TWM505580U - Fill light structure of inspection machine - Google Patents

Fill light structure of inspection machine Download PDF

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Publication number
TWM505580U
TWM505580U TW104202164U TW104202164U TWM505580U TW M505580 U TWM505580 U TW M505580U TW 104202164 U TW104202164 U TW 104202164U TW 104202164 U TW104202164 U TW 104202164U TW M505580 U TWM505580 U TW M505580U
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TW
Taiwan
Prior art keywords
light source
annular light
annular
fill
light
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TW104202164U
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Chinese (zh)
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Ivan Kao
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Ever Red New Technology Co Ltd
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Priority to TW104202164U priority Critical patent/TWM505580U/en
Publication of TWM505580U publication Critical patent/TWM505580U/en

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Description

檢測機台之補光燈結構Detecting machine's fill light structure

本創作係為一種補光燈結構,特別為一種可提供多角度光源補償給待測物件之檢測機台之補光燈結構。The creation system is a fill light structure, in particular, a fill light structure capable of providing a multi-angle light source to compensate the detection machine of the object to be tested.

目前CCD(Couple Charged Device,電荷耦合裝置)攝影機之取像系統已廣泛用於物件之各種檢測,例如物件之外形檢視、顏色分辨、表面瑕疵及尺寸分析等等。其檢測方法一般是利用CCD攝影機取像後,接著透過電腦影像處理技術進行影像比對,進而達成物件之各項檢測。At present, the image acquisition system of a CCD (Couple Charged Device) camera has been widely used for various detections of objects, such as object shape inspection, color resolution, surface flaw and size analysis, and the like. The detection method generally uses a CCD camera to take an image, and then performs image comparison through computer image processing technology, thereby achieving various detections of the object.

由於檢測系統是根據CCD攝影機所取得之物件影像作判讀,因此取像品質就顯得非常重要,而取像品質除了攝影機之解析度外,就取決於搭配之補光裝置。當補光裝置提供的補光面積不足時,未被補光之區域若發生缺陷,其檢出率也會降低。Since the detection system is interpreted according to the image of the object obtained by the CCD camera, the image quality is very important, and the image quality depends on the matching light fixture, in addition to the resolution of the camera. When the fill light area provided by the light-filling device is insufficient, if the area that is not filled with light is defective, the detection rate is also lowered.

補光裝置必須要能使欲檢測物件之特徵更為明顯,例如能提供一致的亮度至待測物件之表面上,如此才能達到準確的檢測結果。習知之補光裝置,由於只有單一光源,因此使補光裝置投射至檢測物件之光源受到侷限,有許多檢測物件之局部面積甚至沒有接受到補光。The light-filling device must make the characteristics of the object to be detected more obvious, for example, to provide uniform brightness to the surface of the object to be tested, so as to achieve accurate detection results. Since the conventional light-filling device has only a single light source, the light source for projecting the light-filling device to the detecting object is limited, and the local area of many detecting objects does not even receive the fill light.

如第1圖與第2圖所示,第1圖為習知一種環形物件的上視圖,第2圖為第1圖之環形物件於進行檢測時之A-A’的剖面示意圖。當環形物件10例如是O型環(O-ring)欲進行檢測時,習知補光裝置由於只有單一光源,光源投射至環形物件10之光源面積為X,而光源面積X之兩側外的區域並沒有接受到補光,導致未被補光之區域若發生缺陷,將造成檢出率降低。As shown in Figs. 1 and 2, Fig. 1 is a top view of a conventional ring-shaped object, and Fig. 2 is a schematic cross-sectional view of the ring-shaped object of Fig. 1 taken along the line A-A'. When the ring-shaped object 10 is, for example, an O-ring to be detected, the conventional light-filling device has only a single light source, and the light source is projected onto the ring-shaped object 10 by the light source area X, and the light source area X is outside the two sides. The area does not receive fill light, resulting in a defect in the area that is not filled, which will result in a lower detection rate.

本創作係提供一種檢測機台之補光燈結構,其係要提供不同角度的光源,以產生更大的補光面積給予待測物件,使得檢測時對待測物件之缺陷能有更高的檢出率。The creation system provides a fill light structure for detecting the machine, which is to provide a light source with different angles to generate a larger fill light area to give the object to be tested, so that the defect of the object to be tested can be detected more highly during the test. Out rate.

本創作係提供一種檢測機台之補光燈結構,其係由複數個環狀燈源所形成,環狀燈源係設於不同平面,且任二相鄰環狀燈源之光投射面積之邊緣係呈現一距離關係。The present invention provides a fill light structure for detecting a machine, which is formed by a plurality of annular light sources, and the annular light source is disposed on different planes, and the light projection area of any two adjacent annular light sources is The edge system presents a distance relationship.

藉由本創作的實施,可達到下列進步功效:With the implementation of this creation, the following advancements can be achieved:

一、可藉由不同平面之環狀燈源提供更大補光面積。First, a larger fill area can be provided by a ring light source of different planes.

二、使待測物件能獲得一致的亮度補償。Second, the object to be tested can obtain consistent brightness compensation.

為了使任何熟習相關技藝者了解本創作之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本創作相關之目的及優點,因此將在實施方式中詳細敘述本創作之詳細特徵以及優點。In order to make any skilled person understand the technical content of the present invention and implement it according to the content, patent application scope and drawings disclosed in the specification, any skilled person can easily understand the purpose and advantages related to the creation. Therefore, the detailed features and advantages of the present invention will be described in detail in the embodiments.

10‧‧‧環形物件10‧‧‧ ring objects

100‧‧‧檢測機台100‧‧‧Testing machine

110、120、130‧‧‧環狀燈源110, 120, 130‧‧‧ ring light source

111‧‧‧LED燈源111‧‧‧LED light source

112‧‧‧LED112‧‧‧LED

140‧‧‧檢測平台140‧‧‧Testing platform

150‧‧‧基座150‧‧‧Base

200‧‧‧補光燈結構200‧‧‧ fill light structure

第1圖係為習知一種環形物件的上視圖;第2圖係為第1圖之環形物件於進行檢測時之A-A’的剖面示意圖;第3圖係為本實施例一種檢測機台之補光燈結構的立體示意圖;第4A圖至第4B圖係為本創作各種不同實施例之環狀燈源的示意圖;以及第5圖係為本創作實施例之第1圖之環形物件於進行檢測時之A-A’的剖面示意圖。1 is a top view of a conventional ring-shaped object; FIG. 2 is a schematic cross-sectional view of the ring-shaped object of FIG. 1 taken while detecting A-A'; FIG. 3 is a detecting machine of the present embodiment. FIG. 4A to FIG. 4B are schematic diagrams of a ring light source of various different embodiments; and FIG. 5 is a ring object of FIG. 1 of the present embodiment. A schematic cross-sectional view of A-A' at the time of detection.

如第3圖所示,本實施例為一種檢測機台100之補光燈結構200。補光燈結構200係由複數個環狀燈源110,120,130所形成且設於不同平面,在本實施例中係以3個環狀燈源110,120,130為例,但並不限於此數量。環狀燈源110,120,130係固設於檢測機台100之基座150上,且分別設於不同平面。As shown in FIG. 3, this embodiment is a fill light structure 200 for detecting the machine table 100. The fill light structure 200 is formed by a plurality of annular light sources 110, 120, 130 and is disposed on different planes. In the present embodiment, three annular light sources 110, 120, 130 are taken as an example, but are not limited thereto. The annular light sources 110, 120, 130 are fixed on the base 150 of the testing machine 100 and are respectively disposed on different planes.

如第4A圖至第4B圖所示,其為本創作各種不同實施例之環狀燈源的示意圖。在本實施例中,係以環狀燈源110為例來加以說明其之各種實施態樣,然而,環狀燈源120或環狀燈源130之實施態樣可以是和環狀燈源110相同或不相同,因此不再贅述。As shown in Figures 4A through 4B, it is a schematic illustration of a ring light source for various different embodiments. In this embodiment, the annular light source 110 is taken as an example to describe various embodiments thereof. However, the implementation of the annular light source 120 or the annular light source 130 may be the annular light source 110. Same or different, so I won't go into details.

如第4A圖所示,環狀燈源110為了使補光的光源充足,可將環狀燈源110設有至少一環狀排列之複數個LED 112。又如第4B圖所示,環狀燈源110係可以設有三環環狀排列之複數個LED 112。As shown in FIG. 4A, in order to make the light source of the fill light sufficient, the annular light source 110 can be provided with at least one plurality of LEDs 112 arranged in a ring shape. As also shown in FIG. 4B, the annular light source 110 can be provided with a plurality of LEDs 112 arranged in a three-ring ring shape.

環狀燈源110,120,130,設置時可以有不同的類型,例如兩層式的架構,其可設計成包含一第一環狀燈源110與一第二 環狀燈源120,第一環狀燈源110與第二環狀燈源120可設計成具有相同之一中心軸,又第一環狀燈源110設於第二環狀燈源120之上方,且第一環狀燈源110之半徑小於第二環狀燈源120之半徑。The annular light sources 110, 120, 130 may be provided in different types, such as a two-layer architecture, which may be designed to include a first annular light source 110 and a second The annular light source 120, the first annular light source 110 and the second annular light source 120 can be designed to have one and the same central axis, and the first annular light source 110 is disposed above the second annular light source 120. And the radius of the first annular light source 110 is smaller than the radius of the second annular light source 120.

環狀燈源110,120,130,亦可以設計成三層式架構,環狀燈源更包含一第三環狀燈源130,第三環狀燈源130和第一環狀燈源110與第二環狀燈源120具有相同之中心軸,第三環狀燈源130設於第二環狀燈源120之下方,且第三環狀燈源130之半徑大於第二環狀燈源120之半徑。The annular light source 110, 120, 130 can also be designed as a three-layer structure. The annular light source further includes a third annular light source 130, a third annular light source 130 and a first annular light source 110 and a second ring. The light source 120 has the same central axis, the third annular light source 130 is disposed below the second annular light source 120, and the radius of the third annular light source 130 is greater than the radius of the second annular light source 120.

環狀燈源110,120,130之補光面積係依照彼此投射面積間之關係而決定,本實施例中,任二相鄰環狀燈源110,120,130之光投射面積之邊緣係呈現一距離關係,藉由不同的距離關係,可以產生不同的投射面積及不同的光投射圖案。The light-filling area of the annular light source 110, 120, 130 is determined according to the relationship between the projected areas of the two adjacent light sources. In this embodiment, the edges of the light projection areas of any two adjacent annular light sources 110, 120, 130 exhibit a distance relationship, by different The distance relationship can produce different projection areas and different light projection patterns.

上述距離關係可以為一零數值之距離單位,也就是說,此時環狀燈源110,120,130之投射面積間係形成相互接觸之補光區塊。又上述距離關係可以為一負數值之距離單位,也就是說,此時環狀燈源110,120,130之投射面積間係形成相互局部重疊之補光區塊。The distance relationship may be a distance unit of a zero value, that is, at this time, the projected areas of the annular light sources 110, 120, 130 form complementary light blocks. Further, the distance relationship may be a distance unit of a negative value, that is, at this time, the projected areas of the annular light sources 110, 120, 130 form complementary light patches that partially overlap each other.

如第5圖所示,當待測物件為一環形物件10例如O型環,於進行檢測時,環形物件10將被置於檢測平台140上,環狀燈源110之光源投射至環形物件10之光源面積為X,配合環狀燈源120,130之光源投射將可形成光源面積Y之補光,如此使得光源投射面積大幅增加。As shown in FIG. 5, when the object to be tested is an annular object 10 such as an O-ring, the annular object 10 will be placed on the detection platform 140 when the detection is performed, and the light source of the annular light source 110 is projected to the annular object 10. The light source area is X, and the light source projecting with the annular light source 120, 130 will form a complementary light of the light source area Y, so that the projection area of the light source is greatly increased.

檢測時,環形物件10藉由較大面積之光源補償,可以使CCD攝影機有效之取像面積增加,藉由自動光學檢測技術, 將可使瑕疵物件(Failed)的檢出率有效的提升。During the detection, the annular object 10 is compensated by a large area of the light source, which can increase the effective imaging area of the CCD camera, and by means of automatic optical detection technology, This will effectively increase the detection rate of the Failed object.

藉由本實施例之檢測機台100之補光燈結構200,亦可個別調整環狀燈源110,120,130之光源亮度,以針對不同材質的待測物件給予不同的光源補償,使得待測物件能獲得一致的亮度。With the fill light structure 200 of the detecting machine 100 of the embodiment, the brightness of the light source of the ring light source 110, 120, 130 can be individually adjusted to compensate different light sources for different materials to be tested, so that the object to be tested can be consistent. Brightness.

惟上述各實施例係用以說明本創作之特點,其目的在使熟習該技術者能瞭解本創作之內容並據以實施,而非限定本創作之專利範圍,故凡其他未脫離本創作所揭示之精神而完成之等效修飾或修改,仍應包含在以下所述之申請專利範圍中。However, the above embodiments are intended to illustrate the features of the present invention, and the purpose of the present invention is to enable those skilled in the art to understand the contents of the present invention and to implement it, and not to limit the scope of the patent of the present invention. Equivalent modifications or modifications made by the spirit of the disclosure should still be included in the scope of the claims described below.

100‧‧‧檢測機台100‧‧‧Testing machine

110、120、130‧‧‧環狀燈源110, 120, 130‧‧‧ ring light source

140‧‧‧檢測平台140‧‧‧Testing platform

150‧‧‧基座150‧‧‧Base

200‧‧‧補光燈結構200‧‧‧ fill light structure

Claims (8)

一種檢測機台之補光燈結構,其係由複數個環狀燈源所形成,該些環狀燈源係設於不同平面,且任二相鄰環狀燈源之光投射面積之邊緣係呈現一距離關係。A fill light structure for detecting a machine, which is formed by a plurality of annular light sources, which are disposed on different planes, and the edge of the light projection area of any two adjacent annular light sources Present a distance relationship. 如申請專利範圍第1項所述之補光燈結構,其中該環狀燈源係為一LED燈源。The fill light structure of claim 1, wherein the annular light source is an LED light source. 如申請專利範圍第1項所述之補光燈結構,其中至少一該環狀燈源設有至少一環狀排列之複數個LED。The fill light structure of claim 1, wherein at least one of the annular light sources is provided with at least one annular LED. 如申請專利範圍第1項所述之補光燈結構,其中至少一該環狀燈源設有至少三環環狀排列之複數個LED。The fill light structure of claim 1, wherein at least one of the annular light sources is provided with a plurality of LEDs having at least three rings arranged in a ring shape. 如申請專利範圍第1項所述之補光燈結構,其中該些環狀燈源至少包含一第一環狀燈源與一第二環狀燈源,該第一環狀燈源與該第二環狀燈源具有相同之一中心軸,該第一環狀燈源設於該第二環狀燈源之上方,且該第一環狀燈源之半徑小於該第二環狀燈源之半徑。The fill light structure of claim 1, wherein the annular light source comprises at least a first annular light source and a second annular light source, the first annular light source and the first The two annular light sources have the same central axis, the first annular light source is disposed above the second annular light source, and the radius of the first annular light source is smaller than the second annular light source radius. 如申請專利範圍第5項所述之補光燈結構,其中該些環狀燈源更包含一第三環狀燈源,該第三環狀燈源和該第一環狀燈源與該第二環狀燈源具有相同之該中心軸,該第三環狀燈源設於該第二環狀燈源之下方,且該第三環狀燈源之半徑大於該第二環狀燈源之半徑。The fill light structure of claim 5, wherein the annular light source further comprises a third annular light source, the third annular light source and the first annular light source and the first The second annular light source has the same central axis, the third annular light source is disposed below the second annular light source, and the third annular light source has a larger radius than the second annular light source radius. 如申請專利範圍第1項所述之補光燈結構,其中該距離關係為一零數值之距離單位。The fill light structure of claim 1, wherein the distance relationship is a distance unit of a zero value. 如申請專利範圍第1項所述之補光燈結構,其中該距離關係為一負數值之距離單位。The fill light structure of claim 1, wherein the distance relationship is a distance unit of a negative value.
TW104202164U 2015-02-10 2015-02-10 Fill light structure of inspection machine TWM505580U (en)

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