JP3245651U - Electronic product testing equipment - Google Patents

Abstract

The present invention provides a test device for electronic products that reduces the risk of damage to a probe. A test device (1) for electronic products includes a test stage (20) and an alignment mechanism (10). The test stage includes a support frame 700 and a connector. The connector is located on top of the support frame. The alignment mechanism includes a bracket, a probe card, and a plate holder 300. The bracket is attached to the top of the support frame. The plate holder is movably positioned on the bracket to sandwich the probe card and expose the probes of the probe card. The lifting device 500 is attached to the bracket and fixed to the plate holder in order to raise and lower the plate holder. Therefore, when the lifting device lowers the plate holder vertically, the probes of the probe card are respectively vertically inserted into these probe holes of the connector and electrically connected. [Selection diagram] Figure 4B

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test device, and more particularly, to a test device that can vertically move a probe card up and down.

Generally, conventional large test equipment includes a test stage and a large probe card located above the test stage. Multiple electronic products are installed within the test stage. Therefore, by inserting the probes of the large probe card downward into all the pinholes in the test stage, the large probe card can electrically detect all the electronic products in the test stage. Conversely, in order to remove a large probe card, said large probe card must be lifted vertically from the test stage so that each of these probes can be separated from the pinhole simultaneously.

However, all the probes in the large probe card described above are very precise, and the large probe card has a certain weight. There is a risk of damage.

It can be seen that the above techniques clearly still have disadvantages and deficiencies and need further improvement. Therefore, how to effectively solve the above-mentioned inconveniences and shortcomings is one of the current important research and development issues, and is a goal that should be urgently improved in the current related fields.

One purpose of the present invention is to provide a testing device for electronic products to solve the above-mentioned difficulties in the prior art.

According to an embodiment of the present invention, a support frame, at least one test slot fixed to the support frame for accommodating at least one device under test; at least one first connector including a plurality of probe holes, each electrically connected to the test stage; a bracket removably attached to the top of the support frame; and at least one second connector including a plurality of probes. a probe card having a connector, the probe card being movably positioned on the bracket, including an upper clamping plate and a lower clamping plate, the lower clamping plate having at least one opening, and the upper clamping plate and the lower clamping plate sandwiching the probe card; and a plate holder in which the plurality of probes are exposed through the opening; the plurality of probes are attached to a bracket and fixed to the plate holder, and are used for raising and lowering the plate holder, and vertically lowering the plate holder; The present invention provides a testing device for electronic products, comprising: a lifting device in which a plurality of probes can be vertically inserted into the plurality of probe holes and electrically connected to each other; and a positioning mechanism including a positioning mechanism.

According to one or more embodiments of the present invention, in the electronic product testing device, the upper clamping plate has a plurality of notches, and the plurality of notches are respectively disposed on the plurality of side edges of the upper clamping plate. To position. The plate holder further includes a plurality of quick release locks each pivotally attached to a plurality of side edges of the lower jaw plate. When each of the plurality of quick release locks enters the plurality of notches from the lower clamping plate and locks the respective plate holder, the plurality of quick release locks together firmly close the lower clamping plate and the upper clamping plate to each other.

According to one or more embodiments of the present invention, in the electronic product testing apparatus, the test stage further includes a plurality of position limiters located at least oppositely on the support frame. The alignment mechanism further includes a plurality of positioning modules located at least oppositely on the bracket and each including an extension unit and a snap unit, one end of the extension unit is fixed to the bracket, and the snap unit is fixed to the bracket. It is located at the other end of the extension unit and is used to hook onto one of the plurality of position limiting parts.

According to one or more embodiments of the present invention, in the electronic product testing device, each of the plurality of position limiting parts includes an external connection member fixed to the outside of the support frame, and a support for the external connection member. and a roller pivotably provided on a surface facing the frame. The extension unit includes a transverse support arm fixed at one end to the outside of the bracket, and a longitudinal support arm pivotally connected to the other end of the transverse support arm and extending toward the support frame. The snap unit is formed in the longitudinal support arm and includes an aperture for accommodating the roller.

According to one or more embodiments of the present invention, in the electronic product testing apparatus, the longitudinal support arm includes a first sheet that is perpendicular to the horizontal support arm and a second sheet in which the aperture is located. , a hinge unit that pivotally connects the first seat and the second seat.

According to one or more embodiments of the present invention, in the electronic product testing device, the external connection member further has a positioning protrusion, and the positioning protrusion and the opening are at the same height level. . The extension unit further includes a positioning ring movably positioned on and surrounding the second sheet. When the locating ring is fitted onto the locating protrusion along the second sheet, the locating ring closes the aperture on the second sheet such that the longitudinal support arm is confined to the support frame.

According to one or more embodiments of the present invention, in the electronic product testing apparatus, the extension unit is a quick release that extends through the lateral support arm and is pivotally mounted on one end surface of the longitudinal support arm. It further includes a fastener. When the quick-release fastener locks the extension unit and raises the longitudinal support arm, the inner wall surface of the aperture synchronously abuts the roller.

According to one or more embodiments of the present invention, in the electronic product testing apparatus described above, the support frame further includes a plurality of guide grooves formed on the upper part of the support frame. The brackets are distributed at intervals on the platform and the bottom of the platform, and both extend to the top of the support frame, thereby defining an elevating space between the platform and the support frame, and allowing the plate holder to move within the elevating space. a plurality of support legs each extending through the plate holder for reciprocating movement; and a plurality of support legs extending outwardly from the surface of the lower clamping plate opposite the upper clamping plate to removably extend into the plurality of guide grooves. and a plurality of guide pins.

According to one or more embodiments of the present invention, in the electronic product testing device, the lifting device includes a connection cover fixedly covered by the upper holding plate, a bearing unit located in the connection cover, and a platform. A tube body that extends vertically through the tube body and has a female threaded portion, and a male threaded portion that extends through the tube body and into the connection cover and is screwed into the female threaded portion, and one end pivots on the bearing unit within the connection cover. It includes a extendable stud and a fixing part for fixing the bearing unit to the connection cover and the stud. When the stud rotates within the tube, the stud raises and lowers the upper clamping plate through the connection cover.

According to one or more embodiments of the present invention, in the electronic product testing device, the lifting device includes a rotation operation section, the rotation operation section is fixed to the other end of the stud, and the rotation operation section is axially centered together with the stud. The rotary disk has a common receiving groove on its surface facing the plate holder, and an operating handle having one end pivotally mounted in the receiving groove and pivoting into and out of the receiving groove. . When the operating handle is rotated out of the receiving groove and off the axis of the stud, the operating handle can rotate the turntable.

According to one or more embodiments of the present invention, in the electronic product testing apparatus, the bracket is locked to a first guide hole drilled in the platform and to the plate holder, and is movable within the first guide hole. The apparatus further includes a first guide rod located in the plate holder, a second guide hole drilled in the plate holder, and a second guide rod locked to the platform and movably positioned within the second guide hole. The stud is located between the first guide rod and the second guide rod.

As described above, with the structure of each of the above embodiments, the probe card can be vertically raised and lowered, and thereby all the probes can be smoothly inserted vertically and electrically connected to the probe holes. can perform subsequent testing processes on the test equipment, reducing the risk of damaging the probe.

The above content is only for explaining the problem that the present invention attempts to solve, the technical solutions to solve the problem, and the effects produced by it.The specific details of the present invention are as follows. The embodiments are described in detail in the embodiments and related drawings.

In order to make the above and other objects, features, advantages and embodiments of the present invention more clear and understandable, the accompanying drawings are described below.
FIG. 3 is an exploded view of a positioning mechanism according to an embodiment of the present invention. FIG. 2 is a bottom view of the probe card of FIG. 1; FIG. 2 is an operation diagram for unlocking the plate holder in FIG. 1; FIG. 2 is an operation diagram for locking the plate holder of FIG. 1; FIG. 3 is a top view of a test stage according to an embodiment of the present invention. FIG. 6 is a sequential operation diagram for attaching the alignment mechanism to the test stage. FIG. 6 is a sequential operation diagram for attaching the alignment mechanism to the test stage. 4C is a sequential operation diagram for positioning the alignment mechanism of FIG. 4C on a test stage; FIG. 4C is a sequential operation diagram for positioning the alignment mechanism of FIG. 4C on a test stage; FIG. 4C is a sequential operation diagram for positioning the alignment mechanism of FIG. 4C on a test stage; FIG. 4C is a sequential operation diagram for positioning the alignment mechanism of FIG. 4C on a test stage; FIG. FIG. 4C is a continuous operation view of the alignment mechanism of FIG. 4C lowering the plate holder onto the test stage. FIG. 4C is a continuous operation view of the alignment mechanism of FIG. 4C lowering the plate holder onto the test stage. 6B is a partial cross-sectional view taken along line segment AA. FIG. FIG. 6B is a schematic diagram of the operation of the rotation operation section of FIG. 6A. 1 is a partial cross-sectional view of a test device according to an embodiment of the present invention; FIG.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, several embodiments of the present invention will be disclosed based on the drawings, and in order to make the description clear, numerous practical details will be described in the following description. However, it is understood that these practical details are not intended to limit the invention. That is, these practical details are not necessary in each embodiment of the present invention. In addition, in order to simplify the drawings, certain conventional structures and components are shown simply and schematically in the drawings.

FIG. 1 is an exploded view of a positioning mechanism 10 according to an embodiment of the present invention. FIG. 2 is a bottom view of the probe card 200 of FIG. 1. FIG. 3A is an operation diagram for unlocking the plate holder 300 of FIG. 1. As shown in FIGS. 1 and 2, the electronic product testing apparatus includes an alignment mechanism 10. As shown in FIGS. The alignment mechanism 10 includes a bracket 100, a probe card 200, a plate holder 300, and a lifting device 500. Probe card 200 includes a circuit board 210 and a plurality of (for example, four) male connectors 220. These male connectors 220 are arranged at intervals on the bottom surface 211 of the circuit board 210. Each male connector 220 includes a plurality (eg, tens or hundreds) of probes 221. The plate holder 300 is movably positioned on the bracket 100 and includes an upper clamping plate 310 and a lower clamping plate 320. The lower holding plate 320 has a plurality of (for example, four) openings 321. The upper clamping plate 310 and the lower clamping plate 320 sandwich the probe card 200 (FIG. 3A), these male connectors 220 are exposed through these openings 321, and these probes 221 of each male connector 220 are exposed through the corresponding opening 321. Extend. The lifting device 500 is attached to the bracket 100 and fixed to the plate holder 300, and is used to raise and lower the plate holder 300 in the vertical direction (for example, in the axial direction Z).

As shown in FIGS. 1 and 3A, more specifically, the top surface 324 of the lower clamping plate 320 facing the upper clamping plate 310 further includes grooves 322, and these openings 321 are connected to the bottoms of the grooves 322. 323. The area of the groove 322 is approximately the same as the area of the circuit board 210, and the depth of the groove 322 is approximately the same as the thickness of the circuit board 210. Therefore, when the circuit board 210 of the probe card 200 is completely fitted into the groove 322 and the upper clamping plate 310 and the lower clamping plate 320 are clamped together (FIG. 3A), the upper clamping plate 310 and the lower clamping plate 320 can be in direct contact with each other, so that the circuit board 210 of the probe card 200 is not easily separated from the plate holder 300, and the original thickness of the plate holder 300 is not increased.

FIG. 3B is an operation diagram for locking the plate holder 300 of FIG. 1. As shown in FIGS. 1 and 3A, the upper clamping plate 310 has a plurality of (for example, four) notches 312, and these notches 312 are located at a plurality of side edges of the upper clamping plate 310, respectively. The plate holder 300 further includes a plurality (for example, four) of quick release locks 400 pivotally attached to a plurality of side edges of the lower clamping plate 320, respectively. Therefore, as shown in FIG. 3B, when the quick release locks 400 respectively enter the corresponding notches 312 and respectively lock the plate holders 300, these quick release locks 400 both engage the lower clamping plate 320 and the upper clamping plate. 310 are tightly closed together.

For example, in this embodiment, as shown in FIGS. 1 and 3A, the upper clamping plate 310 has a plurality of (for example, four) lugs 311, and each of these lugs 311 covers all the side edges of the upper clamping plate 310. Each lug 311 is provided with the aforementioned notch 312, and the notch 312 extends inward from the outermost side of the lug 311. The lower clamping plate 320 has a plurality of (for example, four) pivoting parts 330, each of which is provided in a protruding manner on all side edges of the lower clamping plate 320, and is located at each of the lugs 311 described above. Matched. Each quick release lock 400 includes a T-shaped pivot 410 and a first quick release fastener 420. One end of the T-shaped pivot 410 is pivotally connected to the shaft attachment part 330, and the other end of the T-shaped pivot 410 is fixed to the first quick release fastener 420 described above. Each first quick release fastener 420 includes a handle 421, a base 422, and a link 423. Handle 421 is located on base 422 , one end of link 423 is pivotally attached to handle 421 , and the other end of link 423 passes through base 422 and is connected to the other end of T-shaped pivot 410 .

In this way, as shown in FIG. 3B, when the first quick release fastener 420 locks the plate holder 300, the handle 421 of the first quick release fastener 420 is pulled vertically (e.g., in the axial direction Z). , the handle 421 of the first quick release fastener 420 presses down the upper gripping plate 310 through the base 422 and pulls up the lower gripping plate 320 through the T-shaped pivot 410. Therefore, the lower clamping plate 320 and the upper clamping plate 310 are tightly closed to each other. Conversely, as shown in FIG. 3A, when the first quick release fastener 420 unlocks the plate holder 300, the handle 421 of the first quick release fastener 420 is pulled horizontally (e.g., in the axial direction X or Y). Accordingly, the first quick release fastener 420 stops applying force to the upper clamping plate 310 and the lower clamping plate 320.

FIG. 4A is a top view of the test stage 20 according to an embodiment of the present invention. 4B and 4C are sequential operation diagrams for attaching the alignment mechanism 10 to the test stage 20. As shown in FIGS. 4A to 4C, in this embodiment, the test apparatus 1 further includes a test stage 20. The test stage 20 is located directly below the alignment mechanism 10. Test stage 20 includes a support frame 700, at least one test slot 810, and at least one female connector 830. Test slot 810 is fixed to support frame 700 and is used to accommodate at least one device under test 811. The female connectors 830 include probe holes 831 located on the top of the support frame 700 and electrically connected to the devices under test 811, respectively.

In this embodiment, the test stage 20 further includes a plurality (for example, four) of test blocks 800. These test blocks 800 are fixed to a plurality of side edges of the support frame 700 at intervals. The support frame 700 includes a pedestal 710 and a plurality of (eg, four) pillar modules 720. These pillar modules 720 are each erected on a pedestal 710, and each test block 800 is fixedly covered between two pillar modules 720, so that these pillar modules 720 and these test blocks 800 are Encloses a glyph-shaped hollow region 840.

Each test block 800 includes the aforementioned test slot 810, the side plate module 820, and the aforementioned female connector 830. The side plate module 820 is installed upright on one side edge of the support frame 700. The test slot 810 is fixedly provided on the surface of the side plate module 820 facing away from the rectangular hollow region 840 and is used to accommodate one or more test target devices 811 . The device under test 811 may be, for example, an electronic product such as an image capture card, but is not limited thereto. Each female connector 830 is located at the upper edge of the side plate module 820 and at the top of the support frame 700. Each female connector 830 includes a plurality (eg, tens or hundreds) of the aforementioned probe holes 831. These probe holes 831 are each electrically connected to the device under test 811 in the corresponding test slot 810 within the same test block 800. More specifically, each side plate module 820 includes a circuit side plate electrically connected to a female connector 830 and a test slot 810, with contacts and circuitry (not shown) within each probe hole 831. Therefore, the contacts in the probe hole 831 can be electrically connected to the device under test 811 in the corresponding test slot 810 via the circuit and circuit side plate.

Further, as shown in FIGS. 1 and 4A, the support frame 700 further includes a plurality of (for example, four) guide grooves 730, and these guide grooves 730 are arranged in the upper part of the support frame 700 (for example, the pillar module 720). formed on the inner wall of the The long axis direction (for example, axial direction Z) of the guide grooves 730 is parallel to each other, and the long axis direction (for example, axial direction Z) of each guide groove 730 is parallel to the above-mentioned perpendicular direction (for example, axial direction Z). . Bracket 100 includes a platform 110, a plurality (eg, four) of support legs 120, and a plurality (eg, two) of guide pins 130. These guide pins 130 are spaced apart from each other on the lower clamping plate 320 , with each guide pin 130 facing away from the upper clamping plate 310 of the lower clamping plate 320 so as to removably extend into the guide groove 730 . Extends outward from the surface. These support legs 120 are distributed at intervals on the bottom surface 111 of the platform 110 and extend together to the top of the support frame 700 (e.g., the top of the pillar module 720), so that the support legs 120 are disposed between the platform 110 and the support frame 700. A lifting space 350 is defined, and each of these support legs 120 passes through the plate holder 300 such that the plate holder 300 can reciprocate within the lifting space 350.

In this manner, when the alignment mechanism 10 is disposed on the top of the support frame 700, these support legs 120 of the alignment mechanism 10 are respectively erected on the top of the support frame 700, and these guides of the alignment mechanism 10 are The pins 130 each extend into a guide groove 730 (FIGS. 4B and 4C), thereby positioning the alignment mechanism 10 on top of the support frame 700.

5A to 5D are sequential operation diagrams for positioning the alignment mechanism 10 of FIG. 4C on the test stage 20. As shown in FIGS. 4C and 5A, the test stage 20 further includes a plurality of (for example, four) position limiters 740. These position limiters 740 are spaced apart from a plurality of side edges of the support frame 700 (eg, the outer wall of the pillar module 720), or are at least located oppositely on the support frame 700. As shown in FIGS. 1 and 5A, the alignment mechanism 10 further includes a plurality (for example, four) of positioning modules 600, and these positioning modules 600 are attached to the plurality of (for example, four) side edges of the bracket 100. They are spaced apart or at least located opposite each other on the bracket 100 . Each positioning module 600 includes an extension unit 610 and a snap unit 640. One end of the extension unit 610 is fixed to the bracket 100 , and a snap unit 640 is located at the other end of the extension unit 610 and hooked to one position limiter 740 .

More specifically, each position limiter 740 includes an external connection member 741 and a roller 743. The external connection member 741 is fixed to the outside of the support frame 700. The roller 743 is pivotally provided on a surface (eg, one outer surface 744) of the external connection member 741 facing the support frame 700. For example, the roller 743 is attached to the above-mentioned outer surface 744 of the external connection member 741 via a rotating shaft (not shown), that is, the axis 743A (FIG. 4A) of the roller 743 is attached to the above-mentioned outer surface 744 of the external connection member 741. perpendicular to the outer surface 744 of.

Extension unit 610 includes a lateral support arm 611 and a longitudinal support arm 612. One end of the lateral support arm 611 is fixed to the outside of the bracket 100, and the longitudinal support arm 612 is pivotally attached to the other end of the lateral support arm 611 and extends toward the support frame 700. The above-mentioned vertical direction (e.g., axial direction Z) is substantially orthogonal to the longitudinal direction of the lateral support arm 611 (e.g., axial direction (Fig. 5D). Snap unit 640 is formed in longitudinal support arm 612 and includes an aperture 641 for accommodating roller 743. The opening 641 has an elongated shape, and its long axis direction (for example, axial direction Z) is substantially parallel to the long axis direction (for example, axial direction Z) of the vertical support arm 612.

Further, the longitudinal support arm 612 includes a first seat 613, a second seat 614, and a hinge unit 615. The first seat 613 is pivotally attached to the other end of the lateral support arm 611 and is orthogonal to the lateral support arm 611 . Since the hinge unit 615 pivotally connects the first sheet 613 and the second sheet 614, the first sheet 613 and the second sheet 614 can be spread out and extended along the above-mentioned vertical direction (for example, axial direction Z). (FIG. 5D), or the second sheet 614 can be reversed with respect to the first sheet 613 via the hinge unit 615 (FIG. 5A) and approached the rollers 743.

As shown in FIGS. 4B and 5B, the external connection member 741 further has a positioning protrusion 742 that protrudes upward, and the positioning protrusion 742 is at the same height level as the opening 641. The extension unit 610 further includes a positioning ring 620 that is movably positioned on and surrounds the second sheet 614. The total space within positioning ring 620 becomes accommodation space 622 (FIG. 5A) after subtracting second seat 614. Since the shape of the receiving space 622 is the same as the shape of the positioning protrusion 742 (for example, close to a trapezoid), the positioning protrusion 742 can fit and enter the receiving space 622, thereby allowing the positioning module 600 to perform the test. The risk of separation from stage 20 is reduced. Each extension unit 610 further includes a second quick release fastener 630. A second quick release fastener 630 extends through the lateral support arm 611 and is pivotally attached to the end face of the longitudinal support arm 612 remote from the aperture 641 . It should be understood that the structure of the second quick release fastener 630 described herein is substantially the same as the structure of the first quick release fastener 420 of the quick release lock 400 described above, and will not be described here.

In this way, as shown in FIGS. 5A to 5B, when the operator places the alignment mechanism 10 on the top of the support frame 700, the operator places the second sheet 614 so that the roller 743 extends into the opening 641. is rotated relative to the first sheet 613, and then, as shown in FIGS. 5B to 5C, the operator moves the positioning ring 620 along the second sheet 614 to the positioning protrusion 742. When the positioning ring 620 moves along the second sheet 614 and is fitted into the positioning protrusion 742, the positioning ring 620 is further moved along the second sheet 614 so that the roller 743 cannot leave the opening 641. By simultaneously closing the apertures 641, the longitudinal support arms 612 are restricted to the support frame 700. Next, as shown in FIGS. 5C-5D, when the operator locks the extension unit 610 by the second quick release fastener 630 and pulls up the longitudinal support arm 612, the inner wall surface of the aperture 641 20 and the alignment mechanism 10 is synchronously abutted against the roller 743 so that the alignment mechanism 10 is more securely coupled to the roller 743. It should be understood that the force by which the extension unit 610 pulls up the roller 743 does not immediately wear out the roller 743 because the roller 743 can rotate in a well-balanced manner on the inner wall surface of the aperture 641 as shown in FIG. 5D.

Further, as shown in FIGS. 5A and 5C, a first positioning hole 616 and a second positioning hole 617 are provided on the side surface of the second sheet 614. The first positioning hole 616 is closer to the hinge unit 615 than the second positioning hole 617. The positioning ring 620 has a pin 621. The pin 621 extends into the first positioning hole 616 or the second positioning hole 617 via the positioning ring 620.

In this way, as shown in FIG. 5A, if the positioning ring 620 does not cover the aperture 641 yet, the operator can insert the pin 621 into the first positioning hole 616 so that the positioning ring 620 has vertical support. This prevents the arm 612 from swinging freely on the arm 612 or coming off the second seat 614 from the longitudinal support arm 612. As shown in FIG. 5D, when the positioning ring 620 covers the aperture 641, the operator inserts the pin 621 into the second positioning hole 617 (FIG. 5A) so that the positioning ring 620 covers the vertical support arm. This prevents the roller 743 from swinging freely on the opening 612 and unexpectedly coming off the opening 641.

6A-6B are sequential operation diagrams of the alignment mechanism 10 of FIG. 4C lowering the plate holder 300 onto the test stage 20. FIG. 7 is a partial cross-sectional view of FIG. 6B taken along line segment AA. As shown in FIGS. 6A and 7, the lifting device 500 includes a connection cover 510, a bearing unit 520, a tube body 530, a stud 540, and a fixing part 550. The connection cover 510 is fixedly covered by the upper holding plate 310. In this embodiment, the connection cover 510 includes a cover body 511 and a through hole 512. The cover body 511 is fixed to the surface of the upper holding plate 310 facing the platform 110 and forms an internal space 513 together with the upper holding plate 310 . The through hole 512 is formed on the surface of the cover body 511 facing the upper holding plate 310 and communicates with the internal space 513 . Since the bearing unit 520 is located within the internal space 513 and the bearing unit 520 is larger than the through hole 512, the connection cover 510 of the bearing unit 520 cannot be removed from the through hole 512. A plurality of balls (not shown) within the bearing unit 520 surround the hollow area, for example the bearing unit 520 is a thrust bearing or similar component. Tube 530 extends vertically through platform 110 and has internal threads 531 within tube 530. The stud 540 is located within the tube 530 and has an externally threaded portion 541. The male threaded portion 541 is screwed into the female threaded portion 531. Rotation of the stud 540 within the tube body 530 allows the stud 540 to be displaced along the vertical direction (eg, axial direction Z). Stud 540 includes a first end 542 and a second end 544 that are opposed to each other. A first end 542 of the stud 540 extends into the connection cover 510 through the through hole 512 and pivotably extends within the connection cover 510 into the hollow region of the bearing unit 520 . The fixing part 550 fixes the bearing unit 520 to the connection cover 510 and the stud 540. In this embodiment, for example, the fixing part 550 includes a clip 551 and a lock bolt 552. First end 542 of stud 540 includes a boss 543 that extends into interior space 513 and bearing unit 520 . The clip 551 simultaneously presses the end surfaces of the bearing unit 520 and the boss 543 upward. The lock bolt 552 is inserted into the stud 540 through the end faces of the clip 551 and the boss 543, thereby fixing the bearing unit 520 to the boss 543 of the stud 540, and fixing the bearing unit 520 between the cover body 511 and the clip 551. sandwiched between.

Therefore, when the stud 540 rotates within the tube body 530, the male threaded portion 541 rotates along the female threaded portion 531, and the stud 540 moves the upper clamping plate 310 up and down via the connection cover 510, thereby causing the plate holder to move up and down. The probe card 200 within the probe card 300 can be raised and lowered. In this way, by vertically lowering the plate holder 300 by the lifting device 500, all the probes 221 (FIG. 2) of the probe card 200 are vertically inserted into the probe holes 831 of the corresponding female connectors 830. The test block 800 can be electrically connected to these devices under test 811 of the test block 800 .

When the male threaded portion 541 of the stud 540 rotates along the female threaded portion 531 within the tube body 530, the stud 540 also idles within the bearing unit 520, so the cover body 511 and the upper clamping plate 310 do not rotate accordingly.

FIG. 8 is a schematic diagram of the operation of the rotation operation section 560 of FIG. 6A. As shown in FIGS. 7 and 8, the lifting device 500 further includes a rotation operation section 560. The rotation operation part 560 is fitted onto the second end 544 of the stud 540 and is used to rotate the stud 540. More specifically, in this embodiment, the rotation operation section 560 further includes a rotary disk 561 and an operation handle 563. The rotary disk 561 is fixed to the second end 544 of the stud 540 and shares an axis with the stud 540. The rotary disk 561 has a housing groove 562 on the surface facing the plate holder 300. One end of the operating handle 563 is pivotally mounted within the receiving groove 562 for pivoting into and out of the receiving groove 562 . In this way, when the operating handle 563 rotates and comes out of the accommodation groove 562 and the operating handle 563 is removed from the axis of the stud 540, the operator rotates the rotary plate 561 via the operating handle 563, Stud 540 can be rotated.

FIG. 9 is a partial sectional view of a test device 2 according to an embodiment of the present invention. As shown in FIG. 9, this embodiment is almost the same as the test device 1 described above, but the bracket 100 has a first guide hole 140, a second guide hole 340, a first guide rod 150, and a second guide rod. The difference is that it further includes 160. A first guide hole 140 is formed in the platform 110. The second guide hole 340 is formed in the plate holder 300. The first guide rod 150 is locked to the plate holder 300 and movably disposed within the first guide hole 140 . The second guide rod 160 is locked to the platform 110 and movably located within the second guide hole 340, and the stud 540 is located between the first guide rod 150 and the second guide rod 160.

In this manner, when the lifting device 500 vertically raises the plate holder 300, both the first guide rod 150 and the second guide rod 160 in FIG. 6A can extend from the first guide hole 140 above. In contrast, the first guide rod 150 in FIG. 9 extends upward into the first guide hole 140 and the second guide rod 160 extends downward into the second guide hole 340, so that the plate holder 300 This allows the plate holder 300 to be raised and lowered more smoothly and prevents the plate holder 300 from rotating along with the stud 540.

As described above, with the structure described in each of the above embodiments, the probe card can be vertically raised and lowered, so that all the probes are smoothly inserted vertically and electrically connected to the probe holes. can perform subsequent testing processes on the test equipment, reducing the risk of damaging the probe.

Finally, the embodiments disclosed above do not limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. , all of which are protected by the present invention. Therefore, the scope of protection of the present invention shall be defined by the attached claims for utility model registration.

1, 2 Test equipment
10 Positioning mechanism
20 Test stage
100 bracket
110 platform
111 Bottom
120 Support leg
130 Guide pin
140 First guide hole
150 1st guide rod
160 Second guide rod
200 probe card
210 Circuit board
211 Bottom
220 male connector
221 Probe
300 plate holder
310 Upper clamping plate
311 Rug
312 Notch
320 Lower clamping plate
321 Opening
322 Groove
323 Bottom
324 Top surface
330 Shaft attachment part
340 Second guide hole
350 Lifting space
400 quick release lock
410 T-shaped pivot
420 1st quick release fastener
421 Handle
422 base
423 links
500 Lifting device
510 Connection cover
511 Cover body
512 Through hole
513 Internal space
520 Bearing unit
530 tube body
531 Female thread part
540 stud
541 Male thread part
542 First end
543 Boss
544 Second end
550 Fixed part
551 Clip
552 Rock Bolt
560 Rotation operation unit
561 Turntable
562 Accommodation groove
563 Operation handle
600 positioning module
610 Extension unit
611 Lateral support arm
612 Vertical support arm
613 1st sheet
614 2nd sheet
615 Hinge unit
616 First positioning hole
617 Second positioning hole
620 Positioning ring
621 pin
622 Accommodation space
630 Second quick release fastener
640 snap unit
641 Open hole
700 Support frame
710 Pedestal
720 pillar module
730 Guide groove
740 Position limiter
741 External connection member
742 Positioning protrusion
743 Laura
743A Axial center
744 External surface
800 test block
810 test slot
811 Test target device
820 side plate module
830 female connector
831 Probe hole
840 R-shaped hollow area
AA line segment
X, Y, Z axis direction

Claims (11)

a support frame; at least one test slot fixed to the support frame for accommodating at least one device under test; and at least one test slot located on the top of the support frame and electrically connected to the device under test, respectively. a test stage including at least one first connector including a plurality of probe holes;
a probe card having a bracket removably attached to the upper part of the support frame; a probe card having at least one second connector including a plurality of probes; , a plate holder in which the lower clamping plate has at least one opening, the upper clamping plate and the lower clamping plate sandwich the probe card, and the plurality of probes extend from the opening; The plurality of probes are respectively inserted vertically into the plurality of probe holes by being attached and fixed to the plate holder and used to raise and lower the plate holder, and by vertically lowering the plate holder. an alignment mechanism that includes a lifting device that can be electrically connected to the lifting device;
Test equipment for electronic products. The upper clamping plate has a plurality of notches, each of the plurality of notches is located at a plurality of side edges of the upper clamping plate,
The plate holder further includes a plurality of quick release locks each pivotally attached to a plurality of side edges of the lower clamping plate;
When the plurality of quick release locks respectively enter the plurality of notches from the lower clamping plate and respectively lock the plate holders, the plurality of quick release locks together lock the lower clamping plate and the upper clamping plate together. The electronic product testing device according to claim 1, which is tightly closed. The test stage further includes a plurality of position limiters located at least oppositely on the support frame,
The alignment mechanism further includes a plurality of positioning modules located at least oppositely on the bracket and each including an extension unit and a snap unit, one end of the extension unit is fixed to the bracket, and the snap unit is , located at the other end of the extension unit, and used for hooking onto one of the plurality of position limiters. Each of the plurality of position restriction parts is
an external connection member fixed to the outside of the support frame; and a roller pivotally provided on a surface of the external connection member facing the support frame;
The extension unit is
a lateral support arm having one end secured to the outside of the bracket;
a longitudinal support arm pivotally connected to the other end of the lateral support arm and extending toward the support frame;
The electronic product testing apparatus according to claim 3, wherein the snap unit includes an opening formed in the vertical support arm and for accommodating the roller. The longitudinal support arm is
a first sheet that is orthogonal to the lateral support arm;
a second sheet in which the aperture is located;
a hinge unit that pivotally connects the first seat and the second seat;
The electronic product testing device according to claim 4, comprising: The external connection member further includes a positioning protrusion, and the positioning protrusion and the opening are at the same height level;
The extension unit further includes a positioning ring movably located on the second sheet and surrounding the second sheet,
When the positioning ring is fitted to the positioning protrusion along the second sheet, the positioning ring is positioned on the second sheet such that the longitudinal support arm is positionally limited to the support frame. The electronic product testing device according to claim 5, wherein the opening is closed. The extension unit further includes a quick release fastener extending through the lateral support arm and pivotally attached to one end face of the longitudinal support arm;
5. The electronic product testing device according to claim 4, wherein when the quick release fastener locks the extension unit and pulls up the longitudinal support arm, the inner wall surface of the aperture synchronously abuts the roller. The support frame further includes a plurality of guide grooves formed in the upper part of the support frame,
The bracket is
platform and
are distributed at intervals on the bottom surface of the platform and both extend to the top of the support frame to define a lifting space between the platform and the support frame, and the plate holder is arranged in the lifting space. a plurality of support legs each passing through the plate holder so as to be able to reciprocate;
a plurality of guide pins extending outward from a surface of the lower clamping plate facing away from the upper clamping plate so as to removably extend into the plurality of guide grooves;
The electronic product testing device according to claim 1 or 2, comprising: The lifting device is
a connection cover fixedly covered by the upper holding plate;
a bearing unit located within the connection cover;
a tube that vertically passes through the platform and has an internal thread;
a stud that extends through the tubular body and into the connection cover, has a male threaded portion that is screwed into the female threaded portion, and has one end that extends pivotably to the bearing unit within the connection cover;
a fixing part that fixes the bearing unit to the connection cover and the stud;
including;
9. The electronic product testing apparatus according to claim 8, wherein when the stud rotates within the tube, the stud moves up and down along with the upper holding plate through the connection cover. The lifting device includes a rotation operation section,
The rotation operation section is
a rotary disk fixed to the other end of the stud, sharing an axis with the stud, and having a housing groove on a surface facing the plate holder;
further comprising an operating handle, one end of which is pivotally mounted within the receiving groove, for pivoting into and out of the receiving groove;
10. The electronic product testing apparatus according to claim 9, wherein when the operating handle is rotated to come out of the receiving groove and disengage from the axis of the stud, the operating handle can rotate the rotary disk. . The bracket is
a first guide hole drilled in the platform;
a first guide rod locked to the plate holder and movably located within the first guide hole;
a second guide hole drilled in the plate holder;
a second guide rod locked to the platform and movably located within the second guide hole;
further including;
The electronic product testing device according to claim 9, wherein the stud is located between the first guide rod and the second guide rod.

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