TWM536751U - Automatic guiding education system of array probes - Google Patents

Description

Array probe automatic guidance education system

This creation is about an array probe automatic guidance education system, and in particular, a device for automatically adjusting the probe and the part to be tested.

Electromagnetic inductive touchpad. Panels are widely used in various types of displays, handheld communication devices or various types of smart devices. However, the panel needs to be tested at least once in the process to confirm whether the panel is damaged.

The existing panel detecting method is to manually align the array probe to the transistor of the panel to be tested, and then contact the transistor with the probe to perform the procedure of detecting the panel.

As mentioned above, there are still some shortcomings in the panel detection method. Because the area of the transistor is very small, the staff should observe the relative position of the probe and the transistor with a high power microscope, whether there is proper contact, and timely adjustment. The position of the needle relative to the transistor.

In summary, the existing panel detection method requires manual adjustment of the position between the probe and the transistor, so that a long working time is required for adjustment, so if a large number of panel inspections are performed and there are many types of panels, The consumption of labor and labor is invisibly increased. For manufacturers, the cost is also invisibly increased. Therefore, there is room for discussion on how to improve the existing panel inspection methods and reduce costs.

The present invention provides an array probe automatic guiding education system, which utilizes automatic detection of the position of the portion to be tested and the probe, and adjusts the position of both the portion to be tested and the probe, thereby shortening the working hours, thereby reducing the cost and The effect of accurate detection.

The present invention provides an array probe automatic guiding education system, which comprises: a multi-axial displacement module; a probe module is disposed on the multi-axis displacement module, the probe module has a plurality of a monitoring module; the monitoring visual module is disposed in the multi-axial displacement module, and a control module, wherein the signal is connected to the multi-axial displacement module, the monitoring visual module and the probe a needle module; wherein the multi-axis displacement module moves the probe module to an object to be tested, the object to be tested has a plurality of parts to be tested; and the monitoring visual module captures the The probe image information of the probes is such that the control module calculates the first horizontal coordinate value of the first coordinate system; the monitoring visual module captures the image information of the to-be-tested part to be tested, so that The control module calculates a second horizontal coordinate value of the second standard system; the control module calculates the first horizontal coordinate value and the second according to the first horizontal coordinate value and the second horizontal coordinate value seat The offset of the horizontal coordinate value seat, if the offset is generated, adjust the horizontal position of the probe module After the horizontal position of the probe module meets the horizontal position of the portion to be tested, the probe module is vertically moved and monitored by the monitoring visual module; when the probes are horizontally slipped The probe module stops moving, and determines that the probe has contacted the parts to be tested, and the vertical coordinate value of the first coordinate system relative to the second coordinate system is obtained.

In an embodiment, an angle adjustment module is provided in the probe Between the needle module and the multi-axis displacement module, the angle adjustment module is connected to the control module, and the angle adjustment module moves the probe module at an angle.

In one embodiment, the multi-axis displacement module has a first axial unit, a second axial unit and a third axial unit, and the second axial unit is disposed on the first axial unit. The triaxial unit is disposed on the second axial unit, and the probe module is disposed on the third axial unit.

In one embodiment, at least one positioning vision module is disposed between the multi-axis displacement module and the probe module, and the positioning vision module is connected to the control module by a signal; The monitoring visual unit has a visual unit and a displacement unit, and the displacement unit is disposed on the multi-axial displacement module, and the visual unit is disposed in the displacement unit.

The present invention provides an array probe automatic guiding education system, which comprises: an angle adjustment module; a probe module, which is disposed in the angle adjustment module, the probe module has a plurality of probes; a monitoring visual module adjacent to the probe module; and a control module coupled to the angle adjustment module, the monitoring visual module and the probe module; wherein The probe module is located above an object to be tested, and the object to be tested has a plurality of parts to be tested; the monitoring visual module extracts probe image information of the probes to enable the control module to calculate a first horizontal coordinate value of the first coordinate system; the monitoring visual module extracts image information of the to-be-tested part to be tested, so that the control module calculates a second horizontal coordinate value of the second coordinate system The control module calculates an offset between the first horizontal coordinate value and the second horizontal coordinate value according to the first horizontal coordinate value and the second horizontal coordinate value, and if the offset is generated, Tune The horizontal position of the probe module is such that the horizontal position of the probe module conforms to the horizontal position of the portion to be tested, and the angle adjustment module moves the probe module at an angle.

Based on the above, the author performs the position correction of the probe module in an automated manner, thereby saving a lot of labor and shortening the working hours, thereby reducing the cost and accurate detection.

10‧‧‧Abutment

11‧‧‧Longmen

12‧‧‧Test object

120‧‧‧The part to be tested

13‧‧‧Multi-axial displacement module

130‧‧‧First axial unit

131‧‧‧Second axial unit

132‧‧‧3rd axial unit

14‧‧‧ Probe Module

140‧‧‧Probe

15‧‧‧Monitor visual module

150‧‧ visual unit

151‧‧‧displacement unit

16‧‧‧Angle adjustment module

17‧‧‧ Positioning Vision Module

18‧‧‧Control Module

S1~S4‧‧‧ steps

The first picture is a schematic diagram of an array of probe automatic guidance education system.

Figure 2 is a partial schematic view of an array probe automatic guidance education system of the present invention.

Figure 3 is a schematic diagram of a plurality of probes and a plurality of parts to be tested.

Figure 4 is another schematic diagram of a plurality of probes and a plurality of parts to be tested.

Figure 5 is a flow chart of the method for automatically guiding education of an array probe.

The embodiments of the present invention are described below by way of specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present invention by the contents disclosed in the present specification.

Please refer to FIG. 1 , which is an array probe automatic guiding education system, which comprises a base 10 , a gantry 11 , at least one multi-axial displacement module 13 , and at least one probe module 14 . At least one monitoring visual module 15, at least one angle adjusting module 16, at least one positioning visual module 17 and a control module 18.

The top end of the base 10 carries a test object 12. Please refer to Figure 3 As shown, the analyte 12 has a plurality of locations 120 to be tested. For example, the object to be tested 12 can be a panel. The portion to be tested 120 can be a transistor.

The gantry 11 is disposed on one side of the base 10, and the gantry 11 is capable of axial movement relative to the base 10. Alternatively, the base 10 can be moved axially relative to the gantry 11.

The multi-axial displacement module 13 is disposed on the gantry 11 , and each of the multi-axial displacement modules 13 is disposed at the gantry 11 at an equal distance. The multi-axial displacement module 13 has a first axial unit 130, a second axial unit 131 and a third axial unit 132. The first axial unit 130 is coupled to the gantry 11 to provide a first axial movement. The second axial unit 131 is disposed on the first axial unit 130, and the second axial unit 131 provides a second axial movement. The third axial unit 132 is disposed on the second axial unit 131, and the third axial unit 132 provides a third axial movement.

Each angle adjustment module 16 is disposed in each of the third axial units 132. The angle adjustment module 16 provides an angular movement.

Each monitoring visual module 15 is disposed in each of the multi-axial displacement modules 13 . Each monitoring visual unit 15 has a visual unit 150 and a displacement unit 151. The displacement unit 151 is disposed in the first axial unit 130. The vision unit 150 is provided in the displacement unit 151.

Each probe module 14 is provided in each angle adjustment module 16 . Referring to FIG. 2, each probe module 14 has a plurality of probes 140.

The positioning vision module 17 is disposed on the multi-axial displacement module 13 at both ends of the gantry 11. As further discussed, the positioning vision module 17 is disposed in the first axial module 130.

The control module 18 is connected to the multi-axis displacement module 13, the probe module 14, the monitoring visual module 15, the angle adjustment module 16, and the positioning vision module 17.

Please refer to Figure 4 for reference. This author is applied to an automatic guidance education method for array probe modules. The steps include: Please refer to Figure 1 and Figure 2. In step S1, a test object 12 is located. At least one positioning visual module 17 captures the image information of the object to be tested 12 and transmits it to the control module 18 to cause the control module 18 to perform a positioning process. After the positioning process is completed, the process proceeds to step S2. For example, in the embodiment, the positioning visual module 17 located at the two ends of the gantry 11 captures the image information of the object to be tested 12 and transmits the image information to the control module 18, so that the control module 18 performs a positioning process. The object to be tested 12 is allowed to enter the field of view of the visual unit 150. However, in the actual test, at least one positioning visual module 17 captures the image information of the object to be tested 12, so that the control module 18 performs the positioning process.

In step S2, a first coordinate system and a second coordinate system are obtained. The control module 18 controls the multi-axis displacement module 13 according to the image information of step S1 to move the probe module 14 above the object to be tested 12. For example, the first axial unit 130 provides a first axial movement, the second axial unit 131 provides a second axial movement, and the third axial unit 132 provides a third axial movement. The first axial movement to the third axial movement causes the probe module 14 to approach the portion to be tested 120 of the object 12 to be tested. In the actual case, the first axial movement, the second axial movement and the third axial movement are selectively performed, and the non-first axial movement to the third axial movement is required. For example, the first axial movement can be an X-axis movement. The second axial movement can be a Y-axis movement. The third axial movement can be a Z-axis movement or a vertical movement.

If further illustrated, as shown in FIG. 3, the monitoring visual module 15 captures the probe image information of the probe 140 and transmits the probe image information to the control module 18 to cause the control module 18 to calculate. The first horizontal coordinate value of the first coordinate system is obtained; the monitoring visual module 15 captures the image information to be tested of the to-be-tested parts 120, and transmits the image information to be tested to the control module 18 to make the control mode Group 18 calculates the second horizontal coordinate value of the second coordinate system.

For example, the visual unit 150 captures the probe image information or the image information to be tested, and the control module 18 determines whether to adjust the position of the visual unit 150 according to the probe image information or the image information to be tested. At the position of the unit 150, the control module 18 controls the displacement unit 151 to cause the displacement unit 151 to adjust the position of the visual unit 150.

Since the probes 140 are plural, the probes 140 are the first probes 140 to the Nth probes 140, and N is a constant, and the motion module 150 is moved to capture the first probes 140. The first tip image information of the tip of the needle. The vision unit 150 is moved to capture the Nth tip image information of the tip of the Nth probe 140. Calculating the horizontal coordinate value of a probe coordinate system according to the first tip image information and the Nth tip image information, and controlling the position of the multi-axis displacement module 13 with the control module 18, the probe coordinate system Is the first horizontal coordinate value of the first coordinate system.

Similarly, the to-be-tested parts 120 are the first to-be-tested part 120 to the Nth to-be-tested part 120, and the monitoring visual module 15 avoids the needle tip of the first probe 140. The multi-axis displacement module 13 causes the probe module 14 to leave the field of view of the monitoring visual module 15 to capture the first image information to be tested of the first portion to be tested 120, and monitor the visual module 15 Avoiding the N-tip of the N-th probe 140 to capture the Nth image to be tested of the Nth portion to be tested 120, according to the first image information to be tested and the information of the Nth image to be tested, and matching the control mode The group 18 controls the position of the multi-axial displacement module 13, and causes the control module 18 to calculate the horizontal coordinate value of the coordinate system of the part to be tested, and the coordinate of the part to be tested is the second horizontal coordinate value of the second coordinate system. .

In step S3, it is determined whether the probe module 14 needs to adjust the position relative to the object to be tested 12. The control module 18 calculates the offset between the first horizontal coordinate value and the second horizontal coordinate value according to the first horizontal coordinate value of the first coordinate system and the second horizontal coordinate value of the second coordinate system, if any When the offset is generated, the position of the probe module 14 is adjusted so that the horizontal position of the probe module 14 conforms to the horizontal position of the portion to be tested 120.

For example, if an offset is generated, the offset is an angular deviation, and the angle adjustment module 16 provides an angular movement even if the probe module 14 is rotated by an angle. If the offset is a horizontal offset, that is, a first axial or second axial offset, the multi-axial displacement module 13 provides a first axial movement or a second axial movement, and the probe mode is The group 14 is moved and the probe 140 is positioned above the site to be tested 120.

Please refer to FIG. 4, step S4, to obtain the vertical coordinate value of the first coordinate system relative to the second coordinate system. The probe module 14 is vertically moved and monitored by the monitoring visual module 15. When the probe 140 is horizontally slipped, the probe module 14 stops moving, and it is judged that the probe 14 has contacted the portion to be tested 120, and The vertical coordinate value of the first coordinate system relative to the second coordinate system is obtained.

For example, the multi-axial displacement module 13 is such that the probe module 14 is vertical. The monitoring module 15 monitors the probe 140. When the control module 18 detects that the probe 140 has a horizontal slip in the probe image information captured by the monitoring visual module 15, the control module 18 The multi-axial displacement module 13 is stopped, and the probe module 14 is stopped. At this time, it can be judged that the probe 14 has contacted the portion to be tested 120. The control module 18 is vertically moved by the probe module 14 to calculate the vertical coordinate value of the first coordinate system relative to the second coordinate system.

As described above, the author uses the monitoring visual module 15 to capture the probe image information, the image information of the portion to be tested, and the image information of the probe 140 to generate horizontal slip, so that the control module 18 calculates the first level. The coordinate value, the second horizontal coordinate value, the offset and the vertical coordinate value, thereby adjusting the relative positions of the probe 140 of the probe module 14 and the portion to be tested 120, and ensuring that the probe 140 is in contact with the portion to be tested. 120, and the probe 140 can perform a detection procedure on the site to be tested 120.

Since the creation of the probe module 14 is performed in an automated manner, it is possible to save a lot of labor and shorten the working hours, thereby reducing the cost and accurate detection.

In summary, although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any person having ordinary knowledge in the technical field can make some changes without departing from the spirit and scope of the present invention. Changes and refinements, the scope of protection of this creation is subject to the definition of the scope of the patent application attached.

10‧‧‧Abutment

11‧‧‧Longmen

12‧‧‧Test object

13‧‧‧Multi-axial displacement module

130‧‧‧First axial unit

131‧‧‧Second axial unit

132‧‧‧3rd axial unit

14‧‧‧ Probe Module

15‧‧‧Monitor visual module

150‧‧ visual unit

151‧‧‧displacement unit

16‧‧‧Angle adjustment module

17‧‧‧ Positioning Vision Module

18‧‧‧Control Module

Claims (7)

An array probe automatic guiding education system comprises: a multi-axial displacement module; a probe module is disposed on the multi-axis displacement module, the probe module has a plurality of probes a monitoring visual module, which is disposed in the multi-axis displacement module, and a control module, wherein the signal is connected to the multi-axis displacement module, the monitoring visual module and the probe module Wherein the multi-axial displacement module moves the probe module to an object to be tested, the object to be tested has a plurality of parts to be tested; and the monitoring visual module captures the probes The probe image information is such that the control module calculates the first horizontal coordinate value of the first coordinate system; the monitoring visual module captures the image information of the to-be-tested part to be tested, so that the control mode The group calculates a second horizontal coordinate value of the second standard system; the control module calculates the first horizontal coordinate value and the second horizontal coordinate value according to the first horizontal coordinate value and the second horizontal coordinate value seat The offset of the seat, if the offset is generated, adjust the horizontal position of the probe module to make the After the horizontal position of the needle module meets the horizontal position of the part to be tested, the probe module is vertically moved and monitored by the monitoring visual module; when the probes are horizontally slipped, the probe mode The group stops moving and judges that the probe has contacted the parts to be tested, and the vertical coordinate value of the first coordinate system relative to the second coordinate system is obtained. For example, the array probe automatic guiding education system described in claim 1 has an angle adjustment module, and the angle adjustment module is disposed in the probe module and the multi-axis displacement module. The angle adjustment module is connected to the control module, and the angle adjustment module is configured to enable the probe The module performs an angular movement, and the multi-axial displacement module is disposed in a gantry. The array probe automatic guiding education system of claim 1, wherein the multi-axis displacement module has a first axial unit, a second axial unit and a third axial unit, The second axial unit is disposed on the first axial unit, the three axial unit is disposed on the second axial unit, and the probe module is disposed on the third axial unit, the multiaxial displacement The module is located in a gantry. The array probe automatic guidance education system of claim 1, further comprising at least one positioning vision module, wherein the positioning vision module is disposed on the multi-axis displacement module and the probe module The positioning visual module is connected to the control module; the monitoring visual unit has a visual unit and a displacement unit, and the displacement unit is disposed on the multi-axis displacement module, and the visual unit is The displacement unit, the multi-axial displacement module is disposed on a gantry. An array probe automatic guiding education system includes: an angle adjustment module; a probe module is disposed in the angle adjustment module, the probe module has a plurality of probes; a vision module adjacent to the probe module; and a control module coupled to the angle adjustment module, the monitoring vision module and the probe module; wherein the probe module The group is located above an object to be tested, and the object to be tested has a plurality of parts to be tested; the monitoring visual module extracts probe image information of the probes, so that the control module calculates the first a first horizontal coordinate value of the coordinate system; the monitoring visual module extracts image information of the to-be-tested part to be tested, so that the control module calculates a second horizontal coordinate value of the second coordinate system; the control The module calculates the first horizontal coordinate value and the second horizontal coordinate value according to the value And offsetting the first horizontal coordinate value from the second horizontal coordinate value, if the offset is generated, adjusting a horizontal position of the probe module, so that the horizontal position of the probe module conforms to the waiting The horizontal position of the measuring portion, the angle adjusting module moves the probe module at an angle. The array probe automatic guiding education system according to claim 5, further comprising a plurality of axial displacement modules, wherein the multi-axial displacement module is connected to the control module, the multi-axial displacement The module has a first axial unit, a second axial unit and a third axial unit. The second axial unit is disposed on the first axial unit, and the three axial unit is disposed on the first axial unit. The two-axis unit is disposed on the third axial unit, and the multi-axial displacement module is disposed on a gantry. The array probe automatic guidance education system of claim 5, further comprising at least one positioning vision module, wherein the positioning vision module is disposed in the multi-axis displacement module, the positioning vision module The monitoring signal is connected to the control module; the monitoring visual unit has a visual unit and a displacement unit, and the displacement unit is disposed on the multi-axis displacement module, and the visual unit is disposed on the displacement unit, the multi-axis The displacement module is located in a gantry.