TWM622831U - Chip detection circuit and an apparatus including the same - Google Patents
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Abstract
Description
本創作涉及電子領域,特別是涉及一種晶片檢測電路及設備。This creation relates to the field of electronics, in particular to a chip detection circuit and equipment.
現有技術中的觸摸晶片在投入使用前需要對其進行檢測,在對觸摸晶片中的補償電容進行檢測時,現有技術中的檢測電路如圖1所示,圖1為現有技術中的晶片檢測電路的結構示意圖,外部電容C1的一端接地,另一端通過開關電路S1至開關電路Sn+1與補償電容101的第一端、放大器103的負輸入端及反饋電容102的第一端連接,補償電容101的第二端接地,放大器103的正輸入端與參考電壓輸出裝置104連接,輸出端與反饋電容102的第二端及模數轉換器105的輸入端連接,在對補償電容101進行檢測時,先基於外部電容C1的容值及反饋電容102的容值將補償電容101的容值調至預設容值,模數轉換器105通過對放大器103的輸出電壓進行採集,控制模組106,即圖中所示MCU (Microcontroller Unit,微控制單元),對模數轉換器105採集的電壓數據進行處理並生成電容數據,通過判斷該電容數據是否在預設範圍內,從而判斷補償電容101在預設容值時是否能夠正常工作。雖然在連接外部電容C1時也可以基於補償電容101的預設容值向上或向下調節幾個檔位元,從而判斷控制模組106輸出的電容數據是否在期望的預設範圍內,然而補償電容101的檔位較多,若只在連接外部電容C1時便調節補償電容的多個檔位,會使放大器103工作在飽和區,即便調節補償電容101的檔位,模數轉換器105也無法採集到放大器103輸出的變化,因此,無法保證觸摸晶片在投入使用後能夠保證觸控螢幕正常工作。The touch chip in the prior art needs to be tested before it is put into use. When detecting the compensation capacitance in the touch chip, the detection circuit in the prior art is shown in FIG. 1 , which is the wafer detection circuit in the prior art. Schematic diagram of the structure, one end of the external capacitor C1 is grounded, and the other end is connected to the first end of the
本創作的目的是提供一種晶片檢測電路及設備,基於外部可調電容不同的容值實現對晶片中的補償電容的各個檔位進行檢測,並判斷所述補償電容在各個檔位能否正常工作。The purpose of this creation is to provide a chip detection circuit and device, which can detect each gear of the compensation capacitor in the chip based on the different capacitance values of the external adjustable capacitor, and judge whether the compensation capacitor can work normally in each gear. .
為解決上述技術問題,本創作提供了一種晶片檢測電路,所述晶片包括開關電路、補償電容、模數轉換器以及控制模組,所述檢測電路包括:In order to solve the above technical problems, the present invention provides a chip detection circuit, the chip includes a switch circuit, a compensation capacitor, an analog-to-digital converter and a control module, and the detection circuit includes:
第一端接地,第二端與所述晶片中的所述開關電路連接的外部可調電容,用於基於所述補償電容的待測檔位調節自身的容值,以對所述晶片中的補償電容的各個檔位進行檢測;The first end is grounded, and the second end is connected to the external adjustable capacitor of the switch circuit in the chip, which is used to adjust its own capacitance value based on the gear position to be measured of the compensation capacitor, so as to adjust the capacitance in the chip. Compensation capacitor for each gear to detect;
所述控制模組用於基於所述模數轉換器採集到的電壓生成相應的電容數據,並基於對所述電容數據是否在預設範圍內的判斷確定所述補償電容在當前檔位能否正常工作;The control module is configured to generate corresponding capacitance data based on the voltage collected by the analog-to-digital converter, and determine whether the compensation capacitance is in the current gear based on the judgment of whether the capacitance data is within a preset range. normal work;
所述預設範圍與所述外部可調電容的當前容值及所述補償電容的當前檔位對應。The preset range corresponds to the current capacitance value of the external adjustable capacitor and the current gear position of the compensation capacitor.
優選地,所述晶片包括多個所述開關電路;Preferably, the wafer includes a plurality of the switch circuits;
所述外部可調電容包括:The external adjustable capacitor includes:
第一端均接地,第二端分別與所述晶片的多個所述開關電路連接且容值不同的多個外部電容,用於基於各個所述開關電路的導通狀態對所述晶片中所述補償電容的各個檔位進行檢測。The first ends are all grounded, and the second ends are respectively connected with a plurality of the switch circuits of the chip and a plurality of external capacitors with different capacitance values, used for adjusting the circuit in the chip based on the conduction state of each of the switch circuits. Each gear of the compensation capacitor is detected.
優選地,所述控制模組的控制信號輸出端與所述補償電容的控制端連接,還用於基於所述外部可調電容當前的容值對所述補償電容的檔位進行調節。Preferably, the control signal output end of the control module is connected to the control end of the compensation capacitor, and is also used for adjusting the gear position of the compensation capacitor based on the current capacitance value of the external adjustable capacitor.
優選地,還包括:Preferably, it also includes:
與所述控制模組的輸出端連接的提示模組,用於基於所述控制模組的判斷結果對用戶進行相應的提示。The prompting module connected to the output end of the control module is used to give corresponding prompts to the user based on the judgment result of the control module.
優選地,所述提示模組為聲音提示模組和/或顯示提示模組。Preferably, the prompt module is a voice prompt module and/or a display prompt module.
優選地,所述聲音提示模組為蜂鳴器。Preferably, the sound prompt module is a buzzer.
優選地,所述顯示提示模組為指示燈。Preferably, the display prompt module is an indicator light.
本創作還提供了一種晶片檢測設備,包括如上述所述的晶片檢測電路。The present creation also provides a wafer inspection device, including the wafer inspection circuit described above.
本創作提供了一種晶片檢測電路及設備,包括與晶片中的開關電路連接的外部可調電容,基於補償電容的待測檔位可對外部可調電容的容值進行調節,從而使控制模組基於接收到的電容數據是否在預設範圍內確定補償電容在當前檔位能否正常工作,即基於外部可調電容不同的容值實現對晶片中的補償電容的各個檔位進行檢測,並判斷補償電容在各個檔位能否正常工作。This creation provides a chip detection circuit and device, including an external adjustable capacitor connected to a switch circuit in the chip, and the capacitance value of the external adjustable capacitor can be adjusted based on the gear position to be tested of the compensation capacitor, so that the control module can Whether the compensation capacitor can work normally in the current gear is determined based on whether the received capacitance data is within the preset range, that is, based on the different capacitance values of the external adjustable capacitors, each gear of the compensation capacitor in the chip is detected and judged. Whether the compensation capacitor can work normally in each gear.
為了更清楚地說明本創作實施例中的技術方案,下面將對現有技術和實施例中所需要使用的圖式作簡單地介紹,顯而易見地,下面描述中的圖式僅僅是本創作的一些實施例,對於所屬技術領域中具有通常知識者來講,在不付出創造性勞動的前提下,還可以根據這些圖式獲得其他的圖式。In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the prior art and the drawings that need to be used in the embodiments. Obviously, the drawings in the following description are only some implementations of the present invention. For example, for those with ordinary knowledge in the technical field, other schemas can also be obtained from these schemas on the premise of no creative effort.
本創作的核心是提供一種晶片檢測電路,基於外部可調電容不同的容值實現對晶片中的補償電容的各個檔位進行檢測,並判斷補償電容在各個檔位能否正常工作。The core of this creation is to provide a chip detection circuit, which can detect each gear of the compensation capacitor in the chip based on the different capacitance values of the external adjustable capacitor, and judge whether the compensation capacitor can work normally in each gear.
為使本創作實施例的目的、技術方案和優點更加清楚,下面將結合本創作實施例中的圖式,對本創作實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例是本創作一部分實施例,而不是全部的實施例。基於本創作中的實施例,所屬技術領域中具有通常知識者在沒有做出創造性勞動前提下所獲得的所有其他實施例,都屬於本創作保護的範圍。In order to make the purpose, technical solutions and advantages of this creative embodiment more clear, the technical solutions in this creative embodiment will be described clearly and completely below in conjunction with the drawings in this creative embodiment. Obviously, the described embodiment It is a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments in this creation, all other embodiments obtained by those with ordinary knowledge in the technical field without creative work shall fall within the scope of protection of this creation.
請參照圖2,圖2為本創作提供的晶片檢測電路的結構示意圖。Please refer to FIG. 2 , which is a schematic structural diagram of a chip inspection circuit provided by the present invention.
晶片2包括開關電路、補償電容101、模數轉換器105以及控制模組106,該檢測電路包括:The
第一端接地,第二端與晶片2中的開關電路連接的外部可調電容1,用於基於補償電容101的待測檔位調節自身的容值,以對晶片2中的補償電容101的各個檔位進行檢測;The first end is grounded, and the second end is connected to the external
控制模組106用於基於模數轉換器105採集到的電壓生成相應的電容數據,並基於對電容數據是否在預設範圍內的判斷確定補償電容101在當前檔位能否正常工作;The
預設範圍與外部可調電容1的當前容值及補償電容101的當前檔位對應。The preset range corresponds to the current capacitance value of the external
現有技術中的晶片用於檢測觸控螢幕的電容變化,從而實現觸控螢幕的正常使用,且在投入使用前需要對其進行檢測,現如今已有的晶片檢測電路如圖1所示,其原理為基於外部的負載電容C1的容值和反饋電容102的容值將補償電容101的容值調至對應的容值,補償電容101將自身的電荷傳輸至外部的負載電容C1和晶片2內部的反饋電容102上,由於在晶片2內部,補償電容101的一端與反饋電容102的一端及放大器103的負輸入端連接,放大器103的正輸入端存在由參考電壓輸出裝置104生成的參考電壓的輸入,因此,放大器103能夠將負輸入端電荷的變化轉換為電壓的變化,模數轉換器105對放大器103輸出的電壓進行採集,控制模組106對模數轉換器105採集的電壓進行處理並生成電容數據,從而使控制模組106基於自身輸出的電容數據判斷其是否在預設範圍內,若在預設範圍內,則說明補償電容101在該容值,也即該檔位能夠正常工作,若不在預設範圍內,則說明補償電容101在該容值,也即該檔位不能正常工作,此外,也可以適當地對補償電容101基於當前檔位向上或向下調節幾個檔位,但是,若調節的檔位太多,會導致放大器103工作在飽和狀態,而無法判斷補償電容101在當前檔位能夠正常工作,且由於觸控螢幕在被觸摸以及未被觸摸時,其內部工作的電容容值不同,例如,觸控螢幕被觸摸時,其內部工作的電容容值可能較大,未被觸摸時,其內部工作的電容容值可能較小,若補償電容101在某些檔位時存在不能正常工作的情況,會導致觸控螢幕無法正常工作,因此,只設置一個固定容值的外部的負載電容C1無法對補償電容101所有的檔位進行檢測,無法保證晶片2的正常使用。The chip in the prior art is used to detect the capacitance change of the touch screen, so as to realize the normal use of the touch screen, and it needs to be tested before it is put into use. The existing chip detection circuit is shown in Figure 1. The principle is to adjust the capacitance value of the
為了解決上述技術問題,本創作中設置了外部可調電容1,該電容的容值可調,可基於補償電容101所有的檔位對外部可調電容1的容值進行調節,從而能夠對補償電容101的多個檔位進行檢測,保證了補償電容101的正常使用,也即保證了晶片2的正常使用。In order to solve the above technical problems, an external
其中,外部可調電容1可以為具有多個檔位的電容,其檔位基於補償電容101的檔位設定,通過調節外部可調電容1的檔位以實現調節其容值;外部可調電容1還可以為多個外部電容,請參照圖3,圖3為本創作提供的晶片檢測電路具體的結構示意圖,各個外部電容的容值不同,且各個外部電容的容值基於補償電容101的各個檔位確定,各個外部電容分時與晶片2內部的開關電路連接,通過對開關電路中開關的導通與關斷的控制,實現對外部可調電容1的容值的改變,每個開關可依次單獨導通,也可以是每次任意多個開關同時導通,具體基於補償電容101的檔位設定。本創作對外部可調電容1的具體形式,及其檔位或外部電容的個數不作限定,能夠實現將補償電容101的所有檔位均檢測到即可。Among them, the external
此外,本創作中的預設範圍為基於外部可調電容1當前的容值確定,可以對補償電容101適當的進行向上調節檔位或向下調節檔位,若調節後控制模組106輸出的電容數據在預設範圍內,則可以確定補償電容101在這幾個檔位均能正常工作,但是,對補償電容101的檔位進行調節時,能夠保證放大器103不工作在飽和狀態即可。In addition, the preset range in this creation is determined based on the current capacitance value of the external
需要說明的是,本實施例中的控制模組106為IC(integrated circuit,積體電路)的MCU,其它實施方式中也可以為晶片外的單片機或PC(Personal Computer,個人電腦)。It should be noted that the
綜上,基於補償電容101的待測檔位可對外部可調電容1的容值進行調節,從而使控制模組106基於接收到的電容數據是否在預設範圍內確定補償電容101在當前檔位能否正常工作,即基於外部可調電容1不同的容值實現對晶片中的補償電容101的各個檔位進行檢測,並判斷補償電容101在各個檔位能否正常工作。To sum up, the capacitance value of the external
在上述實施例的基礎上:On the basis of the above-mentioned embodiment:
作為一種優選的實施例,晶片2包括多個開關電路;As a preferred embodiment, the
外部可調電容1包括:External
第一端均接地,第二端分別與晶片2的多個開關電路連接且容值不同的多個外部電容,用於基於各個開關電路的導通狀態對晶片2中補償電容101的各個檔位進行檢測。The first ends are all grounded, and the second ends are respectively connected to a plurality of switch circuits of the
本實施例中,外部可調電容1可以為多個外部電容,即圖3中的C1至Cn+1,各個外部電容的容值不同,且各個外部電容的容值基於補償電容101的各個檔位確定,各個外部電容分別與晶片2內部的多個開關電路,即開關電路S1至Sn+1連接,通過對開關電路中開關的導通與關斷的控制,實現對外部電容的容值的改變。In this embodiment, the external
當然,本創作中對外部電容的個數不作限定,能夠實現對補償電容101的各個檔位進行檢測即可。Of course, the number of external capacitors is not limited in this creation, and it is sufficient to detect each gear of the
作為一種優選的實施例,控制模組106的控制信號輸出端與補償電容101的控制端連接,還用於基於外部可調電容1當前的容值對補償電容101的檔位進行調節。本實施例中的控制模組還能夠對補償電容101的擋位進行調節,從而便於對補償電容101的各個擋位進行檢測。As a preferred embodiment, the control signal output end of the
作為一種優選的實施例,還包括:As a preferred embodiment, it also includes:
與控制模組106的輸出端連接的提示模組,用於基於控制模組106的判斷結果對用戶進行相應的提示。The prompting module connected to the output end of the
本實施例中,考慮到控制模組106檢測到補償電容101於當前的檔位無法正常工作時需要及時告知工作人員進行處理,因此,加入了提示模組。控制模組106檢測到補償電容101於當前的檔位無法正常工作後,控制提示模組發出提示,以提示工作人員對待測晶片,即晶片2進行處理。In this embodiment, considering that when the
作為一種優選的實施例,提示模組為聲音提示模組和/或顯示提示模組。As a preferred embodiment, the prompt module is a voice prompt module and/or a display prompt module.
本實施例中,提示模組包括聲音提示模組或顯示提示模組。聲音提示模組可以發出聲音的提示,顯示提示模組可以發出燈光的提示。In this embodiment, the prompt module includes a voice prompt module or a display prompt module. The sound prompt module can issue a sound prompt, and the display prompt module can issue a light prompt.
具體地,提示模組可以僅包括聲音提示模組或顯示提示模組,提示模組還可以同時包括聲音提示模組和顯示提示模組。其中,在提示模組可以同時包括聲音提示模組和顯示提示模組時,較為嘈雜的工作環境下,工作人員聽不到聲音的提示,但是可以通過顯示提示模組得知控制模組106檢測到補償電容101於當前的檔位無法正常工作;當工作人員視野範圍內看不到顯示提示模組時,可以通過聲音提示模組得知控制模組106檢測到補償電容101於當前的檔位無法正常工作,以便更快地對待測晶片進行處理。Specifically, the prompt module may only include a voice prompt module or a display prompt module, and the prompt module may also include a voice prompt module and a display prompt module at the same time. Wherein, when the prompt module can include both a voice prompt module and a display prompt module, in a relatively noisy working environment, the staff cannot hear the voice prompt, but can know that the
作為一種優選的實施例,聲音提示模組為蜂鳴器。As a preferred embodiment, the sound prompt module is a buzzer.
本實施例中,選用蜂鳴器作為聲音提示模組,蜂鳴器能夠實現聲音的提示。In this embodiment, a buzzer is selected as the sound prompt module, and the buzzer can realize sound prompt.
此外,蜂鳴器還具有成本低,靈敏度高的特點。In addition, the buzzer also has the characteristics of low cost and high sensitivity.
作為一種優選的實施例,顯示提示模組為指示燈。As a preferred embodiment, the display prompt module is an indicator light.
本實施例中,選用指示燈作為顯示提示模組,指示燈能夠實現燈光的提示。In this embodiment, the indicator light is selected as the display prompt module, and the indicator light can realize the prompting of the light.
此外,發光二極體還具有成本低的優點,可以和蜂鳴器共用一個控制口。In addition, the light-emitting diode also has the advantage of low cost, and can share a control port with the buzzer.
當然,本創作中顯示提示模組並不限定選用指示燈,還可以選用發光二極體。Of course, the display prompt module in this creation is not limited to the selection of indicator lights, and light-emitting diodes can also be used.
本創作還提供了一種晶片檢測設備,包括如上述的晶片檢測電路。The present creation also provides a wafer inspection device, including the above wafer inspection circuit.
本創作中的晶片檢測設備具有和上述晶片檢測電路相同的有益效果,本創作對此不再贅述。The wafer detection device in this creation has the same beneficial effects as the above-mentioned wafer detection circuit, which will not be repeated in this creation.
還需要說明的是,在本說明書中,諸如第一和第二等之類的關係術語僅僅用來將一個實體或者操作與另一個實體或操作區分開來,而不一定要求或者暗示這些實體或操作之間存在任何這種實際的關係或者順序。而且,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者設備不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者設備所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括所述要素的過程、方法、物品或者設備中還存在另外的相同要素。It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is no such actual relationship or sequence between operations. Moreover, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device that includes a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.
對所公開的實施例的上述說明,使所屬技術領域中具有通常知識者能夠實現或使用本創作。對這些實施例的多種修改對本領域的專業技術人員來說將是顯而易見的,本文中所定義的一般原理可以在不脫離本創作的精神或範圍的情況下,在其他實施例中實現。因此,本創作將不會被限制于本文所示的這些實施例,而是要符合與本文所公開的原理和新穎特點相一致的最寬的範圍。The above description of the disclosed embodiments enables any person of ordinary skill in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Thus, the present invention is not intended to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
1:外部可調電容 2:晶片 101:補償電容 102:反饋電容 103:放大器 104:參考電壓輸出裝置 105:模數轉換器 106:控制模組 C1… Cn+1:外部電容 S1…Sn+1:開關電路1: External adjustable capacitor 2: Wafer 101: Compensation capacitor 102: Feedback capacitor 103: Amplifier 104: Reference voltage output device 105: Analog to Digital Converter 106: Control Module C1… Cn+1: External capacitors S1...Sn+1: switch circuit
圖1為現有技術中的晶片檢測電路的結構示意圖; 圖2為本創作提供的晶片檢測電路的結構示意圖; 圖3為本創作提供的晶片檢測電路具體的結構示意圖。 1 is a schematic structural diagram of a wafer detection circuit in the prior art; FIG. 2 is a schematic structural diagram of a chip detection circuit provided for this creation; FIG. 3 is a schematic structural diagram of a wafer detection circuit provided by the present invention.
1:外部可調電容 1: External adjustable capacitor
2:晶片 2: Wafer
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CN202120441402.0U CN215005736U (en) | 2021-03-01 | 2021-03-01 | Chip detection circuit and equipment |
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