TWM475312U - Quantification feeding device, processing station, and processing equipment - Google Patents
Quantification feeding device, processing station, and processing equipmentInfo
- Publication number
- TWM475312U TWM475312U TW101222554U TW101222554U TWM475312U TW M475312 U TWM475312 U TW M475312U TW 101222554 U TW101222554 U TW 101222554U TW 101222554 U TW101222554 U TW 101222554U TW M475312 U TWM475312 U TW M475312U
- Authority
- TW
- Taiwan
- Prior art keywords
- processing
- feeding device
- processing equipment
- quantification feeding
- processing station
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
- G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
- G05D7/0629—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means
- G05D7/0635—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means
- G05D7/0641—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means using a plurality of throttling means
- G05D7/0647—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means using a plurality of throttling means the plurality of throttling means being arranged in series
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/67086—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- Automation & Control Theory (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102012000899.6A DE102012000899B4 (en) | 2012-01-19 | 2012-01-19 | Dosing device, treatment station, treatment plant and dosing process |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM475312U true TWM475312U (en) | 2014-04-01 |
Family
ID=48742096
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101222554U TWM475312U (en) | 2012-01-19 | 2012-11-21 | Quantification feeding device, processing station, and processing equipment |
TW101222555U TWM465965U (en) | 2012-01-19 | 2012-11-21 | Treatment equipment having quantitative loading device |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101222555U TWM465965U (en) | 2012-01-19 | 2012-11-21 | Treatment equipment having quantitative loading device |
Country Status (4)
Country | Link |
---|---|
KR (2) | KR20130004644U (en) |
CN (2) | CN203253420U (en) |
DE (1) | DE102012000899B4 (en) |
TW (2) | TWM475312U (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014106129A1 (en) | 2014-04-30 | 2015-11-05 | Thyssenkrupp Ag | Method and apparatus for continuous precursor delivery |
US11075218B2 (en) * | 2019-05-22 | 2021-07-27 | Sandisk Technologies Llc | Method of making a three-dimensional memory device using silicon nitride etching end point detection |
CN110935400B (en) * | 2019-12-25 | 2021-01-01 | 唐虹 | Intermittent automatic feeding device of liquid storage tank |
DE102021109076A1 (en) | 2021-04-12 | 2022-10-13 | Bürkert Werke GmbH & Co. KG | Metering device and method for metering liquid media |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH702769B1 (en) * | 2010-02-22 | 2019-07-31 | Reseachem Gmbh | Metering device and method for metering a fluid into a reaction vessel. |
-
2012
- 2012-01-19 DE DE102012000899.6A patent/DE102012000899B4/en not_active Expired - Fee Related
- 2012-11-21 TW TW101222554U patent/TWM475312U/en not_active IP Right Cessation
- 2012-11-21 TW TW101222555U patent/TWM465965U/en not_active IP Right Cessation
- 2012-12-20 CN CN2012207130854U patent/CN203253420U/en not_active Expired - Fee Related
- 2012-12-21 CN CN2012207154628U patent/CN203134765U/en not_active Expired - Fee Related
-
2013
- 2013-01-17 KR KR2020130000426U patent/KR20130004644U/en not_active Application Discontinuation
- 2013-01-17 KR KR2020130000425U patent/KR20130004643U/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
CN203253420U (en) | 2013-10-30 |
KR20130004643U (en) | 2013-07-29 |
TWM465965U (en) | 2013-11-21 |
DE102012000899A1 (en) | 2013-07-25 |
DE102012000899B4 (en) | 2014-01-16 |
KR20130004644U (en) | 2013-07-29 |
CN203134765U (en) | 2013-08-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4K | Annulment or lapse of a utility model due to non-payment of fees |