TWM599471U - Cleaning structure of electronic components - Google Patents
Cleaning structure of electronic components Download PDFInfo
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- TWM599471U TWM599471U TW109205421U TW109205421U TWM599471U TW M599471 U TWM599471 U TW M599471U TW 109205421 U TW109205421 U TW 109205421U TW 109205421 U TW109205421 U TW 109205421U TW M599471 U TWM599471 U TW M599471U
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Abstract
一種電子元件的清洗構造,包含一桶體、一置放架及至少一震盪單元,該桶體用以填充一清洗液,該置放架用以供至少一電子元件置放,該置放架設置於該容置空間中,該震盪單元設置於該桶體,該震盪單元用以使填充於該容置空間中的該清洗液產生一震盪波,以對該電子元件進行清洗或浸泡作業。A cleaning structure for electronic components includes a barrel, a rack and at least one oscillating unit, the barrel is used for filling a cleaning liquid, the rack is used for placing at least one electronic component, the rack The oscillating unit is arranged in the accommodating space, and the oscillating unit is used to make the cleaning liquid filled in the accommodating space generate an oscillating wave to clean or soak the electronic component.
Description
本創作是關於一種電子元件的清洗構造,尤其是用以清洗或浸泡晶圓的清洗構造。This creation is about a cleaning structure for electronic components, especially for cleaning or soaking wafers.
在電子元件製造過程中會殘留廢棄顆粒或化學製劑在電子元件上,因此在製造過程中必需移除該廢棄顆粒或化學製劑。During the manufacturing process of electronic components, waste particles or chemical agents will remain on the electronic components, so the waste particles or chemical agents must be removed during the manufacturing process.
以晶圓製程為例,在晶圓製程中會暫時地在一晶圓表面上形成一圖案化光阻層,並藉由該圖案化光阻層進行後續的線路佈局等製程,在完成前述製程後,必需移除該圖案化光阻層。Take the wafer process as an example. During the wafer process, a patterned photoresist layer is temporarily formed on the surface of a wafer, and the patterned photoresist layer is used to perform subsequent processes such as circuit layout, and the aforementioned process is completed. After that, the patterned photoresist layer must be removed.
在習知的技術中,為移除該圖案化光阻層,會將該晶圓浸泡於一去除劑(stripper)中,以使該圖案化光阻層剝離該晶圓,然而利用該去除劑以浸泡方式去除該圖案化光阻層所需時間較長,因此並不利於製程效率。In the conventional technology, in order to remove the patterned photoresist layer, the wafer is immersed in a stripper to make the patterned photoresist layer peel off the wafer, but the stripper is used It takes a long time to remove the patterned photoresist layer by soaking, which is not conducive to process efficiency.
本創作的主要目的是藉由至少一震盪單元使一填充於一桶體中的清洗液產生一震盪波,並藉由該震盪波使該清洗液波動,以利該清洗液加速清洗浸泡於該清洗液中的至少一電子元件,以減少該電子元件浸泡時間,並改善先前技術製程效率不佳的問題。The main purpose of this creation is to use at least one oscillating unit to make a cleaning liquid filled in a barrel generate an oscillating wave, and to make the cleaning liquid oscillate by the oscillating wave, so that the cleaning liquid can accelerate the cleaning and immersion in the cleaning liquid. At least one electronic component in the cleaning solution is used to reduce the soaking time of the electronic component and to improve the problem of poor efficiency of the prior art process.
本創作之一種電子元件的清洗構造包含一桶體、一置放架以及至少一震盪單元,該桶體具有一桶壁及一容置空間,該桶壁環繞該容置空間,該容置空間用以填充一清洗液,該置放架用以供至少一電子元件置放,該置放架並設置於該容置空間中,該震盪單元,設置於該桶體,該震盪單元用以使填充於該容置空間中的該清洗液產生一震盪波。An electronic component cleaning structure of this invention includes a barrel body, a rack and at least one oscillating unit. The barrel body has a barrel wall and an accommodating space. The barrel wall surrounds the accommodating space. Used to fill a cleaning fluid, the rack is used to place at least one electronic component, the rack is disposed in the accommodating space, the oscillating unit is disposed in the barrel, and the oscillating unit is used to make The cleaning liquid filled in the accommodating space generates a shock wave.
本創作藉由該震盪單元使填充於該容置空間中的該清洗液產生波動,以加速該清洗液清洗該電子元件,以及減少該電子元件浸泡時間,已有效地改善先前技術因浸泡時間較長,而造成製程效率不佳的問題。This creation uses the oscillating unit to make the cleaning fluid filled in the accommodating space fluctuate, so as to accelerate the cleaning of the electronic component by the cleaning fluid and reduce the immersion time of the electronic component, which has effectively improved the prior art due to the relatively short immersion time. Long, causing the problem of poor process efficiency.
請參閱第1、2及3圖,其為本創作的一實施例,一種電子元件的清洗構造100,其包含一桶體110、一置放架120及至少一震盪單元130,該桶體110具有一桶壁111及一容置空間112,該桶壁111環繞該容置空間112,該容置空間112用以填充一清洗液200,該清洗液200可依據不同的待清洗電子元件而置換,該置放架120用以供至少一電子元件300置放,在本實施例中,以該電子元件300為晶圓為例,但不以此為限制,該置放架120並設置於該容置空間112中,使放置於該置放架120的該電子元件300能浸泡於該清洗液200中。Please refer to Figures 1, 2 and 3, which are an embodiment of the creation, an electronic
請參閱第1、2及3圖,該震盪單元130設置於該桶體110,在本實施例中,該震盪單元130設置於該桶壁111的一外表面111a,或者,在另一實施例中,該震盪單元130設置於該桶壁111的一內表面111b,又或者,在又一實施例中,該震盪單元130設置於該桶體110的該容置空間112中,該震盪單元130用以使填充於該容置空間112中的該清洗液200產生一震盪波,以使該清洗液200波動並對該電子元件300進行清洗作業,以清洗附著於該電子元件300上的微顆粒/污染物,或移除該電子元件300上暫時性的化學層(如光阻),在本實施例中,該清洗液200選自於去除劑(stripper),但不以此為限制,該清洗液200(去除劑)用以使該電子元件300(晶圓)上的一光阻層(圖未繪出)產生化學變化,以使該光阻層剝離該晶圓或溶解於該清洗液200中。Please refer to Figures 1, 2 and 3, the oscillating
請參閱第1至4圖,該震盪單元130包含複數個第一震盪器131,該些第一震盪器131對稱地環設於該桶體110,請參閱第1及5圖,較佳地,可依據該桶體110的該容置空間112的深度,使該震盪單元130包含複數個第二震盪器132,該些第二震盪器132環設於該桶體110,該清洗液200的一液面210的一虛擬延伸線A至各該第一震盪器131之間具有一第一深渡H1,該虛擬延伸線A至各該第二震盪器132之間具有一第二深渡H2,該第一深渡H1不大於該第二深渡H2,在本實施例中,該些第二震盪器132對稱地環設於該桶體110,或者,在不同的實施例中,該些第二震盪器132不對稱地設置於該桶體110,或者,請參閱第6圖,在另一個不同的實施例中,該震盪單元130包含複數個震盪器130a,該些震盪器130a不對稱地設置於該桶體110,該些震盪器130a可依據實際上使用需求或不同的待清洗物(電子元件300)而不對稱地設置於該桶體110,該震盪單元130(如該些第一震盪器131、該些第二震盪器132或該些震盪器130a)選自於超音波震盪器。Please refer to Figures 1 to 4. The oscillating
請參閱第2及3圖,在本實施例中,以該震盪單元130設置於該桶壁111的該外表面111a說明,當該電子元件300藉由該置放架120放置於填充有該清洗液200的該容置空間112時,該電子元件300是浸泡在該清洗液200中,該震盪單元130(如該些第一震盪器131、該些第二震盪器132或該些震盪器130a)震盪該桶體110的該桶壁111,並藉由該桶壁111震盪該清洗液200,該清洗液200並產生震盪波,使該清洗液200波動,藉由該清洗液200的波動,加速清洗浸泡於該清洗液200中的該電子元件300,以減少該電子元件300浸泡時間,並改善先前技術製程效率不佳的問題。Please refer to Figures 2 and 3. In this embodiment, the oscillating
或者,在不同的實施例中,當該震盪單元130設置於該桶體110的該桶壁111的該內表面111b,或者,該震盪單元130設置於該容置空間112的該清洗液200中時,該震盪單元130是直接震盪該清洗液200,使該清洗液200產生波動,相同地,可藉由該清洗液200的波動,加速清洗浸泡於該清洗液200中的該電子元件300,以減少該電子元件300浸泡時間,並改善先前技術製程效率不佳的問題。Or, in different embodiments, when the oscillating
請參閱第2及7圖,在本實施例中,該電子元件的清洗構造100另包含一擺動單元140,該擺動單元140具有一第一支架141及一第二支架142,該置放架120活動地結合於該第一支架141及該第二支架142,該第二支架142選擇性地沿著一軸線Y運動,使該置放架120擺動,在本實施例中,該第二支架142活動地穿設於該第一支架141中。Please refer to FIGS. 2 and 7. In this embodiment, the
請參閱第2及7圖,在本實施例中,該置放架120具有一第一軸座121及一第二軸座122,該第一支架141以一第一軸桿141a樞接該第一軸座121,該擺動單元140具有一連動桿143,該連動桿143以一第二軸桿142a樞接該第二支架142,該連動桿143以一第三軸桿143a樞接該第二軸座122,請參閱第8圖,在另一實施例中,該第二支架142以該第二軸桿142a樞接該第二軸座122。Please refer to Figures 2 and 7. In this embodiment, the
請參閱第7圖,由於該置放架120的該第一軸座121以該第一軸桿141a樞接該第一支架141,因此當該第二支架142沿著該軸線Y往復運動時,該置放架120以該第一軸桿141a為支點而往復擺動,藉由該置放架120的往復擺動,使該清洗液200隨著波動,以加速清洗浸泡於該清洗液200中的該電子元件300,及減少該電子元件300浸泡時間,並改善先前技術製程效率不佳的問題。Please refer to FIG. 7, because the
本創作之保護範圍當視後附之申請專利範圍所界定者為準,任何熟知此項技藝者,在不脫離本創作之精神和範圍內所作之任何變化與修改,均屬於本創作之保護範圍。The scope of protection of this creation shall be subject to the scope of the attached patent application. Any change and modification made by anyone who is familiar with this technique without departing from the spirit and scope of this creation shall belong to the scope of protection of this creation. .
100:電子元件的清洗構造
110:桶體
111:桶壁
111a:外表面
111b:內表面
112:容置空間
120:置放架
121:第一軸座
122:第二軸座
130:震盪單元
130a:震盪器
131:第一震盪器
132:第二震盪器
140:擺動單元
141:第一支架
141a:第一軸桿
142:第二支架
142a:第二軸桿
143:連動桿
143a:第三軸桿
200:清洗液
210:液面
300:電子元件
A:虛擬延伸線
H1:第一深渡
H2:第二深渡
Y:軸線
100: Cleaning structure of electronic components
110: barrel
111:
第1圖:本創作的電子元件的清洗構造的立體圖。 第2圖:本創作的電子元件的清洗構造的立體剖視圖。 第3圖:本創作的電子元件的清洗構造的剖視圖。 第4圖:本創作的電子元件的清洗構造的桶體的橫向剖視圖。 第5圖:本創作的電子元件的清洗構造的桶體的橫向剖視圖。 第6圖:本創作的電子元件的清洗構造的桶體的展開示意圖。 第7圖:本創作的電子元件的清洗構造的立體剖視圖。 第8圖:本創作的電子元件的清洗構造的另一實施例的立體剖視圖。 Figure 1: A three-dimensional view of the cleaning structure of the electronic component of this creation. Figure 2: A three-dimensional cross-sectional view of the cleaning structure of the electronic component of this creation. Figure 3: A cross-sectional view of the cleaning structure of the electronic component of this creation. Figure 4: A cross-sectional view of the barrel of the cleaning structure for electronic components of the invention. Figure 5: A transverse cross-sectional view of the barrel of the electronic component cleaning structure of this creation. Figure 6: The unfolded schematic diagram of the barrel of the electronic component cleaning structure of this creation. Figure 7: A three-dimensional cross-sectional view of the cleaning structure of the electronic component of this creation. Figure 8: A perspective cross-sectional view of another embodiment of the cleaning structure for electronic components of the present invention.
100:電子元件的清洗構造 100: Cleaning structure of electronic components
110:桶體 110: barrel
130:震盪單元 130: shock unit
131:第一震盪器 131: First Oscillator
132:第二震盪器 132: Second Oscillator
140:擺動單元 140: swing unit
141:第一支架 141: The first bracket
Claims (15)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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TW109205421U TWM599471U (en) | 2020-05-06 | 2020-05-06 | Cleaning structure of electronic components |
CN202020980142.XU CN212303610U (en) | 2020-05-06 | 2020-06-02 | Cleaning structure for electronic component |
Applications Claiming Priority (1)
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TW109205421U TWM599471U (en) | 2020-05-06 | 2020-05-06 | Cleaning structure of electronic components |
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TWM599471U true TWM599471U (en) | 2020-08-01 |
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TW109205421U TWM599471U (en) | 2020-05-06 | 2020-05-06 | Cleaning structure of electronic components |
Country Status (2)
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CN (1) | CN212303610U (en) |
TW (1) | TWM599471U (en) |
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2020
- 2020-05-06 TW TW109205421U patent/TWM599471U/en unknown
- 2020-06-02 CN CN202020980142.XU patent/CN212303610U/en active Active
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CN212303610U (en) | 2021-01-05 |
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