TWM638560U - Wafer sucking device - Google Patents
Wafer sucking device Download PDFInfo
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- TWM638560U TWM638560U TW111210949U TW111210949U TWM638560U TW M638560 U TWM638560 U TW M638560U TW 111210949 U TW111210949 U TW 111210949U TW 111210949 U TW111210949 U TW 111210949U TW M638560 U TWM638560 U TW M638560U
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- ring
- cover
- wafer
- top surface
- base
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- 238000001179 sorption measurement Methods 0.000 claims abstract description 8
- 238000007664 blowing Methods 0.000 abstract description 4
- 230000003749 cleanliness Effects 0.000 abstract description 3
- 239000000428 dust Substances 0.000 abstract description 3
- 235000012431 wafers Nutrition 0.000 description 42
- 238000000034 method Methods 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
本新型係一種晶圓吸附裝置,其包含一底座,底座貫穿有一進氣孔;一導流環,其包含一環體及複數止滑塊,各止滑塊間隔凸設於環體的頂面,導流環設置於底座上;一導流蓋,其一側面內凹形成有複數流道,各流道的一端相連接,各流道的另一端朝向外側延伸且各流道為弧狀,導流蓋設置於導流環的環體內並固設於底座,各流道的一端與進氣孔相連通,導流蓋與導流環之間保持一間距;藉此當放置晶圓時,可達到降低與晶圓的接觸面,以減少晶圓磨損的機率,且利用吹氣之方式可進一步減少灰塵沾附於晶圓上,以保持晶圓之潔淨度。The present invention is a wafer adsorption device, which comprises a base with an air intake hole running through the base; a guide ring, which comprises a ring body and a plurality of anti-sliding blocks, and each anti-sliding block is protruded on the top surface of the ring body at intervals. The diversion ring is arranged on the base; a diversion cover, one side of which is concaved to form a plurality of flow channels, one end of each flow channel is connected, the other end of each flow channel extends outward and each flow channel is arc-shaped, and the guide The flow cover is set in the ring body of the flow guide ring and fixed on the base, one end of each flow channel is connected with the air inlet, and a distance is kept between the flow guide cover and the flow guide ring; thereby, when placing the wafer, it can To reduce the contact surface with the wafer to reduce the chance of wafer wear, and the use of air blowing can further reduce dust adhesion on the wafer to maintain the cleanliness of the wafer.
Description
本新型係涉及一種晶圓吸附裝置,尤指一種利用吹氣方式使得晶圓可定位於其上之晶圓吸附裝置。The present invention relates to a wafer adsorption device, in particular to a wafer adsorption device which utilizes air blowing to position wafers thereon.
現有技術於半導體的濕式製程中,其中有一步驟是對晶背進行清洗作業,而清洗晶背時,需先將晶圓定位於一吸附盤上,而吸附盤是利用其頂面形成有複數吸氣孔,以吸氣孔的吸附力將晶圓吸附於其上,再旋轉吸附盤帶動晶圓轉動,於晶圓旋轉的過程中以清洗液噴灑於晶圓表面進行清洗作業。In the prior art, in the wet manufacturing process of semiconductors, one of the steps is to clean the crystal back, and when cleaning the crystal back, the wafer needs to be positioned on a suction plate first, and the suction plate is formed with a plurality of The suction hole, the wafer is adsorbed on it by the suction force of the suction hole, and then the suction plate is rotated to drive the wafer to rotate, and the cleaning solution is sprayed on the surface of the wafer during the rotation of the wafer to perform cleaning operations.
然而,現有技術之吸附盤因為採用吸氣方式,故除了需形成有一定數量之吸附孔外,其與晶圓之接觸面亦需有一定之面積才能保持穩定,但與晶圓接觸面積越多時,尤其在動態旋轉的過程中,如果晶圓產生滑移現象,刮傷晶圓之機率更顯提升,如此將造成產品良率的下降;因此,現有技術的吸附盤,其整體構造存在有如前述的問題及缺點,實有待加以改良。However, because the suction plate in the prior art adopts the air suction method, in addition to forming a certain number of adsorption holes, the contact surface with the wafer also needs a certain area to maintain stability, but the more the contact area with the wafer When, especially in the process of dynamic rotation, if the wafer slips, the probability of scratching the wafer will increase, which will cause a decline in product yield; therefore, the overall structure of the suction plate in the prior art exists as The aforementioned problems and shortcomings need to be improved.
有鑒於現有技術的不足,本新型提供一種晶圓吸附裝置,其藉由於底座上設置導流環及導流蓋,達到可形成旋轉氣流並朝向晶圓吹氣使晶圓固定於其上之目的。In view of the deficiencies in the prior art, the present invention provides a wafer adsorption device, which can form a swirling air flow and blow air toward the wafer to fix the wafer on it by setting a guide ring and a guide cover on the base .
為達上述之新型目的,本新型所採用的技術手段為設計一種晶圓吸附裝置,其包含: 一底座,其貫穿有一進氣孔; 一導流環,其包含一環體及複數止滑塊,該環體為一中空體且具有一環頂面、一環底面及一環內側面,該環內側面位於該環頂面及該環底面之間,各該止滑塊間隔凸設於該環頂面,該導流環以該環底面設置於該底座上; 一導流蓋,其包含一蓋頂面、一蓋底面及一蓋環外側面,該蓋環外側面位於該蓋頂面及該蓋底面之間,該蓋底面內凹形成有複數流道,各該流道的一端相連接,各該流道的另一端朝向外側延伸並形成一開口,各該流道為弧狀,該導流蓋設置於該導流環的該環體內,並以該蓋底面固設於該底座,各該流道的一端與該進氣孔相連通,該蓋環外側面為弧面且與該環內側面保持一間距。 In order to achieve the above-mentioned new purpose, the technical means adopted in this new model is to design a wafer adsorption device, which includes: a base, which runs through an air inlet; A guide ring, which includes a ring body and a plurality of anti-sliding blocks, the ring body is a hollow body and has a ring top surface, a ring bottom surface and a ring inner surface, the ring inner surface is located between the ring top surface and the ring bottom surface , each of the anti-sliding blocks is protrudingly arranged on the top surface of the ring at intervals, and the guide ring is arranged on the base with the bottom surface of the ring; A diversion cover, which includes a cover top surface, a cover bottom surface and a cover ring outer surface, the cover ring outer surface is located between the cover top surface and the cover bottom surface, and the cover bottom surface is concavely formed with a plurality of flow channels, One end of each of the flow channels is connected, the other end of each of the flow channels extends outward and forms an opening, each of the flow channels is arc-shaped, the diversion cover is arranged in the ring body of the diversion ring, and the The bottom surface of the cover is fixed on the base, one end of each of the flow channels communicates with the air inlet, and the outer surface of the cover ring is arc-shaped and maintains a distance from the inner surface of the ring.
進一步而言,所述之晶圓吸附裝置,其中該環內側面為弧面,該環內側面與該蓋環外側面相互平行。Further, in the wafer suction device, the inner surface of the ring is an arc surface, and the inner surface of the ring and the outer surface of the cover ring are parallel to each other.
進一步而言,所述之晶圓吸附裝置,其中該環頂面鄰近於外緣的一端形成有一環斜面,該環斜面朝向外側方向向上傾斜。Furthermore, in the above-mentioned wafer adsorption device, a ring slope is formed on the top surface of the ring adjacent to the outer edge, and the ring slope slopes upward toward the outside.
進一步而言,所述之晶圓吸附裝置,其中各該止滑塊由該環頂面的表面向上突出一高度。Furthermore, in the wafer suction device, each of the anti-sliding blocks protrudes upward from the top surface of the ring by a certain height.
本新型的優點在於,可達到降低晶圓與本新型的接觸面積,以減少晶圓因為滑移而導致磨損的機率,且利用吹氣之方式可進一步減少灰塵沾附於晶圓上,以保持晶圓之潔淨度。The advantage of the new model is that it can reduce the contact area between the wafer and the new model, so as to reduce the chance of the wafer being worn due to slipping, and the use of air blowing can further reduce the dust from adhering to the wafer, so as to maintain Wafer cleanliness.
以下配合圖式以及本新型之較佳實施例,進一步闡述本新型為達成預定新型目的所採取的技術手段。In the following, in conjunction with the drawings and preferred embodiments of the present invention, the technical means adopted by the present invention for achieving the intended purpose of the new model will be further described.
請參閱圖1及圖2所示,本新型之晶圓吸附裝置,其包含一底座10、一導流環20及一導流蓋30。Please refer to FIG. 1 and FIG. 2 , the wafer suction device of the present invention includes a
底座10為圓形片體,其貫穿有一進氣孔11、複數內座孔12及複數外座孔13,該進氣孔11位於中央位置,各內座孔12及各外座孔13環繞間隔排列於進氣孔11周圍,但不以此為限,底座10之形式可依使用者需求作改變。The
請參閱圖2及圖4所示,導流環20包含一環體21及複數止滑塊22,環體21為一中空體,其具有一環頂面211、一環底面212及一環內側面213,環內側面213位於環頂面211及環底面212之間,各止滑塊22間隔凸設於環頂面211,各止滑塊22由環頂面211的表面向上突出一高度,導流環20藉由複數鎖固件穿設於各外座孔13鎖固於環底面212,將導流環20固定於底座10上,在本實施例中,環內側面213為弧面,其自環底面212朝向環頂面211的方向向外傾斜,即如同一喇叭口之形狀,環頂面211鄰近於外緣的一端形成有一環斜面214,環斜面214朝向外側方向向上傾斜,但不以此為限,導流環20之形式可依使用者需求作改變。2 and 4, the
請參閱圖2至圖4所示,導流蓋30包含一蓋頂面31、一蓋底面32及一蓋環外側面33,蓋環外側面33位於蓋頂面31及蓋底面32之間,蓋底面32內凹形成有複數流道34,各流道34的一端相連接形成一匯流區35,各流道34的另一端朝向外側延伸並形成一出口36,在本實施例中,各流道34為弧狀且較佳的數量為三個,各流道34彎曲的方向相同,前述所指彎曲的方向即正視各流道34各出口36皆朝向逆時針方向的一側傾斜,但不以此為限,各流道34之數量及形式可依使用者需求作改變,導流蓋30設置於導流環20的環體21內,以複數鎖固件穿設於各內座孔12並鎖固於蓋底面32,將導流蓋30固定於底座10,位於各流道34一端的匯流區35與進氣孔11相連通,蓋環外側面33為弧面,蓋環外側面33與環內側面213相互平行且保持一間距,從上方視之導流蓋30與導流環20之間形成一環狀出氣孔,蓋環外側面33與環內側面213之間形成一旋流區37。Please refer to FIG. 2 to FIG. 4, the
本新型使用時,請參閱圖2及圖5所示,可配合一晶圓40實施,晶圓40放置於各止滑塊22上,底座10連接一外部供氣裝置(圖式中未示),外部供氣裝置將氣體自進氣孔11輸入,氣體流向匯流區35後,將發散自各流道34並從各出口36流出,而因為各出口36為斜向口,故位於旋流區37之氣體將沿著同方向流動形成旋轉氣流並向上吹出,而當氣體撞擊到晶圓40時,則會沿著晶圓40的底面朝向外側方向自環斜面214流出,而因為晶圓40下方的氣體流速較晶圓40上方之氣體流速快,故位於晶圓40上方之氣體壓力大於晶圓40下方之氣體壓力,使得晶圓40可定位於各止滑塊22上如同懸浮狀態,藉此相較於現有技術可達到降低晶圓40的接觸面,以減少晶圓40磨損的機率,且利用吹氣之方式可進一步減少灰塵沾附於晶圓40上,以保持晶圓40之潔淨度。When the present invention is used, please refer to Fig. 2 and Fig. 5, it can be implemented with a
前述過程中,由於環斜面214可導引氣體往上方方向移動,故氣體可直接推抵晶圓40的底面進一步提供支撐力,藉此使得晶圓40的受力較為平均,提升晶圓40定位之穩定度及減少晶圓40產生形變之功效。In the aforementioned process, since the
以上所述僅是本創作之較佳實施例而已,並非對本創作做任何形式上的限制,雖然本創作已以較佳實施例揭露如上,然而並非用以限定本創作,任何所屬技術領域中具有通常知識者,在不脫離本創作技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾作為等同變化的等效實施例,但凡是未脫離本創作技術方案的內容,依據本創作的技術實質對以上實施例所做的任何簡單修改、等同變化與修飾,均仍屬於本創作技術方案的範圍內。The above description is only a preferred embodiment of this creation, and does not impose any formal restrictions on this creation. Although this creation has been disclosed as above with a preferred embodiment, it is not used to limit this creation. Anyone in the technical field has Ordinary knowledgeable persons, without departing from the scope of this creative technical solution, may use the technical content disclosed above to make some changes or modifications as equivalent embodiments of equivalent changes, but any content that does not deviate from this creative technical solution, according to this Any simple modifications, equivalent changes and modifications made to the above embodiments by the technical essence of the creation still belong to the scope of the technical solution of the creation.
10:底座 11:進氣孔 12:內座孔 13:外座孔 20:導流環 21:環體 211:環頂面 212:環底面 213:環內側面 214:環斜面 22:止滑塊 30:導流蓋 31:蓋頂面 32:蓋底面 33:蓋環外側面 34:流道 35:匯流區 36:出口 37:旋流區 40:晶圓10: Base 11: air intake 12: Inner seat hole 13: Outer seat hole 20: guide ring 21: ring body 211: ring top surface 212: ring bottom 213: inner side of the ring 214: ring bevel 22: Stop slider 30: diversion cover 31: cover top surface 32: cover bottom surface 33: Outer side of cover ring 34: Runner 35: Confluence area 36: export 37: Swirl zone 40: Wafer
圖1係本新型之立體外觀圖。 圖2係本新型之分解圖。 圖3係本新型之導流蓋下視圖。 圖4係本新型之局部剖面圖。 圖5係本新型之剖面圖。 Fig. 1 is the perspective view of the new model. Fig. 2 is an exploded view of the new model. Fig. 3 is the bottom view of the diversion cover of the present invention. Fig. 4 is a partial sectional view of the present model. Fig. 5 is the sectional view of the present model.
20:導流環 20: guide ring
21:環體 21: ring body
211:環頂面 211: ring top surface
214:環斜面 214: ring bevel
22:止滑塊 22: Stop slider
30:導流蓋 30: diversion cover
31:蓋頂面 31: cover top surface
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111210949U TWM638560U (en) | 2022-10-06 | 2022-10-06 | Wafer sucking device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111210949U TWM638560U (en) | 2022-10-06 | 2022-10-06 | Wafer sucking device |
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| Publication Number | Publication Date |
|---|---|
| TWM638560U true TWM638560U (en) | 2023-03-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111210949U TWM638560U (en) | 2022-10-06 | 2022-10-06 | Wafer sucking device |
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| Country | Link |
|---|---|
| TW (1) | TWM638560U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI840988B (en) * | 2022-10-06 | 2024-05-01 | 盛詮科技股份有限公司 | Wafer adsorption device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI840988B (en) * | 2022-10-06 | 2024-05-01 | 盛詮科技股份有限公司 | Wafer adsorption device |
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