TWM583556U - Fine metal mask - Google Patents
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- TWM583556U TWM583556U TW108207573U TW108207573U TWM583556U TW M583556 U TWM583556 U TW M583556U TW 108207573 U TW108207573 U TW 108207573U TW 108207573 U TW108207573 U TW 108207573U TW M583556 U TWM583556 U TW M583556U
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Abstract
Description
本創作是關於一種精細金屬遮罩。This creation is about a fine metal mask.
有機發光二極體(Organic Light-Emitting Diode, OLED)因具有自發光、廣視角、省電、高效率、反應時間及輕薄等優點,而被廣泛的應用於電子書、行動電話及顯示器等商品中。OLED包括玻璃基板、有機發光材料層及電極層,有機發光材料層配置於玻璃基板上,電極層配置於有機發光材料層上。其中,有機發光材料層是以蒸鍍的方式形成於玻璃基板上,而蒸鍍時使用的精細金屬遮罩的遮罩圖案不僅決定了有機發光材料層於玻璃基板上的配置位置,還決定了有機發光材料層的尺寸、精細度等,進而影響到OLED顯示器的像素高低。Organic Light-Emitting Diode (OLED) has been widely used in e-books, mobile phones and displays due to its advantages such as self-emission, wide viewing angle, power saving, high efficiency, response time, and thinness. in. The OLED includes a glass substrate, an organic light emitting material layer, and an electrode layer. The organic light emitting material layer is disposed on the glass substrate, and the electrode layer is disposed on the organic light emitting material layer. The organic light-emitting material layer is formed on a glass substrate by evaporation. The mask pattern of the fine metal mask used during evaporation not only determines the position of the organic light-emitting material layer on the glass substrate, but also determines the position of the organic light-emitting material layer on the glass substrate. The size and fineness of the organic light-emitting material layer further affect the pixel height of the OLED display.
為提高OLED顯示器的像素,習知技術於蒸鍍製程中使用精細金屬遮罩(Fine Metal Mask, FMM)形成有機發光材料層。習知技術的精細金屬遮罩的製造方式分為蝕刻法及電鑄法。由於蝕刻法存在可能過蝕、遮罩圖案鈍化等缺點,故相較於蝕刻法,電鑄法製的精細金屬遮罩的遮罩圖案的位置可較為準確且孔徑精度更可達到數個微米(μm)。In order to improve the pixels of the OLED display, the conventional technology uses a fine metal mask (FMM) to form an organic light-emitting material layer during the evaporation process. The manufacturing methods of the conventional fine metal mask are divided into an etching method and an electroforming method. Due to the disadvantages of overetching and mask pattern passivation, the position of the mask pattern of the fine metal mask made by electroforming can be more accurate and the aperture accuracy can reach several microns (μm) compared to the etching method. ).
但是,電鑄法製的精細金屬遮罩的厚度相對較薄,整體結構強度較弱,而容易因外力產生撓曲,導致遮罩圖案於使用上無法精確對準預定設置有機發光材料層的位置的問題,進而影響精細金屬遮罩的使用壽命及OLED顯示器的良率。However, the thickness of the fine metal mask made by the electroforming method is relatively thin, and the overall structural strength is weak, and it is easy to be deflected due to external forces. As a result, the mask pattern cannot be accurately aligned with the position where the organic light emitting material layer is intended to be used. Problems, which in turn affect the service life of fine metal masks and the yield of OLED displays.
本創作提供一種精細金屬遮罩,不易因外力產生撓曲,使用壽命長且可提升OLED顯示器的良率。This creation provides a fine metal mask, which is not easy to be deflected by external forces, has a long service life, and can improve the yield of OLED displays.
為達上述之一或多個目的,本創作所提供的精細金屬遮罩包括遮罩本體及張力邊框,遮罩本體包括中央圖案部及強化外框,中央圖案部具有遮罩圖案,強化外框具有頂面及內緣,頂面與中央圖案部相間隔,內緣與頂面相接且連接於中央圖案部的外緣,強化外框的厚度大於中央圖案部的厚度,且遮罩本體是以電鑄製程製成。張力邊框疊設於強化外框的頂面上且具有中央開口,中央開口與中央圖案部位置相對。In order to achieve one or more of the above purposes, the fine metal mask provided in this creation includes a mask body and a tension frame. The mask body includes a central pattern portion and a reinforced outer frame. The central pattern portion has a mask pattern to strengthen the outer frame. It has a top surface and an inner edge. The top surface is spaced from the central pattern portion. The inner edge is in contact with the top surface and connected to the outer edge of the central pattern portion. The thickness of the strengthened outer frame is greater than the thickness of the central pattern portion. Made by electroforming process. The tension frame is stacked on the top surface of the reinforced outer frame and has a central opening, and the central opening is opposite to the central pattern portion.
在本創作的一實施例中,上述之中央圖案部更包括第一電鑄層的第一中央部,遮罩圖案形成於第一中央部上,且強化外框更包括第一電鑄層的第一周緣部及第二電鑄層,第一周緣部鄰接於第一中央部,第二電鑄層疊設於第一周緣部上,第二電鑄層與第一中央部之間形成貫孔,貫孔連通遮罩圖案,張力邊框疊設於第二電鑄層上,且中央開口連通貫孔且與第一中央部位置相對。In an embodiment of the present invention, the above-mentioned central pattern portion further includes a first central portion of the first electroformed layer, a mask pattern is formed on the first central portion, and the reinforced frame further includes the first electroformed layer. The first peripheral edge portion and the second electroformed layer, the first peripheral edge portion is adjacent to the first central portion, the second electroformed layer is stacked on the first peripheral edge portion, and between the second electroformed layer and the first central portion A through hole is formed, the through hole communicates with a mask pattern, a tension frame is superimposed on the second electroformed layer, and a central opening communicates with the through hole and is opposite to the first central portion.
在本創作的一實施例中,上述之強化外框更包括第三電鑄層,第二電鑄層更包括第二中央部及第二周緣部,第二周緣部鄰接於第二中央部,第三電鑄層疊設於第二周緣部上,第三電鑄層與第二中央部之間形成一透孔,透孔連通貫孔,張力邊框經由第三電鑄層疊設於第二電鑄層的第二周緣部上,中央開口經由透孔連通貫孔,且中央開口與第一中央部及第二中央部位置相對。In an embodiment of the present invention, the reinforced outer frame further includes a third electroformed layer, the second electroformed layer further includes a second central portion and a second peripheral portion, and the second peripheral portion is adjacent to the second central portion. The third electroformed layer is disposed on the second peripheral edge portion. A through hole is formed between the third electroformed layer and the second central portion, and the through hole communicates with the through hole. The tension frame is provided on the second electroformed layer through the third electroformed layer. On the second peripheral edge portion of the layer, the central opening communicates with the through hole through the through hole, and the central opening is opposite to the first central portion and the second central portion.
在本創作的一實施例中,上述之精細金屬遮罩更包括黏著層,黏著層配置於張力邊框與強化外框的頂面之間。In an embodiment of the present invention, the above-mentioned fine metal mask further includes an adhesive layer, and the adhesive layer is disposed between the tension frame and the top surface of the reinforced outer frame.
在本創作的一實施例中,上述之遮罩本體的材料是選自於下列構成的群組:鐵、鈷、鎳及上述至少兩者的合金。In an embodiment of the present invention, the material of the mask body is selected from the group consisting of iron, cobalt, nickel, and an alloy of at least two of the foregoing.
在本創作的一實施例中,上述之張力邊框的材料是選自於下列構成的群組:鐵、鈷、鎳、玻璃及鐵、鈷、鎳中至少兩者的合金。In an embodiment of the present invention, the material of the tension frame is selected from the group consisting of iron, cobalt, nickel, glass, and an alloy of at least two of iron, cobalt, and nickel.
本創作的精細金屬遮罩中,由於強化外框連接於中央圖案部的外緣,且強化外框的厚度大於中央圖案層的厚度,故中央圖案部可於使用或搬運過程中維持平整而不易撓曲,遮罩圖案於多次使用後仍可以精確對準有機發光材料層的預定設置位置,從而有利於提升OLED顯示器的良率。且精細金屬遮罩是採用電鑄法製成,故遮罩圖案的位置準確且孔徑精度可達到數個微米,更無如蝕刻法的汙水處理及蝕刻液管理問題。此外,藉由張力邊框,精細金屬遮罩於製造到應用於蒸鍍製程的整個過程中,遮罩本體的形變量、位移量均可保持相當低,讓中央圖案部的遮罩圖案保持完整,從而有利於提升蒸鍍準確度並提升及OLED顯示器的解析度。In the fine metal mask of this creation, because the reinforced outer frame is connected to the outer edge of the central pattern portion, and the thickness of the reinforced outer frame is greater than the thickness of the central pattern layer, the central pattern portion can be kept flat during use or transportation After deflection, the mask pattern can be accurately aligned with the predetermined setting position of the organic light-emitting material layer after repeated use, thereby helping to improve the yield of the OLED display. And the fine metal mask is made by electroforming, so the position of the mask pattern is accurate and the aperture accuracy can reach several micrometers, and there is no problem of sewage treatment and etching solution management such as the etching method. In addition, through the tension frame, the fine metal mask can be kept relatively low in the deformation and displacement of the mask body during the entire process from manufacturing to the application in the evaporation process, so that the mask pattern in the central pattern part is kept intact. Therefore, it is beneficial to improve the accuracy of evaporation and the resolution of the OLED display.
為讓本創作之上述和其他目的、特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式,作詳細說明如下。In order to make the above and other objects, features, and advantages of this creation more comprehensible, embodiments are described below in detail with the accompanying drawings, as follows.
圖1為本創作一實施例的精細金屬遮罩的上視示意圖。圖2為沿圖1的A-A剖面線的剖面示意圖。請參考圖1及2,本實施例的精細金屬遮罩100包括遮罩本體及張力邊框130,遮罩本體包括中央圖案部110及強化外框120,中央圖案部110具有遮罩圖案111,強化外框120具有頂面121及內緣122,頂面121與中央圖案部110相間隔,內緣122與頂面121相接且連接於中央圖案部110的外緣,且強化外框120的厚度T1大於中央圖案部110的厚度T2,且遮罩本體是以電鑄技術製成。張力邊框130疊設於強化外框120的頂面121上且具有中央開口131,中央開口131與中央圖案部110位置相對。FIG. 1 is a schematic top view of a fine metal mask according to an embodiment of the present invention. Fig. 2 is a schematic cross-sectional view taken along the A-A section line of Fig. 1. Please refer to FIGS. 1 and 2. The fine metal mask 100 of this embodiment includes a mask body and a tension frame 130. The mask body includes a central pattern portion 110 and a reinforced outer frame 120. The central pattern portion 110 has a mask pattern 111 to strengthen The outer frame 120 has a top surface 121 and an inner edge 122. The top surface 121 is spaced from the central pattern portion 110. The inner edge 122 is in contact with the top surface 121 and is connected to the outer edge of the central pattern portion 110. The thickness of the outer frame 120 is strengthened. T1 is greater than the thickness T2 of the central pattern portion 110, and the mask body is made by electroforming technology. The tension frame 130 is stacked on the top surface 121 of the reinforced outer frame 120 and has a central opening 131, and the central opening 131 is opposite to the central pattern portion 110.
上述的中央圖案部110更可包括第一電鑄層200的第一中央部210,遮罩圖案111形成於第一中央部210上,且強化外框120更可包括第一電鑄層200的第一周緣部220及第二電鑄層300,第一周緣部220鄰接於第一中央部210,第二電鑄層300疊設於第一周緣部220上,第二電鑄層300與第一中央部210之間形成貫孔310,貫孔310連通遮罩圖案111,第二電鑄層300具有內緣122及頂面121,張力邊框130疊設於強化外框120的頂面121上,亦即,張力邊框130疊設於第二電鑄層300上。在本實施例中,第一周緣部220與第二電鑄層300的總厚度可為強化外框120的厚度T1,第一中央部210的厚度可為中央圖案部110的厚度T2。此外,遮罩圖案111的孔徑D1可小於貫孔310的孔徑D2,舉例而言,遮罩圖案111的孔徑D1可例如為25 μm,貫孔310的孔徑D2可例如為80 μm,但不以此為限。The above-mentioned central pattern portion 110 may further include a first central portion 210 of the first electroformed layer 200, a mask pattern 111 is formed on the first central portion 210, and the reinforced outer frame 120 may further include the first electroformed layer 200. The first peripheral edge portion 220 and the second electroformed layer 300, the first peripheral edge portion 220 is adjacent to the first central portion 210, the second electroformed layer 300 is stacked on the first peripheral edge portion 220, and the second electroformed layer A through hole 310 is formed between the 300 and the first central portion 210. The through hole 310 communicates with the mask pattern 111. The second electroformed layer 300 has an inner edge 122 and a top surface 121. A tension frame 130 is stacked on top of the reinforced outer frame 120. On the surface 121, that is, the tension frame 130 is stacked on the second electroformed layer 300. In this embodiment, the total thickness of the first peripheral edge portion 220 and the second electroformed layer 300 may be the thickness T1 of the reinforced outer frame 120, and the thickness of the first central portion 210 may be the thickness T2 of the central pattern portion 110. In addition, the aperture D1 of the mask pattern 111 may be smaller than the aperture D2 of the through-hole 310. For example, the aperture D1 of the mask pattern 111 may be, for example, 25 μm, and the aperture D2 of the through-hole 310 may be, for example, 80 μm. This is limited.
上述的精細金屬遮罩100可包括黏著層,黏著層配置於張力邊框130與強化外框120的頂面121之間,換言之,張力邊框130貼附於強化外框120的頂面121,也就是說,張力邊框130貼附於第二電鑄層300上。The above-mentioned fine metal mask 100 may include an adhesive layer disposed between the tension frame 130 and the top surface 121 of the reinforced outer frame 120. In other words, the tension frame 130 is attached to the top surface 121 of the reinforced outer frame 120, that is, That is, the tension frame 130 is attached to the second electroformed layer 300.
本實施例的精細金屬遮罩100,遮罩本體的中央圖案部110的遮罩圖案111可用於製作OLED的有機發光材料層,由於強化外框120連接於中央圖案部110的外緣,且強化外框120的厚度大於中央圖案部110的厚度,故可以提高精細金屬遮罩100整體結構強度,並避免中央圖案部110於使用或搬運過程中因外力而產生撓曲,使中央圖案部110可以維持平整,遮罩圖案111於多次使用後仍可以精確對準有機發光材料層的預定設置位置。因此,本實施例的精細金屬遮罩100不僅使用壽命長且有利於提升OLED顯示器的良率。另外,遮罩本體是以電鑄法製成,故遮罩圖案111的位置準確且孔徑精度可達到數個微米,更無如蝕刻法的汙水處理及蝕刻液管理問題。In the fine metal mask 100 of this embodiment, the mask pattern 111 of the central pattern portion 110 of the main body can be used to fabricate an organic light emitting material layer of the OLED. Since the reinforced outer frame 120 is connected to the outer edge of the central pattern portion 110, and strengthened The thickness of the outer frame 120 is greater than the thickness of the central pattern portion 110, so that the overall structural strength of the fine metal mask 100 can be improved, and the central pattern portion 110 can be prevented from being deformed by external forces during use or transportation, so that the central pattern portion 110 can Maintaining the flatness, the mask pattern 111 can be accurately aligned with the predetermined setting position of the organic light emitting material layer after repeated use. Therefore, the fine metal mask 100 of this embodiment not only has a long service life, but also helps to improve the yield of the OLED display. In addition, the mask body is made by the electroforming method, so the position of the mask pattern 111 is accurate and the aperture accuracy can reach several micrometers, and there is no problem of sewage treatment and etching solution management such as the etching method.
本實施例中的遮罩本體於製造時以電鑄製程形成於基材上,基材例如是玻璃基材,基材與遮罩本體之間設有金屬層。在遮罩本體形成於基材上後,將張力邊框130疊設於強化外框120上;在張力邊框130配置完成後,才將遮罩本體與金屬層及基材分離,從而獲得本實施例的精細金屬遮罩100(包括遮罩本體及張力邊框130)。藉由張力邊框130提供足夠的張力來支撐遮罩本體,即便遮罩本體的厚度相當薄,遮罩本體在與金屬層及基材分離時仍可維持完整且避免變形。再者,傳統將遮罩用於有機發光材料層的蒸鍍製程時,必須經過三個步驟:預張網(before tension)、張網(tension)及蒸鍍(evaporation);在預張網步驟中,遮罩被接合於框架上;在張網步驟中,遮罩及框架被移置到張網機上以將遮罩拉撐;在蒸鍍步驟中,將拉撐後的遮罩置入蒸鍍腔體內以進行蒸鍍。傳統遮罩的結構穩定度較弱,因此於預張網步驟後還須經過張網步驟,將遮罩拉撐才可進行蒸鍍;且由於傳統遮罩的結構穩定度弱,故於預張網步驟必須相當的小心以避免遮罩變形。也就是說,傳統遮罩因結構穩定度較弱,故需要經過複雜的處理步驟及較長的處理時間才能用於蒸鍍。反觀本實施例,藉由張力邊框130,精細金屬遮罩100整體可以保持相當的結構穩定度,當應用於有機發光材料層的蒸鍍製程時,可縮減預張網、張網步驟所需要的時間,甚至不用經過拉撐(張網步驟)即可直接進行蒸鍍,從而減少製作有機發光材料層的時間並降低遮罩於預張網及張網時所衍生的遮罩變形的可能性。據此,本實施例的精細金屬遮罩100由製作到進行蒸鍍製程的整個過程中,遮罩本體的形變量、位移量均可保持相當低,讓中央圖案部110的遮罩圖案111保持完整,從而有利於提升蒸鍍準確度並提升及OLED顯示器的解析度。The mask body in this embodiment is formed on a substrate by an electroforming process during manufacture. The substrate is, for example, a glass substrate, and a metal layer is provided between the substrate and the mask body. After the mask body is formed on the substrate, the tension frame 130 is stacked on the reinforced outer frame 120; after the tension frame 130 is configured, the mask body is separated from the metal layer and the substrate, thereby obtaining this embodiment. Fine metal mask 100 (including the mask body and tension frame 130). The tension frame 130 provides sufficient tension to support the mask body. Even if the thickness of the mask body is relatively thin, the mask body can remain intact and avoid deformation when it is separated from the metal layer and the substrate. Furthermore, traditionally, when a mask is used for an evaporation process of an organic light-emitting material layer, three steps must be passed: before tension, tension, and evaporation; in the step of pre-tensioning In the step, the mask is joined to the frame; in the step of stretching the net, the mask and the frame are moved to the stretching machine to stretch the mask; in the evaporation step, the stretched mask is placed in The inside of the chamber is evaporated for evaporation. The structural stability of traditional masks is weak. Therefore, after the pre-tensioning step, it is necessary to go through the screen stretching step before the mask can be stretched for evaporation; and because the structural stability of traditional masks is weak, it is necessary to pre-tension. The netting step must be done with great care to avoid mask deformation. That is to say, the traditional mask has a weak structural stability, and therefore requires complex processing steps and a long processing time before it can be used for evaporation. In contrast, in this embodiment, with the tension frame 130, the fine metal mask 100 as a whole can maintain a considerable degree of structural stability. When applied to the organic light-emitting material evaporation process, the steps required for the pre-tensioning and the stretching steps can be reduced. In time, vapor deposition can be performed directly without even stretching (screening step), thereby reducing the time for fabricating the organic light-emitting material layer and reducing the possibility of mask deformation caused by masking on the pre-stretched screen and the screen. According to this, during the entire process from the fabrication of the fine metal mask 100 of this embodiment to the evaporation process, the deformation and displacement of the mask body can be kept relatively low, so that the mask pattern 111 of the central pattern portion 110 is maintained. Complete, which is conducive to improving the accuracy of evaporation and the resolution of the OLED display.
圖3為本創作一實施例的精細金屬遮罩的製法的流程圖。請參考圖3,本實施例的精細金屬遮罩的製法包括:步驟S100:濺鍍形成金屬層於玻璃基板上;步驟S200:電鑄形成中央圖案部及強化外框於金屬層上,以獲得一遮罩本體於該金屬層上;以及步驟S300:令張力邊框疊設於強化外框的頂面上並移除金屬層及玻璃基板,以獲得精細金屬遮罩。本實施例的精細金屬遮罩的製法可製得如圖1所示的精細金屬遮罩100。FIG. 3 is a flowchart of a method for manufacturing a fine metal mask according to an embodiment of the present invention. Referring to FIG. 3, the method for manufacturing a fine metal mask in this embodiment includes: Step S100: Sputtering to form a metal layer on a glass substrate; Step S200: Electroforming to form a central pattern portion and strengthening the outer frame on the metal layer to obtain A mask body is on the metal layer; and step S300: the tension frame is superposed on the top surface of the reinforced outer frame and the metal layer and the glass substrate are removed to obtain a fine metal mask. The method for manufacturing a fine metal mask of this embodiment can obtain a fine metal mask 100 as shown in FIG. 1.
圖4為圖3的精細金屬遮罩的製法的步驟S200的流程圖。請參考圖3及4,步驟S200更可包括:步驟S210:形成第一圖案化光阻層於金屬層上;步驟S220:電鑄形成第一電鑄層於金屬層的第一預定電鑄表面上;步驟S230:形成第二圖案化光阻層於第一電鑄層的第一中央部及第一圖案化光阻層上;步驟S240:電鑄形成第二電鑄層於第一電鑄層的第二預定電鑄表面上;以及步驟S250:移除第一圖案化光阻層及第二圖案化光阻層,以獲得遮罩本體於金屬層上。FIG. 4 is a flowchart of step S200 of the method for manufacturing the fine metal mask of FIG. 3. Referring to FIGS. 3 and 4, step S200 may further include: step S210: forming a first patterned photoresist layer on the metal layer; step S220: electroforming to form a first electroforming layer on a first predetermined electroforming surface of the metal layer Step S230: forming a second patterned photoresist layer on the first central portion of the first electroformed layer and the first patterned photoresist layer; step S240: electroforming to form a second electroformed layer on the first electroformed layer On the second predetermined electroformed surface of the layer; and step S250: removing the first patterned photoresist layer and the second patterned photoresist layer to obtain a mask body on the metal layer.
圖5A為對應於圖3中步驟S100的示意圖。請參考圖3及5A,在步驟S100中,金屬層500以濺鍍的方式形成於玻璃基板510上,金屬層500的材料例如可為但不限於銅、鉑、金及銀等導電金屬,玻璃基板510之材料例如可為但不限於氟氧化錫、氧化銦錫或矽。其中,金屬層500可藉由直流濺鍍、射頻濺鍍或三極濺鍍等濺鍍方式形成於玻璃基板510上,本創作對濺鍍方式不予以限制。FIG. 5A is a schematic diagram corresponding to step S100 in FIG. 3. Please refer to FIGS. 3 and 5A. In step S100, a metal layer 500 is formed on the glass substrate 510 by sputtering. The material of the metal layer 500 may be, but is not limited to, conductive metals such as copper, platinum, gold, and silver, and glass. The material of the substrate 510 may be, but is not limited to, tin oxyfluoride, indium tin oxide, or silicon. The metal layer 500 can be formed on the glass substrate 510 by sputtering methods such as direct current sputtering, radio frequency sputtering, or tri-electrode sputtering, and the present invention does not limit the sputtering method.
圖5B為對應於圖4中步驟S210的示意圖。請參考圖4及5B,在步驟S210中,第一圖案化光阻層600形成於金屬層500上,且第一圖案化光阻層600暴露出金屬層500的第一預定電鑄表面501;於本實施例中,第一圖案化光阻層600為乾膜光阻,但不以此為限;於其他實施例中,第一圖案化光阻層600亦可為濕膜光阻。此外,於本實施例中,第一圖案化光阻層600為正光阻,但不以此為限,於其他實施例中,第一圖案化光阻層600也可以是負光阻。FIG. 5B is a schematic diagram corresponding to step S210 in FIG. 4. 4 and 5B, in step S210, a first patterned photoresist layer 600 is formed on the metal layer 500, and the first patterned photoresist layer 600 exposes a first predetermined electroformed surface 501 of the metal layer 500; In this embodiment, the first patterned photoresist layer 600 is a dry film photoresist, but is not limited thereto. In other embodiments, the first patterned photoresist layer 600 may also be a wet film photoresist. In addition, in this embodiment, the first patterned photoresist layer 600 is a positive photoresist, but is not limited thereto. In other embodiments, the first patterned photoresist layer 600 may also be a negative photoresist.
圖5C為對應於圖4中步驟S220的示意圖。請參考圖4及5C,在步驟S220中,第一電鑄層200以電鑄的方式形成於第一預定電鑄表面501上,第一電鑄層200具有第一中央部210及鄰接於第一中央部210的第一周緣部220,第一中央部210與第一圖案化光阻層600連接,第一周緣部220具有第二預定電鑄表面221。第一電鑄層200的材料例如可為鐵、鈷、鎳或上述至少兩者的合金。另外,第一電鑄層200的厚度T2例如可為3 μm至5 μm,更進一步而言,例如為4 μm,但不以此為限。FIG. 5C is a schematic diagram corresponding to step S220 in FIG. 4. Please refer to FIGS. 4 and 5C. In step S220, the first electroformed layer 200 is electroformed on the first predetermined electroformed surface 501. The first electroformed layer 200 has a first central portion 210 and is adjacent to the first electroformed layer 200. A first peripheral edge portion 220 of a central portion 210 is connected to the first patterned photoresist layer 600. The first peripheral edge portion 220 has a second predetermined electroformed surface 221. The material of the first electroformed layer 200 may be, for example, iron, cobalt, nickel, or an alloy of at least two of the foregoing. In addition, the thickness T2 of the first electroformed layer 200 may be, for example, 3 μm to 5 μm, and further, for example, 4 μm, but is not limited thereto.
圖5D為對應於圖4中步驟S230的示意圖。請參考圖4及5D,在步驟S230中,第二圖案化光阻層610形成於第一電鑄層200的第一中央部210及第一圖案化光阻層600上。第二圖案化光阻層610暴露出第二預定電鑄表面221。於本實施例中,第二圖案化光阻層610為乾膜光阻,但不以此為限;於其他實施例中,第二圖案化光阻層610亦可為濕膜光阻。此外,於本實施例中,第二圖案化光阻層610為正光阻,但不以此為限,於其他實施例中,第二圖案化光阻層610也可以是負光阻。FIG. 5D is a schematic diagram corresponding to step S230 in FIG. 4. Please refer to FIGS. 4 and 5D. In step S230, a second patterned photoresist layer 610 is formed on the first central portion 210 and the first patterned photoresist layer 600 of the first electroformed layer 200. The second patterned photoresist layer 610 exposes a second predetermined electroformed surface 221. In this embodiment, the second patterned photoresist layer 610 is a dry film photoresist, but is not limited thereto. In other embodiments, the second patterned photoresist layer 610 may also be a wet film photoresist. In addition, in this embodiment, the second patterned photoresist layer 610 is a positive photoresist, but is not limited thereto. In other embodiments, the second patterned photoresist layer 610 may also be a negative photoresist.
圖5E為對應於圖4中步驟S240的示意圖。請參考圖4及5E,在步驟S240中,第二電鑄層300以電鑄的方式形成於第一電鑄層200的第二預定電鑄表面221上。第二電鑄層300的材料例如可為鐵、鈷、鎳或上述至少兩者的合金。 另外,第二電鑄層300與第一周緣部220的總厚度T1可例如為50 μm至 100 μm,更進一步而言,例如為75 μm,但不以此為限。其中,第一電鑄層200的厚度T2即可等於第一周緣部220的厚度。FIG. 5E is a schematic diagram corresponding to step S240 in FIG. 4. 4 and 5E, in step S240, the second electroformed layer 300 is formed on the second predetermined electroformed surface 221 of the first electroformed layer 200 by electroforming. The material of the second electroformed layer 300 may be, for example, iron, cobalt, nickel, or an alloy of at least two of the foregoing. In addition, the total thickness T1 of the second electroformed layer 300 and the first peripheral edge portion 220 may be, for example, 50 μm to 100 μm, and further, for example, 75 μm, but is not limited thereto. The thickness T2 of the first electroformed layer 200 may be equal to the thickness of the first peripheral edge portion 220.
圖5F為對應於圖4中步驟S250的示意圖。請參考圖2、4、5E及5F,在步驟S250中,將第一圖案化光阻層600、第二圖案化光阻層610移除後,即獲得遮罩本體於金屬層500上。第一圖案化光阻層600移除後形成遮罩圖案111於第一中央部210上,第二圖案化光阻層610移除後可形成貫孔310於第二電鑄層300與第一中央部210之間,貫孔310連通遮罩圖案111,遮罩本體即可包括第一電鑄層200、第二電鑄層300、貫孔310及遮罩圖案111;進一步而言,中央圖案部110更可包括第一中央部210,且強化外框120更可包括第一周緣部220及第二電鑄層300,第二電鑄層300疊設於第一周緣部220上。此外,遮罩圖案111例如可為矩形、菱形、圓形、多邊形等規則形狀,但也可以爲不規則形狀。本創作對遮罩圖案111的形狀及孔徑不予以限制。FIG. 5F is a schematic diagram corresponding to step S250 in FIG. 4. Please refer to FIGS. 2, 4, 5E, and 5F. In step S250, the first patterned photoresist layer 600 and the second patterned photoresist layer 610 are removed to obtain a mask body on the metal layer 500. After the first patterned photoresist layer 600 is removed, a mask pattern 111 is formed on the first central portion 210. After the second patterned photoresist layer 610 is removed, a through hole 310 can be formed in the second electroformed layer 300 and the first Between the central portion 210, the through hole 310 communicates with the mask pattern 111, and the mask body may include the first electroformed layer 200, the second electroformed layer 300, the through hole 310, and the mask pattern 111. Further, the central pattern The portion 110 may further include a first central portion 210, and the reinforced outer frame 120 may further include a first peripheral portion 220 and a second electroformed layer 300, and the second electroformed layer 300 is stacked on the first peripheral portion 220. In addition, the mask pattern 111 may have a regular shape such as a rectangle, a rhombus, a circle, or a polygon, but may also have an irregular shape. The shape and aperture of the mask pattern 111 are not limited in this creation.
此外,本實施例的精細金屬遮罩的製法中,第一圖案化光阻層600可利用如微影技術,將光阻曝光並將曝光後的光阻顯影而獲得;同理,第二圖案化光阻層610亦可以微影技術而獲得,但本創作不以此為限。In addition, in the method for manufacturing a fine metal mask in this embodiment, the first patterned photoresist layer 600 can be obtained by exposing the photoresist and developing the exposed photoresist using, for example, a photolithography technique; similarly, the second pattern The photoresist layer 610 can also be obtained by lithography technology, but this creation is not limited to this.
圖6為對應於圖3中步驟S300的示意圖。請參考圖2、3、5F及6,在步驟S300中,將張力邊框130疊設於強化外框120的頂面121上;接著,將張力邊框130及遮罩本體與金屬層500及玻璃基板510分離,即獲得精細金屬遮罩100。在本實施例中,張力邊框130疊設於第二電鑄層300上,且張力邊框130可經由黏著層140貼附於第二電鑄層300上,黏著層140的材料可為光固化黏著劑,但不以此為限。當以光固化黏著劑固定張力邊框130時,可以先對張力邊框130的位置微調及校正後,才以光照的方式使光固化黏著劑形成黏著層140,如此一來可以使張力邊框130準確地設置於預定位置上,從而提升精細金屬遮罩100的良率。FIG. 6 is a schematic diagram corresponding to step S300 in FIG. 3. Please refer to FIGS. 2, 3, 5F, and 6. In step S300, the tension frame 130 is stacked on the top surface 121 of the reinforced outer frame 120. Next, the tension frame 130 and the mask body and the metal layer 500 and the glass substrate are stacked. When 510 is separated, a fine metal mask 100 is obtained. In this embodiment, the tension frame 130 is stacked on the second electroformed layer 300, and the tension frame 130 may be attached to the second electroformed layer 300 through the adhesive layer 140. The material of the adhesive layer 140 may be a light-cured adhesive. Agents, but not limited to this. When the tension frame 130 is fixed with a light-curing adhesive, the position of the tension frame 130 can be fine-tuned and corrected before the light-curing adhesive is formed into an adhesive layer 140 by means of light. In this way, the tension frame 130 can be accurately made. It is set at a predetermined position, thereby improving the yield of the fine metal mask 100.
圖7為本創作一實施例的精細金屬遮罩的製法的步驟S300的流程圖。請參考圖7,步驟S300更可包括:步驟S310:令張力邊框疊設於第二電鑄層上;步驟S320:覆蓋封閉中央開口的第一保護膜於張力邊框;以及步驟S330:移除金屬層及玻璃基板並覆蓋封閉遮罩圖案的第二保護膜於第一電鑄層遠離第二電鑄層之一側,以獲得精細金屬遮罩於第一保護膜及第二保護膜之間。FIG. 7 is a flowchart of step S300 of a method for manufacturing a fine metal mask according to an embodiment of the present invention. Referring to FIG. 7, step S300 may further include: step S310: superimposing the tension frame on the second electroformed layer; step S320: covering the first protective film that closes the central opening on the tension frame; and step S330: removing metal Layer and a glass substrate and a second protective film covering the closed mask pattern on one side of the first electroformed layer away from the second electroformed layer to obtain a fine metal mask between the first protective film and the second protective film.
圖8A、8B及8C為對應於圖7中步驟S310、S320及S330的示意圖。請參考圖5F、7、8A、8B及8C,於步驟S310中,將張力邊框130經由黏著層140疊設於第二電鑄層300上;於步驟S320中,將第一保護膜700覆蓋於張力邊框130上,且第一保護膜700封閉中央開口131;於步驟S330中,將金屬層500及玻璃基板510移除後,將第二保護膜710覆蓋於第一電鑄層200遠離第二電鑄層300之一側可封閉遮罩圖案111遠離貫孔310的一端,從而獲得精細金屬遮罩100於第一保護膜700及第二保護膜710之間。此外,第一保護膜700及第二保護膜710例如可為光固化解膠膜,但不以此為限。8A, 8B, and 8C are schematic diagrams corresponding to steps S310, S320, and S330 in FIG. Please refer to FIGS. 5F, 7, 8A, 8B, and 8C. In step S310, the tension frame 130 is stacked on the second electroformed layer 300 through the adhesive layer 140. In step S320, the first protective film 700 is covered on On the tension frame 130, and the first protective film 700 closes the central opening 131; in step S330, after the metal layer 500 and the glass substrate 510 are removed, the second protective film 710 is covered on the first electroformed layer 200 away from the second One side of the electroformed layer 300 can close an end of the mask pattern 111 away from the through hole 310, so as to obtain a fine metal mask 100 between the first protective film 700 and the second protective film 710. In addition, the first protective film 700 and the second protective film 710 may be, for example, a photo-curable debonding film, but are not limited thereto.
本實施例的精細金屬遮罩的製法中,藉由將第一保護膜700及第二保護膜710覆蓋於精細金屬遮罩100,可達到保護精細金屬遮罩100免於沾染灰塵或磨損之優點。In the method for manufacturing the fine metal mask of this embodiment, by covering the fine metal mask 100 with the first protective film 700 and the second protective film 710, the advantage of protecting the fine metal mask 100 from dust or abrasion can be achieved. .
此外,本實施例的精細金屬遮罩的製法中,張力邊框130的材料可為玻璃、鐵、鈷、鎳、玻璃或鐵、鈷、鎳中至少兩者的合金。當張力邊框130的材料為玻璃時,由於進行有機發光材料層的蒸鍍的時候所使用的底材也是玻璃,蒸鍍時蒸鍍材料會穿過遮罩本體的遮罩圖案鍍附於底材上的預定位置,當底材跟張力邊框130同樣為玻璃時,底材跟張力邊框130的脹縮率相近;據此,於蒸鍍受熱時,張力邊框130及底材可以相近的脹縮率膨脹,遮罩本體於本身膨脹之同時受張力邊框130作用,可受張力邊框130牽引而變形,使得蒸鍍材料可更為準確的鍍附於底材上的預定位置,更為提升蒸鍍精確度及OLED顯示器的解析度。In addition, in the method for manufacturing a fine metal mask in this embodiment, the material of the tension frame 130 may be glass, iron, cobalt, nickel, glass, or an alloy of at least two of iron, cobalt, and nickel. When the material of the tension frame 130 is glass, since the substrate used for the evaporation of the organic light-emitting material layer is also glass, the evaporation material passes through the mask pattern of the mask body and is plated on the substrate during the evaporation. In the predetermined position above, when the substrate and the tension frame 130 are also glass, the expansion and contraction rates of the substrate and the tension frame 130 are similar; accordingly, when the evaporation heat is applied, the tension frame 130 and the substrate can have similar expansion and contraction rates. Expansion, the mask body expands while being affected by the tension frame 130, and can be deformed by being pulled by the tension frame 130, so that the vapor deposition material can be more accurately deposited on a predetermined position on the substrate, and the evaporation accuracy is further improved. And OLED display resolution.
圖9為本創作一實施例的精細金屬遮罩的示意圖。請參考圖9,本實施例的精細金屬遮罩100中,強化外框120更可包括第三電鑄層400,第二電鑄層300更可包括第二中央部320及第二周緣部330,第二周緣部330鄰接於第二中央部320,第三電鑄層400疊設於第二周緣部330上,第三電鑄層400與第二中央部320之間形成透孔410,透孔410連通貫孔310,張力邊框130經由第三電鑄層400疊設於第二電鑄層300的第二周緣部330上,中央開口131經由透孔410連通該貫孔310,且中央開口131與第一中央部210及第二中央部320位置相對。於本實施例中,強化外框120的厚度T1為第三電鑄層400、第二周緣部330與第一周緣部220的總厚度。此外,貫孔310的孔徑D2小於透孔410的孔徑D3。另外,張力邊框130可經由黏著層140貼附於第三電鑄層400上,也就是說,張力邊框130可經由黏著層140及第三電鑄層400疊設於第二電鑄層300的第二周緣部330上。FIG. 9 is a schematic diagram of a fine metal mask according to an embodiment of the present invention. Referring to FIG. 9, in the fine metal mask 100 of this embodiment, the reinforced outer frame 120 may further include a third electroformed layer 400, and the second electroformed layer 300 may further include a second central portion 320 and a second peripheral portion 330. The second peripheral edge portion 330 is adjacent to the second central portion 320, the third electroformed layer 400 is stacked on the second peripheral edge portion 330, and a through hole 410 is formed between the third electroformed layer 400 and the second central portion 320. The hole 410 communicates with the through hole 310, the tension frame 130 is stacked on the second peripheral edge portion 330 of the second electroformed layer 300 via the third electroformed layer 400, and the central opening 131 communicates with the through hole 310 via the through hole 410, and the central opening 131 is opposite to the first central portion 210 and the second central portion 320. In this embodiment, the thickness T1 of the reinforced outer frame 120 is the total thickness of the third electroformed layer 400, the second peripheral edge portion 330, and the first peripheral edge portion 220. In addition, the hole diameter D2 of the through hole 310 is smaller than the hole diameter D3 of the through hole 410. In addition, the tension frame 130 may be attached to the third electroformed layer 400 through the adhesive layer 140, that is, the tension frame 130 may be stacked on the second electroformed layer 300 through the adhesive layer 140 and the third electroformed layer 400. On the second peripheral edge portion 330.
圖10為本創作一實施例的精細金屬遮罩的製法的步驟S200的流程圖。請參考圖8,本實施例的精細金屬遮罩的製法中,步驟S200在步驟S240與步驟S250之間更可包括:步驟S260:形成第三圖案化光阻層於第二電鑄層的第二中央部及第二圖案化光阻層上;以及步驟S270:電鑄形成第三電鑄層於第二電鑄層的第二周緣部的第三預定電鑄表面上。本實施例的精細金屬遮罩的製法可製得如圖9所示的精細金屬遮罩100。FIG. 10 is a flowchart of step S200 of a method for manufacturing a fine metal mask according to an embodiment of the present invention. Referring to FIG. 8, in the method for manufacturing a fine metal mask in this embodiment, step S200 between steps S240 and S250 may further include: step S260: forming a third patterned photoresist layer on the second electroformed layer. The two central portions and the second patterned photoresist layer; and step S270: electroforming to form a third electroforming layer on a third predetermined electroforming surface of the second peripheral portion of the second electroforming layer. The method for manufacturing a fine metal mask of this embodiment can obtain a fine metal mask 100 as shown in FIG. 9.
圖11A為對應於圖10中步驟S240的示意圖。請參考圖10及11A,在步驟S240中,第二電鑄層300更可具有第二中央部320及鄰接於第二中央部320的第二周緣部330,第二中央部320與第二圖案化光阻層610連接,第二周緣部330具有第三預定電鑄表面331。另外,第一電鑄層200的厚度(即第一電鑄層200的厚度T2)例如可為3 μm至5 μm,更進一步而言,例如為5 μm,但不以此為限。第二電鑄層300與第一周緣部220的總厚度T3可例如為20 μm至100 μm,更進一步而言,例如為30 μm,但不以此為限。FIG. 11A is a schematic diagram corresponding to step S240 in FIG. 10. Please refer to FIGS. 10 and 11A. In step S240, the second electroformed layer 300 may further have a second central portion 320 and a second peripheral edge portion 330 adjacent to the second central portion 320. The second central portion 320 and the second pattern The photoresist layer 610 is connected, and the second peripheral edge portion 330 has a third predetermined electroformed surface 331. In addition, the thickness of the first electroformed layer 200 (that is, the thickness T2 of the first electroformed layer 200) may be, for example, 3 μm to 5 μm, and further, for example, 5 μm, but is not limited thereto. The total thickness T3 of the second electroformed layer 300 and the first peripheral edge portion 220 may be, for example, 20 μm to 100 μm, and further, for example, 30 μm, but is not limited thereto.
圖11B為對應於圖10中步驟S260的示意圖。請參考圖10及11B,在步驟S260中,第三圖案化光阻層620形成於第二電鑄層300的第二中央部320及第二圖案化光阻層610上。第三圖案化光阻層620暴露出第三預定電鑄表面331。於本實施例中,第三圖案化光阻層620為乾膜光阻,但不以此為限;於其他實施例中,第三圖案化光阻層620亦可為濕膜光阻。此外,於本實施例中,第三圖案化光阻層620為正光阻,但不以此為限,於其他實施例中,第三圖案化光阻層620也可以是負光阻。FIG. 11B is a schematic diagram corresponding to step S260 in FIG. 10. Please refer to FIGS. 10 and 11B. In step S260, a third patterned photoresist layer 620 is formed on the second central portion 320 and the second patterned photoresist layer 610 of the second electroformed layer 300. The third patterned photoresist layer 620 exposes a third predetermined electroformed surface 331. In this embodiment, the third patterned photoresist layer 620 is a dry film photoresist, but is not limited thereto. In other embodiments, the third patterned photoresist layer 620 may also be a wet film photoresist. In addition, in this embodiment, the third patterned photoresist layer 620 is a positive photoresist, but is not limited thereto. In other embodiments, the third patterned photoresist layer 620 may be a negative photoresist.
圖11C為對應於圖10中步驟S270的示意圖。請參考圖10及11C,在步驟S270中,第三電鑄層400以電鑄的方式形成於第二電鑄層300的第三預定電鑄表面331上。第三電鑄層400的材料例如可為鐵、鈷、鎳或上述至少兩者的合金。另外,第三電鑄層400、第二周緣部330與第一周緣部220的總厚度(即強化外框120的厚度T1)可例如為50 μm至 100 μm,但不以此為限。FIG. 11C is a schematic diagram corresponding to step S270 in FIG. 10. Referring to FIGS. 10 and 11C, in step S270, the third electroformed layer 400 is formed on the third predetermined electroformed surface 331 of the second electroformed layer 300 by electroforming. The material of the third electroformed layer 400 may be, for example, iron, cobalt, nickel, or an alloy of at least two of the foregoing. In addition, the total thickness of the third electroformed layer 400, the second peripheral edge portion 330, and the first peripheral edge portion 220 (ie, the thickness T1 of the reinforced outer frame 120) may be, for example, 50 μm to 100 μm, but is not limited thereto.
圖11D為對應於圖10中步驟S250的示意圖。請參考圖9、10、11C及11D,在步驟S250中,將第一圖案化光阻層600、第二圖案化光阻層610、第三圖案化光阻層620移除後,即可獲得遮罩本體於金屬層500上。第三圖案化光阻層620移除後可形成透孔410於第三電鑄層400與第二中央部320之間,透孔410與貫孔310連通,強化外框120更可包括第三電鑄層400。FIG. 11D is a schematic diagram corresponding to step S250 in FIG. 10. Please refer to FIGS. 9, 10, 11C, and 11D. In step S250, the first patterned photoresist layer 600, the second patterned photoresist layer 610, and the third patterned photoresist layer 620 are removed to obtain The mask body is on the metal layer 500. After the third patterned photoresist layer 620 is removed, a through hole 410 may be formed between the third electroformed layer 400 and the second central portion 320. The through hole 410 is communicated with the through hole 310, and the reinforced frame 120 may further include a third Electroformed layer 400.
此外,於本實施例的精細金屬遮罩的製法中,第一圖案化光阻層600可利用如微影技術,將光阻曝光並將曝光後的光阻顯影而獲得;同理,第二圖案化光阻層610及第三圖案化光阻層620亦可以微影技術而獲得,但本創作不以此為限。In addition, in the method for manufacturing a fine metal mask in this embodiment, the first patterned photoresist layer 600 may be obtained by exposing the photoresist and developing the exposed photoresist using, for example, a photolithography technique; the same, the second The patterned photoresist layer 610 and the third patterned photoresist layer 620 can also be obtained by lithography technology, but this creation is not limited to this.
本實施例的精細金屬遮罩100的製法中,先形成厚度相對較薄的第一電鑄層200,再以增厚的方式形成厚度相對較厚的第二電鑄層300及第三電鑄層400而獲得強化外框120。其中,由於遮罩圖案111是形成於先形成且厚度相對較薄的第一電鑄層200的第一中央部210上,故遮罩圖案111的位置、形狀及孔徑可被精確控制,則有助於提高OLED顯示器的良率。In the method for manufacturing the fine metal mask 100 of this embodiment, a relatively thin first electroformed layer 200 is formed first, and then a thickened second electroformed layer 300 and a third electroformed layer are formed in a thickened manner. Layer 400 to obtain a reinforced outer frame 120. Among them, since the mask pattern 111 is formed on the first central portion 210 of the first electroformed layer 200 that is formed first and is relatively thin, the position, shape, and aperture of the mask pattern 111 can be accurately controlled. Helps improve the yield of OLED displays.
圖12為本創作一實施例的精細金屬遮罩的製法的步驟S300a的流程圖。請參考圖12,步驟S300a更可包括:步驟S310a:令張力邊框經由第三電鑄層疊設於第二電鑄層上;步驟S320a:覆蓋封閉中央開口的第一保護膜於張力邊框;以及步驟S330a:移除金屬層及玻璃基板並覆蓋封閉遮罩圖案的第二保護膜於第一電鑄層遠離第二電鑄層及第三電鑄層之一側,獲得精細金屬遮罩於第一保護膜及第二保護膜之間。FIG. 12 is a flowchart of step S300a of a method for manufacturing a fine metal mask according to an embodiment of the present invention. Referring to FIG. 12, step S300a may further include: step S310a: the tension frame is laminated on the second electroformed layer through a third electroforming layer; step S320a: a first protective film covering the central opening on the tension frame; and step S330a: The second protective film that removes the metal layer and the glass substrate and covers the closed mask pattern is on a side of the first electroformed layer away from the second and third electroformed layers to obtain a fine metal mask on the first Between the protective film and the second protective film.
圖13A、13B及13C為對應於圖12中步驟S310a、S320a及S330a的示意圖。請參考圖11D、12、13A、13B及13C,於步驟S310a中,將張力邊框130經由第三電鑄層400疊設於第二電鑄層300的第二周緣部330上;於步驟S320a中,將第一保護膜700覆蓋於張力邊框130上,且第一保護膜700可封閉中央開口131;於步驟S330a中,將金屬層500及玻璃基板510移除後,再將第二保護膜710覆蓋於第一電鑄層200遠離第二電鑄層300及第三電鑄層400之一側,可將遮罩圖案111遠離貫孔310的一端封閉,從而獲得精細金屬遮罩100於第一保護膜700及第二保護膜710之間。此外,第一保護膜700及第二保護膜710可例如為光固化解膠膜,但不以此為限。13A, 13B, and 13C are schematic diagrams corresponding to steps S310a, S320a, and S330a in FIG. Please refer to FIGS. 11D, 12, 13A, 13B, and 13C. In step S310a, the tension frame 130 is stacked on the second peripheral edge portion 330 of the second electroformed layer 300 via the third electroformed layer 400; in step S320a The first protective film 700 is covered on the tension frame 130, and the first protective film 700 may close the central opening 131. In step S330a, the metal layer 500 and the glass substrate 510 are removed, and then the second protective film 710 is removed. Covering one side of the first electroformed layer 200 away from the second electroformed layer 300 and the third electroformed layer 400, the end of the mask pattern 111 away from the through hole 310 can be closed, thereby obtaining a fine metal mask 100 at the first Between the protective film 700 and the second protective film 710. In addition, the first protective film 700 and the second protective film 710 may be, for example, a photo-curable debinding film, but are not limited thereto.
本實施例的精細金屬遮罩的製法中藉由將第一保護膜700及第二保護膜710覆蓋於精細金屬遮罩100,可達到保護精細金屬遮罩100免於沾染灰塵或磨損之優點。In the method for manufacturing the fine metal mask of this embodiment, by covering the fine metal mask 100 with the first protective film 700 and the second protective film 710, the advantage of protecting the fine metal mask 100 from dust or abrasion can be achieved.
綜上所述,本創作實施例的精細金屬遮罩中,由於強化外框連接於中央圖案部的外緣,且強化外框的厚度大於中央圖案層的厚度,故中央圖案部可於使用或搬運過程中維持平整而不易撓曲,遮罩圖案於多次使用後仍可以精確對準有機發光材料層的預定設置位置,從而有利於提升OLED顯示器的良率。且精細金屬遮罩是採用電鑄法製成,故遮罩圖案的位置準確且孔徑精度可達到數個微米,更無如蝕刻法的汙水處理及蝕刻液管理問題。此外,藉由張力邊框,精細金屬遮罩於製造到應用於蒸鍍製程的整個過程中,遮罩本體的形變量、位移量均可保持相當低,讓中央圖案部的遮罩圖案保持完整,從而有利於提升蒸鍍準確度並提升及OLED顯示器的解析度。In summary, in the fine metal mask of this creative embodiment, since the reinforced outer frame is connected to the outer edge of the central pattern portion, and the thickness of the reinforced outer frame is greater than the thickness of the central pattern layer, the central pattern portion can be used or During the transportation, it is kept flat and not easily bent, and the mask pattern can be precisely aligned with the predetermined setting position of the organic light emitting material layer after repeated use, which is conducive to improving the yield of the OLED display. And the fine metal mask is made by electroforming, so the position of the mask pattern is accurate and the aperture accuracy can reach several micrometers, and there is no problem of sewage treatment and etching solution management such as the etching method. In addition, through the tension frame, the fine metal mask can be kept relatively low in the deformation and displacement of the mask body during the entire process from manufacturing to the application in the evaporation process, so that the mask pattern in the central pattern part is kept intact. Therefore, it is beneficial to improve the accuracy of evaporation and the resolution of the OLED display.
雖然本創作已以實施例揭露如上,然其並非用以限定本創作,本創作所屬技術領域中具有通常知識者,在不脫離本創作之精神和範圍內,當可作些許之更動與潤飾,因此本創作之保護範圍當視後附之申請專利範圍所界定者為準。Although this creation has been disclosed as an example above, it is not intended to limit this creation. Those with ordinary knowledge in the technical field to which this creation belongs can make some changes and decorations without departing from the spirit and scope of this creation. Therefore, the scope of protection of this creation shall be determined by the scope of the attached patent application.
100‧‧‧精細金屬遮罩
110‧‧‧中央圖案部
111‧‧‧遮罩圖案
120‧‧‧強化外框
121‧‧‧頂面
122‧‧‧內緣
130‧‧‧張力邊框
131‧‧‧中央開口
140‧‧‧黏著層
200‧‧‧第一電鑄層
210‧‧‧第一中央部
220‧‧‧第一周緣部
221‧‧‧第二預定電鑄表面
300‧‧‧第二電鑄層
310‧‧‧貫孔
320‧‧‧第二中央部
330‧‧‧第二周緣部
331‧‧‧第三預定電鑄表面
400‧‧‧第三電鑄層
410‧‧‧透孔
500‧‧‧金屬層
501‧‧‧第一預定電鑄表面
510‧‧‧玻璃基板
600‧‧‧第一圖案化光阻層
610‧‧‧第二圖案化光阻層
620‧‧‧第三圖案化光阻層
700‧‧‧第一保護膜
710‧‧‧第二保護膜
T1、T2、T3‧‧‧厚度
D1、D2、D3‧‧‧孔徑
S100、S200、S210、S220、S230、S240、S250、S260、S270、S300、S300a、S310、S310a、S320、S320a、S330、S330a‧‧‧步驟
100‧‧‧fine metal mask
110‧‧‧ Central Pattern Department
111‧‧‧Mask pattern
120‧‧‧ Enhanced frame
121‧‧‧Top
122‧‧‧Inner edge
130‧‧‧tension frame
131‧‧‧ central opening
140‧‧‧ Adhesive layer
200‧‧‧The first electroformed layer
210‧‧‧First Central
220‧‧‧ the first peripheral edge
221‧‧‧ Second scheduled electroformed surface
300‧‧‧Second electroformed layer
310‧‧‧through hole
320‧‧‧Second Central Section
330‧‧‧Second peripheral edge
331‧‧‧ Third scheduled electroformed surface
400‧‧‧ third electroformed layer
410‧‧‧through hole
500‧‧‧ metal layer
501‧‧‧The first scheduled electroformed surface
510‧‧‧ glass substrate
600‧‧‧The first patterned photoresist layer
610‧‧‧Second patterned photoresist layer
620‧‧‧The third patterned photoresist layer
700‧‧‧first protective film
710‧‧‧Second protective film
T1, T2, T3‧‧‧thickness
D1, D2, D3‧‧‧‧Aperture
S100, S200, S210, S220, S230, S240, S250, S260, S270, S300, S300a, S310, S310a, S320, S320a, S330, S330a‧‧‧Steps
圖1為本創作一實施例的精細金屬遮罩的上視示意圖;
圖2為沿圖1的A-A剖面線的剖面示意圖;
圖3為本創作一實施例的精細金屬遮罩的製法的流程圖;
圖4為圖3的精細金屬遮罩的製法的步驟S200的流程圖;
圖5A為對應於圖3中步驟S100的示意圖;
圖5B為對應於圖4中步驟S210的示意圖;
圖5C為對應於圖4中步驟S220的示意圖;
圖5D為對應於圖4中步驟S230的示意圖;
圖5E為對應於圖4中步驟S240的示意圖;
圖5F為對應於圖4中步驟S250的示意圖;
圖6為對應於圖3中步驟S300的示意圖;
圖7為本創作一實施例的精細金屬遮罩的製法的步驟S300的流程圖;
圖8A為對應於圖7中步驟S310的示意圖;
圖8B為對應於圖7中步驟S320的示意圖;
圖8C為對應於圖7中步驟S330的示意圖;
圖9為本創作一實施例的精細金屬遮罩的示意圖;
圖10為本創作一實施例的精細金屬遮罩的製法的步驟S200的流程圖;
圖11A為對應於圖10中步驟S240的示意圖;
圖11B為對應於圖10中步驟S260的示意圖;
圖11C為對應於圖10中步驟S270的示意圖;
圖11D為對應於圖10中步驟S250的示意圖
圖12為本創作一實施例的精細金屬遮罩的製法的步驟S300a的流程圖;
圖13A為對應於圖12中步驟S310a的示意圖;
圖13B為對應於圖12中步驟S320a的示意圖;以及
圖13C為對應於圖12中步驟S330a的示意圖。
1 is a schematic top view of a fine metal mask according to an embodiment of the present invention;
2 is a schematic cross-sectional view taken along the AA section line of FIG. 1;
3 is a flowchart of a method for manufacturing a fine metal mask according to an embodiment of the present invention;
4 is a flowchart of step S200 of the method for manufacturing a fine metal mask of FIG. 3;
5A is a schematic diagram corresponding to step S100 in FIG. 3;
5B is a schematic diagram corresponding to step S210 in FIG. 4;
5C is a schematic diagram corresponding to step S220 in FIG. 4;
5D is a schematic diagram corresponding to step S230 in FIG. 4;
5E is a schematic diagram corresponding to step S240 in FIG. 4;
5F is a schematic diagram corresponding to step S250 in FIG. 4;
6 is a schematic diagram corresponding to step S300 in FIG. 3;
7 is a flowchart of step S300 of a method for manufacturing a fine metal mask according to an embodiment of the present invention;
FIG. 8A is a schematic diagram corresponding to step S310 in FIG. 7; FIG.
8B is a schematic diagram corresponding to step S320 in FIG. 7;
8C is a schematic diagram corresponding to step S330 in FIG. 7;
9 is a schematic diagram of a fine metal mask according to an embodiment of the present invention;
10 is a flowchart of step S200 of a method for manufacturing a fine metal mask according to an embodiment of the present invention;
FIG. 11A is a schematic diagram corresponding to step S240 in FIG. 10; FIG.
FIG. 11B is a schematic diagram corresponding to step S260 in FIG. 10; FIG.
FIG. 11C is a schematic diagram corresponding to step S270 in FIG. 10;
11D is a schematic diagram corresponding to step S250 in FIG. 10; FIG. 12 is a flowchart of step S300a of a method for manufacturing a fine metal mask according to an embodiment of the present invention;
FIG. 13A is a schematic diagram corresponding to step S310a in FIG. 12;
FIG. 13B is a schematic diagram corresponding to step S320a in FIG. 12; and FIG. 13C is a schematic diagram corresponding to step S330a in FIG.
Claims (6)
一遮罩本體,包括一中央圖案部及一強化外框,該中央圖案部具有一遮罩圖案,該強化外框具有一頂面及一內緣,該頂面與該中央圖案部相間隔,該內緣與該頂面相接且連接於該中央圖案部的一外緣,該強化外框的厚度大於該中央圖案部的厚度,且該遮罩本體是以電鑄製程製成;以及
一張力邊框,疊設於該強化外框的該頂面上且具有一中央開口,該中央開口與該中央圖案部位置相對。 A fine metal mask including:
A mask body includes a central pattern portion and a reinforced outer frame. The central pattern portion has a mask pattern. The reinforced outer frame has a top surface and an inner edge. The top surface is spaced from the central pattern portion. The inner edge is in contact with the top surface and connected to an outer edge of the central pattern portion; the thickness of the reinforced outer frame is greater than the thickness of the central pattern portion; and the mask body is made by an electroforming process; and The tension frame is stacked on the top surface of the reinforced outer frame and has a central opening, and the central opening is opposite to the central pattern portion.
Priority Applications (1)
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TW108207573U TWM583556U (en) | 2019-06-14 | 2019-06-14 | Fine metal mask |
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TW108207573U TWM583556U (en) | 2019-06-14 | 2019-06-14 | Fine metal mask |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113258021A (en) * | 2020-02-10 | 2021-08-13 | 永恒光实业股份有限公司 | Composite fine mask |
CN113258022A (en) * | 2020-02-10 | 2021-08-13 | 永恒光实业股份有限公司 | Composite fine mask |
-
2019
- 2019-06-14 TW TW108207573U patent/TWM583556U/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113258021A (en) * | 2020-02-10 | 2021-08-13 | 永恒光实业股份有限公司 | Composite fine mask |
CN113258022A (en) * | 2020-02-10 | 2021-08-13 | 永恒光实业股份有限公司 | Composite fine mask |
CN113258022B (en) * | 2020-02-10 | 2024-04-09 | 永恒光实业股份有限公司 | Composite fine mask |
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