TWI675225B - Micro distance les detection device - Google Patents

Micro distance les detection device Download PDF

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TWI675225B
TWI675225B TW107138907A TW107138907A TWI675225B TW I675225 B TWI675225 B TW I675225B TW 107138907 A TW107138907 A TW 107138907A TW 107138907 A TW107138907 A TW 107138907A TW I675225 B TWI675225 B TW I675225B
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lens
pattern
light
micro
distance
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TW107138907A
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TW202018374A (en
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施維竣
朱誼桓
江宗謙
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新鉅科技股份有限公司
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Abstract

本發明是一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一擴散片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;據此,讓該待測鏡頭與該圖樣測試卡之間在微距離的條件下,可對該待測鏡頭進行光學解晰調變轉換函數(modulation transfer function, MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。The invention is a micro-distance lens detection device, which is suitable for micro-distance detection of a lens to be tested with a surface. The micro-distance lens detection device includes a light source module, a diffuser, and a pattern test arranged in sequence Card, a collimator unit, and an image acquisition module, wherein the lens to be tested is disposed between the pattern test card and the collimator unit, and the surface of the lens to be tested and the light output from the pattern test card The micro-distance between the faces is less than 25 mm; accordingly, the micro-distance between the lens to be tested and the pattern test card can be optically adjusted for the lens under test Detection of a transfer function (modulation transfer function, MTF). Therefore, the installation space required by the lens detection device is small.

Description

微距離的鏡頭檢測裝置Micro-distance lens detection device

本發明係與鏡頭的檢測裝置有關,特別是指一種微距離的鏡頭檢測裝置。The present invention relates to a lens detection device, and more particularly to a micro-distance lens detection device.

目前鏡頭已大量地被應用於可攜式的行動裝置上,例如智慧型手機、數位相機等。於製造過程中會因製程差異而改變鏡頭品質,因此,鏡頭於出廠前均需經過檢測,以確定製造完成的鏡頭符合原設計之規範,例如光學解晰調變轉換函數(modulation transfer function, MTF)已為現今市面上評估一個鏡頭之光學品質的常用指標。Lenses have been widely used in portable mobile devices, such as smart phones and digital cameras. During the manufacturing process, the lens quality will be changed due to process differences. Therefore, the lens must be tested before it leaves the factory to ensure that the manufactured lens meets the original design specifications, such as the modulation transfer function (MTF). ) Has been a common indicator for evaluating the optical quality of a lens on the market today.

參閱圖1所示,顯示目前一般所採用的鏡頭檢測裝置,其主要由光源模組11、圖樣測試卡12及一取像模組13組成。該光源模組11發出的光透過該圖樣測試卡12,用於提供待測鏡頭14所需要的測試圖樣。將待測鏡頭14放置在測試位處,用取像模組13獲取測試圖樣經待測鏡頭14所成的影像並傳送至主機15,再利用主機15對被擷取到的影像進行分析。Referring to FIG. 1, a lens detection device generally used at present is mainly composed of a light source module 11, a pattern test card 12, and an image capturing module 13. The light emitted from the light source module 11 passes through the pattern test card 12 and is used to provide a test pattern required by the lens 14 to be tested. The lens 14 to be tested is placed at the test position, the image formed by the test pattern 14 through the lens 14 to be tested is acquired by the image capturing module 13 and transmitted to the host 15, and the captured image is analyzed by the host 15.

然而,由於物距與像距存在共軛關係,物距越遠,像距越近,相反,物距越近,像距越遠,因此,此種鏡頭檢測裝置都只能對物距(即待測鏡頭14表面及圖樣測試卡12之間的距離)在特定的範圍之間進行檢測,約為320公厘至500公厘之間,一旦待測鏡頭14及圖樣測試卡12之間的距離小於前述範圍時,特別是在為距離物距(即待測鏡頭14表面及圖樣測試卡12之間的距離在25公厘以下)的狀態下,該取像模組13必須設置相對於該待測鏡頭13在無窮遠處,如此造成設備空間的需求極大,不利檢測裝置的設置。However, due to the conjugate relationship between the object distance and the image distance, the farther the object distance is, the closer the image distance is. On the contrary, the closer the object distance is, the further the image distance is. The distance between the surface of the lens 14 to be tested and the pattern test card 12) is detected between a specific range, about 320 mm to 500 mm. Once the distance between the lens 14 to be tested and the pattern test card 12 When it is smaller than the foregoing range, especially in a state where the distance is the object distance (that is, the distance between the surface of the lens 14 to be tested and the pattern test card 12 is less than 25 mm), the image capturing module 13 must be set to The measuring lens 13 is at an infinite distance, which causes a great demand for equipment space, which is disadvantageous to the setting of the detection device.

本發明的目的係在於提供一種微距離的鏡頭檢測裝置,該鏡頭檢測裝置所需的設置空間小即可以微距離的方式對一待測鏡頭進行檢測。The object of the present invention is to provide a micro-distance lens detection device, which requires a small installation space to detect a lens to be measured in a micro-distance manner.

為達前述目的,本發明係一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一擴散片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:In order to achieve the foregoing object, the present invention is a micro-distance lens detection device, which is suitable for micro-distance detection of a lens to be measured with a surface. The micro-distance lens detection device includes a light source module and a diffuser which are sequentially arranged. Film, a pattern test card, a collimator unit, and an image acquisition module, of which:

該光源模組,提供一光線;該擴散片,設在該光線的路徑上,用以使經過的該光線更加均勻;該圖樣測試卡,設在經均勻後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。The light source module provides a light; the diffusion sheet is provided on a path of the light to make the light passing therethrough more uniform; the pattern test card is provided on the path of the light after uniformity and has A light emitting surface generates a test pattern light type required by the lens under test by the light; the lens under test is disposed between the pattern test card and the collimator unit, and the surface of the lens under test and the The light emitting surface of the pattern test card is the micro distance, the micro distance is less than 25 mm; the collimator unit is used to receive the light pattern of the test pattern after passing the lens to be tested, and focus on the image capturing mode The image acquisition module is used to receive the light pattern of the test pattern focused by the collimator unit.

本發明的功效在於:藉由該光源模組、擴散片、圖樣測試卡、準直儀單元以及取像模組的依序配置,讓該待測鏡頭與該圖樣測試卡之間在微距離的條件下,可對該待測鏡頭進行光學解晰調變轉換函數(modulation transfer function,MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。另外,該待測鏡頭與該圖樣測試卡之間在該微距離的條件下,於軸上、離軸皆可對該待測鏡頭正確量測MTF,同時該待測鏡頭不論其聚焦平面在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。The effect of the present invention is that the sequential arrangement of the light source module, the diffusion sheet, the pattern test card, the collimator unit, and the image acquisition module allows the lens to be tested and the pattern test card to be at a small distance. Under the conditions, an optical resolution modulation transfer function (MTF) detection can be performed on the lens to be measured, and therefore, a small installation space requirement of the lens detection device is required. In addition, under the condition of the micro-distance between the lens to be tested and the pattern test card, the MTF can be accurately measured on and off the axis, and the lens to be tested does not matter whether its focus plane is on the lens MTF measurement can be performed inside or outside the lens mechanism.

較佳地,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 Preferably, the lens to be tested has a lens barrel and a plurality of lens groups disposed in the lens barrel, and the lens group generates a focusing plane which is located inside the lens barrel or outside the lens barrel.

較佳地,其中該微距離小於10公厘。 Preferably, the micro-distance is less than 10 mm.

較佳地,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 Preferably, the test pattern of the pattern test card is a bar chart, an edge chart, or a slit chart.

較佳地,其中該準直儀單元包含一取像鏡頭及一準直儀,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。 Preferably, the collimator unit includes an imaging lens and a collimator, the imaging lens is used to receive the light pattern of the test pattern after passing through the lens to be tested, and the collimator is used to receive the light passing through the lens. The light pattern of the test pattern of the image capturing lens is focused on the image capturing module.

另外,同樣為達前述目的,本發明係一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一濾光片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:該光源模組,提供一光線;該濾光片,設在該光線的路徑上,用以濾除該光線的特定波長光;該圖樣測試卡,設在經濾除後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。 In addition, to achieve the foregoing object, the present invention is a micro-distance lens detection device, which is suitable for detecting a lens to be tested with a surface at a micro-distance. The micro-distance lens detection device includes a light source module sequentially arranged. , A filter, a pattern test card, a collimator unit, and an image capturing module, wherein: the light source module provides a light; the filter is arranged on the path of the light to filter Excluding light of a specific wavelength; the pattern test card is provided on the path of the filtered light and has a light emitting surface, and the light pattern of the test pattern required by the lens to be tested is generated by the light; The lens to be tested is set between the pattern test card and the collimator unit, and the micro distance between the surface of the lens to be tested and the light emitting surface of the pattern test card is less than 25 mm; the A collimator unit for receiving the light pattern of the test pattern after passing through the lens to be tested and focusing on the image capturing module; the image capturing module for receiving the test pattern focused by the collimator unit Light type.

本發明的功效在於:藉由該光源模組、濾光片、圖樣測試卡、準直儀單元以及取像模組的依序配置,讓該待測鏡頭與該圖樣測試卡之間在微距離的條件下,可對該待測鏡頭進行光學解晰調變轉換函數(modulation transfer function,MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。另外,該待測鏡頭與該圖樣測試卡之間在該微距離的條件下,於軸上、離軸皆可對該待測鏡頭正確量測MTF,同時該待測鏡頭不論其聚焦平面在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。 The effect of the present invention is: by the sequential arrangement of the light source module, filter, pattern test card, collimator unit and image acquisition module, the micro-distance between the lens under test and the pattern test card Under the condition of the lens, an optical resolution modulation transfer function can be performed on the lens under test. function, MTF), so the installation space required by the lens detection device is small. In addition, under the condition of the micro-distance between the lens to be tested and the pattern test card, the MTF can be accurately measured on and off the axis, and the lens to be tested does not matter whether its focus plane is on the lens MTF measurement can be performed inside or outside the lens mechanism.

較佳地,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 Preferably, the lens to be tested has a lens barrel and a plurality of lens groups disposed in the lens barrel, and the lens group generates a focusing plane which is located inside the lens barrel or outside the lens barrel.

較佳地,其中該微距離小於10公厘。 Preferably, the micro-distance is less than 10 mm.

較佳地,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 Preferably, the test pattern of the pattern test card is a bar chart, an edge chart, or a slit chart.

較佳地,其中該準直儀單元包含一取像鏡頭及一準直儀及,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。Preferably, the collimator unit includes an imaging lens and a collimator, and the imaging lens is used to receive the light pattern of the test pattern after passing through the lens to be tested, and the collimator is used to receive The test pattern of the imaging lens is light-focused and focused on the imaging module.

請參閱圖2所示,本發明第一實施例所提供一種微距離的鏡頭檢測裝置,適用於以微距離D檢測一具有一表面21的待測鏡頭20,該微距離的鏡頭檢測裝置包含依序設置的一光源模組30、一擴散片40、一圖樣測試卡50、一準直儀單元60以及一取像模組70,其中:該光源模組30,提供一光線。Please refer to FIG. 2. A micro-distance lens detection device according to a first embodiment of the present invention is suitable for detecting a lens 20 to be tested with a surface 21 at a micro-distance D. The micro-lens detection device includes A light source module 30, a diffusion sheet 40, a pattern test card 50, a collimator unit 60, and an image capturing module 70 are sequentially arranged, wherein the light source module 30 provides a light.

該擴散片40,設在該光線的路徑上,用以使經過的該光線更加均勻;據此,使得由該光源模組30發出的光線經過擴散片40後更加均勻,提高了最終測量的精度。The diffusion sheet 40 is provided on the path of the light to make the light passing therethrough more uniform; accordingly, the light emitted by the light source module 30 is made more uniform after passing through the diffusion sheet 40, which improves the accuracy of the final measurement. .

該圖樣測試卡50,設在經均勻後的該光線的路徑上,並具有一出光面51,藉由該光線產生該待測鏡頭20所需要的測試圖樣光型;本實施例中,該圖樣測試卡50的測試圖樣光型為條狀圖(Bar Chart),但不以此為限,亦可為邊緣圖(Edge Chart)或狹縫圖(Slit Chart)等等。值得說明的是,該圖樣測試卡50的測試圖樣光型會隨著該待測鏡頭20所欲檢測的光學特性不同而有所改變,同時該圖樣測試卡50也可以光柵的方式呈現。The pattern test card 50 is provided on the path of the light after uniformity, and has a light emitting surface 51. The light pattern of the test pattern required for the lens 20 to be tested is generated by the light. In this embodiment, the pattern The light pattern of the test pattern of the test card 50 is a bar chart, but it is not limited thereto, and may also be an edge chart or a slit chart. It is worth noting that the light pattern of the test pattern of the pattern test card 50 will change with different optical characteristics of the lens 20 to be detected, and the pattern test card 50 can also be presented in a raster manner.

該待測鏡頭20,設在該圖樣測試卡50與該準直儀單元60之間,且該待測鏡頭20的表面21與該圖樣測試卡50的出光面51之間為該微距離D,該微距離D為25公厘,但不以此為限,該微距離D小於25公厘的範圍內皆可,例如小於10公厘的5公厘、6公厘、7公厘、8公厘、9公厘等等皆可。本實施例中,該待測鏡頭20具有一鏡筒22及複數設在該鏡筒22內的透鏡組23,該透鏡組23是由複數片透鏡所組成,並產生一聚焦平面231,該聚焦平面231位於該鏡筒22內部。The lens to be tested 20 is disposed between the pattern test card 50 and the collimator unit 60, and the micro distance D is between the surface 21 of the lens to be tested 20 and the light emitting surface 51 of the pattern test card 50. The micro-distance D is 25 mm, but is not limited thereto. The micro-distance D may be within a range of less than 25 mm, for example, 5 mm, 6 mm, 7 mm, and 8 mm less than 10 mm. Centimeters, 9 millimeters, and so on. In this embodiment, the lens 20 to be tested has a lens barrel 22 and a plurality of lens groups 23 disposed in the lens barrel 22. The lens group 23 is composed of a plurality of lenses and generates a focusing plane 231. The plane 231 is located inside the lens barrel 22.

該準直儀單元60,用以接收經過該待測鏡頭20後的該測試圖樣光型,並聚焦在該取像模組70;本實施例中,該準直儀單元60包含一取像鏡頭61及一準直儀62,該取像鏡頭61用以接收經過該待測鏡頭20後的該測試圖樣光型,該準直儀62用以接收經過該取像鏡頭61的該測試圖樣光型並聚焦在該取像模組70,同時該準直儀62在該待測鏡頭20與該取像模組70之間模擬出無窮遠的距離。The collimator unit 60 is configured to receive the light pattern of the test pattern after passing through the lens 20 to be tested, and focus on the image capturing module 70. In this embodiment, the collimator unit 60 includes an image capturing lens 61 and a collimator 62, the taking lens 61 is used to receive the light pattern of the test pattern after passing through the lens 20 to be tested, and the collimator 62 is used to receive the light pattern of the test pattern passing through the image lens 61 Focusing on the image capturing module 70, the collimator 62 simulates an infinite distance between the lens 20 to be measured and the image capturing module 70.

該取像模組70,用以接收該準直儀單元60所聚焦的該測試圖樣光型。The image capturing module 70 is configured to receive the light pattern of the test pattern focused by the collimator unit 60.

據此,藉由該光源模組30、擴散片40、圖樣測試卡50、準直儀單元60以及取像模組70的依序配置,讓該待測鏡頭20與該圖樣測試卡50之間在微距離D的條件下,可對該待測鏡頭20進行光學解晰調變轉換函數(modulation transfer function, MTF)的檢測,因此,該鏡頭檢測裝置所需的設置空間需求小。其中由於該待測鏡頭20的表面21與該圖樣測試卡50的出光面51之間為25公厘的微距離,因此,該圖樣測試卡50所產生的測試圖樣光型經過該待測鏡頭20後,該測試圖樣光型會產生在該待測鏡頭20像面對應焦點處(即該聚焦平面231上),而本發明藉由該準直儀單元60將經過該待測鏡頭20的測試圖樣光型(即成像)接收後再投射到該取像模組70,進而在該待測鏡頭20與該取像模組70之間模擬出無窮遠的距離,最後該取像模組70可以耦接於一主機(圖上未示),該主機取得該測試圖樣光型影像後即可利用該影像求得對應的光學特徵值,例如MTF。According to this, the light source module 30, the diffusion sheet 40, the pattern test card 50, the collimator unit 60, and the image capturing module 70 are sequentially arranged, so that the lens 20 to be tested and the pattern test card 50 are arranged. Under the condition of the micro-distance D, the optically-determined modulation transfer function (MTF) can be detected on the lens 20 to be measured. Therefore, the installation space requirement of the lens detection device is small. Because the micro-distance between the surface 21 of the lens 20 to be tested and the light-emitting surface 51 of the pattern test card 50 is 25 mm, the light pattern of the test pattern generated by the pattern test card 50 passes through the lens 20 Then, the test pattern light pattern will be generated at the focal point corresponding to the image plane of the lens 20 (ie, on the focusing plane 231), and the present invention passes the test pattern of the lens 20 through the collimator unit 60. The light type (that is, imaging) is received and then projected to the image capturing module 70, and an infinite distance is simulated between the lens 20 to be measured and the image capturing module 70. Finally, the image capturing module 70 can be coupled Connected to a host (not shown in the figure), after obtaining the light pattern image of the test pattern, the host can use the image to obtain the corresponding optical characteristic value, such as MTF.

另外,該待測鏡頭20與該圖樣測試卡50之間在該微距離D的條件下,於軸上、離軸皆可對該待測鏡頭20正確量測MTF,軸上為取像模組70的影像中心點,而離軸即為取像模組70的影像其他位置處。In addition, under the condition of the micro distance D between the lens to be tested 20 and the pattern test card 50, the MTF can be accurately measured on and off the axis, and the image acquisition module is on the axis. The image center point of 70, and the off-axis are other positions of the image of the image capturing module 70.

另外,參閱圖3所示,本發明第二實施例所提供一種微距離的鏡頭檢測裝置,同樣適用於以微距離D檢測該待測鏡頭20,該微距離的鏡頭檢測裝置同樣包含依序設置的光源模組30、擴散片40、圖樣測試卡50、準直儀單元60以及取像模組70,其不同處在於:In addition, as shown in FIG. 3, a micro-distance lens detection device provided by a second embodiment of the present invention is also suitable for detecting the lens 20 to be measured at a micro-distance D. The micro-distance lens detection device also includes sequential settings. The light source module 30, the diffusion sheet 40, the pattern test card 50, the collimator unit 60, and the image capturing module 70 are different in that:

該待測鏡頭20的聚焦平面231位於該鏡筒22外部。據此,該待測鏡頭20不論其聚焦平面231在鏡頭機構內部還是鏡頭機構外部,皆可進行MTF量測。The focusing plane 231 of the lens 20 to be measured is located outside the lens barrel 22. According to this, the MTF measurement can be performed on the lens 20 under test regardless of whether the focusing plane 231 is inside the lens mechanism or outside the lens mechanism.

值得說明的是,在另一實施狀態中,請同時參閱圖2所示,該微距離的鏡頭檢測裝置包含依序設置的光源模組30、濾光片80、圖樣測試卡50、準直儀單元60以及一取像模組70,也就是將該擴散片40替換成濾光片80,不同處在於: 該濾光片80,設在該光源模組30提供的光線的路徑上,用以濾除該光線的特定波長光。該準直儀單元60會隨著該濾光片80的不同而所改變,特別是該取像鏡頭61。 該圖樣測試卡50,設在經濾除後的該光線的路徑上,並具有一出光面51,藉由該光線產生該待測鏡頭20所需要的測試圖樣光型。It is worth noting that, in another implementation state, please refer to FIG. 2 at the same time. The micro-distance lens detection device includes a light source module 30, a filter 80, a pattern test card 50, and a collimator, which are sequentially arranged. The unit 60 and an image capturing module 70, that is, the diffuser 40 is replaced with a filter 80, the difference is that the filter 80 is provided on the path of the light provided by the light source module 30, and is used for Filter out specific wavelengths of the light. The collimator unit 60 is changed according to the filter 80, and in particular the imaging lens 61. The pattern test card 50 is provided on the path of the filtered light and has a light emitting surface 51. The light pattern of the test pattern required by the lens 20 to be tested is generated by the light.

[習知][Habitant]

11‧‧‧光源模組11‧‧‧light source module

12‧‧‧圖樣測試卡12‧‧‧ Pattern Test Card

13‧‧‧取像模組13‧‧‧Image acquisition module

14‧‧‧待測鏡頭14‧‧‧lens

15‧‧‧主機15‧‧‧Host

[本發明][this invention]

D‧‧‧微距離D‧‧‧ micro distance

20‧‧‧待測鏡頭20‧‧‧lens

21‧‧‧表面21‧‧‧ surface

22‧‧‧鏡筒22‧‧‧ Mirror Tube

23‧‧‧透鏡組23‧‧‧ lens group

231‧‧‧聚焦平面231‧‧‧Focus plane

30‧‧‧光源模組30‧‧‧light source module

40‧‧‧擴散片40‧‧‧ diffuser

50‧‧‧圖樣測試卡50‧‧‧Pattern test card

51‧‧‧出光面51‧‧‧light surface

60‧‧‧準直儀單元60‧‧‧collimator unit

61‧‧‧取像鏡頭61‧‧‧Image taking lens

62‧‧‧準直儀62‧‧‧collimator

70‧‧‧取像模組70‧‧‧Image acquisition module

80‧‧‧濾光片80‧‧‧ Filter

圖1是習知鏡頭檢測裝置的示意圖;圖2是本發明第一實施例的示意圖;以及圖3是本發明第二實施例的示意圖。FIG. 1 is a schematic diagram of a conventional lens detection device; FIG. 2 is a schematic diagram of a first embodiment of the present invention; and FIG. 3 is a schematic diagram of a second embodiment of the present invention.

Claims (10)

一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一擴散片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:該光源模組,提供一光線;該擴散片,設在該光線的路徑上,用以使經過的該光線更加均勻;該圖樣測試卡,設在經均勻後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。 A micro-distance lens detection device is suitable for micro-distance detection of a lens to be tested with a surface. The micro-distance lens detection device includes a light source module, a diffusion sheet, a pattern test card, and A collimator unit and an image capturing module, wherein: the light source module provides a light; the diffusion sheet is provided on the path of the light to make the light passing through more uniform; the pattern test card, set On the path of the light after uniformity, there is a light emitting surface, and the light pattern of the test pattern required by the lens to be tested is generated by the light; the lens to be tested is set on the pattern test card and the collimator Between the units, and between the surface of the lens under test and the light emitting surface of the pattern test card, the micro distance is less than 25 mm; the collimator unit is used to receive the The light pattern of the test pattern is focused on the image capturing module; the image capturing module is used to receive the light pattern of the test pattern focused by the collimator unit. 如請求項1所述之微距離的鏡頭檢測裝置,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 The micro-distance lens detection device according to claim 1, wherein the lens to be measured has a lens barrel and a plurality of lens groups disposed in the lens barrel, the lens group generates a focusing plane, and the focusing plane is located in the lens barrel Inside or outside the lens barrel. 如請求項1所述之微距離的鏡頭檢測裝置,其中該微距離小於10公厘。 The micro-distance lens detection device according to claim 1, wherein the micro-distance is less than 10 mm. 如請求項1所述之微距離的鏡頭檢測裝置,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 The micro-distance lens detection device according to claim 1, wherein the test pattern of the pattern test card is a bar chart, an edge chart, or a slit chart. 如請求項1所述之微距離的鏡頭檢測裝置,其中該準直儀單元包含一取像鏡頭及一準直儀,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖 樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。 The micro-lens detection device according to claim 1, wherein the collimator unit includes an imaging lens and a collimator, and the imaging lens is used to receive the test chart after passing through the lens to be tested Sample light type, the collimator is used to receive the light pattern of the test pattern passing through the image capturing lens and focus on the image capturing module. 一種微距離的鏡頭檢測裝置,適用於以微距離檢測一具有一表面的待測鏡頭,該微距離的鏡頭檢測裝置包含依序設置的一光源模組、一濾光片、一圖樣測試卡、一準直儀單元以及一取像模組,其中:該光源模組,提供一光線;該濾光片,設在該光線的路徑上,用以濾除該光線的特定波長光;該圖樣測試卡,設在經濾除後的該光線的路徑上,並具有一出光面,藉由該光線產生該待測鏡頭所需要的測試圖樣光型;該待測鏡頭,設在該圖樣測試卡與該準直儀單元之間,且該待測鏡頭的表面與該圖樣測試卡的出光面之間為該微距離,該微距離小於25公厘;該準直儀單元,用以接收經過該待測鏡頭後的該測試圖樣光型,並聚焦在該取像模組;該取像模組,用以接收該準直儀單元所聚焦的該測試圖樣光型。 A micro-distance lens detection device is suitable for micro-distance detection of a lens to be tested with a surface. The micro-distance lens detection device includes a light source module, a filter, a pattern test card, A collimator unit and an image capturing module, wherein: the light source module provides a light; the filter is arranged on the path of the light to filter out a specific wavelength of the light; the pattern test The card is provided on the path of the filtered light and has a light emitting surface, and the light pattern of the test pattern required by the lens to be tested is generated by the light; the lens to be tested is provided on the pattern test card and The micro-distance is between the collimator unit and the surface of the lens to be tested and the light-emitting surface of the pattern test card, and the micro-distance is less than 25 mm; the collimator unit is used to receive the collimator. The light pattern of the test pattern after measuring the lens is focused on the image capturing module; the image capturing module is used to receive the light pattern of the test pattern focused by the collimator unit. 如請求項6所述之微距離的鏡頭檢測裝置,其中該待測鏡頭具有一鏡筒及複數設在該鏡筒內的透鏡組,該透鏡組產生一聚焦平面,該聚焦平面位於該鏡筒內部或該鏡筒外部。 The micro-distance lens detection device according to claim 6, wherein the lens to be measured has a lens barrel and a plurality of lens groups provided in the lens barrel, the lens group generates a focusing plane, and the focusing plane is located in the lens barrel Inside or outside the lens barrel. 如請求項6所述之微距離的鏡頭檢測裝置,其中該微距離小於10公厘。 The micro-distance lens detection device according to claim 6, wherein the micro-distance is less than 10 mm. 如請求項6所述之微距離的鏡頭檢測裝置,其中該圖樣測試卡的測試圖樣為條狀圖(Bar Chart)、邊緣圖(Edge Chart)、或狹縫圖(Slit Chart)。 The micro-lens detection device according to claim 6, wherein the test pattern of the pattern test card is a bar chart, an edge chart, or a slit chart. 如請求項6所述之微距離的鏡頭檢測裝置,其中該準直儀單元包含一準直儀及一取像鏡頭,該取像鏡頭用以接收經過該待測鏡頭後的該測試圖樣光型,該準直儀用以接收經過該取像鏡頭的該測試圖樣光型並聚焦在該取像模組。The micro-lens detection device according to claim 6, wherein the collimator unit includes a collimator and an imaging lens, and the imaging lens is used to receive the light pattern of the test pattern after passing through the lens to be tested The collimator is used for receiving the light pattern of the test pattern passing through the image capturing lens and focusing on the image capturing module.
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621520A (en) * 1996-05-13 1997-04-15 Northrop Grumman Corporation Transparency inspection method for blurriness in vehicle windscreens with elastomeric liners
US20060274275A1 (en) * 2002-05-20 2006-12-07 Bremer James C Wide field collimator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621520A (en) * 1996-05-13 1997-04-15 Northrop Grumman Corporation Transparency inspection method for blurriness in vehicle windscreens with elastomeric liners
US20060274275A1 (en) * 2002-05-20 2006-12-07 Bremer James C Wide field collimator

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