TWM576739U - Cold-hot exchange circulating structure for controlling temperature of semiconductor equipment - Google Patents

Cold-hot exchange circulating structure for controlling temperature of semiconductor equipment Download PDF

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Publication number
TWM576739U
TWM576739U TW107214674U TW107214674U TWM576739U TW M576739 U TWM576739 U TW M576739U TW 107214674 U TW107214674 U TW 107214674U TW 107214674 U TW107214674 U TW 107214674U TW M576739 U TWM576739 U TW M576739U
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Taiwan
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heat exchange
cold heat
cold
semiconductor device
temperature
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TW107214674U
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Chinese (zh)
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張寶曜
林立崧
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博斯科技股份有限公司
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Priority to TW107214674U priority Critical patent/TWM576739U/en
Publication of TWM576739U publication Critical patent/TWM576739U/en

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Abstract

一種用於控制半導體設備溫度的冷熱交換循環結構,其係組設於一半導體設備中,並包含有;一傳導本體,其內部係具有一冷熱交換空間,又,該傳導本體更具有複數隔板、一組接口、一進液孔、一出液孔及複數組接部;及至少一蓋體,其係對應蓋設於該組接口,該蓋體對應該等組接部設有複數連接部,該等連接部係組設於該等組接部,使該蓋體封蓋該組接口;其中,該等隔板,其係凸設於該冷熱交換空間之內周壁,並使該冷熱交換空間形成有一流道,而該組接口、該進液孔及該出液孔係設於該傳導本體之外側;另外,該傳導本體係連接一致冷模組;藉此,本創作係裝設於半導體設備中,並能達到精準冷熱補償控制製程、機台溫度的效用。A cold heat exchange cycle structure for controlling temperature of a semiconductor device, which is assembled in a semiconductor device and includes: a conductive body having a cold heat exchange space therein, and further having a plurality of partition plates a set of interfaces, a liquid inlet hole, a liquid outlet hole and a plurality of connection portions; and at least one cover body correspondingly disposed on the group interface, the cover body corresponding to the assembly portion is provided with a plurality of connection portions The connecting portions are disposed in the connecting portions, so that the cover covers the set of interfaces; wherein the partitions are protruded from the inner peripheral wall of the cold heat exchange space, and the cold heat exchange is performed The space is formed with a first-class track, and the set of interfaces, the liquid inlet hole and the liquid outlet hole are disposed on the outer side of the conductive body; in addition, the conductive system is connected to the uniform cold module; thereby, the creative system is installed in In semiconductor equipment, it can achieve the effect of precise cold and heat compensation control process and machine temperature.

Description

用於控制半導體設備溫度的冷熱交換循環結構Cold and heat exchange cycle structure for controlling temperature of semiconductor equipment

本創作係與一種冷熱交換結構有關,特別是指一種用於控制半導體設備溫度的冷熱交換循環結構。The present invention relates to a cold heat exchange structure, and more particularly to a cold heat exchange cycle structure for controlling the temperature of a semiconductor device.

按,已知在半導體製造與處理,包括例如蝕刻與沉積處理,其處理品質主要取決於半導體處理裝置的基板溫度,故一般會藉由熱交換設備控制基板之溫度,以使半導體處理的處理品質更為良好。According to the semiconductor manufacturing and processing, including, for example, etching and deposition processing, the processing quality mainly depends on the substrate temperature of the semiconductor processing device, so the temperature of the substrate is generally controlled by the heat exchange device to make the processing quality of the semiconductor processing. More good.

例如,以低溫以及致冷冷卻係被典型地使用來冷卻用於致冷分離之流體,捕捉水蒸氣用以在真空處理程序中產生低蒸氣壓力,及用以在製造程序中對物體進行冷卻,例如是在半導體晶圓處理、影像偵測器及輻射偵測器之冷卻、工業熱傳、以及生化製藥和生醫應用、以及生醫儲存、以及化學處理程序中;一般而言,冷卻循環係會對一冷卻氣體進行壓縮,經由以冷卻劑所進行之熱交換而對氣體進行冷凝、並且可能更進一步地與返回中的已減壓或已膨脹氣體進行熱交換,用以達成額外的冷卻;通常,冷卻循環的諸部分係具有二相態之液體/氣體流動。For example, low temperature and cryogenic cooling systems are typically used to cool fluids for cryogenic separation, to capture water vapor for generating low vapor pressures in vacuum processing procedures, and to cool objects during manufacturing processes, For example, in semiconductor wafer processing, image detector and radiation detector cooling, industrial heat transfer, and biochemical pharmaceutical and biomedical applications, as well as biomedical storage, and chemical processing procedures; in general, the cooling cycle system Compressing a cooling gas, condensing the gas via heat exchange with the coolant, and possibly further heat exchange with the decompressed or expanded gas in the return for additional cooling; Typically, portions of the cooling cycle have a liquid/gas flow in a two-phase state.

另外,用於製造半導體的某些工藝可能需要複雜的工藝以使外延層生長來創建多層半導體結構以用於製造高性能裝置;在該工藝中,外延層是透過被稱之為化學氣相沉積(CVD)的一般工藝而生長的。一種類型的CVD工藝被稱之為金屬有機化學氣相沉積(MOCVD)。在MOCVD中,將反應氣體導入使反應氣體沉積在襯底(通常被稱之為晶片)上以生長薄外延層的受控環境內的密封的反應室中。In addition, certain processes for fabricating semiconductors may require complex processes to grow epitaxial layers to create multilayer semiconductor structures for use in fabricating high performance devices; in this process, epitaxial layers are known as chemical vapor deposition. (CVD) is grown by the general process. One type of CVD process is known as metal organic chemical vapor deposition (MOCVD). In MOCVD, a reactive gas is introduced into a sealed reaction chamber in a controlled environment in which a reactive gas is deposited on a substrate, commonly referred to as a wafer, to grow a thin epitaxial layer.

再者,現今半導體系統設備中,以MOCVD系統設備為例,於MOCVD系統設備內的氣體控制系統(Gas handling & mixing system)中,係具有針對載體氣體進行調控溫度的設備,其主要係透過壓縮機來運作,但是由於壓縮機的設置係會形成一組大型的設備,且不但能夠安靜的運作,從而整體設備體積大,且未有效地能於半導體製程中控制在測試要求的溫度。Furthermore, in the current semiconductor system equipment, the MOCVD system equipment is taken as an example, and in the gas handling & mixing system of the MOCVD system equipment, there is a device for regulating the temperature of the carrier gas, which is mainly through compression. The machine operates, but because the compressor is set up to form a large set of equipment, and not only can be quiet operation, the overall equipment is bulky, and is not effectively able to control the temperature required for testing in the semiconductor process.

另外,關於熱的傳遞有三種模式,即傳導、對流及輻射。傳導係將兩個物體相互接觸,而使熱量自高溫物體朝低溫物體傳遞。對流係指液體或氣體等流體的流動而傳遞熱量,其中包括有由於流體內部的溫度不同而導致密度或壓力變化所致的自然對流,以及對系統施以外力而被迫發生的強制對流。輻射則係源自物體自身的溫度而朝外發射電磁波形式能量的作用,其強度取決於溫度的高低。In addition, there are three modes of heat transfer, namely conduction, convection, and radiation. The conduction system brings two objects into contact with each other, and heat is transferred from the high temperature object toward the low temperature object. Convection refers to the transfer of heat by the flow of a fluid such as a liquid or a gas, including natural convection due to changes in density or pressure due to differences in temperature inside the fluid, and forced convection forced by external forces applied to the system. Radiation is the effect of emitting energy in the form of electromagnetic waves from the temperature of the object itself, the intensity of which depends on the temperature.

利用上述熱傳原理,業界開發了空冷式散熱器,其以一導熱座接觸熱源,並自導熱座伸出許多鰭片,該導熱座將熱源所產生之熱量導向鰭片,當空氣流過這些鰭片時即可藉由上述熱的傳導模式帶走熱量,以達降低熱源溫度的目的;惟散熱的效率取決於物質的導熱係數,而空氣的導熱係數甚小,因而空冷式散熱器的散熱效率不佳。Using the above heat transfer principle, the industry has developed an air-cooled heat sink that contacts a heat source with a heat-conducting seat and projects a plurality of fins from the heat-conducting seat. The heat-conducting seat directs heat generated by the heat source to the fins when the air flows through the air. When the fins are taken away, the heat can be removed by the above-mentioned heat conduction mode to reduce the temperature of the heat source; however, the heat dissipation efficiency depends on the thermal conductivity of the substance, and the thermal conductivity of the air is very small, so that the heat dissipation of the air-cooled heat sink Inefficient.

是以,本案創作人在觀察到上述缺失後,而遂有本創作之產生。Therefore, the creators of this case have observed the above-mentioned deficiencies, but have not produced this creation.

本創作之主要目的係在提供一種用於控制半導體設備溫度的冷熱交換循環結構,其係裝設於半導體設備中,並能達到精準冷熱補償控制製程、機台溫度的目的。The main purpose of this creation is to provide a cold and heat exchange cycle structure for controlling the temperature of a semiconductor device, which is installed in a semiconductor device and can achieve the purpose of precise cold and heat compensation control process and machine temperature.

為達上述目的,本創作所提供之用於控制半導體設備溫度的冷熱交換循環結構,其係組設於一半導體設備中,並包含有:一傳導本體,其內部係具有一冷熱交換空間,並具有:複數隔板,其係凸設於該冷熱交換空間之內周壁,並使該冷熱交換空間形成有一流道;至少一組接口,其係開設於該傳導本體之外側,且該組接口與該冷熱交換空間相連通;至少一進液孔,其係穿設於該傳導本體之外側,並連接該流道之一端;至少一出液孔,其係穿設於該傳導本體之外側,並連接該流道之另一端;複數組接部,其係設於該傳導本體之外側,並間隔鄰設於該組接口;另,該冷熱交換循環結構還包含有至少一蓋體,其係對應蓋設於該組接口,該蓋體對應該等組接部設有複數連接部,該等連接部係組設於該等組接部,使該蓋體封蓋該組接口。To achieve the above objective, the cold heat exchange cycle structure for controlling the temperature of a semiconductor device provided by the present invention is assembled in a semiconductor device and includes: a conductive body having a cold heat exchange space therein, and The utility model has a plurality of partitions protruding from an inner peripheral wall of the cold heat exchange space, and the cold heat exchange space is formed with a first-class track; at least one set of interfaces is formed on an outer side of the conductive body, and the set of interfaces is The cold heat exchange space is connected to each other; at least one liquid inlet hole is disposed on the outer side of the conductive body and connected to one end of the flow channel; at least one liquid outlet hole is disposed on the outer side of the conductive body, and The other end of the flow channel is connected to the outer side of the conductive body, and is disposed adjacent to the group of interfaces; and the cold heat exchange cycle structure further includes at least one cover body corresponding to The cover is disposed on the set of interfaces, and the cover body is provided with a plurality of connecting portions corresponding to the connecting portions, and the connecting portions are assembled to the assembled portions, so that the cover covers the set of interfaces.

較佳地,其中更包含有至少一致冷模組,該致冷模組包含有至少一致冷晶片、一電源單元及一控制單元,該致冷晶片係電性連接該電源單元,該電源單元係電性連接該控制單元,又,該致冷晶片係連接該傳導本體,而該致冷晶片係具有一致冷連接面及一發熱連接面,另,該致冷連接面及該發熱連接面係選自為一平面、粗糙面、具有複數盲孔之表面及具有複數切溝之表面其中之一種。Preferably, the cooling module further includes at least a uniform cold chip, the cooling module includes at least a uniform cold chip, a power supply unit, and a control unit, the cooling chip is electrically connected to the power supply unit, and the power supply unit is Electrically connecting the control unit, and the cooling chip is connected to the conductive body, and the cooling chip has a uniform cold connection surface and a heat connection surface, and the refrigeration connection surface and the heat connection surface are selected It is one of a flat surface, a rough surface, a surface having a plurality of blind holes, and a surface having a plurality of dicing grooves.

較佳地,其中該傳導本體係選自連接該致冷連接面及該發熱連接面其中之一。Preferably, the conduction system is selected from one of a connection between the refrigeration connection surface and the heat connection surface.

較佳地,其中二冷熱交換循環結構之傳導本體係分別連接該致冷連接面及該發熱連接面。Preferably, the conduction system of the two cold heat exchange cycle structures respectively connects the refrigeration connection surface and the heat connection surface.

較佳地,其中更包含有一冷卻器,該冷卻器係連接該進液孔與該出液口,又,該流道、該進液孔、該出液口及該冷卻器形成一冷熱交換循環迴路。Preferably, the method further includes a cooler connecting the liquid inlet hole and the liquid outlet, and the flow channel, the liquid inlet hole, the liquid outlet port and the cooler form a cold heat exchange cycle. Loop.

較佳地,其中更包含有一冷卻器,該冷卻器係連接該進液孔與該出液口,而該傳導本體係連接該致冷晶片,又,該流道、該進液孔、該出液口及該冷卻器形成一冷熱交換循環迴路,而該冷熱交換循環迴路係用以對該致冷連接面或該發熱連接面進行熱傳導。Preferably, the method further comprises a cooler connecting the liquid inlet hole and the liquid outlet, and the conduction system is connected to the refrigerant chip, and the flow channel, the liquid inlet hole, the outlet The liquid port and the cooler form a cold heat exchange circulation loop for thermally conducting the refrigerant connection surface or the heat connection surface.

較佳地,其中該等組接部係選自螺孔、卡槽及卡塊其中之一或其組合,又,該等連接部係選自通孔及卡接孔其中之一或其組合。Preferably, the components are selected from one or a combination of a screw hole, a card slot and a card block, and the connection portions are selected from one of a through hole and a snap hole or a combination thereof.

較佳地,其中更包含有複數組接件,該等組接件係穿過該等連接部,並組設於該等組接部,並使該蓋體蓋設於該組接口。Preferably, the method further includes a plurality of connectors, the components are passed through the connecting portions, and are assembled to the connecting portions, and the cover is disposed on the set of interfaces.

較佳地,其中該傳導本體係由耐腐蝕金屬材質所構成,又,該傳導本體於該冷熱交換空間、該進液孔及該出液孔塗設有一耐腐蝕塗層。Preferably, the conductive system is made of a corrosion-resistant metal material, and the conductive body is coated with a corrosion-resistant coating on the cold heat exchange space, the liquid inlet hole and the liquid outlet.

較佳地,其中該傳導本體係具有二組接口,又,二蓋體係分別蓋設於該等組接口。Preferably, the conductive system has two sets of interfaces, and the two cover systems are respectively disposed on the set of interfaces.

本創作所提供之用於控制半導體設備溫度的冷熱交換循環結構,主要係利用該傳導本體係連接該致冷晶片的該致冷連接面或該發熱連接面,同時,搭配該冷熱交換空間之流道設置,以及該等隔板連接該冷熱交換空間之內周壁的一端兩側係呈彎弧狀,使該流道呈連續彎曲設置;更詳而言之,該流道呈連續彎曲設置係能提供於工作流體順利通過該冷熱交換空間,以達進行冷熱的傳導;藉此,本創作達到精準冷熱補償控制製程、機台溫度的功效。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device provided by the present invention mainly uses the conduction system to connect the refrigeration connection surface or the heat connection surface of the refrigerant chip, and at the same time, the flow of the cold heat exchange space The track arrangement, and one end of the inner wall of the partition wall connecting the cold heat exchange space is curved, so that the flow path is continuously curved; more specifically, the flow path is continuously curved. The working fluid is smoothly passed through the cold heat exchange space to conduct the conduction of heat and cold; thereby, the creation achieves the effect of precise cold and heat compensation control process and machine temperature.

請參閱圖1及圖2,並搭配圖3、圖4及圖5所示,係為本創作第一實施例之立體圖、分解立體圖、方塊示意圖及組合立體圖,其係揭露有一種用於控制半導體設備溫度的冷熱交換循環結構100,其係組設於一半導體設備(圖未示,例如:冰水機、冷卻機、溫度控制器…等)中,並包含有:Please refer to FIG. 1 and FIG. 2 , together with FIG. 3 , FIG. 4 and FIG. 5 , which are perspective views, exploded perspective views, block diagrams and combined perspective views of the first embodiment of the present invention, which are disclosed for controlling a semiconductor. The device temperature cold heat exchange cycle structure 100 is assembled in a semiconductor device (not shown, for example, a chiller, a chiller, a temperature controller, etc.), and includes:

一傳導本體10,其係呈矩形體狀,且該傳導本體10的內部係具有一冷熱交換空間11,又,該傳導本體10更具有複數隔板12、一組接口13、一進液孔14、一出液孔15及複數組接部16,其中:A conductive body 10 having a rectangular shape, and the interior of the conductive body 10 has a cold heat exchange space 11 . Further, the conductive body 10 further has a plurality of partitions 12 , a set of interfaces 13 , and a liquid inlet 14 . , a liquid outlet 15 and a complex array 16 , wherein:

該等隔板12係凸設於該冷熱交換空間11之內周壁,並使該冷熱交換空間11形成有一流道111;於本實施例中,該等隔板12連接該冷熱交換空間11之內周壁的一端兩側係呈彎弧狀,使該流道111呈連續彎曲設置。The partitions 12 are protruded from the inner peripheral wall of the cold heat exchange space 11, and the cold heat exchange space 11 is formed with a first-class channel 111. In the embodiment, the partitions 12 are connected to the cold heat exchange space 11. One end of one end of the peripheral wall is curved, so that the flow path 111 is continuously curved.

該組接口13係開設於該傳導本體10之外側面,且該組接口13與該冷熱交換空間11相連通;於本實施例中,該組接口13係為矩形區域狀的開口,且該組接口13與該冷熱交換空間11係形成為一開放式之容置槽。The set of interfaces 13 is open to the outer side of the conductive body 10, and the set of interfaces 13 is connected to the cold heat exchange space 11; in this embodiment, the set of interfaces 13 is a rectangular area-shaped opening, and the set The interface 13 and the cold heat exchange space 11 are formed as an open receiving groove.

該進液孔14係穿設於該傳導本體10之外周側,並連接該流道111之一端。The liquid inlet hole 14 is bored on the outer peripheral side of the conductive body 10 and connected to one end of the flow path 111.

該出液孔15係穿設於該傳導本體10之外周側,並連接該流道111之另一端。The liquid outlet hole 15 is bored on the outer peripheral side of the conductive body 10 and connected to the other end of the flow path 111.

該等組接部16係設於該傳導本體10之外側,並間隔鄰設於該組接口13;於本實施例中,該等組接部16係選自螺孔161、卡槽及卡塊其中之一或其組合,本實施例係以螺孔161為例,但不限制本創作之實施態樣。The assembly portion 16 is disposed on the outer side of the conductive body 10 and is disposed adjacent to the group of interfaces 13; in the embodiment, the assembly portion 16 is selected from the group consisting of a screw hole 161, a card slot and a card block. One or a combination thereof, the embodiment uses the screw hole 161 as an example, but does not limit the implementation of the present invention.

一蓋體20,其係對應蓋設於該組接口13,該蓋體20對應該等組接部16設有複數連接部21,該等連接部21係組設於該等組接部16,使該蓋體20封蓋該組接口13;於本實施例中,該等連接部21係選自通孔211及卡接孔其中之一或其組合,本實施例係以通孔211為例,但不限制本創作之實施態樣。A cover body 20 correspondingly disposed on the set of interfaces 13 , the cover body 20 corresponding to the assembly portion 16 is provided with a plurality of connecting portions 21 , and the connecting portions 21 are assembled to the assembled portions 16 , The cover body 20 is covered with the set of interfaces 13; in the embodiment, the connecting portions 21 are selected from one of the through holes 211 and the snap holes, or a combination thereof. In this embodiment, the through holes 211 are taken as an example. , but does not limit the implementation of this creation.

複數組接件30,該等組接件30係穿過該等連接部21,並組設於該等組接部16,並使該蓋體20蓋設於該組接口13;於本實施例,該等組接件30係以螺釘為例,為例,但不限制本創作之實施態樣。The plurality of connectors 30 are disposed through the connecting portions 21 and are disposed on the connecting portions 16 and the cover 20 is disposed on the set of interfaces 13; The components 30 are exemplified by screws, for example, but the implementation of the present invention is not limited.

一致冷模組40,該致冷模組40包含有至少一致冷晶片41、一電源單元43及一控制單元44,該致冷晶片41係電性連接該電源單元43,該電源單元43係電性連接該控制單元44,又,該致冷晶片41係連接該傳導本體10,而該致冷晶片41係具有一致冷連接面4131及一發熱連接面4132。The cooling module 40 includes at least a uniform cold chip 41, a power supply unit 43 and a control unit 44. The cooling chip 41 is electrically connected to the power supply unit 43, and the power supply unit 43 is electrically connected. The control unit 44 is connected, and the refrigerating wafer 41 is connected to the conductive body 10, and the refrigerating wafer 41 has a uniform cold connecting surface 4131 and a heat generating connecting surface 4132.

於本實施例中,該致冷連接面4131及該發熱連接面4132係選自為一平面、粗糙面、具有複數盲孔之表面及具有複數切溝之表面其中之一種;本實施例係以平面設置為例,但不限制本創作之實施態樣。In this embodiment, the cooling connection surface 4131 and the heating connection surface 4132 are selected from the group consisting of a flat surface, a rough surface, a surface having a plurality of blind holes, and a surface having a plurality of dicing grooves; The plane setting is an example, but does not limit the implementation of this creation.

於本實施例中,如圖3所示,該致冷晶片41係包含有複數極性交錯排置的P型半導體晶片411及N型半導體晶片412,以及,複數導線42,該等導線42係電性連接該等P型半導體晶片411及該等N型半導體晶片412;由於該等P型半導體晶片411及該等N型半導體晶片412係極性相對應地排置且同時電性連結於二載板413上之導電層,因此當該控制單元44控制該電源單元43施加一預定直流電流時,該致冷晶片41的每一P型、N型半導體晶片412就會開始產生珀爾帖效應,使二載板413間產生溫度差,這樣即可應用為致冷晶片或致熱晶片,端視對外的接觸面係選用冷端或熱端。In the present embodiment, as shown in FIG. 3, the refrigerating wafer 41 includes a P-type semiconductor wafer 411 and an N-type semiconductor wafer 412 having a plurality of polar staggered rows, and a plurality of wires 42 electrically connected to the wires 42. The P-type semiconductor wafer 411 and the N-type semiconductor wafers 412 are connected to each other; the P-type semiconductor wafers 411 and the N-type semiconductor wafers 412 are arranged in a corresponding polarity and electrically connected to the two carriers. a conductive layer on 413, so when the control unit 44 controls the power supply unit 43 to apply a predetermined direct current, each P-type, N-type semiconductor wafer 412 of the cooled wafer 41 begins to generate a Peltier effect, A temperature difference is generated between the two carrier plates 413, so that it can be applied as a cold wafer or a heat generating wafer, and the external contact surface is selected from a cold end or a hot end.

需進一步說明的是,本創作具有二傳導本體10,該等傳導本體10係分別設置於該致冷連接面4131及該發熱連接面4132,如圖6所示;另外,該傳導本體10係可由耐腐蝕金屬材質所構成,亦或是,該傳導本體10於該冷熱交換空間11、該進液孔14及該出液孔15塗設有一耐腐蝕塗層(圖未示,例如:腐蝕抑制劑、防腐蝕納米塗料…等),從而具有耐腐蝕功能;更詳而言之,該流道111係能針對不同的工作流體提高其應用性,以及,延長該傳導本體10的使用壽命。It should be further noted that the present invention has two conductive bodies 10, which are respectively disposed on the cooling connection surface 4131 and the heating connection surface 4132, as shown in FIG. 6; in addition, the conductive body 10 can be The corrosion-resistant metal material is formed, or the conductive body 10 is coated with a corrosion-resistant coating on the cold heat exchange space 11, the liquid inlet hole 14 and the liquid outlet hole 15 (not shown, for example, a corrosion inhibitor). , anti-corrosion nano-coatings, etc.), thereby having a corrosion-resistant function; more specifically, the flow path 111 can improve its applicability for different working fluids, and extend the service life of the conductive body 10.

為供進一步瞭解本創作構造特徵、運用技術手段及所預期達成之功效,茲將本創作使用方式加以敘述,相信當可由此而對本創作有更深入且具體之瞭解,如下所述:In order to further understand the characteristics of this creation, the use of technical means and the expected results, we will describe the use of this creation, and believe that we can have a deeper and more specific understanding of this creation, as follows:

請繼續參閱圖2及圖3,並配合圖5及圖6所示,係為本創作第一實施例之分解立體圖、方塊示意圖、組合立體圖及使用狀態示意圖;於使用狀態時,本創作係組設於一半導體設備(例如,冰水機、冷卻機、溫度控制器…等)中,利用該傳導本體10係連接該致冷晶片41的該致冷連接面4131或該發熱連接面4132,同時,搭配該冷熱交換空間11之流道111設置,以及該等隔板12連接該冷熱交換空間11之內周壁的一端兩側係呈彎弧狀,使該流道111呈連續彎曲設置;更詳而言之,該流道111呈連續彎曲設置係能提供於工作流體順利通過該冷熱交換空間11,以達進行冷熱的傳導。Please refer to FIG. 2 and FIG. 3 together with FIG. 5 and FIG. 6 , which are exploded perspective view, block diagram, combined perspective view and use state diagram of the first embodiment of the present invention; Provided in a semiconductor device (for example, a chiller, a chiller, a temperature controller, etc.), the chilling connection surface 4131 or the heat generating connection surface 4132 of the chilled wafer 41 is connected by the conductive body 10 while And the flow passages 111 of the cold heat exchange space 11 are disposed, and the two ends of one end of the partition wall 12 connecting the inner and outer peripheral walls of the cold heat exchange space 11 are curved, so that the flow passage 111 is continuously curved; In other words, the flow passage 111 is in a continuous curved arrangement to provide a working fluid to smoothly pass through the cold heat exchange space 11 for conducting heat conduction.

另外,上述結構說明及搭配圖5及圖6所示,可進一步得知,本創作藉由該傳導本體10結合至該致冷模組40,以達到可迅速在該致冷晶片41本體一面吸熱,並迅速在致冷晶片41本體另一面散熱,藉此提高其應用性,以及該傳導本體10本身材質或後加工塗層,從而具有耐腐蝕功能,換言之,本創作具有使用壽命長、效能佳、溫控佳、作業便利以及大幅降低成本等優點。In addition, the above description of the structure and the combination of FIG. 5 and FIG. 6 further show that the present invention is coupled to the refrigeration module 40 by the conductive body 10 so as to quickly absorb heat on the body of the refrigerant chip 41. And rapidly dissipating heat on the other side of the body of the cooling chip 41, thereby improving the applicability thereof, and the material of the conductive body 10 or the post-processing coating, thereby having corrosion resistance, in other words, the creation has a long service life and good performance. , good temperature control, convenient operation and significant cost reduction.

重要的是,本創作係可讓裝設本創作的半導體設備不必裝設壓縮機,達到簡化半導體設備的整體體積,以及成本低、散熱效率高及提高良率之功效。What is important is that this creation system allows the semiconductor device to be installed without the need for a compressor, which simplifies the overall size of the semiconductor device, as well as low cost, high heat dissipation efficiency and improved yield.

請參閱圖7及圖8所示,係為本創作第二實施例之方塊示意圖及分解立體圖;本實施例與第一實施例相較,其不同之處係在於更包含有一冷卻器50,該冷卻器50係連接該進液孔14與該出液口,而該傳導本體10係連接該致冷晶片41,又,該流道111、該進液孔14、該出液口及該冷卻器50形成一冷熱交換循環迴路,而該冷熱交換循環迴路係用以對該致冷連接面4131或該發熱連接面4132進行熱傳導;該冷卻器50係能選自於油冷卻器、水冷卻器、鰭片式冷卻器…等。藉此,本實施例係裝設使用於半導體設備(例如,冰水機、冷卻機、溫度控制器…等)中,本實施例係同樣能夠達到如第一實施例之實施功效與技術功效。Please refer to FIG. 7 and FIG. 8 , which are block diagrams and exploded perspective views of the second embodiment of the present invention. The present embodiment is different from the first embodiment in that it further includes a cooler 50. The cooler 50 is connected to the liquid inlet hole 14 and the liquid outlet port, and the conductive body 10 is connected to the refrigerant chip 41. Further, the flow channel 111, the liquid inlet hole 14, the liquid outlet port and the cooler 50 forming a cold heat exchange circulation loop for thermally conducting the refrigerant connection surface 4131 or the heat connection surface 4132; the cooler 50 can be selected from an oil cooler, a water cooler, Fin coolers...etc. Therefore, the present embodiment is used in a semiconductor device (for example, a chiller, a chiller, a temperature controller, etc.), and the present embodiment can also achieve the efficacies and technical effects as in the first embodiment.

請圖9所示,係為本創作第三實施例之分解立體圖;本實施例與第一實施例相較,其不同之處係在於該傳導本體10係具有二組接口13,又,二蓋體20係分別蓋設於該等組接口13;換言之,於維修或清潔時具有多一種的拆解;藉此,本實施例同樣能夠利用該流道111呈連續彎曲設置係能提供於工作流體順利通過該冷熱交換空間11,以達進行冷熱的傳導;所以,本實施例係同樣能夠達到如第一實施例之實施功效與技術功效。FIG. 9 is an exploded perspective view of the third embodiment of the present invention; the difference between this embodiment and the first embodiment is that the conductive body 10 has two sets of interfaces 13 and two covers. The body 20 is respectively disposed on the group interface 13; in other words, there is a plurality of disassembling during maintenance or cleaning; thereby, the embodiment can also be provided with a continuous bending system by the flow channel 111 to provide the working fluid. The cold heat exchange space 11 is smoothly passed to conduct the conduction of heat and cold; therefore, the embodiment can also achieve the efficacy and technical effects as the first embodiment.

值得一提的是,本創作將載板413(即,致冷連接面4131及該發熱連接面4132)設呈粗糙面、具有複數盲孔之表面或具有複數切溝之表面時,本創作係可以提高供與冷熱源接觸面積,並可快速導出熱量,進而達到提冷熱傳導效率。It is worth mentioning that the present invention sets the carrier plate 413 (ie, the cooling connection surface 4131 and the heating connection surface 4132) as a rough surface, a surface having a plurality of blind holes, or a surface having a plurality of dicing grooves. The contact area with the cold and heat source can be increased, and the heat can be quickly extracted, thereby achieving the heat transfer efficiency of the cooling.

茲,再將本創作之特徵及其可達成之預期功效陳述如下:Hereby, the characteristics of this creation and its achievable expected effects are stated as follows:

本創作之用於控制半導體設備溫度的冷熱交換循環結構100,利用二傳導本體10,該等傳導本體10係分別設置於該致冷連接面4131及該發熱連接面4132,以構成如圖5所示之態樣,同時,更搭配該冷熱交換空間11之流道111設置,以及該等隔板12連接該冷熱交換空間11之內周壁的一端兩側係呈彎弧狀,使該流道111呈連續彎曲設置;更詳而言之,該流道111呈連續彎曲設置係能提供於工作流體順利通過該冷熱交換空間11,以達進行冷熱的傳導。The cold heat exchange cycle structure 100 for controlling the temperature of the semiconductor device of the present invention utilizes two conductive bodies 10, which are respectively disposed on the cooling connection surface 4131 and the heat connection surface 4132 to form a structure as shown in FIG. In the embodiment, at the same time, the flow passage 111 of the cold heat exchange space 11 is further disposed, and the two ends of one end of the partition wall 12 connecting the inner and outer walls of the cold heat exchange space 11 are curved, so that the flow passage 111 is formed. In a continuous bending arrangement; more specifically, the flow path 111 is in a continuous curved arrangement to provide a smooth flow of working fluid through the cold heat exchange space 11 for conduction of heat and cold.

藉此,本創作係具有以下實施功效及技術功效:In this way, the author has the following implementation effects and technical effects:

其一,本創作係裝設於半導體設備中,並能達到精準冷熱補償控制製程、機台溫度的效用,且本創作係可讓裝設本創作的半導體設備不必裝設壓縮機,達到簡化半導體設備的整體體積,以及成本低、散熱效率高及提高良率之功效。First, the creation department is installed in a semiconductor device, and can achieve the effects of precise cold and heat compensation control process and machine temperature, and the creation system can make the semiconductor device installed in this creation unnecessary to install a compressor to simplify the semiconductor. The overall size of the device, as well as low cost, high heat dissipation efficiency and improved yield.

其二,本創作之該等傳導本體10結合該致冷模組40,係可迅速在該致冷晶片41本體一面吸熱,並迅速在致冷晶片41本體另一面散熱,藉此提高其應用性,以及該傳導本體10本身材質或後加工塗層,從而具有耐腐蝕功能,換言之,本創作具有使用壽命長、效能佳、溫控佳、作業便利以及大幅降低成本等優點。Secondly, the conductive body 10 of the present invention is combined with the refrigeration module 40 to quickly absorb heat on the body of the refrigerant chip 41 and rapidly dissipate heat on the other side of the body of the refrigerant chip 41, thereby improving the applicability thereof. And the conductive body 10 itself or the post-processing coating, thereby having corrosion resistance function, in other words, the creation has the advantages of long service life, good performance, good temperature control, convenient operation and greatly reduced cost.

其三,本創作係於該致冷晶片41的致冷連接面4131及該發熱連接面4132設呈粗糙面、具有複數盲孔之表面或具有複數切溝之表面,以提高供與冷熱源接觸面積,並可快速導出熱量,進而達到提冷熱傳導效率之功效。Thirdly, the present invention is to provide a rough surface, a surface having a plurality of blind holes or a surface having a plurality of dicing grooves on the cooling connection surface 4131 of the cooling wafer 41 and the heating connection surface 4132 to improve contact with the cold heat source. The area and the heat can be quickly exported to achieve the effect of cooling heat transfer efficiency.

綜上所述,本創作在同類產品中實有其極佳之進步實用性,同時遍查國內外關於此類結構之技術資料,文獻中亦未發現有相同的構造存在在先,是以,本創作實已具備新型專利要件,爰依法提出申請。In summary, this creation has its excellent progress and practicality in similar products. At the same time, it has investigated the technical information about such structures at home and abroad. The same structure has not been found in the literature. This creation has already possessed new types of patent requirements, and applied for it according to law.

惟,以上所述者,僅係本創作之較佳可行實施例而已,故舉凡應用本創作說明書及申請專利範圍所為之等效結構變化,理應包含在本創作之專利範圍內。However, the above-mentioned embodiments are merely preferred embodiments of the present invention, and the equivalent structural changes that are applied to the present specification and the scope of the patent application are intended to be included in the scope of the present patent.

100‧‧‧冷熱交換循環結構100‧‧‧Cold and heat exchange cycle structure

10‧‧‧傳導本體10‧‧‧ Conducting the ontology

11‧‧‧冷熱交換空間11‧‧‧ Cold and heat exchange space

111‧‧‧流道111‧‧‧ flow path

12‧‧‧隔板12‧‧‧Baffle

13‧‧‧組接口13‧‧‧ group interface

14‧‧‧進液孔14‧‧‧Inlet hole

15‧‧‧出液孔15‧‧‧ liquid outlet

16‧‧‧組接部16‧‧‧Team

161‧‧‧螺孔161‧‧‧ screw holes

20‧‧‧蓋體20‧‧‧ cover

21‧‧‧連接部21‧‧‧Connecting Department

211‧‧‧通孔211‧‧‧through hole

30‧‧‧組接件30‧‧‧Components

40‧‧‧致冷模組40‧‧‧ Refrigeration module

41‧‧‧致冷晶片41‧‧‧Chilled wafer

411‧‧‧P型半導體晶片411‧‧‧P type semiconductor wafer

412‧‧‧N型半導體晶片412‧‧‧N type semiconductor wafer

413‧‧‧載板413‧‧‧ Carrier Board

4131‧‧‧致冷連接面4131‧‧‧Cool connection

4132‧‧‧發熱連接面4132‧‧‧Facial connection surface

42‧‧‧導線42‧‧‧Wire

43‧‧‧電源單元43‧‧‧Power unit

44‧‧‧控制單元44‧‧‧Control unit

50‧‧‧冷卻器50‧‧‧cooler

圖1係本創作第一實施例中顯示傳導本體與蓋體的立體圖。 圖2係本創作第一實施例中顯示傳導本體與蓋體的分解立體圖。 圖3係本創作第一實施例中顯示致冷晶片的立體圖。 圖4係本創作第一實施例中之方塊示意圖。 圖5係本創作第一實施例中之組合立體圖。 圖6係本創作第一實施例中之使用狀態示意圖。 圖7係本創作第二實施例中之方塊示意圖。 圖8係本創作第二實施例中之分解立體圖。 圖9係本創作第三實施例中之分解立體圖。1 is a perspective view showing a conductive body and a cover in the first embodiment of the present invention. Fig. 2 is an exploded perspective view showing the conductive body and the cover in the first embodiment of the present invention. Figure 3 is a perspective view showing the refrigerant wafer in the first embodiment of the present invention. Figure 4 is a block diagram showing the first embodiment of the present invention. Figure 5 is a combined perspective view of the first embodiment of the present creation. Fig. 6 is a schematic view showing the state of use in the first embodiment of the present creation. Figure 7 is a block diagram showing the second embodiment of the present creation. Figure 8 is an exploded perspective view of the second embodiment of the present creation. Figure 9 is an exploded perspective view of the third embodiment of the present creation.

Claims (10)

一種用於控制半導體設備溫度的冷熱交換循環結構,其係組設於一半導體設備中,並包含有: 一傳導本體,其內部係具有一冷熱交換空間,並具有: 複數隔板,其係凸設於該冷熱交換空間之內周壁,並使該冷熱交換空間形成有一流道; 至少一組接口,其係開設於該傳導本體之外側,且該組接口與該冷熱交換空間相連通; 至少一進液孔,其係穿設於該傳導本體之外側,並連接該流道之一端; 至少一出液孔,其係穿設於該傳導本體之外側,並連接該流道之另一端; 複數組接部,其係設於該傳導本體之外側,並間隔鄰設於該組接口; 至少一蓋體,其係對應蓋設於該組接口,該蓋體對應該等組接部設有複數連接部,該等連接部係組設於該等組接部,使該蓋體封蓋該組接口; 其中,該等隔板連接該冷熱交換空間之內周壁的一端兩側係呈彎弧狀,使該流道呈連續彎曲設置。A cold heat exchange cycle structure for controlling the temperature of a semiconductor device is assembled in a semiconductor device and comprises: a conductive body having a cold heat exchange space therein and having: a plurality of spacers, which are convex The inner wall of the cold heat exchange space is disposed, and the cold heat exchange space is formed with a first-class track; at least one set of interfaces is disposed on an outer side of the conductive body, and the set of interfaces is connected to the cold heat exchange space; at least one a liquid inlet hole is disposed on an outer side of the conductive body and connected to one end of the flow channel; at least one liquid outlet hole is disposed on an outer side of the conductive body and connected to the other end of the flow channel; The assembly portion is disposed on the outer side of the conductive body and is disposed adjacent to the group of interfaces; at least one cover body is correspondingly disposed on the group interface, and the cover body is provided with a plurality of corresponding portions a connecting portion, the connecting portions are disposed in the connecting portion, so that the cover covers the set of interfaces; wherein the two sides of the inner peripheral wall of the partition connected to the cold heat exchange space are curved To make the stream Continuously curved shape is provided. 依據申請專利範圍第1項所述之用於控制半導體設備溫度的冷熱交換循環結構,更包含有至少一致冷模組,該致冷模組包含有至少一致冷晶片、一電源單元及一控制單元,該致冷晶片係電性連接該電源單元,該電源單元係電性連接該控制單元,又,該致冷晶片係連接該傳導本體,而該致冷晶片係具有一致冷連接面及一發熱連接面,另,該致冷連接面及該發熱連接面係選自為一平面、粗糙面、具有複數盲孔之表面及具有複數切溝之表面其中之一種。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device according to claim 1 of the patent application, further comprising at least a uniform cold module comprising at least a uniform cold chip, a power supply unit and a control unit The cooling chip is electrically connected to the power unit, the power unit is electrically connected to the control unit, and the cooling chip is connected to the conductive body, and the cooling chip has a uniform cold connection surface and a heat generation. The connecting surface, and the cooling connecting surface and the heating connecting surface are selected from the group consisting of a flat surface, a rough surface, a surface having a plurality of blind holes, and a surface having a plurality of dicing grooves. 依據申請專利範圍第2項所述之用於控制半導體設備溫度的冷熱交換循環結構,其中,該傳導本體係選自連接該致冷連接面及該發熱連接面其中之一。The cold heat exchange cycle structure for controlling the temperature of a semiconductor device according to claim 2, wherein the conduction system is selected from one of a connection of the refrigeration connection surface and the heat connection surface. 依據申請專利範圍第2項所述之用於控制半導體設備溫度的冷熱交換循環結構,其中,二冷熱交換循環結構之傳導本體係分別連接該致冷連接面及該發熱連接面。The cold heat exchange cycle structure for controlling the temperature of a semiconductor device according to the second aspect of the patent application, wherein the conduction system of the two cold heat exchange cycle structure respectively connects the refrigeration connection surface and the heat connection surface. 依據申請專利範圍第1項所述之用於控制半導體設備溫度的冷熱交換循環結構,更包含有一冷卻器,該冷卻器係連接該進液孔與該出液口,又,該流道、該進液孔、該出液口及該冷卻器形成一冷熱交換循環迴路。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device according to claim 1, further comprising a cooler connecting the liquid inlet hole and the liquid outlet, and the flow channel, the flow channel The inlet hole, the outlet port and the cooler form a cold heat exchange circulation loop. 依據申請專利範圍第2項所述之用於控制半導體設備溫度的冷熱交換循環結構,更包含有一冷卻器,該冷卻器係連接該進液孔與該出液口,而該傳導本體係連接該致冷晶片,又,該流道、該進液孔、該出液口及該冷卻器形成一冷熱交換循環迴路,而該冷熱交換循環迴路係用以對該致冷連接面或該發熱連接面進行熱傳導。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device according to claim 2, further comprising a cooler connecting the liquid inlet hole and the liquid outlet, and the conduction system is connected to the Cooling the wafer, and further, the flow channel, the liquid inlet hole, the liquid outlet port and the cooler form a cold heat exchange circulation circuit, and the cold heat exchange circulation circuit is used for the refrigeration connection surface or the heat connection surface Conduct heat conduction. 依據申請專利範圍第1項所述之用於控制半導體設備溫度的冷熱交換循環結構,其中,該等組接部係選自螺孔、卡槽及卡塊其中之一或其組合,又,該等連接部係選自通孔及卡接孔其中之一或其組合。The cold heat exchange cycle structure for controlling the temperature of a semiconductor device according to claim 1, wherein the components are selected from one of a screw hole, a card slot, and a card block, or a combination thereof. The connecting portion is selected from one of a through hole and a snap hole or a combination thereof. 依據申請專利範圍第7項所述之用於控制半導體設備溫度的冷熱交換循環結構,更包含有複數組接件,該等組接件係穿過該等連接部,並組設於該等組接部,並使該蓋體蓋設於該組接口。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device according to claim 7 of the patent application scope further includes a plurality of array connectors, the components are passed through the connection portions, and are assembled in the groups Connecting the cover and covering the cover to the set of interfaces. 依據申請專利範圍第1項所述之用於控制半導體設備溫度的冷熱交換循環結構,其中,該傳導本體係由耐腐蝕金屬材質所構成,又,該傳導本體於該冷熱交換空間、該進液孔及該出液孔塗設有一耐腐蝕塗層。The cold heat exchange cycle structure for controlling the temperature of a semiconductor device according to claim 1, wherein the conduction system is made of a corrosion-resistant metal material, and the conduction body is in the cold heat exchange space, the liquid inlet The hole and the liquid outlet are coated with a corrosion resistant coating. 依據申請專利範圍第1項所述之用於控制半導體設備溫度的冷熱交換循環結構,其中,該傳導本體係具有二組接口,又,二蓋體係分別蓋設於該等組接口。The cold heat exchange cycle structure for controlling the temperature of the semiconductor device according to the first aspect of the patent application, wherein the conduction system has two sets of interfaces, and the two cover systems are respectively disposed on the group interfaces.
TW107214674U 2018-10-29 2018-10-29 Cold-hot exchange circulating structure for controlling temperature of semiconductor equipment TWM576739U (en)

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