TWM638420U - Testing device for electronic products - Google Patents

Abstract

A testing device for electronic products includes a test platform and an aligning mechanism. The test platform includes a support frame and a connector located at the top of the support frame. The aligning mechanism includes a bracket, a probe assembly and a board fixture. The bracket is mounted on the top of the support frame. The board fixture is movably located on the bracket for sandwiching the probe assembly therebetween and exposing the probes of the probe assembly. The lifting device is installed on the bracket and fixedly connected to the board fixture for lifting the board fixture. Therefore, when the lifting device vertically descends the board fixture, the probes of the probe assembly can be vertically inserted into and electrically connected to these probe holes of the connector.

Description

Electronic product testing device

The invention relates to a test device, especially a test device capable of vertically lifting a probe card.

Generally speaking, an existing large-scale test machine includes a test bed and a large probe card located above the test bed. Several electronic products are installed in the test bench. Therefore, the probes of the large probe card are inserted downwards into all pinholes in the test bench to ensure that the large probe card can perform electrical testing on all electronic products in the test bench. Instead, the large probe card must be lifted vertically from the test bench so that the probes can respectively and simultaneously exit the pinholes for removal of the large probe card.

However, since all the probes of the large probe card are quite delicate, and the large probe card has a specific weight, there is a risk of probe damage if the operator manually inserts and removes the large probe card above the test bench. .

This shows that the above-mentioned technology obviously still has inconvenience and defective, and needs to be further improved. Therefore, how to effectively solve the above-mentioned inconveniences and defects is one of the current important research and development issues, and has become an urgent need for improvement in related fields.

One purpose of the present invention is to provide an electronic product testing device to solve the above mentioned difficulties in the prior art.

According to an embodiment of the invention, the invention provides an electronic product testing device. The test device includes a test platform and a positioning mechanism. The test bench includes a support frame, at least one test slot and at least one first connector. The test slot is fixed on the supporting frame and is used for accommodating at least one device to be tested. The first connector is located on the top of the supporting frame and includes a plurality of probe holes, and these probe holes are respectively electrically connected to the device under test. The alignment mechanism includes a frame, a probe card, a board holding fixture and a lifting device. The frame is removably mounted on top of the support frame. The probe card has at least one second connector, and the second connector includes a plurality of probes. The board-holding fixture is located on the frame in a liftable manner, and includes an upper splint and a lower splint. The lower clamping plate has at least one opening, the upper clamping plate and the lower clamping plate clamp the probe card therein, and the probes are exposed through the opening. The lifting device is installed on the frame, fixedly connected with the plate holding jig, and used for lifting the plate holding jig. Therefore, the lifting device vertically lowers the board holding jig so that the probes can be vertically inserted and electrically connected to the probe holes.

In this way, through the structures described in the above embodiments, the probe card can be vertically lifted, so that all probes can be smoothly inserted vertically and electrically connected to the probe holes, so that the subsequent test procedures of the test machine can be executed, reducing Risk of damaging the probe.

The above description is only used to explain the problem to be solved by this creation, the technical means to solve the problem, and its effects, etc. The specific details of this creation will be introduced in detail in the following implementation methods and related drawings.

A plurality of embodiments of the invention will be disclosed with diagrams below. For the sake of clarity, many practical details will be described together in the following description. However, it should be understood that these practical details should not be used to limit the present invention. That is, in the various embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some commonly used structures and components will be shown in a simple and schematic manner in the drawings.

Fig. 1 is an exploded view of an alignment mechanism 10 according to an embodiment of the invention. FIG. 2 is a bottom view of the probe card 200 in FIG. 1 . FIG. 3A is an operation diagram for unlocking the plate holding jig 300 in FIG. 1 . As shown in FIG. 1 and FIG. 2 , an electronic product testing device includes a positioning mechanism 10 . The alignment mechanism 10 includes a frame 100 , a probe card 200 , a board holding jig 300 and a lifting device 500 . The probe card 200 includes a circuit board 210 and a plurality (eg, four) of male connectors 220 . These male connectors 220 are arranged at intervals on the bottom surface 211 of the circuit board 210 . Each male connector 220 contains a plurality (eg tens or hundreds) of probes 221 . The board holding jig 300 is located on the frame 100 in a liftable manner, and the board holding jig 300 includes an upper splint 310 and a lower splint 320 . The lower clamping plate 320 has a plurality of (eg 4) openings 321 . The upper clamping plate 310 and the lower clamping plate 320 clamp the probe card 200 therein (FIG. 3A), and the male connectors 220 are respectively exposed from the openings 321, and the probes 221 of each male connector 220 are exposed from the corresponding The opening 321 protrudes. The lifting device 500 is installed on the frame 100 and is fixedly connected with the plate holding jig 300 for lifting and lowering the plate holding jig 300 along a vertical direction (such as the axial direction Z).

As shown in FIG. 1 and FIG. 3A , more specifically, the top surface 324 of the lower clamping plate 320 facing the upper clamping plate 310 further has a groove 322 , and the openings 321 are formed through the bottom 323 of the groove 322 . The area of the groove 322 is approximately the same as the area of the circuit board 210 , and the depth of the groove 322 is approximately the same as the thickness of the circuit board 210 . Therefore, when the circuit board 210 of the probe card 200 is completely put into the groove 322, and after the upper clamping plate 310 and the lower clamping plate 320 are clamped together (FIG. 3A), the upper clamping plate 310 and the lower clamping plate 320 can directly contact each other. , so that the circuit board 210 of the probe card 200 will not be easily detached from the board holding jig 300 , and the original thickness of the board holding jig 300 will not be increased.

FIG. 3B is an operation diagram for locking the plate holding jig 300 in FIG. 1 . As shown in FIG. 1 and FIG. 3A , the upper splint 310 has a plurality of (for example, four) notches 312 , and these notches 312 are respectively located at multiple side edges of the upper splint 310 . The board holding fixture 300 further includes a plurality (for example, four) of quick-release lockers 400 , and the quick-release lockers 400 are pivotally connected to multiple side edges of the lower splint 320 respectively. Therefore, as shown in FIG. 3B, when the quick-release locking parts 400 are respectively transferred into the corresponding notches 312, and the plate-holding fixtures 300 are respectively locked, these quick-release locking parts 400 jointly lock the lower splint. 320 and the upper splint 310 are tightly closed to each other.

For example, in this embodiment, as shown in FIG. 1 and FIG. 3A, the upper splint 310 has a plurality of (eg, four) lugs 311, and these lugs 311 protrude from all sides of the upper splint 310 respectively. Each lug 311 is provided with the notch 312 , and the notch 312 extends inwardly from the outermost side of the lug 311 . The lower clamping plate 320 has a plurality of (for example, four) shaft joints 330 protruding from all side edges of the lower clamping plate 320 and respectively aligning with the lugs 311 . Each quick-release fastener 400 includes a T-shaped pivot 410 and a first quick-release fastener 420 . One end of the T-shaped pivot 410 is pivotally connected to the shaft connection portion 330 , and the other end of the T-shaped pivot 410 is fixedly connected to the first quick release fastener 420 . Each first quick release fastener 420 includes a handle 421 , a base 422 and a connecting rod 423 . The handle 421 is located on the base 422 , and one end of the connecting rod 423 is pivotally connected to the handle 421 , and the other end of the connecting rod 423 passes through the base 422 to connect to the other end of the T-shaped pivot 410 .

In this way, as shown in FIG. 3B, when the first quick-release fastener 420 locks the plate holding jig 300, the handle 421 of the first quick-release fastener 420 is pulled vertically (such as the axis Z ), so that the handle 421 of the first quick-release fastener 420 presses the upper splint 310 downward through the base 422, and pulls the lower splint 320 upward through the T-shaped pivot 410, so that the lower splint 320 and the upper splint 310 are tightly closed to each other . Conversely, as shown in FIG. 3A, when the first quick-release fastener 420 unlocks the plate-holding jig 300, the handle 421 of the first quick-release fastener 420 is pulled horizontally (such as in the axial direction X or Y), so that the first quick release fastener 420 stops exerting force on the upper splint 310 and the lower splint 320 .

FIG. 4A is a top view of a test bench 20 according to an embodiment of the invention. FIG. 4B and FIG. 4C are continuous operation diagrams for installing the alignment mechanism 10 on the test bench 20 . As shown in FIG. 4A to FIG. 4C , in this embodiment, the testing device 1 further includes a testing platform 20 . The test bench 20 is located right below the alignment mechanism 10 . The test stand 20 includes a support frame 700 , at least one test slot 810 and at least one female connector 830 . The test slot 810 is fixed on the support frame 700 for accommodating at least one device under test 811 . The female connector 830 is located on the top of the support frame 700 and includes probe holes 831 electrically connected to the devices under test 811 .

In this embodiment, the test bench 20 further includes a plurality (eg, 4) test blocks 800 . The test blocks 800 are fixed on multiple side edges of the supporting frame 700 at intervals . The support frame 700 includes a base 710 and a plurality of (eg, 4) column modules 720 . These column modules 720 are respectively erected on the base 710, and each test block 800 is fixedly covered between two column modules 720, so that these column modules 720 and these test blocks 800 form a square hollow area 840.

Each test block 800 includes the test slot 810 , a side panel module 820 and the female connector 830 . The side plate module 820 is erected on one side edge of the supporting frame 700 . The test slot 810 is fixed on the side of the side plate module 820 facing away from the square-shaped hollow area 840, and is used to accommodate one or more devices to be tested 811, wherein the devices to be tested 811 can be electronic products, such as image capture cards (Image Capture Card), but not limited thereto. Each female connector 830 is located on the upper edge of the side panel module 820 and on the top of the supporting frame 700 . Each female connector 830 includes a plurality (such as dozens or hundreds) of the probe holes 831 . In the same test block 800 , the probe holes 831 are respectively electrically connected to the DUTs 811 in the corresponding test slots 810 . More specifically, each side plate module 820 includes a circuit side plate electrically connected to the female connector 830 and the test slot 810 , and each probe hole 831 has contacts and circuits (not shown in the figure). Therefore, the contacts in the probe hole 831 can be electrically connected to the device under test 811 in the corresponding test slot 810 through the circuit and the circuit side plate.

In addition, as shown in FIG. 1 and FIG. 4A, the support frame 700 further includes a plurality of (for example, four) guide grooves 730 formed on the top of the support frame 700 (such as the inner wall of the column module 720) . The long axis directions (such as the axial direction Z) of the guide grooves 730 are parallel to each other, and the long axis directions (such as the axial direction Z) of each guiding groove 730 are parallel to the above-mentioned vertical direction (such as the axial direction Z). The frame 100 includes a platform 110 , multiple (eg 4) feet 120 and multiple (eg 2) guide pins 130 . The guiding pins 130 are disposed on the lower clamping plate 320 at intervals, and each guiding pin 130 protrudes outward from a side of the lower clamping plate 320 facing away from the upper clamping plate 310 for removably extending into the guiding groove 730 . These legs 120 are distributed at intervals on the bottom surface 111 of the platform 110, and extend to the top of the support frame 700 (for example, the top of the column module 720), so that a lifting space 350 is defined between the platform 110 and the support frame 700. These supports The legs 120 respectively pass through the board holding jig 300 , so that the board holding jig 300 can move back and forth in the lifting space 350 .

In this way, when the alignment mechanism 10 is placed on the top of the support frame 700, the legs 120 of the alignment mechanism 10 are respectively erected on the top of the support frame 700, and the guide pins 130 of the alignment mechanism 10 extend into the guide grooves respectively. 730 (FIG. 4B and FIG. 4C), so that the alignment mechanism 10 is located on the top of the support frame 700.

FIG. 5A to FIG. 5D are continuous operation diagrams for positioning the alignment mechanism 10 of FIG. 4C on the test platform 20 . As shown in FIG. 4C and FIG. 5A , the test bench 20 further includes a plurality (for example, four) of limiting parts 740 . The limiting portions 740 are arranged at intervals on a plurality of side edges of the support frame 700 (such as the outer side wall of the column module 720 ), or at least relatively located on the support frame 700 . As shown in FIG. 1 and FIG. 5A, the alignment mechanism 10 further includes a plurality (eg, 4) positioning modules 600, and these positioning modules 600 are arranged at intervals on multiple (eg, 4) side edges of the frame 100. , or at least relatively on the frame 100 . Each positioning module 600 includes an extension unit 610 and a locking unit 640 . One end of the extension unit 610 is fixed on the frame 100 , and the buckle unit 640 is located at the other end of the extension unit 610 and is hooked to one of the limiting parts 740 .

More specifically, each limiting portion 740 includes an external connecting member 741 and a roller 743 . The outer connecting member 741 is fixed on the outer side of the supporting frame 700 . The roller 743 is pivotally disposed on a side of the outer connecting member 741 opposite to the supporting frame 700 (such as an outer side 744 ). For example, the roller 743 is installed on the outer surface 744 of the outer connection part 741 through a rotating shaft (not shown in the figure), that is, the axis 743A of the roller 743 (Fig. 4A) is perpendicular to the outer surface 744 of the outer connection part 741 .

The extension unit 610 includes a horizontal arm 611 and a vertical arm 612 . One end of the horizontal support arm 611 is fixed on the outside of the frame 100 , and the vertical support arm 612 is pivotally connected to the other end of the horizontal support arm 611 and extends toward the supporting frame 700 . The vertical direction (such as the axial direction Z) is approximately perpendicular to the long axis direction (such as the axial direction X) of the transverse support arm 611, and is approximately parallel to the long axis direction (such as the axial direction Z) of the longitudinal support arm 612 (the 5D picture). The buckle unit 640 includes an opening 641 formed on the longitudinal arm 612 for receiving the roller 743 . The opening 641 is long and narrow, and its long axis direction (such as the axial direction Z) is substantially parallel to the long axis direction (such as the axial direction Z) of the longitudinal support arm 612 .

Furthermore, the longitudinal arm 612 includes a first piece 613 , a second piece 614 and a hinge unit 615 . The first piece 613 is pivotally connected to the other end of the transverse arm 611 and is perpendicular to the transverse arm 611 . The hinge unit 615 pivotally connects the first piece 613 and the second piece 614, so that the first piece 613 and the second piece 614 can be unfolded and extend along the vertical direction (such as the axial direction Z) (FIG. 5D), Or the second sheet 614 can be flipped relative to the first sheet 613 through the hinge unit 615 ( FIG. 5A ) to approach the roller 743 .

As shown in FIG. 4B and FIG. 5B , the external connecting member 741 further has a positioning protrusion 742 protruding upward, and the positioning protrusion 742 is at the same height level as the opening 641 . The extension unit 610 further includes a positioning ring 620 , the positioning ring 620 is movably located on the second piece 614 and surrounds the second piece 614 . The total space in the positioning ring 620 becomes an accommodating space 622 (Fig. 5A) after deducting the second sheet body 614. The shape of the accommodating space 622 is the same as that of the positioning protrusion 742 (like a trapezoid), so that the positioning protrusion The portion 742 can fit into the accommodating space 622 , reducing the risk of the positioning module 600 detaching from the test bench 20 . Each extension unit 610 further includes a second quick release fastener 630 . The second quick release fastener 630 passes through the transverse arm 611 and is pivotally connected to an end surface of the longitudinal arm 612 away from the hole 641 . It should be understood that the structure of the second quick-release fastener 630 described here is substantially the same as the structure of the first quick-release fastener 420 of the above-mentioned quick-release latch 400 , and will not be repeated here.

In this way, as shown in Figures 5A to 5B, when the operator places the alignment mechanism 10 on the top of the support frame 700, the operator rotates the second piece 614 relative to the first piece 613 to allow the roller 743 to stretch out. Then, as shown in FIG. 5B to FIG. 5C , the operator moves the positioning ring 620 down to the positioning protrusion 742 along the second sheet body 614 . When the locating ring 620 moves down along the second piece 614 and sleeves the positioning protrusion 742, the locating ring 620 closes the opening 641 on the second piece 614 at the same time, so that the roller 743 cannot leave the opening 641, so that The longitudinal support arm 612 is limited on the support frame 700; then, as shown in FIG. 5C to FIG. , the inner wall of the opening 641 abuts against the roller 743 synchronously, so that the alignment mechanism 10 can be more firmly combined with the test platform 20 . It should be understood that, as shown in FIG. 5D , since the roller 743 can rotate in a balanced manner on the inner wall of the opening 641 , the lifting force of the extension unit 610 on the roller 743 will not cause immediate wear to the roller 743 .

In addition, as shown in FIG. 5A and FIG. 5C , the side of the second sheet 614 has a first positioning hole 616 and a second positioning hole 617 . The first positioning hole 616 is closer to the hinge unit 615 than the second positioning hole 617 . The positioning ring 620 has a pin 621 on it. The pin 621 extends into the first positioning hole 616 or the second positioning hole 617 through the positioning ring 620 .

In this way, as shown in Figure 5A, when the positioning ring 620 has not yet covered the opening 641, the operator inserts the first positioning hole 616 through the latch 621, so as to avoid the positioning ring 620 from shaking arbitrarily on the longitudinal support arm 612, or from the second positioning ring 620. The sheet 614 breaks away from the longitudinal arm 612 . As shown in Figure 5D, when the positioning ring 620 covers the opening 641, the operator inserts the pin 621 into the second positioning hole 617 (Figure 5A), so as to prevent the positioning ring 620 from shaking arbitrarily on the longitudinal arm 612, thereby allowing Roller 743 exits aperture 641 unexpectedly.

FIGS. 6A to 6B are continuous operation diagrams for lowering the alignment mechanism 10 of FIG. 4C on the test platform 20 and lowering the plate holding jig 300 . Figure 7 is a partial sectional view taken along line AA of Figure 6B. As shown in FIG. 6A and FIG. 7 , the lifting device 500 includes a connecting cover 510 , a bearing unit 520 , a tube body 530 , a stud 540 and a fixing portion 550 . The connection cover 510 is fixedly covered on the upper clamping plate 310 . In this embodiment, the connection cover 510 includes a cover body 511 and a through hole 512 . The cover 511 is locked on the side of the upper splint 310 facing the platform 110 , and forms an inner space 513 together with the upper splint 310 . The through hole 512 is formed on a side of the cover body 511 opposite to the upper clamping plate 310 , and is connected to the inner space 513 . The bearing unit 520 is located in the inner space 513 , and the bearing unit 520 is larger than the through hole 512 , so that the bearing unit 520 cannot be removed from the connection cover 510 through the through hole 512 . A plurality of balls (not shown) in the bearing unit 520 enclose a hollow area, such as a thrust bearing of the bearing unit 520 or the like. The tube body 530 passes through the platform 110 vertically, and has an internal thread portion 531 inside the tube body 530 . The stud 540 is located in the tube body 530 , and the stud 540 has an external thread portion 541 . The external thread portion 541 is screwed into the internal thread portion 531 . Through the rotation of the stud 540 in the tube body 530 , the stud 540 can be displaced along the vertical direction (such as the axial direction Z). The stud 540 includes a first end 542 and a second end 544 opposite to each other. The first end 542 of the stud 540 extends into the connection cover 510 through the through hole 512 , and pivotably extends into the hollow area of the bearing unit 520 in the connection cover 510 . The fixing part 550 fixes the bearing unit 520 on the connection cover 510 and the stud 540 . In this embodiment, for example, the fixing part 550 includes a clip 551 and a locking bolt 552 . The first end 542 of the stud 540 includes a protrusion 543 , and the protrusion 543 of the stud 540 extends into the inner space 513 and the bearing unit 520 . The clip 551 faces upward and presses the end surfaces of the bearing unit 520 and the boss 543 at the same time. The locking bolt 552 extends into the stud 540 through the clip 551 and the end surface of the boss 543, thereby fixing the bearing unit 520 to the boss 543 of the stud 540, and clamping the bearing unit 520 between the cover body 511 and the Between clips 551.

Therefore, when the stud 540 rotates in the pipe body 530, the outer threaded part 541 rotates along the inner threaded part 531, and the stud 540 can drive the upper splint 310 to lift through the connecting cover 510, thereby driving the inner part of the plate holding fixture 300. The probe card 200 lifts. In this way, when the lifting device 500 vertically lowers the board holding jig 300, so that all the probes 221 of the probe card 200 (Fig. 2) can be vertically inserted and electrically connected to the probe holes 831 of the corresponding female connector 830, thereby electrically The DUTs 811 of the test block 800 are connected.

It should be understood that when the external threaded portion 541 of the stud 540 rotates along the internal threaded portion 531 of the pipe body 530, the stud 540 also rotates idly in the bearing unit 520, so the cover body 511 and the upper splint 310 will not follow it. turn.

FIG. 8 is a schematic diagram of the operation of the rotary operation unit 560 in FIG. 6A. As shown in FIG. 7 and FIG. 8 , the lifting device 500 further includes a rotating operation part 560 . The rotating operation part 560 is sleeved on the second end 544 of the stud 540 to drive the stud 540 to rotate. More specifically, in this embodiment, the rotating operation part 560 further includes a rotating disk 561 and an operating handle 563 . The rotating disk 561 is fixedly connected to the second end 544 of the stud 540 and shares an axis with the stud 540 . The rotary disk 561 has a receiving groove 562 on a surface opposite to the plate holding jig 300 . One end of the operating handle 563 is pivotally connected to the accommodating slot 562 for pivoting in and out of the accommodating slot 562 . In this way, when the operating handle 563 is rotated out of the receiving groove 562 and the operating handle 563 deviates from the axis of the stud 540 , the operator can rotate the rotating disk 561 through the operating handle 563 to drive the stud 540 to rotate.

Fig. 9 is a partial cross-sectional view of a test device 2 according to an embodiment of the invention. As shown in Figure 9, the present embodiment is substantially the same as the above-mentioned testing device 1, and the difference is that the frame 100 further includes a first guide hole 140, a second guide hole 340, a first guide rod 150 and a second guide rod 150. guide rod 160 . The first guide hole 140 is opened on the platform 110 . The second guide hole 340 is opened on the plate holding jig 300 . The first guide rod 150 is locked on the plate holding jig 300 and is movably located in the first guide hole 140 . The second guide rod 160 is locked on the platform 110 and is movably located in the second guide hole 340 , and the stud 540 is located between the first guide rod 150 and the second guide rod 160 .

In this way, when the lifting device 500 vertically lifts the plate holding jig 300, compared with the first guide rod 150 and the second guide rod 160 in FIG. The first guide rod 150 extends upwards into the first guide hole 140, and the second guide rod 160 extends downwards into the second guide hole 340, thereby making the lifting of the lifting plate jig 300 smoother and avoiding holding the plate The jig 300 is rotated in conjunction with the stud 540 .

In this way, through the structures described in the above embodiments, the probe card can be vertically lifted, so that all probes can be smoothly inserted vertically and electrically connected to the probe holes, so that the subsequent test procedures of the test machine can be executed, reducing Risk of damaging the probe.

Finally, the embodiments disclosed above are not intended to limit this creation. Anyone who is familiar with this technique can make various changes and modifications without departing from the spirit and scope of this creation, and all of them can be protected in this creation. creation. Therefore, the scope of protection of this creation should be defined by the scope of the attached patent application.

1, 2: Test device 10: Counterpoint mechanism 20: Test bench 100: frame 110: Platform 111: bottom surface 120: Leg 130: Guide pin 140: The first guide hole 150: The first guide rod 160: the second guide rod 200: probe card 210: circuit board 211: Bottom 220: male connector 221: Probe 300: Holder fixture 310: upper splint 311: lug 312: Gap 320: lower splint 321: opening 322: Groove 323: bottom 324: top surface 330: Shaft connection 340: Second guide hole 350: lifting space 400:Quick release lock 410: T-pivot 420: The first quick release fastener 421: handle 422: seat body 423: connecting rod 500: lifting device 510: connection cover 511: cover body 512: Through hole 513: inner space 520: bearing unit 530: tube body 531: internal thread part 540: stud 541: external thread 542: first end 543: convex column 544: second end 550: fixed part 551: clip 552: locking bolt 560:Rotary operation part 561:Rotary disk 562: storage tank 563: Operating handle 600: positioning module 610: extension unit 611: Horizontal support arm 612: Longitudinal support arm 613: The first body 614: second body 615: hinge unit 616: The first positioning hole 617: Second positioning hole 620: positioning ring 621: plug 622:Accommodating space 630: Second quick release fastener 640: snap unit 641: opening 700: support frame 710: base 720: column module 730: guide groove 740: limit part 741: External parts 742: positioning convex part 743:Roller 743A: axis 744: Outer side 800: test block 810: test slot 811:Device under test 820: side panel module 830: female connector 831: probe hole 840: word-shaped hollow area AA: line segment X, Y, Z: Axial

In order to make the above-mentioned and other purposes, features, advantages and embodiments of this creation more obvious and easy to understand, the description of the accompanying drawings is as follows: Fig. 1 is an exploded view of the alignment mechanism of an embodiment of the invention. Figure 2 is a bottom view of the probe card in Figure 1. Fig. 3A is an operation diagram for unlocking the plate holding jig in Fig. 1. Fig. 3B is an operation diagram for locking the plate holding fixture in Fig. 1. Fig. 4A is a top view of a test bench according to an embodiment of the invention. Fig. 4B and Fig. 4C are continuous operation diagrams for installing the alignment mechanism to the test bench. Fig. 5A ~ Fig. 5D are continuous operation diagrams for positioning the alignment mechanism in Fig. 4C on the test bench. Figures 6A to 6B are continuous operation diagrams for lowering the plate-holding jig from the alignment mechanism shown in Figure 4C on the test bench. Figure 7 is a partial sectional view taken along line AA of Figure 6B. Fig. 8 is a schematic diagram of the operation of the rotary operation part in Fig. 6A. Fig. 9 is a partial sectional view of a testing device according to an embodiment of the invention.

1: Test device

10: Counterpoint mechanism

20: Test bench

110: Platform

120: Leg

130: Guide pin

300: Holder fixture

500: lifting device

600: positioning module

610: extension unit

630: Second quick release fastener

640: snap unit

641: opening

700: support frame

710: base

720: column module

730: guide groove

740: limit part

741: External parts

742: positioning convex part

743:Roller

744: Outer side

800: test block

811:Device under test

830: female connector

X, Y, Z: Axial

Claims (11)

An electronic product testing device, comprising: A test bench, including: a support frame; at least one test slot, fixed on the support frame, for accommodating at least one device under test; and At least one first connector, located on the top of the support frame, includes a plurality of probe holes, and the probe holes are respectively electrically connected to the device under test; and A pair of institutions, including: a frame removably mounted on the top of the support frame; A probe card has at least one second connector, and the second connector includes a plurality of probes; A board-holding jig, which can be lifted and lowered on the frame, includes an upper splint and a lower splint, the lower splint has at least one opening, the upper splint and the lower splint clamp the probe card, and the the probe protrudes from the opening; and A lifting device, installed on the frame, fixedly connected with the plate holding fixture, used for lifting the plate holding fixture, wherein the lifting device vertically lowers the plate holding fixture, so that the probes can be inserted vertically and The probe holes are electrically connected. The electronic product testing device as claimed in item 1, wherein the upper splint has a plurality of notches, and the notches are respectively located at a plurality of side edges of the upper splint; and The plate holding jig further includes a plurality of quick-release locks, and the quick-release locks are respectively pivotally connected to a plurality of side edges of the lower splint, Wherein, when the quick-release locks are respectively transferred from the lower splint to the gaps, and the plate-holding jigs are respectively locked, the quick-release locks jointly make the lower splint and the upper splint The splints are tightly closed to each other. The electronic product testing device as claimed in item 1, wherein the test platform further includes a plurality of limiting parts, and the limiting parts are at least relatively located on the supporting frame; and The alignment mechanism further includes a plurality of positioning modules, the positioning modules are at least oppositely located on the frame, each of the positioning modules includes an extension unit and a buckle unit, one end of the extension unit Fixed to the frame, the buckle unit is located at the other end of the extension unit, and is used for hooking to one of the limiting parts. The electronic product testing device as described in claim 3, wherein each of the limiting parts includes: an external attachment fixed to one of the outer sides of the support frame; and a roller, pivotally disposed on one side of the external member opposite to the supporting frame; and This extension unit contains: a transverse arm having one end fixed to the outside of the frame; and a longitudinal support arm, pivotally connected to the other end of the transverse support arm, and extending toward the support frame, wherein the buckle unit includes an opening formed on the longitudinal support arm, and used to accommodate the roller . The electronic product testing device as described in claim 4, wherein the longitudinal support arm includes: a first sheet, which is perpendicular to the transverse arm; a second sheet, wherein the opening is located on the second sheet; and A hinge unit pivotally connects the first sheet and the second sheet. The electronic product testing device as described in claim 5, wherein the external connector further has a positioning protrusion, and the positioning protrusion is at the same height as the opening; and The extension unit further includes a positioning ring, the positioning ring is movably located on the second piece and surrounds the second piece, Wherein when the positioning ring is sleeved onto the positioning protrusion along the second sheet, the positioning ring closes the opening on the second sheet so that the longitudinal arm is limited on the support frame . The electronic product testing device as described in claim 4, wherein the extension unit further includes a quick-release fastener, and the quick-release fastener passes through the horizontal support arm and is pivotally connected to an end surface of the longitudinal support arm, Wherein when the quick-release fastener locks the extension unit and pulls up the longitudinal support arm, the inner wall of the opening synchronously abuts against the roller. The electronic product testing device as described in claim 1, wherein the support frame further includes a plurality of guide grooves formed on the top of the support frame; and The framework contains: a platform; A plurality of legs are distributed on the bottom surface of the platform at intervals, and extend toward the top of the support frame together, so that a lift space is defined between the platform and the support frame, wherein the legs respectively pass through the support plate jig, so that the board-holding jig can move back and forth in the lifting space; and A plurality of guide pins protrude outward from one side of the lower clamping plate facing away from the upper clamping plate, for removably extending into the guiding grooves. The electronic product testing device as described in Claim 8, wherein the lifting device includes: a connecting cover fixedly covering the upper splint; a bearing unit located in the connection cover; A pipe body, passing through the platform vertically, has an internal thread portion; A stud, which passes through the pipe body and extends into the connecting cover, has an external threaded part screwed to the internal thread part, wherein one end of the stud is pivotably extended into the bearing unit in the connecting cover ;as well as a fixing part, fixing the bearing unit on the connection cover and the stud, Wherein when the stud rotates in the tube body, the stud moves the upper splint up and down through the connecting cover. The electronic product testing device as described in claim 9, wherein the lifting device includes a rotating operation part, and the rotating operation part further includes: a rotating disk, fixed to the other end of the stud, shares an axis with the stud, and has a receiving groove on one surface of the rotating disk opposite to the plate holding jig; and an operating handle, one end of the operating handle is pivotally connected in the accommodating groove for pivoting in and out of the accommodating groove, Wherein when the operating handle turns out of the accommodating groove and deviates from the axis of the stud, the operating handle can drive the rotating disk to rotate. The electronic product testing device as described in Claim 9, wherein the frame further includes: a first guide hole opened on the platform; a first guide rod, locked on the plate holding jig, and movably located in the first guide hole; A second guide hole is opened on the plate holding jig; and A second guide rod is locked on the platform and movably located in the second guide hole, wherein the stud is located between the first guide rod and the second guide rod.

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