TWM509223U - Electro-deposition equipment, holding device and spring type holding mechanism thereof - Google Patents

Electro-deposition equipment, holding device and spring type holding mechanism thereof Download PDF

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Publication number
TWM509223U
TWM509223U TW104205382U TW104205382U TWM509223U TW M509223 U TWM509223 U TW M509223U TW 104205382 U TW104205382 U TW 104205382U TW 104205382 U TW104205382 U TW 104205382U TW M509223 U TWM509223 U TW M509223U
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Taiwan
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limiting
accommodating cavity
spring
positioning member
base
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TW104205382U
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Chinese (zh)
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Zhi-Wei Lin
Guan-Jie Huang
rui-ying Zhang
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G Tech Optoelectronics Corp
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Priority to TW104205382U priority Critical patent/TWM509223U/en
Publication of TWM509223U publication Critical patent/TWM509223U/en

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Description

電沉積設備、固持裝置及其彈簧式固持機構Electrodeposition device, holding device and spring type holding mechanism thereof

本創作有關一種用於固持基材的機構件,尤指一種在鍍膜程序中對待加工物件起到固持作用的彈簧式固持機構、具有此彈簧式固持機構的固持裝置以及應用此固持裝置的電沉積設備。The present invention relates to a machine component for holding a substrate, in particular to a spring-type holding mechanism for holding a workpiece to be processed in a coating process, a holding device having the spring-type holding mechanism, and electrodeposition using the same device.

眾所周知,“電鍍(electroplating)”乃是一種利用電解還原反應在物體上鍍一層膜的方法,其所使用之製程設備依所需鍍層(如鍍鎳、鍍銀、鍍錫鉛等)不同而有所差異,而無論使用何種形式的製程設備,於各電鍍區內都需要設置一個固定裝置,用於將待電鍍工件予以固定,使其在鍍膜過程中保持定位位置不變,以利在待電鍍工件之表面鍍覆金屬鍍層。As is well known, "electroplating" is a method of plating a film on an object by an electrolytic reduction reaction, and the process equipment used is different depending on the desired plating (such as nickel plating, silver plating, tin plating, etc.). Regardless of the type of process equipment used, no fixed device is required in each plating zone to fix the workpiece to be plated, so that the positioning position remains unchanged during the coating process. The surface of the plated workpiece is plated with a metal coating.

惟,習知之電鍍用固定裝置主要藉由數量不等的膠體結構以固持待電鍍工件,而待電鍍工件在高溫環境下,其因為膨脹係數的關係會產生彎曲形變,導致一部分的膠體結構無法與待電鍍工件有效黏結,使待電鍍工件掉落;更嚴重時,有可能發生破片之情形。However, the conventional electroplating fixing device mainly uses a colloidal structure of different amounts to hold the workpiece to be electroplated, and in the high temperature environment, the workpiece to be electroplated may be bent and deformed due to the expansion coefficient, so that a part of the colloidal structure cannot be combined with The workpiece to be electroplated is effectively bonded, so that the workpiece to be electroplated is dropped; in a more serious case, the fragmentation may occur.

本創作之其一目的在於提供一種結構新穎的彈簧式固持機構及採用此彈簧式固持機構之固持裝置,所述固持裝置可提供較佳的固持靈活性,使待加工物件不會受到高溫加熱的影響。One of the objects of the present invention is to provide a novel spring-type holding mechanism and a holding device using the same, which can provide better holding flexibility, so that the object to be processed is not heated by high temperature. influences.

為達前揭目的,本創作採用以下技術方案:一種彈簧式固持機構,適於固持一待加工物件,該彈簧式固持機構包括:一基座、一支撐定位件、一彈性件及一限位組件。其中,該基座具有一第一面及一相對於該第一面的第二面;該支撐定位件設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部;該彈性件設置於該基座的內部,該彈性件環繞於該軸部且與該承接部保持彈性接觸;該限位組件與該軸部相接,用以限制該支撐定位件的位置。In order to achieve the goal, the present invention adopts the following technical solution: a spring-type holding mechanism for holding a workpiece to be processed, the spring-type holding mechanism comprises: a base, a supporting positioning member, an elastic member and a limit Component. The base has a first surface and a second surface opposite to the first surface; the support positioning member is disposed on the base, the support positioning member has a receiving portion and a extending portion of the receiving portion a shaft portion; the elastic member is disposed inside the base, the elastic member surrounds the shaft portion and maintains elastic contact with the receiving portion; the limiting assembly is coupled to the shaft portion for limiting the support positioning The location of the piece.

基於上述的彈簧式固持機構,本創作進一步提供一種固持裝置,適於將至少一待加工物件固定於一鍍膜腔室內,該固持裝置包括:一承載單元及複數個彈簧式固持機構。其中,該些彈簧式固持機構設置於該承載單元上,其中該些彈簧式固持機構各包括一基座、一支撐定位件、一彈性件及一限位組件;該基座具有一第一面及一相對於該第一面的第二面;該支撐定位件設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部,其中該承接部位於該第一面上方,且該軸部的其中一部分突伸出該第二面;該彈性件設置於該基座的內部,該彈性件環繞於該軸部且與該承接部保持彈性接觸;該限位組件與該軸部相接,用以限制該支撐定位件的位置。Based on the above-mentioned spring-type holding mechanism, the present invention further provides a holding device, which is suitable for fixing at least one object to be processed in a coating chamber, the holding device comprising: a carrying unit and a plurality of spring-type holding mechanisms. The spring-type retaining mechanism is disposed on the carrying unit, wherein the spring-type retaining mechanisms each include a base, a supporting positioning member, an elastic member and a limiting component; the base has a first surface And a second surface opposite to the first surface; the support positioning member is disposed on the base, the support positioning member has a receiving portion and a shaft portion formed by the extending portion, wherein the receiving portion is located Above the first surface, and a portion of the shaft portion protrudes from the second surface; the elastic member is disposed inside the base, the elastic member surrounds the shaft portion and maintains elastic contact with the receiving portion; The limiting component is coupled to the shaft portion for limiting the position of the support positioning member.

基於上述的固持裝置,本創作更進一步提供一種電沉積設備,包括:一鍍膜腔室、一固持裝置及一電鍍裝置。其中,該固持裝置設置於該鍍膜腔室內,用以固持至少一待加工物件,該固持裝置包括一承載單元及複數個設置於該承載單元上的彈簧式固持機構;其中該些彈簧式固持機構各包括一基座、一支撐定位件、一彈性件及一限位組件,該基座具有一第一面及一相對於該第一面的第二面,該支撐定位件設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部,其中該承接部位於該第一面上方,且該軸部的其中一部分突伸出該第二面,該彈性 件設置於該基座的內部,該彈性件環繞於該軸部且與該承接部保持彈性接觸,該限位組件與該軸部相接,用以限制該支撐定位件的位置;該電鍍裝置與該固持裝置相對應設置。Based on the above holding device, the present invention further provides an electrodeposition apparatus comprising: a coating chamber, a holding device, and a plating device. The holding device is disposed in the coating chamber for holding at least one object to be processed, the holding device includes a carrying unit and a plurality of spring-type retaining mechanisms disposed on the carrying unit; wherein the spring-type retaining mechanism Each of the base includes a base, a support positioning member, an elastic member and a limiting component, the base has a first surface and a second surface opposite to the first surface, the support positioning member is disposed on the base The support positioning member has a receiving portion and a shaft portion formed by the extending portion, wherein the receiving portion is located above the first surface, and a part of the shaft portion protrudes from the second surface, elasticity The member is disposed inside the base, the elastic member surrounds the shaft portion and maintains elastic contact with the receiving portion, and the limiting assembly is coupled to the shaft portion for limiting the position of the supporting positioning member; It is provided corresponding to the holding device.

本創作至少具有以下技術效果:本創作之固持裝置易於製作、成本低廉且適用於不同大小尺寸的待加工物件,大幅提升實用性。The present invention has at least the following technical effects: the holding device of the present invention is easy to manufacture, low in cost, and suitable for articles to be processed of different sizes, which greatly improves the practicality.

再者,本創作透過“複數個設置於承載單元上的彈簧式固持機構,其中支撐定位件設置於基座上,彈性件設置於基座內部且與支撐定位件保持彈性接觸,限位組用以限制支撐定位件位置”的設計,可提供較佳的固持靈活性,以防止待電鍍物因受高溫加熱而掉落。Furthermore, the present invention passes through a plurality of spring-type holding mechanisms disposed on the carrying unit, wherein the supporting positioning member is disposed on the base, and the elastic member is disposed inside the base and maintains elastic contact with the supporting positioning member, and the limit group is used. The design to limit the position of the support locator provides better retention flexibility to prevent the object to be electroplated from falling due to high temperature heating.

為使能更進一步瞭解本創作的特徵及技術內容,請參閱以下有關本創作的詳細說明與附圖,然而所附圖式僅提供參考與說明用,並非用來對本創作加以限制者。In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, the drawings are only for reference and description, and are not intended to limit the creation.

E‧‧‧電沉積設備E‧‧‧Electrodeposition equipment

100、100’‧‧‧固持裝置100, 100’‧‧‧ holding device

1‧‧‧承載單元1‧‧‧bearing unit

2、2’‧‧‧彈簧式固持機構2, 2'‧‧ ‧ spring-type retaining mechanism

21‧‧‧基座21‧‧‧Base

211‧‧‧第一面211‧‧‧ first side

212‧‧‧第二面212‧‧‧ second side

213‧‧‧元件配置空間213‧‧‧Component configuration space

2131‧‧‧第一容置腔2131‧‧‧First accommodation cavity

2132‧‧‧第二容置腔2132‧‧‧Second accommodating chamber

d1、d2‧‧‧內徑D1, d2‧‧‧ inside diameter

22‧‧‧支撐定位件22‧‧‧Support positioning parts

221‧‧‧承接部221‧‧‧Acceptance Department

2211‧‧‧主要區域2211‧‧‧Main areas

2212‧‧‧周邊區域2212‧‧‧ surrounding area

2213‧‧‧限位孔2213‧‧‧Limited holes

222‧‧‧軸部222‧‧‧Axis

23‧‧‧彈性件23‧‧‧Flexible parts

24‧‧‧限位組件24‧‧‧Limited components

241‧‧‧限位墊片241‧‧‧ Limit gasket

242‧‧‧鎖固件242‧‧‧Locker

243‧‧‧限位柱243‧‧‧Limited Column

2431‧‧‧大徑部2431‧‧‧Great Path Department

25‧‧‧接著層25‧‧‧Next layer

200‧‧‧鍍膜腔室200‧‧‧ coating chamber

300‧‧‧電鍍裝置300‧‧‧Electroplating unit

C1、C2‧‧‧中心線C1, C2‧‧‧ center line

W‧‧‧待加工物件W‧‧‧Items to be processed

圖1為本創作第一實施例之固持裝置的結構示意圖。FIG. 1 is a schematic structural view of a holding device according to a first embodiment of the present invention.

圖2為本創作第一實施例之彈簧式固持機構的立體分解圖。2 is an exploded perspective view of the spring-type holding mechanism of the first embodiment of the present invention.

圖3A為本創作第一實施例之彈簧式固持機構的使用狀態圖(一)。Fig. 3A is a view showing the use state (1) of the spring type holding mechanism of the first embodiment of the present invention.

圖3B為本創作第一實施例之彈簧式固持機構的使用狀態圖(二)。Fig. 3B is a view showing the use state (2) of the spring type holding mechanism of the first embodiment of the present invention.

圖4為本創作第二實施例之固持裝置的結構示意圖。FIG. 4 is a schematic structural view of a holding device according to a second embodiment of the present invention.

圖5為本創作第二實施例之彈簧式固持機構的立體分解圖。Fig. 5 is an exploded perspective view showing the spring type holding mechanism of the second embodiment of the present invention.

圖6A為本創作第二實施例之彈簧式固持機構的使用狀態圖(一)。Fig. 6A is a view showing a state of use of the spring type holding mechanism of the second embodiment of the present invention.

圖6B為本創作第二實施例之彈簧式固持機構的使用狀態圖(二)。Fig. 6B is a view showing the use state (2) of the spring type holding mechanism of the second embodiment of the present invention.

圖6C為本創作第二實施例之彈簧式固持機構的使用狀態圖(三)。Fig. 6C is a view (3) showing a state of use of the spring type holding mechanism of the second embodiment of the present invention.

圖7為本創作之電沉積設備的結構示意圖。FIG. 7 is a schematic structural view of the electrodeposition apparatus of the present invention.

下文中特舉多個實施例,並配合所附圖式,詳細說明本創作的創新部分以及優點。The various embodiments and advantages of the present invention are described in detail below with reference to the accompanying drawings.

〔第一實施例〕[First Embodiment]

圖1為本創作第一實施例之固持裝置的結構示意圖。如圖所示,本實施例之固持裝置100主要包括一承載單元1及複數個設置於承載單元1上的彈簧式固持機構2。承載單元1可為一承載平台,而該些彈簧式固持機構2設置於承載單元1上,且概呈平均分布。FIG. 1 is a schematic structural view of a holding device according to a first embodiment of the present invention. As shown in the figure, the holding device 100 of the present embodiment mainly includes a carrying unit 1 and a plurality of spring-type holding mechanisms 2 disposed on the carrying unit 1. The carrying unit 1 can be a carrying platform, and the spring-type holding mechanisms 2 are disposed on the carrying unit 1 and are evenly distributed.

須說明的是,本創作第一實施例提供的固持裝置100適用於各類製程腔室,例如,電鍍腔室、電化學拋光腔室、化學機械研磨腔室等;且固持裝置100主要透過“多個彈簧式固持機構2連接一個待加工物件W”的方式對尺寸較大的待加工物件W進行固持,其中待加工物件W可為但不限於玻璃基材或半導體材料之基材。It should be noted that the holding device 100 provided by the first embodiment of the present invention is applicable to various processing chambers, for example, an electroplating chamber, an electrochemical polishing chamber, a chemical mechanical polishing chamber, and the like; and the holding device 100 mainly transmits through The plurality of spring-type holding mechanisms 2 are connected to a workpiece W to be processed to hold the larger-sized object to be processed W, wherein the object to be processed W can be, but not limited to, a substrate of a glass substrate or a semiconductor material.

另外,雖然在圖1所示的固持裝置100中,相對應於一個待加工物件W之彈簧式固持機構2的數量有四個,但是對於本實施例之其他實施態樣,相對應於一個待加工物件W之彈簧式固持機構2的數量可以有四個以上。也就是說,圖1所示的彈簧式固持機構2的數量僅供舉例說明,本創作並不以此為限,彈簧式固持機構2的數量可依待加工物件W的尺寸大小而決定。In addition, although the number of the spring-type holding mechanisms 2 corresponding to one object W to be processed is four in the holding device 100 shown in FIG. 1, for the other embodiments of the present embodiment, one is to be treated. The number of spring-type holding mechanisms 2 of the processed article W may be four or more. That is to say, the number of the spring-type holding mechanism 2 shown in FIG. 1 is for illustrative purposes only, and the present invention is not limited thereto. The number of the spring-type holding mechanisms 2 can be determined according to the size of the workpiece W to be processed.

請一併參閱圖2、圖3A及圖3B,圖2為本創作第一實施例之彈簧式固持機構的立體分解圖,圖3A及圖3B為本創作第一實施 例之彈簧式固持機構的使用狀態圖。在固持裝置100中,該些彈簧式固持機構2的作用在於固持待加工物件W之一側,以對待加工物件W進行約束;每一個彈簧式固持機構2包括一基座21、一支撐定位件22、一彈性件23及一限位組件24。Please refer to FIG. 2, FIG. 3A and FIG. 3B together. FIG. 2 is an exploded perspective view of the spring-type holding mechanism according to the first embodiment of the present invention, and FIG. 3A and FIG. A state diagram of the use of a spring-type holding mechanism. In the holding device 100, the spring-type holding mechanism 2 functions to hold one side of the object to be processed W to restrain the workpiece W to be processed; each spring-type holding mechanism 2 includes a base 21 and a supporting positioning member. 22. An elastic member 23 and a limit assembly 24.

本實施例中,基座21可供上述其餘元件進行組裝,而本創作並不限定其構造型式;支撐定位件22用以承接並使待加工物件W保持在一固定位置,支撐定位件22的其中一部分安裝於基座21上;彈性件23之主要部分安裝於基座21上,並與支撐定位件22保持彈性接觸,如此一來,支撐定位件22便可透過彈性件23的伸張與壓縮行程,對待加工物件W彎曲的形變進行緩衝;限位組件24與支撐定位件22末端相接,用以限制支撐定位件22,使其不致因外力作用而脫離基座21。In this embodiment, the base 21 can be assembled by the remaining components, and the present invention does not limit its configuration; the support positioning member 22 is used to receive and hold the object to be processed W in a fixed position, and supports the positioning member 22. A part of the elastic member 23 is mounted on the base 21 and is in elastic contact with the support positioning member 22, so that the support positioning member 22 can be stretched and compressed by the elastic member 23. The stroke is to buffer the deformation of the workpiece W, and the limiting component 24 is in contact with the end of the supporting positioning member 22 for limiting the supporting positioning member 22 so as not to be separated from the base 21 by an external force.

更進一步來說,基座21具有裸露在外的一第一面211及一相對於第一面211的第二面212,且基座21之內壁面可界定出一第一容置腔2131及一第二容置腔2132,第一和第二容置腔2131、2132呈上下錯位分布且彼此相互連通,第一和第二容置腔2131、2132並構成一元件配置空間213,提供支撐定位件22之主要部分及彈性件23設置。而根據元件的尺寸和定位方式,第一容置腔2131之內徑d1須大於第二容置腔2132之內徑d2。Further, the pedestal 21 has a first surface 211 exposed to the outside and a second surface 212 opposite to the first surface 211, and the inner wall surface of the pedestal 21 defines a first accommodating cavity 2131 and a The second accommodating cavity 2132, the first and second accommodating cavities 2131, 2132 are vertically dislocated and communicate with each other, and the first and second accommodating cavities 2131, 2132 form a component arranging space 213 to provide a supporting locating member. The main part of 22 and the elastic member 23 are provided. The inner diameter d1 of the first accommodating cavity 2131 must be larger than the inner diameter d2 of the second accommodating cavity 2132 according to the size and positioning of the component.

附帶一提,為將支撐定位件22、彈性件23及限位組件24予以直接安裝,基座21之第一面211設有一連通第一容置腔2131的第一開口(圖中未標示),且基座21之第二面212設有一連通第二容置腔2132的第二開口(圖中未標示)。In addition, the first surface 211 of the base 21 is provided with a first opening that communicates with the first accommodating cavity 2131 (not shown). The second surface 212 of the base 21 is provided with a second opening (not shown) that communicates with the second receiving cavity 2132.

支撐定位件22可用金屬製成,例如,支撐定位件22可為一鋁件。支撐定位件22具有一承接部221及一由承接部221延伸所形成的軸部222,在結構設計上,承接部221為具圓周之圓形板狀,而軸部222為圓柱狀。其中,承接部221本身可定義出一主要區域2211及一環繞主要區域2211的周邊區域2212,軸部222 為主要區域2211中央處、並沿基座21之第一面211往第二面222的方向延伸所形成。而當支撐定位件22組裝完成時,承接部221會在第一面211上方,且軸部222會沿著第一面211往第二面212的方向延伸。The support locating member 22 can be made of metal. For example, the support locating member 22 can be an aluminum member. The support positioning member 22 has a receiving portion 221 and a shaft portion 222 formed by the extending portion 221. The structural portion is designed to have a circular circular plate shape and the shaft portion 222 has a cylindrical shape. The receiving portion 221 itself defines a main area 2211 and a peripheral area 2212 surrounding the main area 2211. The shaft portion 222 It is formed at the center of the main region 2211 and extends along the first surface 211 of the susceptor 21 in the direction of the second surface 222. When the support positioning member 22 is assembled, the receiving portion 221 is above the first surface 211, and the shaft portion 222 extends along the first surface 211 toward the second surface 212.

彈性件23可為一壓縮彈簧,彈性件23套設在支撐定位件22之軸部222上,彈性件23之一端固接於第二容置腔2132底面,且另一端與承接部221保持彈性接觸。限位組件24與支撐定位件22之軸部222相互組接,限位組件24主要包括一限位墊片241及一鎖固件242;安裝時,可先以限位墊片241抵接軸部222末端,然後再以鎖固件242穿過限位墊片241而鎖入軸部222,其中鎖固件242可為螺絲。據此,限位墊片241能與支撐定位件22及彈性件23共同作動。The elastic member 23 can be a compression spring. The elastic member 23 is sleeved on the shaft portion 222 of the support locating member 22. One end of the elastic member 23 is fixed to the bottom surface of the second accommodating chamber 2132, and the other end is elastic with the receiving portion 221 contact. The limiting component 24 is coupled to the shaft portion 222 of the supporting locating member 22. The limiting component 24 mainly includes a limiting spacer 241 and a locking member 242. When the mounting member is used, the limiting portion 241 can be used to abut the shaft portion. The end of 222 is then locked into the shaft portion 222 by the fastener 242 passing through the limit spacer 241, wherein the lock 242 can be a screw. Accordingly, the limit spacer 241 can be actuated together with the support positioning member 22 and the elastic member 23.

如上所述,已詳細介紹固持裝置100之構成元件及其細部特徵,接下來將進一步說明本創作第一實施例提供的固持裝置100的使用方式。As described above, the constituent elements of the holding device 100 and the detailed features thereof have been described in detail, and the manner of use of the holding device 100 provided by the first embodiment of the present creation will be further explained.

請複參閱圖3A及圖3B,首先,將固持裝置100放置於一製程腔室(如電鍍腔室)內,固持裝置100可依製程需求做垂直或水平放置;接著,選取一適當尺寸之待加工物件W,並將其與固持裝置100作結合,而結合的方式可以是先在所有的支撐定位件22之承接部221上都形成一接著層25,然後再透過接著層25與待加工物件W接合在一起。於此同時,如圖3A所示,支撐定位件22連同限位組件24會因為受待加工物件W的重力作用而產生向下之位移,並逐步壓縮彈性件23,直到承接部221接觸到第一容置腔2131底面為止。Referring to FIG. 3A and FIG. 3B, first, the holding device 100 is placed in a processing chamber (such as a plating chamber), and the holding device 100 can be placed vertically or horizontally according to the process requirements; then, an appropriate size is selected. The object W is processed and combined with the holding device 100, and the bonding may be performed by first forming an adhesive layer 25 on the receiving portion 221 of all the supporting positioning members 22, and then passing through the adhesive layer 25 and the object to be processed. W is joined together. At the same time, as shown in FIG. 3A, the support positioning member 22 together with the limiting member 24 may be displaced downward due to the gravity of the object W to be processed, and the elastic member 23 is gradually compressed until the receiving portion 221 contacts the first portion. A cavity is placed on the bottom surface of the cavity 2131.

此後,雖然待加工物件W在製程中會受高溫加熱而產生彎曲形變,但值得注意的是,如圖3B所示,由於支撐定位件22之承接部221與彈性件23保持彈性接觸,因此支撐定位件22連同限位組件24會隨著待加工物件W所產生之翹曲而產生向上之位 移,並藉由接著層25及限位墊片241持續約束待加工物件W。Thereafter, although the object to be processed W is heated by the high temperature in the process to cause bending deformation, it is worth noting that, as shown in FIG. 3B, since the receiving portion 221 of the support positioning member 22 is in elastic contact with the elastic member 23, the support is supported. The positioning member 22 together with the limiting member 24 will have an upward position with the warpage generated by the object W to be processed. The object W to be processed is continuously restrained by the adhesive layer 241 and the stopper 241.

更進一步來說,待加工物件W在高溫環境下,其因為膨脹係數的關係會產生向內或向外之彎曲;與此同時,支撐定位件22之承接部221在發生彎曲形變的地方,可以從一靠近基座21之位置移動到一遠離基座21之位置,並以此方式來防止待加工物件W因受高溫加熱而掉落,對於大尺寸之待加工物件W尤其有效。Further, in the high temperature environment, the object to be processed W may be bent inward or outward due to the relationship of the expansion coefficient; at the same time, the receiving portion 221 of the support positioning member 22 may be bent and deformed. Moving from a position close to the susceptor 21 to a position away from the susceptor 21, and in this way, preventing the object to be processed W from falling due to high temperature heating is particularly effective for a large-sized object to be processed W.

〔第二實施例〕[Second embodiment]

圖4為本創作第二實施例之固持裝置的結構示意圖。本創作第二實施例提供的固持裝置100’適用於各類製程腔室,例如,電鍍腔室、電化學拋光腔室、化學機械研磨腔室等;與前一實施例不同的地方是,本實施例之固持裝置100’主要透過“一個彈簧式固持機構2’連接一個待加工物件W”的方式,對尺寸較小的待加工物件W進行固持。FIG. 4 is a schematic structural view of a holding device according to a second embodiment of the present invention. The holding device 100' provided by the second embodiment of the present invention is applicable to various types of processing chambers, for example, an electroplating chamber, an electrochemical polishing chamber, a chemical mechanical polishing chamber, etc.; a difference from the previous embodiment is that The holding device 100' of the embodiment mainly holds the small-sized object to be processed W by means of "a spring-type holding mechanism 2' is connected to an object to be processed W".

請參閱圖5,為本創作第二實施例之彈簧式固持機構的立體分解圖。本實施例之彈簧式固持機構2’中,限位組件24還包括複數個限位柱243,而支撐定位件22之承接部221的周邊區域2212開設複數個與該些限位柱243相配合的限位孔2213,該些限位柱243分別穿過該些限位孔2213而固定於基座21上,其中該些限位柱243與所對應的限位孔2213內緣皆相隔一間距。Please refer to FIG. 5 , which is an exploded perspective view of the spring-type holding mechanism of the second embodiment of the present invention. In the spring-type holding mechanism 2 ′ of the embodiment, the limiting component 24 further includes a plurality of limiting posts 243 , and the peripheral region 2212 of the receiving portion 221 of the supporting positioning member 22 defines a plurality of matching with the limiting posts 243 . The limiting hole 2213 is fixed to the base 21 through the limiting holes 2213, wherein the limiting posts 243 are spaced apart from the inner edges of the corresponding limiting holes 2213. .

另外,雖然在圖5所示的彈簧式固持機構2’中,限位柱243及限位孔2213的數量均有四個,但是對於本實施例之其他實施態樣,限位柱243及限位孔2213的數量可以有四個以上。也就是說,圖5所示的限位柱243及限位孔2213的數量僅供舉例說明,本創作並不以此為限。In addition, although the number of the limiting post 243 and the limiting hole 2213 is four in the spring-type holding mechanism 2' shown in FIG. 5, for other embodiments of the embodiment, the limiting post 243 and the limit The number of bit holes 2213 may be four or more. That is to say, the number of the limiting post 243 and the limiting hole 2213 shown in FIG. 5 is for illustrative purposes only, and the present invention is not limited thereto.

請參閱圖6A至圖6C,進一步說明本創作第二實施例提供的固持裝置100’的使用方式。首先,如圖6A及6B所示,每一個彈簧式固持機構2’之支撐定位件22可供放置一個待加工物件W,當 待加工物件W被準確擺放時,待加工物件W之中心線C1會與支撐定位件22之中心線C2完全重疊。然後,如圖6C所示,雖然待加工物件W會因為未被準確擺放、或因受到外力作用而導致其位置產生偏移,但是當支撐定位件22產生向下之位移時,待加工物件W仍可被穩固地支持在限位柱243上,使待加工物件W之中心線C1平行於支撐定位件22之中心線C2(即待加工物件W位置不偏移)。Referring to Figures 6A through 6C, the manner of use of the holding device 100' provided by the second embodiment of the present invention is further explained. First, as shown in Figs. 6A and 6B, the support positioning member 22 of each spring-type holding mechanism 2' can be used to place an object to be processed W, when When the object to be processed W is accurately placed, the center line C1 of the object to be processed W completely overlaps with the center line C2 of the support positioning member 22. Then, as shown in FIG. 6C, although the object to be processed W may be displaced due to being not accurately placed or subjected to an external force, when the support positioning member 22 generates a downward displacement, the object to be processed is to be processed. The W can still be stably supported on the limit post 243 such that the center line C1 of the object W to be processed is parallel to the center line C2 of the support positioning member 22 (i.e., the position of the object W to be processed is not offset).

如上述實施例所述,已經詳細說明本創作之固持裝置100的整體結構設計及功用,接下來將簡單介紹其應用領域。As described in the above embodiments, the overall structural design and function of the holding device 100 of the present invention have been described in detail, and the application fields thereof will be briefly described next.

請參閱圖7,為本創作之電沉積設備的基本架構圖。如圖所示,電沉積設備E主要包括一鍍膜腔室200、至少一固持裝置100及至少一電鍍裝置300。本實施例中,鍍膜腔室200可為適用於抗反射膜(AR)之鍍膜製程的真空腔室;固持裝置100用於將至少一待電鍍物W固定於一鍍膜腔室200內,其中固持裝置100可水平或垂直地安裝在一支架(圖中未顯示)上,並藉由支架組立於鍍膜腔室200內;電鍍裝置300與固持裝置100呈相對應設置,電鍍裝置300之構成元件非本創作之重點,故不予贅述。須說明的是,電鍍裝置300與固持裝置100的數量亦相對應,而熟悉此項技藝者可依所需之生產能力增加或減少兩者的數量。Please refer to FIG. 7 , which is a basic structural diagram of the electrodeposition apparatus of the present invention. As shown, the electrodeposition apparatus E mainly includes a coating chamber 200, at least one holding device 100, and at least one plating device 300. In this embodiment, the coating chamber 200 may be a vacuum chamber suitable for the coating process of the anti-reflection film (AR); the holding device 100 is used for fixing at least one object to be electroplated W in a coating chamber 200, wherein the coating is held therein The device 100 can be mounted horizontally or vertically on a bracket (not shown) and stood in the coating chamber 200 by the bracket; the plating device 300 is disposed corresponding to the holding device 100, and the constituent elements of the plating device 300 are not The focus of this creation is not to be repeated. It should be noted that the number of the plating apparatus 300 and the holding apparatus 100 also correspond, and those skilled in the art can increase or decrease the number of both according to the required production capacity.

綜上所述,本創作與習用之待電鍍物的固定裝置(carrier)相比,至少具有下列優點: 首先,本創作之固持裝置易於製作、成本低廉且適用於不同大小尺寸的待加工物件,使實用性大幅提升。In summary, the present invention has at least the following advantages over the conventional carrier to be electroplated: First of all, the holding device of the present invention is easy to manufacture, low in cost, and suitable for different sizes of objects to be processed, so that the practicality is greatly improved.

其次,本創作之固持裝置透過“複數個設置於承載單元上的彈簧式固持機構,其中支撐定位件設置於基座上,彈性件設置於基座內部且與支撐定位件保持彈性接觸,限位組用以限制支撐定位件位置”的設計,可提供較佳的固持靈活性,以防止待電鍍物因受高溫加熱而掉落。Secondly, the holding device of the present invention passes through a plurality of spring-type holding mechanisms disposed on the carrying unit, wherein the supporting positioning member is disposed on the base, and the elastic member is disposed inside the base and maintains elastic contact with the supporting positioning member, and the limit is The design of the group to limit the position of the support locator provides better retention flexibility to prevent the object to be electroplated from falling due to high temperature heating.

再者,本創作之彈簧式固持機構透過“支撐定位件上開設複數個限位孔,且限位組件中之複數個限位柱分別穿過該些限位孔而固定於基座上”的設計,即便加工物件未被準確擺放、或因受到外力作用而導致其位置產生偏移,仍可以被穩固地固持在限位柱上。Furthermore, the spring-type holding mechanism of the present invention has a plurality of limiting holes formed on the supporting positioning member, and a plurality of limiting posts in the limiting component respectively pass through the limiting holes and are fixed on the base. The design can be firmly held on the limit post even if the workpiece is not accurately placed or displaced due to external force.

以上所述僅為本創作的實施例,其並非用以限定本創作的專利保護範圍。任何熟習相像技藝者,在不脫離本創作的精神與範圍內,所作的更動及潤飾的等效替換,仍落入本創作的專利保護範圍內。The above description is only an embodiment of the present invention, and is not intended to limit the scope of patent protection of the present invention. Anyone who is familiar with the art of the artist, within the spirit and scope of the creation, the equivalent of the changes and retouching, still fall within the scope of the patent protection of this creation.

100‧‧‧固持裝置100‧‧‧ holding device

1‧‧‧承載單元1‧‧‧bearing unit

2‧‧‧彈簧式固持機構2‧‧‧Spring type retaining mechanism

21‧‧‧基座21‧‧‧Base

W‧‧‧待加工物件W‧‧‧Items to be processed

Claims (21)

一種彈簧式固持機構,適於固持一待加工物件,該彈簧式固持機構包括:一基座,具有一第一面及一相對於該第一面的第二面;一支撐定位件,設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部,該承接部位於該第一面上方,且該軸部沿該第一面往該第二面的方向延伸;一彈性件,設置於該基座上,該彈性件環繞於該軸部且與該承接部保持彈性接觸;以及一限位組件,與該軸部相接,用以限制該支撐定位件的位置。The utility model relates to a spring-type holding mechanism, which is suitable for holding a workpiece to be processed. The spring-type holding mechanism comprises: a base having a first surface and a second surface opposite to the first surface; a support positioning member disposed on the The support positioning member has a receiving portion and a shaft portion formed by the extending portion, the receiving portion is located above the first surface, and the shaft portion is along the first surface toward the second surface a direction extending; an elastic member disposed on the base, the elastic member surrounding the shaft portion and maintaining elastic contact with the receiving portion; and a limiting component coupled to the shaft portion for limiting the support The position of the positioning piece. 如請求項1所述的彈簧式固持機構,其中該基座內設有一第一容置腔及一第二容置腔,該第一容置腔及該第二容置腔呈上下錯位分布且彼此相互連通,該第一容置腔及該第二容置腔構成一元件配置空間,且該支撐定位件之主要部分及該彈性件安裝於該元件配置空間內。The spring-type holding mechanism of claim 1, wherein the base is provided with a first accommodating cavity and a second accommodating cavity, and the first accommodating cavity and the second accommodating cavity are vertically displaced The first accommodating cavity and the second accommodating cavity form a component arrangement space, and a main portion of the support locating member and the elastic component are installed in the component arrangement space. 如請求項2所述的彈簧式固持機構,其中該第一容置腔之內徑大於該第二容置腔之內徑。The spring-type holding mechanism of claim 2, wherein an inner diameter of the first receiving cavity is larger than an inner diameter of the second receiving cavity. 如請求項1所述的彈簧式固持機構,其中該支撐定位件之該承接部具有一主要區域及一環繞該主要區域的周邊區域,該支撐定位件之該軸部由該主要區域中央處並沿該基座之該第一面往該第二面的方向延伸所形成。The spring-type holding mechanism according to claim 1, wherein the receiving portion of the supporting positioning member has a main portion and a peripheral portion surrounding the main portion, the shaft portion of the supporting positioning member is located at the center of the main portion Formed along the first surface of the base extending in the direction of the second surface. 如請求項4所述的彈簧式固持機構,其中該限位組件更進一步包括複數個限位柱,該承接部之該周邊區域開設複數個與該些限位柱相配合的限位孔,且該些限位柱分別穿過該些限位孔而固定於該基座。The spring-type retaining mechanism of claim 4, wherein the limiting component further comprises a plurality of limiting posts, wherein the peripheral portion of the receiving portion defines a plurality of limiting holes that cooperate with the limiting posts, and The limiting posts are respectively fixed to the base through the limiting holes. 如請求項5所述的彈簧式固持機構,其中該些限位柱各具有一大徑部,且該些大徑部之外徑小於所對應的該些限位孔之孔徑。The spring-type retaining mechanism of claim 5, wherein the limiting posts each have a large diameter portion, and the outer diameters of the large diameter portions are smaller than the corresponding apertures of the limiting holes. 如請求項1所述的彈簧式固持機構,其中該限位組件包括一限 位墊片及一鎖固件,該限位墊片與該支撐定位件之該軸部相接觸,該鎖固件穿過該限位墊片而鎖入該軸部。The spring-type holding mechanism of claim 1, wherein the limiting component comprises a limit a spacer and a locking member, the limiting spacer is in contact with the shaft portion of the supporting positioning member, and the locking member is locked into the shaft portion through the limiting spacer. 一種固持裝置,適於將至少一待加工物件固定於一鍍膜腔室內,該固持裝置包括:一承載單元;以及至少一個彈簧式固持機構,設置於該承載單元上,其中該彈簧式固持機構包括:一基座,具有一第一面及一相對於該第一面的第二面;一支撐定位件,設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部,該承接部位於該第一面上方,且該軸部沿該第一面往該第二面的方向延伸;一彈性件,設置於該基座上,該彈性件環繞於該軸部且與該承接部保持彈性接觸;及一限位組件,與該軸部相接,用以限制該支撐定位件的位置。A holding device is adapted to fix at least one object to be processed in a coating chamber, the holding device comprising: a carrying unit; and at least one spring-type holding mechanism disposed on the carrying unit, wherein the spring-type holding mechanism comprises a base having a first surface and a second surface opposite to the first surface; a support positioning member disposed on the base, the support positioning member having a receiving portion and an extension portion extending from the receiving portion a shaft portion, the receiving portion is located above the first surface, and the shaft portion extends along the first surface toward the second surface; an elastic member is disposed on the base, the elastic member is surrounded by The shaft portion is in elastic contact with the receiving portion; and a limiting assembly is coupled to the shaft portion for limiting the position of the supporting positioning member. 如請求項8所述的固持裝置,其中該基座內設有一第一容置腔及一第二容置腔,該第一容置腔及該第二容置腔呈上下錯位分布且彼此相互連通,該第一容置腔及該第二容置腔構成一元件配置空間,且該支撐定位件之主要部分及該彈性件安裝於該元件配置空間內。The holding device of claim 8, wherein the base is provided with a first accommodating cavity and a second accommodating cavity, and the first accommodating cavity and the second accommodating cavity are vertically displaced and mutually The first accommodating cavity and the second accommodating cavity form a component arrangement space, and a main part of the support locating member and the elastic component are installed in the component arrangement space. 如請求項9所述的固持裝置,其中該第一容置腔之內徑大於該第二容置腔之內徑。The holding device of claim 9, wherein an inner diameter of the first accommodating cavity is larger than an inner diameter of the second accommodating cavity. 如請求項8所述的固持裝置,其中該支撐定位件之該承接部具有一主要區域及一環繞該主要區域的周邊區域,該支撐定位件之該軸部由該主要區域中央處並沿該基座之該第一面往該第二面的方向延伸所形成。The holding device of claim 8, wherein the receiving portion of the supporting positioning member has a main area and a peripheral area surrounding the main area, the shaft portion of the supporting positioning member is located at the center of the main area and along the The first surface of the base extends to extend in the direction of the second surface. 如請求項11所述的固持裝置,其中該限位組件更進一步包括複數個限位柱,該承接部之該周邊區域開設複數個與該些限位柱相配合的限位孔,且該些限位柱分別穿過該些限位孔而固定於 該基座。The holding device of claim 11, wherein the limiting component further comprises a plurality of limiting posts, wherein the peripheral region of the receiving portion defines a plurality of limiting holes that cooperate with the limiting posts, and the The limit post is respectively fixed through the limit holes The pedestal. 如請求項12所述的固持裝置,其中該些限位柱各具有一大徑部,且該些大徑部之外徑小於所對應的該些限位孔之孔徑。The holding device of claim 12, wherein the limiting posts each have a large diameter portion, and the outer diameters of the large diameter portions are smaller than the corresponding apertures of the limiting holes. 如請求項8所述的固持裝置,其中該限位組件包括一限位墊片及一鎖固件,該限位墊片與該支撐定位件之該軸部相接觸,該鎖固件穿過該限位墊片而鎖入該軸部。The holding device of claim 8, wherein the limiting component comprises a limiting spacer and a locking member, the limiting spacer is in contact with the shaft portion of the supporting positioning member, and the locking member passes through the limit The spacer is locked into the shaft. 一種電沉積設備,包括:一鍍膜腔室;一固持裝置,設置於該鍍膜腔室內,用以固持至少一待加工物件,該固持裝置包括一承載單元及至少一個設置於該承載單元上的彈簧式固持機構,其中該彈簧式固持機構包括:一基座,具有一第一面及一相對於該第一面的第二面;一支撐定位件,設置於該基座上,該支撐定位件具有一承接部及一由該承接部延伸所形成的軸部,該承接部位於該第一面上方,且該軸部沿該第一面往該第二面的方向延伸;一彈性件,設置於該基座上,該彈性件環繞於該軸部且與該承接部保持彈性接觸;及一限位組件,與該軸部相接,用以限制該支撐定位件的位置;以及一電鍍裝置,與該固持裝置相對應設置。An electrodeposition apparatus comprising: a coating chamber; a holding device disposed in the coating chamber for holding at least one object to be processed, the holding device comprising a carrying unit and at least one spring disposed on the carrying unit The retaining mechanism, wherein the spring retaining mechanism comprises: a base having a first surface and a second surface opposite to the first surface; a support positioning member disposed on the base, the support positioning member Having a receiving portion and a shaft portion formed by the extending portion, the receiving portion is located above the first surface, and the shaft portion extends along the first surface toward the second surface; an elastic member is disposed On the base, the elastic member surrounds the shaft portion and maintains elastic contact with the receiving portion; and a limiting assembly is coupled to the shaft portion for limiting the position of the supporting positioning member; and a plating device , corresponding to the holding device. 如請求項15所述的電沉積設備,其中該基座內設有一第一容置腔及一第二容置腔,該第一容置腔及該第二容置腔呈上下錯位分布且彼此相互連通,該第一容置腔及該第二容置腔構成一元件配置空間,且該支撐定位件之主要部分及該彈性件安裝於該元件配置空間內。The electrodeposition apparatus of claim 15, wherein the susceptor has a first accommodating cavity and a second accommodating cavity, wherein the first accommodating cavity and the second accommodating cavity are vertically dislocated and mutually The first accommodating cavity and the second accommodating cavity form a component arrangement space, and a main portion of the support locating member and the elastic component are installed in the component arrangement space. 如請求項16所述的電沉積設備,其中該第一容置腔之內徑大於該第二容置腔之內徑。The electrodeposition apparatus of claim 16, wherein an inner diameter of the first accommodating cavity is larger than an inner diameter of the second accommodating cavity. 如請求項15所述的電沉積設備,其中該支撐定位件之該承接部 具有一主要區域及一環繞該主要區域的周邊區域,該支撐定位件之該軸部由該主要區域中央處並沿該基座之該第一面往該第二面的方向延伸所形成。The electrodeposition apparatus according to claim 15, wherein the receiving portion of the support positioning member The main portion and the peripheral portion surrounding the main portion are formed by the central portion of the main portion extending from the first surface of the main portion toward the second surface. 如請求項18所述的電沉積設備,其中該限位組件更進一步包括複數個限位柱,該承接部之該周邊區域開設複數個與該些限位柱相配合的限位孔,且該些限位柱分別穿過該些限位孔而固定於該基座。The electrodeposition apparatus of claim 18, wherein the limiting component further comprises a plurality of limiting posts, wherein the peripheral region of the receiving portion defines a plurality of limiting holes that cooperate with the limiting posts, and the The limiting posts are respectively fixed to the base through the limiting holes. 如請求項19所述的電沉積設備,其中該些限位柱各具有一大徑部,且該些大徑部之外徑小於所對應的該些限位孔之孔徑。The electrodeposition apparatus of claim 19, wherein the plurality of limiting posts each have a large diameter portion, and the outer diameters of the large diameter portions are smaller than the corresponding apertures of the limiting holes. 如請求項15所述的電沉積設備,其中該限位組件包括一限位墊片及一鎖固件,該限位墊片與該支撐定位件之該軸部相接觸,該鎖固件穿過該限位墊片而鎖入該軸部。The electrodeposition apparatus of claim 15, wherein the limiting component comprises a limiting spacer and a locking member, the limiting spacer is in contact with the shaft portion of the supporting positioning member, and the locking member passes through the The limit pad is locked into the shaft.
TW104205382U 2015-04-10 2015-04-10 Electro-deposition equipment, holding device and spring type holding mechanism thereof TWM509223U (en)

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