TWM622831U - Chip detection circuit and an apparatus including the same - Google Patents

Abstract

The present application provides a chip detection circuit and an apparatus including the same. The chip detection circuit includes an external adjustable capacitor connected with a switch circuit of a chip. A capacitance value of the external adjustable capacitor is adjusted based on a to-be-detected gear of a compensation capacitor, so that a control module determines whether the compensation capacitor works normally in a current gear based on whether a received capacitance data is within a preset range. That is, various gears of the compensation capacitor in the chip are detected based on different capacitance values of the external adjustable capacitors, and whether the compensation capacitor works normally in each gear is determined.

Description

Wafer inspection circuit and equipment

This creation relates to the field of electronics, in particular to a chip detection circuit and equipment.

The touch chip in the prior art needs to be tested before it is put into use. When detecting the compensation capacitance in the touch chip, the detection circuit in the prior art is shown in FIG. 1 , which is the wafer detection circuit in the prior art. Schematic diagram of the structure, one end of the external capacitor C1 is grounded, and the other end is connected to the first end of the compensation capacitor 101, the negative input end of the amplifier 103 and the first end of the feedback capacitor 102 through the switch circuit S1 to the switch circuit Sn+1. The second terminal of 101 is grounded, the positive input terminal of the amplifier 103 is connected to the reference voltage output device 104, and the output terminal is connected to the second terminal of the feedback capacitor 102 and the input terminal of the analog-to-digital converter 105. When the compensation capacitor 101 is detected , first adjust the capacitance value of the compensation capacitor 101 to a preset value based on the capacitance value of the external capacitor C1 and the capacitance value of the feedback capacitor 102, and the analog-to-digital converter 105 collects the output voltage of the amplifier 103 to control the module 106, That is, the MCU (Microcontroller Unit) shown in the figure processes the voltage data collected by the analog-to-digital converter 105 and generates capacitance data. By judging whether the capacitance data is within the preset range, it is judged that the compensation capacitor 101 is in the Whether it can work normally when the preset capacitance value is used. Although when the external capacitor C1 is connected, several gears can be adjusted up or down based on the preset capacitance value of the compensation capacitor 101, so as to determine whether the capacitance data output by the control module 106 is within the expected preset range, but the compensation The capacitor 101 has many gears. If the multiple gears of the compensation capacitor are adjusted only when the external capacitor C1 is connected, the amplifier 103 will work in the saturation region. Even if the gear of the compensation capacitor 101 is adjusted, the analog-to-digital converter 105 will The change of the output of the amplifier 103 cannot be collected, therefore, it cannot be guaranteed that the touch screen can work normally after the touch chip is put into use.

The purpose of this creation is to provide a chip detection circuit and device, which can detect each gear of the compensation capacitor in the chip based on the different capacitance values of the external adjustable capacitor, and judge whether the compensation capacitor can work normally in each gear. .

In order to solve the above technical problems, the present invention provides a chip detection circuit, the chip includes a switch circuit, a compensation capacitor, an analog-to-digital converter and a control module, and the detection circuit includes:

The first end is grounded, and the second end is connected to the external adjustable capacitor of the switch circuit in the chip, which is used to adjust its own capacitance value based on the gear position to be measured of the compensation capacitor, so as to adjust the capacitance in the chip. Compensation capacitor for each gear to detect;

The control module is configured to generate corresponding capacitance data based on the voltage collected by the analog-to-digital converter, and determine whether the compensation capacitance is in the current gear based on the judgment of whether the capacitance data is within a preset range. normal work;

The preset range corresponds to the current capacitance value of the external adjustable capacitor and the current gear position of the compensation capacitor.

Preferably, the wafer includes a plurality of the switch circuits;

The external adjustable capacitor includes:

The first ends are all grounded, and the second ends are respectively connected with a plurality of the switch circuits of the chip and a plurality of external capacitors with different capacitance values, used for adjusting the circuit in the chip based on the conduction state of each of the switch circuits. Each gear of the compensation capacitor is detected.

Preferably, the control signal output end of the control module is connected to the control end of the compensation capacitor, and is also used for adjusting the gear position of the compensation capacitor based on the current capacitance value of the external adjustable capacitor.

Preferably, it also includes:

The prompting module connected to the output end of the control module is used to give corresponding prompts to the user based on the judgment result of the control module.

Preferably, the prompt module is a voice prompt module and/or a display prompt module.

Preferably, the sound prompt module is a buzzer.

Preferably, the display prompt module is an indicator light.

The present creation also provides a wafer inspection device, including the wafer inspection circuit described above.

This creation provides a chip detection circuit and device, including an external adjustable capacitor connected to a switch circuit in the chip, and the capacitance value of the external adjustable capacitor can be adjusted based on the gear position to be tested of the compensation capacitor, so that the control module can Whether the compensation capacitor can work normally in the current gear is determined based on whether the received capacitance data is within the preset range, that is, based on the different capacitance values of the external adjustable capacitors, each gear of the compensation capacitor in the chip is detected and judged. Whether the compensation capacitor can work normally in each gear.

In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the prior art and the drawings that need to be used in the embodiments. Obviously, the drawings in the following description are only some implementations of the present invention. For example, for those with ordinary knowledge in the technical field, other schemas can also be obtained from these schemas on the premise of no creative effort.

The core of this creation is to provide a chip detection circuit, which can detect each gear of the compensation capacitor in the chip based on the different capacitance values of the external adjustable capacitor, and judge whether the compensation capacitor can work normally in each gear.

In order to make the purpose, technical solutions and advantages of this creative embodiment more clear, the technical solutions in this creative embodiment will be described clearly and completely below in conjunction with the drawings in this creative embodiment. Obviously, the described embodiment It is a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments in this creation, all other embodiments obtained by those with ordinary knowledge in the technical field without creative work shall fall within the scope of protection of this creation.

Please refer to FIG. 2 , which is a schematic structural diagram of a chip inspection circuit provided by the present invention.

The chip 2 includes a switch circuit, a compensation capacitor 101, an analog-to-digital converter 105 and a control module 106. The detection circuit includes:

The first end is grounded, and the second end is connected to the external adjustable capacitor 1 in the switch circuit in the chip 2, which is used to adjust its own capacitance value based on the gear to be measured of the compensation capacitor 101, so as to adjust the compensation capacitor 101 in the chip 2. Each gear is tested;

The control module 106 is configured to generate corresponding capacitance data based on the voltage collected by the analog-to-digital converter 105, and determine whether the compensation capacitor 101 can work normally in the current gear based on the judgment of whether the capacitance data is within a preset range;

The preset range corresponds to the current capacitance value of the external adjustable capacitor 1 and the current gear position of the compensation capacitor 101 .

The chip in the prior art is used to detect the capacitance change of the touch screen, so as to realize the normal use of the touch screen, and it needs to be tested before it is put into use. The existing chip detection circuit is shown in Figure 1. The principle is to adjust the capacitance value of the compensation capacitor 101 to the corresponding capacitance value based on the capacitance value of the external load capacitor C1 and the capacitance value of the feedback capacitor 102, and the compensation capacitor 101 transfers its own charge to the external load capacitor C1 and the inside of the chip 2. On the feedback capacitor 102, because inside the chip 2, one end of the compensation capacitor 101 is connected to one end of the feedback capacitor 102 and the negative input end of the amplifier 103, and the positive input end of the amplifier 103 has the reference voltage generated by the reference voltage output device 104. Therefore, the amplifier 103 can convert the change of the charge at the negative input terminal into a voltage change, the analog-to-digital converter 105 collects the voltage output by the amplifier 103, and the control module 106 processes the voltage collected by the analog-to-digital converter 105 and Generate capacitance data, so that the control module 106 can determine whether it is within the preset range based on the capacitance data output by itself. If it is within the preset range, it means that the compensation capacitor 101 is at the capacitance value, that is, the gear can work normally , if it is not within the preset range, it means that the compensation capacitor 101 is at this capacitance value, that is, the gear cannot work normally. In addition, the compensation capacitor 101 can be appropriately adjusted up or down several gears based on the current gear. , however, if the adjusted gears are too many, the amplifier 103 will work in a saturated state, and it is impossible to judge that the compensation capacitor 101 can work normally at the current gear. The working capacitance value is different. For example, when the touch screen is touched, its internal working capacitance value may be larger. When it is not touched, its inner working capacitance value may be smaller. If the compensation capacitor 101 is in some There is a situation in which the gear cannot work normally, which will cause the touch screen to not work normally. Therefore, only setting an external load capacitor C1 with a fixed capacitance value cannot detect all the gears of the compensation capacitor 101, and cannot guarantee the chip 2. Normal use.

In order to solve the above technical problems, an external adjustable capacitor 1 is set in this creation, and the capacitance value of the capacitor can be adjusted. The detection of multiple gears of the capacitor 101 ensures the normal use of the compensation capacitor 101 , that is, the normal use of the chip 2 .

Among them, the external adjustable capacitor 1 can be a capacitor with multiple gears, and its gears are set based on the gears of the compensation capacitor 101, and its capacitance value can be adjusted by adjusting the gears of the external adjustable capacitor 1; the external adjustable capacitor 1 can also be multiple external capacitors, please refer to FIG. 3 . FIG. 3 is a schematic diagram of the specific structure of the chip detection circuit provided for this creation. The capacitance value of each external capacitor is different, and the capacitance value of each external capacitor is based on the compensation capacitor 101. The gear position is determined, each external capacitor is connected to the switch circuit inside the chip 2 in a time-sharing manner, and the capacitance value of the external adjustable capacitor 1 can be changed by controlling the turn-on and turn-off of the switch in the switch circuit. It can be turned on independently, or any number of switches can be turned on at the same time each time, which is specifically based on the gear setting of the compensation capacitor 101 . The present invention does not limit the specific form of the external adjustable capacitor 1 , its gear position or the number of external capacitors, as long as all gear positions of the compensation capacitor 101 can be detected.

In addition, the preset range in this creation is determined based on the current capacitance value of the external adjustable capacitor 1, and the compensation capacitor 101 can be adjusted up or down as appropriate. If the capacitance data is within the preset range, it can be determined that the compensation capacitor 101 can work normally in these gears. However, when the gears of the compensation capacitor 101 are adjusted, it can be ensured that the amplifier 103 does not work in a saturated state.

It should be noted that the control module 106 in this embodiment is an MCU of an IC (integrated circuit, integrated circuit), and other embodiments may also be an off-chip single-chip microcomputer or a PC (Personal Computer, personal computer).

To sum up, the capacitance value of the external adjustable capacitor 1 can be adjusted based on the gear position of the compensation capacitor 101 to be measured, so that the control module 106 determines whether the compensation capacitor 101 is in the current gear based on whether the received capacitance data is within the preset range. Whether the position can work normally, that is, based on the different capacitance values of the external adjustable capacitor 1, each gear of the compensation capacitor 101 in the chip is detected, and it is judged whether the compensation capacitor 101 can work normally in each gear.

On the basis of the above-mentioned embodiment:

As a preferred embodiment, the wafer 2 includes a plurality of switch circuits;

External adjustable capacitor 1 includes:

The first ends are all grounded, and the second ends are respectively connected to a plurality of switch circuits of the chip 2 and a plurality of external capacitors with different capacitance values, which are used for each gear of the compensation capacitor 101 in the chip 2 based on the conduction state of each switch circuit. detection.

In this embodiment, the external adjustable capacitor 1 may be a plurality of external capacitors, namely C1 to Cn+1 in FIG. 3 , the capacitance values of each external capacitor are different, and the capacitance value of each external capacitor is based on each level of the compensation capacitor 101 . The position is determined, each external capacitor is connected to a plurality of switch circuits inside the chip 2, that is, the switch circuits S1 to Sn+1, and the change of the capacitance value of the external capacitor is realized by controlling the turn-on and turn-off of the switches in the switch circuit. .

Of course, the number of external capacitors is not limited in this creation, and it is sufficient to detect each gear of the compensation capacitor 101 .

As a preferred embodiment, the control signal output end of the control module 106 is connected to the control end of the compensation capacitor 101 , and is also used to adjust the gear position of the compensation capacitor 101 based on the current capacitance value of the external adjustable capacitor 1 . The control module in this embodiment can also adjust the gear of the compensation capacitor 101 , so as to facilitate the detection of each gear of the compensation capacitor 101 .

As a preferred embodiment, it also includes:

The prompting module connected to the output end of the control module 106 is used to give corresponding prompts to the user based on the judgment result of the control module 106 .

In this embodiment, considering that when the control module 106 detects that the compensation capacitor 101 cannot work normally in the current gear, it needs to notify the staff in time for processing, so a prompt module is added. After the control module 106 detects that the compensation capacitor 101 cannot work normally at the current gear, the control prompting module sends a prompt to prompt the staff to process the wafer to be tested, that is, the wafer 2 .

As a preferred embodiment, the prompt module is a voice prompt module and/or a display prompt module.

In this embodiment, the prompt module includes a voice prompt module or a display prompt module. The sound prompt module can issue a sound prompt, and the display prompt module can issue a light prompt.

Specifically, the prompt module may only include a voice prompt module or a display prompt module, and the prompt module may also include a voice prompt module and a display prompt module at the same time. Wherein, when the prompt module can include both a voice prompt module and a display prompt module, in a relatively noisy working environment, the staff cannot hear the voice prompt, but can know that the control module 106 detects the detection by the display prompt module. The compensation capacitor 101 cannot work normally in the current gear; when the display prompt module cannot be seen within the staff's field of vision, the control module 106 can know that the control module 106 detects that the compensation capacitor 101 is in the current gear through the voice prompt module. does not work properly for faster processing of the wafer under test.

As a preferred embodiment, the sound prompt module is a buzzer.

In this embodiment, a buzzer is selected as the sound prompt module, and the buzzer can realize sound prompt.

In addition, the buzzer also has the characteristics of low cost and high sensitivity.

As a preferred embodiment, the display prompt module is an indicator light.

In this embodiment, the indicator light is selected as the display prompt module, and the indicator light can realize the prompting of the light.

In addition, the light-emitting diode also has the advantage of low cost, and can share a control port with the buzzer.

Of course, the display prompt module in this creation is not limited to the selection of indicator lights, and light-emitting diodes can also be used.

The present creation also provides a wafer inspection device, including the above wafer inspection circuit.

The wafer detection device in this creation has the same beneficial effects as the above-mentioned wafer detection circuit, which will not be repeated in this creation.

It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is no such actual relationship or sequence between operations. Moreover, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device that includes a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.

The above description of the disclosed embodiments enables any person of ordinary skill in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Thus, the present invention is not intended to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

1: External adjustable capacitor 2: Wafer 101: Compensation capacitor 102: Feedback capacitor 103: Amplifier 104: Reference voltage output device 105: Analog to Digital Converter 106: Control Module C1… Cn+1: External capacitors S1...Sn+1: switch circuit

1 is a schematic structural diagram of a wafer detection circuit in the prior art; FIG. 2 is a schematic structural diagram of a chip detection circuit provided for this creation; FIG. 3 is a schematic structural diagram of a wafer detection circuit provided by the present invention.

1: External adjustable capacitor

2: Wafer

Claims (8)

A wafer detection circuit, comprising: a chip and a detection circuit, the chip includes a switch circuit, a compensation capacitor, an analog-to-digital converter and a control module, the detection circuit includes an external adjustable capacitor; A first end of the external adjustable capacitor is grounded, and a second end is connected to the switch circuit in the chip, and is used to adjust its own capacitance value based on the gear to be measured of the compensation capacitor, so that the Compensation capacitor for each gear to detect; The control module is used to generate a corresponding capacitance data based on the voltage collected by the analog-to-digital converter, and determine whether the compensation capacitor can work normally in the current gear based on the judgment of whether the capacitance data is within a preset range ;and The preset range corresponds to the current capacitance value of the external adjustable capacitor and the current gear position of the compensation capacitor. The chip detection circuit of claim 1, wherein the chip includes a plurality of the switch circuits; The external adjustable capacitor includes: The first ends are all grounded, and the second ends are respectively connected with a plurality of the switch circuits of the chip and a plurality of external capacitors with different capacitance values, used for the compensation capacitor in the chip based on the conduction state of each of the switch circuits. Each gear is tested. The chip detection circuit according to claim 1, wherein the control signal output end of the control module is connected to the control end of the compensation capacitor, and is also used for setting the position of the compensation capacitor based on the current capacitance value of the external adjustable capacitor bit to adjust. The wafer detection circuit according to claim 1, further comprising: A prompting module connected to the output end of the control module is used to give corresponding prompts to the user based on the judgment result of the control module. The chip detection circuit according to claim 4, wherein the prompt module is a voice prompt module and/or a display prompt module. The chip detection circuit of claim 5, wherein the sound prompting module is a buzzer. The chip detection circuit according to claim 5, wherein the display prompt module is an indicator light. A wafer inspection equipment, comprising: a chip detection circuit, the chip detection circuit includes a chip and a detection circuit, the chip includes a switch circuit, a compensation capacitor, an analog-to-digital converter and a control module, and the detection circuit includes an external adjustable capacitor; A first end of the external adjustable capacitor is grounded, and a second end is connected to the switch circuit in the chip, and is used to adjust its own capacitance value based on the gear to be measured of the compensation capacitor, so that the Compensation capacitor for each gear to detect; The control module is used to generate a corresponding capacitance data based on the voltage collected by the analog-to-digital converter, and determine whether the compensation capacitor can work normally in the current gear based on the judgment of whether the capacitance data is within a preset range ;and The preset range corresponds to the current capacitance value of the external adjustable capacitor and the current gear position of the compensation capacitor.

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