TWM553809U - Simulation and calibration device for velocimeter - Google Patents
Simulation and calibration device for velocimeter Download PDFInfo
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- TWM553809U TWM553809U TW106209877U TW106209877U TWM553809U TW M553809 U TWM553809 U TW M553809U TW 106209877 U TW106209877 U TW 106209877U TW 106209877 U TW106209877 U TW 106209877U TW M553809 U TWM553809 U TW M553809U
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Description
本創作係有關於一種速度儀校正裝置,更詳而言之,尤指一種利用模擬訊號進行待校正測速儀校正之測速儀模擬校正裝置。 This creation is related to a speedometer calibration device, and more particularly, a speedometer analog calibration device that uses an analog signal to correct a speedometer to be corrected.
近年來科技的進步,對於車輛及物體速度測試的方式不斷地推陳出新,由傳統感應線圈至現在雷射雷達測速,均利用物體通過速度測試儀之時間,作為運算該物體速度之依據。 In recent years, advances in science and technology have continually introduced new ways to test the speed of vehicles and objects. From the traditional induction coils to the current speed measurement of laser radars, the time of passing the object through the speed tester is used as the basis for calculating the speed of the object.
請參閱第1圖,係為習知速度測試儀示意圖,如圖所示,該速度測試儀具有第一測試單元11、第二測試單元12,及一處理模組13,當物體通過第一測試單元11時,該第一測試單元11產生一物體通過之第一時間t1,待物體通過該第二測試單元12時,則產生物體通過之第二時間t2,該處理模組13分別將該第一時間t1及第二時間t2,與該第一測試單元11及第二測試單元12之距離進行運算,獲得到該物體之速度值。 Please refer to FIG. 1 , which is a schematic diagram of a conventional speed tester. As shown, the speed tester has a first test unit 11 , a second test unit 12 , and a processing module 13 . When the object passes the first test In the unit 11, the first test unit 11 generates a first time t1 when an object passes, and when the object passes the second test unit 12, a second time t2 is generated, and the processing module 13 respectively At a time t1 and a second time t2, the distance from the first test unit 11 and the second test unit 12 is calculated to obtain a velocity value of the object.
目前最常使用之速度測試儀校正測試方法,需利用一已知定速物體通過兩測試單元,透過兩測試單元所測得 速度進行比對,故所需之工時及成本相對增加。 The most commonly used speed tester calibration test method is to measure through two test units through two test units using a known fixed speed object. The speed is compared, so the required labor and cost are relatively increased.
鑒於上述習知技術之缺點,本創作主要之目的在於提供一種測速儀模擬校正裝置,透過比對該模擬電訊號,所產生之速度標準值及該待測測速儀器示值,得到該速度標準值及該器示值之器差,利用器差修正測速儀量測數據,以達該校正測速儀之目的。 In view of the above-mentioned shortcomings of the prior art, the main purpose of the present invention is to provide a speedometer analog calibration device, which obtains the speed standard value by comparing the speed standard value generated by the analog electrical signal with the indication value of the speed measuring instrument to be tested. And the difference between the indication value of the device, and the difference between the measured speedometer and the measured data is used to achieve the purpose of the calibration speedometer.
為達上述之目的,本創作係提供一種測速儀模擬校正裝置,利用模擬方式,進行待校正測速儀之速度校正,利用模擬訊號產生模組產生一負向脈衝電訊號,分別驅動該第一發光單元及該第二發光單元,產生一負向脈衝光訊號,透過接收該負向脈衝光訊號,俾使待校正轉速量測裝置產生一速度器示值,透過比對該負向脈衝電訊號所產生之速度標準值及該器示值,得到該速度標準值及該待校正測速度儀器示值之器差,利用器差修正測速儀量測數據,以達該校正測速儀之目的。 In order to achieve the above purpose, the present invention provides a speedometer analog calibration device, which uses an analog method to perform speed correction of the speedometer to be corrected, and uses the analog signal generation module to generate a negative pulse electrical signal to respectively drive the first illumination. The unit and the second illuminating unit generate a negative pulse optical signal, and receive the negative pulse optical signal, so that the speed measuring device to be corrected generates a speed indicator, and the transmission ratio is compared to the negative pulse signal. The generated speed standard value and the device indication value are obtained, and the difference between the speed standard value and the instrument value to be corrected is obtained, and the measurement data of the speedometer is corrected by the device difference to achieve the purpose of the calibration speedometer.
11‧‧‧第一測試單元 11‧‧‧First test unit
12‧‧‧第二測試單元 12‧‧‧Second test unit
13‧‧‧處理模組 13‧‧‧Processing module
t1‧‧‧第一時間 First time t1‧‧‧
t2‧‧‧第二時間 T2‧‧‧ second time
21‧‧‧模擬訊號產生模組 21‧‧‧ Analog signal generation module
22‧‧‧待校正測速儀 22‧‧‧Stop speedometer
211‧‧‧訊號產生單元 211‧‧‧Signal generating unit
212‧‧‧第一發光單元 212‧‧‧First lighting unit
213‧‧‧第二發光單元 213‧‧‧second lighting unit
第1圖係為習知速度測試儀示意圖。 Figure 1 is a schematic diagram of a conventional speed tester.
第2圖係為本創作測速儀模擬校正裝置示意圖。 The second picture is a schematic diagram of the simulation correction device of the creation speedometer.
以下係藉由特定的具體實例說明本創作之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容瞭解本創作之其他優點與功效。 The embodiments of the present invention are described by way of specific examples, and those skilled in the art can understand other advantages and effects of the present invention from the disclosure of the present specification.
請參閱第2圖,係為本創作測速儀模擬校正裝置示意圖,如圖所示,該裝置係包括模擬訊號產生模組21及待校正測速儀22,該模擬訊號產生模組21具有一訊號產生單元211、一發光二極體(LED)或雷射之第一發光單元212及第二發光單元213,利用該訊號產生單元211分別產生一負向脈衝電訊號,驅動該第一發光單元212及第二發光單元213,依序產生一負向脈衝光訊號,該待校正測速儀22係接收、運算該負向脈衝光訊號,得到一待校正測速儀22器示值,透過該模擬訊號產生模組21分別產生一負向脈衝電訊號之時間差,透過該負向脈衝電訊號時間差用以模擬不同速度值,藉以得到該速度標準值,比對該速度標準值及該待校正測速儀22器示值,得到該待校正測速儀22器示值之器差,利用器差修正該待校正測速儀22量測數據,以達到校正測速儀之目的。 Please refer to FIG. 2 , which is a schematic diagram of the analog calibration device of the present speedometer. As shown in the figure, the device includes an analog signal generation module 21 and a speedometer 22 to be corrected. The analog signal generation module 21 has a signal generation. The unit 211, a light emitting diode (LED) or a laser first light emitting unit 212 and a second light emitting unit 213, respectively, generate a negative pulse electrical signal by the signal generating unit 211, and drive the first light emitting unit 212 and The second illumination unit 213 sequentially generates a negative pulse optical signal, and the to-be-corrected tachometer 22 receives and calculates the negative pulse optical signal to obtain a value of the to-be-corrected tachometer 22, and generates a mode by using the analog signal. The group 21 respectively generates a time difference of a negative pulse electrical signal, and the time difference of the negative pulse electrical signal is used to simulate different speed values, thereby obtaining the speed standard value, compared with the speed standard value and the to-be-corrected speedometer 22 The value is obtained, and the difference between the values of the indicator to be corrected is obtained, and the measured data of the to-be-corrected speedometer 22 is corrected by the difference of the device to achieve the purpose of correcting the speedometer.
上述之實施例僅為例示性說明本創作之特點及其功效,而非用於限制本創作之實質技術內容的範圍。任何熟習此技藝之人士均可在不違背本創作之精神及範疇下,對上述實施例進行修飾與變化。因此,本創作之權利保護範圍, 應如後述之申請專利範圍所列。 The above-described embodiments are merely illustrative of the features and functions of the present invention, and are not intended to limit the scope of the technical content of the present invention. Any person skilled in the art can modify and change the above embodiments without departing from the spirit and scope of the present invention. Therefore, the scope of the rights of this creation, It should be listed in the scope of patent application as described later.
21‧‧‧模擬訊號產生模組 21‧‧‧ Analog signal generation module
22‧‧‧待校正測速儀 22‧‧‧Stop speedometer
211‧‧‧訊號產生單元 211‧‧‧Signal generating unit
212‧‧‧第一發光單元 212‧‧‧First lighting unit
213‧‧‧第二發光單元 213‧‧‧second lighting unit
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TW106209877U TWM553809U (en) | 2017-07-05 | 2017-07-05 | Simulation and calibration device for velocimeter |
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TW106209877U TWM553809U (en) | 2017-07-05 | 2017-07-05 | Simulation and calibration device for velocimeter |
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TWM553809U true TWM553809U (en) | 2018-01-01 |
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