TWM539057U - Anti-collision system of optical microscope - Google Patents
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- TWM539057U TWM539057U TW105219673U TW105219673U TWM539057U TW M539057 U TWM539057 U TW M539057U TW 105219673 U TW105219673 U TW 105219673U TW 105219673 U TW105219673 U TW 105219673U TW M539057 U TWM539057 U TW M539057U
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Description
本創作是有關於一種光學顯微鏡之防撞系統,特別是有關於一種具有防止物鏡直接碰撞待測物之光學顯微鏡之防撞系統。The present invention relates to an anti-collision system for an optical microscope, and more particularly to an anti-collision system having an optical microscope that prevents an objective lens from directly colliding with a test object.
一般而言,光學顯微鏡進行量測時,只能透過顯示器的畫面間接觀看目前待測物的影像,所以物鏡移近待測物的過程中,如果沒有注意物鏡與待測物之間的距離,極有可能發生碰撞,進而造成物鏡或者待測物的損壞引起不必要的損失。In general, when measuring with an optical microscope, the image of the current object to be tested can only be indirectly viewed through the screen of the display. Therefore, if the objective lens is moved closer to the object to be tested, if the distance between the objective lens and the object to be tested is not observed, Collisions are highly likely to occur, causing unnecessary damage to the objective lens or the object to be tested.
光學顯微鏡的物鏡與待測物多為高單價物品如半導體產業測試晶圓良率的探針卡(Probe card),為了避免碰撞進而造成損失,在進行量測的過程中,光學顯微鏡必須搭配一防撞系統,避免物鏡與待測物發生碰撞。有業者提出在光學顯微鏡上安裝接觸式感測器,以偵測判斷物鏡是否會撞上待測物。但是對於一些較為敏感不耐壓的待測物,就不適用接觸式感測器。The objective lens and the object to be tested of the optical microscope are high-priced items such as the probe card of the semiconductor industry test wafer yield. In order to avoid collision and cause loss, the optical microscope must be matched with one during the measurement. Anti-collision system to avoid collision between the objective lens and the object to be tested. Some practitioners have proposed to install a contact sensor on an optical microscope to detect whether the objective lens will hit the object to be tested. However, for some sensitive and unbearable test objects, contact sensors are not applicable.
也有業者提出在光學顯微鏡上安裝非接觸式感測器,比如光纖;但是此類非接觸式感測器容易受到待測物材質的影響。此外,外加的感測器沒辦法對準在鏡頭正在看的影像上,尤其是當顯微鏡的待測物很小或很細時,感測器可能無法感測到物鏡與待測物之間的距離,而無法發揮防撞功能。再者,光學顯微鏡上額外安裝感測器也會增加成本。Some manufacturers have proposed to install non-contact sensors such as optical fibers on optical microscopes; however, such non-contact sensors are susceptible to the material of the object to be tested. In addition, the external sensor cannot be aligned with the image being viewed by the lens, especially when the microscope's object to be tested is small or very thin, the sensor may not be able to sense the relationship between the objective and the object to be tested. Distance, and can not play the anti-collision function. Furthermore, the additional mounting of the sensor on the optical microscope also adds cost.
綜觀前所述,本創作之創作人思索並設計一種光學顯微鏡之防撞系統,經苦心潛心研究,以針對現有技術之缺失加以改善,進而增進產業上之實施利用。As mentioned above, the creators of this creation think about and design an anti-collision system for optical microscopes, and painstakingly study them to improve the lack of existing technologies, thereby enhancing the implementation and utilization of the industry.
有鑑於上述習知技藝之問題,本創作之其中一目的就是在提供一種光學顯微鏡之防撞系統,利用影像清晰度之門檻值,判斷停止物鏡繼續接近待測物之功能,避免物鏡直接碰觸待測物導致物鏡或待測物之損害,有效減低其損害之成本進而提升工作之效率。In view of the above-mentioned problems of the prior art, one of the purposes of the present invention is to provide an anti-collision system for an optical microscope, using the threshold of image sharpness to judge the function of stopping the objective lens to continue to approach the object to be tested, and avoiding direct contact of the objective lens. The object to be tested causes damage to the objective lens or the object to be tested, effectively reducing the cost of the damage and improving the efficiency of the work.
基於上述目的,本創作係提供一種光學顯微鏡之防撞系統,其包含一光學顯微鏡以及一影像處理裝置。光學顯微鏡具有支柱部、至少一物鏡與基座,支柱部之內部具有控制單元以及馬達,控制單元係控制馬達移動至少一物鏡以及影像處理裝置,包括顯示器以及防撞判斷單元,影像處理裝置係與光學顯微鏡連接,透由顯示器顯示至少一物鏡拍攝基座上之待測物之影像,在馬達調整至少一物鏡接近待測物的過程中,防撞判斷單元根據影像之一清晰度的變化判斷是否停止馬達驅動至少一物鏡往待測物移動。Based on the above objects, the present invention provides an anti-collision system for an optical microscope, which comprises an optical microscope and an image processing device. The optical microscope has a pillar portion, at least one objective lens and a base, the pillar portion has a control unit and a motor therein, and the control unit controls the motor to move at least one objective lens and the image processing device, including the display and the collision avoidance determining unit, and the image processing device is The optical microscope is connected to the image of the object to be tested on the pedestal by at least one objective lens. When the motor adjusts at least one objective lens to approach the object to be tested, the collision avoidance determining unit determines whether the brightness of the image is changed according to one of the images. The stop motor drives at least one objective lens to move toward the object to be tested.
較佳地,至少一物鏡的數量為複數個,而複數個物鏡具有不同的倍率,且不同的倍率之物鏡係對應不同解析度之範圍。Preferably, the number of at least one objective lens is plural, and the plurality of objective lenses have different magnifications, and the objective lenses of different magnifications correspond to different resolution ranges.
較佳地,防撞判斷單元係對應至少一物鏡預設儲存一門檻值,當影像之清晰度從一最大值下降超出門檻值時,防撞判斷單元傳送一指令至控制單元,用以停止馬達移動至少一物鏡。Preferably, the anti-collision determining unit stores a threshold value corresponding to at least one objective lens. When the resolution of the image falls from a maximum value beyond the threshold value, the anti-collision determining unit transmits an instruction to the control unit to stop the motor. Move at least one objective lens.
較佳地,影像之清晰度係包含影像之銳利度或邊緣值。Preferably, the sharpness of the image includes the sharpness or edge value of the image.
較佳地,銳利度或邊緣值係與門檻值相關。Preferably, the sharpness or edge value is related to the threshold value.
較佳地,控制單元具有一數位化控制介面,並透由顯示器顯示數位化控制介面,透由數位化控制介面操作馬達與影像處理裝置,且當防撞判斷單元判斷停止至少一物鏡往待測物移動時,防撞判斷單元係產生一警示訊號顯示於數位化控制介面。Preferably, the control unit has a digital control interface, and displays the digital control interface through the display, and operates the motor and the image processing device through the digital control interface, and when the collision avoidance determination unit determines to stop at least one objective lens to be tested When the object moves, the collision avoidance determining unit generates a warning signal to be displayed on the digital control interface.
較佳地,支柱部與至少一物鏡之間係設置轉盤,轉盤之頂部具有樞軸係連接支柱部,以使至少一物鏡透由轉盤相對於支柱部轉動。Preferably, a turntable is disposed between the pillar portion and the at least one objective lens, and the top of the turntable has a pivotal connection pillar portion so that at least one objective lens is rotated by the turntable relative to the pillar portion.
較佳地,基座上具有調整方位之裝置,以利基座上之待測物相對於至少一物鏡橫向、縱向與樞轉之移動。Preferably, the base has means for adjusting the orientation to facilitate lateral, longitudinal and pivotal movement of the test object on the base relative to the at least one objective lens.
較佳地,支柱部表面具有複數個旋鈕,透由數位化控制介面切換成手動模式,用以轉動複數個旋鈕,調整至少一物鏡相對於基座之距離。Preferably, the surface of the pillar portion has a plurality of knobs, and the digital control interface is switched to a manual mode for rotating a plurality of knobs to adjust the distance of at least one objective lens relative to the base.
較佳地,光學顯微鏡之手動模式下,當防撞判斷單元判斷停止至少一物鏡往待測物移動時,防撞判斷單元係產生一警示訊號顯示於數位化控制介面。Preferably, in the manual mode of the optical microscope, when the collision avoidance determining unit determines to stop moving at least one objective lens to the object to be tested, the collision avoidance determining unit generates a warning signal to be displayed on the digital control interface.
承上所述,本創作之一種光學顯微鏡之防撞系統,可具有一或多個下述優點:As mentioned above, an optical microscope collision avoidance system of the present invention may have one or more of the following advantages:
(1) 利用影像清晰度之門檻值範圍,判斷停止物鏡繼續接近待測物之功能,避免物鏡直接碰觸待測物導致物鏡或待測物之損害。(1) Using the threshold range of image sharpness, judge the function of stopping the objective lens to continue to approach the object to be tested, and avoid the damage of the objective lens or the object to be tested by directly touching the object to be tested.
(2)光學顯微鏡不須安裝額外的感測器便可實現防撞功能,所以不會增加成本。(2) The optical microscope can realize the anti-collision function without installing an additional sensor, so there is no increase in cost.
(3) 使用者可以透由數位化控制介面切換成手動模式,利用粗調旋鈕與細調旋鈕調整物鏡相對於待測物之距離,並透由警示訊號提示使用者停止轉動複數個旋鈕,避免物鏡直接碰觸待測物。(3) The user can switch to the manual mode through the digital control interface, and use the coarse adjustment knob and the fine adjustment knob to adjust the distance of the objective lens relative to the object to be tested, and the warning signal prompts the user to stop turning the plurality of knobs to avoid The objective lens directly touches the object to be tested.
為利 貴審查員瞭解本創作之技術特徵、內容與優點及其所能達成之功效,茲將本創作配合附圖,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明之用,未必為本創作實施後之真實比例與精準配置,故不應就所附之圖式的比例與配置關係解讀、侷限本創作於實際實施上的權利範圍,合先敘明。In order to understand the technical characteristics, content and advantages of the creation and the effects that can be achieved by the examiner, the author will use the drawings in detail and explain the following in the form of the examples, and the drawings used therein The subject matter is only for the purpose of illustration and supplementary explanation. It is not necessarily the true proportion and precise configuration after the implementation of the original creation. Therefore, the scope and configuration relationship of the attached drawings should not be interpreted or limited. First described.
以下將參考相關圖式,說明本創作之光學顯微鏡之防撞系統,為使便於理解,下述實施例中相同元件係以相同之符號標示來說明。The collision avoidance system of the optical microscope of the present invention will be described below with reference to the related drawings. For ease of understanding, the same components in the following embodiments are denoted by the same reference numerals.
請參閱第1圖,其係為本創作之實施例之光學顯微鏡之防撞系統之示意圖。在第1圖中,光學顯微鏡10具有支柱部101、轉盤102、至少一物鏡103與基座105。當物鏡103的數量為複數個時,可具有不同的倍率,而不同的倍率之物鏡對應不同的解析度範圍。Please refer to FIG. 1 , which is a schematic diagram of an anti-collision system for an optical microscope according to an embodiment of the present invention. In Fig. 1, the optical microscope 10 has a pillar portion 101, a turntable 102, at least one objective lens 103, and a susceptor 105. When the number of the objective lenses 103 is plural, they may have different magnifications, and the objective lenses of different magnifications correspond to different resolution ranges.
支柱部101的內部具有控制單元以及馬達,控制單元係可控制馬達移動物鏡103接近或遠離待測物12,轉盤102係設置在支柱部101與物鏡103之間,此轉盤102的頂部具有一樞軸係連接著支柱部101,以使物鏡103可透由轉盤102相對於支柱部101轉動,且轉盤102上具有不同倍率之物鏡103,使用者可依其需求透由轉動此轉盤102,以利切換不同倍率之物鏡103。The inside of the pillar portion 101 has a control unit and a motor. The control unit can control the motor to move the objective lens 103 to approach or away from the object to be tested 12. The turntable 102 is disposed between the pillar portion 101 and the objective lens 103. The top of the turntable 102 has a pivot. The shaft system is connected to the pillar portion 101 so that the objective lens 103 can be rotated by the turntable 102 relative to the pillar portion 101, and the turntable 102 has the objective lens 103 of different magnifications, and the user can rotate the turntable 102 according to the needs thereof. The objective lens 103 of different magnifications is switched.
基座105則用來置放待測物12。影像處理裝置包括顯示器11以及防撞判斷單元,影像處理裝置係與光學顯微鏡10連接,透由顯示器11顯示物鏡103拍攝基座105上的待測物12之影像,而上述之控制單元具有一數位化控制介面,即透由此顯示器11顯示數位化控制介面,讓使用者透過此數位化控制介面得以輕易的操作本創作之光學顯微鏡之防撞系統。The base 105 is used to place the object to be tested 12. The image processing device includes a display 11 and an anti-collision judging unit. The image processing device is connected to the optical microscope 10, and the objective lens 103 is displayed on the display 11 to capture an image of the object to be tested 12 on the susceptor 105, and the control unit has a digital position. The control interface is displayed through the display 11 to display the digital control interface, so that the user can easily operate the optical microscope collision avoidance system through the digital control interface.
影像處理裝置在馬達調整物鏡103接近待測物12的過程中,防撞判斷單元根據影像之清晰度的變化判斷是否停止馬達驅動物鏡103往待測物12移動,避免物鏡103直接碰觸待測物12。In the process of the motor adjustment objective lens 103 approaching the object to be tested 12, the anti-collision determination unit determines whether to stop the movement of the motor-driven objective lens 103 toward the object to be tested 12 according to the change of the sharpness of the image, so as to prevent the objective lens 103 from directly touching the object to be tested. Matter 12.
請參閱第2圖,其係為本創作之實施例之光學顯微鏡之防撞系統之操作流程圖與實務上拍攝待測物之影像圖,能更進一步的詳細說明其操作流程。如第2圖所示並搭配上述之第1圖,步驟S1,使用者啟用光學顯微鏡10與影像處理裝置,並將待側物12放置於基座105,此時待側物12與物鏡103相隔一適當的距離;步驟S2,使用者透過數位化控制介面選定一特定倍率的物鏡103,並預設其特定倍率物鏡103之影像清晰度相對應之門檻值範圍,其中,影像清晰度係包含影像的銳利度或邊緣值,且銳利度或邊緣值係與門檻值相關。Please refer to FIG. 2 , which is an operation flowchart of an optical microscope anti-collision system according to an embodiment of the present invention, and an image diagram of a subject to be tested, and the operation flow thereof can be further described in detail. As shown in FIG. 2 and in conjunction with FIG. 1 above, in step S1, the user activates the optical microscope 10 and the image processing apparatus, and places the to-be-side object 12 on the base 105, at which time the side object 12 is separated from the objective lens 103. a suitable distance; in step S2, the user selects a target lens 103 of a specific magnification through the digital control interface, and presets a range of threshold values corresponding to the image resolution of the specific magnification objective lens 103, wherein the image sharpness includes the image The sharpness or edge value, and the sharpness or edge value is related to the threshold value.
在步驟S3,可同步參閱實務上拍攝待測物12之實際影像示意圖(如步驟S31至步驟S35),使用者透過數位化控制介面操作馬達,用以驅動物鏡103開始接近待測物12(步驟S31,此時門檻值為3.09),在接近的過程中,顯示器11顯示待測物12的影像會逐漸清晰,對應的門檻值也隨之變大(步驟S32,此時門檻值為3.20),繼續驅動物鏡103接近待測物12,當獲得最大的門檻值時,其對應的影像最為清楚(步驟S33,此時門檻值為5.13),此時若再繼續接近待測物12,其對應的影像會轉為模糊,而門檻值也隨之越來越低(步驟S34至步驟S35),若影像清晰度之門檻值超出預設之範圍(例如門檻值低於3.0),防撞判斷單元則立即判斷停止物鏡103繼續接近待測物12,並傳送指令至控制單元用以停止馬達繼續驅動物鏡103往待測物12移動,且於數位化控制介面上即時顯示警示訊號,以利提醒使用者注意。In step S3, the actual image diagram of the object to be tested 12 can be synchronously taken (steps S31 to S35), and the user operates the motor through the digital control interface to drive the objective lens 103 to start approaching the object to be tested 12 (steps). S31, the threshold value is 3.09 at this time, in the process of approaching, the display 11 displays that the image of the object to be tested 12 is gradually clear, and the corresponding threshold value also becomes larger (step S32, the threshold value is 3.20). Continue to drive the objective lens 103 close to the object to be tested 12. When the maximum threshold value is obtained, the corresponding image is the clearest (step S33, the threshold value is 5.13), and if it continues to approach the object to be tested 12, its corresponding The image will be blurred and the threshold value will be lower and lower (step S34 to step S35). If the threshold of image sharpness exceeds the preset range (for example, the threshold value is lower than 3.0), the collision avoidance judgment unit It is immediately determined that the stopping objective lens 103 continues to approach the object to be tested 12, and transmits a command to the control unit for stopping the motor from continuing to drive the objective lens 103 to move to the object to be tested 12, and displaying an alert signal on the digital control interface to prompt the user. note
此時,使用者可依量測所需,調整物鏡103回復到方才影像最為清楚之位置進行影像擷取之作業或者進行接下來的步驟S4;步驟S4,使用者若需獲得更高的影像清晰度或解析度,可利用數位化控制介面轉動此轉盤102切換更高倍率之物鏡,並重複步驟S2進行接下來的操作流程,以利得到所需的待測物12之影像清晰度。At this time, the user can adjust the objective lens 103 to return to the position where the image is most clear for the image capturing operation or perform the next step S4 according to the measurement; in step S4, the user needs to obtain a higher image clarity. The degree or resolution can be rotated by the digital control interface to switch the objective lens of the higher magnification, and the subsequent operation flow is repeated in step S2 to obtain the desired image sharpness of the object 12 to be tested.
請參閱第3圖,其係為本創作之另一實施例之光學顯微鏡10之示意圖。如第3圖所示,支柱部101表面具有複數個旋鈕104,使用者可以透由數位化控制介面切換成手動模式後,即可手動轉動複數個旋鈕104以及轉盤102,用以調整物鏡103相對於基座105或待測物12之距離與切換不同倍率之物鏡103,並透由警示訊號提示停止轉動複數個旋鈕104,避免物鏡103直接碰觸待測物12。Please refer to FIG. 3, which is a schematic diagram of an optical microscope 10 of another embodiment of the present invention. As shown in FIG. 3, the surface of the pillar portion 101 has a plurality of knobs 104. After the user can switch to the manual mode through the digital control interface, the plurality of knobs 104 and the dial 102 can be manually rotated to adjust the relative orientation of the objective lens 103. The distance between the base 105 and the object to be tested 12 is switched with the objective lens 103 of different magnifications, and the plurality of knobs 104 are stopped by the warning signal to prevent the objective lens 103 from directly touching the object to be tested 12.
此外,複數個旋鈕104至少具有一粗調旋鈕104a與一細調旋鈕104b以利使用者操作上之所需,如粗調旋鈕104a提供物鏡103快速移動至預設之位置,而細調旋鈕104b則提供物鏡103緩慢接近待測物12。基座105可安裝一調整方位之裝置108,以利基座105上的待測物12能相對於物鏡103做橫向與縱向之移動或者是樞轉之轉動,此外,基座105內具有一光源,且基座105之表面為透光之材質,可藉此用以照亮待測物12。In addition, the plurality of knobs 104 have at least one coarse adjustment knob 104a and a fine adjustment knob 104b for user operation, such as the coarse adjustment knob 104a provides the objective lens 103 to quickly move to a preset position, and the fine adjustment knob 104b Then, the objective lens 103 is provided to slowly approach the object to be tested 12. The base 105 can be mounted with a device 108 for adjusting the orientation, so that the object 12 on the base 105 can be moved laterally or longitudinally relative to the objective lens 103 or pivoted. Further, the base 105 has a light source therein. And the surface of the pedestal 105 is a light transmissive material, which can be used to illuminate the object to be tested 12.
本創作之實施例之光學顯微鏡之防撞系統,如第3圖所示,基座105之表面可配置有水平儀106,以確保待測物12是否在平坦的基座105上進行量測。基座105之表面邊緣可具有一固定件107,用以固定待測物12與基座105之相對位置,確保待測物12不因調整其他各部件或外力因素導致其相對位置偏離等問題。In the optical microscope collision avoidance system of the present embodiment, as shown in FIG. 3, the surface of the base 105 may be provided with a level 106 to ensure whether the object 12 is measured on the flat base 105. The surface edge of the base 105 may have a fixing member 107 for fixing the relative position of the object to be tested 12 and the base 105, and ensuring that the object to be tested 12 does not have a relative positional deviation due to adjustment of other components or external force factors.
本創作之光學顯微鏡之防撞系統可應用於產業的範圍廣泛,如半導體產業之製造流程,尤其可應用在半導體產業針對積體電路(IC)尚未封裝前之測試,即為在光學顯微鏡下以探針卡(probe card)對裸晶做初步的功能性測試,此測試流程有利於篩選出不良品並進行後續的作業程序,對半導體產業製造成本影響相當大,而一般晶圓級的探針卡皆屬高單價之產品,藉於此,本創作之光學顯微鏡之防撞系統,有利於此測試流程中如下探針(probe)的過程避免碰撞探針卡,有效減低其損害之成本進而提升產能之效率。The optical microscope anti-collision system of the present invention can be applied to a wide range of industries, such as the manufacturing process of the semiconductor industry, and particularly can be applied to the semiconductor industry before the integrated circuit (IC) is not packaged, that is, under the optical microscope The probe card performs a preliminary functional test on the bare crystal. This test process is useful for screening out defective products and performing subsequent operation procedures, which has a considerable impact on the manufacturing cost of the semiconductor industry, and general wafer level probes. The card is a high unit price product. Therefore, the optical microscope anti-collision system of the present invention facilitates the following probe process in the test process to avoid collision of the probe card, thereby effectively reducing the cost of damage and thereby increasing the cost. Productivity efficiency.
以上所述僅為舉例性,而非為限制性者。任何未脫離本創作之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of this creation shall be included in the scope of the appended patent application.
S1、S2、S3、S4、S31、S32、S33、S34、S35‧‧‧步驟
10‧‧‧光學顯微鏡
101‧‧‧支柱部
102‧‧‧轉盤
103‧‧‧物鏡
104‧‧‧複數個旋鈕
104a‧‧‧粗調旋鈕
104b‧‧‧細調旋鈕
105‧‧‧基座
106‧‧‧水平儀
107‧‧‧固定件
108‧‧‧調整方位之裝置
11‧‧‧顯示器
12‧‧‧待測物S1, S2, S3, S4, S31, S32, S33, S34, S35‧‧ steps
10‧‧‧Light microscope
101‧‧‧ Pillars
102‧‧‧ Turntable
103‧‧‧ Objective lens
104‧‧‧Multiple knobs
104a‧‧‧ coarse adjustment knob
104b‧‧‧ fine adjustment knob
105‧‧‧Base
106‧‧‧ level
107‧‧‧Fixed parts
108‧‧‧Azimuth adjustment device
11‧‧‧ Display
12‧‧‧Test object
第1圖係為本創作之光學顯微鏡之防撞系統之外觀示意圖。The first figure is a schematic view of the appearance of the collision avoidance system of the optical microscope of the present invention.
第2圖係為本創作之光學顯微鏡之防撞系統之操作流程圖與拍攝待測物之影像圖。The second figure is an operation flow chart of the collision avoidance system of the optical microscope of the present invention and an image diagram of the object to be tested.
第3圖係為本創作之光學顯微鏡之防撞系統之光學顯微鏡之示意圖。Figure 3 is a schematic diagram of an optical microscope of the collision avoidance system of the optical microscope of the present invention.
10‧‧‧光學顯微鏡 10‧‧‧Light microscope
101‧‧‧支柱部 101‧‧‧ Pillars
102‧‧‧轉盤 102‧‧‧ Turntable
103‧‧‧物鏡 103‧‧‧ Objective lens
105‧‧‧基座 105‧‧‧Base
11‧‧‧顯示器 11‧‧‧ Display
12‧‧‧待測物 12‧‧‧Test object
Claims (10)
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TW105219673U TWM539057U (en) | 2016-12-23 | 2016-12-23 | Anti-collision system of optical microscope |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI674437B (en) * | 2018-03-28 | 2019-10-11 | 浮雕精密有限公司 | Microscope collision avoidance architecture |
TWI735144B (en) * | 2019-01-29 | 2021-08-01 | 美商豐菲克特公司 | Microscopes with objective assembly crash detection and methods of utilizing the same |
-
2016
- 2016-12-23 TW TW105219673U patent/TWM539057U/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI674437B (en) * | 2018-03-28 | 2019-10-11 | 浮雕精密有限公司 | Microscope collision avoidance architecture |
TWI735144B (en) * | 2019-01-29 | 2021-08-01 | 美商豐菲克特公司 | Microscopes with objective assembly crash detection and methods of utilizing the same |
US11454799B2 (en) | 2019-01-29 | 2022-09-27 | Formfactor, Inc. | Microscopes with objective assembly crash detection and methods of utiliizing the same |
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