TWM602206U - Equipment for object detection - Google Patents

Equipment for object detection Download PDF

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Publication number
TWM602206U
TWM602206U TW108214721U TW108214721U TWM602206U TW M602206 U TWM602206 U TW M602206U TW 108214721 U TW108214721 U TW 108214721U TW 108214721 U TW108214721 U TW 108214721U TW M602206 U TWM602206 U TW M602206U
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Taiwan
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detection
infrared
object detection
carrier
detection according
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TW108214721U
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Chinese (zh)
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光榮 胡
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馬來西亞商正齊科技有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Abstract

本新型提供一種用於物件檢測的設備包括至少一具有蓋體的物件載體,其中設備還包括至少一紅外線(IR)相機、至少一紅外線照明、至少一帶通濾波器及個人電腦(PC)系統,該物件檢測的設備能夠對置放在該物件載體的至少一物件執行紅外線檢測。 The present model provides a device for object detection including at least one object carrier with a cover, wherein the device also includes at least one infrared (IR) camera, at least one infrared illuminator, at least one band pass filter and a personal computer (PC) system, The object detection device can perform infrared detection on at least one object placed on the object carrier.

Description

用於物件檢測的設備 Equipment for object detection

一種用於物件檢測的設備包括至少一具有蓋體的物件載體,其中該設備還包括至少一紅外線(IR)相機、至少一紅外線照明、至少一帶通濾波器及一個人電腦(PC)系統,該設備能夠對置放在該物件載體的至少一物件執行紅外線檢測。A device for object detection includes at least one object carrier with a cover, wherein the device also includes at least one infrared (IR) camera, at least one infrared illuminator, at least one band-pass filter, and a personal computer (PC) system. The infrared detection can be performed on at least one object placed on the object carrier.

現今,自動的或自動化光學檢測(AOI)機器是電子組件測試製程所用關鍵技術,自動化光學檢測使用可見光源照亮待量測物件的表面,並使用影像擷取裝置擷取待偵測物件之一。儘管如此,前述自動化光學檢測機器以及後端晶圓級晶片尺寸封裝(WLCSP)製程中的最終視覺檢測(FVI)機器並無法執行紅外線(IR)內部檢測,因此半導體裝置或組件上的內部缺陷將出貨到終端用戶或客戶而未被檢測出。Nowadays, automatic or automated optical inspection (AOI) machines are the key technology used in the electronic component testing process. Automatic optical inspection uses visible light sources to illuminate the surface of the object to be measured, and uses an image capture device to capture one of the objects to be detected . Nevertheless, the aforementioned automated optical inspection machines and final visual inspection (FVI) machines in the back-end wafer level wafer scale packaging (WLCSP) process cannot perform infrared (IR) internal inspections, so internal defects on semiconductor devices or components will Shipped to end users or customers without being detected.

Yoshihiro等人的日本專利JP 2000260376 A揭露了一種缺陷檢測裝置,其配備有線性掃描工作台控制裝置,其中XY線性掃描區域RB的範圍是矩形區域並在檢測晶圓W的表面中心位置W0含有指定面積,及分成具有指定掃描寬度的複數個帶狀部分,XY工作台驅動裝置受控制,使得電子束依序地掃描複數個帶狀部分;以及旋轉掃描工作台控制裝置,其中旋轉掃描區域RA形成在設於檢測晶圓W的表面上的矩形區域RB內側的內部設定圓W2及設於外側的外部設定圓W1之間,且其範圍分成具有指定掃描寬度的複數個環形部分RA0、RA1、...、RA1189,旋轉工作台驅動裝置受控制,使得電子束依序地掃描複數個環形部分。然而,JP 2000260376 A並未揭露使用紅外線(IR)的內部檢測,因此裝置內發生如崩裂或斷線將無法被檢測出。The Japanese patent JP 2000260376 A of Yoshihiro et al. discloses a defect inspection device equipped with a linear scanning table control device, wherein the range of the XY linear scanning area RB is a rectangular area and contains a specified position at the center position W0 of the surface of the inspected wafer W Area, and divided into a plurality of belt-shaped parts with a specified scanning width, the XY table driving device is controlled so that the electron beam scans the plurality of belt-shaped parts sequentially; and a rotating scanning table control device, wherein the rotating scanning area RA is formed Between the inner setting circle W2 provided on the inner side of the rectangular area RB on the surface of the inspection wafer W and the outer setting circle W1 provided on the outer side, and the range is divided into a plurality of ring portions RA0, RA1 having a designated scan width. .., RA1189, the driving device of the rotary table is controlled so that the electron beam scans a plurality of ring parts in sequence. However, JP 2000260376 A does not disclose the use of infrared (IR) internal detection. Therefore, cracks or disconnections in the device cannot be detected.

因此,具有用於紅外線(IR)檢測的系統將有利於減輕缺點,其中所述系統能夠同時檢測物件的每一側的內部及外部缺陷。Therefore, having a system for infrared (IR) inspection will help alleviate the shortcomings, where the system can simultaneously detect internal and external defects on each side of the object.

本新型的主要目的是提供一種用於紅外線(IR)檢測的系統,藉此所述系統能夠同時地檢測物件的頂部及底部的內部及外部缺陷之目的。The main purpose of the present invention is to provide a system for infrared (IR) detection, whereby the system can simultaneously detect internal and external defects on the top and bottom of an object.

本新型的另一個目的是提供一種用於物件檢測的設備,藉此所述系統能夠利用更大紅外線波長範圍提供更佳缺陷檢測範圍。Another object of the present invention is to provide a device for object detection, whereby the system can utilize a larger infrared wavelength range to provide a better defect detection range.

本新型的另一個目的是提供一種用於物件檢測的設備,藉此所述系統提供每個物件的可追溯性。Another object of the present invention is to provide a device for object detection, whereby the system provides traceability of each object.

本新型的另一個目的是提供一種用於物件檢測的設備,藉此所述系統目標0%受到拒絕及0%過度拒絕為不合格的單件時,將由使用者來判斷。Another object of the present invention is to provide a device for object detection, whereby the system target 0% rejected and 0% over rejected as unqualified items will be judged by the user.

本新型的另一個目的是提供一種用於物件檢測的設備,藉此所述系統能夠產生具有檢測結果的地圖檔案。Another object of the present invention is to provide a device for object detection, whereby the system can generate a map file with detection results.

藉由理解本新型的以下詳細描述或當本新型實際應用時,本新型的其他進一步目的將變得顯而易見。By understanding the following detailed description of the invention or when the invention is actually applied, other further purposes of the invention will become apparent.

根據本新型的較佳實施例,提供如下:According to a preferred embodiment of the present invention, the following are provided:

一種用於物件檢測的設備,包括:至少一具有蓋體的物件載體;該物件包括電子組件、晶粒、晶片或任何其他類似物件;其特徵在於:該物件檢測的設備能夠對置放在該物件載體的至少一該物件執行紅外線檢測,並包括至少一紅外線(IR)相機、至少一設置於該至少一紅外線(IR)相機一側的紅外線照明、至少一設置於該紅外線照明的帶通濾波器及一PC系統。 A device for object detection includes: at least one object carrier with a cover; the object includes electronic components, dies, chips, or any other similar objects; and is characterized in that: the object detection equipment can be placed opposite to the At least one of the objects of the object carrier performs infrared detection, and includes at least one infrared (IR) camera, at least one infrared illumination provided on one side of the at least one infrared (IR) camera, and at least one band-pass filter provided on the infrared illumination And a PC system.

(1):物件檢測的設備 (1): Equipment for object detection

(101):物件載體 (101): Object carrier

(103):蓋體 (103): Lid

(105):紅外線(IR)相機 (105): Infrared (IR) camera

(107):紅外線照明 (107): Infrared lighting

(109):帶通濾波器 (109): Band pass filter

(111):物件 (111): Object

(113):容置部 (113): Housing Department

(115):黏合表面 (115): Adhesive surface

圖1顯示本新型的實施例的結構示意圖。 Figure 1 shows a schematic structural diagram of an embodiment of the present invention.

圖2A顯示具有物件的托盤的實施例圖。 Fig. 2A shows an embodiment view of a tray with objects.

圖2B顯示具有物件的膠體包裝的實施例圖。 Fig. 2B shows a diagram of an embodiment of a gel package with objects.

圖3A顯示本新型的實施例的方法流程。 Figure 3A shows the method flow of an embodiment of the present invention.

圖3B顯示本新型的另一實施例的方法流程。 Figure 3B shows the method flow of another embodiment of the present invention.

在以下詳細說明中,闡述了許多具體細節,以提供對本新型的詳盡理解。然而,本技術領域中具通常技術者將理解,本新型可以在沒有這些具體細節的情況下實施。在其他情況下,習知的方法、程序及/或組件並未詳細描述,以免讓本新型變得晦澀難懂。 In the following detailed description, many specific details are explained to provide a detailed understanding of the present invention. However, those skilled in the art will understand that the present invention can be implemented without these specific details. In other cases, the conventional methods, procedures, and/or components are not described in detail, so as not to make the present invention obscure.

本新型將從以下實施例的描述更清楚地理解,該些實施例僅參考附圖舉例提供,且附圖並非按比例繪製。 The present invention will be understood more clearly from the description of the following embodiments, which are provided as examples with reference to the drawings, and the drawings are not drawn to scale.

如本揭露內容及在此所附申請專利範圍中所使用,單數形式“一”及“該”包括複數指稱物,除非上下文清楚地指示或另有說明。 As used in the present disclosure and in the scope of the attached patent application, the singular forms "a" and "the" include plural referents, unless the context clearly indicates or otherwise indicates.

在整份說明書之揭露內容及申請專利範圍中,詞語“包括”及其變化意指“包括、但不限於”,並且無意排除如其他組件、整體事物或步驟。“範例”意味著“一例”並且非意圖表達暗示較佳或理想實施例,“例如”並非用於限制性意義,而是用於解釋目的。 In the disclosure of the entire specification and the scope of the patent application, the word "including" and its variations mean "including, but not limited to", and it is not intended to exclude other components, whole things or steps. "Example" means "an example" and is not intended to imply a preferred or ideal embodiment. "For example" is not used in a restrictive sense but for explanatory purposes.

參考圖1所示,其顯示用於物件檢測的設備(1)的實施例圖,該物件檢測的設備(1)包括至少一具有蓋體(103)的物件載體(101);該物件(111)包括電子組件、晶粒、晶片或任何其他類似物件,該物件檢測的設備(1)能夠對置放在該物件載體(101)的至少一該物件(111)執行紅外線檢測,並包括至少一紅外線(IR)相機(105)、至少一設置於該至少一紅外線(IR)相機(105)一側的紅外線照明(107)、至少一設置於該紅外線照明(107)的帶通濾波器(109)及一PC系統。該物件載體(101)包括料帶、托盤、膠體包裝或任何適合的物件載體。該物件載體(101)還包括至少一容置部(113)來容納一個該物件(111)。該物件載體(101)材料是可供紅外線穿透的,以允許頂部紅外線檢測、底部紅外線檢測或其組合,且該物件(111)檢測包括內部檢測、外部檢測或其組合。該內部檢測包括內部裂縫、脫層、碎屑及污染,而該外部檢測包括碎屑、污染、裂縫等。該帶通濾波器(109)能夠過濾750奈米(nm)至3000奈米範圍的特定紅外線波長。該物件檢測的設備(1)還包括具有檢測結果的一地圖檔案,以提供每個物件的可追溯性。該地圖檔案包含容置部或物件坐標相對檢測結果,並 且從上游產生或在檢測後重新產生。該物件檢測的設備(1)還包括一部件計數機構,用以在檢測之後比較用戶鍵入值與實際單位。同時,該物件檢測的設備(1)還包括一標記機構,用以標記具有缺陷的物件(111)。 Refer to Figure 1, which shows an embodiment diagram of a device (1) for object detection. The device (1) for object detection includes at least one object carrier (101) with a cover (103); the object (111) ) Includes electronic components, dies, chips or any other similar objects. The object detection equipment (1) can perform infrared detection on at least one object (111) placed on the object carrier (101), and includes at least one An infrared (IR) camera (105), at least one infrared illuminator (107) provided on the side of the at least one infrared (IR) camera (105), and at least one band-pass filter (109) provided on the infrared illuminator (107) ) And a PC system. The object carrier (101) includes a tape, a tray, a gel package or any suitable object carrier. The object carrier (101) also includes at least one accommodating portion (113) to accommodate one object (111). The material of the object carrier (101) can be penetrated by infrared rays to allow top infrared detection, bottom infrared detection or a combination thereof, and the object (111) detection includes internal detection, external detection or a combination thereof. The internal inspection includes internal cracks, delamination, debris, and pollution, while the external inspection includes debris, pollution, cracks, and so on. The band pass filter (109) can filter specific infrared wavelengths ranging from 750 nanometers (nm) to 3000 nanometers. The object detection equipment (1) also includes a map file with detection results to provide the traceability of each object. The map file contains the relative detection result of the accommodating part or object coordinate, and And produced from upstream or reproduced after detection. The object detection device (1) also includes a component counting mechanism for comparing the value entered by the user with the actual unit after the detection. At the same time, the object detection equipment (1) also includes a marking mechanism for marking defective objects (111).

該蓋體(103)可以由聚酯膜或任何適合的可供紅外線穿透材料製成,該蓋體(103)的厚度通常在48微米(micrometer)到62微米的範圍內。例如,需要1100奈米的紅外線波長來檢測厚度為50微米的該蓋體(103)及厚度為80微米到100微米的該物件(111),其中該蓋體(103)由聚酯膜製成。 The cover (103) can be made of polyester film or any suitable material capable of infrared penetration. The thickness of the cover (103) is usually in the range of 48 micrometers (micrometer) to 62 micrometers. For example, an infrared wavelength of 1100 nm is required to detect the cover (103) with a thickness of 50 microns and the object (111) with a thickness of 80 to 100 microns, wherein the cover (103) is made of polyester film .

參考第圖2A及圖2B所示,其顯示具有物件的托盤及具有物件的膠體包裝的實施例圖。托盤包括至少一具有蓋體(103)的容置部(113),其中該容置部(113)容納一個該物件(111)。該膠體包裝包括具有一個該蓋體(103)的一黏合表面(115),其中該黏合表面(115)容納一個該物件(111)。 Refer to FIG. 2A and FIG. 2B, which show an embodiment diagram of a tray with an object and a gel package with an object. The tray includes at least one containing portion (113) with a cover (103), wherein the containing portion (113) contains an object (111). The glue package includes an adhesive surface (115) with a cover (103), wherein the adhesive surface (115) contains an object (111).

一種對物件(111)執行紅外線檢測的方法,其中該物件(111)置放在一物件載體(101);該物件載體(101)包括一蓋體(103)。該物件載體(101)包括料帶、托盤、膠體包裝或任何適合的物件載體。另外,該物件載體(101)材料是可供紅外線穿透的,以允許頂部紅外線檢測、底部紅外線檢測或其組合,其中該紅外線檢測包括內部檢測、外部檢測或其組合。該紅外線檢測能夠以750奈米至3000奈米的波長來檢測該物件(111)。該紅外線檢測能夠藉由取得檢測結果來產生或更新一地圖檔案。此外,該紅外線檢測結果可由用戶使用儲存影像來檢視及更新。 A method for performing infrared detection on an object (111), wherein the object (111) is placed on an object carrier (101); the object carrier (101) includes a cover (103). The object carrier (101) includes a tape, a tray, a gel package or any suitable object carrier. In addition, the material of the object carrier (101) can be penetrated by infrared rays to allow top infrared detection, bottom infrared detection or a combination thereof, wherein the infrared detection includes internal detection, external detection or a combination thereof. The infrared detection can detect the object (111) with a wavelength of 750 nm to 3000 nm. The infrared detection can generate or update a map file by obtaining the detection result. In addition, the infrared detection result can be viewed and updated by the user using the stored image.

參考圖3A所示,其顯示用於紅外線檢測的實施例方法流程。用戶將加載一輸入(S201),其中該輸入包括具有該蓋體(103)的該物件載體(101)、執行對準檢查,及進行紅外線掃描(S203)。若檢測到任何不合格缺陷(S205), 則用戶將對其進行檢視,並且用戶將決定最終拒絕或接受該物件(111)(S207)。選擇性地,該物件檢測的設備(1)可以設置用以標記最終拒絕物件(S208)。在完成檢測後,便將更新該地圖檔案,及卸載具有該蓋體(103)的該物件載體(101)(S209)。若未檢測到不合格缺陷(S205),則繼續檢測直到檢測完成、更新該地圖檔案,及卸載具有該蓋體(103)的該物件載體(101)(S209)。 Refer to FIG. 3A, which shows the flow of an embodiment method for infrared detection. The user will load an input (S201), where the input includes the object carrier (101) with the cover (103), perform alignment check, and perform infrared scanning (S203). If any unqualified defects are detected (S205), Then the user will review it, and the user will decide to finally reject or accept the object (111) (S207). Optionally, the object detection device (1) can be set to mark the object finally rejected (S208). After the detection is completed, the map file is updated, and the object carrier (101) with the cover (103) is uninstalled (S209). If the unqualified defect is not detected (S205), the inspection continues until the inspection is completed, the map file is updated, and the object carrier (101) with the cover (103) is uninstalled (S209).

參考圖3B所示,其顯示用於紅外線檢測的另一實施例方法流程。用戶將加載一輸入(S201),其中該輸入包括具有該蓋體(103)的該物件載體(101)、執行對準檢查,及進行紅外線掃描(S203)。在完成檢測後,便將更新該地圖檔案(S301)。若檢測到任何不合格缺陷(S303),則用戶將對其進行檢視,並且用戶將決定最終拒絕或接受該物件(111)(S305)。選擇性地,該物件檢測的設備(1)可以設置用以標記最終拒絕物件(S307)。最後,卸載具有該蓋體(103)的該物件載體(101)。若未檢測到不合格缺陷(S303),則卸載具有該蓋體(103)的該物件載體(101)(S309)。 Refer to FIG. 3B, which shows the method flow of another embodiment for infrared detection. The user will load an input (S201), where the input includes the object carrier (101) with the cover (103), perform alignment check, and perform infrared scanning (S203). After the detection is completed, the map file will be updated (S301). If any unqualified defect is detected (S303), the user will review it, and the user will decide to reject or accept the object (111) (S305). Optionally, the object detection device (1) can be configured to mark the object finally rejected (S307). Finally, unload the article carrier (101) with the cover (103). If no unqualified defects are detected (S303), the article carrier (101) with the cover (103) is unloaded (S309).

(1):物件檢測的設備 (1): Equipment for object detection

(101):物件載體 (101): Object carrier

(103):蓋體 (103): Lid

(IR):紅外線 (IR): infrared

(105):相機 (105): Camera

(107):紅外線照明 (107): Infrared lighting

(109):帶通濾波器 (109): Band pass filter

(111):物件 (111): Object

(113):容置部 (113): Housing Department

Claims (9)

一種用於物件檢測的設備,包括:至少一具有一蓋體(103)的物件載體(101);該物件(111)包括一電子元件、晶粒、晶片或任何其他類似物件;其特徵在於:該物件檢測的設備(1)能夠對置放在該物件載體(101)的至少一該物件(111)執行紅外線檢測,並包括至少一紅外線(IR)相機(105)、至少一設置於該至少一紅外線(IR)相機(105)一側的紅外線照明(107)、至少一設置於該紅外線照明(107)的帶通濾波器(109)及一個人電腦(PC)系統。 A device for object detection, comprising: at least one object carrier (101) with a cover (103); the object (111) includes an electronic component, die, chip or any other similar object; characterized by: The object detection device (1) can perform infrared detection on at least one of the objects (111) placed on the object carrier (101), and includes at least one infrared (IR) camera (105), and at least one set on the at least one An infrared illuminator (107) on the side of an infrared (IR) camera (105), at least one band-pass filter (109) arranged on the infrared illuminator (107), and a personal computer (PC) system. 如請求項1所述之用於物件檢測的設備,其中該物件載體(101)包括料帶、托盤、膠體包裝或任何適合的物件載體。 The device for object detection according to claim 1, wherein the object carrier (101) includes a tape, a tray, a gel package or any suitable object carrier. 如請求項1所述之用於物件檢測的設備,其中該物件載體(101)還包括至少一容置部(113),其中該容置部(113)容納該物件(111)。 The device for object detection according to claim 1, wherein the object carrier (101) further includes at least one accommodating portion (113), wherein the accommodating portion (113) accommodates the object (111). 如請求項1所述之用於物件檢測的設備,其中該物件載體(101)材料是可供紅外線穿透的,以允許頂部紅外線檢測、底部紅外線檢測或其組合。 The device for object detection according to claim 1, wherein the material of the object carrier (101) can be penetrated by infrared rays to allow top infrared detection, bottom infrared detection, or a combination thereof. 如請求項1所述之用於物件檢測的設備,其中該物件(111)檢測包括內部檢測、外部檢測或其組合。 The device for object detection according to claim 1, wherein the object (111) detection includes internal detection, external detection or a combination thereof. 如請求項1所述之用於物件檢測的設備,其中該帶通濾波器(109)能夠過濾750奈米至3000奈米範圍的紅外線波長。 The device for object detection according to claim 1, wherein the band pass filter (109) can filter infrared wavelengths ranging from 750 nm to 3000 nm. 如請求項1所述之用於物件檢測的設備,其中該物件檢測的設備(1)還包括具有檢測結果的一地圖檔案。 The device for object detection according to claim 1, wherein the device (1) for object detection further includes a map file with detection results. 如請求項1所述之用於物件檢測的設備,其中該物件檢測的設備(1)還包括一部件計數機構,用以比較一用戶鍵入值與檢測之後的一實際單位。 The device for object detection according to claim 1, wherein the object detection device (1) further includes a component counting mechanism for comparing a user input value with an actual unit after detection. 如請求項1所述之用於物件檢測的設備,其中該物件檢測的設備(1)還包括一標記機構,用以標記具有缺陷的該物件(111)。 The device for object detection according to claim 1, wherein the device (1) for object detection further includes a marking mechanism for marking the object (111) with defects.
TW108214721U 2018-04-13 2019-03-15 Equipment for object detection TWM602206U (en)

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