TWM577496U - Micro distance les detection device - Google Patents
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Abstract
Description
本新型係與鏡頭的檢測裝置有關,特別是指一種微距離的鏡頭檢測裝置。The present invention relates to a lens detecting device, and more particularly to a micro-range lens detecting device.
目前鏡頭已大量地被應用於可攜式的行動裝置上,例如智慧型手機、數位相機等。於製造過程中會因製程差異而改變鏡頭品質,因此,鏡頭於出廠前均需經過檢測,以確定製造完成的鏡頭符合原設計之規範,例如光學解晰調變轉換函數(modulation transfer function, MTF)已為現今市面上評估一個鏡頭之光學品質的常用指標。At present, the lens has been widely used in portable mobile devices, such as smart phones, digital cameras, and the like. In the manufacturing process, the lens quality is changed due to process differences. Therefore, the lens must be tested before leaving the factory to determine that the manufactured lens conforms to the original design specifications, such as the modulation transfer function (MTF). ) has been commonly used to evaluate the optical quality of a lens on the market today.
參閱圖1所示,顯示目前一般所採用的鏡頭檢測裝置,其主要由光源模組11、圖樣測試卡12及一取像模組13組成。該光源模組11發出的光透過該圖樣測試卡12,用於提供待測鏡頭14所需要的測試圖樣。將待測鏡頭14放置在測試位處,用取像模組13獲取測試圖樣經待測鏡頭14所成的影像並傳送至主機15,再利用主機15對被擷取到的影像進行分析。Referring to FIG. 1 , a lens detecting device generally used in the present invention is mainly composed of a light source module 11 , a pattern testing card 12 and an image capturing module 13 . The light emitted by the light source module 11 passes through the pattern test card 12 for providing a test pattern required for the lens 14 to be tested. The image to be tested 14 is placed at the test position, and the image formed by the test pattern 14 through the image to be tested 14 is acquired by the image capturing module 13 and transmitted to the host computer 15, and the captured image is analyzed by the host computer 15.
然而,由於物距與像距存在共軛關係,物距越遠,像距越近,相反,物距越近,像距越遠,因此,此種鏡頭檢測裝置都只能對物距(即待測鏡頭14表面及圖樣測試卡12之間的距離)在特定的範圍之間進行檢測,約為320公厘至500公厘之間,一旦待測鏡頭14及圖樣測試卡12之間的距離小於前述範圍時,特別是在為距離物距(即待測鏡頭14表面及圖樣測試卡12之間的距離在25公厘以下)的狀態下,該取像模組13必須設置相對於該待測鏡頭13在無窮遠處,如此造成設備空間的需求極大,不利檢測裝置的設置。However, since the object distance and the image distance have a conjugate relationship, the farther the object distance is, the closer the image distance is. On the contrary, the closer the object distance is, the farther the image distance is. Therefore, the lens detecting device can only measure the object distance (ie, The distance between the surface of the lens under test 14 and the pattern test card 12 is detected between a specific range, which is between 320 mm and 500 mm, and the distance between the lens 14 to be tested and the pattern test card 12 is When the distance is smaller than the foregoing range, especially in the state of the distance of the object (that is, the distance between the surface of the lens 14 to be tested and the pattern test card 12 is less than 25 mm), the image capturing module 13 must be set relative to the waiting The measuring lens 13 is at infinity, thus causing a great demand for equipment space, which is disadvantageous for the setting of the detecting device.
本新型的目的係在於提供一種微距離的鏡頭檢測裝置,該鏡頭檢測裝置所需的設置空間小即可以微距離的方式對一待測鏡頭進行檢測。The purpose of the present invention is to provide a micro-range lens detecting device, which requires a small installation space to detect a lens to be tested in a micro-distance manner.
為達前述目的,本新型係一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一擴散片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:In order to achieve the above objective, the present invention is a micro-range lens detecting device, which is suitable for detecting a lens to be tested having a surface by micro-distance, and the micro-range lens detecting device comprises a light source module and a diffusion arranged in sequence a film, a pattern test card, a collimator unit, and an image capture module, wherein:
該光源模組,提供一光線;該擴散片,設在該光線的路徑上,用以使經過的該光線更加均勻;該圖樣測試卡,設在經均勻後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。The light source module provides a light; the diffusion sheet is disposed on the path of the light to make the light passing through more uniform; the pattern test card is disposed on the path of the uniform light and has a light-emitting surface, the light pattern of the test pattern required for the lens to be tested is generated by the light; the lens to be tested is disposed between the pattern test card and the collimator unit, and the surface of the lens to be tested is The micro-distance between the light-emitting surfaces of the pattern test card is less than 25 mm; the collimator unit is configured to receive the test pattern light pattern after passing the lens to be tested, and focus on the image capturing mode The imaging module is configured to receive the test pattern light image that is focused by the collimator unit.
本新型的功效在於:藉由該光源模組、擴散片、圖樣測試卡、準直儀單元以及取像模組的依序配置,讓該待測鏡頭與該圖樣測試卡之間在微距離的條件下,可對該待測鏡頭進行光學解晰調變轉換函數(modulation transfer function,MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。另外,該待測鏡頭與該圖樣測試卡之間在該微距離的條件下,於軸上、離軸皆可對該待測鏡頭正確量測MTF,同時該待測鏡頭不論其聚焦平面在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。The utility model has the advantages that: the light source module, the diffusion sheet, the pattern test card, the collimator unit and the image capturing module are sequentially arranged, so that the lens to be tested and the pattern test card are at a micro distance. Under the condition, the lens to be tested can be optically tuned to detect the modulation transfer function (MTF). Therefore, the space required for the lens detecting device is small. In addition, under the condition of the micro-distance between the lens to be tested and the pattern test card, the MTF can be correctly measured on the axis and the off-axis, and the lens to be tested is in the lens regardless of the focus plane. The MTF measurement can be performed inside the mechanism or outside the lens mechanism.
較佳地,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 Preferably, the lens to be tested has a lens barrel and a plurality of lens groups disposed in the lens barrel, and the lens group generates a focusing plane which is located inside the lens barrel or outside the lens barrel.
較佳地,其中該微距離小於10公厘。 Preferably, wherein the micro-distance is less than 10 mm.
較佳地,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 Preferably, the test pattern of the pattern test card is a Bar Chart, an Edge Chart, or a Slit Chart.
較佳地,其中該準直儀單元包含一取像鏡頭及一準直儀,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。 Preferably, the collimator unit includes an image taking lens and a collimator for receiving the test pattern light pattern after passing through the lens to be tested, and the collimator is configured to receive the image. Taking the test pattern of the image lens and focusing on the image capturing module.
另外,同樣為達前述目的,本新型係一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一濾光片、一圖樣測試卡、一準直儀單元以及一取像模組,其中: In addition, for the above purpose, the present invention is a micro-range lens detecting device, which is suitable for detecting a lens to be tested having a surface by micro-distance, and the micro-range lens detecting device comprises a light source module arranged in sequence. a filter, a pattern test card, a collimator unit, and an image capture module, wherein:
該光源模組,提供一光線;該濾光片,設在該光線的路徑上,用以濾除該光線的特定波長光;該圖樣測試卡,設在經濾除後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。 The light source module provides a light; the filter is disposed on the path of the light to filter out the specific wavelength light of the light; the pattern test card is disposed on the path of the filtered light And having a light-emitting surface, the light pattern of the test pattern required for the lens to be tested is generated by the light; the lens to be tested is disposed between the pattern test card and the collimator unit, and the lens to be tested The micro-distance between the surface and the light-emitting surface of the pattern test card is less than 25 mm; the collimator unit is configured to receive the test pattern after passing the lens to be tested, and focus on the The image capturing module is configured to receive the test pattern light image that is focused by the collimator unit.
本新型的功效在於:藉由該光源模組、濾光片、圖樣測試卡、準直儀單元以及取像模組的依序配置,讓該待測鏡頭與該圖樣測試卡之間在微距離的條件下,可對該待測鏡頭進行光學解晰調變轉換函數(modulation transfer function,MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。另外,該待測鏡頭與該圖樣測試卡之間在該微距離的條件下,於軸上、離軸皆可對該待測鏡頭正確量測MTF,同時該待測鏡頭不論其聚焦平面在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。 The utility model has the advantages that: the light source module, the filter, the pattern test card, the collimator unit and the image capturing module are sequentially arranged, so that the distance between the lens to be tested and the pattern test card is at a micro distance Under the condition, the lens to be tested can be optically modulated and modulated (modulation transfer) The detection of the function, MTF), therefore, the setup space required for the lens detecting device is small. In addition, under the condition of the micro-distance between the lens to be tested and the pattern test card, the MTF can be correctly measured on the axis and the off-axis, and the lens to be tested is in the lens regardless of the focus plane. The MTF measurement can be performed inside the mechanism or outside the lens mechanism.
較佳地,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 Preferably, the lens to be tested has a lens barrel and a plurality of lens groups disposed in the lens barrel, and the lens group generates a focusing plane which is located inside the lens barrel or outside the lens barrel.
較佳地,其中該微距離小於10公厘。 Preferably, wherein the micro-distance is less than 10 mm.
較佳地,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 Preferably, the test pattern of the pattern test card is a Bar Chart, an Edge Chart, or a Slit Chart.
較佳地,其中該準直儀單元包含一取像鏡頭及一準直儀及,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。Preferably, the collimator unit includes an image taking lens and a collimator, and the image capturing lens is configured to receive the test pattern light pattern after passing through the lens to be tested, and the collimator is configured to receive the passing image. The test pattern of the image taking lens is optically focused and focused on the image capturing module.
請參閱圖2所示,本新型第一實施例所提供一種微距離的鏡頭檢測裝置,適用於以微距離D檢測一具有一表面21的待測鏡頭20,該微距離的鏡頭檢測裝置包含依序設置的一光源模組30、一擴散片40、一圖樣測試卡50、一準直儀單元60以及一取像模組70,其中:Referring to FIG. 2, a first embodiment of the present invention provides a micro-range lens detecting device, which is suitable for detecting a lens 20 to be tested having a surface 21 by using a micro-distance D, and the lens detecting device of the micro-distance includes A light source module 30, a diffusion sheet 40, a pattern test card 50, a collimator unit 60 and an image capturing module 70 are arranged in sequence, wherein:
該光源模組30,提供一光線。The light source module 30 provides a light.
該擴散片40,設在該光線的路徑上,用以使經過的該光線更加均勻;據此,使得由該光源模組30發出的光線經過擴散片40後更加均勻,提高了最終測量的精度。The diffusion sheet 40 is disposed on the path of the light to make the light passing through more uniform; accordingly, the light emitted by the light source module 30 is more uniform after passing through the diffusion sheet 40, thereby improving the accuracy of the final measurement. .
該圖樣測試卡50,設在經均勻後的該光線的路徑上,並具有一出光面51,藉由該光線產生該待測鏡頭20所需要的測試圖樣光型;本實施例中,該圖樣測試卡50的測試圖樣光型為條狀圖(Bar Chart),但不以此為限,亦可為邊緣圖(Edge Chart)或狹縫圖(Slit Chart)等等。值得說明的是,該圖樣測試卡50的測試圖樣光型會隨著該待測鏡頭20所欲檢測的光學特性不同而有所改變,同時該圖樣測試卡50也可以光柵的方式呈現。The pattern test card 50 is disposed on the path of the uniform light, and has a light-emitting surface 51, and the light pattern of the test pattern required for the lens 20 to be tested is generated by the light; in this embodiment, the pattern The test pattern of the test card 50 is a Bar Chart, but not limited thereto, and may be an Edge Chart or a Slit Chart. It should be noted that the test pattern of the pattern test card 50 may change depending on the optical characteristics to be detected by the lens 20 to be tested, and the pattern test card 50 may also be presented in a raster manner.
該待測鏡頭20,設在該圖樣測試卡50與該準直儀單元60之間,且該待測鏡頭20的表面21與該圖樣測試卡50的出光面51之間為該微距離D,該微距離D為25公厘,但不以此為限,該微距離D小於25公厘的範圍內皆可,例如小於10公厘的5公厘、6公厘、7公厘、8公厘、9公厘等等皆可。本實施例中,該待測鏡頭20具有一鏡筒22及複數設在該鏡筒22內的透鏡組23,該透鏡組23是由複數片透鏡所組成,並產生一聚焦平面231,該聚焦平面231位於該鏡筒22內部。The lens 20 to be tested is disposed between the pattern test card 50 and the collimator unit 60, and the micro-distance D is between the surface 21 of the lens 20 to be tested and the light-emitting surface 51 of the pattern test card 50. The micro-distance D is 25 mm, but not limited thereto, and the micro-distance D is less than 25 mm, for example, less than 10 mm, 5 mm, 6 mm, 7 mm, and 8 mm. PCT, 9 mm, etc. are acceptable. In this embodiment, the lens 20 to be tested has a lens barrel 22 and a plurality of lens groups 23 disposed in the lens barrel 22. The lens group 23 is composed of a plurality of lenses and generates a focusing plane 231. The plane 231 is located inside the lens barrel 22.
該準直儀單元60,用以接收經過該待測鏡頭20後的該測試圖樣光型,並聚焦在該取像模組70;本實施例中,該準直儀單元60包含一取像鏡頭61及一準直儀62,該取像鏡頭61用以接收經過該待測鏡頭20後的該測試圖樣光型,該準直儀62用以接收經過該取像鏡頭61的該測試圖樣光型並聚焦在該取像模組70,同時該準直儀62在該待測鏡頭20與該取像模組70之間模擬出無窮遠的距離。The collimator unit 60 is configured to receive the test pattern after passing through the lens 20 to be tested, and focus on the image capturing module 70. In the embodiment, the collimator unit 60 includes an image capturing lens. 61 and a collimator 62, the image capturing lens 61 is configured to receive the test pattern light pattern after passing through the lens 20 to be tested, and the collimator 62 is configured to receive the test pattern light pattern passing through the image capturing lens 61. And focusing on the image capturing module 70, the collimator 62 simulates an infinite distance between the lens 20 to be tested and the image capturing module 70.
該取像模組70,用以接收該準直儀單元60所聚焦的該測試圖樣光型。The image capturing module 70 is configured to receive the test pattern light type that the collimator unit 60 focuses on.
據此,藉由該光源模組30、擴散片40、圖樣測試卡50、準直儀單元60以及取像模組70的依序配置,讓該待測鏡頭20與該圖樣測試卡50之間在微距離D的條件下,可對該待測鏡頭20進行光學解晰調變轉換函數(modulation transfer function, MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。其中由於該待測鏡頭20的表面21與該圖樣測試卡50的出光面51之間為25公厘的微距離,因此,該圖樣測試卡50所產生的測試圖樣光型經過該待測鏡頭20後,該測試圖樣光型會產生在該待測鏡頭20像面對應焦點處(即該聚焦平面231上),而本新型藉由該準直儀單元60將經過該待測鏡頭20的測試圖樣光型(即成像)接收後再投射到該取像模組70,進而在該待測鏡頭20與該取像模組70之間模擬出無窮遠的距離,最後該取像模組70可以耦接於一主機(圖上未示),該主機取得該測試圖樣光型影像後即可利用該影像求得對應的光學特徵值,例如MTF。Accordingly, the light source module 30, the diffusion sheet 40, the pattern test card 50, the collimator unit 60, and the image capturing module 70 are sequentially disposed between the lens 20 to be tested and the pattern test card 50. Under the condition of the micro-distance D, the lens 20 to be tested can be optically tuned to detect the modulation transfer function (MTF). Therefore, the space required for the lens detecting device is small. The test pattern light generated by the pattern test card 50 passes through the to-be-tested lens 20 because the surface 21 of the to-be-tested lens 20 and the light-emitting surface 51 of the pattern test card 50 are at a micro-distance of 25 mm. After that, the test pattern light pattern is generated at the corresponding focus of the image plane of the lens 20 to be tested (ie, the focus plane 231), and the test pattern of the lens 20 to be tested by the collimator unit 60 is adopted by the collimator unit 60. After the light type (ie, imaging) is received, it is projected to the image capturing module 70, and then an infinite distance is simulated between the lens 20 to be tested and the image capturing module 70. Finally, the image capturing module 70 can be coupled. Connected to a host (not shown), the host can obtain the corresponding optical characteristic value, such as MTF, by using the image of the test pattern.
另外,該待測鏡頭20與該圖樣測試卡50之間在該微距離D的條件下,於軸上、離軸皆可對該待測鏡頭20正確量測MTF,軸上為取像模組70的影像中心點,而離軸即為取像模組70的影像其他位置處。In addition, under the condition of the micro-distance D between the to-be-tested lens 20 and the pattern test card 50, the MTF can be accurately measured on the on-axis and off-axis, and the image capture module is on the axis. The image center point of 70, and the off-axis is the other position of the image of the image capturing module 70.
另外,參閱圖3所示,本新型第二實施例所提供一種微距離的鏡頭檢測裝置,同樣適用於以微距離D檢測該待測鏡頭20,該微距離的鏡頭檢測裝置同樣包含依序設置的光源模組30、擴散片40、圖樣測試卡50、準直儀單元60以及取像模組70,其不同處在於:In addition, referring to FIG. 3, a second embodiment of the present invention provides a micro-range lens detecting device, which is also suitable for detecting the lens 20 to be tested by a micro-distance D. The lens detecting device of the micro-range also includes sequentially setting The light source module 30, the diffusion sheet 40, the pattern test card 50, the collimator unit 60, and the image capturing module 70 are different in:
該待測鏡頭20的聚焦平面231位於該鏡筒22外部。據此,該待測鏡頭20不論其聚焦平面231在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。The focal plane 231 of the lens 20 to be tested is located outside the lens barrel 22. Accordingly, the LFT 20 to be tested can perform MTF measurement regardless of whether the focus plane 231 is inside the lens mechanism or outside the lens mechanism.
值得說明的是,在另一實施狀態中,請同時參閱圖2所示,該微距離的鏡頭檢測裝置包含依序設置的光源模組30、濾光片80、圖樣測試卡50、準直儀單元60以及一取像模組70,也就是將該擴散片40替換成濾光片80,不同處在於: 該濾光片80,設在該光源模組30提供的光線的路徑上,用以濾除該光線的特定波長光。該準直儀單元60會隨著該濾光片80的不同而所改變,特別是該取像鏡頭61。 該圖樣測試卡50,設在經濾除後的該光線的路徑上,並具有一出光面51,藉由該光線產生該待測鏡頭20所需要的測試圖樣光型。It should be noted that, in another implementation state, please refer to FIG. 2 at the same time, the micro-range lens detecting device includes the light source module 30, the filter 80, the pattern test card 50, and the collimator which are sequentially disposed. The unit 60 and the image capturing module 70 are replaced with the filter 80. The difference is that the filter 80 is disposed on the path of the light provided by the light source module 30. Filter out the specific wavelength of light of the light. The collimator unit 60 will vary with the filter 80, particularly the image taking lens 61. The pattern test card 50 is disposed on the path of the filtered light and has a light-emitting surface 51, and the light pattern of the test pattern required for the lens 20 to be tested is generated by the light.
[習知] [知知]
11‧‧‧光源模組 11‧‧‧Light source module
12‧‧‧圖樣測試卡 12‧‧‧ pattern test card
13‧‧‧取像模組 13‧‧‧Image capture module
14‧‧‧待測鏡頭 14‧‧‧Test lens
15‧‧‧主機 15‧‧‧Host
[本新型] [This new type]
D‧‧‧微距離 D‧‧‧Micro Distance
20‧‧‧待測鏡頭 20‧‧‧Densor to be tested
21‧‧‧表面 21‧‧‧ surface
22‧‧‧鏡筒 22‧‧‧Mirror tube
23‧‧‧透鏡組 23‧‧‧ lens group
231‧‧‧聚焦平面 231‧‧‧Focus plane
30‧‧‧光源模組 30‧‧‧Light source module
40‧‧‧擴散片 40‧‧‧Diffuser
50‧‧‧圖樣測試卡 50‧‧‧ pattern test card
51‧‧‧出光面 51‧‧‧Glossy surface
60‧‧‧準直儀單元 60‧‧‧ collimator unit
61‧‧‧取像鏡頭 61‧‧‧Image lens
62‧‧‧準直儀 62‧‧ ‧collimator
70‧‧‧取像模組 70‧‧‧Image capture module
80‧‧‧濾光片 80‧‧‧Filter
圖1是習知鏡頭檢測裝置的示意圖;圖2是本新型第一實施例的示意圖;以及圖3是本新型第二實施例的示意圖。1 is a schematic view of a conventional lens detecting device; FIG. 2 is a schematic view of a first embodiment of the present invention; and FIG. 3 is a schematic view of a second embodiment of the present invention.
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW107214935U TWM577496U (en) | 2018-11-02 | 2018-11-02 | Micro distance les detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW107214935U TWM577496U (en) | 2018-11-02 | 2018-11-02 | Micro distance les detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM577496U true TWM577496U (en) | 2019-05-01 |
Family
ID=67353585
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| Application Number | Title | Priority Date | Filing Date |
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| TW107214935U TWM577496U (en) | 2018-11-02 | 2018-11-02 | Micro distance les detection device |
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2018
- 2018-11-02 TW TW107214935U patent/TWM577496U/en unknown
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