/en active Active
- 2019-01-03 SG SG10201900046YA patent/SG10201900046YA/en unknown
- 2019-01-03 TW TW108100158A patent/TWI787427B/en active
- 2019-01-04 KR KR1020190000990A patent/KR102613325B1/en active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012032983A (en) | 2010-07-30 | 2012-02-16 | Fujikin Inc | Calibration method of flow rate controller for gas supply device and flow rate measuring method |
US20180299908A1 (en) * | 2017-04-18 | 2018-10-18 | Tokyo Electron Limited | Method of obtaining output flow rate of flow rate controller and method of processing workpiece |
US20190063987A1 (en) * | 2017-08-31 | 2019-02-28 | Tokyo Electron Limited | Method of inspecting flow rate measuring system |
US20190301912A1 (en) * | 2018-03-29 | 2019-10-03 | Tokyo Electron Limited | Substrate processing system and method of determining flow rate of gas |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4249889A1 (en) | 2022-03-23 | 2023-09-27 | Nebulum Technologies Co., Ltd. | Methods for preparing and analyzing biopsies and biological samples |
Also Published As
Publication number | Publication date |
---|---|
KR102613325B1 (en) | 2023-12-14 |
CN110017877A (en) | 2019-07-16 |
SG10201900046YA (en) | 2019-08-27 |
JP6956014B2 (en) | 2021-10-27 |
KR20190084873A (en) | 2019-07-17 |
TWI787427B (en) | 2022-12-21 |
CN110017877B (en) | 2021-01-12 |
US20190212176A1 (en) | 2019-07-11 |
JP2019120617A (en) | 2019-07-22 |
TW201930833A (en) | 2019-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10876870B2 (en) | Method of determining flow rate of a gas in a substrate processing system | |
US10871786B2 (en) | Substrate processing system and method of determining flow rate of gas | |
US10859426B2 (en) | Method of inspecting flow rate measuring system | |
US10705545B2 (en) | Fluid control device and flow rate ratio control device | |
US10316835B2 (en) | Method of determining output flow rate of gas output by flow rate controller of substrate processing apparatus | |
KR20180100203A (en) | Flow control device, flow rate calibration method of flow control device, flow measurement device and flow measurement method using flow measurement device | |
CN109791099B (en) | Concentration detection method and pressure type flow rate control device | |
CN110571171A (en) | Calibration method and calibration system of gas flow controller and gas inlet device | |
US11555755B2 (en) | Method of calibrating multiple chamber pressure sensors | |
US11585717B2 (en) | Method for calibrating plurality of chamber pressure sensors and substrate processing system | |
US11326914B2 (en) | Flow rate measurement apparatus and method for more accurately measuring gas flow to a substrate processing system | |
US11899476B2 (en) | Method and apparatus for measuring gas flow | |
US10090178B2 (en) | Gas temperature measurement method and gas introduction system | |
KR102501874B1 (en) | Fluid characteristics measurement system, computer-readable storage medium storing computer program for fluid characteristics measurement system, and fluid characteristics measurement method | |
JP2023540790A (en) | Anti-fragile system for semiconductor processing equipment using multiple specialized sensors and algorithms |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
AS | Assignment |
Owner name: TOKYO ELECTRON LIMITED, JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:MIYOSHI, RISAKO;AMIKURA, NORIHIKO;MIURA, KAZUYUKI;AND OTHERS;SIGNING DATES FROM 20181214 TO 20190105;REEL/FRAME:048224/0273 |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |