TWM569425U - Optical testing device - Google Patents

Optical testing device Download PDF

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Publication number
TWM569425U
TWM569425U TW107210479U TW107210479U TWM569425U TW M569425 U TWM569425 U TW M569425U TW 107210479 U TW107210479 U TW 107210479U TW 107210479 U TW107210479 U TW 107210479U TW M569425 U TWM569425 U TW M569425U
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Taiwan
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optical
image sensor
image
tested
light
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TW107210479U
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Chinese (zh)
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林沛沅
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九驊科技股份有限公司
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Priority to CN201821373955.1U priority Critical patent/CN208606989U/en
Publication of TWM569425U publication Critical patent/TWM569425U/en

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Abstract

一種光學檢測裝置,用以檢測一待測光學裝置,且包含一標靶、一光源、一支撐座。標靶其形成有一檢測用圖案。光源用以形成一光線,該光線適於穿透標靶後照射待測光學裝置。第一影像感應器置於支撐座,適於接收來自待測光學裝置的光線,以取得包含檢測用圖案的一影像。第一影像感應器與待測光學裝置間的距離,為一預設物距。 An optical detecting device for detecting an optical device to be tested, and comprising a target, a light source and a support base. The target is formed with a pattern for detection. The light source is used to form a light that is adapted to illuminate the optical device to be tested after penetrating the target. The first image sensor is placed on the support base and is adapted to receive light from the optical device to be tested to obtain an image including the detection pattern. The distance between the first image sensor and the optical device to be tested is a preset object distance.

Description

光學檢測裝置 Optical detection device

本新型係關於一種光學檢測裝置,尤其關於一種光學檢測裝置,其在逆投影方式的在以MTF值的光學檢測裝置的基礎下,進而切換另一種檢測內容以測得短物距的鏡頭光學MTF值。 The present invention relates to an optical detecting device, and more particularly to an optical detecting device, which is in a reverse projection mode based on an optical detecting device with an MTF value, and further switches another detecting content to measure a short object distance lens optical MTF. value.

光學解晰調變轉換函數(modulation transfer function,MTF)已為現今市面上評估一個光學元件或光學系統之光學品質的一個常用指標,舉例來說,藉由檢視一鏡頭在某一區域所具有的光學解晰調變函數於各空間頻率的反應(即為光學空間頻率反應SFR),便可得知該鏡頭在該區域對於各空間頻率(線密度)的解析度。 Optical modulation modulation transfer function (MTF) has become a common indicator for evaluating the optical quality of an optical component or optical system on the market today, for example, by examining a lens in a certain area. The optical resolution of the modulation function at each spatial frequency (ie, the optical spatial frequency response SFR) reveals the resolution of the lens for each spatial frequency (linear density) in that region.

圖1顯示習知用以檢測鏡頭之鏡頭檢測裝置的示意圖。圖1為說明習知所謂逆投影MTF檢測裝置。圖1為臺灣專利申請號104123388的一習知技術。請參照圖1,鏡頭檢測裝置100包含一光源120、至少一影像感測器114、一主機115、一標靶110及一鏡頭130。為檢測鏡頭130的不同特性,可以使用不同的標靶110。舉例而言,標靶110包含圖案101及圖案102。進行檢測時,來自 光源120的光線照射至標靶110後,穿透過鏡頭130再照射至影像感測器114。影像感測器114擷取對應標靶110的一圖案影像並傳送至主機115,再利用主機115對該被擷取到的圖案影像進行分析,求得例如解析度、光電轉換函數(OECF;Opto-electronic conversion function)、灰階度、光學調制函數(modulation transfer function,MTF)、或光學空間頻率反應(spatial frequency responses)等等資訊。標靶110包含圖案101及圖案102,因此影像感測器114所擷取之影像會包含對應圖案101的影像111及對應圖案102的影像112。 Figure 1 shows a schematic view of a conventional lens detecting device for detecting a lens. Fig. 1 is a view showing a conventional so-called back projection MTF detecting device. Figure 1 is a conventional technique of Taiwan Patent Application No. 104123388. Referring to FIG. 1 , the lens detecting device 100 includes a light source 120 , at least one image sensor 114 , a host 115 , a target 110 , and a lens 130 . To detect different characteristics of the lens 130, different targets 110 can be used. For example, the target 110 includes a pattern 101 and a pattern 102. When testing, from After the light of the light source 120 is irradiated to the target 110, it passes through the lens 130 and is irradiated to the image sensor 114. The image sensor 114 captures a pattern image corresponding to the target 110 and transmits it to the host 115, and then analyzes the captured pattern image by using the host 115 to obtain, for example, a resolution and a photoelectric conversion function (OECF; Opto). -electronic conversion function), gray scale, modulation transfer function (MTF), or optical spatial responses. The target 110 includes the pattern 101 and the pattern 102. Therefore, the image captured by the image sensor 114 includes the image 111 corresponding to the pattern 101 and the image 112 of the corresponding pattern 102.

圖2顯示習知的標靶的另一測試圖案的示意圖。如圖2所示,標靶110的檢測用圖案110a為線條圖案,經由待測鏡頭130投影至上方的影像感測器114,而一般一組影像感測器114通常負責分析一組十字線條圖案以求得垂直及水平方向的線分佈函數(line spread function)及MTF。另外,對線分佈函數進行快速傅利葉轉換(FFT),以產生前述的光學解析空間頻率反應。 Figure 2 shows a schematic representation of another test pattern of a conventional target. As shown in FIG. 2, the detection pattern 110a of the target 110 is a line pattern, which is projected to the upper image sensor 114 via the lens 130 to be tested, and generally a group of image sensors 114 is generally responsible for analyzing a set of cross line patterns. In order to obtain the line spread function and MTF in the vertical and horizontal directions. In addition, a fast Fourier transform (FFT) is performed on the line distribution function to produce the aforementioned optically resolved spatial frequency response.

圖3顯示習知用以檢測鏡頭之鏡頭檢測裝置的示意圖。圖3的技術為無限-有限距共軛系統。如圖3所示,鏡頭檢測裝置100包含一標靶110、一光源120、一待測鏡頭130、多個望遠鏡頭及影像模組140及一弧面軌道150。光源120的光線穿透標靶110,標靶110上刻有所需分析的測試圖案,隨後光線再經由待測鏡頭130投影至一望遠影像模組140。望遠影像模組140包含一望遠鏡頭141及一影像感測器142。望遠鏡頭141提供一無窮遠物距,影像感測器142則取得包含標靶110的圖案的影像,並利用電腦及軟體演算(未圖示)得知該影像品質。於圖3所示的鏡頭檢測裝置100,可安裝有多組的望遠影像模 組140,以便同時測得不同視角(field of view,FOV)之影像品質,且望遠影像模組140視需求也可以沿弧面軌道150的弧面移動即可測得另一不同視角的影像品質,此架構優點為對廣角鏡頭而言限制較少。 Figure 3 shows a schematic view of a conventional lens detecting device for detecting a lens. The technique of Figure 3 is an infinite-finite range conjugate system. As shown in FIG. 3, the lens detecting device 100 includes a target 110, a light source 120, a lens to be tested 130, a plurality of telescope heads and an image module 140, and a curved track 150. The light of the light source 120 penetrates the target 110, and the target 110 is engraved with a test pattern to be analyzed, and then the light is projected to the telephoto image module 140 via the lens 130 to be tested. The telephoto image module 140 includes a telescope head 141 and an image sensor 142. The telescope head 141 provides an infinite object distance, and the image sensor 142 takes an image containing the pattern of the target 110 and uses a computer and software calculation (not shown) to determine the image quality. In the lens detecting device 100 shown in FIG. 3, a plurality of sets of telephoto images can be installed. The group 140 is configured to simultaneously measure image quality of different field of view (FOV), and the telephoto image module 140 can also measure the image quality of another different viewing angle by moving along the arc surface of the curved track 150 as needed. The advantage of this architecture is that there are fewer restrictions on wide-angle lenses.

依據本新型一實施例的目的在於,提供一種光學檢測裝置,能夠將第一影像感應器與待測光學裝置間的距離,設為一預設物距,藉以測得不同位置的光學特徵值。於一實施例中,其能夠切換一般多模組遠距檢測或利用單一影像模組檢測不同的短物距鏡頭的光學特徵值。 An object of the present invention is to provide an optical detecting device capable of setting a distance between a first image sensor and an optical device to be tested as a predetermined object distance, thereby measuring optical characteristic values at different positions. In one embodiment, it is capable of switching a general multi-module remote detection or using a single image module to detect optical eigenvalues of different short object distance lenses.

於一實施例中,光學檢測裝置,用以檢測一待測光學裝置,且包含一標靶、一光源、一支撐座。標靶其形成有一檢測用圖案。光源用以形成一光線,該光線適於穿透標靶後照射待測光學裝置。第一影像感應器置於支撐座,適於接收來自待測光學裝置的光線,以取得包含檢測用圖案的一影像。第一影像感應器與待測光學裝置間的距離,為一預設物距。 In one embodiment, the optical detecting device is configured to detect an optical device to be tested, and includes a target, a light source, and a support. The target is formed with a pattern for detection. The light source is used to form a light that is adapted to illuminate the optical device to be tested after penetrating the target. The first image sensor is placed on the support base and is adapted to receive light from the optical device to be tested to obtain an image including the detection pattern. The distance between the first image sensor and the optical device to be tested is a preset object distance.

於一實施例中,光學檢測裝置更包含一位移機構。位移機構連接於支撐座,用以移動支撐座,藉以設定第一影像感應器與待測光學裝置間的距離。 In an embodiment, the optical detecting device further includes a displacement mechanism. The displacement mechanism is coupled to the support base for moving the support base to set a distance between the first image sensor and the optical device to be tested.

於一實施例中,光學檢測裝置,更包含一軌道及多個望遠影像模組。 位移機構設於軌道。多個望遠影像模組設置於軌道上,而且每一該望遠影像模組適於形成一無窮遠物距,並適於接收來自待測光學裝置的光線。而且,第一影像感應器位於軌道的中間。 In an embodiment, the optical detecting device further includes a track and a plurality of telephoto image modules. The displacement mechanism is located in the track. A plurality of telephoto image modules are disposed on the track, and each of the telephoto image modules is adapted to form an infinity object distance and is adapted to receive light from the optical device to be tested. Moreover, the first image sensor is located in the middle of the track.

於一實施例中,位移機構透過調整第一影像感應器的高度,來設定第一影像感應器與待測光學裝置間的距離。 In one embodiment, the displacement mechanism sets the distance between the first image sensor and the optical device to be tested by adjusting the height of the first image sensor.

於一實施例中,每一該望遠影像模組包含一望遠鏡頭及一影像感測器,且望遠鏡頭提供一無窮遠物距,而且以位於軌道之中間的望遠影像模組的影像感測器,作為第一影像感應器。 In one embodiment, each of the telephoto image modules includes a telescope head and an image sensor, and the telescope head provides an infinity object distance, and the image sensor of the telephoto image module located in the middle of the track As the first image sensor.

於一實施例中,光學檢測裝置更包含一軌道及多個望遠影像模組。該些望遠影像模組設置於軌道上,而且每一該望遠影像模組適於形成一無窮遠物距,並適於接收來自待測光學裝置的光線。而且,位移機構使第一影像感應器位於該光線的路徑上或不位於該光線的路徑,藉以在第一影像感應器位於該光線的路徑上時,設定第一影像感應器與待測光學裝置間的距離。 In one embodiment, the optical detecting device further includes a track and a plurality of telephoto image modules. The telephoto image modules are disposed on the track, and each of the telephoto image modules is adapted to form an infinity object distance and is adapted to receive light from the optical device to be tested. Moreover, the displacement mechanism causes the first image sensor to be located on the path of the light or not in the path of the light, thereby setting the first image sensor and the optical device to be tested when the first image sensor is located on the path of the light. The distance between them.

於一實施例中,光學檢測裝置,更包含一計算機,計算機用以接收影像,以求得待測光學裝置的至少一光學特徵。 In one embodiment, the optical detecting device further includes a computer for receiving an image to obtain at least one optical characteristic of the optical device to be tested.

於一實施例中,檢測用圖案包含多個測試圖案,分別形成在不同的多 個測試位置,而且計算機區分並取得該些測試圖案,利用位於每一該測試位置的每一該測試圖案,分別求得每一該測試位置的該至少一光學特徵。較佳的情況是,該至少一光學特徵包含一MTF值。 In one embodiment, the pattern for detection includes a plurality of test patterns, which are formed in different ways. The test locations, and the computer distinguishes and obtains the test patterns, and each of the test patterns at each of the test locations respectively determines the at least one optical feature of each of the test locations. Preferably, the at least one optical feature comprises an MTF value.

於一實施例中,該些測試圖案包含多個網格,該些網格在一第一方向上延伸,且位於該些測試位置的連線上,連續地佈置。 In one embodiment, the test patterns include a plurality of meshes extending in a first direction and located on a line connecting the test locations, continuously disposed.

於一實施例中,光學檢測裝置,用以可以切換一般多模組檢測或利用單一影像模組檢測不同物距鏡頭的至少一光學特徵。於一實施例中,光學檢測裝置可以一次測試的操作,即可取得多個不同位置的光學特徵。 In one embodiment, the optical detecting device is configured to switch between the general multi-module detection or the single image module to detect at least one optical feature of the different object distance lens. In an embodiment, the optical detecting device can obtain optical characteristics of a plurality of different positions in one test operation.

100‧‧‧鏡頭檢測裝置 100‧‧‧Lens detection device

101‧‧‧圖案 101‧‧‧ pattern

102‧‧‧圖案 102‧‧‧ patterns

110‧‧‧標靶 110‧‧‧ Target

110a‧‧‧檢測用圖案 110a‧‧‧Detection pattern

111‧‧‧影像 111‧‧‧Image

112‧‧‧影像 112‧‧‧ images

114‧‧‧影像感測器 114‧‧‧Image Sensor

115‧‧‧主機 115‧‧‧Host

120‧‧‧光源 120‧‧‧Light source

130‧‧‧鏡頭 130‧‧‧ lens

140‧‧‧望遠影像模組 140‧‧‧ Telephoto Module

141‧‧‧望遠鏡頭 141‧‧‧ telescope head

142‧‧‧影像感測器 142‧‧‧Image Sensor

150‧‧‧弧面軌道 150‧‧‧ curved track

200‧‧‧光學檢測裝置 200‧‧‧ optical inspection device

200a‧‧‧光學檢測裝置 200a‧‧‧Optical inspection device

210‧‧‧標靶 210‧‧‧ Target

210a‧‧‧檢測用圖案 210a‧‧‧Detection pattern

210b‧‧‧測試圖案 210b‧‧‧ test pattern

220‧‧‧光源 220‧‧‧Light source

230‧‧‧待測光學裝置 230‧‧‧ Optical device to be tested

240‧‧‧望遠影像模組 240‧‧‧ Telephoto Module

241‧‧‧望遠鏡頭 241‧‧‧ telescope head

242‧‧‧影像感測器 242‧‧‧Image Sensor

242a‧‧‧第一影像感應器 242a‧‧‧First image sensor

250‧‧‧弧面軌道 250‧‧‧ curved track

271‧‧‧支撐座 271‧‧‧ support

272‧‧‧位移機構 272‧‧‧displacement mechanism

280‧‧‧計算機 280‧‧‧ computer

圖1顯示習知用以檢測鏡頭之鏡頭檢測裝置的示意圖。 Figure 1 shows a schematic view of a conventional lens detecting device for detecting a lens.

圖2顯示習知的標靶的測試圖案的示意圖。 Figure 2 shows a schematic diagram of a test pattern of a conventional target.

圖3顯示為另一種習知逆投影檢測裝置的示意圖。 Figure 3 shows a schematic diagram of another conventional back projection detection device.

圖4顯示本新型一實施例之光學檢測裝置的示意圖。 4 is a schematic view showing an optical detecting device of an embodiment of the present invention.

圖5顯示本新型另一實施例之標靶的檢測用圖案的示意圖。 Fig. 5 is a view showing a pattern for detecting a target of another embodiment of the present invention.

圖6顯示本新型另一實施例之光學檢測裝置的示意圖。 Figure 6 is a schematic view showing an optical detecting device of another embodiment of the present invention.

依據本新型一實施例,提供一種光學檢測裝置200,用以可以切換一般多模組檢測或利用單一影像模組檢測不同物距鏡頭的至少一光學特徵。於一實施例中,至少一光學特徵包含一調變轉換函數值(MTF值)。圖4顯示本新型一實施例之光學檢測裝置的示意圖。如圖4所示,光學檢測裝置200用以檢測一待測光學裝置230,其包含一標靶210、一光源220、第一影像感應器242a及一支撐座271。標靶210其上形成有一檢測用圖案210a。支撐座271支撐第一影像感應器242a,使第一影像感應器242a與待測光學裝置230間的距離,為一預設物距。第一影像感應器242a置於支撐座271,適於接收來自待測光學裝置230的一光線,以取得包含檢測用圖案210a的一影像。 According to an embodiment of the present invention, an optical detecting device 200 is provided for switching a general multi-module detection or detecting a plurality of optical features of different object distance lenses by using a single image module. In one embodiment, the at least one optical feature comprises a modulation transfer function value (MTF value). 4 is a schematic view showing an optical detecting device of an embodiment of the present invention. As shown in FIG. 4, the optical detecting device 200 is configured to detect an optical device 230 to be tested, and includes a target 210, a light source 220, a first image sensor 242a, and a support base 271. The target 210 has a detection pattern 210a formed thereon. The support 271 supports the first image sensor 242a such that the distance between the first image sensor 242a and the optical device 230 to be tested is a predetermined object distance. The first image sensor 242a is placed on the support base 271 and is adapted to receive a light from the optical device 230 to be tested to obtain an image including the detection pattern 210a.

於一實施例中,光學檢測裝置200更包含一計算機280。計算機280取得包含檢測用圖案210a的影像,以求得待測光學裝置230的至少一光學特徵。圖5顯示本新型另一實施例之標靶的檢測用圖案的示意圖。如圖5所示,檢測用圖案210a包含多個測試圖案210b,分別形成在不同的多個測試位置。計算機280更利用一影像辨識軟體等的AOI的技術,分析該檢測用圖案210a的影像,區分出多個測試圖案210b,再利用位於每一測試位置的每一測試圖案210b,分別運算並求得每一測試位置的至少一光學特徵。較佳的情況是,該些測試圖案210b包含多個網格,該些網格在一第一方向或一第二方向上延伸,且位於該些測試位置的連線上,連續地佈置。 In an embodiment, the optical detecting device 200 further includes a computer 280. The computer 280 obtains an image including the detection pattern 210a to determine at least one optical characteristic of the optical device 230 to be tested. Fig. 5 is a view showing a pattern for detecting a target of another embodiment of the present invention. As shown in FIG. 5, the detection pattern 210a includes a plurality of test patterns 210b formed at different test positions. The computer 280 further analyzes the image of the detection pattern 210a by using an AOI technique such as an image recognition software, and distinguishes the plurality of test patterns 210b, and then calculates and obtains each test pattern 210b located at each test position. At least one optical feature of each test location. Preferably, the test patterns 210b comprise a plurality of meshes extending in a first direction or a second direction and located on a line connecting the test locations, continuously arranged.

於一實施例中,光學檢測裝置200更包含多個望遠影像模組240及一弧面軌道250。於一實施例中,更包含一位移機構272。光源220的光線穿透標 靶210,標靶210上刻有所需分析的檢測用圖案210a,隨後光線再經由待測光學裝置230照射至該些望遠影像模組240。望遠影像模組240能夠形成一無窮遠物距並擷取一影像,更具體而言望遠影像模組240包含一望遠鏡頭241及一影像感測器242。望遠鏡頭241提供一無窮遠物距,影像感測器242則擷取一包含標靶210之圖案的影像,並利用儲存有軟體演算的計算機280計算該影像,藉以得知該影像品質。於本實施例中,位於弧面軌道250之中間的望遠影像模組240的影像感測器242,作為第一影像感應器242a。如圖4所示,位移機構272連接於支撐座271,用以移動支撐座271,藉以設定第一影像感應器242a與待測光學裝置230間的距離。更具體而言,位移機構272將中間的望遠影像模組240的原望遠鏡頭241取掉,並且降低第一影像感測器242a的高度至想要的物距,藉以設定第一影像感應器242a與待測光學裝置230間的距離,為一預設物距,而使光學檢測裝置200能夠進行短物距的光學檢測。較佳的情況是,此時所有測試圖案210b皆被感應在此第一影像感測器242a中。計算機280更利用一影像辨識軟體,區分出多個測試圖案210b,再利用位於每一測試位置的每一測試圖案210b,分別求得每一測試位置的至少一光學特徵。 In one embodiment, the optical detecting device 200 further includes a plurality of telephoto image modules 240 and a curved track 250. In an embodiment, a displacement mechanism 272 is further included. Light penetration of light source 220 The target 210 and the target 210 are engraved with the detection pattern 210a to be analyzed, and then the light is irradiated to the telephoto image modules 240 via the optical device 230 to be tested. The telephoto image module 240 can form an infinity object distance and capture an image. More specifically, the telephoto image module 240 includes a telescope head 241 and an image sensor 242. The telescope head 241 provides an infinity object distance, and the image sensor 242 captures an image containing the pattern of the target 210 and calculates the image using a computer 280 storing the software calculation to obtain the image quality. In this embodiment, the image sensor 242 of the telephoto image module 240 located in the middle of the curved track 250 serves as the first image sensor 242a. As shown in FIG. 4, the displacement mechanism 272 is coupled to the support base 271 for moving the support base 271 to set the distance between the first image sensor 242a and the optical device 230 to be tested. More specifically, the displacement mechanism 272 removes the original telescope head 241 of the intermediate telephoto image module 240 and reduces the height of the first image sensor 242a to a desired object distance, thereby setting the first image sensor 242a. The distance from the optical device 230 to be tested is a predetermined object distance, enabling the optical detecting device 200 to perform optical detection of a short object distance. Preferably, all test patterns 210b are sensed in the first image sensor 242a at this time. The computer 280 further utilizes an image recognition software to distinguish the plurality of test patterns 210b, and then uses each test pattern 210b located at each test position to obtain at least one optical feature of each test position.

光學檢測裝置200應用於遠物距檢測時,能夠利用多個望遠影像模組240,以遠物距進行光學檢測,其應用於短物距檢測時,利用單一的第一影像感應器242a以短物距進行光學檢測。於本新型中,待測光學裝置230可以為一待測鏡頭或一待測影像模組。鏡頭及影像模組可以例如為相機鏡頭、監視器或望遠鏡等。此外,位移機構272可以為手動的位移機構或包含電動 馬達的位移機構。 When the optical detecting device 200 is applied to the far object distance detection, the plurality of telephoto image modules 240 can be used to perform optical detection at a far object distance, and when applied to the short object distance detection, the single first image sensor 242a is used as a short object. Optical detection is performed. In the present invention, the optical device 230 to be tested may be a lens to be tested or a module to be tested. The lens and image module can be, for example, a camera lens, a monitor, or a telescope. Additionally, the displacement mechanism 272 can be a manual displacement mechanism or include an electric motor The displacement mechanism of the motor.

若為保留圖4實施例之中間的望遠影像模組240的原有物距功能,則於一實施例中,可額外新增一第一影像感測器242a在想要的物高位置。圖6顯示本新型另一實施例之光學檢測裝置的示意圖。圖6實施例相似於圖4實施例,因此相同的元件使用相同的符號,而省略其相關說明,以下僅說明至少一相異處。如圖6所示,於光學檢測裝置200a中,位移機構272適於使該第一影像感測器242a位於光線的路徑上或不位於光線的路徑上,藉以在第一影像感應器242a位於光線的路徑上時,設定第一影像感應器242a與待測光學裝置230間的距離,為一預設物距。較佳的情況是,此時所有測試圖案210b皆被感應在此第一影像感測器242a中。計算機280更利用一影像辨識軟體,區分出多個測試圖案210b,再利用位於每一測試位置的每一測試圖案210b,分別求得每一測試位置的至少一光學特徵。第一影像感測器242a不位於光線的路徑上時,不接收來自待測光學裝置230的光線。於本實施例中,第一影像感測器242a位於光線的路徑上時,標靶210面向第一影像感測器242a。 If the original object distance function of the telephoto image module 240 in the middle of the embodiment of FIG. 4 is retained, in an embodiment, a first image sensor 242a may be additionally added at a desired object height position. Figure 6 is a schematic view showing an optical detecting device of another embodiment of the present invention. The embodiment of Fig. 6 is similar to the embodiment of Fig. 4, and therefore the same elements are denoted by the same reference numerals, and the related description will be omitted. Only the at least one difference will be described below. As shown in FIG. 6, in the optical detecting device 200a, the displacement mechanism 272 is adapted to position the first image sensor 242a on the path of the light or not on the path of the light, so that the first image sensor 242a is located in the light. The distance between the first image sensor 242a and the optical device 230 to be tested is set to be a preset object distance. Preferably, all test patterns 210b are sensed in the first image sensor 242a at this time. The computer 280 further utilizes an image recognition software to distinguish the plurality of test patterns 210b, and then uses each test pattern 210b located at each test position to obtain at least one optical feature of each test position. When the first image sensor 242a is not located on the path of the light, the light from the optical device 230 to be tested is not received. In this embodiment, when the first image sensor 242a is located on the path of the light, the target 210 faces the first image sensor 242a.

於一實施例中,弧面軌道250為連續弧面,且其中間位置可以設有一望遠影像模組240。支撐座271連接於位移機構272,位移機構272讓支撐座271可以選擇性地位於弧面軌道250的外側或弧面軌道250的內側。支撐座271在弧面軌道250的內側時,第一影像感測器242a位於光線的路徑上,標靶210面向第一影像感測器242a,僅能用第一影像感測器242a進行檢測,不可以利用位於弧面軌道250之中間的望遠影像模組240進行光學的量測。支撐座271 在弧面軌道250的外側時,第一影像感測器242a不位於光線的路徑上,而且標靶210不面向第一影像感測器242a,可以利用位於弧面軌道250之中間的望遠影像模組240進行光學的量測。 In one embodiment, the curved track 250 is a continuous curved surface, and a telephoto image module 240 can be disposed at a middle position. The support base 271 is coupled to a displacement mechanism 272 that allows the support base 271 to be selectively located outside of the curved track 250 or inside the curved track 250. When the support base 271 is inside the curved track 250, the first image sensor 242a is located on the path of the light, and the target 210 faces the first image sensor 242a, and can only be detected by the first image sensor 242a. Optical measurement of the telephoto image module 240 located in the middle of the curved track 250 is not possible. Support base 271 In the outer side of the curved track 250, the first image sensor 242a is not located on the path of the light, and the target 210 does not face the first image sensor 242a, and the telephoto image mode located in the middle of the curved track 250 can be utilized. Group 240 is optically measured.

於一實施例中,此裝置不限於手動或自動切換,亦即位移機構272可以連接於計算機280,透過計算機280自動地控制,或利用使用者手動操作。此外,本新型不限定測試圖案210b的圖案,其可以使用線(Line)、邊緣(Edge)或其他MTF檢測圖案。 In one embodiment, the device is not limited to manual or automatic switching, that is, the displacement mechanism 272 can be coupled to the computer 280, automatically controlled by the computer 280, or manually operated by the user. Moreover, the present invention does not limit the pattern of the test pattern 210b, which may use a line, edge or other MTF detection pattern.

依據本新型一實施例,光學檢測裝置200,用以可以切換一般多模組遠距檢測或利用單一影像模組檢測不同的短物距鏡頭的至少一光學特徵。於一實施例中,檢測用圖案210a包含多個測試圖案210b,分別形成在不同的多個測試位置。計算機280更利用一影像辨識軟體等的AOI的技術,分析該檢測用圖案210a的影像,區分出多個測試圖案210b,再利用位於每一測試位置的每一測試圖案210b,分別運算並求得每一測試位置的至少一光學特徵。因此,可以一次測試的操作,即可取得多個不同位置的光學特徵。 According to an embodiment of the present invention, the optical detecting device 200 is configured to switch a general multi-module remote detection or to detect at least one optical feature of a different short object lens by using a single image module. In one embodiment, the pattern for detection 210a includes a plurality of test patterns 210b formed at different test locations. The computer 280 further analyzes the image of the detection pattern 210a by using an AOI technique such as an image recognition software, and distinguishes the plurality of test patterns 210b, and then calculates and obtains each test pattern 210b located at each test position. At least one optical feature of each test location. Therefore, optical characteristics of a plurality of different positions can be obtained in one test operation.

Claims (9)

一種光學檢測裝置,用以檢測一待測光學裝置,包含一標靶,其形成有一檢測用圖案;一光源,用以形成一光線,該光線適於穿透該標靶後照射該待測光學裝置;一支撐座;及一第一影像感應器,置於該支撐座,適於接收來自該待測光學裝置的該光線,以取得包含該檢測用圖案的一影像,其中,該第一影像感應器與該待測光學裝置間的距離,為一預設物距。 An optical detecting device for detecting an optical device to be tested, comprising: a target formed with a detecting pattern; a light source for forming a light, the light being adapted to penetrate the target and illuminating the optical to be tested And a first image sensor disposed on the support base for receiving the light from the optical device to be tested to obtain an image including the detection pattern, wherein the first image The distance between the inductor and the optical device to be tested is a preset object distance. 根據請求項1所述的光學檢測裝置,更包含:一位移機構,連接於該支撐座,用以移動該支撐座,藉以設定該第一影像感應器與該待測光學裝置間的距離。 The optical detecting device of claim 1, further comprising: a displacement mechanism coupled to the support base for moving the support base to set a distance between the first image sensor and the optical device to be tested. 根據請求項2所述的光學檢測裝置,更包含:一軌道,該位移機構設於該軌道;及多個望遠影像模組,設置於該軌道上,而且每一該望遠影像模組適於形成一無窮遠物距,並適於接收來自該待測光學裝置的該光線,而且,該第一影像感應器位於該軌道的中間。 The optical detecting device according to claim 2, further comprising: a track, the displacement mechanism is disposed on the track; and a plurality of telephoto image modules disposed on the track, and each of the telephoto image modules is adapted to be formed An infinity object distance and adapted to receive the light from the optical device to be tested, and the first image sensor is located in the middle of the track. 根據請求項3所述的光學檢測裝置,其中,該位移機構透過調整該第一影像感應器的高度,來設定該第一影像感應器與該待測光學裝置間的距離。 The optical detecting device according to claim 3, wherein the displacement mechanism sets a distance between the first image sensor and the optical device to be tested by adjusting a height of the first image sensor. 根據請求項4所述的光學檢測裝置,其中,每一該望遠影像模組包含一望遠鏡頭及一影像感測器,且該望遠鏡頭 提供一無窮遠物距,而且該位移機構,適於將位於該軌道之中間的望遠影像模組的該望遠鏡頭移開,並以位於該軌道之中間的望遠影像模組的該影像感測器,作為該第一影像感應器,藉以使該光學檢測裝置進行短物距的光學檢測。 The optical detecting device of claim 4, wherein each of the telephoto image modules comprises a telescope head and an image sensor, and the telescope head Providing an infinity object distance, and the displacement mechanism is adapted to move the telescope head of the telephoto image module located in the middle of the track, and the image sensor of the telephoto image module located in the middle of the track As the first image sensor, the optical detecting device performs optical detection of short object distance. 根據請求項2所述的光學檢測裝置,更包含:一軌道;及多個望遠影像模組,設置於該軌道上,而且每一該望遠影像模組適於形成一無窮遠物距,並適於接收來自該待測光學裝置的該光線,而且,該位移機構,使該第一影像感應器位於該光線的路徑上或不位於該光線的路徑,藉以在該第一影像感應器位於該光線的路徑上時,設定該第一影像感應器與該待測光學裝置間的距離。 The optical detecting device of claim 2, further comprising: a track; and a plurality of telephoto image modules disposed on the track, and each of the telephoto image modules is adapted to form an infinity object distance and adapted Receiving the light from the optical device to be tested, and the displacement mechanism is configured to locate the first image sensor in a path of the light or not in the light, so that the first image sensor is located in the light The distance between the first image sensor and the optical device to be tested is set on the path. 根據請求項1至6任一項所述的光學檢測裝置,更包含:一計算機,用以接收該第一影像感應器的該影像,以求得該待測光學裝置的至少一光學特徵。 The optical detecting device according to any one of claims 1 to 6, further comprising: a computer for receiving the image of the first image sensor to obtain at least one optical characteristic of the optical device to be tested. 根據請求項7所述的光學檢測裝置,其中,該檢測用圖案包含多個測試圖案,分別形成在不同的多個測試位置,而且該計算機區分並取得該些測試圖案,利用位於每一該測試位置的每一該測試圖案,分別求得每一該測試位置的該至少一光學特徵。 The optical detecting device according to claim 7, wherein the detecting pattern comprises a plurality of test patterns respectively formed at different plurality of test positions, and the computer distinguishes and obtains the test patterns, and the test is located in each of the tests. Each of the test patterns of the position respectively determines the at least one optical feature of each of the test locations. 根據請求項8所述的光學檢測裝置,其中,該至少一光學特徵包含一MTF值。 The optical detecting device of claim 8, wherein the at least one optical feature comprises an MTF value.
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