TWM595633U - Vibration feeding mechanism for test system - Google Patents

Abstract

A vibrating feeding mechanism of a test system includes a feeding platform including at least one material tube channel formed on the feeding platform in an extending direction for supporting at least one material tube; at least one component conveying One end of the channel is connected to the at least one material tube channel in the same extension direction, and the other end forms an element receiving section. A vibrating propulsion device is coupled to the bottom of the feed platform to generate a vibratory propulsive force from the at least one material tube channel to the at least one component conveying channel, which is applied to the feed platform. The component to be measured contained in the material tube is subjected to the vibration propulsion force and enters the component conveying channel from the discharge end of the material tube, and then sends the component bearing section of the component conveying channel.

Description

Vibration feeding mechanism of test system

This creation is about a test system for electronic components, especially a vibration feeding mechanism of the test system.

In today's various portable electronic devices, measuring devices, detecting devices, motion design, and electronic equipment, various signal sensors may be installed. For example, in order to measure acceleration or gravity, it is necessary to install a gravity sensor. The acceleration, vibration and angular velocity of the object can be sensed by the gravity sensor.

During the production of the gravity sensor, electrical performance testing of the product is required to ensure product yield and electrical performance. In response to the requirement that the gravity sensor must be rotated during the test, the industry has designed a variety of different gravity sensor rotation test devices (such as a six-axis robotic arm and a rotating test bench) to rotate the gravity sensor to be tested test.

When positioning the gravity sensor to be tested on the rotating test device, since the gravity sensor to be tested needs to be flipped at various angles, the positioning stability of the sensor, proper compression, and prevention must also be considered Vibration, consistency of positioning position, easy operation, etc. However, in the design of various existing gravity sensor rotation testing devices, it is still generally unable to meet these requirements.

Furthermore, in the design of various existing gravity sensor rotation test devices, the system configuration of the input and output of the component to be tested cannot be optimized, which often limits the performance of the test system greatly .

Therefore, the main purpose of this creation is to provide an optimized design of the vibration feeding mechanism of the test system, so that the feeding and discharging process of the component to be tested can be smooth and smooth in the test procedure of the gravity sensor , A real purpose.

The technical method used in this creation is to include a feeding platform in the vibration feeding mechanism of the test system, including at least one material pipe channel on the feeding platform, formed on the feeding platform in an extending direction to support at least A material tube; at least one component conveying channel, one end of which is connected to the at least one material channel in the same extension direction, and the other end forms a component receiving section. A vibrating propulsion device is coupled to the bottom of the feed platform to generate a vibratory propulsive force from the at least one material tube channel to the at least one component conveying channel, which is applied to the feed platform. The component to be measured contained in the material tube is subjected to the vibration propulsion force and enters the component conveying channel from the discharge end of the material tube, and then sends the component bearing section of the component conveying channel.

In terms of effect, through the vibration feeding mechanism of this creation, the components to be tested contained in the material tube can be smoothly, smoothly, and reliably supplied to the feeding area during the feeding process, and then supplied with the peripheral devices of the test system To the test system for component performance testing. Similarly, during the discharging process, the vibration feeding mechanism of this creation can also make the tested components to be tested smoothly, smoothly and surely sent to the discharging area.

The specific technology used in this creation will be further explained by the following examples and accompanying drawings.

Refer to FIG. 1, which shows a perspective view of the original creation. This creation is mainly composed of a testing device 100, a component receiving and positioning device 200, a feeding mechanism 300, a discharging mechanism 400, and a component pick and place device 500. In order to make the arrangement relationship between the components in the drawing clearer, if it is not necessary in the subsequent drawings, the feeding mechanism 300, a discharging mechanism 400, and a component pick-and-place device 500 will be omitted. The feeding mechanism 300 is disposed adjacent to one side of the component receiving and positioning device 200, and is used to supply a plurality of components to be tested to a feeding area. The feeding mechanism 300 is disposed on the other side of the component receiving and positioning device 200, and is used to send out a plurality of measured components in the discharging area.

Referring also to Figures 2-4, Figure 2 shows the front view of the creation, Figure 3 shows the top view of the creation, and Figure 4 shows the left side view of the creation. The test device 100 of the present invention includes a support 11, a first motor 12, a second motor 13, a rotating base 14, and a stage 15. The first motor 12 is positioned on one side of the bracket 11, and the bracket 11 is then mounted on a common base 10. The drive shaft of the second motor 12 is coupled to the rotating base 14 and can drive the rotating base 14 to rotate. The second motor 13 is positioned on the rotating base 14, and its driving shaft is combined with the stage 15 to drive the stage 15 to rotate. The first motor 2 and the second motor 3 are arranged at an orthogonal angle to each other.

Also refer to FIGS. 5 and 6, wherein FIG. 5 shows an exploded perspective view of some components in FIG. 1 when separated, and FIG. 6 shows a top view of the pressing plate in FIG. 1 when it is moved away. A plurality of positioning members 16 are arranged on the top surface of the stage 15, a working area is defined by these positioning members 16, and a bearing plate 17 is combined with a circuit board 3 in the working area. Several slots 4 are arranged on the circuit board 3. Each slot 4 can be used to insert a component to be tested.

The first motor 12 drives the rotating base 14 to rotate and the second motor 13 drives the carrier 15 to rotate, so that the carrier 15 can be sequentially located in one of the plurality of test surfaces, so that the controller of the test device 100 (not (Display) Perform electrical functional test on the device under test inserted in the slot 4.

The device bearing positioning device 200 of the present invention mainly includes a sliding base 21, a supporting frame 22, a vertical guide rail 23, a pressing plate 24, a horizontal displacement driving mechanism 5, and a lifting driving mechanism 6.

The sliding seat 21 is combined with the horizontal displacement driving mechanism 5, and the horizontal displacement driving mechanism 5 can drive the screw 51 to perform horizontal displacement along a horizontal slide rail 52, so that the pressing plate 24 on the sliding seat 21 is positioned corresponding to the circuit board 3 above or away from the circuit board 3.

The supporting frame 22 has a generally U-shaped supporting frame structure, which is vertically coupled to the sliding base 21 by a plurality of vertical guide rails 23, and a pressing plate 24 is coupled to the top surface of the supporting frame 22.

An up-and-down driving mechanism 6 is provided adjacent to a side edge of the support frame 22. An eccentric shaft post 61 is provided on the drive shaft of the lift drive mechanism 6. The lifting drive mechanism 6 can drive the eccentric shaft column 61 to rotate eccentrically. When the eccentric shaft column 61 is located at a high point, a roof plate 221 provided at the corresponding position of the top bracket 22 will be removed, and when the eccentric shaft column 61 leaves the high point, the roof plate 221 is no longer affected by the roof, so The frame 22 will drop. In this way, the support frame 22 can be vertically displaced relative to the slide 21, and the pressing plate 24 can be raised to a top dead center position or lowered to a bottom dead center position.

At least one pull spring 25 is disposed between the support frame 22 and the sliding seat 21. By the elastic force of the pull spring 25, a pulling force can be provided to the support frame 22, and the support frame 22 is pulled toward the sliding seat 21 lead.

7A and 7B, FIG. 7A shows a schematic view when the support 22 is positioned on both sides of the circuit board 3, and FIG. 7B shows a schematic view when the support 22 is away from the circuit board 3. The support frame 22 is driven by the horizontal displacement driving mechanism 5, and the sliding block 21 and the support frame 22 can be moved along the horizontal slide rail 52 by the screw 51 to move to positions corresponding to the two side edges of the circuit board 3. At this time, the two corresponding sliding grooves 222 of the supporting frame 22 will slide and hold both sides of the carrier 15 (as shown in FIG. 7A ), so that the carrier 15 can be stably supported. Conversely, when the support 22 is reversely driven by the horizontal displacement drive mechanism 5, the slide 21 and the support 22 are driven by the screw 51 to move backward along the horizontal slide rail 52 away from the circuit board 3 (as shown in FIG. 7B Shown).

Refer to FIGS. 8A and 8B, where FIG. 8A shows a schematic cross-sectional view when the pressure plate 24 is positioned above the circuit board 3 and at the top dead center position, and FIG. 8B shows the pressure plate 24 is positioned above the circuit board 3 and is positioned below Schematic diagram of the cross section at the position of the dead point. When the supporting frame 22 is positioned corresponding to the two side edges of the circuit board 3 as shown in FIG. 7A, the pressing plate 24 is positioned above the circuit board 3. At this time, the lift drive mechanism 6 drives the eccentric shaft column 61 to rotate eccentrically. When the eccentric shaft column 61 is located at a high point, the top plate 221 of the top bracket 22 is pressed, so that the pressing plate 24 and the slot 4 on the circuit board 3 are separated by a height (as shown in FIG. 8A).

Conversely, when the eccentric shaft 61 is rotated by the lift drive mechanism 6 and leaves the high point, since the roof plate 221 of the support frame 22 is no longer supported, the support frame 22 is pulled by the tension spring 25 Lower to press the pressure plate 24 against the slot 4.

9A and 9B, wherein FIG. 9A shows a schematic view of the cross-sectional action when the compressible seat 41 of the slot 4 is pressed down, and FIG. 9B shows the compressible seat 41 of the slot 4 when it is not pressed Schematic diagram of cross-sectional action. The slot 4 has a base 40, a compressible seat 41 coupled to the base 40, at least one elastic member 42 between the base 40 and the compressible seat 41, and a plurality of bases 40 are disposed in the base 40 The conductive part 43 and a slot 45 opened on the base 40. The compressible seat 41 is located in the lifted position by the elastic force of the elastic member 42 when it is not under downward pressure.

When the pressing plate 24 presses against the compressible seat 41 on the top of the slot 4, the sliding edge 411 of the compressible seat 41 presses down the corresponding conductive portion 43, so that the contact end 44 of each conductive portion 43 is in the removed position (See Fig. 9A). At this time, the component to be tested 7 can be placed into the slot 45 in the slot 4 through the opening 241 of the pressure plate 24.

When the pressing plate 24 no longer presses the compressible seat 41 at the top of the slot 4, the sliding edge 411 of the compression member 41 no longer presses the conductive parts 43, so that the contact ends 44 can press the device under test 7 The corresponding component pin 71 (see Figure 9B). After that, the horizontal displacement driving mechanism 5 can drive the carrier 22 to move along the horizontal slide rail 52 away from the circuit board 3, so that the controller of the testing device 100 starts to perform electrical functional testing on the device under test 7 in the slot 4.

In actual production, based on the above structural embodiment, only the support frame and the lifting drive mechanism combined with the support frame may be configured. The lifting drive mechanism is used to drive the support frame to move along a vertical direction. When the pressure plate is driven by the elevating drive mechanism to the bottom dead center position, the pressure plate presses on top of the plurality of slots arranged on the circuit board; and when the pressure plate is driven by the elevating drive mechanism to the top dead center When in position, the pressure plate no longer presses on the top of the plurality of slots.

At the same time, referring to FIGS. 1, 10, 11, and 12, the feeding mechanism 300 includes a feeding platform 301, and a plurality of feeding tube channels extending in an extending direction for receiving the feeding tube are opened on the feeding platform 301 302. The setting position of the feeding platform 301 is defined as the feeding area.

The front end of each tube channel 302 extends a component conveying channel 303 in the same direction as the tube channel 302 extends. A component introduction end 303a of the component conveying channel 303 communicates with the material tube channel 302, and the other end is a component receiving section 304. The component conveying channel 303 has a tapered width structure, the width at the component introduction end 303a is larger, and the width adjacent to the component receiving section 304 is smaller, so that the component under test 7 can be During the vibration feeding process, it smoothly passes through the component conveying channel 303.

Preferably, a guiding structure along the direction of the component conveying channel 303 is formed on the surface of each component conveying channel 303, the guiding structure includes a guiding convex portion 303b extending along the extending direction, and the One groove 303c is formed between the guide convex portion 303b and the groove walls on both sides of the component conveying channel 303, respectively. The width of the side groove 303c is the space through which the element leads 71 on both sides of the element under test 7 pass. When the component under test 7 passes through the component conveying channel 303, the abdomen of the component under test 7 will adhere to and move on the guide convex portion 303b, so that the component under test 7 is smoothly received by the guide convex portion 303b during the vibration feeding process guide.

Similarly, as shown in FIGS. 12 and 13, the component receiving section 304 includes a receiving convex portion 304 a extending along the extending direction, and the receiving convex portion 304 a is away from both sides of the component receiving section 304 One side groove 304b is formed between the groove walls. More preferably, the height of the receiving convex portion 304a is lower than the height of the guiding convex portion 303b, and the side groove 304b may be the same height as the side groove 303c of the component conveying channel 303. In this way, when the component under test 7 is vibrated and moves to the component receiving section 304, the component under test 7 is precisely placed and positioned in the component receiving section 304 without the problem of sway or deflection .

The plurality of material tubes 305 are inserted into the plurality of material tube channels 302 respectively, and pressed by a material tube positioning plate 306 arranged perpendicular to the extending direction to be stably fixed in the individual material tube channels 302. The plurality of elements to be tested 7 are sequentially fed into the material tube 305 from the first free end of the material tube 305. Preferably, a lifting frame 307 may be provided in the passage of the material pipe 305 to appropriately raise the material pipe 305 to the rear end height.

The feeding platform 301 is subjected to the vibration force of the vibrating propulsion device 8 combined at the bottom, so the component 7 to be tested will enter the component conveying channel 303 from the second free end of the material tube 305, and then send the component bearing of the component conveying channel 303 Section 304.

In order to sense the position of the component 7 to be tested in the transportation process, a material pipe sensor may be provided at the material pipe end 302 at the discharge end corresponding to the material pipe 305 (that is, adjacent to the element conveying groove 303) s1, a component passing sensor s2 is provided on the component conveying channel 303 adjacent to the component receiving section 304, and a component positioning sensor s3 is provided on the component receiving section 304.

As shown in FIG. 1 again, the discharge mechanism 400 includes a discharge platform 401, and a plurality of discharge pipe channels 403 for supporting a plurality of discharge pipes 402 are opened on the discharge platform 401. The setting position of the discharging platform 401 is defined as a discharging area.

A component output channel 404 extends from the front end of each discharge tube channel 403. One end of the component output channel 404 is connected to the discharge tube channel 403, and the other end is a component receiving section 405.

The plurality of discharge pipes 402 are inserted into the discharge pipe channel 403, and pressed by a discharge pipe positioning plate 406 to be fixed in the discharge pipe channel 403. The discharge platform 401 is subjected to the vibration force of the discharge vibration propulsion device 9 combined at the bottom, so the components to be tested after the measurement will be sequentially entered into the discharge tube 402 by the component output channel 404. After a predetermined number of tested components are contained in the discharge pipe 402, the operator can take out the discharge pipe 402.

Between the feeding mechanism 300 and the discharging mechanism 400, a component pick-and-place device 500 is arranged, which is also located in the vicinity of the component receiving and positioning device 200. The component pick-and-place device 500 includes at least one component pick-and-place nozzle 501, which can be, for example, a vacuum nozzle connected to a vacuum device (not shown). The component pick-and-place nozzle 501 is connected to an X-axis drive unit 502, which can be driven to perform X-axis displacement. The X-axis drive unit 502 is combined with a Y-axis drive unit 503 provided in the guide mechanism 504, and the Y-axis drive unit 503 can drive the Y-axis displacement along the guide mechanism 504.

When the pressure plate 24 of the component receiving and positioning device 200 is positioned above the circuit board 3 and is located at the bottom dead center position (see also FIG. 8B ), the component pick-and-place nozzle 501 of the component pick-and-place device 500 will pass from the feeding area Take out the component under test 7 and put it into the slot 4 of the circuit board 3. Then, when the pressure plate 24 is driven by the lifting drive mechanism 6 to leave the bottom dead center position (see also FIG. 8A), and the horizontal displacement drive mechanism 5 horizontally displaces the pressure plate 24 to a position away from the circuit board 3 (see also the figure 7B), the testing device 100 can drive the stage 15 to be sequentially located in one of the plurality of test faces, so as to perform electrical functions on the plurality of test elements 7 inserted in the slot 4 test.

After the testing device 100 completes the test of the component 7 to be tested, the component pick-and-place device 500 takes the component 7 to be tested from the slot 4 and sends it to the discharge area one by one, and then the discharge mechanism 400 will complete the test The measuring element is fed into the discharge pipe 402.

Referring to FIG. 14, the bottom of the feeding platform 301 is coupled to the vibration propulsion device 8. The vibration propulsion device 8 includes a pair of main vibration plates 81 corresponding to the front and rear. The top and bottom of the main vibration plate 81 are combined with a top plate 82 and a bottom plate 83, respectively. The top plate 82 may be made of iron material, or made of, for example, aluminum material, but an iron plate 84 is bonded to the bottom surface thereof. An electromagnetic generator 85 is positioned on the bottom plate 83, and there is a gap between the top surface of the electromagnetic generator 85 and the iron plate 84. The electromagnetic generator 85 may adopt, for example, a structure in which a coil of a predetermined number of turns is wound on a silicon steel sheet iron core.

Referring to FIG. 15, when the electromagnetic generator 85 is electrically excited, a periodic pulsating electromagnetic force is applied to the iron plate 84, and the main vibration plate 81 is periodically deformed/reset via the top plate 82, thereby causing The feeding platform 301 generates a vibrating propulsive force from the material tube channel 302 toward the component conveying channel 303. Therefore, the component 7 to be measured contained in the material pipe 305 will be subjected to the vibration propulsion force, and sequentially enter the component conveying channel 303 from the material pipe 305, and finally send the component bearing area of the component conveying channel 303 Paragraph 304.

The feeding platform 301 is further combined with a limiting plate 308 which is located on the component conveying channel 303 and is perpendicular to the extending direction of the component conveying channel 303. The limiting plate 308 at least partially covers the component The conveying channel 303, but does not cover the component receiving section 304, to form a component removal space on the component receiving section 304, so that the component pick-and-place suction nozzle 501 of the component pick-and-place device 500 will be located in the component The component 7 to be tested of the receiving section 304 is taken out. When the component pick-and-place nozzle 501 will place the component under test 7 in the component receiving section 304, the component under test 7 that has not yet entered the component receiving section 304 will be restricted by the front edge of the limiting plate 308, so It will not be attached and removed by mistake. Moreover, as mentioned above, since the component to be tested 7 is accurately supported and positioned in the component receiving section 304 without the problems of jitter, bounce, and deflection, when the component pick-and-place nozzle 501 will be located When the component under test 7 of the component receiving section 304 is taken out to be inserted into the slot 4, it is no longer necessary to perform the optical positioning process in the conventional technology, for example, and the test process can be simplified and the test performance can be improved.

The above embodiment is a description of the feeding mechanism 300 including the vibration propulsion device 8. The same structure and operation are also applicable to the discharge mechanism 400 including the discharge vibration propulsion device 9.

The above-mentioned embodiments are only used to illustrate this creation, not to limit the scope of this creation. All other equivalent modifications or replacements that are completed without departing from the spirit disclosed in this creation should be included in the scope of the patent application described later Inside.

100: test device 200: Component bearing positioning device 10: Common base 11: Bracket 12: First motor 13: Second motor 14: Rotating seat 15: stage 16: Positioning piece 17: bearing plate 21: Slide 22: Carrier 221: The top plate 222: Chute 23: Vertical rail 24: pressure plate 241: opening 25: tension spring 3: circuit board 4: slot 40: Dock 41: Compressible seat 42: Elastic piece 43: conductive part 44: contact end 45: Slot 5: Horizontal displacement drive mechanism 51: screw 52: Horizontal rail 6: Lifting drive mechanism 61: Eccentric shaft column 7: component under test 71: component pin 8: vibration propulsion device 81: Main vibration plate 82: top plate 83: bottom plate 84: iron plate 85: Electromagnetic generator 9: Discharge vibration propulsion device 300: feeding mechanism 301: Feeding platform 302: material channel 303: Component conveying channel 303a: component lead-in 303b: Guide convex part 303c: Side groove 304: component bearing section 304a: Bearing convex part 304b: side groove 305: feed tube 306: material tube positioning plate 307: jacking frame 308: Limit plate 400: Discharging mechanism 401: Discharging platform 402: Discharge tube 403: Discharge tube channel 404: component output channel 405: Component receiving section 406: Discharge tube positioning plate 500: component pick and place device 501: component pick and place nozzle 502: X axial drive unit 503: Y axial drive unit 50:4 guidance mechanism s1: feed tube sensor s2: element passing sensor s3: component positioning sensor

Figure 1 shows a perspective view of this creation. Figure 2 shows the front view of this creation. Figure 3 shows the top view of this creation. Figure 4 shows the left side view of this creation. FIG. 5 shows an exploded perspective view of some components in FIG. 1 when separated. Fig. 6 shows a top view of the pressing plate of Fig. 1 when it is removed. FIG. 7A shows a schematic diagram when the bracket is positioned on both sides of the circuit board. FIG. 7B shows a schematic diagram when the carrier is away from the circuit board. FIG. 8A shows a schematic cross-sectional view when the pressing plate is positioned above the circuit board and is positioned at the top dead center. FIG. 8B shows a schematic cross-sectional view when the pressing plate is positioned above the circuit board and is positioned at the bottom dead center. 9A shows a schematic diagram of the action when the compressible seat of the slot is pressed down. 9B shows a schematic cross-sectional view of the compressible seat of the slot when it is not pressed. Fig. 10 shows a top view of the feeding mechanism in the present invention. Fig. 11 shows a perspective view of a part of the feed mechanism of the present invention when separated. FIG. 12 shows an enlarged perspective view of the component conveying channel and the component receiving section in FIG. 11. 13 shows a top view of a component to be tested when it is located in the component receiving section of the component conveying channel. 14 shows a cross-sectional view of the combination of the feeding mechanism and the vibration propulsion device in the present invention. FIG. 15 shows a schematic sectional view of the feeding mechanism and the vibration propulsion device of the present invention.

8: vibration propulsion device

300: feeding mechanism

301: Feeding platform

302: material channel

303: Component conveying channel

303a: component lead-in

303b: Guide convex part

303c: Side groove

304: component bearing section

304a: Bearing convex part

304b: side groove

305: feed tube

306: material tube positioning plate

308: Limit plate

Claims (10)

A vibrating feeding mechanism of a test system includes: a feeding platform, the feeding platform includes: at least one material tube channel formed on the feeding platform in an extending direction for supporting at least one material tube, the at least one A material tube has a material inlet end and a material outlet end, at least one component to be tested is fed from the material inlet end and is accommodated in the at least one material tube; at least one component conveying channel has a component introduction end system Communicate with the at least one material tube channel in the same direction as the extension direction, and the other end forms a component receiving section on the component introduction channel and the component receiving area on the at least one component conveying channel A guide structure extending along the extending direction is provided between the segments; a vibrating propulsion device, combined with the bottom of the feeding platform, is used to generate a direction from the at least one material tube channel to the at least one component conveying channel The vibration propulsion force is applied to the feeding platform; wherein, the at least one element to be tested contained in the material tube is subjected to the vibration propulsion force from the discharge end of the at least one material tube into the at least one element for transportation In the channel, the component receiving section is sent through the at least one component conveying channel through the guiding structure. The vibration feeding mechanism of the test system according to item 1 of the patent application scope, wherein the vibration propulsion device includes: a pair of front and rear corresponding main vibration plates; a top plate, which is combined on the top of the pair of main vibration plates, and the top plate is Combined with the feeding platform, the top plate includes an iron plate; a bottom plate, combined with the bottom of the pair of main vibration plates; an electromagnetic generator, positioned on the bottom plate, and the top surface of the electromagnetic generator and the iron plate There is a gap between Wherein, when the electromagnetic generator is electrically excited, a periodic pulsating electromagnetic force is applied to the iron plate, and the main vibrating plate is periodically deformed/reset via the top plate, so that the feeding platform generates the vibration propulsion force. According to the vibration feeding mechanism of the test system described in item 1 of the patent application scope, a feeding tube positioning plate is further integrated on the feeding platform, the feeding tube positioning plate is located on the at least one feeding tube channel and is perpendicular to the extending direction , When the at least one material tube is placed in the at least one material tube channel, the at least one material tube is compressed and positioned in the at least one material tube channel. According to the vibration feed mechanism of the test system described in item 1 of the patent application scope, a limit plate is further integrated on the feed platform, the limit plate is located on the at least one component conveying channel and is perpendicular to the at least one component conveying In the extending direction of the channel, the limiting plate at least partially covers the at least one component conveying channel, but does not cover the component receiving section, so as to form a component removal space on the component receiving section. The vibration feeding mechanism of the test system according to item 1 of the scope of the patent application further includes a lifting frame, which is located on the opposite side of the component receiving section of the feeding platform, and is located on the at least one material tube bearing The passage path of the at least one material pipe channel is used to raise the height of the inlet end of the at least one material pipe to the height of the outlet end. The vibration feeding mechanism of the test system according to item 1 of the patent application scope further includes a component pick-and-place device, which includes: a component pick-and-place nozzle, corresponding to the component receiving area of the at least one material tube channel The position of the segment is used to take out the at least one component to be tested fed into the component receiving section; an X-axis drive unit is connected to the component pick-and-place nozzle to drive the component pick-and-place nozzle to proceed X-axis displacement; a Y-axis drive unit connected to the X-axis drive unit for driving the X-axis drive unit to perform Y-axis displacement along a guide mechanism. According to the vibration feeding mechanism of the test system described in item 1 of the patent application scope, wherein the at least one component conveying slot prop has a tapered width structure, the width at the leading end of the component is larger, and is adjacent to the component receiving area The width of the segment is small. The vibration feeding mechanism of the test system according to item 1 of the patent application scope, wherein the guide structure includes a guide protrusion extending along the extending direction, and the guide protrusion is away from the at least one component conveying groove One side groove is formed between the groove walls on both sides of the channel. The vibration feeding mechanism of the test system according to item 1 of the patent application scope, wherein the component receiving section includes a receiving convex portion extending along the extending direction, and the receiving convex portion is away from the component receiving area One side groove is formed between the groove walls on both sides of the segment. According to the vibration feeding mechanism of the test system described in item 1 of the patent application scope, wherein the at least one material pipe channel is provided with a material pipe sensor at the discharge end corresponding to the at least one material pipe, A component conveying channel is provided with a component passing sensor adjacent to the component receiving section, and a component positioning sensor is provided in the component receiving section.

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