TWI490463B - Detecting method and detecting system for distinguishing the difference of two workpieces - Google Patents
Detecting method and detecting system for distinguishing the difference of two workpieces Download PDFInfo
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Description
本發明係關於一種檢測方法及檢測系統,特別關於一種檢測二工件之差異性的檢測方法及檢測系統。The invention relates to a detection method and a detection system, in particular to a detection method and a detection system for detecting the difference between two workpieces.
隨著工業技術的進步,業界對於各式工件的精密的要求亦越趨嚴格,當然,足夠精確的量測技術也必須同步發展,才能真正的提升工業技術。而在量測技術的應用上,更常被用於檢查或比對二個工件是否相同。With the advancement of industrial technology, the industry's precise requirements for various types of workpieces have become stricter. Of course, accurate measurement techniques must be developed simultaneously to truly enhance industrial technology. In the application of measurement technology, it is more often used to check or compare the two workpieces.
舉例而言,在製作工件的過程中,常因設計的變更而需要進行修模,在修模後,除了必須確認應該變更的位置是否有變更,更需要確認應該維持原狀的結構是否還是保持原樣,進而必須比對修模前後的二工件。具體而言,若是需將一工件的周緣的銳角變更成鈍角,於修模後,除了需檢查工件的周緣是否為鈍角以外,更需要一一比對其他的結構是否仍與原先的工件相同。然而,目前修模前後的工件確認都是利用人眼,慢慢的檢查。先看一下修模前的樣品後,再看修模後的樣品,但常有遺漏的情形發生。For example, in the process of making a workpiece, it is often necessary to carry out the mold modification due to the design change. After the mold repair, in addition to confirming whether the position to be changed is changed, it is necessary to confirm whether the structure that should remain unchanged remains intact. In turn, it is necessary to compare the two workpieces before and after the mold repair. Specifically, if it is necessary to change the acute angle of the periphery of a workpiece to an obtuse angle, it is necessary to check whether the other structures are still the same as the original workpiece after the mold is repaired, in addition to checking whether the circumference of the workpiece is an obtuse angle. However, the current workpiece confirmation before and after the mold repair is to use the human eye and slowly check. First look at the sample before the mold repair, then look at the sample after the mold repair, but often there are missing situations.
對此,目前的解決方法有直接增加人力幫忙檢查,但除了增加成本以外,且仍有不少的疏忽地方。另外,亦有利用X光檢查模具的作法,但成本相當高,故較少被採用。目前亦有將工業用相機架設於動態移動滑台,並於多數個不同位置拍攝修模後的工件,以取得不同角度之修模後工件的圖像後,再將該些圖像與對應之3D電腦圖檔進行比對,以檢查是否有任何差異。然而,這樣的作法費用仍相當高,且移動滑台所花時間與檢測時間都不少。In this regard, the current solution has directly increased the manpower to help check, but in addition to increasing costs, there are still many negligence places. In addition, there are also methods of using X-ray inspection of the mold, but the cost is quite high, so it is rarely used. At present, industrial cameras are erected on a dynamic moving slide, and the repaired workpieces are taken at a plurality of different positions to obtain images of the workpieces after repairing at different angles, and then the images are correspondingly The 3D computer files are compared to check for any discrepancies. However, the cost of such a process is still quite high, and the time and detection time of moving the slide is quite a lot.
因此,如何設計出一種檢測方法及檢測系統,可藉由簡易的裝置及方法,以達到比對不同工件之間的差異性之功效,乃為檢測方法之檢測系統之設計者之一重要課題。Therefore, how to design a detection method and detection system can achieve the effect of comparing the differences between different workpieces by simple devices and methods, and is an important subject for the design of the detection system.
有鑑於上述課題,本發明之目的為提供一種檢測方法及檢測系統,可藉由簡易的裝置及方法,以達到比對不同工件之間的差異性之功效。In view of the above problems, an object of the present invention is to provide a detection method and a detection system, which can achieve the effect of comparing the differences between different workpieces by a simple device and method.
為達上述目的,依據本發明之一種檢測方法,用以檢測一第一工件與一第二工件的差異,檢測方法包括下列步驟:置放第一工件於一檢測平台的一預設位置;於一預設角度擷取第一工件之一第一圖像,並取得第一圖像的一第一像素資料;置放第二工件於檢測平台的預設位置;於預設角度擷取第二工件之一第二圖像,並取得第二圖像的一第二像素資料;計算第一像素資料及第二像素資料之各像素的差值,並取得一比對資料。In order to achieve the above object, a detecting method according to the present invention is for detecting a difference between a first workpiece and a second workpiece, and the detecting method comprises the steps of: placing the first workpiece at a preset position of a detecting platform; The first image of the first workpiece is captured by a predetermined angle, and a first pixel data of the first image is obtained; the preset position of the second workpiece is placed on the detection platform; and the second image is captured at the preset angle a second image of the workpiece, and obtaining a second pixel data of the second image; calculating a difference between each pixel of the first pixel data and the second pixel data, and obtaining a comparison data.
在本發明一實施例中,其中檢測方法更包括:共同輸出比對資料與第一像素資料或第二像素資料。In an embodiment of the invention, the detecting method further comprises: jointly outputting the comparison data with the first pixel data or the second pixel data.
在本發明一實施例中,其中檢測方法更包括:比對資料與第一像素資料或第二像素資料共同顯示於一顯示單元。In an embodiment of the invention, the detecting method further comprises: displaying the comparison data together with the first pixel data or the second pixel data in a display unit.
在本發明一實施例中,其中檢測方法更包括:二值化比對資料。In an embodiment of the invention, the detecting method further comprises: binarizing the comparison data.
在本發明一實施例中,預設角度包括多數個預設角度,處理模組比對於相同的預設角度所取得之第一像素資料及第二像素資料。In an embodiment of the invention, the preset angle includes a plurality of preset angles, and the processing module compares the first pixel data and the second pixel data obtained for the same preset angle.
在本發明一實施例中,其中檢測方法更包括:減少比對資料的不透明參數值,並共同輸出減少不透明參數值後的比對資料與第一像素資料該第二像素資料。In an embodiment of the invention, the detecting method further comprises: reducing an opaque parameter value of the comparison data, and jointly outputting the comparison data after reducing the opacity parameter value and the second pixel data of the first pixel data.
為達上述目的,依據本發明之一種檢測系統,用以檢測一第一工件與一第二工件的差異,檢測系統包括一檢測平台、一定位件、至少一影像擷取裝置以及一處理模組。檢測平台置放第一工件或第二工件。定位件設置於檢測平台,定位件固定第一工件或第二工件於一預設位置。影 像擷取裝置對應檢測平台設置,以擷取第一工件於一預設角度之一第一圖像及第二工件之一第二圖像,並取得對應於第一圖像的一第一像素資料,及取得對應於第二圖像的一第二像素資料。處理模組與影像擷取裝置耦接,處理模組計算第一像素資料及第二像素資料之各像素的差值,並取得一比對資料。In order to achieve the above object, a detection system according to the present invention is configured to detect a difference between a first workpiece and a second workpiece. The detection system includes a detection platform, a positioning component, at least one image capturing device, and a processing module. . The detecting platform places the first workpiece or the second workpiece. The positioning member is disposed on the detecting platform, and the positioning member fixes the first workpiece or the second workpiece to a predetermined position. Shadow The capturing device is configured to correspond to the detecting platform to capture the first image of the first workpiece and the second image of the second workpiece, and obtain a first pixel corresponding to the first image. Data, and obtaining a second pixel data corresponding to the second image. The processing module is coupled to the image capturing device, and the processing module calculates a difference between each pixel of the first pixel data and the second pixel data, and obtains a comparison data.
在本發明一實施例中,處理模組共同輸出比對資料與第一像素資料或第二像素資料。In an embodiment of the invention, the processing module outputs the comparison data and the first pixel data or the second pixel data.
在本發明一實施例中,處理模組包括一顯示單元,以共同顯示比對資料與第一像素資料或第二像素資料。In an embodiment of the invention, the processing module includes a display unit for collectively displaying the comparison data with the first pixel data or the second pixel data.
在本發明一實施例中,檢測平台包括金屬材質、或磁性材質,定位件包括金屬材質、或磁性材質。In an embodiment of the invention, the detecting platform comprises a metal material or a magnetic material, and the positioning component comprises a metal material or a magnetic material.
在本發明一實施例中,處理模組係將比對資料二值化。In an embodiment of the invention, the processing module binarizes the comparison data.
在本發明一實施例中,其中檢測系統包括多數個影像擷取裝置,分別設置於與檢測平台平行的一第一平面,及設置於與檢測平台垂直的至少一第二平面,以取得多數個預設角度的多數個第一像素資料及多數個第二像素資料。In an embodiment of the invention, the detecting system includes a plurality of image capturing devices respectively disposed on a first plane parallel to the detecting platform and at least one second plane perpendicular to the detecting platform to obtain a plurality of A plurality of first pixel data and a plurality of second pixel data of a preset angle.
在本發明一實施例中,處理模組比對於相同的該預設角度所取得之該第一像素資料及該第二像素資料。In an embodiment of the invention, the processing module compares the first pixel data and the second pixel data obtained for the same predetermined angle.
在本發明一實施例中,處理模組更包括減少比對資料的不透明參數值,且處理模組共同輸出減少不透明參數值後的比對資料與第一像素資料或第二像素資料。In an embodiment of the invention, the processing module further includes: reducing the opaque parameter value of the comparison data, and the processing module outputs the comparison data and the first pixel data or the second pixel data after reducing the opacity parameter value.
在本發明一實施例中,其中檢測系統更包括一光源,對應於檢測平台設置。In an embodiment of the invention, the detection system further includes a light source corresponding to the detection platform setting.
在本發明一實施例中,檢測平台設置於一暗室。In an embodiment of the invention, the detection platform is disposed in a dark room.
在本發明一實施例中,檢測平台包括粗糙或霧面的表面。In an embodiment of the invention, the detection platform includes a rough or matte surface.
承上所述,本案之檢測方法及檢測系統,透過簡易檢測平台及固定件的設置,以分別將二工件(第一工件及第二工件)設置於相同的預設位置,並藉由固定的影像擷取裝置分別取得對應於第一工件的第一圖像,以及對應於第二工件的第二圖像,且第一圖像與第二圖像的角度及位 置皆實質上相同。接著,藉由處理模組直接計算第一圖像的第一像素資料與第二圖像的第二像素資料之各像素的差值,並取得比對資料後,即可由比對資料所顯示的圖像查看第一工件與第二工件的差異。因此,本發明藉由簡易的檢測平台、定位件及影像擷取裝置,以及處理模組進行簡易的運算,即可達到比對不同工件之間的差異性之功效。According to the above description, the detection method and the detection system of the present case are arranged by the simple detection platform and the fixing member to respectively set the two workpieces (the first workpiece and the second workpiece) at the same preset position, and by fixing The image capturing device respectively obtains a first image corresponding to the first workpiece, and a second image corresponding to the second workpiece, and the angle and the position of the first image and the second image The settings are essentially the same. Then, the processing module directly calculates the difference between each pixel of the first pixel data of the first image and the second pixel data of the second image, and obtains the comparison data, which can be displayed by the comparison data. The image looks at the difference between the first workpiece and the second workpiece. Therefore, the present invention can achieve the effect of comparing the differences between different workpieces by simple calculation platform, positioning member and image capturing device, and processing module for simple calculation.
另外,更可將比對資料與第一像素資料或第二像素資料共同輸出,及以第一圖像或第二圖像為參考基準,並將比對後的圖像覆蓋於第一圖像或第二圖像,令使用者可更清楚的查看第一工件與第二工件的差異。In addition, the comparison data may be output together with the first pixel data or the second pixel data, and the first image or the second image is used as a reference, and the compared image is overlaid on the first image. Or the second image, so that the user can more clearly see the difference between the first workpiece and the second workpiece.
除此之外,門檻值的定義更可過濾掉數位影像難以避免的雜訊,或是第一工件與第二工件置放於預設位置時的細微差異,甚至是因為光線而造成背景值的不同等微小差異,進而可較精準的顯示第一工件與第二工件的差異之處。In addition, the definition of the threshold value can filter out the noise that is difficult to avoid in the digital image, or the slight difference between the first workpiece and the second workpiece placed in the preset position, even the background value due to the light. Different minor differences can be used to more accurately display the difference between the first workpiece and the second workpiece.
另外,更可藉由於檢測平台的側邊設置影像擷取裝置,以取取得於Z軸的第一圖像或第二圖像,進而可針對工件的盲孔,進一步檢查修模前後之盲孔的深度差異。In addition, the image capturing device can be disposed on the side of the detecting platform to take the first image or the second image acquired on the Z axis, and further, the blind hole before and after the mold clamping can be further checked for the blind hole of the workpiece. The difference in depth.
1、1a‧‧‧檢測平台1, 1a‧‧‧ testing platform
2、2a‧‧‧定位件2, 2a‧‧‧ positioning parts
3、3a、3b‧‧‧影像擷取裝置3, 3a, 3b‧‧‧ image capture device
4‧‧‧處理模組4‧‧‧Processing module
41‧‧‧處理單元41‧‧‧Processing unit
42‧‧‧訊號轉換單元42‧‧‧Signal Conversion Unit
43‧‧‧顯示單元43‧‧‧Display unit
5‧‧‧層架5‧‧‧Shelf
6‧‧‧遮光件6‧‧‧Lighting parts
7‧‧‧光源7‧‧‧Light source
A1‧‧‧第一平面A1‧‧‧ first plane
A2‧‧‧第二平面A2‧‧‧ second plane
I1 ‧‧‧第一圖像I 1 ‧‧‧ first image
I2 ‧‧‧第二圖像I 2 ‧‧‧Second image
Ic ‧‧‧比對圖像I c ‧‧‧ alignment image
P1‧‧‧第一工件P1‧‧‧ first workpiece
P2‧‧‧第二工件P2‧‧‧ second workpiece
S‧‧‧檢測系統S‧‧‧Detection System
S10~S60‧‧‧步驟S10~S60‧‧‧Steps
圖1為依據本發明一實施例之一種檢測方法的流程示意圖。FIG. 1 is a schematic flow chart of a detecting method according to an embodiment of the invention.
圖2A及圖2B為依據本發明一實施例之一種檢測系統的示意圖。2A and 2B are schematic diagrams of a detection system in accordance with an embodiment of the present invention.
圖3A為圖1所示之步驟S20的第一圖像的示意圖。FIG. 3A is a schematic diagram of the first image of step S20 shown in FIG. 1.
圖3B為圖1所示之步驟S40的第二圖像的示意圖。FIG. 3B is a schematic diagram of the second image of step S40 shown in FIG. 1.
圖3C為圖1所示之步驟S40的比對資料轉換成對應之圖像的示意圖。FIG. 3C is a schematic diagram of the conversion of the comparison data of step S40 shown in FIG. 1 into a corresponding image.
圖3D為圖1所示之步驟S60的示意圖。FIG. 3D is a schematic diagram of step S60 shown in FIG. 1.
圖4為依據本發明另一實施例之一種檢測系統的示意圖。4 is a schematic diagram of a detection system in accordance with another embodiment of the present invention.
圖5為圖2A所示之定位件的另一實施態樣。Figure 5 is another embodiment of the positioning member shown in Figure 2A.
圖6為依據本發明又一實施例之一種檢測系統的剖面示意圖。6 is a cross-sectional view of a detection system in accordance with yet another embodiment of the present invention.
以下將參照相關圖式,說明依本發明較佳實施例之一種檢測方法及檢測系統,其中相同的元件將以相同的參照符號加以說明。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a detection method and a detection system according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals.
圖1為依據本發明一實施例之一種檢測方法的流程示意圖,圖2A及圖2B為依據本發明一實施例之一種檢測系統的示意圖,以下先簡述檢測方法的各步驟後,再以檢測系統的元件組成及其運作,進一步解釋檢測方法的各步驟的細節。本實施例之檢測方法係用以檢測一第一工件P1與一第二工件P2的差異,具體而言,本實施例之第一工件P1可以為修模前的工件,而第二工件P2則為經設計變更而修模後的工件。當然,本發明之檢測方法亦可應用於其他應用於其他任二個工件需比對差異的場合,不以修模前後的工件比對為限。1 is a schematic flow chart of a detecting method according to an embodiment of the present invention. FIG. 2A and FIG. 2B are schematic diagrams of a detecting system according to an embodiment of the present invention. The components of the system and their operation further explain the details of the various steps of the test method. The detecting method of the embodiment is for detecting a difference between a first workpiece P1 and a second workpiece P2. Specifically, the first workpiece P1 of the embodiment may be a workpiece before the mold clamping, and the second workpiece P2 is A workpiece that has been modified for design changes. Of course, the detection method of the present invention can also be applied to other occasions where the other two workpieces need to be compared, and is not limited to the workpiece comparison before and after the mold modification.
請先參考圖1所示,本實施例之檢測方法包括以下步驟:置放第一工件於一檢測平台的一預設位置(步驟S10);於一預設角度擷取第一工件之一第一圖像,並取得第一圖像的一第一像素資料(步驟S20);置放第二工件於檢測平台的預設位置(步驟S30);於該預設角度擷取該第二工件之一第二圖像,並取得第二圖像的一第二像素資料(步驟S40);以及計算第一像素資料及第二像素資料之各像素的差值,並取得一比對資料(步驟S50)。Referring to FIG. 1 , the detecting method of the embodiment includes the following steps: placing a first workpiece at a preset position of a detecting platform (step S10); and capturing a first workpiece at a preset angle. An image, and obtaining a first pixel data of the first image (step S20); placing a second workpiece at a preset position of the detection platform (step S30); and capturing the second workpiece at the preset angle a second image, and obtaining a second pixel data of the second image (step S40); and calculating a difference between each pixel of the first pixel data and the second pixel data, and obtaining a comparison data (step S50) ).
請同時搭配圖2A及圖2B所示,本實施例之檢測系統S包括一檢測平台1、一定位件2、至少一影像擷取裝置3以及一處理模組4。於步驟S10,係將第一工件P1置放於檢測平台1的一預設位置。詳細而言,預設位置即為工件(包括第一工件P1及第二工件P2)所被置放的位置,為求第一工件P1及第二工件P2可設置於相同的位置,進而使用定位件2固定第一工件P1及第二工件P2。本實施例之定位件2係為多個一組的夾持件,其設置於檢測平台1,並可定義出一預設位置,以供第一工件P1置放。當第一工件P1置放於檢測平台1的預設位置時,定位件2剛好位於第一工件P1的周緣,並可夾持第一工件P1,使第一工件P1固定於預設位置。本實施例之定位件2更具有滑軌的結構,可依據工件(包括第一工件P1及第二工件P2)的形狀及尺寸的不同而進行調整,以定義預設位置。以下先續行詳述本實施例之檢測方法的流程步驟,而關於定位件2的其他實施態樣於後詳述之。As shown in FIG. 2A and FIG. 2B , the detection system S of the embodiment includes a detection platform 1 , a positioning component 2 , at least one image capturing device 3 , and a processing module 4 . In step S10, the first workpiece P1 is placed at a preset position of the detection platform 1. In detail, the preset position is a position at which the workpiece (including the first workpiece P1 and the second workpiece P2) is placed, and the first workpiece P1 and the second workpiece P2 can be disposed at the same position, and then the positioning is performed. The piece 2 fixes the first workpiece P1 and the second workpiece P2. The positioning member 2 of the embodiment is a plurality of sets of clamping members which are disposed on the detecting platform 1 and can define a preset position for the first workpiece P1 to be placed. When the first workpiece P1 is placed at the preset position of the detecting platform 1, the positioning member 2 is located at the periphery of the first workpiece P1, and the first workpiece P1 can be clamped to fix the first workpiece P1 at the preset position. The positioning member 2 of the embodiment further has a structure of a slide rail, which can be adjusted according to the shape and size of the workpiece (including the first workpiece P1 and the second workpiece P2) to define a preset position. The flow steps of the detecting method of the present embodiment will be described in detail below, and other embodiments of the positioning member 2 will be described in detail later.
圖3A為圖1所示之步驟S20的第一圖像的示意圖,請同時 搭配圖3A所示。接著,於步驟S20中,於一預設角度擷取第一工件P1之一第一圖像I1 ,並取得第一圖像I1 的第一像素資料。具體而言,如圖2A所示,本實施例之影像擷取裝置3係對應檢測平台1設置,即影像擷取裝置3可擷取檢測平台1所呈現之物的畫面。本實施例之檢測系統S更具有一層架5,檢測平台1設置於層架5的其中一層,而該些影像擷取裝置3設置於與檢測平台1平行的另一層,於此將與檢測平台1平行的平面稱為第一平面A1,本實施例之影像擷取裝置3即設置於檢測平台1上方的第一平面A1,以擷取第一工件P1於一預設角度之一第一圖像I1 (如圖3A)。需註明的是,圖2A係以多台影像擷取裝置3為例,而多台影像擷取裝置3即可取得多種不同預設角度的多張第一圖像I1 ,本實施例係以其中一台影像擷取裝置3(即設置於中間的影像擷取裝置3)所擷取之第一圖像I1 (如圖3A)為例說明之。當然,本發明不以影像擷取裝置3的數量為限。FIG. 3A is a schematic diagram of the first image of step S20 shown in FIG. 1, please also be combined with FIG. 3A. Next, in step S20, capturing a predetermined angle in a first one of the workpieces P1 of the first image I 1, and acquires the first image I 1 of the first pixel data. Specifically, as shown in FIG. 2A, the image capturing device 3 of the present embodiment is provided corresponding to the detection platform 1, that is, the image capturing device 3 can capture the image of the object presented by the detection platform 1. The detection system S of the embodiment further has a shelf 5, the detection platform 1 is disposed on one of the shelves 5, and the image capturing devices 3 are disposed on another layer parallel to the detection platform 1, where the detection platform and the detection platform A parallel plane is referred to as a first plane A1. The image capturing device 3 of the present embodiment is disposed on the first plane A1 above the detecting platform 1 to capture the first workpiece P1 at a predetermined angle. Like I 1 (Figure 3A). It should be noted that, in FIG. 2A, multiple image capturing devices 3 are taken as an example, and multiple image capturing devices 3 can obtain multiple first images I 1 of different preset angles. The first image I 1 (see FIG. 3A ) captured by one of the image capturing devices 3 (ie, the image capturing device 3 disposed in the middle) is taken as an example. Of course, the present invention is not limited to the number of image capturing devices 3.
其中,本實施例之影像擷取裝置3可以為一般的數位相機,並固定地設置於層架5,故影像擷取裝置3同樣以固定的角度對應於檢測平台1,而本實施例之預設角度即指影像擷取裝置3係以固定的角度擷取第一工件P1的第一圖像I1 ,並取得第一圖像I1 的第一像素資料,而處理模組4係與影像擷取裝置3耦接,可自影像擷取裝置3接收第一像素資料。The image capturing device 3 of the embodiment may be a general digital camera and fixedly disposed on the shelf 5, so the image capturing device 3 also corresponds to the detecting platform 1 at a fixed angle, and the pre-preparation of the embodiment The image capturing device 3 captures the first image I 1 of the first workpiece P1 at a fixed angle, and obtains the first pixel data of the first image I 1 , and the processing module 4 and the image The capturing device 3 is coupled to receive the first pixel data from the image capturing device 3.
接著,取出第一工件P1,並於步驟S30中,將第二工件P2置放於檢測平台1的預設位置。需註明的是,當取出第一工件P1時,不會變動定位件2的位置,故定位件2所定義出的預設位置亦不會變動。於本實施例中,係將第二工件P2置放於定位件2所定義出的預設位置。而於步驟S40中,影像擷取裝置3同樣與擷取第一圖像I1 時相同的預設角度擷取第二工件P2之一第二圖像I2 ,如圖3B所示,圖3B為圖1所示之步驟S40的第二圖像的示意圖,並取得第二圖像I2 的第二像素資料,而處理模組4可自影像擷取裝置3接收第二像素資料。其中,由於預設位置並未變動,影像擷取裝置3係固定的設置於層架5,故第一圖像I1 與第二圖像I2 中第一工件P1與第二工件P2的角度及位置實質上相同。Next, the first workpiece P1 is taken out, and in step S30, the second workpiece P2 is placed at a preset position of the detection platform 1. It should be noted that when the first workpiece P1 is taken out, the position of the positioning member 2 is not changed, so the preset position defined by the positioning member 2 does not change. In the embodiment, the second workpiece P2 is placed at a preset position defined by the positioning member 2. In step S40, the image capturing device 3 also captures the second image I 2 of the second workpiece P2 at the same preset angle as when the first image I 1 is captured, as shown in FIG. 3B, FIG. 3B. The second image data of the second image I 2 is obtained from the image capturing device 3 , and the second pixel data is received from the image capturing device 3 . The image capturing device 3 is fixedly disposed on the shelf 5 because the preset position is not changed. Therefore, the angles of the first workpiece P1 and the second workpiece P2 in the first image I 1 and the second image I 2 are And the location is essentially the same.
並於步驟S50中,處理模組4可比對前述接收之第一像素資料及第二像素資料。於本實施例中,處理模組4具有處理單元41,處理 單元41可計算第一像素資料及第二像素資料之各像素的差值,並取得一比對資料。具體而言,第一像素資料及第二像素資料係以矩陣數列表示各個座標位置所對應之像素的數值,即各像素的RGB值(R值、G值、B值),處理單元41先分別計算於第一像素資料及第二像素資料中相同座標位置之像素的差值。因此,比對資料亦可以矩陣數列表示,而其各像素的數值可以為第一像素資料及第二像素資料之各像素的差值,或是可進一步執行其他的運算,如圖1所示,檢測方法更可包括步驟S52,二值化比對資料,換言之,藉由處理模組4的處理單元41將比對資料二值化。In step S50, the processing module 4 can compare the received first pixel data and the second pixel data. In this embodiment, the processing module 4 has a processing unit 41 for processing The unit 41 can calculate the difference between each pixel of the first pixel data and the second pixel data, and obtain a comparison data. Specifically, the first pixel data and the second pixel data represent the values of the pixels corresponding to the respective coordinate positions in a matrix sequence, that is, the RGB values (R value, G value, and B value) of each pixel, and the processing unit 41 separately Calculating the difference between the pixels of the same coordinate position in the first pixel data and the second pixel data. Therefore, the comparison data may also be represented by a matrix sequence, and the value of each pixel may be the difference between each pixel of the first pixel data and the second pixel data, or other operations may be further performed, as shown in FIG. 1 . The detecting method may further comprise a step S52 of binarizing the data, in other words, binarizing the data by the processing unit 41 of the processing module 4.
舉例而言,可先將第一像素資料及第二像素資料之各像素的差值(比對資料)灰階化並取絕對值後,於本實施例中,係利用公式sqrt(ΔR2 +ΔG2 +ΔB2 )。接著,再把差值的絕對值大於等於門檻值的像素定義為第一數值,例如灰階值000,而差值的絕對值小於門檻值的像素定義為第二數值,例如灰階值255,以達到可呈現二值化之圖像的效果。其中,門檻值是可由使用者自行設定選擇,可先設定所欲過濾的差異程度。舉例而言,以過濾(或忽略)20%以下的差異為例說明,本實施例之門檻值可定義為88(灰階值為88),這是由於每一個像素的R值、G值、B值最大差距皆為255,是故,代入公式sqrt(2552 +2552 +2552 ),可求得441為比對資料灰階化並取絕對值後的最大值,而門檻值即為441x20%所求得之88。於此,將門檻值定義為88,若差值的絕對值小於等於88的像素定義為灰階值255(第二數值)呈現白色,即過濾差值的絕對值小於等於88者,以避免系統太敏感而被一點點光線就影響結果。反之若差值的絕對值大於88,處理單元41可將其定義為灰階值000(第一數值),即自動標出該像素的位置並進行塗色。換言之,即係將第一像素資料及第二像素資料中差異大之像素的灰階值定義為000,可呈現黑色,差異性小之像素的灰階值定義為255,可呈現白色。而本實施例之處理模組4更包括訊號轉換單元42及顯示單元43,訊號轉換單元42可將比對資料轉換成對應之圖像,本實施例係以比對圖像Ic 稱之,並於顯示單元43呈現,如圖3C所示,圖3C為圖1所示之步驟S40的比對資料轉換成對應之圖像的示意圖。其中,比對圖像呈現白色處則為第一工件P1與第二工件P2相同的位置,而第一工件P1與第二工件P2有 差異的位置係呈現黑色。當然,亦可以將第一數值及第二數值定義為其他數值,使為有差異處呈現黑色,而無差異出呈現白色,或是其他顏色,本發明不以此為限。For example, after the difference (alignment data) of each pixel of the first pixel data and the second pixel data is grayed out and taken as an absolute value, in the embodiment, the formula sqrt (ΔR 2 + is used. ΔG 2 + ΔB 2 ). Then, the pixel whose absolute value is greater than or equal to the threshold value is defined as a first value, such as a grayscale value of 000, and the pixel whose absolute value of the difference is less than the threshold value is defined as a second value, such as a grayscale value of 255. In order to achieve the effect of rendering the image of binarization. Among them, the threshold value can be set by the user, and the degree of difference to be filtered can be set first. For example, by filtering (or ignoring) the difference of 20% or less as an example, the threshold value of the embodiment may be defined as 88 (the gray scale value is 88), which is due to the R value and the G value of each pixel. The maximum difference of B values is 255. Therefore, by substituting into the formula sqrt(255 2 +255 2 +255 2 ), 441 can be obtained as the maximum value after the data is grayed out and the absolute value is taken, and the threshold value is 441x20% of the obtained 88. Here, the threshold value is defined as 88, and if the absolute value of the difference value is less than or equal to 88, the pixel is defined as a grayscale value of 255 (the second value) is white, that is, the absolute value of the filter difference is less than or equal to 88 to avoid the system. Too sensitive and affected by a little bit of light. On the other hand, if the absolute value of the difference is greater than 88, the processing unit 41 can define it as a grayscale value of 000 (the first value), that is, automatically mark the position of the pixel and perform coloring. In other words, the grayscale value of the pixel with the difference between the first pixel data and the second pixel data is defined as 000, which can be black, and the grayscale value of the pixel with small difference is defined as 255, which can be white. The processing module 4 of the embodiment further includes a signal conversion unit 42 and a display unit 43. The signal conversion unit 42 can convert the comparison data into a corresponding image. This embodiment refers to the comparison image I c . And displayed on the display unit 43, as shown in FIG. 3C, FIG. 3C is a schematic diagram of the comparison of the data of step S40 shown in FIG. 1 into a corresponding image. Wherein, the white color of the comparison image is the same position of the first workpiece P1 and the second workpiece P2, and the position where the first workpiece P1 and the second workpiece P2 are different is black. Of course, the first value and the second value may also be defined as other values, such that black is present in the difference, and no difference is present in white, or other colors, and the invention is not limited thereto.
進而言之,由於門檻值的定義可過濾掉僅具有微小差異的像素,微小差異可能是數位影像難以避免的雜訊,或是第一工件P1與第二工件P2置放於預設位置時的細微差異,甚至是因為光線而造成背景值有細微的不同。因此,門檻值的定義可過濾掉前述之細微差異,進而可較精準的顯示第一工件P1與第二工件P2的差異之處。另外,於其他實施例中,檢測平台1用於置放工件(第一工件P1及第二工件P2)的該表面,可以為粗糙或霧面的表面,其可以噴霧處理檢測平台1的該表面,而具有粗糙或霧面的表面的檢測平台1更可避免陰影的產生,進而可降低背景值的干擾。In other words, since the definition of the threshold value can filter out pixels having only slight differences, the slight difference may be noise that is difficult to avoid for the digital image, or when the first workpiece P1 and the second workpiece P2 are placed at the preset position. Subtle differences, even due to light, cause subtle differences in background values. Therefore, the definition of the threshold value can filter out the aforementioned slight difference, thereby more accurately displaying the difference between the first workpiece P1 and the second workpiece P2. In addition, in other embodiments, the surface of the detecting platform 1 for placing the workpieces (the first workpiece P1 and the second workpiece P2) may be a rough or matte surface, which may spray the surface of the detecting platform 1 The detection platform 1 having a rough or matte surface can avoid the generation of shadows, thereby reducing the interference of background values.
另外,為令使用者可更清楚的判斷第一工件P1與第二工件P2的差異,本實施例之檢測方法更可包括步驟S60,處理模組4可共同輸出比對資料與第一像素資料或第二像素資料。詳細而言,處理單元41可將比對資料與第一像素資料共同輸出至顯示單元43,令顯示單元43可同時呈現比對圖像Ic 以及第一圖像I1 ,如圖3D所示,圖3D為圖1所示之步驟S60的示意圖。換言之,即以第一圖像I1 為參考基準,並將比對圖像Ic 著色於第一圖像I1 。而為避免比對圖像覆蓋第一圖像I1 ,可減少比對資料的不透明參數值(α值),例如較佳可設定比對資料的不透明參數值(α值)為0.5,進而使顯示單元43除了可呈現第一圖像I1 以供使用者參考外,另外藉由比對圖像Ic 半透明的覆蓋(著色)於第一圖像I1 ,進而可清楚的查看具有差異之處。除此之外,對於某些較小而不易直接觀察的區域,更提供一種軟體放大鏡的功能,令使用者可以看到較細微較大的畫素,以清楚辨別差異處,而其實施方式係為本發明所屬技術領域具有通常知識者所熟悉,於此不加贅述。當然,亦可以第二圖像I2 為參考基準,則於步驟S60係共同輸出比對資料與第二像素資料,其他運作內容可參考前述,於此不加贅述。In addition, in order to make the user more clearly determine the difference between the first workpiece P1 and the second workpiece P2, the detecting method of the embodiment may further include step S60, and the processing module 4 may jointly output the comparison data and the first pixel data. Or second pixel data. In detail, the processing unit 41 can output the comparison data and the first pixel data to the display unit 43 together, so that the display unit 43 can simultaneously display the comparison image I c and the first image I 1 , as shown in FIG. 3D . FIG. 3D is a schematic diagram of step S60 shown in FIG. 1. In other words, the first image I 1 is used as a reference, and the comparison image I c is colored on the first image I 1 . In order to prevent the comparison image from covering the first image I 1 , the opaque parameter value (α value) of the comparison data may be reduced. For example, the opaque parameter value (α value) of the comparison data may be set to 0.5, thereby in addition to the external display unit 43 presenting a first image I 1 by reference for the user, by addition, and thus can clearly see the image than I c translucent cover (coloring) of the first image I 1 have a difference of At the office. In addition, for some smaller and less directly observable areas, a soft magnifying glass function is provided, so that the user can see the finer and larger pixels to clearly distinguish the difference, and the implementation method is It is familiar to those of ordinary skill in the art to which the present invention pertains, and is not described herein. Of course, the second image I 2 can be used as a reference. In step S60, the comparison data and the second pixel data are jointly output. For other operation contents, reference may be made to the foregoing, and no further details are provided herein.
於其他實施例中,更可於變換第一工件P1的設置方式或角度後,重複步驟S10~S40,以取得不同位置或角度之第一工件P1的多張第一圖像I1 及對應之第二工件P2的多張第二圖像I2 。需註明的是,多張第 一圖像I1 及多張第二圖像I2 應分別具有不同角度或設置位置,而圖式請直接參考圖3A及圖3B所示,於以下的實施例不另以其他圖式表示。舉例而言,若欲觀察第一工件P1與第二工件P2於右側面的差異,則可將第一工件P1立起並以定位件2固定並定義出一預設位置後(步驟S10),再取得該設置方式(角度)之第一工件P1的第一圖像I1 (步驟S20)。接著,第二工件P2以同樣的方式、角度置放於該預設位置(步驟S30),在同樣取得該第二工件P2的第二圖像I2 (步驟S40)。因此,本實施例之預設角度可包括多數個預設角度,而由於影像擷取裝置3係為固定的,多個預設角度表示不同位置或角度之第一工件P1的第一圖像I1 及對應該位置或角度之第二工件P2的第二圖像I2 。而於步驟S50中,係比對於相同的預設角度,即工件(第一工件P1及第二工件P2)於相同設置位置或角度時,所取得之第一像素資料及第二像素資料。In other embodiments, after the setting manner or angle of the first workpiece P1 is changed, the steps S10 to S40 are repeated to obtain the plurality of first images I 1 of the first workpiece P1 at different positions or angles and corresponding ones. A plurality of second images I 2 of the second workpiece P2. It should be noted that the plurality of first images I 1 and the plurality of second images I 2 should have different angles or set positions, respectively, and the drawings are directly referred to FIG. 3A and FIG. 3B, in the following embodiments. It is not represented by other drawings. For example, if the difference between the first workpiece P1 and the second workpiece P2 on the right side is to be observed, the first workpiece P1 can be erected and fixed by the positioning member 2 and a predetermined position is defined (step S10). The first image I 1 of the first workpiece P1 of the setting mode (angle) is obtained again (step S20). Next, the second workpiece P2 is placed at the predetermined position in the same manner (step S30), and the second image I 2 of the second workpiece P2 is also acquired (step S40). Therefore, the preset angle of the embodiment may include a plurality of preset angles, and since the image capturing device 3 is fixed, the plurality of preset angles represent the first image I of the first workpiece P1 of different positions or angles. 1 and a second image I 2 of the second workpiece P2 corresponding to the position or angle. In step S50, the first pixel data and the second pixel data obtained are obtained at the same set position or angle for the same preset angle, that is, the workpiece (the first workpiece P1 and the second workpiece P2).
另外,於其他實施例中,可同時具有多數個不同設置方位的影像擷取裝置3,如圖4所示,圖4為依據本發明另一實施例之一種檢測系統的示意圖。本實施例亦可藉由設置多數個不同設置方位的影像擷取裝置3,以取得多個預設角度的多張第一圖像I1 及多張第二圖像I2 。具體而言,本實施例之檢測系統S除了於與檢測平台1平行的第一平面A1,即於第一工件P1(圖4係以第一工件P1為例說明,當然可置換成第二工件P2)的上方設置影像擷取裝置3a,更可於與檢測平台1垂直的第二平面A2,即對應於第一工件P1的側面設置影像擷取裝置3b,而本實施例係以一台影像擷取裝置3a與四台影像擷取裝置3b為例說明之,而為求圖面簡潔,省略其中一側(前側)的影像擷取裝置3b。其中,每一台影像擷取裝置3a、3b可擷取一種預設角度的第一圖像I1 ,因此,於步驟S20或步驟S40可依序或同時觸發多台的影像擷取裝置3a、3b,以取得多種預設角度的多張第一圖像I1 第二圖像I2 。同樣的,於步驟S50中,係比對於相同的預設角度,即自同一台影像擷取裝置3a或3b所取得之第一像素資料及第二像素資料。由於本實施例之檢測系統S具有設置於可對應於檢測平台1及工件(第一工件P1及第二工件P2)之側邊的影像擷取裝置3b,故更可針對工件的盲孔,進一步檢查修模前後之盲孔的深度差異。進而言之,設置於第一平面 A1的影像擷取裝置3a可取得於XY軸的第一圖像I1 或第二圖像I2 (如圖3A及圖3B),而設置於第二平面A2的影像擷取裝置3b則可取得於Z軸的第一圖像或第二圖像(圖未顯示),進而可提供二張圖像分別於XY軸及Z軸上的差異,而Z軸上的差異更可被應用為檢測深度的差異。In addition, in other embodiments, the image capturing device 3 can have a plurality of different orientations at the same time. As shown in FIG. 4, FIG. 4 is a schematic diagram of a detection system according to another embodiment of the present invention. In this embodiment, the image capturing device 3 of a plurality of different orientations may be disposed to obtain a plurality of first images I 1 and a plurality of second images I 2 of a plurality of preset angles. Specifically, the detection system S of the embodiment is different from the first plane A1 parallel to the detection platform 1, that is, the first workpiece P1 (FIG. 4 is illustrated by taking the first workpiece P1 as an example, and of course, can be replaced with the second workpiece. The image capturing device 3a is disposed above the P2), and the image capturing device 3b is disposed on the second plane A2 perpendicular to the detecting platform 1, that is, the side corresponding to the first workpiece P1, and the embodiment is an image. The capturing device 3a and the four image capturing devices 3b are exemplified, and in order to simplify the drawing, the image capturing device 3b on one side (front side) is omitted. Wherein each image capturing means 3a, 3b can capture one of the preset angle of the first image I 1, and therefore, in step S20 or step S40 may be sequentially or simultaneously triggered plurality of image capturing means 3a, 3b, to obtain a plurality of first images I 1 second image I 2 of a plurality of preset angles. Similarly, in step S50, the first pixel data and the second pixel data obtained from the same image capturing device 3a or 3b are compared to the same preset angle. Since the detecting system S of the embodiment has the image capturing device 3b disposed on the side of the detecting platform 1 and the workpieces (the first workpiece P1 and the second workpiece P2), the blind hole of the workpiece can be further Check the depth difference of the blind holes before and after the mold repair. In other words, the image capturing device 3a disposed on the first plane A1 can be obtained from the first image I 1 or the second image I 2 of the XY axis (as shown in FIGS. 3A and 3B ) and disposed on the second plane. The image capturing device 3b of A2 can obtain the first image or the second image of the Z axis (not shown), thereby providing a difference between the two images on the XY axis and the Z axis, and the Z axis. The difference can be applied to detect the difference in depth.
承上,本實施例之多數個影像擷取裝置3皆設置於固定的位置,並分別以一固定的角度擷取工件(第一工件P1及第二工件P2)於各個平面或角度的圖像。因此,可取代習知係利用影像擷取裝置架設於動態移動滑台,並於多數個不同位置拍攝的工件,以達到比對不同工件之差異性的目的及功效。再者,本實施例係以靜態的方式擷取圖像,可解決習知以動態的方式擷取圖像,於移動時所產生的震動將造成圖像有誤差的情形。另外,相較於習知為避免震動所造成的誤差而必須使用價格昂貴的工業用相機,本實施例可以為一般相機的多個影像擷取裝置3,更可有效的降低成本。The image capturing device 3 of the embodiment is disposed at a fixed position, and respectively captures images of the workpiece (the first workpiece P1 and the second workpiece P2) at various planes or angles at a fixed angle. . Therefore, it is possible to replace the workpiece that is mounted on the dynamic moving slide by the image capturing device and photographed at a plurality of different positions to achieve the purpose and effect of comparing the differences of the different workpieces. Furthermore, in this embodiment, the image is captured in a static manner, which can solve the problem that the image is captured in a dynamic manner, and the vibration generated when moving will cause an error in the image. In addition, it is necessary to use an expensive industrial camera in order to avoid the error caused by the vibration. This embodiment can be a plurality of image capturing devices 3 of a general camera, and the cost can be effectively reduced.
圖5為圖2A所示之定位件的另一實施態樣,請參考圖5所示。本實施例之檢測系統S具有至少一定位件2a,且定位件2a係為塊狀或積木式的設計,可藉由將定位件2a設置於第一工件P1及第二工件P2本身所具有的缺口內,同樣可設置於第一工件P1及第二工件P2的周緣,本實施例係以二定位件2a設置於第一工件P1及第二工件P2所具有的缺口內為例說明之。另需說明的是,圖5僅以第一工件P1為例說明,當然亦可置換成第二工件P2。FIG. 5 is another embodiment of the positioning member shown in FIG. 2A. Please refer to FIG. 5 . The detecting system S of the embodiment has at least one positioning member 2a, and the positioning member 2a is of a block or block type design, and can be disposed on the first workpiece P1 and the second workpiece P2 by the positioning member 2a. The notch can also be disposed on the periphery of the first workpiece P1 and the second workpiece P2. This embodiment is described by taking the two positioning members 2a in the notches of the first workpiece P1 and the second workpiece P2. It should be noted that FIG. 5 only illustrates the first workpiece P1 as an example, and may of course be replaced with the second workpiece P2.
具體而言,本實施例之檢測平台1a及定位件2a可包括金屬材質、或磁性材質,即本實施例之檢測平台1a與定位件2a可以為以磁力或其他非接觸力相互吸引的材質,使定位件2a可依照不同的工件(第一工件P1)所具有不相同的構型,或是多個定位件2a可組合形成不同的構型,即如同積木的方式,進而可輕易的調整定位件2a的設置位置。而本實施例之檢測平台1a為鐵板,定位件2a為磁性材料,其磁力較佳為4000高斯左右,或是大於4000高斯。應用上,可先將第一工件P1置放於檢測平台1a後,再將定位件2a置放於第一工件P1所具有的缺口,若無缺口則同樣可設置於第一工件P1相對的二側,以固定第一工件P1。第一工件P1被固定的位 置即為預設位置,並在影像擷取裝置3取得第一圖像I1 (步驟S20,可參考圖3A)後,而移除第一工件P1時,將定位件2a仍維持在原位,至步驟S30,再將第二工件P2設置於該預設位置。詳言之,由於本實施例之第一工件P1為修模前的工件,而第二工件P2則為經設計變更而修模後的工件,故第一工件P1及第二工件P2皆應具有相同的缺口,故可將第二工件P2以相同的方式,即同樣將缺口對應於定位件2a設置。Specifically, the detecting platform 1a and the positioning member 2a of the embodiment may include a metal material or a magnetic material, that is, the detecting platform 1a and the positioning member 2a of the embodiment may be mutually attracted by magnetic force or other non-contact force. The positioning member 2a can have different configurations according to different workpieces (the first workpiece P1), or the plurality of positioning members 2a can be combined to form different configurations, that is, like the way of building blocks, and thus the positioning can be easily adjusted. The setting position of the piece 2a. The detecting platform 1a of the embodiment is an iron plate, and the positioning member 2a is a magnetic material, and the magnetic force is preferably about 4000 Gauss or more than 4000 Gauss. In the application, the first workpiece P1 can be placed on the detecting platform 1a, and then the positioning member 2a can be placed on the gap of the first workpiece P1. If there is no gap, the second workpiece P1 can also be disposed opposite to the first workpiece P1. Side to fix the first workpiece P1. The position where the first workpiece P1 is fixed is the preset position, and after the image capturing device 3 obtains the first image I 1 (step S20, refer to FIG. 3A ), when the first workpiece P1 is removed, the positioning is performed. The piece 2a is still maintained in the home position, and to step S30, the second workpiece P2 is set to the preset position. In detail, since the first workpiece P1 of the embodiment is the workpiece before the mold modification, and the second workpiece P2 is the workpiece after the design modification, the first workpiece P1 and the second workpiece P2 should have With the same notch, the second workpiece P2 can be placed in the same manner, that is, the notch corresponding to the positioning member 2a.
另外,本實施例之檢測平台1a與定位件2a係使用以磁力或其他非接觸力相互吸引的材質的設計,可輕易置換檢測平台1a的色系。舉例而言,檢測平台1a更可鋪設一色紙,若工件(第一工件P1及第二工件P2)為黑色,則可使用白色或黃色等亮色系的色紙,反之,若工件為白色,則可使用黑色的色紙,以增加對比性,而不會受到背景的干擾,可更容易的判斷出第一工件P1與第二工件P2的差異。因此,本實施例之定位件2a可同時兼具置換檢測平台1a的色系與固定工件的便利性。另外,也可以作為壓緊檢測平台1a之色紙的工具,而不會使紙輕易的翹曲。於其他實施例中,檢測平台1更可以為抽拉式的檢測平台1,令使用者可輕易的置換工件,更可便利的置換檢測平台1之色紙。In addition, the detection platform 1a and the positioning member 2a of the present embodiment are designed to directly replace the color system of the detection platform 1a by using a material that attracts each other by magnetic force or other non-contact force. For example, the detecting platform 1a can lay a color paper. If the workpiece (the first workpiece P1 and the second workpiece P2) is black, a bright color paper such as white or yellow can be used. Otherwise, if the workpiece is white, the workpiece can be white. The use of black colored paper to increase contrast without being disturbed by the background makes it easier to judge the difference between the first workpiece P1 and the second workpiece P2. Therefore, the positioning member 2a of the present embodiment can simultaneously have the convenience of replacing the color system of the detecting platform 1a and fixing the workpiece. In addition, it can also be used as a tool for pressing the color paper of the detecting platform 1a without causing the paper to be easily warped. In other embodiments, the detecting platform 1 can be a pull-type detecting platform 1 so that the user can easily replace the workpiece, and the color paper of the detecting platform 1 can be replaced conveniently.
圖6為依據本發明又一實施例之一種檢測系統的剖面示意圖,請參考圖6所示,本實施例之檢測系統S更包括一遮光件6及一光源7,其中,遮光件6設置於層架5的周緣,使檢測平台1設置於暗室中。需註明的是,由於圖式難以表示暗室之態樣,故以遮光件6設置於層架5周緣的方式表示,另為求圖面簡潔,圖6未顯示定位件2。另外,光源7設置於層架5與遮光件6所形成的暗室中,光源7對應於檢測平台1設置,較佳的,光源7係設置於層架5與檢測平台1平行的第一平面A1,以提供影像擷取裝置3較為均勻的光源。另較佳的,光源7所提供者為白光光源。FIG. 6 is a cross-sectional view of a detection system according to another embodiment of the present invention. Referring to FIG. 6, the detection system S of the present embodiment further includes a light shielding member 6 and a light source 7, wherein the light shielding member 6 is disposed on The periphery of the shelf 5 allows the detection platform 1 to be placed in the darkroom. It should be noted that since the drawing is difficult to indicate the state of the dark room, the light shielding member 6 is disposed on the periphery of the shelf 5, and the drawing surface is simple. The positioning member 2 is not shown in FIG. In addition, the light source 7 is disposed in the dark room formed by the shelf 5 and the light shielding member 6. The light source 7 is disposed corresponding to the detecting platform 1. Preferably, the light source 7 is disposed on the first plane A1 of the shelf 5 parallel to the detecting platform 1. To provide a relatively uniform light source for the image capturing device 3. Further preferably, the light source 7 is provided by a white light source.
綜上所述,本案之檢測方法及檢測系統,透過簡易檢測平台及固定件的設置,以分別將二工件(第一工件及第二工件)設置於相同的預設位置,並藉由固定的影像擷取裝置分別取得對應於第一工件的第一圖像,以及對應於第二工件的第二圖像,且第一圖像與第二圖像的角度及位置皆實質上相同。接著,藉由處理模組直接計算第一圖像的第一像素資料 與第二圖像的第二像素資料之各像素的差值,並取得比對資料後,即可由比對資料所顯示的圖像查看第一工件與第二工件的差異。因此,本發明藉由簡易的檢測平台、定位件及影像擷取裝置,以及處理模組進行簡易的運算,即可達到比對不同工件之間的差異性之功效。In summary, the detection method and the detection system of the present case, through the simple detection platform and the setting of the fixing member, respectively, the two workpieces (the first workpiece and the second workpiece) are set at the same preset position, and fixed by The image capturing device respectively obtains a first image corresponding to the first workpiece and a second image corresponding to the second workpiece, and the angles and positions of the first image and the second image are substantially the same. Then, the first pixel data of the first image is directly calculated by the processing module After the difference between each pixel of the second pixel data of the second image is obtained, and the comparison data is obtained, the difference between the first workpiece and the second workpiece can be viewed by the image displayed by the comparison data. Therefore, the present invention can achieve the effect of comparing the differences between different workpieces by simple calculation platform, positioning member and image capturing device, and processing module for simple calculation.
另外,更可將比對資料與第一像素資料或第二像素資料共同輸出,及以第一圖像或第二圖像為參考基準,並將比對後的圖像覆蓋於第一圖像或第二圖像,令使用者可更清楚的查看第一工件與第二工件的差異。In addition, the comparison data may be output together with the first pixel data or the second pixel data, and the first image or the second image is used as a reference, and the compared image is overlaid on the first image. Or the second image, so that the user can more clearly see the difference between the first workpiece and the second workpiece.
除此之外,門檻值的定義更可過濾掉數位影像難以避免的雜訊,或是第一工件與第二工件置放於預設位置時的細微差異,甚至是因為光線而造成背景值的不同等微小差異,進而可較精準的顯示第一工件與第二工件的差異之處。In addition, the definition of the threshold value can filter out the noise that is difficult to avoid in the digital image, or the slight difference between the first workpiece and the second workpiece placed in the preset position, even the background value due to the light. Different minor differences can be used to more accurately display the difference between the first workpiece and the second workpiece.
另外,更可藉由於檢測平台的側邊設置影像擷取裝置,以取取得於Z軸的第一圖像或第二圖像,進而可針對工件的盲孔,進一步檢查修模前後之盲孔的深度差異。In addition, the image capturing device can be disposed on the side of the detecting platform to take the first image or the second image acquired on the Z axis, and further, the blind hole before and after the mold clamping can be further checked for the blind hole of the workpiece. The difference in depth.
以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.
S10~S60‧‧‧步驟S10~S60‧‧‧Steps
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