TWM592078U - Structure of testing probe - Google Patents

Abstract

This creative department provides a test needle base structure, which utilizes a retractable needle base provided with a plurality of penetration spaces, and the penetration spaces are provided with a plurality of probes and the tips of the probes are not exposed to the A space for penetration, and the bottom ends of the probes are fixed on the bottom side of a substrate, and the retractable needle base has a telescopic gap between the substrate and a plurality of elastic members, and the bottom side of the retractable needle base When a contact surface is in contact test with a predetermined object to be tested, the elastic members are compressed and deformed and the retractable needle holder moves upward and the top surface bears against the bottom side of the substrate, so that the tips of the probes A predetermined length is exposed in the penetration spaces, and the tips of the probes are in contact with a plurality of contacts of the predetermined object to be tested and an electrical connection is generated. The structure of the flexible needle base is applied to thin film flip chip During the packaging process, the plurality of probes can make electrical connection by elastically contacting the predetermined object to be tested, so that all the probes can make good electrical connection with the contacts.

Description

Test needle seat structure

This creation provides a test needle base structure, especially a structure with a retractable needle base used in a thin film flip-chip packaging process, where a plurality of probes make electrical connection by elastically contacting the predetermined object to be tested, namely It can achieve the purpose of making good electrical connection between all probes and these contacts.

Press, the probe card (Probe Card) is applied before the integrated circuit (IC) has not been packaged, and the probe (Probe) is used to test the conduction or disconnection test of the bare crystal, and then the defective product is screened out and then packaged. engineering. Therefore, the use of probe cards for integrated circuit testing is an important process for integrated circuits; this probe card test can improve the yield of finished products from the original 70% to 90%, of which 20% increase in yield contribution For semiconductor factories whose yields must be compared, the impact of this process is huge and necessary. The probe card is an interface between a test machine and a wafer. Each integrated circuit requires at least a corresponding probe card for testing. The purpose of the probe card test is to cut the wafer After passing the test, the good product enters the next packaging process, and can avoid further waste caused by the continued processing of the defective product.

In the wafer (wafer) or printed circuit board (PCB) test devices currently used in the industry, the test fixture is provided with a plurality of probes through a probe card, The probes are electrically connected to a plurality of test points of a wafer or a printed circuit board to be tested, and the electronic signals of the test points are acquired by the probes and transmitted to a test machine through the plurality of wires. The test machine The platform shows whether the test points of the wafer or printed circuit to be tested are on or off. Since the chip on film (COF) process is set on the flexible circuit film, the test pin When the multiple probes of the base contact the multiple contacts of the chip to be tested, they are easily affected by the deformation and bending of the flexible circuit film, and all the probes and these contacts cannot be electrically connected, so the test fixture is passed back The electronic signal to the test equipment will generate errors, and the aforementioned problems need to be improved and resolved by those engaged in this industry.

Therefore, in view of the above-mentioned problems and deficiencies in the practice, the creators have collected relevant materials, evaluated and considered by many parties, and used the years of research and development experience in this industry to continuously trial and modify. Was born.

The main purpose of this creation is to provide a test needle holder structure, which is to use a retractable needle holder with a plurality of penetration spaces, and a plurality of probes are provided in the penetration spaces and the tips of the probes are not It is exposed in the penetration spaces, and the bottom ends of the probes are fixed on the bottom side of a substrate, and there is a retractable gap between the retractable needle holder and the substrate and a plurality of elastic members are provided, and the retractable When a contact surface on the bottom side of the needle base is subjected to a contact test with a predetermined object to be tested, the elastic members are compressed and deformed and the retractable needle base moves upward and the top surface bears against the bottom side of the substrate, so that the The tips of the probes are exposed in the penetration spaces by a predetermined length, and the tips of the probes contact a plurality of contacts of the predetermined object to be tested and produce an electrical connection, which is applied by the structure of the retractable needle holder During the flip-chip packaging process of the thin film, the plurality of probes can make electrical connection by elastically contacting the predetermined object to be tested, so that all the probes can make good electrical connection with the contacts.

The secondary purpose of this creation is that the distance of the expansion and contraction gap is 0.3mm.

Another purpose of this creation is that when the bottom side of the retractable needle base is in contact test with a predetermined object to be tested, the predetermined length of the tips of the probes exposed to the wearing spaces is 0.3 mm.

Another purpose of this creation is that the second surface of the circuit board is further provided with a reinforcing ring pad, the reinforcing ring pad is used to strengthen the circuit board structure so that it is not easy to bend and deform.

Another purpose of this creation is that the first surface of the circuit board is further provided with a fixing ring pad, the fixing ring pad has an accommodating space into which the substrate and the retractable needle holder are placed, and the fixing The ring pad extends inwards with a flange, the flange is provided for one of the bottom surfaces of the convex peripheral edge of the base plate to make a resist, and the contact surface of the retractable needle holder when the elastic member is in the reset state It is exposed on the bottom side of the fixing ring pad.

Another purpose of this creation is that a plurality of positioning members are further provided between the base plate and the retractable needle holder, and the positioning pieces are used for positioning and guiding when the retractable needle holder performs a retracting action on the base board The positioning member is composed of a screw or a rivet.

1‧‧‧ circuit board

11‧‧‧The first side

12‧‧‧Second side

2‧‧‧ substrate

3‧‧‧With retractable needle seat

30‧‧‧Putting space

31‧‧‧Probe

311‧‧‧Top

312‧‧‧Bottom

32‧‧‧telescopic clearance

33‧‧‧Elastic parts

34‧‧‧Contact surface

35‧‧‧resistance

36‧‧‧Locating parts

4‧‧‧Reinforced ring pad

5‧‧‧Retaining ring pad

50‧‧‧accommodation space

51‧‧‧Flange

The first picture is a side cross-sectional structure diagram of the test needle base before the test.

The second picture is a side cross-sectional structure diagram of the test needle base created during the test.

The third figure is a partial enlarged structural view of the probe in the second figure.

In order to achieve the above purpose and effect, the technical means and structure adopted in this creation For the purpose of making this drawing, I will explain in detail the structure and function of the preferred embodiment of this creation as follows, so I fully understand it.

Please refer to the first to third figures, each of which is a partial enlarged structural view of the side view cross-sectional structure diagram of the creation test needle seat before the test, the side view cross-sectional structure diagram and the probe during the test. The structure includes a circuit board 1, a base plate 2, a retractable needle base 3, a reinforcing ring pad 4 and a fixed ring pad 5. The components and connection relationships are detailed as follows:

The circuit board 1 has a first surface 11 at the bottom and a second surface 12 at the top, and a plurality of metal contacts (not shown) are provided on the first surface 11 and the second surface 12, the first The metal contacts on the surface 11 are for a predetermined testing instrument (not shown) to make electrical connections;

The substrate 2 is disposed on the first surface 11 on the bottom side of the circuit board 1 and is electrically connected to the metal contacts;

A plurality of penetration spaces 30 are provided inside the retractable needle hub 3, and a plurality of probes 31 are provided in the penetration spaces 30 and the tips of the probes 31 are not exposed from the penetration spaces 30 (such as the first (Shown), and the bottom ends of the probes 31 are fixed on the bottom side of the substrate 2, and the retractable needle holder 3 and the substrate 2 have a telescopic gap 32 and a plurality of elastic members 33, the telescopic The distance of the gap 32 is 0.3 mm (mm), and when a contact surface 34 on the bottom side of the retractable needle base 3 makes a contact test with a predetermined object to be tested (not shown in the figure), the elasticity The piece 33 is compressed and deformed, and the expansion gap 32 between the retractable needle base 3 and the base plate 2 is filled, and the retractable needle base 3 moves upward and the top surface bears against the bottom side of the base plate 2, so that the The tips of the probes 31 are exposed to the penetration space 30 by a preset length (as shown in the second figure), the preset length is 0.3 mm (mm), and the tips of the probes 31 are in contact with the preset Set multiple contacts (not shown in the figure) of the object to be tested and create electrical connections.

A plurality of positioning elements 36 are further provided between the base plate 2 and the retractable needle base 3, the positioning elements 36 are used for the positioning and guiding of the retractable needle base 3 when performing a retracting action on the base plate 2, The positioning member 36 is formed by a screw or a rivet.

A reinforced ring pad 4 is further provided on the second surface 12 of the circuit board 1. The reinforced ring pad 4 is used to strengthen the structure of the circuit board 1 so that it is not easily deformed by bending.

A fixing ring pad 5 is further provided on the first surface 11 of the circuit board 1, the fixing ring pad 5 has an accommodating space 50 into which the substrate 2 and the retractable needle base 3 are placed, and the fixing The ring pad 5 extends inwards with a flange 51 for the bottom surface of one of the abutting surfaces 35 of the convex peripheral edges of the base plate 2 to resist, and the elastic member 33 has the retractable needle in the reset state The contact surface 34 of the seat 3 is exposed on the bottom side of the fixing ring pad 5.

When you want to use the test needle base, first place the preset object under test (for example: flexible circuit film) under the retractable needle base 3, use a preset jig to lift the preset object under test upward, when When the upper surface of the object to be tested contacts the contact surface 34 of the retractable needle base 3, a plurality of elastic members 33 disposed between the base plate 2 and the retractable needle base 3 are compressed and deformed, and the retractable needle base 3 and The expansion gap 32 between the substrates 2 is filled, so that the tops of the plurality of probes 31 are exposed to the penetration spaces 30 by a predetermined length, and the tops of the probes 31 are in contact with the plurality of contacts of the predetermined test object and An electrical connection is generated, and the electronic signals of the contacts of the preset DUT are acquired by the probe and transmitted to a preset testing machine (not shown in the figure) through a plurality of wires (not shown in the figure), The testing machine displays whether the test points of the preset DUT are on or off. After the test is completed, after the preset object to be tested is removed, the reset elasticity of the plurality of elastic members 33 is used to separate the base plate 2 from the retractable needle base 3 and a telescopic gap 32 is generated. At this time, the plurality of probes 3 1 The exposed top is retracted and stored in these wearing spaces 30 to wait for the next test of the preset test object, and so on to complete all the tests.

Through the disclosure of the first to third figures above, we can understand that this creation is a test needle base structure, which is to use a retractable needle base with a plurality of penetration spaces, and the penetration spaces are provided with a plurality of penetration spaces. Probes and the tips of the probes are not exposed in the penetrating spaces, and the bottom ends of the probes are fixed on the bottom side of a substrate, and the retractable needle holder and the substrate have a telescopic gap and are provided with A plurality of elastic members, and when a contact surface on the bottom side of the retractable needle base performs a contact test with a predetermined object to be tested, the elastic members compress and deform and the retractable needle base moves upward and the top surface resists On the bottom side of the substrate, so that the tips of the probes are exposed to the penetration spaces by a preset length, and the tips of the probes contact a plurality of contacts of the preset object to be tested and generate an electrical connection by When the structure of the retractable pin holder is used in the process of thin film flip chip packaging, the plurality of probes can make electrical connection by elastically contacting the predetermined object to be tested, so that all the probes and the contacts can be made The purpose of good electrical connection. This creation is applied to the thin film flip chip packaging process for wafer testing with high accuracy and precision test results, so a patent application is filed to seek patent protection.

The above detailed description is for the description of a preferred feasible embodiment of this creation, but this embodiment is not intended to limit the scope of the patent application of this creation. Any other changes and modifications that have been completed without departing from the spirit of the art disclosed in this creation Changes should be included in the scope of patents covered by this creation.

In summary, the test needle holder structure described above in this creation can indeed achieve its efficacy and purpose when it is used, so this creation is a creation with excellent practicality, which actually meets the requirements for the application of new patents, and the application is submitted according to law. I hope that the review committee will grant this case as soon as possible to protect the creator's hard work. If the bureau has any doubts, please send me a letter and instruct the creator to do his best Together, really feel virtuous.

1‧‧‧ circuit board

11‧‧‧The first side

12‧‧‧Second side

2‧‧‧ substrate

3‧‧‧With retractable needle seat

30‧‧‧Putting space

31‧‧‧Probe

311‧‧‧Top

312‧‧‧Bottom

32‧‧‧telescopic clearance

33‧‧‧Elastic parts

34‧‧‧Contact surface

35‧‧‧resistance

36‧‧‧Locating parts

4‧‧‧Reinforced ring pad

5‧‧‧Retaining ring pad

50‧‧‧accommodation space

51‧‧‧Flange

Claims (6)

A test needle base structure, including: A circuit board with a first surface on the bottom and a second surface on the top, and a plurality of metal contacts on the first surface and the second surface, the metal contacts on the first surface are provided for A preset testing instrument generates electrical connection; A substrate disposed on the first surface on the bottom side of the circuit board and electrically connected to the metal contacts; and A retractable needle holder is provided with a plurality of penetration spaces therein, and a plurality of probes are provided in the penetration spaces and the tips of the probes are not exposed in the penetration spaces, and the bottom ends of the probes It is fixed on the bottom side of the substrate, and there is a telescopic gap between the retractable needle holder and the substrate and a plurality of elastic members are provided, and a contact surface on the bottom side of the retractable needle holder and a preset object to be measured During a contact test, the elastic members are compressed and deformed, and the expansion gap between the retractable needle holder and the substrate is filled, and the retractable needle holder moves upward and the top surface bears against the substrate The bottom side, so that the tips of the probes are exposed to the penetration spaces by a predetermined length, and the tips of the probes contact the plurality of contacts of the predetermined object to be tested and generate an electrical connection. The test needle base structure as described in item 1 of the patent application scope, wherein the distance of the expansion and contraction gap is 0.3 mm. The test needle holder structure as described in item 1 of the patent application scope, wherein when the bottom side of the retractable needle holder makes a contact test with a predetermined object to be tested, the tips of the probes are exposed to the wearing spaces The preset length is 0.3mm. The test needle base structure as described in item 1 of the patent application scope, wherein the second of the circuit board A reinforced ring pad is further arranged on the surface, and the reinforced ring pad is used to strengthen the circuit board structure so that it is not easy to bend and deform. The test needle holder structure as described in item 1 of the patent application scope, wherein a fixing ring pad is further provided on the first surface of the circuit board, and the fixing ring pad is provided with the base plate and the retractable needle holder One of the accommodating spaces, and the fixing ring pad extends inwards with a flange, the flange is provided for one of the outer peripheral edges of the base plate to bear against the bottom of the holding surface, and the elastic member is in the reset state The contact surface of the retractable needle hub is exposed on the bottom side of the fixing ring pad. The test needle base structure as described in item 1 of the patent application scope, wherein a plurality of positioning members are further provided between the base plate and the retractable needle base, and the positioning members are provided for the retractable needle base on the base plate A positioning and guiding is performed when the telescopic action is performed. The positioning member is composed of a screw or a rivet.

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