TWM549351U - Inspection device for determining quality of conduction pattern - Google Patents

Description

Inspection device for determining whether a conductive pattern is good or bad

The present invention relates to an inspection apparatus for determining whether a conductive pattern is good or bad, and more particularly to an inspection apparatus for determining whether a conductive pattern of a liquid crystal substrate is good or bad.

After forming a conductive pattern on a glass substrate such as a liquid crystal display, it is necessary to detect it well. That is, the conduction or disconnection of a plurality of parallel strip patterns (or a plurality of sub-patterns that are not electrically conductive with each other) included in the conductive pattern is detected one by one by an inspection device.

The above inspection apparatus is important in the field of a conductive pattern such as a liquid crystal display, and how to make it more sophisticated is a problem worth pondering.

As a result of his position, the creator, in view of the lack of prior art, is thinking and improving the idea of creation, and can finally create the "inspection device for determining the quality of a conductive pattern" in this case.

The main purpose of the present invention is to provide an inspection apparatus for determining the quality of a conductive pattern, to improve the reliability of the inspection apparatus and to reduce the associated production and manufacturing costs of the inspection apparatus in a more compact configuration.

Another main object of the present invention is to provide an inspection apparatus for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a midpoint, and a second end. The inspection device includes: a DC power supply, providing a DC voltage, a power supply sensor, receiving the DC voltage, and coupling to a specific parallel pattern of the plurality of parallel patterns, the first end of the specific parallel pattern Having a predetermined first distance, and providing an applied waveform to the first end, wherein the power supply sensor and the first end form a first capacitance value due to the DC voltage, and the specific parallel pattern The midpoint and a ground are charged to have a second capacitance value due to the first capacitance value, a charge amplifier, and an inductor, electrically connected to the charge amplifier, coupled to the specific parallel pattern. The second end has a predetermined second distance from the second end, and the second end has a third capacitance value due to the second capacitance value, and outputs a receiving waveform to the charge , Wherein the charge amplifier based on the received waveform shows that the quality of the particular pattern of parallel, and the quality inspection device determines good or bad based on the conductive pattern of the particular pattern of parallel.

Another main object of the present invention is to provide an inspection apparatus for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end, the inspection device The method includes: a power supply sensor, receiving a DC voltage from a DC power source, coupling to a specific parallel pattern of the plurality of parallel patterns and providing The first end of the specific parallel pattern is supplied to the first end of the specific parallel pattern, a charge amplifier, and an inductor, coupled to the second end of the specific parallel pattern, electrically connected to the charge amplifier, and outputted to receive A waveform is applied to the charge amplifier to indicate the quality of the particular parallel pattern, and the inspection device determines whether the conductive pattern is good or bad based on the quality of the particular parallel pattern.

A primary object of the present invention is to provide an inspection apparatus for determining whether a conductive pattern is good or not, wherein the conductive pattern has a plurality of sub-patterns that are mutually non-conductive, and each of the sub-patterns has a first end and a second End, the inspection device includes: a power supply sensor, receiving a DC voltage from the DC power source, coupling to a specific sub-pattern of the plurality of sub-patterns, and providing a DC test signal to the first end of the specific sub-pattern a charge amplifier, and an inductor, coupled to the second end of the particular sub-pattern, electrically coupled to the charge amplifier, and outputting a receive waveform to the charge amplifier to indicate the quality of the particular sub-pattern, And the inspection device determines whether the conductive pattern is good or bad based on the quality of the specific sub-pattern.

In order to make the above objects, features, and advantages of the present invention more comprehensible, the preferred embodiments are described below, and the accompanying drawings are described in detail as follows:

1‧‧‧Checking device

10‧‧‧DC power supply

11‧‧‧Power sensor

12‧‧‧Inductance detector

13‧‧‧Charger amplifier

2‧‧‧ conductive pattern

21‧‧‧Specific parallel patterns

C1‧‧‧First equivalent capacitance

C2‧‧‧Second equivalent capacitance

C3‧‧‧ third equivalent capacitance

The first figure shows a schematic diagram of detecting a plurality of parallel patterns of a conductive pattern one by one according to the inspection apparatus of the preferred embodiment of the present invention. Figure.

Second Figure: A schematic diagram showing a particular parallel pattern of an inspection device coupled to a detected conductive pattern in accordance with a preferred embodiment of the present inventive concept.

Third figure: It shows a circuit diagram corresponding to an equivalent circuit of one of the second figures.

Figure 4 (a) is a schematic diagram showing a circuit in which an inspection apparatus according to a preferred embodiment of the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the two ends of the specific parallel pattern are in communication with each other. .

FIG. 4(b) is a circuit diagram showing a method in which an inspection apparatus according to a preferred embodiment of the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the ends of the specific parallel pattern are disconnected from each other .

The idea of the present invention is to provide an inspection apparatus for providing one end of one of a plurality of parallel strip patterns provided on a glass substrate of a liquid crystal display by providing a direct current inspection signal (having an applied waveform). At the other end corresponding to the specific parallel strip pattern, a detection signal (having a received waveform) is used to determine whether the specific parallel strip pattern is turned on or off, thereby determining whether the conductive pattern is good or bad.

The first figure is a schematic diagram showing a plurality of parallel patterns of a conductive pattern sequentially inspected by an inspection apparatus according to a preferred embodiment of the present invention. As shown in the first figure, the inspection device includes a power sensor 11 and a sensor 12, and the device is indicated by an arrow. The left and right ends of each of the parallel patterns 21 of the conductive pattern 2 are detected to be electrically connected to each other or have an open circuit in order from the top to the bottom.

The second figure is a schematic diagram showing a particular parallel pattern of an inspection device coupled to the detected conductive pattern in accordance with a preferred embodiment of the present inventive concept. In the second figure, the inspection apparatus 1 includes a DC power supply 10, a power supply sensor 11, a sensed detector 12, and a charge amplifier 13.

As shown in the second figure, an inspection apparatus 1 for determining whether a conductive pattern is good or not, wherein the conductive pattern (see the conductive pattern 2 shown in the first figure) has a plurality of parallel patterns 21, and each of the parallel patterns 21 has a first end, a midpoint and a second end, the DC power source 10 of the inspection device 1 provides a DC voltage, and the power sensor 11 receives the DC voltage and is coupled to the plurality of parallel patterns. a specific parallel pattern 21, having a predetermined first distance from the first end of the specific parallel pattern 21, and providing an applied waveform (which is a DC test signal) to the first end, wherein the power supply sense A first capacitance value is formed between the detector 11 and the first end due to the DC voltage (the first power supply sensor 11 and the first end have a first equivalent capacitance C1), and the specific parallel pattern The midpoint and a ground are charged to have a second capacitance value due to the first capacitance value (the second equivalent capacitor C2 between the midpoint of the specific parallel pattern and the ground), the inductive detector 12 electrically connected to the charge amplifier 13 and coupled to the specific parallel pattern 21 Between the second end and the second end The preset second distance and the second end have a third capacitance value due to the second capacitance value (the third inductance capacitor C3 is connected between the inductor 12 and the second end), and Outputting a received waveform to the charge amplifier 13; wherein the charge amplifier 13 can indicate the quality of the specific parallel pattern 21 based on the received waveform, and the inspection device 1 determines the conductive pattern 2 based on the quality of the specific parallel pattern 21 Good or bad. That is, when the inspection is performed one by one, it is known that when all the first ends of the plurality of parallel patterns 21 are in communication with the corresponding second end, the conductive pattern 2 is normal (or It's good). When the first end of at least one of the plurality of parallel patterns 21 is disconnected from the corresponding second end, the conductive pattern is abnormal (or bad).

The third figure is a circuit diagram showing an equivalent circuit corresponding to one of the second figures. In the third figure, the DC power supply 10 and the specific parallel pattern 21 have the first equivalent capacitance C1. The specific parallel pattern 21 and the ground have the second equivalent capacitance C2, and the specific parallel pattern 21 The third equivalent capacitance C3 is provided between the charge amplifier 13 and the charge amplifier 13.

The fourth diagram (a) is a circuit diagram showing a method in which an inspection apparatus according to a preferred embodiment of the present invention is coupled to a specific parallel pattern of the detected conductive pattern and both ends of the specific parallel pattern are in communication with each other. As described above, each of the specific parallel patterns 21 is one of a plurality of parallel strip patterns (which in a different preferred embodiment may also be a plurality of sub-patterns that are mutually non-conductive with each other). a), the conductive map Case 2 is disposed on, for example, a glass substrate included in a liquid crystal display. The power supply sensor 11 provides an applied waveform to the specific parallel pattern 21, and the sensed sensor 12 receives a received waveform from the specific parallel pattern 21.

The applied waveform shown in the fourth diagram (a) is a step function having a potential greater than zero, and the received waveform shown in the fourth diagram (a) has a rising edge and A rise time greater than zero, when the received waveform has the rising edge and the rising time greater than zero, the first end of the specific parallel pattern 21 is normally in communication with the second end.

The fourth diagram (b) is a circuit diagram showing a method in which an inspection apparatus according to a preferred embodiment of the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the ends of the specific parallel pattern are disconnected from each other. Similarly, the power supply sensor 11 provides an applied waveform to the specific parallel pattern 21, and the sensed device 12 receives a received waveform from the specific parallel pattern 21.

The applied waveform shown in the fourth diagram (b) is also a step function having a potential greater than zero, and the received waveform shown in the fourth diagram (b) is a zero state. Zero state response. When the received waveform is the zero state response (which has a zero potential), it can be seen that the first end of the specific parallel pattern 21 is disconnected from the second end.

Example:

An inspection apparatus for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a midpoint and a second end, and the inspection apparatus comprises: a DC power supply for providing a DC voltage; a power supply sensor receiving the DC voltage coupled to one of the plurality of parallel patterns and having a predetermined pattern between the first end of the specific parallel pattern a first distance, and providing an applied waveform to the first end, wherein the power supply sensor and the first end form a first capacitance value due to the DC voltage, and the midpoint of the specific parallel pattern and the The grounding ground is charged to have a second capacitance value due to the first capacitance value; a charge amplifier; and an inductor detector electrically connected to the charge amplifier coupled to the second end of the specific parallel pattern, and The second end has a predetermined second distance, and the second end has a third capacitance value due to the second capacitance value, and outputs a receiving waveform to the charge amplifier, wherein the charge amplifier base This indicates that the quality of the received waveform and a particular pattern of parallel, and the quality inspection device determines good or bad based on the conductive pattern of the particular pattern of parallel.

2. The inspection apparatus according to embodiment 1, wherein each of the parallel patterns is a parallel strip pattern, the conductive pattern is disposed on a glass substrate included in a liquid crystal display, and the applied waveform has a larger than One of the zero potential steps function, when the received waveform is a zero state response, the first end of the particular parallel pattern is open between the second end, and the specific parallel when the received waveform has a rising edge and a rise time greater than zero The first end of the pattern is in normal communication with the second end.

3. The inspection apparatus according to embodiment 1 or 2, further comprising a first equivalent capacitor, a second equivalent capacitor and a third equivalent capacitor, wherein the first equivalent capacitor has the first capacitor value And electrically connected between the power supply sensor and the first end of the specific parallel pattern, the second equivalent capacitance has the second capacitance value and is electrically connected to the midpoint of the specific parallel pattern and the ground And the third equivalent capacitor has the third capacitance value and is electrically connected between the inductor and the second end of the specific parallel pattern.

4. The inspection apparatus according to any of the above embodiments, wherein the conductive pattern is abnormal when the first end of at least one of the plurality of parallel patterns is disconnected from the corresponding second end of.

5. The inspection apparatus according to any of the preceding embodiments, wherein the conductive pattern is normal when all of the first ends of the plurality of parallel patterns are in communication with the corresponding second end.

6. The inspection apparatus according to any of the above embodiments, wherein the parallel patterns of the plurality of parallel patterns are sequentially checked to see if they are normal.

7. An inspection apparatus for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end, the inspection device comprising: a power supply sensing Receiving a DC voltage from a DC power source, coupling to a specific parallel pattern of the plurality of parallel patterns and providing a DC test signal to the first end of the specific parallel pattern; a charge amplifier; and an inductor a second end coupled to the specific parallel pattern, electrically coupled to the charge amplifier, and outputting a receive waveform to the charge amplifier to indicate the quality of the particular parallel pattern, and the inspection device is based on the particular parallel pattern Good or bad determines whether the conductive pattern is good or bad.

8. The inspection apparatus of embodiment 7, wherein each of the parallel patterns further comprises a midpoint, the DC scan signal being a step function having a potential greater than zero, the power sensor and the Between the first end of the specific parallel pattern having a predetermined first distance, the power sensor and the first end of the specific parallel pattern form a first capacitance value, and the midpoint of the specific parallel pattern And a ground is charged to have a second capacitance value due to the first capacitance value, and the received inductor and the second end of the specific parallel pattern have a predetermined second distance, and the inductor is inductive The detector and the second end of the particular parallel pattern have a third capacitance value due to the second capacitance value.

9. The inspection apparatus according to embodiment 7 or 8, wherein When all of the first ends of the plurality of parallel patterns are in communication with the corresponding second ends, the conductive pattern is normal.

10. The inspection apparatus according to any of the above embodiments, wherein the conductive pattern is abnormal when the first end of at least one of the plurality of parallel patterns is disconnected from the corresponding second end of.

11. An inspection apparatus for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of sub-patterns that are mutually non-conductive, and each of the sub-patterns has a first end and a second end, the inspection device comprising a power supply sensor for receiving a DC voltage from a DC power source, coupling to a specific sub-pattern of the plurality of sub-patterns, and providing a DC test signal to the first end of the specific sub-pattern; a charge amplifier; An inductive detector coupled to the second end of the specific sub-pattern, electrically coupled to the charge amplifier, and outputting a receive waveform to the charge amplifier to indicate the quality of the particular sub-pattern, and the inspection device is based on the The quality of the specific sub-pattern determines whether the conductive pattern is good or bad.

In summary, the present invention provides an inspection apparatus for determining whether a conductive pattern is good or bad, and improves the reliability of the inspection apparatus and reduces the related production and manufacturing costs of the inspection apparatus in a more compact configuration, so Progressive and novel.

Therefore, even though the case has been detailed in the above examples It can be modified by those skilled in the art, and is not intended to be protected by the scope of the patent application.

1‧‧‧Checking device

10‧‧‧DC power supply

11‧‧‧Power sensor

12‧‧‧Inductance detector

13‧‧‧Charger amplifier

21‧‧‧Specific parallel patterns

C1‧‧‧First equivalent capacitance

C2‧‧‧Second equivalent capacitance

C3‧‧‧ third equivalent capacitance

Claims (11)

An inspection apparatus for determining whether a conductive pattern is good or not, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a middle point and a second end, and the inspection device comprises: a continuous flow a power supply, providing a DC voltage; a power supply sensor receiving the DC voltage coupled to one of the plurality of parallel patterns and having a predetermined first pattern between the first end of the specific parallel pattern And providing an applied waveform to the first end, wherein the power supply sensor and the first end form a first capacitance value due to the DC voltage, and the midpoint of the specific parallel pattern and a ground Charging to have a second capacitance value due to the first capacitance value; a charge amplifier; and an inductor connected to the charge amplifier, coupled to the second end of the specific parallel pattern, and the first The second end has a predetermined second distance, and the second end has a third capacitance value due to the second capacitance value, and outputs a receiving waveform to the charge amplifier, wherein the charge amplifier is based on Received waveform shows that the quality of the particular pattern of parallel, and the quality inspection device determines good or bad based on the conductive pattern of the particular pattern of parallel. The inspection apparatus of claim 1, wherein each of the parallel patterns is a parallel strip pattern, and the conductive pattern is disposed on a glass substrate included in a liquid crystal display, and the applied waveform has a more than the a step function of zero potential, when the received waveform is a zero state response, the first end of the specific parallel pattern is disconnected from the second end, and when the receiving When the waveform has a rising edge and a rising time greater than zero, the first end of the specific parallel pattern is normally in communication with the second end. The inspection device of claim 1, further comprising a first equivalent capacitor, a second equivalent capacitor and a third equivalent capacitor, wherein the first equivalent capacitor has the first capacitor value and Electrically connected between the power supply sensor and the first end of the specific parallel pattern, the second equivalent capacitance has the second capacitance value and is electrically connected between the midpoint of the specific parallel pattern and the ground. The third equivalent capacitor has the third capacitance value and is electrically connected between the inductor and the second end of the specific parallel pattern. The inspection apparatus of claim 3, wherein when the first end of at least one of the plurality of parallel patterns is disconnected from the corresponding second end, the conductive pattern is abnormal. . The inspection apparatus of claim 3, wherein the conductive pattern is normal when all of the first ends of the plurality of parallel patterns are in communication with the corresponding second end. The inspection apparatus of claim 3, wherein each of the plurality of parallel patterns is sequentially checked to see if it is normal. An inspection device for determining whether a conductive pattern is good or not, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end, and the inspection device comprises: a power supply sensor, Receiving a DC voltage from a DC power source, coupling to a specific parallel pattern of the plurality of parallel patterns and providing a DC test signal to the first end of the specific parallel pattern; a charge amplifier; and an inductor detector, The second end coupled to the particular parallel pattern is electrically coupled to the charge amplifier and outputs a receive waveform to the charge amplifier to indicate the quality of the particular parallel pattern, and the inspection device is based on the quality of the particular parallel pattern It is determined whether the conductive pattern is good or bad. The inspection apparatus of claim 7, wherein each of the parallel patterns further includes a midpoint, and the DC inspection signal is a step function having a potential greater than zero, the power supply sensor and The first end of the specific parallel pattern has a predetermined first distance, and the power sensor forms a first capacitance value with the first end of the specific parallel pattern, and the midpoint of the specific pattern And a ground is charged to have a second capacitance value due to the first capacitance value, and the received inductor and the second end of the specific parallel pattern have a predetermined second distance, and the inductor is inductive The detector and the second end of the particular parallel pattern have a third capacitance value due to the second capacitance value. An inspection device as described in claim 8 wherein all of the When the first end of the plurality of parallel patterns is in communication with the corresponding second end, the conductive pattern is normal. The inspection apparatus of claim 9, wherein the conductive pattern is abnormal when the first end of at least one of the plurality of parallel patterns is disconnected from the corresponding second end . An inspection device for determining the quality of a conductive pattern, wherein the conductive pattern has a plurality of sub-patterns that are mutually non-conductive, and each of the sub-patterns has a first end and a second end, and the inspection device comprises: Providing a sensor, receiving a DC voltage from a DC power source, coupling to a specific sub-pattern of the plurality of sub-patterns, and providing a DC test signal to the first end of the specific sub-pattern; a charge amplifier; and a power receiving a sensor coupled to the second end of the specific sub-pattern, electrically connected to the charge amplifier, and outputting a receive waveform to the charge amplifier to indicate the quality of the particular sub-pattern, and the inspection device is based on the specific sub- The quality of the pattern determines whether the conductive pattern is good or bad.