TWM475334U - Polishing pad - Google Patents
Polishing padInfo
- Publication number
- TWM475334U TWM475334U TW102210795U TW102210795U TWM475334U TW M475334 U TWM475334 U TW M475334U TW 102210795 U TW102210795 U TW 102210795U TW 102210795 U TW102210795 U TW 102210795U TW M475334 U TWM475334 U TW M475334U
- Authority
- TW
- Taiwan
- Prior art keywords
- grooves
- polishing pad
- sub
- polishing
- rotational direction
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- 230000002093 peripheral effect Effects 0.000 abstract 2
- 230000003247 decreasing effect Effects 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
Abstract
A polishing pad being applicable to a polishing system having a rotational direction is provided. The polishing pad has a polishing layer including a central region, a peripheral region, a plurality of main grooves and a plurality of sub grooves. The main grooves extend from near the central region to near the peripheral region, and the sub grooves are disposed between adjacent two of the main grooves. Each of the sub grooves has a respective length, and the respective lengths of the sub grooves are sequentially decreased along the rotational direction.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102210795U TWM475334U (en) | 2013-06-07 | 2013-06-07 | Polishing pad |
| CN201410066190.7A CN104227554A (en) | 2013-06-07 | 2014-02-26 | Polishing pad |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102210795U TWM475334U (en) | 2013-06-07 | 2013-06-07 | Polishing pad |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM475334U true TWM475334U (en) | 2014-04-01 |
Family
ID=52216916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102210795U TWM475334U (en) | 2013-06-07 | 2013-06-07 | Polishing pad |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN104227554A (en) |
| TW (1) | TWM475334U (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10586708B2 (en) | 2017-06-14 | 2020-03-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Uniform CMP polishing method |
| US10777418B2 (en) | 2017-06-14 | 2020-09-15 | Rohm And Haas Electronic Materials Cmp Holdings, I | Biased pulse CMP groove pattern |
| US10861702B2 (en) | 2017-06-14 | 2020-12-08 | Rohm And Haas Electronic Materials Cmp Holdings | Controlled residence CMP polishing method |
| US10857647B2 (en) | 2017-06-14 | 2020-12-08 | Rohm And Haas Electronic Materials Cmp Holdings | High-rate CMP polishing method |
| US10857648B2 (en) | 2017-06-14 | 2020-12-08 | Rohm And Haas Electronic Materials Cmp Holdings | Trapezoidal CMP groove pattern |
| CN108044500A (en) * | 2018-01-15 | 2018-05-18 | 华侨大学 | A kind of abrasive disk and preparation method based on bionic plant train of thought |
| TWI679083B (en) * | 2019-01-02 | 2019-12-11 | 力晶積成電子製造股份有限公司 | Polishing pad |
| CN117697619A (en) * | 2024-01-11 | 2024-03-15 | 湖北鼎汇微电子材料有限公司 | Polishing pad and grinding equipment |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW562716B (en) * | 2002-08-23 | 2003-11-21 | Applied Materials Inc | A polishing pad for chemical mechanical polishing |
| KR100568258B1 (en) * | 2004-07-01 | 2006-04-07 | 삼성전자주식회사 | Polishing pad for chemical mechanical polishing and chemical mechanical polishing apparatus using the same |
| CN101987431B (en) * | 2009-08-06 | 2015-08-19 | 智胜科技股份有限公司 | Ginding process, grinding pad and grinding system |
| KR101091079B1 (en) * | 2009-12-30 | 2011-12-09 | 세메스 주식회사 | Disk unit for cleaning a substrate and cleaning apparatus having the same |
| CN102320031B (en) * | 2011-08-25 | 2014-03-12 | 山东理工大学 | Zirconia ceramic abrasive wheel and preparation method |
-
2013
- 2013-06-07 TW TW102210795U patent/TWM475334U/en not_active IP Right Cessation
-
2014
- 2014-02-26 CN CN201410066190.7A patent/CN104227554A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN104227554A (en) | 2014-12-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4K | Annulment or lapse of a utility model due to non-payment of fees |