TWM566357U - Keyswitch device - Google Patents

Keyswitch device Download PDF

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Publication number
TWM566357U
TWM566357U TW107207018U TW107207018U TWM566357U TW M566357 U TWM566357 U TW M566357U TW 107207018 U TW107207018 U TW 107207018U TW 107207018 U TW107207018 U TW 107207018U TW M566357 U TWM566357 U TW M566357U
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Taiwan
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conductive
buffer
switch
pad
switch pad
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TW107207018U
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Chinese (zh)
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陳建碩
汪光申
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群光電子股份有限公司
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Priority to TW107207018U priority Critical patent/TWM566357U/en
Publication of TWM566357U publication Critical patent/TWM566357U/en

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Abstract

A keyswitch device includes a circuit board, a switch circuit, a conductive cushion member, and a metal dome. The circuit board has a surface. The switch circuit is disposed on the surface. The conductive cushion member is disposed on the surface. A part of the switch circuit is located between the surface and the conductive cushion member. The metal dome covers the conductive cushion member and is configured to deform toward the circuit board to press the conductive cushion member.

Description

按鍵裝置 Button device

本創作是有關於一種按鍵裝置,特別是有關於一種具有金屬彈片之按鍵裝置。 This creation relates to a key device, and more particularly to a key device with a metal spring sheet.

就目前個人電腦的使用習慣而言,按鍵裝置為不可或缺的輸入設備之一,用以輸入文字或數字。不僅如此,舉凡日常生活所接觸的消費級電子產品或是工業界使用的大型加工設備,皆需設有按鍵結構作為輸入裝置,以操作上述之電子產品與加工設備。 In terms of current personal computer usage habits, the key device is one of the indispensable input devices for entering text or numbers. Not only that, all consumer electronics products or large-scale processing equipment used in industry need to be equipped with a button structure as an input device to operate the above-mentioned electronic products and processing equipment.

對於低行程按鍵或是觸控板來說,一般會將金屬彈片做為觸發開關之元件。在運用上,金屬彈片通常需配合電路板上的開關電路做訊號導通觸發。然而,在金屬彈片進行按壓時,會與電路板上的開關電路接觸墊(例如為銅片)相互撞擊,造成不悅耳的聲響。也就是說,前述訊號導通觸發的組合在操作上容易產生噪音。 For low-stroke buttons or touchpads, metal shrapnels are generally used as components of trigger switches. In application, metal shrapnel usually needs to cooperate with the switch circuit on the circuit board for signal conduction trigger. However, when the metal elastic sheet is pressed, it will collide with the switch circuit contact pad (for example, a copper sheet) on the circuit board, causing an unpleasant sound. That is, the aforementioned combination of signal on triggers is prone to generate noise in operation.

因此,如何提出一種可解決上述問題的按鍵裝置,是目前業界亟欲投入研發資源解決的問題之一。 Therefore, how to propose a key device that can solve the above problems is one of the problems that the industry is eager to invest in research and development resources.

有鑑於此,本創作之一目的在於提出一種可有效解決前述問題的按鍵裝置。 In view of this, one object of the present invention is to propose a key device that can effectively solve the aforementioned problems.

為了達到上述目的,依據本創作之一實施方式,一種按鍵裝置包含電路板、開關電路、導電緩衝件以及金屬彈片。電路板具有一表面。開關電路設置於此表面上。導電緩衝件設置於前述表面上。開關電路的一部分位於前述表面與導電緩衝件之間。金屬彈片覆蓋導電緩衝件,並配置以朝向電路板變形而按壓導電緩衝件。 In order to achieve the above object, according to an embodiment of the present invention, a key device includes a circuit board, a switch circuit, a conductive buffer, and a metal elastic piece. The circuit board has a surface. The switch circuit is disposed on this surface. The conductive buffer is disposed on the aforementioned surface. A part of the switching circuit is located between the aforementioned surface and the conductive buffer. The metal elastic piece covers the conductive buffer, and is configured to deform toward the circuit board to press the conductive buffer.

於本創作的一或多個實施方式中,開關電路的前述部分包含第一開關墊以及第二開關墊。第二開關墊與第一開關墊分離。變形之金屬彈片係配置以按壓區域接觸導電緩衝件。導電緩衝件被設置以接觸第一開關墊及第二開關墊。 In one or more embodiments of the present invention, the aforementioned part of the switch circuit includes a first switch pad and a second switch pad. The second switch pad is separated from the first switch pad. The deformed metal dome is configured to contact the conductive buffer with the pressing area. The conductive buffer is disposed to contact the first switch pad and the second switch pad.

於本創作的一或多個實施方式中,按壓區域在前述表面上之正投影至少部分重疊於第一開關墊與第二開關墊。 In one or more embodiments of the present invention, the orthographic projection of the pressing area on the aforementioned surface at least partially overlaps the first switch pad and the second switch pad.

於本創作的一或多個實施方式中,開關電路的前述部分包含第一開關墊。開關電路還包含第二開關墊。金屬彈片電性接觸第二開關墊。變形之金屬彈片係配置以按壓區域接觸導電緩衝件。按壓區域在前述表面上之正投影至少部分重疊於第一開關墊。 In one or more embodiments of the present invention, the aforementioned portion of the switch circuit includes a first switch pad. The switching circuit also includes a second switching pad. The metal dome contacts the second switch pad electrically. The deformed metal dome is configured to contact the conductive buffer with the pressing area. The orthographic projection of the pressing area on the aforementioned surface at least partially overlaps the first switch pad.

於本創作的一或多個實施方式中,導電緩衝件為導電泡棉。 In one or more embodiments of the present invention, the conductive buffer is a conductive foam.

於本創作的一或多個實施方式中,導電緩衝件為異方性導電膜。 In one or more embodiments of the present invention, the conductive buffer is an anisotropic conductive film.

於本創作的一或多個實施方式中,導電緩衝件包 含緩衝結構以及導電件。緩衝結構設置於表面上,並位於電路板與金屬彈片之間。導電件設置於緩衝結構面向電路板的一側,並與開關電路的前述部分相對。金屬彈片配置以按壓導電緩衝件而使導電件與開關電路的前述部分接觸。 In one or more embodiments of the present invention, the conductive buffer package Contains buffer structure and conductive parts. The buffer structure is disposed on the surface and is located between the circuit board and the metal spring sheet. The conductive member is disposed on a side of the buffer structure facing the circuit board, and is opposite to the aforementioned part of the switching circuit. The metal dome is configured to press the conductive buffer to contact the conductive member with the aforementioned portion of the switch circuit.

於本創作的一或多個實施方式中,緩衝結構具有凹陷。凹陷鄰接電路板之前述表面。導電件與開關電路的前述部分位於凹陷內。 In one or more embodiments of the present invention, the buffer structure has a depression. The depression abuts the aforementioned surface of the circuit board. The conductive part and the aforementioned part of the switching circuit are located in the recess.

於本創作的一或多個實施方式中,緩衝結構包含間隔層以及緩衝層。間隔層設置於前述表面上,並具有容置空間。開關電路的前述部分位於容置空間內。緩衝層覆蓋於間隔層上以共同形成凹陷。導電件設置於緩衝層面向電路板的一側。 In one or more embodiments of the present invention, the buffer structure includes a spacer layer and a buffer layer. The spacer layer is disposed on the aforementioned surface and has an accommodation space. The aforementioned part of the switching circuit is located in the accommodation space. The buffer layer covers the spacer layer to form a depression together. The conductive member is disposed on a side of the buffer layer facing the circuit board.

於本創作的一或多個實施方式中,緩衝層為PET墊。 In one or more embodiments of the present invention, the buffer layer is a PET pad.

於本創作的一或多個實施方式中,開關電路的該部分包含第一開關墊以及第二開關墊。第二開關墊與第一開關墊分離。變形之金屬彈片係配置以按壓區域接觸緩衝結構。按壓區域與導電件在前述表面上之正投影至少部分重疊於第一開關墊與第二開關墊。 In one or more embodiments of the present invention, the part of the switch circuit includes a first switch pad and a second switch pad. The second switch pad is separated from the first switch pad. The deformed metal dome is configured to contact the cushioning structure with the pressing area. The orthographic projection of the pressing area and the conductive member on the aforementioned surface at least partially overlaps the first switch pad and the second switch pad.

綜上所述,在本創作之按鍵裝置中,設置於電路板上的開關電路與金屬彈片之間的導電緩衝件可緩衝變形之金屬彈片所產生的衝擊。不僅如此,導電緩衝件還可提供導電之功能。因此,使用者在按壓本創作之按鍵裝置時,可以利用導電緩衝件做為開關電路與金屬彈片之間的緩衝與導電媒 介,以有效地減少金屬碰撞的聲響,進而達到降低噪音之目的。 To sum up, in the key device of the present invention, the conductive buffer member provided between the switch circuit on the circuit board and the metal spring sheet can buffer the impact generated by the deformed metal spring sheet. Not only that, the conductive buffer can also provide the function of conducting electricity. Therefore, when the user presses the key device of this creation, the conductive buffer member can be used as a buffer and conductive medium between the switch circuit and the metal elastic piece. Media to effectively reduce the sound of metal collisions, thereby achieving the purpose of reducing noise.

以上所述僅係用以闡述本創作所欲解決的問題、解決問題的技術手段、及其產生的功效等等,本創作之具體細節將在下文的實施方式及相關圖式中詳細介紹。 The above is only used to explain the problems that this creation intends to solve, the technical means to solve the problems, and the effects they produce, etc. The specific details of this creation will be described in detail in the following embodiments and related drawings.

100、200A、200B、300、400‧‧‧按鍵裝置 100, 200A, 200B, 300, 400‧‧‧ button devices

110‧‧‧電路板 110‧‧‧Circuit board

110a‧‧‧表面 110a‧‧‧ surface

111、211‧‧‧開關電路 111, 211‧‧‧ switch circuit

111a、211a‧‧‧第一開關墊 111a, 211a‧‧‧The first switch pad

111b、211b‧‧‧第二開關墊 111b, 211b‧‧‧Second switch pad

120、220a、220b、320、420‧‧‧導電緩衝件 120, 220a, 220b, 320, 420‧‧‧ conductive buffer

130‧‧‧金屬彈片 130‧‧‧Metal shrapnel

131‧‧‧按壓區域 131‧‧‧Press area

321、421‧‧‧緩衝結構 321, 421‧‧‧Buffer Structure

321a‧‧‧間隔層 321a‧‧‧spacer

321b‧‧‧緩衝層 321b‧‧‧Buffer layer

322‧‧‧導電件 322‧‧‧Conductive parts

P‧‧‧正投影 P‧‧‧ Orthographic

R‧‧‧凹陷 R‧‧‧ Depression

S‧‧‧容置空間 S‧‧‧ accommodation space

為讓本創作之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: In order to make the above and other purposes, features, advantages, and embodiments of this creation more comprehensible, the description of the drawings is as follows:

第1A圖為繪示根據本創作一實施方式之按鍵裝置的部分元件於未按壓狀態下的剖面示意圖。 FIG. 1A is a schematic cross-sectional view showing some elements of a key device according to an embodiment of the present invention in an unpressed state.

第1B圖為繪示第1A圖中之結構於按壓狀態下的剖面示意圖。 FIG. 1B is a schematic cross-sectional view showing the structure in FIG. 1A in a pressed state.

第2圖為繪示根據本創作一實施方式之電路開關的局部上視圖。 FIG. 2 is a partial top view illustrating a circuit switch according to an embodiment of the present invention.

第3A圖為繪示根據本創作另一實施方式之按鍵裝置的部分元件於未按壓狀態下的剖面示意圖。 FIG. 3A is a schematic cross-sectional view showing some elements of a key device according to another embodiment of the present invention in an unpressed state.

第3B圖為繪示第3A圖中之結構於按壓狀態下的剖面示意圖。 FIG. 3B is a schematic cross-sectional view showing the structure in FIG. 3A in a pressed state.

第4圖為繪示根據本創作另一實施方式之電路開關的局部上視圖。 FIG. 4 is a partial top view illustrating a circuit switch according to another embodiment of the present invention.

第5A圖為繪示根據本創作另一實施方式之按鍵裝置的部分元件於未按壓狀態下的剖面示意圖。 FIG. 5A is a schematic cross-sectional view showing some elements of a key device according to another embodiment of the present invention in an unpressed state.

第5B圖為繪示第5A圖中之結構於按壓狀態下的剖面示意圖。 FIG. 5B is a schematic cross-sectional view showing the structure in FIG. 5A in a pressed state.

第6A圖為繪示根據本創作另一實施方式之按鍵裝置的部分元件於未按壓狀態下的剖面示意圖。 FIG. 6A is a schematic cross-sectional view showing some elements of a key device according to another embodiment of the present invention in an unpressed state.

第6B圖為繪示第6A圖中之結構於按壓狀態下的剖面示意圖。 FIG. 6B is a schematic cross-sectional view showing the structure in FIG. 6A in a pressed state.

第7圖為繪示根據本創作另一實施方式之按鍵裝置的部分元件於未按壓狀態下的剖面示意圖。 FIG. 7 is a schematic cross-sectional view showing some elements of a key device according to another embodiment of the present invention in an unpressed state.

以下將以圖式揭露本創作之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本創作。也就是說,在本創作部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。實施方式中的圖式省略部份元件,以清楚顯示本創作的技術特點。實施方式僅用以作為範例說明,並不會限縮本創作欲保護之範圍。在所有圖式中相同的標號將用於表示相同或相似的元件。這些圖式之繪示是為了清楚表達這些實施方式中各元件之間的連接關係,並非繪示各元件的實際尺寸。 In the following, multiple implementations of this creation will be disclosed graphically. For the sake of clarity, many practical details will be explained in the following description. However, it should be understood that these practical details should not be used to limit this creation. That is to say, in the implementation of this creative part, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventional structures and components will be shown in the drawings in a simple and schematic manner. The drawings in the embodiments omit some elements to clearly show the technical characteristics of the creation. The implementation method is only used as an example for illustration, and does not limit the scope of the creative protection. The same reference numbers will be used throughout the drawings to refer to the same or like parts. These drawings are shown for the purpose of clearly expressing the connection relationship between the elements in these embodiments, and are not intended to show the actual dimensions of the elements.

請參照第1A圖以及第1B圖。第1A圖為繪示根據本創作一實施方式之按鍵裝置100的部分元件於未按壓狀態下的剖面示意圖。第1B圖為繪示第1A圖中之結構於按壓狀態下的剖面示意圖。如第1A圖與第1B圖所示,本實施方式之按鍵裝置100可以是供桌上型電腦使用之外接鍵盤(例如,PS2介 面之鍵盤或USB介面之鍵盤)的按鍵或是包含按鍵形式之輸入裝置(例如,筆記型電腦上的觸控板),但並不以此為限。換言之,本創作之按鍵裝置100之概念可以應用於任何以按壓作為輸入方式的電子產品。 Please refer to Fig. 1A and Fig. 1B. FIG. 1A is a schematic cross-sectional view showing some elements of the key device 100 according to an embodiment of the present invention in an unpressed state. FIG. 1B is a schematic cross-sectional view showing the structure in FIG. 1A in a pressed state. As shown in FIG. 1A and FIG. 1B, the key device 100 in this embodiment may be an external keyboard (for example, a PS2 interface) for a desktop computer. (Such as a keyboard or a USB keyboard) or an input device (such as a touchpad on a notebook computer) in the form of a key, but not limited to this. In other words, the concept of the created key device 100 can be applied to any electronic product that uses pressing as an input method.

如第1A圖與第1B圖所示,於本實施方式中,按鍵裝置100包含電路板110、開關電路111、導電緩衝件120以及金屬彈片130。電路板110具有表面110a。開關電路111設置於此表面110a上。導電緩衝件120設置於電路板110的表面110a上。開關電路111的一部分位於電路板110的表面110a與導電緩衝件120之間。金屬彈片130覆蓋導電緩衝件120,並配置以朝向電路板110變形而按壓導電緩衝件120。 As shown in FIG. 1A and FIG. 1B, in the present embodiment, the key device 100 includes a circuit board 110, a switch circuit 111, a conductive buffer 120, and a metal elastic piece 130. The circuit board 110 has a surface 110a. The switch circuit 111 is disposed on the surface 110a. The conductive buffer 120 is disposed on the surface 110 a of the circuit board 110. A part of the switching circuit 111 is located between the surface 110 a of the circuit board 110 and the conductive buffer 120. The metal elastic sheet 130 covers the conductive buffer 120 and is configured to deform toward the circuit board 110 to press the conductive buffer 120.

請參照第2圖,其為繪示根據本創作一實施方式之電路開關的局部上視圖。如第2圖所示,於本實施方式中,前述開關電路111位於表面110a與導電緩衝件120之間的部分包含第一開關墊111a以及第二開關墊111b。第二開關墊111b與第一開關墊111a分離,且兩者具有多個延伸部且彼此交錯排列。如第1B圖所示,變形之金屬彈片130係配置以按壓區域131接觸導電緩衝件120。按壓區域131在電路板110的表面110a上之正投影P(第2圖中以虛線表示)至少部分重疊於第一開關墊111a與第二開關墊111b。 Please refer to FIG. 2, which is a partial top view illustrating a circuit switch according to an embodiment of the present invention. As shown in FIG. 2, in the present embodiment, a portion of the switch circuit 111 between the surface 110 a and the conductive buffer 120 includes a first switch pad 111 a and a second switch pad 111 b. The second switch pad 111b is separated from the first switch pad 111a, and both have a plurality of extending portions and are staggered with each other. As shown in FIG. 1B, the deformed metal dome 130 is configured to contact the conductive buffer 120 with the pressing region 131. The orthographic projection P of the pressing area 131 on the surface 110 a of the circuit board 110 (shown by a dashed line in the second figure) at least partially overlaps the first switch pad 111 a and the second switch pad 111 b.

於一些實施方式中,導電緩衝件120為異方性導電膜(Anisotropic Conductive Film,ACF)。異方性導電膜具有垂直導電的特性。於一些導電緩衝件120為異方性導電膜的實施方式中,異方性導電膜在沿著其膜面方向上保有絕緣 性,而在垂直於其膜面方向上則具有導電性。當金屬彈片130未受到按壓時,金屬彈片130未接觸開關電路111上方的異方性導電膜,因此,金屬彈片130未透過異方性導電膜與開關電路111電性導通。同時,由於異方性導電膜在沿著其膜面方向保有絕緣性,因此,即使異方性導電膜被設置以直接接觸開關電路111,開關電路111的第一開關墊111a與第二開關墊111b亦不會電性導通。當金屬彈片130受到按壓時,金屬彈片130的按壓區域131接觸異方性導電膜,由於異方性導電膜在垂直於其膜面方向具有導電性,是以,金屬彈片130透過異方性導電膜與開關電路111電性導通。因此,導電緩衝件120在受金屬彈片130的按壓區域131按壓的部位可以進行Z軸方向(亦即,垂直於異方性導電膜的膜面方向)上的電性導通。 In some embodiments, the conductive buffer 120 is an anisotropic conductive film (ACF). The anisotropic conductive film has a characteristic of vertical conductivity. In some embodiments in which the conductive buffer member 120 is an anisotropic conductive film, the anisotropic conductive film is insulated in a direction along the film surface thereof. It is conductive in the direction perpendicular to its film surface. When the metal dome 130 is not pressed, the metal dome 130 is not in contact with the anisotropic conductive film above the switching circuit 111. Therefore, the metal dome 130 is not electrically connected to the switch circuit 111 through the anisotropic conductive film. At the same time, since the anisotropic conductive film is insulated along its film surface direction, even if the anisotropic conductive film is provided to directly contact the switch circuit 111, the first switch pad 111a and the second switch pad of the switch circuit 111 111b will not be electrically conductive. When the metal elastic sheet 130 is pressed, the pressing area 131 of the metal elastic sheet 130 contacts the anisotropic conductive film. Since the anisotropic conductive film has conductivity in a direction perpendicular to the film surface thereof, the metal elastic sheet 130 transmits through the anisotropic conductive film. The film is electrically connected to the switching circuit 111. Therefore, the conductive buffer 120 can be electrically conducted in the Z-axis direction (that is, perpendicular to the film surface direction of the anisotropic conductive film) at a portion pressed by the pressing region 131 of the metal elastic sheet 130.

藉由前述結構配置,本實施方式之導電緩衝件120即可緩衝變形之金屬彈片130對第一開關墊111a以及第二開關墊111b所產生的衝擊,還可在受按壓時提供導電之功能,使得第一開關墊111a與第二開關墊111b可經由導電緩衝件120及金屬彈片130電性導通。因此,使用者在按壓本實施方式之按鍵裝置100時,可以利用導電緩衝件120做為開關電路111與金屬彈片130之間的緩衝與導電媒介,以有效地減少金屬碰撞的聲響,進而達到降低噪音之目的。 With the foregoing structural configuration, the conductive buffer member 120 of this embodiment can buffer the impact of the deformed metal elastic sheet 130 on the first switch pad 111a and the second switch pad 111b, and can also provide a conductive function when pressed. The first switch pad 111a and the second switch pad 111b can be electrically connected through the conductive buffer 120 and the metal elastic sheet 130. Therefore, when the user presses the key device 100 of this embodiment, the conductive buffer 120 can be used as a buffer and conductive medium between the switch circuit 111 and the metal elastic sheet 130 to effectively reduce the sound of metal collision, thereby achieving a reduction. The purpose of noise.

另外,由於前述實施方式中所使用的異方性導電膜具有在垂直於其膜面方向(Z軸方向)可電性導通,而在沿著其膜面方向(X/Y軸方向)絕緣的特性,僅在金屬彈片130受按壓接觸到異方性導電膜時,才會產生電性導通的現象,因此導 電緩衝件120在按鍵裝置100處於未按壓狀態時可被設置以接觸開關電路111,而開關電路111不會產生電性導通的現象,因此可有效縮減按鍵裝置100的整體厚度。 In addition, the anisotropic conductive film used in the foregoing embodiment has electrical conductivity in a direction perpendicular to the film surface direction (Z-axis direction), and is insulated in a direction along the film surface direction (X / Y-axis direction). Characteristics, only when the metal elastic sheet 130 is pressed to contact the anisotropic conductive film, the phenomenon of electrical conduction will occur, so The electrical buffer 120 can be disposed to contact the switch circuit 111 when the key device 100 is not pressed, and the switch circuit 111 does not cause electrical conduction, so the overall thickness of the key device 100 can be effectively reduced.

請參照第3A圖以及第3B圖。第3A圖為繪示根據本創作另一實施方式之按鍵裝置200A的部分元件於未按壓狀態下的剖面示意圖。第3B圖為繪示第3A圖中之結構於按壓狀態下的剖面示意圖。 Please refer to Fig. 3A and Fig. 3B. FIG. 3A is a schematic cross-sectional view showing some components of a key device 200A according to another embodiment of the present invention in an unpressed state. FIG. 3B is a schematic cross-sectional view showing the structure in FIG. 3A in a pressed state.

如第3A圖與第3B圖所示,於本實施方式中,按鍵裝置200A包含電路板110、開關電路211、導電緩衝件220a以及金屬彈片130,其中電路板110及金屬彈片130與第1A圖所示之實施方式相同,因此可參照前述相關描述,在此恕不贅述。本實施方式相較於第1A圖所示之實施方式的差異之處,在於本實施方式的開關電路211位於電路板110的表面110a與導電緩衝件220a之間的部分包含第一開關墊211a,而第二開關墊211b位於導電緩衝件220a的外緣之外。亦即,本實施方式之導電緩衝件220a相對於第1A圖所示之實施方式在側向上縮短而僅覆蓋第一開關墊211a。另外,本實施方式之金屬彈片130係電性接觸第二開關墊211b。 As shown in FIG. 3A and FIG. 3B, in this embodiment, the key device 200A includes a circuit board 110, a switch circuit 211, a conductive buffer 220a, and a metal spring sheet 130. The circuit board 110, the metal spring sheet 130, and FIG. 1A The illustrated embodiments are the same, so reference may be made to the foregoing related description, and details are not described herein. The difference between this embodiment and the embodiment shown in FIG. 1A is that the portion of the switch circuit 211 of this embodiment between the surface 110 a of the circuit board 110 and the conductive buffer 220 a includes a first switch pad 211 a. The second switch pad 211b is located outside the outer edge of the conductive buffer 220a. That is, compared with the embodiment shown in FIG. 1A, the conductive buffer 220 a of this embodiment is shortened in the lateral direction to cover only the first switch pad 211 a. In addition, the metal elastic piece 130 of this embodiment is in electrical contact with the second switch pad 211b.

請參照第4圖,其為繪示根據本創作另一實施方式之電路開關的局部上視圖。如第4圖所示,於本實施方式中,第二開關墊211b與第一開關墊211a分離,且第二開關墊211b環繞於第一開關墊211a的外緣之外。如第3B圖所示,變形之金屬彈片130係配置以按壓區域131接觸導電緩衝件220a。按壓區域131在電路板110的表面110a上之正投影P(第4圖中以 虛線表示)至少部分重疊於第一開關墊211a。 Please refer to FIG. 4, which is a partial top view illustrating a circuit switch according to another embodiment of the present invention. As shown in FIG. 4, in this embodiment, the second switch pad 211 b is separated from the first switch pad 211 a, and the second switch pad 211 b surrounds the outer edge of the first switch pad 211 a. As shown in FIG. 3B, the deformed metal elastic sheet 130 is configured to contact the conductive buffer 220 a with the pressing region 131. The orthographic projection P of the pressing area 131 on the surface 110a of the circuit board 110 (shown in FIG. 4 as (Dotted line) is at least partially overlapped with the first switch pad 211a.

於一些實施方式中,導電緩衝件220a為導電泡棉或異方性導電膜。當金屬彈片130受到按壓時,金屬彈片130的按壓區域131接觸導電緩衝件220a,金屬彈片130透過導電緩衝件220a與開關電路111電性導通。藉由前述結構配置,本實施方式之導電緩衝件220a即可緩衝變形之金屬彈片130對第一開關墊211a所產生的衝擊,還可在受按壓時提供導電之功能,使得第一開關墊211a可依序經由導電緩衝件220a與金屬彈片130而電性導通至第二開關墊211b。 In some embodiments, the conductive buffer 220a is a conductive foam or an anisotropic conductive film. When the metal elastic piece 130 is pressed, the pressing area 131 of the metal elastic piece 130 contacts the conductive buffer 220a, and the metal elastic piece 130 is electrically connected to the switch circuit 111 through the conductive buffer 220a. With the foregoing structural configuration, the conductive buffer 220a of this embodiment can cushion the impact of the deformed metal spring sheet 130 on the first switch pad 211a, and can also provide a conductive function when pressed, so that the first switch pad 211a It can be electrically conducted to the second switch pad 211b in sequence through the conductive buffer 220a and the metal elastic sheet 130.

請參照第5A圖以及第5B圖。第5A圖為繪示根據本創作另一實施方式之按鍵裝置200B的部分元件於未按壓狀態下的剖面示意圖。第5B圖為繪示第5A圖中之結構於按壓狀態下的剖面示意圖。 Please refer to Fig. 5A and Fig. 5B. FIG. 5A is a schematic cross-sectional view showing some elements of a key device 200B according to another embodiment of the present invention in an unpressed state. FIG. 5B is a schematic cross-sectional view showing the structure in FIG. 5A in a pressed state.

如第5A圖與第5B圖所示,於本實施方式中,按鍵裝置200B包含電路板110、開關電路211、導電緩衝件220b以及金屬彈片130,其中電路板110、開關電路211及金屬彈片130與第3A圖所示之實施方式相同,因此可參照前述相關描述,在此恕不贅述。本實施方式相較於第3A圖所示之實施方式的差異之處,在於本實施方式的導電緩衝件220b被設置覆蓋且接觸第一開關墊211a及第二開關墊211b。在此實施方式中,導電緩衝件220b可以為異方性導電膜。金屬彈片130係配置以按壓區域131接觸導電緩衝件220b。按壓區域131在電路板110的表面110a上之正投影P(第4圖中以虛線表示)至少部分重疊於第一開關墊211a。當金屬彈片130受到按壓時,導電 緩衝件220b在受金屬彈片130的按壓區域131按壓的部位可以進行Z軸方向(亦即,垂直於異方性導電膜的膜面方向)上的電性導通。金屬彈片130的按壓區域131接觸導電緩衝件220b,金屬彈片130透過導電緩衝件220b與開關電路211電性導通,亦使得第一開關墊211a與第二開關墊211b可經由導電緩衝件220b及金屬彈片130電性導通。 As shown in FIG. 5A and FIG. 5B, in this embodiment, the key device 200B includes a circuit board 110, a switch circuit 211, a conductive buffer 220b, and a metal spring sheet 130, among which the circuit board 110, the switch circuit 211, and the metal spring sheet 130 It is the same as the embodiment shown in FIG. 3A, so reference may be made to the related descriptions above, and details are not described herein. The difference between this embodiment and the embodiment shown in FIG. 3A is that the conductive buffer 220b of this embodiment is provided to cover and contact the first switch pad 211a and the second switch pad 211b. In this embodiment, the conductive buffer 220b may be an anisotropic conductive film. The metal elastic piece 130 is configured so that the pressing area 131 contacts the conductive buffer 220b. The orthographic projection P of the pressing area 131 on the surface 110 a of the circuit board 110 (indicated by a dashed line in FIG. 4) at least partially overlaps the first switch pad 211 a. When the metal dome 130 is pressed, it conducts electricity The buffer 220 b can be electrically conducted in the Z-axis direction (that is, perpendicular to the film surface direction of the anisotropic conductive film) at a portion pressed by the pressing region 131 of the metal elastic sheet 130. The pressing area 131 of the metal elastic piece 130 contacts the conductive buffer 220b, and the metal elastic piece 130 is electrically connected to the switch circuit 211 through the conductive buffer 220b, so that the first switch pad 211a and the second switch pad 211b can pass through the conductive buffer 220b and metal The elastic piece 130 is electrically conductive.

請參照第6A圖以及第6B圖。第6A圖為繪示根據本創作另一實施方式之按鍵裝置300的部分元件於未按壓狀態下的剖面示意圖。第6B圖為繪示第6A圖中之結構於按壓狀態下的剖面示意圖。 Please refer to Fig. 6A and Fig. 6B. FIG. 6A is a schematic cross-sectional view showing some elements of a key device 300 according to another embodiment of the present invention in an unpressed state. FIG. 6B is a schematic cross-sectional view showing the structure in FIG. 6A in a pressed state.

如第6A圖與第6B圖所示,於本實施方式中,按鍵裝置300包含電路板110、開關電路111、導電緩衝件320以及金屬彈片130,其中電路板110、開關電路111及金屬彈片130與第1A圖所示之實施方式相同,因此可參照前述相關描述,在此恕不贅述。本實施方式相較於第1A圖所示之實施方式的差異之處,在於本實施方式的導電緩衝件320包含緩衝結構321以及導電件322。緩衝結構321設置於電路板110的表面110a上,並位於電路板110與金屬彈片130之間。導電件322設置於緩衝結構321面向電路板110的一側,並與開關電路111位於表面110a與導電緩衝件320之間的前述部分相對。 As shown in FIG. 6A and FIG. 6B, in the present embodiment, the key device 300 includes a circuit board 110, a switch circuit 111, a conductive buffer 320, and a metal spring 130, wherein the circuit board 110, the switch circuit 111, and the metal spring 130 The embodiment is the same as that shown in FIG. 1A, and therefore reference may be made to the foregoing related descriptions, and details are not described herein. The difference between this embodiment and the embodiment shown in FIG. 1A is that the conductive buffer member 320 of this embodiment includes a buffer structure 321 and a conductive member 322. The buffer structure 321 is disposed on the surface 110 a of the circuit board 110 and is located between the circuit board 110 and the metal elastic sheet 130. The conductive member 322 is disposed on a side of the buffer structure 321 facing the circuit board 110, and is opposite to the aforementioned portion of the switch circuit 111 located between the surface 110 a and the conductive buffer 320.

具體來說,緩衝結構321包含間隔層321a以及緩衝層321b。間隔層321a設置於電路板110的表面110a上,並具有容置空間S。前述開關電路111位於表面110a與導電緩衝件320之間的部分(即包含第一開關墊111a及第二開關墊111b 的部分,如第2圖所示)位於容置空間S內。緩衝層321b覆蓋於間隔層321a上。導電件322設置於緩衝層321b面向電路板110的一側。金屬彈片130配置以按壓緩衝層321b而使緩衝層321b變形,進而使導電件322與開關電路111的第一開關墊111a及第二開關墊111b接觸。 Specifically, the buffer structure 321 includes a spacer layer 321 a and a buffer layer 321 b. The spacer layer 321 a is disposed on the surface 110 a of the circuit board 110 and has an accommodation space S. The portion of the aforementioned switching circuit 111 between the surface 110a and the conductive buffer 320 (that is, including the first switching pad 111a and the second switching pad 111b (As shown in FIG. 2) is located in the accommodation space S. The buffer layer 321b covers the spacer layer 321a. The conductive member 322 is disposed on a side of the buffer layer 321 b facing the circuit board 110. The metal elastic piece 130 is arranged to press the buffer layer 321b to deform the buffer layer 321b, and further, the conductive member 322 is in contact with the first switch pad 111a and the second switch pad 111b of the switch circuit 111.

如第6B圖所示,並配合參照第2圖,於本實施方式中,變形之金屬彈片130係配置以按壓區域131接觸緩衝結構321的緩衝層321b。按壓區域131與導電件322在電路板110的表面110a上之正投影(可參考第2圖中的虛線)至少部分重疊於第一開關墊111a與第二開關墊111b。 As shown in FIG. 6B and with reference to FIG. 2, in this embodiment, the deformed metal elastic sheet 130 is configured to press the region 131 to contact the buffer layer 321 b of the buffer structure 321. The orthographic projection of the pressing area 131 and the conductive member 322 on the surface 110 a of the circuit board 110 (refer to the dotted line in FIG. 2) at least partially overlap the first switch pad 111 a and the second switch pad 111 b.

當金屬彈片130受到按壓時,金屬彈片130的按壓區域131接觸緩衝結構321的緩衝層321b,緩衝層321b亦受到按壓,可帶動導電件322朝向開關電路111移動,進而使導電件322接觸開關電路111。藉由前述結構配置,本實施方式之緩衝層321b即可緩衝變形之金屬彈片130對第一開關墊111a以及第二開關墊111b所產生的衝擊,還可在受按壓時以導電件322提供導電之功能,使得第一開關墊111a與第二開關墊111b可經由導電件322電性導通。 When the metal elastic sheet 130 is pressed, the pressing area 131 of the metal elastic sheet 130 contacts the buffer layer 321b of the buffer structure 321, and the buffer layer 321b is also pressed, which can cause the conductive member 322 to move toward the switch circuit 111, and then the conductive member 322 contacts the switch circuit. 111. With the foregoing structural configuration, the buffer layer 321b of this embodiment can cushion the impact of the deformed metal spring sheet 130 on the first switch pad 111a and the second switch pad 111b, and can also provide conductivity with the conductive member 322 when pressed This function enables the first switch pad 111a and the second switch pad 111b to be electrically conducted through the conductive member 322.

於一些實施方式中,緩衝層321b為聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)墊。於其他實施方式中,緩衝層321b亦可為導電泡棉、異方性導電膜或是Pubber材質,則前述導電件322可省略。 In some embodiments, the buffer layer 321b is a polyethylene terephthalate (PET) pad. In other embodiments, the buffer layer 321b may also be made of conductive foam, anisotropic conductive film, or Rubber, and the conductive member 322 may be omitted.

請參照第7圖,其為繪示根據本創作另一實施方式之按鍵裝置400的部分元件於未按壓狀態下的剖面示意 圖。如第7圖所示,於本實施方式中,按鍵裝置400包含電路板110、開關電路111、導電緩衝件420以及金屬彈片130,其中電路板110、開關電路111及金屬彈片130與第6A圖所示之實施方式相同,因此可參照前述相關描述,在此恕不贅述。本實施方式相較於第6A圖所示之實施方式的差異之處,在於本實施方式的導電緩衝件420所包含的緩衝結構421為單件式結構。緩衝結構421具有凹陷R。凹陷R鄰接電路板110的表面110a。導電件322及前述開關電路111位於表面110a與導電緩衝件120之間的部分(即包含第一開關墊111a及第二開關墊111b的部分,如第2圖所示)位於凹陷R內(亦即,位於容置空間S內)。 Please refer to FIG. 7, which is a schematic cross-sectional view showing some elements of a key device 400 according to another embodiment of the present invention in an unpressed state. Illustration. As shown in FIG. 7, in this embodiment, the key device 400 includes a circuit board 110, a switch circuit 111, a conductive buffer 420, and a metal spring sheet 130. The circuit board 110, the switch circuit 111, and the metal spring sheet 130 are shown in FIG. 6A. The illustrated embodiments are the same, so reference may be made to the foregoing related description, and details are not described herein. The difference between this embodiment and the embodiment shown in FIG. 6A is that the buffer structure 421 included in the conductive buffer 420 of this embodiment is a one-piece structure. The buffer structure 421 has a recess R. The recess R abuts the surface 110 a of the circuit board 110. The conductive member 322 and the aforementioned switching circuit 111 are located between the surface 110a and the conductive buffer 120 (that is, the portion including the first switch pad 111a and the second switch pad 111b, as shown in FIG. 2) is located in the recess R (also That is, it is located in the accommodation space S).

於一些實施方式中,緩衝結構421為PET所製成的單件式結構。於實際應用中,緩衝結構421亦可為導電泡棉或異方性導電膜或是Pubber材質,則前述導電件322可省略。 In some embodiments, the buffer structure 421 is a one-piece structure made of PET. In practical applications, the buffer structure 421 may also be a conductive foam, an anisotropic conductive film, or a Rubber material, and the aforementioned conductive member 322 may be omitted.

由以上對於本創作之具體實施方式之詳述,可以明顯地看出,在本創作之按鍵裝置中,設置於電路板上的開關電路與金屬彈片之間的導電緩衝件可緩衝變形之金屬彈片所產生的衝擊。不僅如此,導電緩衝件還可提供導電之功能。因此,使用者在按壓本創作之按鍵裝置時,可以利用導電緩衝件做為開關電路與金屬彈片之間的緩衝與導電媒介,以有效地減少金屬碰撞的聲響,進而達到降低噪音之目的。 From the above detailed description of the specific implementation of this creation, it can be clearly seen that, in the key device of this creation, the conductive buffer member provided between the switch circuit on the circuit board and the metal dome can cushion the deformed metal dome. The impact. Not only that, the conductive buffer can also provide the function of conducting electricity. Therefore, when the user presses the key device of this creation, the conductive buffer member can be used as a buffer and conductive medium between the switch circuit and the metal spring sheet, so as to effectively reduce the sound of metal collision, thereby achieving the purpose of reducing noise.

雖然本創作已以實施方式揭露如上,然其並不用以限定本創作,任何熟習此技藝者,在不脫離本創作的精神和範圍內,當可作各種的更動與潤飾,因此本創作的保護範圍當 視後附的申請專利範圍所界定者為準。 Although this creation has been disclosed as above in implementation, it is not intended to limit this creation. Any person skilled in this art can make various modifications and retouches without departing from the spirit and scope of this creation, so the protection of this creation Range when Subject to the scope of the attached patent application.

Claims (11)

一種按鍵裝置,包含:一電路板,具有一表面;一開關電路,設置於該表面上;一導電緩衝件,設置於該表面上,其中該開關電路的一部分位於該表面與該導電緩衝件之間;以及一金屬彈片,覆蓋該導電緩衝件,並配置以朝向該電路板變形而按壓該導電緩衝件。A key device includes: a circuit board having a surface; a switch circuit disposed on the surface; and a conductive buffer member disposed on the surface, wherein a part of the switch circuit is located between the surface and the conductive buffer member. And a metal spring sheet covering the conductive buffer member and configured to deform the conductive buffer member and press the conductive buffer member. 如請求項第1項所述之按鍵裝置,其中該開關電路的該部分包含:一第一開關墊;以及一第二開關墊,與該第一開關墊分離,其中變形之該金屬彈片係配置以一按壓區域接觸該導電緩衝件,以及該導電緩衝件被設置以接觸該第一開關墊及該第二開關墊。The key device according to claim 1, wherein the part of the switch circuit includes: a first switch pad; and a second switch pad separated from the first switch pad, wherein the deformed metal spring sheet is configured The conductive buffer is contacted with a pressing area, and the conductive buffer is arranged to contact the first switch pad and the second switch pad. 如請求項第2項所述之按鍵裝置,其中該按壓區域在該表面上之一正投影至少部分重疊於該第一開關墊與該第二開關墊。The button device according to claim 2, wherein an orthographic projection of the pressing area on the surface at least partially overlaps the first switch pad and the second switch pad. 如請求項第1項所述之按鍵裝置,其中開關電路的該部分包含一第一開關墊,該開關電路還包含一第二開關墊,該金屬彈片電性接觸該第二開關墊,變形之該金屬彈片係配置以一按壓區域接觸該導電緩衝件,並且該按壓區域在該表面上之一正投影至少部分重疊於該第一開關墊。The key device according to claim 1, wherein the part of the switch circuit includes a first switch pad, the switch circuit further includes a second switch pad, and the metal spring piece electrically contacts the second switch pad, deforming the The metal elastic sheet is configured to contact the conductive buffer with a pressing area, and an orthographic projection of the pressing area on the surface at least partially overlaps the first switch pad. 如請求項第4項所述之按鍵裝置,其中該導電緩衝件為一導電泡棉。The button device according to claim 4, wherein the conductive buffer is a conductive foam. 如請求項第2或4項所述之按鍵裝置,其中該導電緩衝件為一異方性導電膜。The key device according to claim 2 or 4, wherein the conductive buffer member is an anisotropic conductive film. 如請求項第1項所述之按鍵裝置,其中該導電緩衝件包含:一緩衝結構,設置於該表面上,並位於該電路板與該金屬彈片之間;以及一導電件,設置於該緩衝結構面向該電路板的一側,並與該開關電路的該部分相對,其中該金屬彈片配置以按壓該導電緩衝件而使該導電件與該開關電路的該部分接觸。The key device according to claim 1, wherein the conductive buffer includes: a buffer structure provided on the surface and between the circuit board and the metal spring sheet; and a conductive member provided on the buffer The structure faces one side of the circuit board and is opposite to the portion of the switch circuit, wherein the metal spring piece is configured to press the conductive buffer member to contact the conductive member with the portion of the switch circuit. 如請求項第7項所述之按鍵裝置,其中該緩衝結構具有一凹陷,該凹陷鄰接該電路板之該表面,並且該導電件與該開關電路的該部分位於該凹陷內。The key device according to claim 7, wherein the buffer structure has a recess, the recess is adjacent to the surface of the circuit board, and the conductive member and the portion of the switch circuit are located in the recess. 如請求項第8項所述之按鍵裝置,其中該緩衝結構包含:一間隔層,設置於該表面上,並具有一容置空間,其中該開關電路的該部分位於該容置空間內;一緩衝層,覆蓋於該間隔層上以共同形成該凹陷,其中該導電件設置於該緩衝層面向該電路板的一側。The key device according to claim 8, wherein the buffer structure comprises: a spacer layer disposed on the surface, and having an accommodation space, wherein the part of the switch circuit is located in the accommodation space; A buffer layer covers the spacer layer to form the depression together, wherein the conductive member is disposed on a side of the buffer layer facing the circuit board. 如請求項第9項所述之按鍵裝置,其中該緩衝層為一PET墊。The button device according to claim 9, wherein the buffer layer is a PET pad. 如請求項第7項所述之按鍵裝置,其中該開關電路的該部分包含:一第一開關墊;以及一第二開關墊,與該第一開關墊分離,其中變形之該金屬彈片係配置以一按壓區域接觸該緩衝結構,並且該按壓區域與該導電件在該表面上之正投影至少部分重疊於該第一開關墊與該第二開關墊。The key device according to claim 7, wherein the part of the switch circuit includes: a first switch pad; and a second switch pad separated from the first switch pad, wherein the deformed metal spring sheet is configured The buffer structure is contacted with a pressing area, and an orthographic projection of the pressing area and the conductive member on the surface at least partially overlaps the first switch pad and the second switch pad.
TW107207018U 2018-05-28 2018-05-28 Keyswitch device TWM566357U (en)

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